MOSFET - Power, Single
N-Channel
80 V, 50 mW, 14 A
NVTFS6H888NL
Features
•
•
•
•
•
•
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Small Footprint (3.3 x 3.3 mm) for Compact Design
Low RDS(on) to Minimize Conduction Losses
Low Capacitance to Minimize Driver Losses
NVTFS6H888NLWF − Wettable Flanks Product
AEC−Q101 Qualified and PPAP Capable
These Devices are Pb−Free and are RoHS Compliant
V(BR)DSS
RDS(ON) MAX
ID MAX
50 mW @ 10 V
80 V
14 A
67 mW @ 4.5 V
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
Parameter
Drain−to−Source Voltage
Gate−to−Source Voltage
Continuous Drain
Current RqJC
(Notes 1, 2, 3, 4)
TC = 25°C
Power Dissipation
RqJC (Notes 1, 2, 3)
Continuous Drain
Current RqJA
(Notes 1, 3, 4)
Steady
State
Value
Unit
VDSS
80
V
VGS
±20
V
ID
14
A
TC = 100°C
TC = 25°C
PD
Steady
State
Pulsed Drain Current
S (1, 2, 3)
12
ID
A
4.9
PD
W
2.9
1.5
IDM
49
A
TJ, Tstg
−55 to
+175
°C
IS
20
A
Single Pulse Drain−to−Source Avalanche
Energy (IL(pk) = 0.6 A)
EAS
92
mJ
Lead Temperature for Soldering Purposes
(1/8″ from case for 10 s)
TL
260
°C
Operating Junction and Storage Temperature
Range
Source Current (Body Diode)
Stresses exceeding those listed in the Maximum Ratings table may damage the
device. If any of these limits are exceeded, device functionality should not be
assumed, damage may occur and reliability may be affected.
THERMAL RESISTANCE MAXIMUM RATINGS (Note 1)
Parameter
Symbol
Value
Unit
Junction−to−Case − Steady State (Note 3)
RqJC
6.4
°C/W
Junction−to−Ambient − Steady State (Note 3)
RqJA
52
1. The entire application environment impacts the thermal resistance values shown,
they are not constants and are only valid for the particular conditions noted.
2. Psi (Y) is used as required per JESD51−12 for packages in which
substantially less than 100% of the heat flows to single case surface.
3. Surface−mounted on FR4 board using a 650 mm2, 2 oz. Cu pad.
4. Continuous DC current rating. Maximum current for pulses as long as 1
second is higher but is dependent on pulse duration and duty cycle.
© Semiconductor Components Industries, LLC, 2019
November, 2020 − Rev. 1
MARKING
DIAGRAMS
3.5
TA = 100°C
TA = 25°C, tp = 10 ms
D (5 − 8)
W
23
TA = 100°C
TA = 25°C
N−Channel
G (4)
10
TC = 100°C
TA = 25°C
Power Dissipation
RqJA (Notes 1, 3)
Symbol
1
1
WDFN8
(m8FL)
CASE 511AB
WDFNW8
(Full−Cut m8FL)
CASE 515AN
1
S
S
S
G
XXXX
AYWWG
G
D
D
D
D
XXXX
AYWWG
G
XXXX = Specific Device Code
A
= Assembly Location
Y
= Year
WW
= Work Week
G
= Pb−Free Package
(Note: Microdot may be in either location)
ORDERING INFORMATION
See detailed ordering, marking and shipping information in the
package dimensions section on page 5 of this data sheet.
Publication Order Number:
NVTFS6H888NL/D
NVTFS6H888NL
ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)
Parameter
Symbol
Test Condition
Min
V(BR)DSS
VGS = 0 V, ID = 250 mA
80
Typ
Max
Unit
OFF CHARACTERISTICS
Drain−to−Source Breakdown Voltage
Zero Gate Voltage Drain Current
IDSS
Gate−to−Source Leakage Current
VGS = 0 V,
VDS = 80 V
V
TJ = 25°C
10
TJ = 125°C
100
IGSS
VDS = 0 V, VGS = 20 V
VGS(TH)
VGS = VDS, ID = 15 mA
100
mA
nA
ON CHARACTERISTICS (Note 5)
Gate Threshold Voltage
Threshold Temperature Coefficient
Drain−to−Source On Resistance
VGS(TH)/TJ
RDS(on)
Forward Transconductance
gFS
1.2
2.0
−5
V
mV/°C
VGS = 10 V
ID = 5 A
41
50
mW
VGS = 4.5 V
ID = 5 A
53
67
mW
VDS = 8 V, ID = 10 A
20
S
CHARGES, CAPACITANCES & GATE RESISTANCE
Input Capacitance
CISS
Output Capacitance
COSS
Reverse Transfer Capacitance
CRSS
258
VGS = 0 V, f = 1 MHz, VDS = 40 V
36
Total Gate Charge
QG(TOT)
Threshold Gate Charge
QG(TH)
0.7
Gate−to−Source Charge
QGS
1.2
Gate−to−Drain Charge
QGD
Plateau Voltage
Total Gate Charge
pF
3
VGS = 10 V, VDS = 40 V; ID = 10 A
VGS = 4.5 V, VDS = 40 V; ID = 10 A
6
nC
1.0
VGP
3.3
V
QG(TOT)
3
nC
SWITCHING CHARACTERISTICS (Note 6)
Turn−On Delay Time
Rise Time
Turn−Off Delay Time
Fall Time
td(ON)
tr
td(OFF)
6
VGS = 4.5 V, VDS = 64 V,
ID = 10 A, RG = 2.5 W
tf
15
ns
9
3
DRAIN−SOURCE DIODE CHARACTERISTICS
Forward Diode Voltage
Reverse Recovery Time
Charge Time
Discharge Time
Reverse Recovery Charge
VSD
VGS = 0 V,
IS = 5 A
TJ = 25°C
0.85
TJ = 125°C
0.73
tRR
ta
tb
1.2
V
23
VGS = 0 V, dIS/dt = 100 A/ms,
IS = 10 A
QRR
15
ns
7
13
nC
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
5. Pulse Test: pulse width v 300 ms, duty cycle v 2%.
6. Switching characteristics are independent of operating junction temperatures.
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2
NVTFS6H888NL
TYPICAL CHARACTERISTICS
14
12
3.4 V
ID, DRAIN CURRENT (A)
ID, DRAIN CURRENT (A)
12
3.6 V
10
3.2 V
8
6
3.0 V
4
2.8 V
10
8
6
2
0
0
0
1
2
4
3
5
0
1.5
2.0
TJ = −55°C
2.5
3.0
50
45
40
6
5
4
7
9
8
10
VGS, GATE−TO−SOURCE VOLTAGE (V)
4.0
3.5
Figure 2. Transfer Characteristics
55
57
TJ = 25°C
55
VGS = 4.5 V
53
51
49
47
45
43
VGS = 10 V
41
39
37
35
1
2
3
5
4
ID, DRAIN CURRENT (A)
Figure 3. On−Resistance vs. Gate−to−Source
Voltage
Figure 4. On−Resistance vs. Drain Current and
Gate Voltage
1000
2.5
VGS = 10 V
ID = 5 A
100
2.0
IDSS, LEAKAGE (nA)
RDS(on), NORMALIZED DRAIN−TO−
SOURCE RESISTANCE
1.0
Figure 1. On−Region Characteristics
TJ = 25°C
ID = 5 A
1.5
1.0
0.5
−50
0.5
VGS, GATE−TO−SOURCE VOLTAGE (V)
60
3
TJ = 125°C
VDS, DRAIN−TO−SOURCE VOLTAGE (V)
65
35
TJ = 25°C
4
2
RDS(on), DRAIN−TO−SOURCE RESISTANCE (mW)
RDS(on), DRAIN−TO−SOURCE RESISTANCE (mW)
14
VGS = 10 V to 3.8 V
−25
0
25
50
75
100
125
150
175
10 TJ = 175°C
TJ = 150°C
1 T = 125°C
J
0.1
TJ = 85°C
0.01
TJ = 25°C
0.001
5
15
25
35
45
55
65
75
TJ, JUNCTION TEMPERATURE (°C)
VDS, DRAIN−TO−SOURCE VOLTAGE (V)
Figure 5. On−Resistance Variation with
Temperature
Figure 6. Drain−to−Source Leakage Current
vs. Voltage
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3
NVTFS6H888NL
1000
C, CAPACITANCE (pF)
CISS
100
COSS
10
0
t, TIME (ns)
100
10
CRSS
20
30
40
50
60
70
80
6
5
QGS
4
QGD
3
VDS = 40 V
ID = 10 A
TJ = 25°C
2
1
0
1
0
2
3
5
4
Figure 8. Gate−to−Source and
Drain−to−Source Voltage vs. Total Charge
VGS = 4.5 V
VDS = 64 V
ID = 10 A
6
VGS = 0 V
td(off)
tr
tf
1
TJ = 125°C
0.1
1
10
0.3
100
0.4
TJ = −55°C
TJ = 25°C
0.5
0.6
0.7
0.8
0.9
1.0
RG, GATE RESISTANCE (W)
VSD, SOURCE−TO−DRAIN VOLTAGE (V)
Figure 9. Resistive Switching Time Variation
vs. Gate Resistance
Figure 10. Diode Forward Voltage vs. Current
TA = 25°C
Single Pulse
VGS ≤ 10 V
10
TJ(initial) = 25°C
IPEAK (A)
ID, DRAIN CURRENT (A)
100
8
7
Figure 7. Capacitance Variation
td(on)
1000
9
QG, TOTAL GATE CHARGE (nC)
10
1
10
VDS, DRAIN−TO−SOURCE VOLTAGE (V)
IS, SOURCE CURRENT (A)
1
VGS = 0 V
TJ = 25°C
f = 1 MHz
VGS, GATE−TO−SOURCE VOLTAGE (V)
TYPICAL CHARACTERISTICS
10
1
TJ(initial) = 100°C
1
0.1
RDS(on) Limit
Thermal Limit
Package Limit
0.1
1
10
10 ms
10 ms
0.5 ms
1 ms
100
1000
0.1
0.00001
0.0001
0.001
0.01
VDS, DRAIN−SOURCE VOLTAGE (V)
TIME IN AVALANCHE (s)
Figure 11. Safe Operating Area
Figure 12. Maximum Drain Current vs. Time in
Avalanche
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4
NVTFS6H888NL
TYPICAL CHARACTERISTICS
100
R(t) (°C/W)
50% Duty Cycle
20%
10 10%
5%
1
2%
1%
0.1 Single Pulse
0.01
0.000001
0.00001
0.0001
0.001
0.01
1
0.1
10
100
1000
PULSE TIME (sec)
Figure 13. Thermal Response
DEVICE ORDERING INFORMATION
Marking
Package
Shipping†
NVTFS6H888NLTAG
888L
WDFN8
(Pb−Free)
1500 / Tape & Reel
NVTFS6H888NLWFTAG
88LW
WDFN8
(Pb−Free, Wettable Flanks)
1500 / Tape & Reel
Device
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
www.onsemi.com
5
MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
WDFN8 3.3x3.3, 0.65P
CASE 511AB
ISSUE D
1
SCALE 2:1
DATE 23 APR 2012
2X
NOTES:
1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994.
2. CONTROLLING DIMENSION: MILLIMETERS.
3. DIMENSION D1 AND E1 DO NOT INCLUDE MOLD FLASH
PROTRUSIONS OR GATE BURRS.
0.20 C
D
A
D1
B
2X
0.20 C
8 7 6 5
4X
E1 E
q
c
1 2 3 4
A1
TOP VIEW
0.10 C
A
e
SIDE VIEW
0.10
8X b
C A B
0.05
C
4X
DETAIL A
8X
e/2
1
0.42
4
INCHES
NOM
0.030
−−−
0.012
0.008
0.130 BSC
0.116
0.120
0.078
0.083
0.130 BSC
0.116
0.120
0.058
0.063
0.009
0.012
0.026 BSC
0.012
0.016
0.026
0.032
0.012
0.017
0.002
0.005
0.055
0.059
0_
−−−
MIN
0.028
0.000
0.009
0.006
MAX
0.031
0.002
0.016
0.010
0.124
0.088
0.124
0.068
0.016
0.020
0.037
0.022
0.008
0.063
12 _
0.65
PITCH
PACKAGE
OUTLINE
4X
0.66
M
E3
8
5
D2
BOTTOM VIEW
1
3.60
L1
GENERIC
MARKING DIAGRAM*
XXXXX
A
Y
WW
G
MILLIMETERS
MIN
NOM
MAX
0.70
0.75
0.80
0.00
−−−
0.05
0.23
0.30
0.40
0.15
0.20
0.25
3.30 BSC
2.95
3.05
3.15
1.98
2.11
2.24
3.30 BSC
2.95
3.05
3.15
1.47
1.60
1.73
0.23
0.30
0.40
0.65 BSC
0.30
0.41
0.51
0.65
0.80
0.95
0.30
0.43
0.56
0.06
0.13
0.20
1.40
1.50
1.60
0_
−−−
12 _
SOLDERING FOOTPRINT*
L
G
SEATING
PLANE
DETAIL A
K
E2
C
6X
0.10 C
DIM
A
A1
b
c
D
D1
D2
E
E1
E2
E3
e
G
K
L
L1
M
q
XXXXX
AYWWG
G
0.75
2.30
0.57
0.47
2.37
3.46
DIMENSION: MILLIMETERS
= Specific Device Code
= Assembly Location
= Year
= Work Week
= Pb−Free Package
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
*This information is generic. Please refer
to device data sheet for actual part
marking.
Pb−Free indicator, “G” or microdot “ G”,
may or may not be present.
DOCUMENT NUMBER:
DESCRIPTION:
98AON30561E
WDFN8 3.3X3.3, 0.65P
Electronic versions are uncontrolled except when accessed directly from the Document Repository.
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
PAGE 1 OF 1
ON Semiconductor and
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding
the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically
disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the
rights of others.
© Semiconductor Components Industries, LLC, 2019
www.onsemi.com
MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
WDFNW8 3.3x3.3, 0.65P (Full−Cut m8FL WF)
CASE 515AN
ISSUE O
GENERIC
MARKING DIAGRAM*
XXXX
AYWWG
G
DOCUMENT NUMBER:
DESCRIPTION:
DATE 25 AUG 2020
XXXX = Specific Device Code
*This information is generic. Please refer to
A
= Assembly Location
device data sheet for actual part marking.
Y
= Year
Pb−Free indicator, “G” or microdot “G”, may
or may not be present. Some products may
WW = Work Week
not follow the Generic Marking.
G
= Pb−Free Package
(Note: Microdot may be in either location)
98AON24556H
Electronic versions are uncontrolled except when accessed directly from the Document Repository.
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
WDFNW8 3.3x3.3, 0.65P (Full−Cut m8FL WF)
PAGE 1 OF 1
ON Semiconductor and
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding
the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically
disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the
rights of others.
© Semiconductor Components Industries, LLC, 2018
www.onsemi.com
onsemi,
, and other names, marks, and brands are registered and/or common law trademarks of Semiconductor Components Industries, LLC dba “onsemi” or its affiliates
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A listing of onsemi’s product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. onsemi reserves the right to make changes at any time to any
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