QSB363C
Subminiature Plastic Silicon Infrared Phototransistor
Features
Description
■ NPN Silicon Phototransistor
The QSB363 is a silicon phototransistor encapsulated in
a clear infrared T-3/4 package.
■ T-3/4 (2mm) Surface Mount Package
■ Medium Wide Beam Angle, 24°
■ Clear Plastic Package
■ Matched Emitters: QEB363 or QEB373
■ Tape & Reel Option (See Tape & Reel Specifications)
■ Lead Form Options: Gullwing, Yoke, Z-Bend
Package Dimensions
EMITTER
0.276 (7.0)
MIN
0.087 (2.2)
0.071 (1.8)
0.024 (0.6)
0.016 (0.4)
0.019 (0.5)
0.012 (0.3)
0.074 (1.9)
.118 (3.0)
.102 (2.6)
.059 (1.5)
.051 (1.3)
Schematic
0.055 (1.4)
0.008 (0.21)
0.004 (0.11)
0.106 (2.7)
0.091 (2.3)
0.024 (0.6)
NOTES:
1. Dimensions are in inches (mm).
2. Tolerance of ± .010 (.25) on all non nominal dimensions
unless otherwise specified.
©2011 Fairchild Semiconductor Corporation
QSB363C Rev. 1.0.3
COLLECTOR
EMITTER
www.fairchildsemi.com
QSB363C — Subminiature Plastic Silicon Infrared Phototransistor
March 2011
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only. )
Symbol
Parameter
Rating
Unit
°C
TOPR
Operating Temperature
-25 to +85
TSTG
Storage Temperature
-40 to +85
°C
TSOL
Soldering Temperature (Iron)(2,3,4)
260
°C
TSOL
Soldering Temperature (Flow)(2,3)
260
°C
VCEO
Collector Emitter Voltage
30
V
VECO
Emitter Collector Voltage
5
V
Power Dissipation(1)
75
mW
PC
Notes
1. Derate power dissipation linearly 1.33mW/°C above 25°C.
2. RMA flux is recommended.
3. Methanol or isopropyl alcohols are recommended as cleaning agents.
4. Pulse conditions: tp = 100µs, T = 10ms.
5. D = 940nm, GaAs.
Electrical/Optical Characteristics (TA = 25°C)
Symbol
Parameters
λP
Peak Sensitivity Wavelength
Θ
Reception Angle
ICEO
BVCEO
BVECO
IC(on)
VCE (SAT)
Test Conditions
Min.
Typ.
Max.
940
Units
nm
±12
0mW/cm2
Collector Dark Current
VCE = 20V, Ee =
Collector-Emitter Breakdown Voltage
IC = 100µA, Ee = 0mW/cm2
30
V
Emitter-Collector Breakdown Voltage
0mW/cm2
5
V
On-State Collector Current
IE = 100µA, Ee =
VCE = 5V, Ee =
0.5mW/cm2
1mW/cm2
Collector-Emitter Saturation Voltage
IC = 2mA, Ee =
tr
Rise Time
tf
Fall Time
VCE = 5 V, IC = 1mA,
RL = 1000Ω
©2011 Fairchild Semiconductor Corporation
QSB363C Rev. 1.0.3
100
1.0
1.5
nA
mA
0.4
V
15
µs
15
µs
www.fairchildsemi.com
2
QSB363C — Subminiature Plastic Silicon Infrared Phototransistor
Absolute Maximum Ratings (TA = 25°C unless otherwise specified)
Fig. 1 Collector Power Dissipation vs.
Ambient Temperature
Fig. 2 Spectral Sensitivity
1.0
100
Relative Spectral Sensitivity
Collector Power
Dissipation Pd (mW)
TA = 25˚C
80
60
40
20
0.8
0.6
0.4
0.2
0
0
-25
0
25
50
100
75 85 100
300
500
10
VCE = 5 V
Ee = 1 mW/cm2
Collector Current IC (mA)
Relative Collector Current (%)
160
120
100
80
60
40
1100
1300
VCE = 5 V
TA = 25˚C
1
0.1
0.01
20
0
0
20
10
40
30
50
60
0.001
0.01
70
1
0.1
10
Ambient Temperature TA (˚C)
Irradiance Ee (mW/cm2)
Fig. 5 Collector Dark Current vs.
Ambient Temperature
Fig. 6 Collector Current vs.
Collector Emitter Voltage
10-6
5
14
VCE = 20 V
12
2
Collector Current IC (mA)
Collector Dark Current ICEO (A)
900
Fig. 4 Collector Current vs.
Irradiance
Fig. 3 Relative Collector Current vs.
Ambient Temperature
140
700
Wavelength λ (nm)
Ambient Temperature TA (˚C)
10-7
5
2
10-8
5
2
10-9
5
10
Ee=1.50mW/cm2
8
Ee=1.25mW/cm2
6
Ee=1.0mW/cm2
4
Ee=0.75mW/cm2
2
2
10-10
Ee=0.5mW/cm2
0
0
25
50
75
100
0
2
4
3
Collector Emitter Voltage VCE (V)
Ambient Temperature (°C)
©2011 Fairchild Semiconductor Corporation
QSB363C Rev. 1.0.3
1
www.fairchildsemi.com
3
QSB363C — Subminiature Plastic Silicon Infrared Phototransistor
Typical Performance Curves
Features
■ Three lead forming options: Gull Wing, Yoke and Z-Bend
■ Compatible with automatic placement equipment
■ Supplied on tape and reel or in bulk packaging
■ Compatible with vapor phase reflow solder processes
0.006±0.002
(0.15±0.05)
0.025±0.004
(0.65±0.1)
0.043±0.008 0.055±0.008
(1.1±0.2) (1.4±0.2)
R0.031±.004
(0.8±0.1)
0.012±0.004
(0.3±0.1)
0.032 +0.005
–0
+0.13
(0.83 –0
0.029±0.004
(0.75±0.1)
Emitter
CL
0.016±0.004
(0.4±0.1)
0.020±0.004
(0.5±0.1)
0.043±0.008 0.055±0.008
R0.031±.004 (1.1±0.2) (1.4±0.2)
(0.8±0.1)
0.051±0.004
(1.3±0.1)
0.006±0.002
(0.15±0.05)
0.157±0.008
(4.0±0.2)
CL
0.079±0.008
(2.0±0.2)
0.016±0.004
(0.4±0.1)
0.020±0.004
(0.5±0.1)
CL
Emitter
0.098±0.004
(2.5±0.1)
0.055±0.004
(1.4±0.1)
0.023 +0.005
–0
(0.6 +0.13
)
–0
)
0.12±0.008
(3.05±0.2)
0.169±0.008 (4.3±0.2)
0.228±0.008 (5.8±0.2)
0.025±0.004
(0.65±0.1)
CL
ø0.075±0.008
(1.9±0.2)
0.079±0.008
(2.0±0.2)
0.098±0.004
(2.5±0.1)
0.106±0.008
(2.7±0.2)
ø0.075±0.008
(ø1.9±0.2)
Z-Bend Lead Configuration
0.051±0.004
(1.3±0.1)
0.106±0.008
(2.7±0.2)
Gull Wing Lead Configuration
0.055±0.004
(1.4±0.1)
0.029±0.004
(0.75±0.1)
Yoke Lead Configuration
0.098±0.004
(2.5±0.1)
Emitter
0.006±0.002
(0.15±0.05)
0.185±0.008 (4.7±0.2)
0.291±0.008 (7.4±0.2)
©2011 Fairchild Semiconductor Corporation
QSB363C Rev. 1.0.3
0.029±0.004
(0.75±0.1)
0.051±0.004
(1.3±0.1)
0.106±0.008
(2.7±0.2)
0.043±0.008 0.055±0.008
(1.1±0.2) (1.4±0.2)
R0.031±.004
(0.8±0.1)
0.025±0.004
(0.65±0.1)
R0.016±.004
(0.4±0.1)
0.016±0.004
(0.4±0.1)
0.020±0.004
(0.5±0.1)
CL
CL
0.079±0.008
(2.0±0.2)
ø0.075±0.008
(1.9±0.2)
0.055±0.004
(1.4±0.1)
www.fairchildsemi.com
4
QSB363C — Subminiature Plastic Silicon Infrared Phototransistor
Package Dimensions
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Saving our world, 1mW/W/kW at a time™
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SuperFET®
SuperSOT™-3
SuperSOT™-6
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EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
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and (c) whose failure to perform when properly used in accordance
with instructions for use provided in the labeling, can be reasonably
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PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet Identification
Product Status
Advance Information
Formative / In Design
Preliminary
First Production
No Identification Needed
Full Production
Obsolete
Not In Production
Definition
Datasheet contains the design specifications for product development. Specifications may change in
any manner without notice.
Datasheet contains preliminary data; supplementary data will be published at a later date. Fairchild
Semiconductor reserves the right to make changes at any time without notice to improve design.
Datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes
at any time without notice to improve the design.
Datasheet contains specifications on a product that is discontinued by Fairchild Semiconductor.
The datasheet is for reference information only.
Rev. I51
©2011 Fairchild Semiconductor Corporation
QSB363C Rev. 1.0.3
www.fairchildsemi.com
5
QSB363C — Subminiature Plastic Silicon Infrared Phototransistor
TRADEMARKS
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intended to be an exhaustive list of all such trademarks.
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