SNSR20F20NXT5G

Update Notification Document # : FPCN21451X1 Issue Date: 2 November 2016 Title of Change: Update of FPCN21451X – Correction of the Test Change box selection in the Change Category section and the addition of 2 Qualification Vehicles in the Reliability Data Summary table. Proposed first ship date: 20 December 2016 Contact information: Contact your local ON Semiconductor Sales Office or Samples: Contact your local ON Semiconductor Sales Office Additional Reliability Data: Contact your local ON Semiconductor Sales Office or Type of notification: ON Semiconductor will consider this change accepted, unless an inquiry is made in writing within 30 days of delivery of this notice. To do so, contact . Change category: Wafer Fab Change Change Sub-Category(s): Manufacturing Site Change/Addition Manufacturing Process Change Sites Affected: All site(s) not applicable Assembly Change Test Change Other Plating Change Datasheet/Product Doc change Shipping/Packaging/Marking Other: _______________________ Material Change Product specific change ON Semiconductor site(s) : ON Niigata, Japan External Foundry/Subcon site(s) Description and Purpose: This Update Notification is issued to inform customer on the following updates: • Test Change box in the Change Category section was incorrectly selected. No Test site change is being announced. • 2 Qual Vehicles (NSR20F40NXT5G and NSR02L30NXT5G) were added to the Reliability Data Summary which unintentionally missed out from the previous FPCN21451X. • Clarification that the full list of impacted parts is reflected in this Update Notice because some parts where included in the initial FPCN21451X distribution but unintentionally omitted from the Generic PCN document. The FPCN21451X was initially released in September 2016 to notify customers on the plans to transfer of DSN2 Schottky plating site from existing external foundry facility to existing internal manufacturing site in Niigata, Japan. Reliability Data Summary: QV DEVICE NAME : NSR10F40NXT5G, NSR20F40NXT5G, NSR02L30NXT5G PACKAGE: DSN2 Test Specification Condition Interval Results HTRB JESD22-A108 Ta=90°C, 80% max rated V 1008 hrs 0/240 TC JESD22-A104 Ta= -_40°C to +125°C 850cyc 0/240 H3TRB JESD22-A101 85°C, 85% RH, 80%bias 1008 hrs 0/240 uHAST JESD22-A118 130°C, 85% RH, 18.8psig, unbiased 96 hrs 0/240 TEM001153 Rev. D Page 1 of 2 Update Notification Document # : FPCN21451X1 Issue Date: 2 November 2016 Electrical Characteristic Summary: Three temperature characterization and ESD performance meet datasheet specification. Detail of Electrical characterization result is available upon request. List of Affected Standard Parts: TEM001153 Rev. D Part Number Qualification Vehicle NSR02L30NXT5G NSR02L30NXT5G NSR02F30NXT5G NSR02L30NXT5G NSR05F40NXT5G NSR10F40NXT5G NSR10F20NXT5G NSR10F40NXT5G NSR10F30NXT5G NSR10F40NXT5G SNSR20F20NXT5G NSR20F40NXT5G NSR05F30QNXT5G NSR10F40NXT5G NSR10F30QNXT5G NSR10F40NXT5G NSR20F30QNXT5G NSR20F40NXT5G NSR05F40QNXT5G NSR10F40NXT5G NSR10F40QNXT5G NSR10F40NXT5G Page 2 of 2