STK5C4-340J-E

Final Product/Process Change Notification Document # : FPCN21606X Issue Date: 12 January 2017 Title of Change: Qualification of ON Semiconductor Binh Duong, Vietnam as metal substrate plant for Intelligent Power Module (IPM) of STK products. Proposed first ship date: 19 April 2017 Contact information: Contact your local ON Semiconductor Sales Office or . Samples: Contact your local ON Semiconductor Sales Office or . Additional Reliability Data: Contact your local ON Semiconductor Sales Office or . Type of notification: This is a Final Product/Process Change Notification (FPCN) sent to customers. FPCNs are issued 90 days prior to implementation of the change. ON Semiconductor will consider this change accepted, unless an inquiry is made in writing within 30 days of delivery of this notice. To do so, contact . Change Part Identification: Identification via lot code Change category: ☐ Wafer Fab Change ☐ Assembly Change Change Sub-Category(s): ☒ Manufacturing Site Change/Addition ☐ Manufacturing Process Change ☐ Test Change ☒ Other Metal Substrate Mfg. ☐ Material Change ☐ Product specific change ☐ Datasheet/Product Doc change ☐ Shipping/Packaging/Marking ☐ Other: _______________________ ☒ ON Semiconductor site(s) : ☐ External Foundry/Subcon site(s) Sites Affected: ☐ All site(s) ☐ not applicable ON Binh Duong Province, Vietnam _________________________ _____________________________ Description and Purpose: As for Insulated Metal Substrate (IMST) using our Intelligent Power Module (IPM) STK series, we plan to build Ni plating process in our Vietnam plant (ON Semiconductor Binh Duong Co., Ltd) in order to stable supply. Before Change After Change Cu foil press OSNC Gunma plant (Japan) OSNC Gunma plant / Material supplier (Japan) Shirring OSNC Gunma plant (Japan) OSNC Gunma plant / Material supplier (Japan) Ni plating OSNC Gunma plant (Japan) OSNC Gunma plant / OSBD (Vietnam) OSBD (Vietnam) OSBD (Vietnam) OSV (Vietnam) OSV (Vietnam) After Cu foil etching process IPM assembly The other process and all materials do not change. TEM001092 Rev. K Page 1 of 6 Final Product/Process Change Notification Document # : FPCN21606X Issue Date: 12 January 2017 Reliability Data Summary: QV DEVICE NAME: STK534UC90A-E RMS: J35448 PACKAGE: SIP05F Test Specification Condition Interval Results HTSL JEITA EIAJ ED-4701/201 Ta=125°C 1008 hrs 0/11 TC JEITA EIAJ ED-4701/105 Ta= -40°C to +125°C 1000 cyc 0/11 AC JEITA EIAJ ED-4701/102 121°C, 100% RH, 15psig, unbiased 96 hrs 0/11 H3TRB JEITA EIAJ ED-4701/102 85°C, 85% RH, 80% max rated V 1008 hrs 0/11 QV DEVICE NAME: STK554U362C-E RMS: J35446 PACKAGE: SIP1A Test Specification Condition Interval Results HTSL JEITA EIAJ ED-4701/201 Ta=125°C 1008 hrs 0/11 TC JEITA EIAJ ED-4701/105 Ta= -40°C to +125°C 1000 cyc 0/11 AC JEITA EIAJ ED-4701/102 121°C, 100% RH, 15psig, unbiased 96 hrs 0/11 H3TRB JEITA EIAJ ED-4701/102 85°C, 85% RH, 80% max rated V 1008 hrs 0/11 Condition Interval Results QV DEVICE NAME: STK57FU394A-E RMS: J35450 PACKAGE: SIP2A Test Specification HTSL JEITA EIAJ ED-4701/201 Ta=125°C 1008 hrs 0/11 TC JEITA EIAJ ED-4701/105 Ta= -40°C to +125°C 1000 cyc 0/11 AC JEITA EIAJ ED-4701/102 121°C, 100% RH, 15psig, unbiased 96 hrs 0/11 H3TRB JEITA EIAJ ED-4701/102 85°C, 85% RH, 80% max rated V 1008 hrs 0/11 TEM001092 Rev. K Page 2 of 6 Final Product/Process Change Notification Document # : FPCN21606X Issue Date: 12 January 2017 QV DEVICE: NAME: STK5C4U332J-E RMS: J35466 PACKAGE: DIP-S Test Specification Condition Interval Results HTSL JEITA EIAJ ED-4701/201 Ta=125°C 1008 hrs 0/11 TC JEITA EIAJ ED-4701/105 Ta= -40°C to +125°C 1000 cyc 0/11 AC JEITA EIAJ ED-4701/102 121°C, 100% RH, 15psig, unbiased 96 hrs 0/11 H3TRB JEITA EIAJ ED-4701/102 85°C, 85% RH, 80% max rated V 1008 hrs 0/11 Condition Interval Results QV DEVICE NAME: STK5F1U3C3D-E RMS: J35467 PACKAGE: DIP4 Test Specification HTSL JEITA EIAJ ED-4701/201 Ta=125°C 1008 hrs 0/11 TC JEITA EIAJ ED-4701/105 Ta= -40°C to +125°C 1000 cyc 0/11 AC JEITA EIAJ ED-4701/102 121°C, 100% RH, 15psig, unbiased 96 hrs 0/11 H3TRB JEITA EIAJ ED-4701/102 85°C, 85% RH, 80% max rated V 1008 hrs 0/11 Condition Interval Results QV DEVICE NAME: STK621-068S-E RMS: J35454 PACKAGE: SIP3 Test Specification HTSL JEITA EIAJ ED-4701/201 Ta=125°C 1008 hrs 0/11 TC JEITA EIAJ ED-4701/105 Ta= -40°C to +125°C 1000 cyc 0/11 AC JEITA EIAJ ED-4701/102 121°C, 100% RH, 15psig, unbiased 96 hrs 0/11 H3TRB JEITA EIAJ ED-4701/102 85°C, 85% RH, 80% max rated V 1008 hrs 0/11 TEM001092 Rev. K Page 3 of 6 Final Product/Process Change Notification Document # : FPCN21606X Issue Date: 12 January 2017 Electrical Characteristic Summary: Electrical characteristic are not impacted. List of Affected Standard Parts: TEM001092 Rev. K Part Number Qualification Vehicle STK531-344A-E STK534UC90A-E STK531-367A-E STK534UC90A-E STK531-392A-E STK534UC90A-E STK531U340A-E STK534UC90A-E STK531U360A-E STK534UC90A-E STK531U369A-E STK534UC90A-E STK531U369C-E STK534UC90A-E STK531U36AA-E STK534UC90A-E STK531U390A-E STK534UC90A-E STK531U394A-E STK534UC90A-E STK531U395A-E STK534UC90A-E STK534U342C-E STK534UC90A-E STK534U362C-E STK534UC90A-E STK534U363C-E STK534UC90A-E STK534UC60A-E STK534UC90A-E STK534UC90A-E STK534UC90A-E STK541UC60C-E STK554U362C-E STK541UC62K-E STK554U362C-E STK544UC62K-E STK554U362C-E STK551-3A0A1-E STK554U362C-E STK551U362A-E STK554U362C-E STK551U392A-E STK554U362C-E STK551U3A2A-E STK554U362C-E STK554U361A-E STK554U362C-E STK554U362A-E STK554U362C-E STK554U362C-E STK554U362C-E STK554U392A-E STK554U362C-E STK554U394A-E STK554U362C-E STK554U3A1A-E STK554U362C-E STK57FU394AG-E STK57FU394A-E STK581U3A0D-E STK621-068S-E STK581U3C0D-E STK621-068S-E Page 4 of 6 Final Product/Process Change Notification Document # : FPCN21606X Issue Date: 12 January 2017 TEM001092 Rev. K STK581U3C2D-E STK621-068S-E STK58AUNP0D-E STK621-068S-E STK5C4-330J1-E STK5C4U332J-E STK5C4-340J-E STK5C4U332J-E STK5C4U332J-E STK5C4U332J-E STK5F1U3C2D-E STK5F1U3C3D-E STK5F1U3C3D-E STK5F1U3C3D-E STK5F1U3E0D-E STK5F1U3C3D-E STK5F1U3E2D-E STK5F1U3C3D-E STK5F1U3E3D-E STK5F1U3C3D-E STK5F4U3C2D-E STK5F1U3C3D-E STK5F4U3E2D-E STK5F1U3C3D-E STK5FK-CA0D-E STK5F1U3C3D-E STK5FK-CA1D-E STK5F1U3C3D-E STK5MFU3C1A-E STK621-068S-E STK621-014-E STK554U362C-E STK621-015B-E STK554U362C-E STK621-024A-E STK554U362C-E STK621-033A-E STK554U362C-E STK621-033D-E STK554U362C-E STK621-033N-E STK554U362C-E STK621-043C-E STK57FU394A-E STK621-043D-E STK57FU394A-E STK621-051F-E STK621-068S-E STK621-061-E STK621-068S-E STK621-068C-E STK621-068S-E STK621-068R-E STK621-068S-E STK621-068S-E STK621-068S-E STK621-140B-E STK554U362C-E STK621-141A-E STK554U362C-E STK621-150A-E STK57FU394A-E STK621-728S-E STK534UC90A-E STK625-728-E STK534UC90A-E STK625-728SG-E STK534UC90A-E STK760-211A-E STK57FU394A-E STK760-211C-E STK57FU394A-E STK760-213A-E STK621-068S-E Page 5 of 6 Final Product/Process Change Notification Document # : FPCN21606X Issue Date: 12 January 2017 TEM001092 Rev. K STK760-216-E STK5F1U3C3D-E STK760-220A-E STK621-068S-E STK760-221A-E STK621-068S-E Page 6 of 6