CX2016DB38400D0FLJCC

Specifications Drawing No. K1101-13745-372 1/11 Issued Date. Jan,23,2014 TO: Digi-Key Note：In case of specification change, KYOCERA Part Number also will be changed. Product Name Quartz Crystal Product Model CX2016DB Frequency Refer to K1101-13745-372 3/11 Nominal Frequency Customer Part Number - Customer Specification Number - KYOCERA Part Number Refer to K1101-13745-372 3/12 KYOCERA Part Number Remarks Pb-Free、RoHS Compliant、MSL 1 Customer Acceptance Accept Signature Approved Date Department Person in charge Seller KYOCERA Corporation Manufacturer KYOCERA Crystal Device Corporation 6 Takeda Tobadono-cho, Fushimi-ku, Kyoto 612-8501 Japan TEL. No. 075-604-3500 FAX. No. 075-604-3501 5850, Higashine-Koh, Higashine-Shi, Yamagata 999-3701 Japan TEL. No. 0237-43-5611 FAX. No. 0237-43-5615 Design Department Quality Assurance Approved by Checked by Issued by KYOCERA Crystal Device Corporation Crystal Units Engineering Section Crystal Units Division A. Kikuchi Y.Takahashi T. Nitoube Y. Kikuchi KYOCERA Crystal Device Corporation KBS-5079E Drawing No. K1101-13745-372 2/11 Revision History Rev.No. 1 2 Description of revise First Edition ･Frequency Addition. 16000kHz, 20000kHz Date Approved by Checked by Issued by Jul,29,2013 Y.Takahashi T. Nitoube Y. Kikuchi Jan,23,2014 Y.Takahashi T. Nitoube Y. Kikuchi KYOCERA Crystal Device Corporation KBS-5079E Drawing No. K1101-13745-372 3/11 [PART NUMBER LIST] Nominal Frequency (MHz) KYOCERA Part Number ESR (Ω) Nominal Frequency Code 16.000 CX2016DB16000D0FLJCC 200 16000 20.000 CX2016DB20000D0FLJCC 150 20000 26.000 CX2016DB26000D0FLJCC 80 26000 32.000 CX2016DB32000D0FLJCC 80 32000 38.400 CX2016DB38400D0FLJCC 60 38400 40.000 CX2016DB40000D0FLJCC 50 40000 KYOCERA Crystal Device Corporation KBS-5079E Drawing No. K1101-13745-372 4/11 1. APPLICATION This specification sheet is applied to quartz crystal “CX2016DB” 2. KYOCERA PART NUMBER Refer to K1101-13745-372 3/11 KYOCERA Part Number 3. RATINGS Items SYMB. Rating Unit Operating Temperature Topr -30 to +85 °C Storage Temperature range Tstg -40 to +85 °C Remarks 4. CHARACTERISTICS ELECTRICAL CHARACTERISTICS Items Electrical Specification SYMB. Min Typ. Max Mode of Vibration Fundamental Test Condition Nominal Frequency F0 ※1 MHz Nominal Temperature Load Capacitance TNOM 25 °C CL 8.0 pF Frequency Tolerance Frequency Temperature characteristics Frequency Ageing Rate Equivalent Series Resistance Drive Level df/F -10.0 +10.0 df/F -15.0 +15.0 Insulation Resistance Remarks Unit +25±3°C -30 to +85°C PPM -1.0 ESR Pd 0.01 IR 500 +1.0 1 year ※2 Ω 100 μW MΩ +25±3°C 100V(DC) ※1 Refer to K1101-13745-372 3/11 Nominal Frequency ※2 Refer to K1101-13745-372 3/11 ESR KYOCERA Crystal Device Corporation KBS-5079E Drawing No. K1101-13745-372 5/11 5. APPEARANCES, PHYSICAL DIMENSION OUTLINE DIMENSION (not to scale) 1 （TOP VIEW） 2.00±0.10 #4 #4 GND #3 1.60±0.10 ※ 3 K401 Y #2 #1 HOT #2 GND 4－R0.10 3 4 4－0.10 PIN NO. #1 #2 #3 #4 PIN Layout HOT GND HOT GND 4－0.57±0.10 #2 #1 4－0.49±0.10 2 0.15±0.025 0.40±0.05 #1 4-0.08 #3 HOT C 0.20 UNIT： mm #4 #3 MARKING 1 Nominal Frequency Move the number of maximum indication beams of the frequency to five digits，and omit less than kHz． 2 Identification [K] mark is surely 1Pin direction. 3 Date Code Year…LAST 1 DIGIT of YEAR AND WEEK (Ex)Jan,01, 2014 → 401 4 Manufacturing Location Y…Yamagata Z…Shiga Yohkaichi T…Thailand F…Philippines ※3 Refer to K1101-3745-372 3/11 Nominal Frequency Code The font of marking is reference. KYOCERA Crystal Device Corporation KBS-5079E Drawing No. K1101-13745-372 6/11 6. RECOMMENDED LAND PATTERN (not to scale) 0.5 0.9 0.8 1.1 0.3 0.8 0.9 UNIT： mm 1.4 KYOCERA Crystal Device Corporation KBS-5079E Drawing No. K1101-13745-372 7/11 7. TAPING&REEL 7-1.Dimensions 4.0±0.1 φ1.5± 0.1 0 Unreeling direction 1.75±0.1 2.0±0.05 2.35±0.10 2.30±0.05 3.5±0.05 1.95±0.1 4.0±0.1 0.7±0.05 1.90±0.1 0.2±0.05 8.0±0.2 φ1.05±0.05 7-2.Leader and trailer tape Empty compartment Empty compartment Component Leader END START 100～200mm 160mm or more 400～560mm 7-3.Direction（The direction shall be seen from the top cover tape side） 12345 K123 Y 12345 K123 Y 12345 K123 Y 12345 K123 Y Unreeling direction 7-4.Specification 1. Material of the carrier tape shall be polystyrene or A－PET (ESD). 2. Material of the seal tape shall be polyester (ESD). 3. The seal tape shall not cover the sprocket holes. And not protrude from the carrier tape. 4. Tensile strength of the tape: 10N or more. 5. The R of the corner without designation is 0.2RMAX. 6. The alignment between centers of the cavity and sprocket hole shall be 0.05mm or less. 7. Cumulative pitch tolerance of “P0” shall be ±0.2mm at 10 pitches. 8. Suppose that it unifies as shown in the above-mentioned figure to the directivity of printing in an embossing tape. 9. Peeling force of the seal tape: 0.1 to 1.0N. 10. The component can fall headlong naturally from taping in the environment, such dry conditions, when this components were transferred to, cover was removed and the component was moved upside down. 165°～180° Cover tape Career tape KYOCERA Crystal Device Corporation KBS-5079E Drawing No. K1101-13745-372 8/11 7-5.Reel Specification t W C D E B A In the case of φ180 Reel (3,000 pcs max, every 1,000 pcs) Symbol Dimension Symbol Dimension A B C D φ180 +0/-3 φ60 +1/-0 φ13±0.2 φ21±0.8 E W t 2.0±0.5 9±1 2.0±0.5 (Unit : mm) In the case of φ330 Reel (12,000 pcs max, every 1,000 pcs) Symbol Dimension Symbol Dimension A B C D φ330±2.0 φ100±1.0 φ13±0.2 φ21±0.8 E W t 2.0±0.5 9.5±0.5 2.2±0.1 (Unit : mm) KYOCERA Crystal Device Corporation KBS-5079E Drawing No. K1101-13745-372 9/11 8.Enviromental requirements After following test, frequency shall not change more than ±10×10－６ And CI，±20% or 5Ω of large value. 8.1 Resistance to Shock Test condition Natural dropped from height 100cm onto hard wood board in 3 times 8.2 Resistance to Vibration 8.3 Resistance to Heat Test condition frequency ： 10 - 55 - 10 Hz Amplitude ： 1.5mm Cycle time ： 15 minutes Direction ： X,Y,Z (3direction),2 h each. Test condition The quartz crystal unit shall be stored at a temperature of +85±2°C for 500 h. Then it shal be subjected to standard atmospheric conditions for 1 h ,after whichi measurement shall be made. 8.4 Resistance to Cold Test condition The quartz crystal unit shall be stored at a temperature of -40±2°C for 500 h. Then it shal be subjected to standard atmospheric conditions for 1 h ,after whichi measurement shall be made. 8.5 Thermal Shock Test condition The quartz crystal unit shall be subjected to 500 succesive change of temperature cycles ，each as shown in table below，Then it shall be subjected to standard atmospheric conditions for 1h，after which measurements shall be made. Cycle ：-40±2°C（30min.）to +25±2°C（5min.） to +85±2°C（30min.）to +25±2°C（5min.） KYOCERA Crystal Device Corporation KBS-5079E Drawing No. 8.6 Resistance to Moisture 8.7 Soldering condition K1101-13745-372 10/11 Test condition The quartz crystal unit shall be stored at a temperature of +60±2°C wich relative humidity of 90% to 95% for 240 h. Then it shall be subjected to standard atmospheric conditions for 1h，after which measurements shall be made 1.） Material of solder Kind … lead free solder paste Melting point … +220±5°C 2.） Reflow temp.profile Temp [°C] Preheating +150 to +180 Peak +260±5 Total ― Frequency shift : ±2ppm 3.） Hand Soldering +350°C 3 sec MAX 4.） Reflow Times 2 times Time[sec] 150 (typ.) 10 (max.) 300 (max.) Reflow temp.profile 8.8 Intensity for bending in circuit board Solder this product in center of the circuit board of 40mm×100mm， and add the deflection of 3mm as the bottom figure. Test board : t＝1.6mm 20 PUSH 1.6 board 10 R5 Product 45 45 R230 press jig UNIT : mm KYOCERA Crystal Device Corporation KBS-5079E Drawing No. K1101-13745-372 11/11 9. Cautions for use （1）Automatic mounting machine use Please use after affirmation that select the mounting machine model with a shock small if possible in the case of use of an automatic mounting machine, and it does not have breakage. There is a risk of a crystal oscillating child's breakage occurring and not functioning normally by too much shock etc. （2）Conformity of a circuit In case of use of an oscillation circuit, please insert in a crystal oscillating child in series resistance 5 times as many as the standard value of equivalent in-series resistance, and confirm oscillating. Please remove resistance which inserted after the notes above-mentioned examination in the crystal oscillating child in series, and use it. 10.Storage conditions Storage at prolonged high temperature or low temperature and the storage by high humidity cause degradation of frequency accuracy, and degradation of soldering nature. Storage is performed at the temperature of +18 to +30°C, and the humidity of 20 to 70 % in the state of packing, and a term is 6 months. 11. Manufacturing location Kyocera Crystal Device Corporation Kyocera Crystal Device Corporation Shiga Yohkaichi Plant Kyocera Crystal Device (Thailand) Co., Ltd Kyocera Crystal Device Philippines, Inc. 12. Quality Assurance Kyocera Crystal Device Quality Assurance Division 13. Quality guarantee When the failure by the responsibility of our company occurs clearly after delivery within 1 year, a substitute article etc. is appropriated gratuitously and this is guaranteed. However, when passing 1 year after delivery, there is a case where I am allowed to consider as onerous repair after both consultation. 14. Others When any questions and opinions are in the written matter of these delivery specifications, I will ask connection of you from the company issue day within 45 days. In a connection no case, a written matter is consented to it and employed within a term. KYOCERA Crystal Device Corporation KBS-5079E