CX2520DB12000D0FLJC1

厂商：
OPTREX(京瓷)
封装：
SMD2520_4P
描述：
无源晶振 12MHz 150Ω 8pF ±10ppm -30℃~+85℃ SMD2520_4P

数据手册：

下载CX2520DB12000D0FLJC1.pdf

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数据手册
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CX2520DB12000D0FLJC1 数据手册

Specifications Drawing No. USY1M-H1-16427-00 Apr,20,2016 Issued Date. 1 / 11 Messrs: KED USA Note: Part Number will be revised in case of specification change. Product Type Quartz Crystal Series CX2520DB Frequency Refer to Doc No.USY1M-H1-16427-00 Page 3/11 Customer Part Number - Customer Specification Number - KYOCERA Part Number Refer to Doc No.USY1M-H1-16427-00 Page 3/11 Remarks Pb-Free, RoHS Compliant, MSL 1 Customer Approval Approval Signature Approved Date Department Person in charge Seller KYOCERA Crystal Device Corporation (Sales Division) 6 Takeda Tobadono-cho, Fushimi-ku, Kyoto 612-8501 Japan TEL. No. 075-604-3500 FAX. No. 075-604-3501 Manufacturer KYOCERA Crystal Device Corporation Crystal Units Division 5850, Higashine-Koh, Higashine-Shi, Yamagata 999-3701 Japan TEL. No. 0237-43-5611 FAX. No. 0237-43-5615 Design Department Quality Assurance Approved by Checked by Issued by KYOCERA Crystal Device Corporation Crystal Unit Application Engineering Section Crystal Units Division S.Itoh T.Soda A.Muraoka Y.Nozaki KYOCERA Crystal Device Corporation KBS-5079G Drawing No. USY1M-H1-16427-00 2 / 11 Revision History Rev.No. 00 Description of revise First Edition Date Apr,20,2016 Approved by T.Soda Checked by A.Muraoka Issued by Y.Nozaki KYOCERA Crystal Device Corporation KBS-5079G Drawing No. USY1M-H1-16427-00 3 / 11 [Parts Number list] Nominal Frequency (MHz) 12.000 13.560 19.200 24.000 24.576 25.000 27.000 30.000 48.000 KYOCERA Part Number CX2520DB12000D0FLJC1 CX2520DB13560D0FLJC2 CX2520DB19200D0FLJC2 CX2520DB24000D0FLJCC CX2520DB24576D0FLJC1 CX2520DB25000D0FLJC1 CX2520DB27000D0FLJC1 CX2520DB30000D0FLJC1 CX2520DB48000D0FLJC2 ESR () Nominal Frequency Code 150 150 80 80 80 60 60 60 50 12000 13560 19200 24000 24576 25000 27000 30000 48000 KYOCERA Crystal Device Corporation KBS-5079G Drawing No. USY1M-H1-16427-00 4 / 11 1. APPLICATION The purpose of this document is applied to CX2016DB quartz crystal. 2. KYOCERA PART NUMBER Refer to Doc No.USY1M-H1-16427-00 Page 3/11 3. RATINGS Items SYMB. Rating Unit Operating Temperature range Topr -30~+85 deg. C Storage Temperature range Tstg -40~+85 deg. C Remarks 4. CHARACTERISTICS 4-1 ELECTRICAL CHARACTERISTICS SYMB. Electrical Specification Min Typ. Max Fundamental Unit Nominal Frequency F0 (*1) MHz Nominal Temperature TNOM +25 °C Load Capacitance CL 8.0 pF Frequency Tolerance df/F -10.0 +10.0 Frequency Temperature characteristics df/F -15.0 +15.0 -1.0 +1.0 Items Mode of Vibration Frequency Ageing Rate Equivalent Series Resistance ESR Drive Level Pd 0.01 Insulation Resistance IR 500 Test Condition Remarks +25±3°C PPM -30°C ~+85°C ST 1 year +25±3°C Ω (*2) 100 μW MΩ 100V(DC) Measurement Condition Frequency measurement Measuring instrument : IEC PI-Network Test Fixture IEC 60444-8 STD (Pi circuit 41901A) Equivalent series resistance (ESR) measurement Measuring instrument : IEC PI-Network Test Fixture Load Capacitance : Series *1 *2 Refer to Doc No.USY1M-H1-16427-00 Page 3/11 KYOCERA Crystal Device Corporation KBS-5079G Drawing No. USY1M-H1-16427-00 5 / 11 5. APPEARANCES, PHYSICAL DIMENSION OUTLINE DIMENSION (not to scale) 1 (Top View) (TOP VIEW) (Connection) 2.50±0.10 #4 #4 GND #3 GND (NC) 26000 2.00±0.10 #3 HOT K601Z GND #2 #1 4 3 #2 GND PIN NO. #1 #2 #3 #4 4-0.20 2 0.50±0.05 #1 HOT 4-R0.15 (Side View) (Bottom View) PIN Layout HOT GND HOT GND(NC) #1 4-0.56±0.10 4-0.66±0.1 #2 8-0.115 C 0.20 UNIT: mm #4 #3 MARKING 1 First 5digit of the frequency is indicated. *3 2 Nominal Frequency Identification 3 Date Code Last 1 Digit of YEAR and WEEK (Ex) 2016,Jan,01  601 4 Manufacturing Location YJapan (Yamagata ) ZJapan (Shiga Yohkaichi ) TThailand [K] is to indicate 1Pin direction. *The font of marking is for reference only. *3 Refer to Doc No.USY1M-H1-16427-00 Page 3/11 KYOCERA Crystal Device Corporation KBS-5079G Drawing No. USY1M-H1-16427-00 6 / 11 6. RECOMMENDED LAND PATTERN (not to scale) 0.5 1.2 1.0 1.3 0.3 1.0 1.2 UNIT: mm 1.7 KYOCERA Crystal Device Corporation KBS-5079G Drawing No. USY1M-H1-16427-00 7 / 11 7. TAPING&REEL 7-1.Dimensions 4.0±0.1 1.5 0.1 0 2.0±0.05 1.75±0.1 Unreeling direction 2.85±0.10 3.5±0.05 8.0±0.2 1.05±0.05 2.35±0.1 0.6±0.05 0.2±0.05 4.0±0.1 7-2.Leader and trailer tape Empty compartment Empty compartment Component END Leader START 100~200mm 160mm or more 400~560mm 7-3.Direction(The direction shall be seen from the top cover tape side) 12345 K123 Z 12345 K123 Z 12345 K123 Z 12345 K123 Z Unreeling direction 7-4.Specification 1. Material of the carrier tape is either polystyrene or A-PET (ESD). 2. Material of the cover tape is polyester (ESD). 3. The seal tape shall not cover the sprocket holes and not protrude from the carrier tape. 4. Tensile strength of carrier tape: 10N or more. 5. The R of the corner of each cavity is 0.2RMAX. 6. The alignment between centers of the cavity and sprocket hole shall be 0.05mm or less. 7. The orientation shall be checked from the top cover tape side as shown in 8-3. 8. Peeling force of cover tape: 0.1 to 1.0N. 9. The component will fall out naturally when cover tape is removed and set upside down. 165°~180° Cover tape Career tape KYOCERA Crystal Device Corporation KBS-5079G Drawing No. USY1M-H1-16427-00 8 / 11 7-5.Reel Specification W C D E B A 180 Reel (3,000 pcs Max.) Symbol Dimension A B C 180 +0/-3 60 +1/-0 13±0.2 D E W 21±0.8 2.0±0.5 9±1 Symbol Dimension (Unit: mm) 330 Reel (12,000 pcs Max.) Symbol Dimension Symbol Dimension A B C 330±2.0 100±1.0 13±0.2 D E W 21±0.8 2.0±0.5 9.5±0.5 (Unit: mm) KYOCERA Crystal Device Corporation KBS-5079G Drawing No. USY1M-H1-16427-00 9 / 11 8. Enviromental requirements After conducting the following tests, component needs to meet below conditions. Frequency: Fluctuation within +/-10 x 10-6 CI: Fluctuation within +/-20% or 5Ω whichever is larger 8.1 Resistance to Shock Test condition 3 times natural drop from 100cm onto hard wooden board. 8.2 Resistance to Vibration 8.3 Resistance to Heat Test condition frequency : 10 - 55 - 10 Hz Amplitude : 1.5mm Cycle time : 15 minutes Direction : X,Y,Z (3direction),2h each. Test condition The quartz crystal unit shall be stored at a temperature of +852°C for 500h and subjected to room temperature for 1h before measurement. 8.4 Resistance to Cold Test condition The quartz crystal unit shall be stored at a temperature of -402°C for 500h and subjected to room temperature for 1h before measurement. 8.5 Thermal Shock Test condition The quartz crystal unit shall be subjected to 500 temperature cycles shown in table below,Then it shall be subjected to room temperature for 1h before mesurement. Cycle :-402°C (30min.) +252°C(5min.)  +852°C(30min.) +252°C(5min.) KYOCERA Crystal Device Corporation KBS-5079G Drawing No. 8.6 Resistance to Moisture 8.7 Soldering condition USY1M-H1-16427-00 10 / 11 Test condition The quartz crystal unit shall be stored at a temperature of +602°C with relative humidity of 90% to 95% for 240 h. Then it shall be subjected to room temperature for 1h before measurement. 1.) Type of solder Material  lead free solder paste Melting point  +2205°C 2.) Reflow temp.profile Temp [°C] Time[sec] Preheating +150 to +180 150 (typ.) Peak 10 (max.) +2605 Total --300 (max.) Frequency shift : 2ppm 3.) Hand Soldering +350°C 3 sec max 4.) Reflow Times 2 times in below Reflow temp. profile Reflow temp.profile 8.8 Bending Strength Solder this product in center of the circuit board (40mm X 100mm), and add deflection of 3mm. Test board : t=1.6mm 20 PUSH 1.6 board 10 R5 Product 45 45 R230 Press jig UNIT: mm KYOCERA Crystal Device Corporation KBS-5079G Drawing No. USY1M-H1-16427-00 11 / 11 9. Cautions for use (1)Soldering upon mounting There is a possibility to influence product characteristics when Solder paste or conductive glue comes in contact with product lid or surface. (2)When using mounting machine Please minimize the shock when using mounting machine to avoid any excess stress to the product. (3)Conformity of a circuit We strongly recommend to make sure that Negative resistance (Gain) of IC is designed to be 5 times the ESR (Equivalent Series Resistance) of crystal unit. 10. Storage conditions Please store product in below conditions, and use within 6 months. Temperature +18 to +30°C, and Humidity of 20 to 70 % in the packaging condition. 11. Manufacturing location Kyocera Crystal Device Corporation Yamagata Plant Kyocera Crystal Device Corporation Shiga Yohkaichi Plant Kyocera Crystal Device (Thailand) Co., Ltd 12. Quality Assurance To be guaranteed by Kyocera Crystal Device Quality Assurance Division 13. Quality guarantee In case when Kyocera Crystal Device Corporation rooted failure occurred within 1year after its delivery, substitute product will be arranged based on discussion. Quality guarantee of product after 1year of its delivery is waivered. 14. Others In case of any questions or opinions regarding the Specification, please have it in written manner within 45 days after issued date. KYOCERA Crystal Device Corporation KBS-5079G

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CX2520DB12000D0FLJC1

1. 物料型号：文档中列出了多个型号，例如CX2520DB12000DOFLJC1、CX2520DB13560DOFLJC2等，这些型号属于KYOCERA公司生产的石英晶体。

2. 器件简介：文档提到了石英晶体的用途，适用于CX2016DB系列。

3. 引脚分配：文档中提供了引脚布局图，包括HOT和GND(NC)的分配。

4. 参数特性：包括工作温度范围、存储温度范围、电气特性等，如频率公差、频率温度特性、频率老化率、等效串联电阻(ESR)、驱动电平、绝缘电阻等。

5. 功能详解：文档中详细描述了石英晶体的电气特性和测试条件。

6. 应用信息：文档中提到了推荐的焊盘图案和封装信息。

7. 封装信息：提供了封装的尺寸和胶带卷的规格。

8. 环境要求：包括抗冲击、抗振动、耐热、耐冷、热冲击和耐湿性测试。

9. 使用注意事项：包括焊接时的注意事项、使用贴装机时的注意事项、电路设计的建议等。

10. 存储条件：建议在特定温度和湿度条件下存储，并在6个月内使用。