CX2520DB32000D0WZRC1

Specifications Drawing No. UKY1C-H1-15838-00[31] 1/11 Issued Date. Jul,15,2015 TO: Digi-Key Note：In case of specification change, KYOCERA Part Number also will be changed. Product Name Quartz Crystal Product Model CX2520DB Frequency 32000kHz Customer Part Number - Customer Specification Number - KYOCERA Part Number CX2520DB32000D0WZRC1 Remarks Pb-Free、RoHS Compliant、MSL 1 Customer Acceptance Accept Signature Approved Date Department Person in charge Seller KYOCERA Crystal Device Corporation Manufacturer (Sales Division) 6 Takeda Tobadono-cho, Fushimi-ku, Kyoto 612-8501 Japan TEL. No. 075-604-3500 FAX. No. 075-604-3501 Crystal Units Division 5850, Higashine-Koh, Higashine-Shi, Yamagata 999-3701 Japan TEL. No. 0237-43-5611 FAX. No. 0237-43-5615 Design Department Quality Assurance Approved by Checked by Issued by KYOCERA Crystal Device Corporation Field Application Engineering Section Crystal Units Division T. Noritake K. Yamazaki T. Nitoube Y. Kikuchi KYOCERA Crystal Device Corporation KBS-5079G Drawing No. UKY1C-H1-15838-00[31] 2/11 Revision History Rev.No. 1 Description of revise First Edition Date Approved by Checked by Issued by Jul,15,2015 K. Yamazaki T. Nitoube Y. Kikuchi KYOCERA Crystal Device Corporation KBS-5079G Drawing No. UKY1C-H1-15838-00[31] 3/11 1. APPLICATION This specification sheet is applied to quartz crystal “CX2520DB32000D0WZRC1” 2. KYOCERA PART NUMBER CX2520DB32000D0WZRC1 3. RATINGS Items SYMB. Rating Unit Operating Temperature Topr -25 to +75 °C Storage Temperature range Tstg -40 to +85 °C Remarks 4. CHARACTERISTICS ELECTRICAL CHARACTERISTICS Items Electrical Specification SYMB. Min Typ. Max Mode of Vibration Fundamental Test Condition Unit Nominal Frequency F0 32 MHz Nominal Temperature Load Capacitance TNOM +25 °C CL 8.0 pF Frequency Tolerance Frequency Temperature characteristics Frequency Aging Rate Equivalent Series Resistance Shunt Capacitance Drive Level df/F +25±3°C df/F -25 to +75°C Insulation Resistance -40.0 +40.0 PPM 1st year ESR 50 Ω C0 3.0 pF 100 μW Pd 0.01 IR 500 Remarks MΩ +25±3°C 100V(DC) KYOCERA Crystal Device Corporation KBS-5079G Drawing No. UKY1C-H1-15838-00[31] 4/11 5. Measurement Condition 5.1 Frequency measurement Measuring instrument : IEC PI-Network Test Fixture Load Capacitance : 8.0pF Drive Level : 10μW 5.2 Equivalent series resistance (ESR) measurement Measuring instrument : IEC PI-Network Test Fixture Load Capacitance : Series Drive Level : 10μW KYOCERA Crystal Device Corporation KBS-5079G Drawing No. UKY1C-H1-15838-00[31] 5/11 6. APPEARANCES, PHYSICAL DIMENSION OUTLINE DIMENSION (not to scale) 1 (Top View) （TOP VIEW） (Connection) #4 GND #3 HOT 2.50±0.10 #4 #3 GND (NC) 2.00±0.10 32000 K501 Y GND #2 #1 HOT #2 GND 4－R0.15 2 4 3 PIN NO. #1 #2 #3 #4 4-0.20 0.50±0.05 #1 (Side View) (Bottom View) PIN Layout HOT GND HOT GND #1 4－0.56±0.10 4－0.66±0.1 #2 8－0.115 C 0.20 UNIT： mm #4 #3 MARKING 1 Nominal Frequency Move the number of maximum indication beams of the frequency to five digits，and omit less than kHz． 2 Identification [K] mark is surely 1Pin direction. 3 Date Code Year…LAST 1 DIGIT of YEAR AND WEEK (Ex)Jan,01, 2015 → 501 4 Manufacturing Location Y…Japan(Yamagata) Z…Japan(Shiga Yohkaichi) T…Thailand ※The font of marking is reference. KYOCERA Crystal Device Corporation KBS-5079G Drawing No. UKY1C-H1-15838-00[31] 6/11 7. RECOMMENDED LAND PATTERN (not to scale) 0.5 1.2 1.0 1.3 0.3 1.0 1.2 UNIT： mm 1.7 KYOCERA Crystal Device Corporation KBS-5079G Drawing No. UKY1C-H1-15838-00[31] 7/11 8. TAPING&REEL 8-1.Dimensions 4.0±0.1 φ1.5± 0.1 0 2.0±0.05 2.85±0.10 2.35±0.1 4.0±0.1 0.6±0.05 0.2±0.05 2.2±0.05 2.7±0.05 1.75±0.1 Unreeling direction 3.5±0.05 8.0±0.2 φ1.05±0.05 8-2.Leader and trailer tape Empty compartment Empty compartment Component END Leader START 100～200mm 160mm or more 400～560mm 8-3.Direction（The direction shall be seen from the top cover tape side） 12345 K123 Y 12345 K123 Y 12345 K123 Y 12345 K123 Y Unreeling direction 8-4.Specification 1. Material of the carrier tape is either polystyrene or A－PET (ESD). 2. Material of the cover tape is polyester (ESD). 3. The seal tape shall not cover the sprocket holes and not protrude from the carrier tape. 4. Tensile strength of carrier tape: 10N or more. 5. The R of the corner of each cavity is 0.2RMAX. 6. The alignment between centers of the cavity and sprocket hole shall be 0.05mm or less. 7. The orientation shall be checked from the top cover tape side as shown in 8-3. 8. Peeling force of cover tape: 0.1 to 1.0N. 9. The component will fall out naturally when cover tape is removed and set upside down. 165°～180° Cover tape Career tape KYOCERA Crystal Device Corporation KBS-5079G Drawing No. UKY1C-H1-15838-00[31] 8/11 8-5.Reel Specification t W C D E B A φ180 Reel (3,000 pcs Max.) Symbol Dimension A B C D φ180 +0/-3 φ60 +1/-0 φ13±0.2 φ21±0.8 E W t 2.0±0.5 9±1 2.0±0.5 Symbol Dimension (Unit : mm) φ330 Reel (12,000 pcs Max.) Symbol Dimension Symbol Dimension A B C D φ330±2.0 φ100±1.0 φ13±0.2 φ21±0.8 E W t 2.0±0.5 9.5±0.5 2.2±0.1 (Unit : mm) KYOCERA Crystal Device Corporation KBS-5079G Drawing No. UKY1C-H1-15838-00[31] 9/11 9.Enviromental requirements After conducting the following tests, component needs to meet below conditions. Frequency: Fluctuation within +/-10 x 10－６ CI: Fluctuation within +/-20% or 5Ω whichever is larger 9.1 Resistance to Shock Test condition 3 times natural drop from 100cm onto hard wooden board. 9.2 Resistance to Vibration 9.3 Resistance to Heat Test condition frequency ： 10 - 55 - 10 Hz Amplitude ： 1.5mm Cycle time ： 15 minutes Direction ： X,Y,Z (3direction),2h each. Test condition The quartz crystal unit shall be stored at a temperature of +85±2°C for 500h and subjected to room temperature for 1h before measurement. 9.4 Resistance to Cold Test condition The quartz crystal unit shall be stored at a temperature of -40±2°C for 500h and subjected to room temperature for 1h before measurement. 9.5 Thermal Shock Test condition The quartz crystal unit shall be subjected to 500 temperature cycles shown in table below，Then it shall be subjected to room temperature for 1h before mesurement. Cycle ：-40±2°C（30min.）→ +25±2°C（5min.） → +85±2°C（30min.）→ +25±2°C（5min.） KYOCERA Crystal Device Corporation KBS-5079G Drawing No. 9.6 Resistance to Moisture 9.7 Soldering condition UKY1C-H1-15838-00[31] 10/11 Test condition The quartz crystal unit shall be stored at a temperature of +60±2°C with relative humidity of 90% to 95% for 240 h. Then it shall be subjected to room temperature for 1h before measurement. 1.） Type of solder Material … lead free solder paste Melting point … +220±5°C 2.） Reflow temp.profile Temp [°C] Time[sec] Preheating +150 to +180 150 (typ.) Peak +260±5 10 (max.) Total ― 300 (max.) Frequency shift : ±2ppm 3.） Hand Soldering +350°C 3 sec max 4.） Reflow Times 2 times in below Reflow temp. profile Reflow temp.profile 9.8 Bending Strength Solder this product in center of the circuit board (40mm×100mm), and add deflection of 3mm. Test board : t＝1.6mm 20 PUSH 1.6 board 10 R5 Product 45 45 R230 press jig UNIT : mm KYOCERA Crystal Device Corporation KBS-5079G Drawing No. UKY1C-H1-15838-00[31] 11/11 10. Cautions for use （1）Soldering upon mounting There is a possibility to influence product characteristics when Solder paste or conductive glue comes in contact with product lid or surface. （2）When using mounting machine Please minimize the shock when using mounting machine to avoid any excess stress to the product. （3）Conformity of a circuit We strongly recommend to make sure that Negative resistance (Gain) of IC is designed to be 5 times the ESR (Equivalent Series Resistance) of crystal unit. 11. Storage conditions Please store product in below conditions, and use within 6 months. Temperature +18 to +30°C, and Humidity of 20 to 70 % in the packaging condition. 12. Manufacturing location Kyocera Crystal Device Corporation / Japan(Yamagata) Kyocera Crystal Device Corporation Shiga Yohkaichi Plant / Japan(Shiga) Kyocera Crystal Device (Thailand) Co., Ltd / Thailand(Lamphun) 13. Quality Assurance To be guaranteed by Kyocera Crystal Device Quality Assurance Division 14. Quality guarantee In case when Kyocera Crystal Device Corporation rooted failure occurred within 1year after its delivery, substitute product will be arranged based on discussion. Quality guarantee of product after 1year of its delivery is waivered. 15. Others In case of any questions or opinions regarding the Specification, please have it in written manner within 45 days after issued date. KYOCERA Crystal Device Corporation KBS-5079G