CX3225SB54000D0WPSC1

Specifications Drawing No. UKY1C-H1-14D79-00[43] 1/11 Issued Date. Dec,12,2014 TO: KED USA Note：In case of specification change, KYOCERA Part Number also will be changed. Product Name Quartz Crystal Product Model CX3225SB Frequency 54000kHz Customer Part Number - Customer Specification Number - KYOCERA Part Number CX3225SB54000D0WPSC1 Remarks Pb-Free、RoHS Compliant、MSL 1 Customer Acceptance Accept Signature Approved Date Department Person in charge Seller KYOCERA Crystal Device Corporation Manufacturer (Sales Division) 6 Takeda Tobadono-cho, Fushimi-ku, Kyoto 612-8501 Japan TEL. No. 075-604-3500 FAX. No. 075-604-3501 Crystal Units Division 5850, Higashine-Koh, Higashine-Shi, Yamagata 999-3701 Japan TEL. No. 0237-43-5611 FAX. No. 0237-43-5615 Design Department Quality Assurance Approved by Checked by Issued by KYOCERA Crystal Device Corporation Crystal Units Engineering Section 1 T. Noritake K. Yamazaki Crystal Units Division T. Nitoube Y. Kikuchi KYOCERA Crystal Device Corporation KBS-5079E Drawing No. UKY1C-H1-14D79-00[43] 2/11 Revision History Rev.No. 1 Description of revise First Edition Date Approved by Checked by Issued by Dec,12,2014 K. Yamazaki T. Nitoube Y. Kikuchi KYOCERA Crystal Device Corporation KBS-5079E Drawing No. UKY1C-H1-14D79-00[43] 3/11 1. APPLICATION This specification sheet is applied to quartz crystal “CX3225SB54000D0WPSC1” 2. KYOCERA PART NUMBER CX3225SB54000D0WPSC1 3. RATINGS Items SYMB. Rating Unit Operating Temperature Topr -40 to +85 °C Storage Temperature range Tstg -40 to +85 °C Remarks 4. CHARACTERISTICS ELECTRICAL CHARACTERISTICS Items Electrical Specification SYMB. Min Typ. Max Mode of Vibration Fundamental Test Condition Unit Nominal Frequency F0 54 MHz Nominal Temperature Load Capacitance TNOM +25 °C CL 8.0 pF Frequency Stability & Accuracy Equivalent Series Resistance Shunt Capacitance Pull ability df/F Drive Level -50.0 +50.0 ESR 23 C0 2.0 31 Pd 0.01 Remarks PPM *Note Initial:±15ppm TC:±30ppm Ω pF ppm/pF 200 μW Insulation IR 500 MΩ 100V(DC) Resistance *Note : The sum of Frequency stability and accuracy is guaranteed with the following conditions 1) Temperature range of -40°C to +85°C 2) Frequency drift after 2 solder reflows 3) Drive power from 25 μA to 200 μA 4) 15 years of aging at any temperature from -40°C to +85°C KYOCERA Crystal Device Corporation KBS-5079E Drawing No. UKY1C-H1-14D79-00[43] 4/11 5. Measurement Condition 5.1 Frequency measurement Measuring instrument : IEC PI-Network Test Fixture Load Capacitance : 8.0pF Drive Level : 10μW 5.2 Equivalent series resistance (ESR) measurement Measuring instrument : IEC PI-Network Test Fixture Load Capacitance : Series Drive Level : 10μW KYOCERA Crystal Device Corporation KBS-5079E Drawing No. UKY1C-H1-14D79-00[43] 5/11 6. APPEARANCES, PHYSICAL DIMENSION OUTLINE DIMENSION (not to scale) 1 （TOP VIEW） (Connection) (Top View) 3.20±0.10 #4 #4 GND #3 2.50±0.10 54000 K401Y #2 #1 HOT #2 GND 4－R0.20 3 4 (Side View) (Bottom View) PIN NO. #1 #2 #3 #4 PIN Layout HOT GND HOT GND 4－1.0±0.1 #2 #1 4－0.75±0.1 2 0.20±0.04 0.55±0.05 #1 8－0.10±0.1 #3 HOT C 0.30 UNIT： mm #4 #3 MARKING 1 Nominal Frequency Move the number of maximum indication beams of the frequency to five digits，and omit less than kHz． 2 Identification [K] mark is surely 1Pin direction. 3 Date Code Year…LAST 1 DIGIT of YEAR AND WEEK (Ex)Jan, 01, 2014 → 401 4 Manufacturing Location Y…Japan(Yamagata) Z…Japan(Shiga Yohkaichi) T…Thailand F…Philippines ※The font of marking is reference. KYOCERA Crystal Device Corporation KBS-5079E Drawing No. UKY1C-H1-14D79-00[43] 6/11 7. RECOMMENDED LAND PATTERN (not to scale) 1.0 1.3 1.05 1.85 0.8 1.05 1.3 UNIT： mm 2.3 KYOCERA Crystal Device Corporation KBS-5079E Drawing No. UKY1C-H1-14D79-00[43] 7/11 8.TAPING & REEL 8-1.Dimensions 4.0±0.1 φ1.55±0.05 Unreeling direction 1.75±0.1 2.0±0.05 (3.7) 3.5±0.1 3.5±0.05 (3.0) 2.8±0.1 1.0±0.1 4.0±0.05 0.25±0.05 8.0±0.2 φ1.05±0.1 8-2.Leader and trailer tape Components Empty compartment Empty compartment Leader END START 160mm or more 100～200mm 400～560mm 8-3.Direction（The direction shall be seen from the top cover tape side） Unreeling direction 12345 K123Y 12345 K123Y 12345 K123Y 12345 K123Y 8-4.Specification 1. Material of the carrier tape is either polystyrene or A－PET (ESD). 2. Material of the cover tape is polyester (ESD). 3. The seal tape shall not cover the sprocket holes and not protrude from the carrier tape. 4. Tensile strength of carrier tape: 10N or more. 5. The R of the corner of each cavity is 0.2RMAX. 6. The alignment between centers of the cavity and sprocket hole shall be 0.05mm or less. 7. The orientation shall be checked from the top cover tape side as shown in 8-3. 8. Peeling force of cover tape: 0.1 to 1.0N. 9. The component will fall out naturally when cover tape is removed and set upside down. . 165°～180° Cover tap Career tape KYOCERA Crystal Device Corporation KBS-5079E Drawing No. UKY1C-H1-14D79-00[43] 8/11 8-5.Reel Specification t W C D E B A In the case of Φ180 Reel (3,000 pcs max, every 1,000 pcs) Symbol Dimension Symbol Dimension A B C D φ180 +0/-3 φ60 +1/-0 φ13±0.2 φ21±0.8 E W t 2.0±0.5 9±1 2.0±0.5 (Unit : mm) In the case of Φ330 Reel (10,000 pcs max, every 1,000 pcs) Symbol Dimension Symbol Dimension A B C D φ330±2.0 φ100±1.0 φ13±0.2 φ21±0.8 E W t 2.0±0.5 9.5±0.5 2.2±0.1 (Unit : mm) KYOCERA Crystal Device Corporation KBS-5079E Drawing No. UKY1C-H1-14D79-00[43] 9/11 9. Environmental requirements After following test, frequency shall not change more than ±10×10－６ And CI，±20% or 5Ω of large value. 9.1 Resistance to Shock Test condition Natural dropped from height 100cm onto hard wood board in 3 times 9.2 Resistance to Vibration 9.3 Resistance to Heat Test condition frequency ： 10 - 55 - 10 Hz Amplitude ： 1.5mm Cycle time ： 15 minutes Direction ： X,Y,Z (3direction),2 h each. Test condition The quartz crystal unit shall be stored at a temperature of +85±2°C for 500 h. Then it shal be subjected to standard atmospheric conditions for 1 h ,after whichi measurement shall be made. 9.4 Resistance to Cold Test condition The quartz crystal unit shall be stored at a temperature of -40±2°C for 500 h. Then it shal be subjected to standard atmospheric conditions for 1 h ,after whichi measurement shall be made. 9.5 Thermal Shock Test condition The quartz crystal unit shall be subjected to 500 succesive change of temperature cycles ，each as shown in table below，Then it shall be subjected to standard atmospheric conditions for 1h，after which measurements shall be made. Cycle ：-40±2°C（30min.）to +25±2°C（5min.） to +85±2°C（30min.）to +25±2°C（5min.） KYOCERA Crystal Device Corporation KBS-5079E Drawing No. 9.6 Resistance to Moisture 9.7 Soldering condition UKY1C-H1-14D79-00[43] 10/11 Test condition The quartz crystal unit shall be stored at a temperature of +60±2°C wich relative humidity of 90% to 95% for 240 h. Then it shall be subjected to standard atmospheric conditions for 1h，after which measurements shall be made 1.） Material of solder Kind … lead free solder paste Melting point … +220±5°C 2.） Reflow temp.profile Temp [°C] Preheating +150 to +180 Peak +260±5 Total ― Frequency shift : ±2ppm 3.） Hand Soldering +350°C 3 sec MAX 4.） Reflow Times 2 times Time[sec] 150 (typ.) 10 (max.) 300 (max.) Reflow temp.profile 9.8 Intensity for bending in circuit board Solder this product in center of the circuit board of 40mm×100mm， and add the deflection of 3mm as the bottom figure. Test board : t＝1.6mm 20 PUSH 1.6 board 10 R5 Product 45 45 R230 press jig UNIT : mm KYOCERA Crystal Device Corporation KBS-5079E Drawing No. UKY1C-H1-14D79-00[43] 11/11 10. Cautions for use （1）Soldering upon mounting There is a possibility to influence product characteristics when Solder paste or conductive glue comes in contact with product lid or surface. （2）When using mounting machine Please minimize the shock when using mounting machine to avoid any excess stress to the product. （3）Conformity of a circuit We strongly recommend to make sure that Negative resistance (Gain) of IC is designed to be 5 times the ESR (Equivalent Series Resistance) of crystal unit. 11. Storage conditions Please store product in below conditions, and use within 6 months. Temperature +18 to +30°C, and Humidity of 20 to 70 % in the packaging condition. 12. Manufacturing location Kyocera Crystal Device Corporation Plant Kyocera Crystal Device Corporation Shiga Yohkaichi Plant Kyocera Crystal Device (Thailand) Co., Ltd Kyocera Crystal Device Philippines, Inc. 13. Quality Assurance To be guaranteed by Kyocera Crystal Device Quality Assurance Division 14. Quality guarantee In case when Kyocera Crystal Device Corporation rooted failure occurred within 1year after its delivery, substitute product will be arranged based on discussion. Quality guarantee of product after 1year of its delivery is waivered. 15. Others In case of any questions or opinions regarding the Specification, please have it in written manner within 45 days after issued date. KYOCERA Crystal Device Corporation KBS-5079E