CX8045GA04000H0PST03

Specifications Drawing No. UKY1C-H1-16228-00[32] 1/10 Issued Date. Mar. 2,2016 TO: Digi-Key Note：In case of specification change, KYOCERA Part Number also will be changed. Product Name Quartz Crystal Product Model CX8045GA Frequency 4000kHz Customer Part Number - Customer Specification Number - KYOCERA Part Number CX8045GA04000H0PST03 Remarks RoHS Compliant、MSL 1 AEC-Q200 conformity Customer Acceptance Accept Signature Approved Date Department Person in charge Seller KYOCERA Crystal Device Corporation Manufacturer (Crystal products Sales Division) 6 Takeda Tobadono-cho, Fushimi-ku, Kyoto 612-8501 Japan TEL. No. 075-604-3500 FAX. No. 075-604-3501 Crystal Units Division Design Department 5850, Higashine-Koh, Higashine-Shi, Yamagata 999-3701 Japan TEL. No. 0237-43-5611 FAX. No. 0237-43-5615 Quality Assurance Approved by Examination by Issued by KYOCERA Crystal Device Corporation Crystal Units Engineering Section T. Noritake H. Shoji A.Ito M.Hashimoto Crystal Units Division KYOCERA Crystal Device Corporation KBS-5079G Drawing No. UKY1C-H1-16228-00[32] 2/10 Revision History Rev.No. 1 Description of revise First Edition Date Approved by Examination by Issued by Mar. 2,2016 H.Shoji A.Ito M. Hashimoto KYOCERA Crystal Device Corporation KBS-5079G Drawing No. UKY1C-H1-16228-00[32] 3/10 1. APPLICATION This specification sheet is applied to quartz crystal “CX8045GA04000H0PST03” 2. KYOCERA PART NUMBER CX8045GA04000H0PST03 3. RATINGS Items SYMB. Rating Unit Operating Temperature Topr -40 to +125 °C Storage Temperature Range Tstg -40 to +150 °C Remarks 4. CHARACTERISTICS ELECTRICAL CHARACTERISTICS Items SYMB. Electrical Specification Min. Typ. Max. Fundamental Unit F0 4 MHz TNOM +25 °C CL 12.0 pF Mode of Vibration Nominal Frequency Nominal Temperature Load Capacitance Frequency Tolerance Frequency Temperature Characteristics Frequency Aging Rate Equivalent Series Resistance Drive Level Insulation Resistance Test Condition df/F -50.0 +50.0 25 ±3°C df/F -100.0 +100.0 -40 to +125°C Remarks PPM -5.0 ESR Pd 0.01 IR 500 1st year +5.0 300 Ω 500 µW MΩ +25 ±3°C 100V(DC) KYOCERA Crystal Device Corporation KBS-5079G Drawing No. UKY1C-H1-16228-00[32] 4/10 5. MEASUREMENT CONDITION 5.1 Frequency measurement Measuring instrument : PI-Network Test Fixture Load Capacitance : 12.0pF Drive Level : 10µW 5.2 Equivalent series resistance (ESR) measurement Measuring instrument : PI-Network Test Fixture Load Capacitance : Series Drive Level : 10µW KYOCERA Crystal Device Corporation KBS-5079G Drawing No. UKY1C-H1-16228-00[32] 5/10 6. APPEARANCES, PHYSICAL DIMENSION OUTLINE DIMENSION (not to scale) （Top View） ４０００ KC 601Y 2 1 4 3 B 1.8±0.2 8.0±0.3 D 4.5±0.3 2.0±0.1 1.2±0.1 C A 4‐R0.1±0.1 1.5±0.1 （Bottom View） Unit : mm A Terminal W-Ni-Au (Pb-Free) B CAP CERAMICS（BLACK） C BASE CERAMICS（BLACK） D GLASS LOW TEMPERATURE GLASS MARKING NOTE 1 NOMINAL FREQUENCY （5 DIGITS MAX） UNIT： kHz 2 IDENTIFICATION 3 DATE CODE － YEAR ‥‥ LAST 1 DIGIT of YEAR AND WEEK EXAMPLE ‥‥Jan. 1,2016 → 601 4 MANUFACTURING LOCATION Y…Japan(Yamagata) T…Thailand *The font of marking is reference. KYOCERA Crystal Device Corporation KBS-5079G Drawing No. UKY1C-H1-16228-00[32] 6/10 7. RECOMMENDED LAND PATTERN (not to scale) 2.8 2.4 2.4 6.6 Unit: mm KYOCERA Crystal Device Corporation KBS-5079G Drawing No. UKY1C-H1-16228-00[32] 7/10 8.TAPING & REEL 8-1.Dimensions 4.0±0.1 φ1.55±0.05 φ1.50+0.1/-0 2.0±0.1 4.8±0.1 8.3±0.1 1.75±0.10 7.5±0.1 16.0±0.3 Unreeling direction Unit : mm 2.1±0.1 0.30±0.05 8.0±0.1 8-2.Leader and trailer tape Empty compartment SMD parts taped area Empty compartment END START 160 mm min. 400 mm min. 8-3.Specification 1. Material of the carrier tape shall be A－PET or PS (ESD) 2. The seal tape shall not cover the sprocket holes. And not protrude from the carrier tape. 3. Tensile strength of the tape : 10N or more. 4. The number of lack is 0.1% of 1 reel total part number (the number of the table letters) or the part following whose 1 either is big. (But, the thing which lack of the continuance is not in.) 5. The R of the corner without designation is 0.3R MAX. 6. Disalignment between centers of the cavity and sprocket hole shall be 0.05mm or less. 7. Peeling force of the seal tape (Peeling speed 300mm/min.): 0.1 to 1.0N 8. Cumulative pitch error of feed hole : 50 pitch→±0.3mm 9. The marking on parts is not fixed its direction, its electrical characteristic is equal. 165°~180° Seal tape Carrier tape KYOCERA Crystal Device Corporation KBS-5079G Drawing No. UKY1C-H1-16228-00[32] 8/10 8-4.Reel specifications W C D E B Material ：PS A φ254 Reel (1,000 pcs. Max.) Symbol A Dimension Symbol Dimension B C D φ254 φ100 φ13 φ21 E W 2.0 22.4 (Unit : mm) φ330 Reel (3,000 pcs.) Symbol Dimension Symbol Dimension A B C D φ330 φ100 φ13 φ21 E W 2.0 22.4 (Unit : mm) KYOCERA Crystal Device Corporation KBS-5079G Drawing No. UKY1C-H1-16228-00[32] 9/10 9.Enviromental requirements (Reference: AEC-Q200 Rev. D. The solder used by examination is hereafter set to Sn-3Ag-0.5Cu.) After following test, Frequency applies to each item and CI, ±20% or 5Ω of large value. No 9.1 Stress High Temperature Exposure (Storage) Reference MIL-STD-202 Method 108 9.2 Temperature Cycling JESD22 Method JA-104 9.3 Biased Humidity MIL-STD- 202 Method 103 9.4 Operational Life MIL-STD- 202 Method 108 9.5 Terminal Strength (Leaded) 9.6 Resistance to Solvents 9.7 Mechanical Shock 9.8 Vibration MIL-STD- 202 Method 211 MIL-STD- 202 Method 215 MIL-STD-202 Method 213 MIL-STD-202 Method 204 9.9 Resistance to Soldering Heat MIL-STD-202 Method 210 9.10 Solder ability J-STD-002 9.11 9.12 9.13 Flammability Board Flex Terminal Strength(SMD) UL-94 AEC Q200-005 AEC Q200-006 Additional Requirements 1000 hrs. at rated operating temperature (e.g. 85°C part can be stored for 1000 hrs at 85°C. Same applies for 125°C). Unpowered. Measurement at 24±4 hours after test conclusion. 1000 cycles (-40°C to 125°C) Note: If 85°C part the 1000 cycles will be at that temperature rating. Measurement at 24±4 hours after test conclusion. 30min maximum dwell time at each temperature extreme. 1 min. maximum transition time. 1000 hours 85°C/85%RH. Rated VDD applied with 1 MW and inverter in parallel, 2X crystal CL capacitors between each crystal leg and GND. Measurement at 24±4 hours after test conclusion. Note: 1000 hrs @ 125°C. If 85°C part will be tested at that temperature. Rated VDD applied with 1 MW and inverter in parallel, 2X crystal CL capacitors between each crystal leg and GND. Measurement at 24±4 hours after test conclusion. Test leaded device lead integrity only. Conditions: A (227 g), C (227 g). Note: Also aqueous wash chemical - OKEM clean or equivalent. Do not use banned solvents. Figure 1 of Method 213. Condition C 5g's for 20 minutes 12 cycles each of 3 orientations. Note: Use 8"X5" PCB .031" thick with 7 secure points on one 8" side and 2 secure points on corners of opposite sides. Parts mounted within 2" from any secure point. Test from 10-2000 Hz. Condition B No pre-heat of samples. Note: Single Wave solder - Procedure 1 with solder within 1.5 mm of device body for Leaded. Procedure 1 except 230°C and immerse only to level to cover terminals for SMD. For both Leaded & SMD. Electrical Test not required. Magnification 50 X. Conditions: Leaded: Method A @ 235°C, category 3. SMD: a) Method B, 4 hrs @ 155°C dry heat @ 235°C b) Method B @ 215°C category 3. c) Method D category 3 @ 260°C. V-0 or V-1 Acceptable 60 sec minimum holding time. - KYOCERA Crystal Device Corporation KBS-5079G Drawing No. UKY1C-H1-16228-00[32] 10/10 10.Cautions for use (1）Soldering in mounting In case of Solder paste and conductive glue contact product lid or product side face exception for product terminal it’s possible to influence product characteristics. Please be careful above contents. （2）Automatic mounting machine use Please use after affirmation that select the mounting machine model with a shock small if possible in the case of use of an automatic mounting machine, and it does not have breakage. There is a risk of a quartz crystal unit breakage occurring and not functioning normally by too much shock etc.. （3）Conformity of a circuit In case of use of an oscillation circuit, please insert in a quartz crystal unit in series resistance 10 times as many as the standard value of equivalent in-series resistance, and confirm oscillating. Please remove resistance which inserted after the notes above-mentioned examination in the quartz crystal unit in series, and use it. （4）After making the Quartz Crystal mount on a printed circuit board ,if it is required to devide the printed circuit board into another one, use it with attentive confirmation so that a warp cased by this dividing might not affect any damage. When designing a printed circuit board as well as handling the mounting As much as possible. The quartz crystal shall be passed through the reflow furnace. Then it shall be subjected to standard atmospheric conditions, after which cleaning shall be made. 11.Storage conditions Storage at prolonged high temperature or low temperature and the storage by high humidity cause degradation of frequency accuracy, and degradation of soldering nature. Storage is performed at the temperature of 18-30 degrees C, and the humidity of 20-70 Percent in the state of packing, and a term is 6 months. 12. Manufacturing location Kyocera Crystal Device Corporation / Japan(Yamagata) Kyocera Crystal Device (Thailand) Co., Ltd / Thailand(Lamphun) 13. Quality Assurance To be guaranteed by Kyocera Crystal Device Quality Assurance Division 14. Quality guarantee When the failure by the responsibility of our company occurs clearly after delivery within 1 year, a substitute article etc. is appropriated gratuitously and this is guaranteed. However, when passing 1 year after delivery, there is a case where I am allowed to consider as onerous repair after both consultation. 15.Others When any questions and opinions are in the written matter of these delivery specifications, I will ask connection of you from the our company issue day within 45 days. In a connection no case, a written matter is consented to it and employed within a term. KYOCERA Crystal Device Corporation KBS-5079G