PE29100 Evaluation Kit (EVK) User’s Manual
UltraCMOS® High-speed FET Driver, 33 MHz
PE29100 Evaluation Kit
DOC-72748-2 – (02/2017)
EVK User’s Manual
www.psemi.com
PE29100
EVK User’s Manual
Copyright and Trademarks
©2016-2017, Peregrine Semiconductor Corporation. All rights reserved. The Peregrine name, logo, UTSi and
UltraCMOS are registered trademarks and HaRP, MultiSwitch and DuNE are trademarks of Peregrine Semiconductor Corp. eGaN is a registered trademark of Efficient Power Conversion Corporation, Inc. All other trademarks mentioned herein are the property of their respective owners.
Disclaimers
The information in this document is believed to be reliable. However, Peregrine assumes no liability for the use
of this information. Use shall be entirely at the user’s own risk. No patent rights or licenses to any circuits
described in this document are implied or granted to any third party. Peregrine’s products are not designed or
intended for use in devices or systems intended for surgical implant, or in other applications intended to support
or sustain life, or in any application in which the failure of the Peregrine product could create a situation in which
personal injury or death might occur. Peregrine assumes no liability for damages, including consequential or
incidental damages, arising out of the use of its products in such applications.
Patent Statement
Peregrine products are protected under one or more of the following U.S. patents: patents.psemi.com
Sales Contact
For additional information, contact Sales at sales@psemi.com.
Corporate Headquarters
9369 Carroll Park Drive, San Diego, CA, 92121
858-731-9400
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PE29100
EVK User’s Manual
Table of Contents
Introduction - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - 1
Introduction - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - 1
Application Support . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
Evaluation Kit Contents and Requirements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
Kit Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
Hardware Requirements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2
Safety Precautions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2
Evaluation Board Assembly - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - 3
Evaluation Board Assembly Overview - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - 3
Block Diagram and Schematic . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
Circuit Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
Quick Start Guide - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - 7
Quick Start Overview - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - 7
Evaluation Board Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
Evaluation Test Setup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Hardware Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
Thermal Considerations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
Technical Resources - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - 13
Technical Resources - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - 13
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EVK User’s Manual
1
Introduction
Introduction
The PE29100 evaluation board allows the user to evaluate the PE29100 gate driver in a half-bridge configuration. The PE29100 integrated high-speed driver is designated to control the gates of external power devices,
such as enhancement mode gallium nitride (eGaN®) FETs. The outputs of the PE29100 are capable of providing
switching transition speeds in the sub nano-second range for hard switching applications up to 33 MHz.
The PE29100 evaluation kit (EVK) user’s manual includes the evaluation board schematic, circuit description,
quick start guide, measurement results and a Bill of Materials (BoM).
Application Support
For any technical inquiries regarding the evaluation kit or software, please visit applications support at
www.psemi.com (fastest response) or call (858) 731-9400.
Evaluation Kit Contents and Requirements
Kit Contents
The PE29100 EVK includes the following hardware required to evaluate the FET driver.
Table 1 • PE29100 Evaluation Kit Contents
Quality
1
Description
PE29100 FET driver evaluation board assembly (PRT-66476)
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EVK User’s Manual
Hardware Requirements
In order to evaluate the performance of the evaluation board, the following equipment is required:
• High speed digital oscilloscope
• Functional generator (PWM)
• High voltage DC power supply
• DC power supply
• DC test leads
Safety Precautions
Caution: The PE29100 FET driver EVK contains components that might be damaged by exposure to
voltages in excess of the specified voltage, including voltages produced by electrostatic discharges.
Handle the board in accordance with procedures for handling static-sensitive components. Avoid
applying excessive voltages to the power supply terminals or signal inputs or outputs.
Caution: PCB surface can become hot. Contact may cause burns do not touch!
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PE29100
EVK User’s Manual
Evaluation Board Assembly
2
Evaluation Board Assembly Overview
The evaluation board (EVB) is assembled with a PE29100 FET driver and two EPC8009 eGaN FETs. Headers
are included for signal input and power connections and probe points are included for waveform measurements.
Figure 1 • PE29100 Evaluation Board Assembly
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EVK User’s Manual
Block Diagram and Schematic
The block diagram and schematic of the evaluation board are shown in Figure 2 and Figure 3.
Figure 2 • PE29100 Evaluation Board Block Diagram
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PE29100
EVK User’s Manual
Figure 3 • PE29100 Evaluation Board Schematic(*)
Q4
U3
MCP1703T-5002E/MC
J1
R9
CON2
3
VHS
1
2
C
C2
4.7
402
DNI
402
8
C10
D4
1.0 µF
603
6
A
1
DNI
7-12_Vdc
GRreT1
C3
7
5
R6
0.022 µF
402
R7
9
IN
LSB
7
RDLH
LSS
NC
R23
LSGpu
LSGpd
GND
5
EN
RDHL
LSO
16
0.10 µF
402
Q1
EPC8009
5.1
0201
GRreT1
C14
9
VG2
13
4
TP1
1
IN B
GND
NC
OUT Y
1
1
P2
6
DNI
R5
80.6k
402
5
R12
R14
5.1
0201
1
1 µF
100V
3216
VSW
VOUT
E2
Q5
23
21
19
17
15
13
11
9
7
5
3
1
23
21
19
17
15
13
11
9
7
5
3
1
VSW
VOUT
HDR2X12
L3
0.12uH
EPC8009
2
VOUT
VOUT
PIN_GND
E3
COUT1
COUT2
COUT3
COUT4
COUT5
3.3 µF
0805
3.3 µF
0805
DNI
0805
DNI
0805
DNI
0805
E4
P1
POUT_GND
DNI
R4
R2
80.6k
402
Return
DNI
603
4
C18
0.10 µF
402
24
22
20
18
16
14
12
10
8
6
4
2
2
3
VCC
VCC
C17
0.10 µF
402
C21
PBC36DABN
24
22
20
18
16
14
12
10
8
6
4
2
5.1
0201
2
3
IN A
0.10 µF
402
3
5
6
11
10
U4
NC7SZ08L6X
C16
0.10 µF
402
VCC
12
LS0
CON2
J3
VIN
SW_OUT
2
14
TP2
1
VSW
R11
5.1
0201
1
VCC
DNI
402
E1
R13
3
6
1
HSS
8
2
4
2
HSGpu
3
C13
2.2 µF
402
4
VDD
HSB
HSGpd
R1
3
C11
2.2 µF
603
3
5
6
DNI
0603
15
U1
PE29100
10K
603
GND
1.0 µF
603
4
1
C12
2
1
NC
0
603
VHS
RD
DNI
1
2
NC
VCC
C4
24V_Max
VG1
D1
J2
NC
R3
1
2
VIN
D3
VCC
R22
NC
BAS40LP-7
VG2
0
402
VOUT
27K
402
20
402
WM
VIN
NC
EPAD
EPC2038
4
2
VCC
PWM
VSW
J4
DNI
C1
1
2
DNI
402
HS1
PRT-66476-02
DNI
Note: * CAUTION: Parts and assemblies susceptible to damage by electrostatic discharge (ESD).
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PE29100
EVK User’s Manual
Circuit Description
The evaluation board is configured with a PE29100 gate driver (U1) and two EPC8009 eGaN FETs (Q1 and Q5)
in half-bridge configuration. An additional eGaN FET (Q4) is used as a synchronous bootstrap diode to prevent
overvoltage to the gate of Q1. Gate resistors (R11–R14) are required to de-Q the inductance in the gate loop
and dampen any ringing on the FET gates and the SW node.
The PE29100 features an external dead-time adjustment that allows the user to control the timing of the lowside and high-side gates to eliminate any large shoot-through currents, which could dramatically reduce the
efficiency of the circuit and potentially damage the eGaN FETs. Resistors R4 and R5 are used to adjust the
timing of the output waveforms and have been configured to provide approximately 4 ns of dead-time.
Note: During low-to-high switching transitions, the dead-time should be limited to 4 ns when reverse current is
present on the switch node. Above 4 ns and under no load conditions, reverse current can cause cycle skipping
of the high-side gate.
The dead-time resistors only affect the low-side output; the high-side output will always equal the duty-cycle of
the input. The high-side FET gate node will track the duty cycle of the PWM input with a shift in the response as
shown in Figure 4, as both rising and falling edges are shifted in the same direction. The low-side FET node
duty cycle can be controlled with the dead-time resistors as each resistor will move the rising and falling edges
in opposite directions. R5 will change the dead-time from LSG falling to HSG rising and R4 will change the deadtime from HSG falling to LSG rising.
Figure 4 • PE29100 Dead-time Waveforms
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PE29100
EVK User’s Manual
Quick Start Guide
3
Quick Start Overview
This chapter will guide the user through the operating specifications, hardware configuration, test setup and test
results. Operating the EVB beyond the operating specifications can result in damage to the high-speed driver
and/or the power transistors.
Evaluation Board Overview
The evaluation board is designed to ease customer evaluation of Peregrine’s products. The board contains:
• Header pins and jumpers for power supply and PWM connections
• Test points for performance verification
The operating specifications of the evaluation board are:
• Maximum input operating voltage of 30V(1)
• Maximum output current of 2.5A continuous(1)
• Switching frequency, 5–33 MHz(1)(2)
• Minimum high-side ouput pulse width of 10 ns(2)
• Minimum low-side ouput pulse width of 10 ns(2)
Notes:
1) Assumes inductive load, maximum current depends on die temperature—actual maximum current with subject to switching frequency, bus
voltage and thermals.
2) The minimum positive output pulse width should be limited to 10 ns. Operating the positive pulse width below 10 ns can result in a steady ON
state condition to the high-side gate; therefore, potentially damaging the high-side device. A similar condition can result in the low-side output if
the minimum negative pulse width extends below 10 ns. Figure 5 and Figure 6 show the relationship between operating frequency and duty
cycle for the high-side and low-side minimum output pulse widths.
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EVK User’s Manual
Figure 5 • Duty-cycle Limit for 10 ns High-side Output Pulse Width Independent of Dead-time Setting(*)
35
30
Duty Cycle (%)
25
20
15
10
5
0
0
5
10
15
20
25
30
Frequency (MHz)
Note: * Area above line safe.
Figure 6 • Duty-cycle Limit for 10 ns Low-side Output Pulse Width(*)
0ns dead-time
3ns dead-time
6ns dead-time
9ns dead-time
120
Duty Cycle (%)
100
80
60
40
20
0
0
5
10
15
20
25
30
Frequency (MHz)
Note: * Area below line safe.
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PE29100
EVK User’s Manual
Evaluation Test Setup
Figure 7 shows the test setup for the PE29100 evaluation board. Make sure that the specified safety precautions mentioned in “Safety Precautions” on page 2 are followed.
Figure 7 • PE29100 Evaluation Board Test Setup
VIN supply
7–12 VDC
Main
voltage
measure
VSW
VOUT
DC
output
VMAIN
supply
30 VDCMAX
Control
signal
input
Switch node
oscilloscope probe
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EVK User’s Manual
Hardware Operation
The general guidelines for operating the hardware evaluation board are listed in this section. Follow the steps to
configure the hardware properly for the performance.
1) Verify that all DC power supplies are turned off before proceeding.
2) Connect the PE29100 power supply to pin 1 (J1) and ground return to pin 2 (J1).
3) Connect the input PWM control signal to pin 1 (J2) and ground return to pin 2 (J2).
4) Connect the main input power supply to VIN (J3) and the ground return to GND (J3).
5) Monitor the main supply with a voltmeter connected across test points E1 (+) and E2 (–).
6) Monitor the DC output with a voltmeter connected across test points E3 (+) and E4 (–).
7) Apply between 7V and 12V to power the PE29100 driver.
8) Set the function generator to supply a 50% duty cycle at 10 MHz with a maximum amplitude of 3 VPP and a
1.5V offset.
9) Adjust the bus voltage to the required value making sure not to exceed the absolute maximum voltage of 30V
on VIN (E1 and E2). Increase voltage slowly while monitoring operation to ensure the FETs are operating
within their datasheet parameters.
10) Once operational, adjust the bus voltage PWM control within the operating range and observe the output
switching behavior.
11) A DC load can be attached to the VOUT and GND pins of J3.
12) Using a high frequency probe, carefully measure the driver output to achieve the waveforms shown in
Figure 8. Be careful not to damage the FETs if trying to measure the signals on the eGaN FET gates.
13) Follow the above steps in reverse to power down the evaluation board.
Note: When measuring the high frequency content of switch node, care must be taken to avoid long ground
leads. Measure the switch node by placing the oscilloscope probe tip through the large via on the switch node
(designed for this purpose) and grounding the probe directly across the GND terminal provided. See Figure 9
for proper scope probe technique.
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EVK User’s Manual
Figure 8 • Oscilloscope Plot Showing SW Node Signals(*)
Note: * VIN = 12V, FSW = 10 MHz, ILOAD = 2A
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EVK User’s Manual
Figure 9 • Proper Oscilloscope Probe Measurements Technique
Thermal Considerations
The PE29100 evaluation board includes two EPC8009 eGaN FETs. Although the electrical performance
surpasses that for traditional silicon devices, their relatively smaller size does magnify the thermal management
requirements. The evaluation board is intended for bench evaluation with low ambient temperature and
convection cooling. The addition of the heat-sinking and forced air cooling can significantly increase the current
rating of these devices, but care must be taken to not exceed the absolute maximum die temperature of 125 °C.
Note: The PE29100 evaluation board does not have any current or thermal protection on board.
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PE29100
EVK User’s Manual
Technical Resources
4
Technical Resources
Additional technical resources are available for download in the Products section at www.psemi.com. These
include the Product Specification datasheet, S-parameters, zip file, evaluation kit schematic and bill of materials,
material declaration form and PC-compatible software file.
Trademarks are subject to trademark claims.
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EVK User’s Manual
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