54FCT574TDB

IDT54/74FCT574T/AT/CT FAST CMOS OCTAL D REGISTERS (3-STATE) MILITARY AND INDUSTRIAL TEMPERATURE RANGES FAST CMOS OCTAL D REGISTERS (3-STATE) FEATURES: • • • • • • • • • IDT54/74FCT574T/AT/CT DESCRIPTION: Std., A, and C grades Low input and output leakage ≤1µA (max.) CMOS power levels True TTL input and output compatibility: – VOH = 3.3V (typ.) – VOL = 0.3V (typ.) High Drive outputs (-15mA IOH, 48mA IOL) Meets or exceeds JEDEC standard 18 specifications Military product compliant to MIL-STD-883, Class B and DESC listed (dual marked) Power off disable outputs permit "live insertion" Available in the following packages: – Industrial: SOIC, QSOP – Military: CERDIP, LCC The FCT574T is an 8-bit register built using an advanced dual metal CMOS technology. These registers consist of eight D-type flip-flops with a buffered common clock and buffered 3-state output control. When the output enable (OE) input is low, the eight outputs are enabled. When the OE input is high, the outputs are in the high-impedance state. Input data meeting the set-up and hold time requirements of the D inputs is transferred to the Q outputs on the low-to-high transition of the clock input. FUNCTIONAL BLOCK DIAGRAM D0 D1 CP D Q CP D Q D2 D3 D4 D5 D6 D7 CP CP D CP D CP D CP D CP D CP D Q Q Q Q Q Q Q2 Q3 Q4 Q5 Q6 Q7 OE Q0 Q1 IDT and the IDT logo are registered trademarks of Integrated Device Technology, Inc. MILITARY AND INDUSTRIAL TEMPERATURE RANGES NOVEMBER 2016 1 DSC-5494/7 IDT54/74FCT574T/AT/CT FAST CMOS OCTAL D REGISTERS (3-STATE) MILITARY AND INDUSTRIAL TEMPERATURE RANGES D0 2 19 Q0 D1 3 18 Q1 D2 4 17 Q2 D3 5 16 Q3 D4 6 15 D5 7 14 3 2 1 16 Q3 Q4 D5 7 15 Q4 Q5 D6 8 14 Q5 8 13 Q6 D7 9 12 Q7 10 11 CP 9 10 11 Max Unit VTERM(2) Terminal Voltage with Respect to GND –0.5 to +7 V VTERM(3) Terminal Voltage with Respect to GND –0.5 to VCC+0.5 V TSTG Storage Temperature –65 to +150 °C IOUT DC Output Current –60 to +120 mA PIN DESCRIPTION Pin Names NOTES: 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. No terminal voltage may exceed Vcc by +0.5V unless otherwise noted. 2. Inputs and Vcc terminals only. 3. Output and I/O terminals only. Typ. Max. Input Capacitance VIN = 0V 6 10 pF COUT Output Capacitance VOUT = 0V 8 12 pF D flip-flop data inputs CP Clock Pulse for the register. Enters data on LOW-toHIGH transition. Qx 3-State Outputs (TRUE) Qx 3-State Outputs (INVERTED) OE Active LOW 3-State Output Enable Input Function High-Z Load Register Unit CIN Description Dx FUNCTION TABLE(1) CAPACITANCE (TA = +25°C, F = 1.0MHz) Conditions 13 LCC TOP VIEW Description Parameter(1) 12 Q6 6 Q7 D4 CP Q2 GND 17 D3 D7 5 ABSOLUTE MAXIMUM RATINGS(1) Symbol 19 Q1 D2 4 CERDIP/ SOIC/ TSSOP TOP VIEW Symbol 20 18 D6 GND INDEX Q0 VCC VCC 20 OE 1 D0 OE D1 PIN CONFIGURATION OE H H L L H H NOTE: 1. H = HIGH Voltage Level X = Don’t Care L = LOW Voltage Level Z = High Impedance NC = No Change ↑ = LOW-to-HIGH transition NOTE: 1. This parameter is measured at characterization but not tested. 2 Inputs CP L H ↑ ↑ ↑ ↑ Dx X X L H L H Outputs Qx Z Z L H Z Z Internal Qx NC NC H L H L IDT54/74FCT574T/AT/CT FAST CMOS OCTAL D REGISTERS (3-STATE) MILITARY AND INDUSTRIAL TEMPERATURE RANGES DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE Following Conditions Apply Unless Otherwise Specified: Industrial: TA = –40°C to +85°C, VCC = 5.0V ±5%; Military: TA = –55°C to +125°C, VCC = 5.0V ±10% Symbol Test Conditions(1) Parameter Min. Typ.(2) Max. Unit VIH Input HIGH Level Guaranteed Logic HIGH Level 2 — — V VIL Input LOW Level Guaranteed Logic LOW Level — — 0.8 V IIH Input HIGH Current(4) VCC = Max. VI = 2.7V — — ±1 µA IIL Input LOW Current(4) VCC = Max. VI = 0.5V — — ±1 µA IOZH High Impedance Output Current VCC = Max VO = 2.7V — — ±1 µA IOZL (3-State output pins)(4) II VIK VH Input HIGH Current(4) Clamp Diode Voltage Input Hysteresis VCC = Max., VI = VCC (Max.) VCC = Min, IIN = -18mA ICC Quiescent Power Supply Current VCC = Max., VIN = GND or VCC VO = 0.5V — — — ±1 — — — — –0.7 200 ±1 –1.2 — µA V mV — 0.01 1 mA Min. 2.4 Typ.(2) 3.3 Max. — Unit 2 3 — — 0.3 0.5 V –60 –120 –225 mA OUTPUT DRIVE CHARACTERISTICS Symbol VOH Parameter Output HIGH Voltage VOL Output LOW Voltage IOS Short Circuit Current Test Conditions(1) VCC = Min IOH = –6mA MIL VIN = VIH or VIL IOH = –8mA IND IOH = –12mA MIL IOH = –15mA IND VCC = Min IOL = 32mA MIL VIN = VIH or VIL IOL = 48mA IND VCC = Max., VO = GND(3) V NOTES: 1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at VCC = 5.0V, +25°C ambient. 3. Not more than one output should be tested at one time. Duration of the test should not exceed one second. 4. The test limit for this parameter is ±5µA at TA = –55°C. 3 IDT54/74FCT574T/AT/CT FAST CMOS OCTAL D REGISTERS (3-STATE) MILITARY AND INDUSTRIAL TEMPERATURE RANGES POWER SUPPLY CHARACTERISTICS Test Conditions(1) Min. Typ.(2) Max. Unit — 0.5 2 mA VIN = VCC VIN = GND — 0.15 0.25 mA/ MHz VCC = Max. Outputs Open fCP = 10MHz 50% Duty Cycle OE = GND fi = 5MHz One Bit Toggling VIN = VCC VIN = GND — 1.5 3.5 mA VIN = 3.4V VIN = GND — 2 5.5 VCC = Max. Outputs Open fCP = 10MHz 50% Duty Cycle OE = GND Eight Bits Toggling fi = 2.5MHz VIN = VCC VIN = GND — 3.8 7.3(5) VIN = 3.4V VIN = GND — 6 16.3(5) Symbol Parameter ΔICC Quiescent Power Supply Current TTL Inputs HIGH VCC = Max. VIN = 3.4V(3) ICCD Dynamic Power Supply Current(4) VCC = Max. Outputs Open OE = GND One Input Toggling 50% Duty Cycle Total Power Supply Current(6) IC NOTES: 1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at VCC = 5.0V, +25°C ambient. 3. Per TTL driven input; (VIN = 3.4V). All other inputs at VCC or GND. 4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations. 5. Values for these conditions are examples of ΔICC formula. These limits are guaranteed but not tested. 6. IC = IQUIESCENT + IINPUTS + IDYNAMIC IC = ICC + ΔICC DHNT + ICCD (fCP/2+ fiNi) ICC = Quiescent Current ΔICC = Power Supply Current for a TTL High Input (VIN = 3.4V) DH = Duty Cycle for TTL Inputs High NT = Number of TTL Inputs at DH ICCD = Dynamic Current caused by an Input Transition Pair (HLH or LHL) fCP = Clock Frequency for Register Devices (Zero for Non-Register Devices) fi = Output Frequency Ni = Number of Outputs at fi All currents are in milliamps and all frequencies are in megahertz. 4 mA IDT54/74FCT574T/AT/CT FAST CMOS OCTAL D REGISTERS (3-STATE) MILITARY AND INDUSTRIAL TEMPERATURE RANGES SWITCHING CHARACTERISTICS OVER OPERATING RANGE - INDUSTRIAL FCT574AT Symbol Parameter FCT574CT Condition(1) Min.(2) Max. Min.(2) Max. Unit 2 6.5 2 5.2 ns tPLH Propagation Delay CL = 50pF tPHL CP to Qx RL = 500Ω tPZH Output Enable Time 1.5 6.5 1.5 5.5 ns Output Disable Time 1.5 5.5 1.5 5 ns 2 — 2 — ns 1.5 — 1.5 — ns 5 — 5 — ns tPZL tPHZ tPLZ tSU Set-up Time, HIGH or LOW Dx to CP tH Hold Time, HIGH or LOW Dx to CP tW CP Pulse Width HIGH or LOW(3) SWITCHING CHARACTERISTICS OVER OPERATING RANGE - MILITARY FCT574T Symbol Parameter Condition(1) Min.(2) FCT574AT FCT574CT Max. Min.(2) Max. Min.(2) Max. Unit 2 11 2 7.2 2 6.2 ns tPLH Propagation Delay CL = 50pF tPHL CP to Qx RL = 500Ω tPZH Output Enable Time 1.5 14 1.5 7.5 1.5 6.2 ns Output Disable Time 1.5 8 1.5 6.5 1.5 5.7 ns 2 — 2 — 2 — ns 1.5 — 1.5 — 1.5 — ns 7 — 6 — 6 — ns tPZL tPHZ tPLZ tSU Set-up Time, HIGH or LOW Dx to CP tH Hold Time, HIGH or LOW Dx to CP tW CP Pulse Width HIGH or LOW(3) NOTES: 1. See test circuit and waveforms. 2. Minimum limits are guaranteed but not tested on Propagation Delays. 3. This limit is guaranteed but not tested. 5 IDT54/74FCT574T/AT/CT FAST CMOS OCTAL D REGISTERS (3-STATE) MILITARY AND INDUSTRIAL TEMPERATURE RANGES TEST CIRCUITS AND WAVEFORMS V CC SWITCH POSITION 7.0V 500W V OUT VIN Pulse Generator D.U.T . 50pF RT 500W Test Switch Open Drain Disable Low Enable Low Closed All Other Tests Open DEFINITIONS: CL = Load capacitance: includes jig and probe capacitance. RT = Termination resistance: should be equal to ZOUT of the Pulse Generator. CL Octal Link Test Circuits for All Outputs DATA INPUT tH tSU TIMING INPUT ASYNCHRONOUS CONTROL PRESET CLEAR ETC. SYNCHRONOUS CONTROL PRESET CLEAR CLOCK ENABLE ETC. tREM tSU 3V 1.5V 0V 3V 1.5V 0V LOW-HIGH-LOW PULSE 1.5V tW 3V 1.5V 0V HIGH-LOW-HIGH PULSE 1.5V 3V 1.5V 0V tH Pulse Width Octal Link Octal Link Set-Up, Hold, and Release Times ENABLE SAME PHASE INPUT TRANSITION tPLH tPHL OUTPUT tPLH OPPOSITE PHASE INPUT TRANSITION tPHL 3V 1.5V 0V VOH 1.5V VOL DISABLE 3V 1.5V 0V CONTROL INPUT tPZL OUTPUT NORMALLY LOW 3V 1.5V 0V SWITCH CLOSED tPLZ 3.5V 1.5V tPZH OUTPUT NORMALLY HIGH SWITCH OPEN 3.5V 0.3V VOL tPHZ 0.3V 1.5V 0V Octal Link VOH 0V Octal Link Propagation Delay Enable and Disable Times NOTES: 1. Diagram shown for input Control Enable-LOW and input Control Disable-HIGH. 2. Pulse Generator for All Pulses: Rate ≤ 1.0MHz; tF ≤ 2.5ns; tR ≤ 2.5ns. 6 IDT54/74FCT574T/AT/CT FAST CMOS OCTAL D REGISTERS (3-STATE) MILITARY AND INDUSTRIAL TEMPERATURE RANGES ORDERING INFORMATION XXXX XX FCT Device Type Temp. Range XX Package X Process X X Blank 8 Tube Tape and Reel G Green Blank B Industrial MIL-STD-883, Class B SO Q Industrial Options Small Outline IC (PSG20) Quarter-size Small Outline Package (PCG20) D L Military Options CERDIP (CD20) Leadless Chip Carrier (LC20) 574T 574AT 574CT Fast CMOS Octal D Register 54 74 −55°C to +125°C −40°C to +85°C Datasheet Document History 10/10/2009 11/17/2016 Pg. 7 Pg. 7 Updated the ordering information by removing the "IDT" notation and non RoHS part. 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