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72V70210DA

72V70210DA

  • 厂商:

    RENESAS(瑞萨)

  • 封装:

    LQFP144

  • 描述:

    IC MULTIPLEXER 1 X 32:32 144TQFP

  • 数据手册
  • 价格&库存
72V70210DA 数据手册
3.3 VOLT TIME SLOT INTERCHANGE DIGITAL SWITCH 1,024 x 1,024 FEATURES: Flatpack (TQFP) packages Operating Temperature Range -40°°C to +85°°C 3.3V I/O with 5V tolerant inputs and TTL compatible outputs • • 32 serial input and output streams 1,024 x 1,024 channel non-blocking switching at 2.048 Mb/s • Per-channel Variable Delay Mode for low-latency applications • Per-channel Constant Delay Mode for frame integrity applications • Automatic identification of ST-BUS® and GCI serial streams • Automatic frame offset delay measurement • Per-stream frame delay offset programming • Per-channel high impedance output control • Per-channel processor mode to allow microprocessor writes to TX streams • Direct microprocessor access to all internal memories • Memory block programming for quick set-up • IEEE-1149.1 (JTAG) Test Port • Internal Loopback for testing • · Available in 144-pin Thin QuadArray Flatpack (TQFP) Ball Grid (BGA) and 144-pin Thin Quad • • IDT72V70210 DESCRIPTION: The IDT72V70210 has a non-blocking switch capacity of 1,024 x 1,024 channels at 2.048 Mb/s. With 32 inputs and 32 outputs, programmable per stream control, and a variety of operating modes the IDT72V70210 is designed for the TDM time slot interchange function in either voice or data applications. Some of the main features of the IDT72V70210 are low power 3.3 Volt operation, automatic ST-BUS®/GCI sensing, memory block programming, simple microprocessor interface, one cycle direct internal memory accesses, JTAG Test Access Port (TAP) and per stream programmable input offset delay, variable or constant throughput modes, internal loopback, output enable, and Processor Mode. FUNCTIONAL BLOCK DIAGRAM Vcc GND R ESET TMS TDI TDO TCK ODE TR ST Test Port RX0 RX1 RX2 RX3 RX4 RX5 RX6 RX7 RX8 RX9 RX10 RX11 RX12 RX13 RX14 RX15 RX16 RX17 RX18 RX19 RX20 RX21 RX22 RX23 RX24 RX25 RX26 RX27 RX28 RX29 RX30 RX31 Loopback Output MUX Data Memory Receive Serial Data Streams Transmit Serial Data Streams Connection Memory Internal Registers Timing Unit TX0 TX1 TX2 TX3 TX4 TX5 TX6 TX7 TX8 TX9 TX10 TX11 TX12 TX13 TX14 TX15 TX16 TX17 TX18 TX19 TX20 TX21 TX22 TX23 TX24 TX25 TX26 TX27 TX28 TX29 TX30 TX31 Microprocessor Interface 5714 drw01 CLK F0i FE IC DS CS R/W A0-A11 D TA D0-D15 IDT and the IDT logo are trademarks of Integrated Device Technology, Inc. The ST-BUS® is a trademari of Mitel Corp. JANUARY 2005 1 © 2005 Integrated Device Technology, Inc. All rights reserved. Product specifications subject to change without notice. DSC-5714/4 IDT72V70210 3.3V TIME SLOT INTERCHANGE DIGITAL SWITCH 1,024 x 1,024 COMMERCIAL TEMPERATURE RANGE PIN CONFIGURATIONS A1 BALL PAD CORNER A RX0 RX1 RX3 RX6 TX1 TX4 TX7 RX10 RX12 RX15 TX10 TX11 CLK ODE RX2 RX5 TX0 TX3 TX6 RX9 RX1 3 RX14 TX9 TX1 2 F0i FE R ESET RX4 RX7 TX2 TX5 RX8 RX11 TX8 TX13 TX14 TMS IC TDI GND VCC VCC VCC VCC VCC TX15 RX16 RX17 TD0 TCK TR ST VCC GND GND GND GND VCC RX19 RX20 RX21 DS CS R/W VCC GND GND GND GND VCC RX22 RX23 RX18 A0 A1 A2 VCC GN D GND GND GND VCC TX16 TX17 TX18 A3 A4 A5 VCC GN D GND GND GND VCC TX19 TX20 TX21 A6 A7 A8 D15 VCC VCC VCC VCC GND TX22 RX24 TX23 A9 A10 D TA D9 D6 D3 D0 TX29 TX26 RX27 RX25 RX26 A11 IC D12 D11 D7 D4 D1 TX30 TX27 TX24 RX28 RX29 IC D14 D13 D10 D8 D5 D2 TX31 TX28 TX25 RX31 RX30 1 2 3 4 5 6 7 8 9 10 11 B C D E F G H J K L M 12 5714 drw 02 NOTE: 1. All I/O pins are 5V tolerant except for TMS, TDI and TRST. BGA: 1mm pitch, 13mm x 13mm (BC144-1, order code: BC) TOP VIEW 2 IDT72V70210 3.3V TIME SLOT INTERCHANGE DIGITAL SWITCH 1,024 x 1,024 COMMERCIAL TEMPERATURE RANGE VCC TX22 TX23 GND RX24 RX25 RX26 RX27 RX28 RX29 RX30 RX31 VCC TX18 TX19 GND TX20 TX21 VCC RX16 RX17 RX18 RX19 RX20 RX21 RX22 RX23 GND TX16 TX17 VCC 108 107 106 105 104 103 102 101 100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81 80 79 78 77 76 75 74 73 TX12 TX13 GND TX14 TX15 PIN CONFIGURATIONS (CONTINUED) 34 35 36 VCC TX24 TX25 GND TX26 TX27 VCC TX28 TX29 GND TX30 TX31 VCC D0 D1 GND D2 D3 VCC D4 D5 GND D6 D7 VCC D08 D09 GND D10 D11 VCC D12 D13 GND D14 D15 VCC A11 GND D TA 29 30 31 32 33 GND GND A5 A6 A7 A8 A9 A10 A2 A3 A4 GND A0 A1 17 18 19 20 21 22 23 24 25 26 27 28 VCC ODE VCC TCK TR ST GND DS CS R/W VCC TX1 TX0 GND RX7 RX6 RX5 RX4 RX3 RX2 RX1 RX0 TMS TDI TDO TX2 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52 51 50 49 48 47 46 45 44 43 42 41 40 39 38 37 VCC TX5 TX4 GND TX3 111 112 113 114 115 116 117 118 119 120 121 122 123 124 125 126 127 128 129 130 131 132 133 134 135 136 137 138 139 140 141 142 143 144 F0i FE IC VCC 72 71 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 VCC RX15 RX14 RX13 RX12 RX11 RX10 RX9 RX8 GND TX7 TX6 109 110 R ESET GND CLK TX11 TX10 GND TX9 TX8 5714 drw 03 NOTE: 1. All I/O pins are 5V tolerant except for TMS, TDI and TRST. TQFP: 0.50mm pitch, 20mm x 20mm (DA144-1, order code: DA) TOP VIEW 3 IDT72V70210 3.3V TIME SLOT INTERCHANGE DIGITAL SWITCH 1,024 x 1,024 COMMERCIAL TEMPERATURE RANGE PIN DESCRIPTION SYMBOL NAME I/O DESCRIPTION GND Ground. Ground Rail. VCC VCC +3.3 Volt Power Supply. TX0-31 TX Output 0 to 31 (Three-state Outputs) O Serial data output stream. These streams have a data rate of 2.048 Mb/s. RX0-31 RX Input 0 to 31 I Serial data input stream. These streams have a data rate of 2.048 Mb/s. F0i Frame Pulse I This input accepts and automatically identifies frame synchronization signals formatted according to ST-BUS® and GCI specifications. FE Frame Evaluation I This pin is the frame measurement input. CLK Clock I Serial clock for shifting data in/out on the serial streams (RX/TX 0-31). This input accepts a 4.096 MHz clock. TMS Test Mode Select I JTAG signal that controls the state transitions of the TAP controller. This pin is pulled HIGH by an internal pull-up when not driven. TDI Test Serial Data In I JTAG serial test instructions and data are shifted in on this pin. This pin is pulled HIGH by an internal pull-up when not driven. TDO Test Serial Data Out O JTAG serial data is output on this pin on the falling edge of TCK. This pin is held in high-impedance state when JTAG scan is not enabled. TCK Test Clock I Provides the clock to the JTAG test logic. TRST Test Reset I Asynchronously initializes the JTAG TAP controller by putting it in the Test-Logic-reset state. This pin is pulled by an internal pull-up when not driven. This pin should be pulsed LOW on power-up, or held LOW, to ensure that the IDT72V70210 is in the normal functional mode. RESET Device Reset (Schmitt Trigger Input) I This input (active LOW) puts the IDT72V70210 in its reset state that clears the device internal counters, registers and brings TX0-31 and microport data outputs to a high-impedance state. The time constant for a power up reset circuit must be a minimum of five times the rise time of the power supply. In normal operation, the RESET pin must be held LOW for a minimum of 100ns to reset the device. DS Data Strobe I This active LOW input works in conjunction with CS to enable the read and write operations. R/W Read/Write I This input controls the direction of the data bus lines during a microprocessor access. CS Chip Select I Active LOW input used by a microprocessor to activate the microprocessor port of IDT72V70210. A0-11 Address Bus 0 to 11 I These pins allow direct access to Connection Memory, Data Memory and internal control registers. D0-15 Data Bus 0-15 I/O These pins are the data bits of the microprocessor port. DTA Data Transfer Acknowledgment O This active LOW signal indicates that a data bus transfer is complete. When the bus cycle ends, this pin drives HIGH and then goes high-impedance, allowing for faster bus cycles with a weaker pull-up resistor. A pull-up resistor is required to hold a HIGH level when the pin is in high-impedance. ODE Output Drive Enable I This is the output enable control for the TX0-31 serial outputs. When ODE input is LOW and the OSB bit of the CR register is LOW, TX0-31 are in a high-impedance state. If this input is HIGH, the TX0-31 output drivers are enabled. However, each channel may still be put into a high-impedance state by using the per channel control bit in the connection memory. IC Internal Connection I This pin tied to Ground for normal/JTAG operations 4 IDT72V70210 3.3V TIME SLOT INTERCHANGE DIGITAL SWITCH 1,024 x 1,024 COMMERCIAL TEMPERATURE RANGE DESCRIPTION (CONTINUED): The IDT72V70210 provides two different interface timing modes, ST-BUS® or GCI. The IDT72V70210 automatically detects the presence of an input frame pulse and identifies it as either ST-BUS® or GCI. In ST-BUS® format, every second falling edge of the master clock marks a bit boundary and the data is clocked in on the rising edge of CLK, three quarters of the way into the bit cell. In GCI format, every second rising edge of the master clock marks the bit boundary and data is clocked in on the falling edge of CLK at three quarters of the way into the bit cell. The IDT72V70210 is capable of switching up to 1,024 x 1,024 channels without blocking. Designed to switch 64 Kbit/s PCM or N x 64 Kbit/s data, the device maintains frame integrity in data applications and minimizes throughput delay for voice applications on a per channel basis. The 32 serial input streams (RX) of the IDT72V70210 can be run 2.048 Mb/s allowing 32 channels per 125μs frame. The data rates on the output streams (TX) are identical to those on the input stream. With two main operating modes, Processor Mode and Connection Mode, the IDT72V70210 can easily switch data from incoming serial streams (Data Memory) or from the controlling microprocessor (Connection Memory). As control and status information is critical in data transmission, the Processor Mode is especially useful when there are multiple devices sharing the input and output streams. With data coming from multiple sources and through different paths, data entering the device is often delayed. To handle this problem, the IDT72V70210 has a frame evaluation feature to allow individual streams to be offset from the frame pulse in half clock-cycle intervals up to +4.5 clock cycles. The IDT72V70210 also provides a JTAG test access port, an internal loopback feature, memory block programming, a simple microprocessor interface and automatic ST-BUS®/GCI sensing to shorten setup time, aid in debugging and ease use of the device without sacrificing capabilities. INPUT FRAME OFFSET SELECTION Input frame offset selection allows the channel alignment of individual input streams to be offset with respect to the output stream channel alignment (i.e. F0i). Although all input data comes in at the same speed, delays can be caused by variable path serial backplanes and variable path lengths which may be implemented in large centralized and distributed switching systems. Because data is often delayed this feature is useful in compensating for the skew between clocks. Each input stream can have its own delay offset value by programming the frame input offset registers (FOR, Table 8). The maximum allowable skew is +4 master clock (CLK) periods forward with a resolution of 1/2 clock period. The output frame offset cannot be offset or adjusted. SERIAL INPUT FRAME ALIGNMENT EVALUATION The IDT72V70210 provides the frame evaluation (FE) input to determine different data input delays with respect to the frame pulse F0i. A measurement cycle is started by setting the start frame evaluation (SFE) bit low for at least one frame. When the SFE bit in the Control Register is changed from low to high, the evaluation starts. Two frames later, the complete frame evaluation (CFE) bit of the frame alignment register (FAR) changes from low to high to signal that a valid offset measurement is ready to be read from bits 0 to 11 of the FAR register. The SFE bit must be set to zero before a new measurement cycle is started. In ST-BUS® mode, the falling edge of the frame measurement signal (FE) is evaluated against the falling edge of the ST-BUS® frame pulse. In GCI mode, the rising edge of FE is evaluated against the rising edge of the GCI frame pulse. See Table 7 and Figure 1 for the description of the frame alignment register. FUNCTIONAL DESCRIPTION DATA AND CONNECTION MEMORY All data that comes in through the RX inputs go through a serial-toparallel conversion before being stored into internal Data Memory. The 8 KHz frame pulse (F0i) is used to mark the 125μs frame boundaries and to sequentially address the input channels in Data Memory. Data output on the TX streams may come from either the Serial Input Streams, RX0-31, (Data Memory) or from the microprocessor (Connection Memory). In the case that RX input data is to be output, the addresses in connection memory are used to specify a stream and channel of the input. The connection memory is setup in such a way that each location corresponds to an output channel for each particular stream. In that way, more than one channel can output the same data. In Processor Mode, the microprocessor writes data to the connection memory locations corresponding to the stream and channel that is to be output. The lower half (8 least significant bits) of the connection memory is output every frame until the microprocessor changes the data or mode of the channel. By using this Processor Mode capability, the microprocessor can access input and output time-slots on a per channel basis. The four most significant bits of the connection memory are used to control per channel functions of the out put streams. Specifically, there are bits for Processor or Connection mode, Constant or Variable delay, enables or disables of output drivers, and controls for the Loopback function. If the per channel OE is set to zero, only that particular channel (8-bits) will be in the high-impedance state. If however, the ODE input pin is low or the Output Standby Bit (OSB) in the Control Register is low, all of the outputs will be in a high-impedance state even if a particular channel in connection memory has enabled the output for that channel. In other words, the ODE pin and OSB control bit are master output enables for the device (Table 3). MEMORY BLOCK PROGRAMMING The IDT72V70210 provides users with the capability of initializing the entire connection memory block in two frames. To set bits 12 to 15 of every connection memory location, first program the desired pattern in bits 5 to 8 of the Control Register. The block programming mode is enabled by setting the memory block program (MBP) bit of the control register high. When the block programming enable (BPE) bit of the Control Register is set to high, the block programming data will be loaded into the bits 12 to 15 of every connection memory location. The other connection memory bits (bit 0 to bit 11) are loaded with zeros. When the memory block programming is complete, the device resets the BPE bit to zero. LOOPBACK CONTROL The loopback control (LPBK) bit of each connection memory location allows the TX output data to be looped backed internally to the RX input for diagnostic purposes. If the LPBK bit is high, the associated TX output channel data is internally looped back to the RX input channel (i.e., data from TXn channel m routes to the RXn channel m internally); if the LPBK bit is low, the loopback feature is SERIAL DATA INTERFACE TIMING The master clock frequency must always be twice the data rate. For a serial data rates of 2.048 Mb/s, the master clock (CLK) must be at 4.096 MHz. The input and output stream data rates will always be identical. 5 IDT72V70210 3.3V TIME SLOT INTERCHANGE DIGITAL SWITCH 1,024 x 1,024 COMMERCIAL TEMPERATURE RANGE The two most significant bits of the address select between the registers, Data Memory, and Connection Memory. If A11 and A10 are HIGH, A9-A0 are used to address the Data Memory. If A11 is HIGH and A10 is LOW, A9-A0 are used to address Connection Memory. If A11 is LOW and A10 is HIGH A9-A0 are used to select the Control Register, Frame Alignment Register, and Frame Offset Registers. See Table 4 for mappings. As explained in the Serial Data Interface Timing and Switching Configurations sections, after system power-up, the Control Register should be programmed immediately to establish the desired switching configuration. The data in the Control Register consists of the Memory Block Programming bit (MBP), the Block Programming Data (BPE) bits, the Begin Block Programming Enable (BPE), the Output Stand By, Start Frame Evaluation, and Data Rate Select bits. As explained in the Memory Block Programming section, the BPE begins the programming if the MBP bit is enabled. This allows the entire connection memory block to be programmed with the Block Programming Data bits. If the ODE pin is low, the OSB bit enables (if high) or disables (if low) all TX output drivers. If the ODE pin is high, the contents of the OSB bit is ignored and all TX output drivers are enabled. disabled. For proper per-channel loopback operation, the contents of frame delay offset registers must be set to zero. DELAY THROUGH THE IDT72V70210 The switching of information from the input serial streams to the output serial streams results in a throughput delay. The device can be programmed to perform time-slot interchange functions with different throughput delay capabilities on a per-channel basis. For voice applications, variable throughput delay is best as it ensure minimum delay between input and output data. In wideband data applications, constant throughput delay is best as the frame integrity of the information is maintained through the switch. The delay through the device varies according to the type of throughput delay selected in the V/C bit of the connection memory. VARIABLE DELAY MODE (V/C BIT = 0) In this mode, the delay is dependent only on the combination of source and destination channels and is independent of input and output streams. The minimum delay achievable in the IDT72V70210 is three time-slots. If the input channel data is switched to the same output channel (channel n, frame p), it will be output in the following frame (channel n, frame p+1). The same is true if the input channel n is switched to output channel n+1 or n+2. If the input channel n is switched to output channel n+3, n+4,..., the new output data will appear in the same frame. Table 2 shows the possible delays for the IDT72V70210 in the variable delay mode. CONNECTION MEMORY CONTROL If the ODE pin or the OSB bit is high, the OE bit of each connection memory location controls the output drivers-enables (if high) or disables (if low). See Table 3 for detail. The Processor Channel (PC) bit of the Connection Memory selects between Processor Mode and Connection Mode. If high, the contents of the Connection Memory are output on the TX streams. If low, the Stream Address Bit (SAB) and the Channel Address Bit (CAB) of the Connection Memory defines the source information (stream and channel) of the time-slot that will be switched to the output from Data Memory. Also in the Connection Memory is the V/C (Variable/Constant Delay) bit. Each Connection Memory location allows the per-channel selection between variable and constant throughput delay modes. If the LPBK bit is high, the associated TX output channel data is internally looped back to the RX input channel (i.e., RXn channel m data comes from the TXn channel m). If the LPBK bit is low, the loopback feature is disabled. For proper per-channel loopback operation, the contents of the frame delay offset registers must be set to zero. CONSTANT DELAY MODE (V/C BIT = 1) In this mode, frame integrity is maintained in all switching configurations by making use of a multiple data memory buffer. Input channel data is written into the data memory buffers during frame n will be read out during frame n+2. In the IDT72V70210, the minimum throughput delay achievable in the constant delay mode will be one frame. For example, when input time-slot 31 is switched to output time-slot 0. The maximum delay of 94 time-slots of delay occurs when time-slot 0 in a frame is switched to time-slot 31 in the frame. MICROPROCESSOR INTERFACE The IDT72V70210’s microprocessor interface looks like a standard RAM interface to improve integration into a system. With a 12-bit address bus and a 16-bit data bus, read and writes are mapped directly into Data and Connection memories and require only one cycle to access. By allowing the internal memories to be randomly accessed in one cycle, the controlling microprocessor has more time to manage other peripheral devices and can more easily and quickly gather information and setup the switch paths. Table 4 shows the mapping of the addresses into internal memory blocks and Table 5 shows the Control Register information. INITIALIZATION OF THE IDT72V70210 After power up, the state of the connection memory is unknown. As such, the outputs should be put in high impedance by holding the ODE low. While the ODE is low, the microprocessor can initialize the device, program the active paths, and disable unused outputs by programming the OE bit in connection memory. Once the device is configured, the ODE pin (or OSB bit depending on initialization) can be switched. MEMORY MAPPING The address bus on the microprocessor interface selects the internal registers and memories of the IDT72V70210. 6 IDT72V70210 3.3V TIME SLOT INTERCHANGE DIGITAL SWITCH 1,024 x 1,024 COMMERCIAL TEMPERATURE RANGE TABLE 1 — CONSTANT THROUGHPUT DELAY VALUE Input Rate Delay for Constant Throughput Delay Mode (m – output channel number) (n – input channel number) 2.048 Mb/s 32 + (32 – n) +m time-slots TABLE 2 — VARIABLE THROUGHPUT DELAY VALUE Delay for Variable Throughput Delay Mode (m – output channel number; n – input channel number) Input Rate 2.048 Mb/s m n+2 32 – (n-m) time-slots (m-n + 32) time slots (m-n) time-slots TABLE 3 — OUTPUT HIGH IMPEDANCE CONTROL OE bit in Connection Memory ODE pin OSB bit in CR Register TX Stream Output Status 0 Don’t Care Don’t Care Per Channel High-Impedance 1 0 0 High-Impedance 1 0 1 Enable 1 1 0 Enable 1 1 1 Enable TABLE 4 — INTERNAL REGISTER AND ADDRESS MEMORY MAPPING A11 A10 A9 A8 A7 A6 A5 A4 A3 A2 A1 A0 1 1 STA4 STA3 STA2 STA1 STA0 CH4 CH3 CH2 CH1 CH0 R Data Memory 1 0 STA4 STA3 STA2 STA1 STA0 CH4 CH3 CH2 CH1 CH0 R/W Connect. Memory 0 1 0 0 0 0 x x x x x x R/W Control Register 0 1 0 0 0 1 x x x x x x R/W Frame Align Register 0 1 0 0 1 0 x x x x x x R/W FOR0 0 1 0 0 1 1 x x x x x x R/W FOR1 0 1 0 1 0 0 x x x x x x R/W FOR2 0 1 0 1 0 1 x x x x x x R/W FOR3 0 1 0 1 1 0 x x x x x x R/W FOR4 0 1 0 1 1 1 x x x x x x R/W FOR5 0 1 1 0 0 0 x x x x x x R/W FOR6 0 1 1 0 0 1 x x x x x x R/W FOR7 7 R/W Location IDT72V70210 3.3V TIME SLOT INTERCHANGE DIGITAL SWITCH 1,024 x 1,024 COMMERCIAL TEMPERATURE RANGE TABLE 5 — CONTROL REGISTER (CR) BITS Reset Value: 0000H. 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0 0 0 0 0 0 0 MBP BPD3 BPD2 BPD1 BPD0 BPE OSB SFE 0 0 Bit Name Description 15-10 Unused Must be zero for normal operation. 9 MBP (Memory Block Program) When 1, the connection memory block programming feature is ready for the programming of Connection Memory high bits, bit 11 to bit 15. When 0, this feature is disabled. 8-5 BPD4-0 (Block Programming Data) These bits carry the value to be loaded into the connection memory block whenever the memory block programming feature is activated. After the MBP bit in the control register is set to 1 and the BPE bit is set to 1, the contents of the bits BPD3-0 are loaded into bit 15 and 12 of the connection memory. Bit 11 to bit 0 of the connection memory are set to 0. 4 BPE (Begin Block Programming Enable) A zero to one transition of this bit enables the memory block programming function. The BPE and BPD4-0 bits in the CR register have to be defined in the same write operation. Once the BPE bit is set HIGH, the device requires two frames to complete the block programming. After the programming function has finished, the BPE bit returns to zero to indicate the operation is completed. When the BPE = 1, the BPE or MBP can be set to 0 to abort to ensure proper operation. When BPE = 1, the other bit in the CR register must not be changed for two frames to ensure proper operation. 3 OSB (Output Stand By) When ODE = 0 and OSB = 0, the output drivers of TX0 to TX31 are in high impedance mode. When ODE = 0 and OSB = 1, the output driver of TX0 to TX31 function normally. When ODE =1, TX0 to TX31 output drivers function normally. 2 SFE (Start Frame Evaluation) A zero to one transition in this bit starts the frame evaluation procedure. When the CFE bit in the FAR register changes from zero to one, the evaluation procedure stops. To start another fame evaluation cycle, set this bit to zero for at least one frame. Unused Must be zero for normal operation. 1-0 TABLE 6 — CONNECTION MEMORY BITS 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0 LPBK V/C PC OE SAB4 SAB3 SAB2 SAB1 SAB0 0 0 CAB4 CAB3 CAB2 CAB1 CAB0 Bit Name Description 15 LPBK (Per Channel Loopback) When 1, the RX n channel m data comes from the TX n channel m. For proper per channel loopback operations, set the delay offset register bits OFn[2:0] to zero for the streams which are in the loopback mode. 14 V/C (Variable/Constant Throughput Delay) This bit is used to select between the variable (LOW) and constant delay (HIGH) mode on a per-channel basis. 13 PC (Processor Channel) When 1, the contents of the connection memory are output on the corresponding output channel and stream. Only the lower byte (bit 7 – bit 0) will be output to the TX output pins. When 0, the contents of the connection memory are the data memory address of the switched input channel and stream. 12 OE (Output Enable) This bit enables the TX output drivers on a per-channel basis. When 1, the output driver functions normally. When 0, the output driver is in a high-impedance state. 11-7 SAB4-0 (Source Stream Address Bits) The binary value is the number of the data stream for the source of the connection. 6-5 Unused Must be zero for normal operation. 4-0 CAB4-0 (Source Channel Address Bits) The binary value is the number of the channel for the source of the connection. 8 IDT72V70210 3.3V TIME SLOT INTERCHANGE DIGITAL SWITCH 1,024 x 1,024 COMMERCIAL TEMPERATURE RANGE TABLE 7 — FRAME ALIGNMENT REGISTER (FAR) BITS Reset Value: Bit 15-13 0000H. 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0 0 0 0 CFE FD11 FD10 FD9 FD8 FD7 FD6 FD5 FD4 FD3 FD2 FD1 FD0 Name Description Unused Must be zero for normal operation 12 CFE (Complete Frame Evaluation) When CFE = 1, the frame evaluation is completed and bits FD10 to FD0 bits contains a valid frame alignment offset. This bit is reset to zero, when SFE bit in the CR register is changed from 1 to 0. 11 FD11 The falling edge of FE (or rising edge for GCI mode) is sampled during the CLK-high phase (FD11 = 1) or during the CLK-low phase (Frame Delay Bit 11) (FD11 = 0). This bit allows the measurement resolution to ½ CLK cycle. 10-0 FD10-0 (Frame Delay Bits) The binary value expressed in these bits refers to the measured input offset value. These bits are rest to zero when the SFE bit of the CR register changes from 1 to 0. (FD10 – MSB, FD0 – LSB) ST-BUS® Frame CLK Offset Value 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 13 14 15 16 FE Input (FD[10:0] = 06H) (FD11 = 0, sample at CLK LOW phase) GCI Frame CLK Offset Value 0 1 2 3 4 5 6 7 8 9 10 11 12 FE Input (FD[10:0] = 09H) (FD11 = 1, sample at CLK HIGH phase) 5714 drw 04 Figure 1. Example for Frame Alignment Measurement 9 IDT72V70210 3.3V TIME SLOT INTERCHANGE DIGITAL SWITCH 1,024 x 1,024 COMMERCIAL TEMPERATURE RANGE TABLE 8 — FRAME INPUT OFFSET REGISTER (FOR) BITS Reset Value: 0000H for all FOR registers. 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0 OF32 OF31 OF30 DLE3 OF22 OF21 OF20 DLE2 OF12 OF11 OF10 DLE1 OF02 OF01 OF00 DLE0 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0 OF72 OF71 OF70 DLE7 OF62 OF61 OF60 DLE6 OF52 OF51 OF50 DLE5 OF42 OF41 OF40 DLE4 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0 OF112 OF111 OF110 DLE11 OF102 OF101 OF100 DLE10 OF92 OF91 OF90 DLE9 OF82 OF81 OF80 DLE8 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0 OF312 OF311 OF310 DLE31 OF142 OF141 OF140 DLE14 OF132 OF131 OF130 DLE13 OF122 OF121 OF120 DLE12 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0 OF192 OF191 OF190 DLE19 OF182 OF181 OF180 DLE18 OF172 OF171 OF170 DLE17 OD162 OD161 OF160 DLE16 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0 OF232 OF231 OF230 DLE23 OF222 OF221 OF220 DLE22 OF212 OF211 OF210 DLE21 OF202 OF201 OF200 DLE20 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0 OF272 OF271 OF270 DLE27 OF262 OF261 OF260 DLE26 OF252 OF251 OF250 DLE25 OF242 OF241 OF240 DLE24 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0 OF312 OF311 OF310 DLE31 OF302 OF301 OF300 DLE30 OF292 OF291 OF290 DLE29 OF282 OF281 OF280 DLE28 FOR0 Register FOR1 Register FOR2 Register FOR3 Register FOR4 Register FOR5 Register FOR6 Register FOR7 Register Name(1) Description OFn2, OFn1, OFn0 (Offset Bits 2, 1 & 0) These three bits define how long the serial interface receiver takes to recognize and store bit 0 from the RX input pin: i.e., to start a new frame. The input frame offset can be selected to +4.5 clock periods from the point where the external frame pulse input signal is applied to the F0i input of the device. See Figure 1. DLEn ST-BUS® mode: (Data Latch Edge) DLEn = 0, if clock rising edge is at the ¾ point of the bit cell. DLEn = 1, if when clock falling edge is at the ¾ of the bit cell. GCI mode: DLEn = 0, if clock falling edge is at the ¾ point of the bit cell. DLEn = 1, if when clock rising edge is at the ¾ of the bit cell. NOTE: 1. n denotes an input stream number from 0 to 31. 10 IDT72V70210 3.3V TIME SLOT INTERCHANGE DIGITAL SWITCH 1,024 x 1,024 COMMERCIAL TEMPERATURE RANGE TABLE 9 — OFFSET BITS (OFn2, OFn1, OFn0, DLEn) & FRAME DELAY BITS (FD11, FD2-0) Input Stream Measurement Result from Corresponding Frame Delay Bits Offset Bits Offset FD11 FD2 FD1 FD0 OFn2 OFn1 OFn0 DLEn No clock period shift (Default) 1 0 0 0 0 0 0 0 + 0.5 clock period shift 0 0 0 0 0 0 0 1 + 1.0 clock period shift 1 0 0 1 0 0 1 0 + 1.5 clock period shift 0 0 0 1 0 0 1 1 + 2.0 clock period shift 1 0 1 0 0 1 0 0 + 2.5 clock period shift 0 0 1 0 0 1 0 1 + 3.0 clock period shift 1 0 1 1 0 1 1 0 + 3.5 clock period shift 0 0 1 1 0 1 1 1 + 4.0 clock period shift 1 1 0 0 1 0 0 0 + 4.5 clock period shift 0 1 0 0 1 0 0 1 ST-BUS® F0i CLK RX Stream Bit 7 offset = 0, DLE = 0 RX Stream offset = 1, DLE = 0 Bit 7 offset = 0, DLE = 1 Bit 7 RX Stream offset = 1, DLE = 1 Bit 7 RX Stream denotes the 3/4 point of the bit cell GCI F0i CLK RX Stream Bit 0 offset = 0, DLE = 0 RX Stream RX Stream RX Stream offset = 1, DLE = 0 Bit 0 offset = 0, DLE = 1 Bit 0 offset = 1, DLE = 1 Bit 0 denotes the 3/4 point of the bit cell Figure 2. Examples for Input Offset Delay Timing 11 5714 drw 05 IDT72V70210 3.3V TIME SLOT INTERCHANGE DIGITAL SWITCH 1,024 x 1,024 COMMERCIAL TEMPERATURE RANGE JTAG SUPPORT towards the TDO. The data out of the TDO is clocked on the falling edge of the TCK pulses. When no data is shifted through the boundary scan cells, the TDO driver is set to a high impedance state. •Test Reset (TRST) Reset the JTAG scan structure. This pin is internally pulled to VCC. TEST ACCESS PORT (TAP) The Test Access Port (TAP) provides access to the test functions of the IDT72V70210. It consists of three input pins and one output pin. •Test Clock Input (TCK) TCK provides the clock for the test logic. The TCK does not interfere with any on-chip clock and thus remain independent. The TCK permits shifting of test data into or out of the Boundary-Scan register cells concurrently with the operation of the device and without interfering with the on-chip logic. •Test Mode Select Input (TMS) The logic signals received at the TMS input are interpreted by the TAP Controller to control the test operations. The TMS signals are sampled at the rising edge of the TCK pulse. This pin is internally pulled to VCC when it is not driven from an external source. •Test Data Input (TDI) Serial input data applied to this port is fed either into the instruction register or into a test data register, depending on the sequence previously applied to the TMS input. Both registers are described in a subsequent section. The received input data is sampled at the rising edge of TCK pulses. This pin is internally pulled to Vcc when it is not driven from an external source. •Test Data Output (TDO) Depending on the sequence previously applied to the TMS input, the contents of either the instruction register or data register are serially shifted out INSTRUCTION REGISTER In accordance with the IEEE-1149.1 standard, the IDT72V70210 uses public instructions. The IDT72V70210 JTAG Interface contains a two-bit instruction register. Instructions are serially loaded into the instruction register from the TDI when the TAP Controller is in its shifted-IR state. Subsequently, the instructions are decoded to achieve two basic functions: to select the test data register that may operate while the instruction is current, and to define the serial test data register path, which is used to shift data between TDI and TDO during data register scanning. The IDT72V70210 JTAG interface conforms to the Boundary-Scan standard IEEE-1149.1. This standard specifies a design-for-testability technique called Boundary-Scan test (BST). The operation of the boundary-scan circuitry is controlled by an external test access port (TAP) Controller. TEST DATA REGISTER As specified in IEEE-1149.1, the IDT72V70210 JTAG Interface contains two test data registers: •The Boundary-Scan register The Boundary-Scan register consists of a series of Boundary-Scan cells arranged to form a scan path around the boundary of the IDT72V70210 core logic. •The Bypass Register The Bypass register is a single stage shift register that provides a one-bit path from TDI to its TDO. The IDT72V70210 boundary scan register bits are shown in Table 10. Bit 0 is the first bit clocked out. All three-state enable bits are active high. 12 IDT72V70210 3.3V TIME SLOT INTERCHANGE DIGITAL SWITCH 1,024 x 1,024 COMMERCIAL TEMPERATURE RANGE TABLE 10 — BOUNDARY SCAN REGISTER BITS Device Pin ODE RESET CLK F0i FE IC DS CS R/W A0 A1 A2 A3 A4 IC IC A5 A6 A7 A8 A9 A10 A11 DTA D15 D14 D13 D12 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0 TX31 TX30 TX29 TX28 TX27 TX26 TX25 TX24 RX31 RX30 RX29 RX28 Boundary Scan Bit 0 to bit 167 Three-State Output Input Control Scan Cell Scan Cell 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 91 Device Pin RX27 RX26 RX25 RX24 TX23 TX22 TX21 TX20 TX19 TX18 TX17 TX16 RX23 RX22 RX21 RX20 RX19 RX18 RX17 RX16 TX15 TX14 TX13 TX12 TX11 TX10 TX9 TX8 RX15 RX14 RX13 RX12 RX11 RX10 RX9 RX8 TX7 TX6 TX5 TX4 TX3 TX2 TX1 TX0 RX7 RX6 RX5 RX4 RX3 RX2 RX1 RX0 13 Boundary Scan Bit 0 to bit 167 Three-State Output Input Control Scan Cell Scan Cell 92 93 94 95 96 97 98 99 100 101 102 103 104 105 106 107 108 109 110 111 112 113 114 115 116 117 118 119 120 121 122 123 124 125 126 127 128 129 130 131 132 133 134 135 136 137 138 139 140 141 142 143 144 145 146 147 148 149 150 151 152 153 154 155 156 157 158 159 160 161 162 163 164 165 166 167 IDT72V70210 3.3V TIME SLOT INTERCHANGE DIGITAL SWITCH 1,024 x 1,024 COMMERCIAL TEMPERATURE RANGE ABSOLUTE MAXIMUM RATINGS(1) Symbol Parameter Min. Max. Unit Supply Voltage 3.0 3.6 V VCC Vi Voltage on Digital Inputs GND -0.3 5.3 V IO Current at Digital Outputs -50 50 mA TS Storage Temperature -55 +125 °C PD Package Power Dissapation ⎯ 2 W NOTE: 1. Exceeding these values may cause permanent damage. Functional operation under these conditions is not implied. RECOMMENDED OPERATING CONDITIONS(1) Symbol Parameter Min. Typ. Max. Unit VCC Positive Supply 3.0 3.3 3.6 V VIH Input HIGH Voltage 2.0 ⎯ 5.3 V VIL Input LOW Voltage ⎯ ⎯ 0.8 V TOP Operating Temperature Commercial -40 25 +85 °C NOTE: 1.Voltages are with respect to Ground unless otherwise stated. DC ELECTRICAL CHARACTERISTICS Symbol Min. Typ. Max. Units ICC (2) Parameter Supply Current @ 2 Mb/s - 15 20 mA IIL(3,4) Input Leakage (input pins) - - 50 μA IOZ(3,4) High-impedance Leakage - - 50 μA VOH(5) Output HIGH Voltage 2.4 - - V VOL Output LOW Voltage - - 0.4 V (6) NOTES: 1. Voltages are with respect to ground (GND) unless otherwise stated. 2. Outputs unloaded. 3. 0 ≤ V ≤ VCC. 4. Maximum leakage on pins (output or I/O pins in high-impedance state) is over an 5. IOH = 10 mA. 6. IOL = 10 mA. applied voltage (V). AC ELECTRICAL CHARACTERISTICS - TIMING PARAMETER MEASUREMENT VOLTAGE LEVELS Symbol Rating Level Unit V TT TTL Threshold 1.5 VHM TTL Rise/Fall Threshold Voltage HIGH 2.0 V VLM TTL Rise/Fall Threshold Voltage LOW 0.8 V Test Point V VCC S1 is open circuit except when testing output levels or high impedance states. RL Output Pin S1 S2 CL GND S2 is switched to VCC or GND when testing output levels or high impedance states. GND 5714 drw06 Figure 3. Output Load 14 IDT72V70210 3.3V TIME SLOT INTERCHANGE DIGITAL SWITCH 1,024 x 1,024 COMMERCIAL TEMPERATURE RANGE AC ELECTRICAL CHARACTERISTICS - FRAME PULSE AND CLK Symbol Parameter Min. Typ. Max. Units tFPW Frame Pulse Width (ST-BUS®, GCI) Bit rate = 2.048 Mb/s 26 ⎯ 295 ns tFPS Frame Pulse Setup time before CLK falling (ST-BUS® or GCI) 10 ⎯ ⎯ ns tFPH Frame Pulse Hold Time from CLK falling (ST-BUS® or GCI) 16 ⎯ ⎯ ns tCP CLK Period Bit rate = 2.048 Mb/s 190 ⎯ 300 ns tCH CLK Pulse Width HIGH Bit rate = 2.048 Mb/s 85 ⎯ 150 ns tCL CLK Pulse Width LOW Bit rate = 2.048 Mb/s 85 ⎯ 150 ns tr, tf Clock Rise/Fall Time ⎯ ⎯ 10 ns AC ELECTRICAL CHARACTERISTICS(1) ⎯ SERIAL STREAM (ST-BUS® and GCI) Symbol Parameter Min. Typ. Max. Units tSIS RX Setup Time 5 ⎯ ⎯ ns tSIH RX Hold Time 10 ⎯ ⎯ ns tSOD TX Delay – Active to Active @ 2.048 Mb/s ⎯ ⎯ 30 ns tDZ TX Delay – Active to High-Z @ 2.048 Mb/s ⎯ ⎯ 30 ns tZD TX Delay – High-Z to Active @ 2.048 Mb/s ⎯ ⎯ 30 ns tODE Output Driver Enable (ODE) Delay @ 2.048 Mb/s ⎯ ⎯ 30 ns NOTE: 1. High Impedance is measured by pulling to the appropriate rail with RL (1K), with timing corrected to cancel time taken to discharge CL (150 pF). 15 IDT72V70210 3.3V TIME SLOT INTERCHANGE DIGITAL SWITCH 1,024 x 1,024 COMMERCIAL TEMPERATURE RANGE tFPW F0i tFPS tFPH tCL tCH tCP tf tr CLK tSOD TX Bit 0, Last Ch(1) Bit 7, Channel 0 RX Bit 0, Last Ch Bit 5, Channel 0 tSIH tSIS (1) Bit 6, Channel 0 Bit 7, Channel 0 Bit 6, Channel 0 Bit 5, Channel 0 5714 drw 07 NOTE: 1. @ 2.048 Mb/s bit rate, last channel = ch 31, Figure 4. ST-BUS® Timing tFPW F0i tCL tCH tFPH tFPS tf tr tCP CLK tSOD Bit 7, Last Ch(1) TX Bit 0, Channel 0 tSIS RX (1) Bit 7, Last Ch Bit 2, Channel 0 Bit 1, Channel 0 tSIH Bit 0, Channel 0 Bit 2, Channel 0 Bit 1, Channel 0 5714 drw 08 NOTE: 1. @ 2.048 Mb/s, last channel = ch 31, Figure 5. GCI Timing CLK (ST-BUS® mode) CLK (GCI mode) tDZ TX ODE HiZ VALID DATA tODE tODE tZD TX HiZ TX VALID DATA HIZ VALID DATA 5714 drw 09 HIZ 5714 drw10 Figure 7. Output Driver Enable (ODE) Figure 6. Serial Output and External Control 16 IDT72V70210 3.3V TIME SLOT INTERCHANGE DIGITAL SWITCH 1,024 x 1,024 COMMERCIAL TEMPERATURE RANGE AC ELECTRICAL CHARACTERISTICS - MICROPROCESSOR INTERFACE TIMING Symbol Parameter Min. Typ. Max. Units tCSS CS Setup from DS falling 0 ⎯ ⎯ ns tRWS R/W Setup from DS falling 3 ⎯ ⎯ ns tADS Address Setup from DS falling 2 ⎯ ⎯ ns tCSH CS Hold after DS rising 0 ⎯ ⎯ ns tRWH R/W Hold after DS Rising 3 ⎯ ⎯ ns tADH Address Hold after DS Rising 2 ⎯ ⎯ ns tDDR(1) Data Setup from DTA LOW on Read 2 ⎯ ⎯ ns tDHR(1,2,3) Data Hold on Read 10 15 25 ns tDSW Data Setup on Write (Fast Write) 10 ⎯ ⎯ ns tSWD Valid Data Delay on Write (Slow Write) - ⎯ 0 ns 5 ⎯ ⎯ ns 30 345 ns ns tDHW Data Hold on Write tAKD (1) Acknowledgment Delay: Reading/Writing Registers Reading/Writing Memory tAKH (1,2,3) Acknowledgment Hold Time tDSS (4) Data Strobe Setup Time ⎯ ⎯ 20 ns 2 ⎯ ⎯ ns NOTES: 1. CL= 150pF 2. RL = 1K 3. High Impedance is measured by pulling to the appropriate rail with RL, with timing corrected to cancel time taken to discharge CL. 4. To achieve one clock cycle fast memory access, this setup time, tDSS should be met. Otherwise, memory access operation is determined by tAKD, which in worst case is 345 ns. 17 IDT72V70210 3.3V TIME SLOT INTERCHANGE DIGITAL SWITCH 1,024 x 1,024 COMMERCIAL TEMPERATURE RANGE CLK GCI CLK ST-BUS® tDSS DS tCSH tCSS CS tRWH tRWS R/W tADH tADS VALID ADDRESS A0-A11 tDHR D0-D15 READ VALID READ DATA tSWD tDSW D0-D15 WRITE tDHW VALID WRITE DATA tDDR tAKD D TA tAKH 5714 drw 11 Figure 8. Motorola Non-Mulitplexed Bus Timing 18 ORDERING INFORMATION IDT XXXXX XX XX Device Type Package Process/ Temp. Range Blank -40ºC to +85ºC B DAG TQFP – Green (TQFP, DA144-1) 72V70210 1024 x 1024 – 3.3V Time Slot Interchange Digital Switch DATASHEET DOCUMENT HISTORY 5/05/2000 6/08/2000 8/30/2000 01/24/2001 10/22/2001 1/04/2002 1/11/2005 12/03/2012 pg. 1 pgs. 1, 2, 3 and 18. pgs. 2, 4, 5, 7, 9, 13 and 17. pg. 13 pg. 1 pgs. 1 and 14. pgs. 2, 3 and 4. pg. 19 12/16/14 pg 1 and 19 removed BCG package CORPORATE HEADQUARTERS 2975 Stender Way Santa Clara, CA 95054 for SALES: 800-345-7015 or 408-727-6116 fax: 408-492-8649 www.idt.com 19 for Tech Support: 408-330-1552 email: TELECOMhelp@idt.com IMPORTANT NOTICE AND DISCLAIMER RENESAS ELECTRONICS CORPORATION AND ITS SUBSIDIARIES (“RENESAS”) PROVIDES TECHNICAL SPECIFICATIONS AND RELIABILITY DATA (INCLUDING DATASHEETS), DESIGN RESOURCES (INCLUDING REFERENCE DESIGNS), APPLICATION OR OTHER DESIGN ADVICE, WEB TOOLS, SAFETY INFORMATION, AND OTHER RESOURCES “AS IS” AND WITH ALL FAULTS, AND DISCLAIMS ALL WARRANTIES, EXPRESS OR IMPLIED, INCLUDING, WITHOUT LIMITATION, ANY IMPLIED WARRANTIES OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE, OR NON-INFRINGEMENT OF THIRD PARTY INTELLECTUAL PROPERTY RIGHTS. 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Renesas' products are provided only subject to Renesas' Terms and Conditions of Sale or other applicable terms agreed to in writing. No use of any Renesas resources expands or otherwise alters any applicable warranties or warranty disclaimers for these products. (Rev.1.0 Mar 2020) Corporate Headquarters Contact Information TOYOSU FORESIA, 3-2-24 Toyosu, Koto-ku, Tokyo 135-0061, Japan www.renesas.com For further information on a product, technology, the most up-to-date version of a document, or your nearest sales office, please visit: www.renesas.com/contact/ Trademarks Renesas and the Renesas logo are trademarks of Renesas Electronics Corporation. All trademarks and registered trademarks are the property of their respective owners. © 2020 Renesas Electronics Corporation. All rights reserved.
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