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H5N2901FN

H5N2901FN

  • 厂商:

    RENESAS(瑞萨)

  • 封装:

  • 描述:

    H5N2901FN - Silicon N Channel MOS FET High Speed Power Switching - Renesas Technology Corp

  • 详情介绍
  • 数据手册
  • 价格&库存
H5N2901FN 数据手册
H5N2901FN Silicon N Channel MOS FET High Speed Power Switching REJ03G0372-0100Z Rev.1.00 May.28.2004 Features • Low on-resistance • Low leakage current • High speed switching Outline TO-220FN D G 1. Gate 2. Drain 3. Source S 1 2 3 Absolute Maximum Ratings (Ta = 25°C) Item Drain to Source voltage Gate to Source voltage Drain current Drain peak current Body-Drain diode reverse Drain current Body-Drain diode reverse Drain peak current Avalanche current Avalanche energy Channel dissipation Channel to case thermal impedance Channel temperature Storage temperature Notes: 1. PW ≤ 10 µs, duty cycle ≤ 1% 2. Value at Tc = 25°C 3. STch = 25°C, Tch ≤ 150°C Symbol VDSS VGSS ID Note1 ID (pulse) IDR IDR (pulse)Note1 IAPNote3 EARNote3 Pch Note2 θch-c Tch Tstg Ratings 290 ±30 18 72 18 72 6 2.1 30 4.17 150 –55 to +150 Unit V V A A A A A mJ W °C/W °C °C Rev.1.00, May.28.2004, page 1 of 7 H5N2901FN Electrical Characteristics (Ta = 25°C) Item Drain to Source breakdown voltage Zero Gate voltage drain current Gate to Source leak current Gate to Source cutoff voltage Forward transfer admittance Static Drain to Source on state resistance Input capacitance Output capacitance Reverse transfer capacitance Turn-on delay time Rise time Turn-off delay time Fall time Total Gate charge Gate to Source charge Gate to Drain charge Body-Drain diode forward voltage Body-Drain diode reverse recovery time Body-Drain diode reverse recovery charge Notes: 4. Pulse test Symbol V(BR)DSS IDSS IGSS VGS(off) |yfs| RDS(on) Ciss Coss Crss td(on) tr td(off) tf Qg Qgs Qgd VDF trr Qrr Min 290 — — 3.0 10 — — — — — — — — — — — — — — Typ — — — — 18 0.070 2200 300 38 35 60 110 45 56 13 26 0.9 190 1.3 Max — 1 ±0.1 4.0 — 0.091 — — — — — — — — — — 1.5 — — Unit V µA µA V S Ω pF pF pF ns ns ns ns nC nC nC V ns µC Test conditions ID = 10 mA, VGS = 0 VDS = 290 V, VGS = 0 VGS = ±30 V, VDS = 0 VDS = 10 V, ID = 1 mA ID = 9 A, VDS = 10 V Note4 ID = 9 A, VGS = 10 VNote4 VDS = 25 V VGS = 0 f = 1 MHz ID = 9 A VGS = 10 V RL = 16.1 Ω Rg = 10 Ω VDD = 230 V VGS = 10 V ID = 18 A IF = 18 A, VGS = 0 Note4 IF = 18 A, VGS = 0 diF/dt = 100 A/µs Rev.1.00, May.28.2004, page 2 of 7 H5N2901FN Main Characteristics Power vs. Temperature Derating 40 Pch (W) Maximum Safe Operation Area 1000 300 ID (A) 30 100 30 10 3 1 0.3 Operation in 0.03 this area is 0.1 limited by RDS(on) DC PW Op er Channel Dissipation Drain Current 10 10 0 µ µs 1m = ss 1 0 m ion 20 at s( (T 1s c= ho ) 25 t) °C 10 0 50 100 150 Tc (°C) 200 Case Temperature Ta = 25°C 0.01 0.1 0.3 1 3 10 30 100 300 1000 Drain to Source Voltage VDS (V) Typical Transfer Characteristics 100 VDS = 10 V Pulse Test Typical Output Characteristics 100 Pulse Test ID (A) ID (A) Drain Current 80 10 V 8V 7V 80 60 6V 60 Drain Current 40 40 20 VGS = 5 V 0 4 8 12 Drain to Source Voltage 16 20 VDS (V) 20 Tc = 75°C 25°C –25°C 8 10 VGS (V) 0 2 4 6 Gate to Source Voltage Drain to Source Saturation Voltage vs. Gate to Source Voltage Drain to Source Saturation Voltage VDS(on) (V) Pulse Test 4 3 I D = 30 A 2 15 A 9A 1 Drain to Source on State Resistance RDS(on) (Ω) 5 Static Drain to Source on State Resistance vs. Drain Current 0.2 Pulse Test VGS = 10 V 0.1 0.05 0.02 0 0.01 12 4 8 Gate to Source Voltage 16 20 VGS (V) 1 2 5 10 20 50 Drain Current ID (A) 100 Rev.1.00, May.28.2004, page 3 of 7 H5N2901FN Static Drain to Source on State Resistance vs. Temperature 0.400 Pulse Test 0.320 V GS = 10 V Forward Transfer Admittance vs. Drain Current Forward Transfer Admittance |yfs| (S) Static Drain to Source on State Resistance RDS(on) (Ω) 100 50 Tc = –25°C 20 10 5 2 1 0.5 0.2 0.2 0.5 1 2 5 V DS = 10 V Pulse Test 10 20 ID (A) 50 100 75°C 25°C 0.240 I D = 30 A 0.160 15 A 0.080 0 –40 9A 0 40 80 120 Case Temperature Tc (°C) Body-Drain Diode Reverse Recovery Time 160 Drain Current Typical Capacitance vs. Drain to Source Voltage 10000 5000 1000 Reverse Recovery Time trr (ns) 500 Capacitance C (pF) VGS = 0 f = 1 MHz Ciss 2000 1000 500 200 100 50 Coss 200 100 50 20 10 20 10 0.1 di / dt = 100 A / µs V GS = 0, Ta = 25°C 0.3 1 3 10 30 100 Reverse Drain Current IDR (A) Dynamic Input Characteristics VGS (V) Crss 0 20 40 60 Drain to Source Voltage 80 100 VDS (V) 500 VDS (V) I D = 30 A V DS = 50 V 100 V 230 V VDD VGS 20 10000 Switching Characteristics V GS = 10 V, V DD = 145 V PW = 5 µs, duty < 1 % R G =10 Ω 400 16 Gate to Source Voltage Switching Time t (ns) Drain to Source Voltage 1000 300 12 tf t d(off) tr 200 8 100 tf t d(on) 100 V DS = 230 V 100 V 50 V 20 40 Gate Charge 60 80 Qg (nC) 4 0 100 0 10 0.1 tr 0.3 1 3 Drain Current 10 30 ID (A) 100 Rev.1.00, May.28.2004, page 4 of 7 H5N2901FN Reverse Drain Current vs. Source to Drain Voltage 100 5 Gate to Source Cutoff Voltage vs. Case Temperature V DS = 10 V I D = 10mA IDR (A) 80 Gate to Source Cutoff Voltage V GS(off) (V) 4 Reverse Drain Current 60 V GS = 0 V 3 1mA 2 0.1mA 40 10 V 5V Pulse Test 0 0.4 0.8 1.2 1.6 2.0 20 1 0 -50 0 50 100 150 Tc (°C) 200 Source to Drain Voltage VSD (V) Case Temperature Normalized Transient Thermal Impedance vs. Pulse Width 3 Tc = 25°C 1 Normalized Transient Thermal Impedance γ s (t) D=1 0.5 0.3 0.2 0.1 0.1 0.05 0.03 0.02 1 0.0 tp ul se 0.01 θ ch – c(t) = γ s (t) • θ ch – c θ ch – c = 4.17°C/W, Tc = 25°C PDM PW T 0.003 0.001 10 µ 1s D= PW T ho 100 µ 1m 10 m Pulse Width PW (s) 100 m 1 10 Rev.1.00, May.28.2004, page 5 of 7 H5N2901FN Switching Time Test Circuit Vin Monitor D.U.T. RL 10 Ω Vin 10 V V DD = 145 V Vin Vout 10% 10% 90% td(on) tr 90% td(off) tf 10% Vout Monitor Waveform 90% Rev.1.00, May.28.2004, page 6 of 7 H5N2901FN Package Dimensions TO-220FN EIAJ Package Code  JEDEC Code  Mass (g) (reference value) 2.0 Lead Material Cu alloy 10 ± 0.3 2.8 ± 0.2 15 ± 0.3 φ3.2 ± 0.2 14 ± 0.5 3.6 ± 0.3 1.1 ± 0.2 1.1 ± 0.2 0.75 ± 0.15 6.5 ± 0.3 3 ± 0.3 0.75 ± 0.15 2.54 ± 0.25 2.54 ± 0.25 4.5 ± 0.2 Symbol A A1 A2 b D E e x y y1 ZD ZE Note 1) The dimensional figures indicate representative values unless otherwise the tolerance is specified. Ordering Information Part Name Quantity Shipping Container H5N2901FN-E 50 pcs Plastic magazine Note: For some grades, production may be terminated. Please contact the Renesas sales office to check the state of production before ordering the product. Rev.1.00, May.28.2004, page 7 of 7 2.6 ± 0.2 Dimension in Millimeters Min Typ Max Sales Strategic Planning Div. Keep safety first in your circuit designs! Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan 1. Renesas Technology Corp. puts the maximum effort into making semiconductor products better and more reliable, but there is always the possibility that trouble may occur with them. Trouble with semiconductors may lead to personal injury, fire or property damage. Remember to give due consideration to safety when making your circuit designs, with appropriate measures such as (i) placement of substitutive, auxiliary circuits, (ii) use of nonflammable material or (iii) prevention against any malfunction or mishap. Notes regarding these materials 1. These materials are intended as a reference to assist our customers in the selection of the Renesas Technology Corp. product best suited to the customer's application; they do not convey any license under any intellectual property rights, or any other rights, belonging to Renesas Technology Corp. or a third party. 2. Renesas Technology Corp. assumes no responsibility for any damage, or infringement of any third-party's rights, originating in the use of any product data, diagrams, charts, programs, algorithms, or circuit application examples contained in these materials. 3. All information contained in these materials, including product data, diagrams, charts, programs and algorithms represents information on products at the time of publication of these materials, and are subject to change by Renesas Technology Corp. without notice due to product improvements or other reasons. It is therefore recommended that customers contact Renesas Technology Corp. or an authorized Renesas Technology Corp. product distributor for the latest product information before purchasing a product listed herein. The information described here may contain technical inaccuracies or typographical errors. Renesas Technology Corp. assumes no responsibility for any damage, liability, or other loss rising from these inaccuracies or errors. Please also pay attention to information published by Renesas Technology Corp. by various means, including the Renesas Technology Corp. Semiconductor home page (http://www.renesas.com). 4. When using any or all of the information contained in these materials, including product data, diagrams, charts, programs, and algorithms, please be sure to evaluate all information as a total system before making a final decision on the applicability of the information and products. Renesas Technology Corp. assumes no responsibility for any damage, liability or other loss resulting from the information contained herein. 5. Renesas Technology Corp. semiconductors are not designed or manufactured for use in a device or system that is used under circumstances in which human life is potentially at stake. Please contact Renesas Technology Corp. or an authorized Renesas Technology Corp. product distributor when considering the use of a product contained herein for any specific purposes, such as apparatus or systems for transportation, vehicular, medical, aerospace, nuclear, or undersea repeater use. 6. The prior written approval of Renesas Technology Corp. is necessary to reprint or reproduce in whole or in part these materials. 7. If these products or technologies are subject to the Japanese export control restrictions, they must be exported under a license from the Japanese government and cannot be imported into a country other than the approved destination. Any diversion or reexport contrary to the export control laws and regulations of Japan and/or the country of destination is prohibited. 8. Please contact Renesas Technology Corp. for further details on these materials or the products contained therein. RENESAS SALES OFFICES Refer to "http://www.renesas.com/en/network" for the latest and detailed information. Renesas Technology America, Inc. 450 Holger Way, San Jose, CA 95134-1368, U.S.A Tel: (408) 382-7500, Fax: (408) 382-7501 Renesas Technology Europe Limited Dukes Meadow, Millboard Road, Bourne End, Buckinghamshire, SL8 5FH, U.K. Tel: (1628) 585-100, Fax: (1628) 585-900 Renesas Technology Hong Kong Ltd. 7th Floor, North Tower, World Finance Centre, Harbour City, 1 Canton Road, Tsimshatsui, Kowloon, Hong Kong Tel: 2265-6688, Fax: 2730-6071 Renesas Technology Taiwan Co., Ltd. 10th Floor, No.99, Fushing North Road, Taipei, Taiwan Tel: (2) 2715-2888, Fax: (2) 2713-2999 Renesas Technology (Shanghai) Co., Ltd. Unit2607 Ruijing Building, No.205 Maoming Road (S), Shanghai 200020, China Tel: (21) 6472-1001, Fax: (21) 6415-2952 Renesas Technology Singapore Pte. Ltd. 1 Harbour Front Avenue, #06-10, Keppel Bay Tower, Singapore 098632 Tel: 6213-0200, Fax: 6278-8001 http://www.renesas.com © 2004. Renesas Technology Corp., All rights reserved. Printed in Japan. Colophon .2.0
H5N2901FN
1. 物料型号: - 型号名称:H5N2901FN - 这是一个N沟道MOSFET高速功率开关。

2. 器件简介: - H5N2901FN是一个硅N沟道MOSFET,用于高速功率开关应用。 - 特点包括低导通电阻、低漏电流和高速开关。

3. 引脚分配: - 1. Gate(栅极) - 2. Drain(漏极) - 3. Source(源极)

4. 参数特性: - 绝对最大额定值: - 漏源电压(Vpss):290V - 栅源电压(VGss):+30V - 漏电流(ID):18A - 漏峰值电流(Note1 lp):72A - 体-漏二极管反向漏电流(IDR):18A - 体-漏二极管反向漏峰值电流(Note1 loR):72A - 雪崩电流(IApNote3):6A - 雪崩能量(EARNote3):2.1mJ - 通道耗散(Pch Note2):30W - 通道到外壳热阻(Ach-c):4.17°C/W - 通道温度(Tch):150°C - 存储温度(Tstg):-55到+150°C

5. 功能详解: - 电气特性包括漏源击穿电压、零栅压漏电流、栅源漏电流、栅源截止电压、正向转移导纳、静态漏源导通电阻、输入电容、输出电容、反向转移电容、开通延迟时间、上升时间、关断延迟时间、下降时间、总栅电荷、栅源电荷、栅漏电荷、体-漏二极管正向电压、体-漏二极管反向恢复时间、体-漏二极管反向恢复电荷等。

6. 应用信息: - 该器件适用于高速功率开关应用,具体应用需根据其电气特性和最大额定值来确定。

7. 封装信息: - 封装类型:TO-220FN - 质量(参考值):2.0g - 引脚材料:铜合金
H5N2901FN 价格&库存

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