HI9P0548-9Z

DATASHEET HI-546, HI-547, HI-548, HI-549 FN3150 Rev 7.00 Jun 15, 2016 Single 16 and 8, Differential 8-Channel and 4-Channel CMOS Analog MUXs with Active Overvoltage Protection The HI-546, HI-547, HI-548 and HI-549 are analog multiplexers with active overvoltage protection and guaranteed rON matching. Analog input levels may greatly exceed either power supply without damaging the device or disturbing the signal path of other channels. Active protection circuitry assures that signal fidelity is maintained even under fault conditions that would destroy other multiplexers. Features Analog inputs can withstand constant 70VP-P levels with 15V supplies. Digital inputs will also sustain continuous faults up to 4V greater than either supply. In addition, signal sources are protected from short circuiting should multiplexer supply loss occur. Each input presents 1k of resistance under this condition. These features make the HI-546, HI-547, HI-548 and HI-549 ideal for use in systems where the analog inputs originate from external equipment or separately powered circuitry. All devices are fabricated with 44V Dielectrically Isolated CMOS technology. The HI-546 is a single 16-Channel, the HI-547 is an 8-Channel differential, the HI-548 is a single 8-Channel and the HI-549 is a 4-Channel differential device. If input overvoltage protection is not needed the HI-506/507/508/509 multiplexers are recommended. For further information see Application Notes AN520 and AN521. • Analog Signal Range . . . . . . . . . . . . . . . . . . . . . . . . 15V • Analog Overvoltage Protection. . . . . . . . . . . . . . . . . . 70VP-P • No Channel Interaction During Overvoltage • Guaranteed rON Matching • Maximum Power Supply . . . . . . . . . . . . . . . . . . . . . . 44V • Break-Before-Make Switching • Access Time (Typical) . . . . . . . . . . . . . . . . . . . . . . . 500ns • Standby Power (Typical) . . . . . . . . . . . . . . . . . . . . 7.5mW • Pb-Free Plus Anneal Available (RoHS Compliant) Applications • Data Acquisition • Industrial Controls • Telemetry For MIL-STD-883 compliant parts, request the HI-546/883, HI-547/883, HI-548/883 and HI-549/883 datasheets. FN3150 Rev 7.00 Jun 15, 2016 Page 1 of 25 HI-546, HI-547, HI-548, HI-549 Ordering Information PART NUMBER PART MARKING HI1-0546-2 HI1-546-2 HI3-0546-5Z (Note) (No longer available, recommended replacement: HI9P0546-9Z, HI4P0546-5Z) HI3-546-5Z HI4P0546-5Z (Note) TEMP. RANGE (oC) -55 to 125 PACKAGE PKG. DWG. # 28 Ld CERDIP F28.6 0 to 75 28 Ld PDIP* (Pb-free) E28.6 HI4P546-5Z 0 to 75 28 Ld PLCC (Pb-free) N28.45 HI9P0546-9Z** (Note) HI9P546-9Z -40 to 85 28 Ld SOIC (Pb-free) M28.3 HI3-0547-5Z (Note) HI3-0547-5Z 0 to 75 28 Ld PDIP* (Pb-free) E28.6 HI4P0547-5Z (Note) (No longer available, recommended replacement: HI3-0547-5Z) HI4P547-5Z 0 to 75 28 Ld PLCC (Pb-free) N28.45 HI9P0547-9Z** (Note) HI9P547-9Z -40 to 85 28 Ld SOIC (Pb-free) M28.3 HI1-0548-2 HI1-548-2 -55 to 125 16 Ld CERDIP F16.3 HI3-0548-5Z (Note) HI3-548-5Z 0 to 75 16 LEAD PDIP (Pb-Free) E16.3 HI9P0548-5Z** (Note) HI9P548-5Z 0 to 75 16 Ld SOIC (Pb-free) M16.15 HI9P0548-9Z (Note) HI9P548-9Z -40 to 85 16 Ld SOIC (Pb-free) M16.15 HI1-0549-2 HI1-549-2 -55 to 125 16 Ld CERDIP F16.3 HI3-0549-5 (No longer available or supported) HI3-549-5 0 to 75 16 Ld PDIP E16.3 HI3-0549-5Z (Note) HI3-549-5Z 0 to 75 16 Ld PDIP (Pb-Free E16.3 HI4P0549-5Z (Note) (No longer available or supported) HI4P549-5Z 0 to 75 20 Ld PLCC (Pb-free) N20.35 HI9P0549-9Z (Note) HI9P549-9Z -40 to 85 16 Ld SOIC (Pb-free) M16.15 *Pb-free PDIPs can be used for through hole wave solder processing only. They are not intended for use in Reflow solder processing applications. **Add “96” suffix for tape and reel. NOTE: Intersil Pb-free plus anneal products employ special Pb-free material sets; molding compounds/die attach materials and 100% matte tin plate termination finish, which are RoHS compliant and compatible with both SnPb and Pb-free soldering operations. Intersil Pb-free products are MSL classified at Pb-free peak reflow temperatures that meet or exceed the Pb-free requirements of IPC/JEDEC J STD-020. Pinouts HI-546 (CERDIP, PDIP, SOIC) TOP VIEW +VSUPPLY 1 28 OUT HI-547 (CERDIP, PDIP, SOIC) TOP VIEW +VSUPPLY 1 OUT B 2 28 OUT A 27 -VSUPPLY NC 2 27 -VSUPPLY NC 3 26 IN 8 NC 3 26 IN 8A IN 16 4 25 IN 7 IN 8B 4 25 IN 7A IN 15 5 24 IN 6 IN 7B 5 24 IN 6A IN 14 6 23 IN 5 IN 6B 6 23 IN 5A IN 13 7 22 IN 4 IN 5B 7 22 IN 4A IN 12 8 21 IN 3 IN 4B 8 21 IN 3A IN 11 9 20 IN 2 IN 3B 9 20 IN 2A 19 IN 1 IN 2B 10 19 IN 1A 18 ENABLE IN 1B 11 18 ENABLE IN 10 10 IN 9 11 GND 12 17 ADDRESS A0 GND 12 17 ADDRESS A0 VREF 13 16 ADDRESS A1 VREF 13 16 ADDRESS A1 ADDRESS A3 14 15 ADDRESS A2 NC 14 15 ADDRESS A2 FN3150 Rev 7.00 Jun 15, 2016 Page 2 of 25 HI-546, HI-547, HI-548, HI-549 Pinouts (Continued) NC NC +VSUPPLY OUT -VSUPPLY IN 8 IN 8B NC OUT B +VSUPPLY OUT A -VSUPPLY IN 8A HI-547 (PLCC) TOP VIEW IN 16 HI-546 (PLCC) TOP VIEW 4 3 2 1 28 27 26 4 3 2 1 28 27 26 24 IN 6A IN 13 7 23 IN 5 IN 5B 7 23 IN 5A 22 IN 4 IN 4B 8 22 IN 4A IN 11 9 21 IN 3 IN 3B 9 21 IN 3A IN 10 10 20 IN 2 IN 2B 10 20 IN 2A IN 9 11 19 IN 1 IN 1B 11 19 IN 1A 12 13 14 15 16 17 18 GND VREF A3 A2 A1 A0 ENABLE IN 12 8 HI-548 (CERDIP, PDIP, SOIC) TOP VIEW A0 1 16 A1 ENABLE 2 15 A2 -VSUPPLY 13 14 15 16 17 18 HI-549 (CERDIP, PDIP, SOIC) TOP VIEW 16 A1 A0 1 15 GND ENABLE 2 14 GND 3 12 ENABLE IN 6B 6 A0 24 IN 6 A1 IN 14 6 A2 25 IN 7A NC IN 7B 5 VREF 25 IN 7 GND IN 15 5 -VSUPPLY 14 +VSUPPLY 3 IN 1 4 13 +VSUPPLY IN 1A 4 13 IN 1B IN 2 5 12 IN 5 IN 2A 5 12 IN 2B IN 3 6 11 IN 6 IN 3A 6 11 IN 3B IN 4 7 10 IN 7 IN 4A 7 10 IN 4B OUT 8 9 IN 8 OUT A 8 IN 1 5 17 +V SUPPLY NC 6 16 NC IN 2 7 15 IN 5 14 IN 6 FN3150 Rev 7.00 Jun 15, 2016 9 10 11 12 13 IN 4 OUT NC IN 8 IN 7 IN 3 8 A1 GND 2 1 20 19 -VSUPPLY 4 IN 1A 5 NC 6 IN 2A 7 IN 3A 8 NO ER NG LO ED RT 18 +V O SUPPLY P P SU IN 1B 17 R O E L 16 NC AB IL A 15 IN 2B AV 14 IN 3B 9 10 11 12 13 IN 4B 18 GND 3 OUT B -VSUPPLY 4 NC 19 NC 20 A0 A2 1 OUT A A1 2 ENABLE NC 3 IN 4A A0 HI-549 (PLCC) TOP VIEW ENABLE HI-548 (PLCC) TOP VIEW 9 OUT B Page 3 of 25 HI-546, HI-547, HI-548, HI-549 TRUTH TABLE HI-547 (Continued) TRUTH TABLE HI-546 A3 A2 A1 A0 EN “ON” CHANNEL A2 A1 A0 EN “ON” CHANNEL PAIR X X X X L None H L L H 5 L L L L H 1 H L H H 6 L L L H H 2 H H L H 7 L L H L H 3 H H H H 8 L L H H H 4 L H L L H 5 L H L H H 6 A2 A1 A0 EN “ON” CHANNEL L H H L H 7 X X X L None L H H H H 8 L L L H 1 H L L L H 9 L L H H 2 H L L H H 10 L H L H 3 H L H L H 11 L H H H 4 H L H H H 12 H L L H 5 H H L L H 13 H L H H 6 H H L H H 14 H H L H 7 H H H L H 15 H H H H 8 H H H H H 16 TRUTH TABLE HI-548 TRUTH TABLE HI-549 TRUTH TABLE HI-547 A1 A0 EN “ON” CHANNEL PAIR A2 A1 A0 EN “ON” CHANNEL PAIR X X L None X X X L None L L H 1 L L L H 1 L H H 2 L L H H 2 H L H 3 L H L H 3 H H H 4 L H H H 4 Functional Diagrams HI-546 HI-547 OUT 1K IN 1A IN 1 IN 2 OUT A 1K 1K 1K IN 8A DECODER/ DRIVER 1K 1K † DIGITAL INPUT 5V REF LEVEL SHIFT † † † † † PROTECTION VREF A0 A1 A2 A3 EN FN3150 Rev 7.00 Jun 15, 2016 DECODER/ DRIVER IN 8B IN 16 OVERVOLTAGE CLAMP AND SIGNAL ISOLATION IN 1B OUT B 1K OVERVOLTAGE CLAMP AND SIGNAL ISOLATION † DIGITAL INPUT 5V REF LEVEL SHIFT † † † † VREF A0 A1 A2 EN PROTECTION Page 4 of 25 HI-546, HI-547, HI-548, HI-549 Functional Diagrams (Continued) HI-548 HI-549 OUT 1K IN 1A IN 1 IN 2 OUT A 1K 1K 1K IN 4A DECODER/ DRIVER IN 1B 1K 1K DECODER/ DRIVER IN 4B IN 8 OVERVOLTAGE CLAMP AND SIGNAL ISOLATION OUT B 1K 5V REF OVERVOLTAGE CLAMP AND SIGNAL ISOLATION LEVEL SHIFT † DIGITAL INPUT † † A0 A1 † 5V REF † DIGITAL INPUT † LEVEL SHIFT † † † A0 A1 EN PROTECTION PROTECTION A2 EN Schematic Diagrams ADDRESS DECODER V+ P P P P A0 OR A0 A1 OR A1 A2 OR A2 A3 OR A3 P P P N N N TO P-CHANNEL DEVICE OF THE SWITCH N N TO N-CHANNEL DEVICE OF THE SWITCH N N ENABLE DELETE A3 OR A3 INPUT FOR HI-547, HI-548, HI-549 DELETE A2 OR A2 INPUT FOR HI-549 FN3150 Rev 7.00 Jun 15, 2016 V- Page 5 of 25 HI-546, HI-547, HI-548, HI-549 Schematic Diagrams (Continued) MULTIPLEX SWITCH FROM DECODE OVERVOLTAGE PROTECTION N V+ P R11 1K D6 Q5 D7 D4 D5 N IN OUT N Q6 V- P FROM DECODE FN3150 Rev 7.00 Jun 15, 2016 Page 6 of 25 HI-546, HI-547, HI-548, HI-549 Schematic Diagrams (Continued) ADDRESS INPUT BUFFER AND LEVEL SHIFTER TTL REFERENCE CIRCUIT V+ R10 R9 Q1 VREF Q4 D3 GND LEVEL SHIFTER V+ OVERVOLTAGE PROTECTION P P P N R2 P P P P R5 V+ R3 D1 V- P LEVEL SHIFTED ADDRESS TO DECODE R7 R6 N P R4 D2 R1 200  P N N N N R8 N N N N GND V- ADD IN FN3150 Rev 7.00 Jun 15, 2016 Page 7 of 25 HI-546, HI-547, HI-548, HI-549 Absolute Maximum Ratings Thermal Information V+ to V- . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .+44V V+ to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .+22V V- to GND. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -25V Digital Input Voltage (VEN , VA) . . . . . . . . . . . . . (V-) -4V to (V+) +4V Analog Signal (VIN, VOUT) . . . . . . . . . . . . . . (V-) -20V to (V+) +20V or 20mA, Whichever Occurs First Continuous Current, IN or OUT . . . . . . . . . . . . . . . . . . . . . . . . 20mA Peak Current, IN or OUT (Pulsed 1ms, 10% Duty Cycle Max). . 40mA Thermal Resistance (Typical, Note 1) JA (oC/W) JC (oC/W) 16 Ld CERDIP Package. . . . . . . . . . . 85 32 28 Ld CERDIP Package. . . . . . . . . . . 55 18 28 Ld PDIP Package*. . . . . . . . . . . . . 60 N/A 16 Ld PDIP Package . . . . . . . . . . . . . 90 N/A 28 Ld PLCC Package. . . . . . . . . . . . . 70 N/A 20 Ld PLCC Package. . . . . . . . . . . . . 80 N/A 28 Ld SOIC Package . . . . . . . . . . . . . 75 N/A 16 Ld SOIC Package . . . . . . . . . . . . . 105 N/A Maximum Junction Temperature Ceramic Packages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .175oC Plastic Packages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .150oC Maximum Storage Temperature Range . . . . . . . . . . -65oC to 150oC Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . .300oC (PLCC, SOIC - Lead Tips Only) *Pb-free PDIPs can be used for through hole wave solder processing only. They are not intended for use in Reflow solder processing applications. Operating Conditions Temperature Ranges HI-546/548/549-2 . . . . . . . . . . . . . . . . . . . . . . . . . -55oC to 125oC HI-546/547/548/549-5 . . . . . . . . . . . . . . . . . . . . . . . 0oC to 75oC HI-546/547/548/549-9 . . . . . . . . . . . . . . . . . . . . . . -40oC to 85oC CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. NOTE: 1. JA is measured with the component mounted on an evaluation PC board in free air. Electrical Specifications Supplies = +15V, -15V; VREF Pin = Open; VAH (Logic Level High) = 4V; VAL (Logic Level Low) = 0.8V; Unless Otherwise Specified. For Test Conditions, Consult Test Circuits Section PARAMETER TEST CONDITIONS -2 TEMP (oC) MIN TYP -5, -9 MAX MIN TYP MAX UNITS SWITCHING CHARACTERISTICS 25 - 0.5 - - 0.5 - s Full - - 1.0 - - 1.0 s Break-Before Make Delay, tOPEN 25 25 80 - 25 80 - ns Enable Delay (ON), tON(EN) 25 - 300 500 - 300 - ns Full - - 1000 - - 1000 ns 25 - 300 500 - 300 - ns Full - - 1000 - - 1000 ns 25 - 1.2 - - 1.2 - s Access Time, tA Enable Delay (OFF), tOFF(EN) Settling Time To 0.1% To 0.01% 25 - 3.5 - - 3.5 - s Off Isolation Note 6 25 50 68 - 50 68 - dB 25 - 10 - - 10 - pF HI-546 25 - 52 - - 52 - pF HI-547 25 - 30 - - 30 - pF HI-548 25 - 25 - - 25 - pF HI-549 25 - 12 - - 12 - pF 25 - 0.1 - - 0.1 - pF Channel Input Capacitance, CS(OFF) Channel Output Capacitance CD(OFF) Input to Output Capacitance, CDS(OFF) DIGITAL INPUT CHARACTERISTICS Input Low Threshold, TTL Drive, VAL Full - - 0.8 - - 0.8 V Input High Threshold, VAH (Note 8) Full 4.0 - - 4.0 - - V 25 - - 0.8 - - 0.8 V MOS Drive, VAL (HI-546/547 Only) FN3150 Rev 7.00 Jun 15, 2016 VREF = 10V Page 8 of 25 HI-546, HI-547, HI-548, HI-549 Electrical Specifications Supplies = +15V, -15V; VREF Pin = Open; VAH (Logic Level High) = 4V; VAL (Logic Level Low) = 0.8V; Unless Otherwise Specified. For Test Conditions, Consult Test Circuits Section (Continued) PARAMETER TEST CONDITIONS -2 -5, -9 TEMP (oC) MIN TYP MAX MIN TYP MAX UNITS MOS Drive, VAH (HI-546/547 Only) VREF = 10V 25 6.0 - - 6.0 - - V Input Leakage Current (High or Low), IA Note 5 Full - - 1.0 - - 1.0 A Full -15 - +15 -15 - +15 V 25 - 1.2 1.5 - 1.5 1.8 k Full - 1.5 1.8 - 1.8 2.0 k 25 - - 7.0 - - 7.0 % 25 - 0.03 - - 0.03 - nA Full - - 50 - - 50 nA 25 - 0.1 - - 0.1 - nA HI-546 Full - - 300 - - 300 nA HI-547 Full - - 200 - - 200 nA HI-548 Full - - 200 - - 200 nA ANALOG CHANNEL CHARACTERISTICS Analog Signal Range, VIN On Resistance, rON Note 2 rON , (Any Two Channels) Off Input Leakage Current, IS(OFF) Off Output Leakage Current, ID(OFF) Note 3 Note 3 HI-549 Full - - 100 - - 100 nA 25 - 4.0 - - 4.0 - nA Full - - 2.0 - - - A 25 - 0.1 - - 0.1 - nA HI-546 Full - - 300 - - 300 nA HI-547 Full - - 200 - - 200 nA HI-548 Full - - 200 - - 200 nA HI-549 Full - - 100 - - 100 nA Full - - 50 - - 50 nA Full - 7.5 - - 7.5 - mW ID(OFF) With Input Overvoltage Applied On Channel Leakage Current, ID(ON) Note 4 Note 3 Differential Off Output Leakage Current IDIFF (HI-547, HI-549 Only) POWER SUPPLY CHARACTERISTICS Power Dissipation, PD Current, I+ Note 7 Full - 0.5 2.0 - 0.5 2.0 mA Current, I- Note 7 Full - 0.02 1.0 - 0.02 1.0 mA NOTES:  2. VOUT = 10V, IOUT = 100A. 3. 10nA is the practical lower limit for high speed measurement in the production test environments. 4. Analog Overvoltage = 33V. 5. Digital input leakage is primarily due to the clamp diodes (see Schematic). Typical leakage is less than 1nA at 25oC. 6. VEN = 0.8V, RL = 1K, CL = 15pF, VS = 7VRMS , f = 100kHz. 7. VEN , VA = 0V or 4V. 8. To drive from DTL/TTLCircuits, 1k pull-up resistors to +5V supply are recommended. FN3150 Rev 7.00 Jun 15, 2016 Page 9 of 25 HI-546, HI-547, HI-548, HI-549 Test Circuits and Waveforms TA = 25oC, VSUPPLY = 15V, VAH = 4V, VAL = 0.8V, VREF = Open, Unless Otherwise Specified 100A V2 IN OUT VIN rON = V2 100A FIGURE 1A. ON RESISTANCE TEST CIRCUIT 1.4 ON RESISTANCE (k NORMALIZED ON RESISTANCE (REFERRED TO VALUE AT 15V) 125oC 1.3 1.2 1.1 25oC 1.0 -55oC 0.9 0.8 0.7 0.6 -10 -8 -6 -4 -2 0 2 4 6 8 10 1.5 1.4 1.3 1.2 1.1 1.0 0.9 0.8 5 ANALOG INPUT (V) 6 7 8 9 10 11 12 13 14 SUPPLY VOLTAGE (V) FIGURE 1B. ON RESISTANCE vs ANALOG INPUT VOLTAGE FIGURE 1C. NORMALIZED ON RESISTANCE vs SUPPLY VOLTAGE FIGURE 1. ON RESISTANCE 100nA ON LEAKAGE CURRENT ID(ON) OFF OUTPUT CURRENT ID(OFF) OUT 1nA A 10V ID(OFF) 10V OFF INPUT LEAKAGE CURRENT IS(OFF) 100pA 10pA +0.8V EN  LEAKAGE CURRENT 10nA 25 50 75 100 TEMPERATURE (oC) 125 FIGURE 2A. LEAKAGE CURRENT vs TEMPERATURE FN3150 Rev 7.00 Jun 15, 2016 FIGURE 2B. ID(OFF) TEST CIRCUIT (NOTE 9) Page 10 of 25 15 HI-546, HI-547, HI-548, HI-549 Test Circuits and Waveforms TA = 25oC, VSUPPLY = 15V, VAH = 4V, VAL = 0.8V, VREF = Open, Unless Otherwise Specified OUT OUT IS(OFF) A +0.8V A EN  10V ID(ON) EN 10V 10V 10V  4V FIGURE 2C. IS(OFF) TEST CIRCUIT (NOTE 9) FIGURE 2D. ID(ON) TEST CIRCUIT (NOTE 9) NOTE: 10V. (Two measurements per device for ID(OFF): 10V and  9. Two measurements per channel: 10V and 10V.)  FIGURE 2. LEAKAGE CURRENTS ANALOG INPUT CURRENT (IIN) 15 5 12 4 9 3 6 2 OUTPUT OFF LEAKAGE CURRENT ID(OFF) 3 1 0 0 15 18 21 24 27 30 33 ANALOG INPUT OVERVOLTAGE (V) OUTPUT OFF LEAKAGE CURRENT (nA) ANALOG INPUT CURRENT (mA) 18 A IIN A ID(OFF) VIN 36 FIGURE 3B. TEST CIRCUIT FIGURE 3A. ANALOG INPUT CURRENT AND OUTPUT OFF LEAKAGE CURRENT vs ANALOG INPUT OVER-VOLTAGE FIGURE 3. ANALOG INPUT OVERVOLTAGE CHARACTERISTICS 14 -55oC 25oC SWITCH CURRENT (mA) 12 10 125oC 8 6 VIN 4 A 2 0 0 2 4 6 8 10 12 VOLTAGE ACROSS SWITCH (V) 14 FIGURE 4A. ON CHANNEL CURRENT vs VOLTAGE FIGURE 4B. TEST CIRCUIT FIGURE 4. ON CHANNEL CURRENT FN3150 Rev 7.00 Jun 15, 2016 Page 11 of 25 HI-546, HI-547, HI-548, HI-549 Test Circuits and Waveforms TA = 25oC, VSUPPLY = 15V, VAH = 4V, VAL = 0.8V, VREF = Open, Unless Otherwise Specified 8 6 V+ IN 1 A3 VSUPPLY = 10V 2 A1 IN 2 THRU IN 15 A0 IN 16 EN +4V GND  50 VA 10V/5V HI-546 † A2 VSUPPLY = 15V 4 +15V/+10V +ISUPPLY 10V/ 5V OUT V10M A 0 10K 1K 100K 1M 10M TOGGLE FREQUENCY (Hz)  SUPPLY CURRENT (mA) A 14pF -ISUPPLY -15V/-10V † Similar connection for HI-547/HI-548/HI-549. FIGURE 5A. SUPPLY CURRENT vs TOGGLE FREQUENCY FIGURE 5B. TEST CIRCUIT FIGURE 5. DYNAMIC SUPPLY CURRENT +15V 900 ACCESS TIME (ns) VREF A3 700 A2 50 VA 600 A1 V+ IN 1 10V IN 2 THRU IN 15 HI-546 † A0 IN 16  VREF = OPEN FOR LOGIC HIGH LEVEL  6V VREF = LOGIC HIGH FOR LOGIC HIGH LEVELS > 6V 800 10V 500 EN +4V 400 300 GND OUT V10k 3 4 5 6 8 7 9 10 11 LOGIC LEVEL (HIGH) (V) 12 13 14 -15V 15 † Similar connection for HI-547/HI-548/HI-549. FIGURE 6A. ACCESS TIME vs LOGIC LEVEL (HIGH) VAH = 4.0V 50pF FIGURE 6B. TEST CIRCUIT VA INPUT 2V/DIV. ADDRESS DRIVE (VA) 50% 0V S1 ON +10V OUTPUT 10% OUTPUT 5V/DIV. -10V S16 ON tA 200ns/DIV. FIGURE 6C. MEASUREMENT POINTS FIGURE 6D. WAVEFORMS FIGURE 6. ACCESS TIME FN3150 Rev 7.00 Jun 15, 2016 Page 12 of 25 HI-546, HI-547, HI-548, HI-549 Test Circuits and Waveforms TA = 25oC, VSUPPLY = 15V, VAH = 4V, VAL = 0.8V, VREF = Open, Unless Otherwise Specified HI-546 † A3 A2 +5V VAH = 4V IN 1 IN 2 THRU 50 VA +4V A1 IN 15 A0 IN 16 EN OUT GND ADDRESS DRIVE (VA) 0V VOUT OUTPUT 50pF 1k 50% 50% tOPEN † Similar connection for HI-547/HI-548/HI-549 FIGURE 7A. TEST CIRCUIT FIGURE 7B. MEASUREMENT POINTS VA INPUT 2V/DIV. S1 ON S16 ON OUTPUT 0.5V/DIV. 100ns/DIV. FIGURE 7C. WAVEFORMS FIGURE 7. BREAK-BEFORE-MAKE DELAY A3 HI-546 † A2 A1 IN 1 +10V IN 2 THRU IN16 VOUT GND 90% 1k † Similar connection for HI-547/HI-548/HI-549 FIGURE 8A. TEST CIRCUIT OUTPUT 50pF 10% t ON(EN) FN3150 Rev 7.00 Jun 15, 2016 ENABLE DRIVE (VA) 0V OUT EN 50 50% 50% A0 VA VAH = 4V 0V t OFF(EN) FIGURE 8B. MEASUREMENT POINTS Page 13 of 25 HI-546, HI-547, HI-548, HI-549 Test Circuits and Waveforms TA = 25oC, VSUPPLY = 15V, VAH = 4V, VAL = 0.8V, VREF = Open, Unless Otherwise Specified ENABLE DRIVE 2V/DIV. DISABLED OUTPUT 2V/DIV. ENABLED (S1 ON) 100ns/DIV. FIGURE 8C. WAVEFORMS FIGURE 8. ENABLE DELAYS FN3150 Rev 7.00 Jun 15, 2016 Page 14 of 25 HI-546, HI-547, HI-548, HI-549 Die Characteristics DIE DIMENSIONS: PASSIVATION: 83.9 mils x 159 mils Type: Nitride Over Silox Nitride Thickness: 3.5kÅ 1kÅ Silox Thickness: 12kÅ 2kÅ METALLIZATION: Type: CuAl Thickness: 16kÅ 2kÅ WORST CASE CURRENT DENSITY: 1.4 x 105 A/cm2 SUBSTRATE POTENTIAL (NOTE): TRANSISTOR COUNT: -VSUPPLY 485 PROCESS: CMOS-DI NOTE: The substrate appears resistive to the -VSUPPLY terminal, therefore it may be left floating (Insulating Die Mount) or it may be mounted on a conductor at -VSUPPLY potential. Metallization Mask Layouts HI-546 EN (18) A0 (17) A1 A2 (16) (15) HI-547 A3 VREF (14) (13) GND (12) EN (18) A0 (17) A1 A2 (16) (15) NC VREF (14) (13) GND (12) IN 1 (19) IN 9 (11) IN 1A (19) IN 2 (20) IN 10 (10) IN 2A (20) IN 3 (21) IN 11 (9) IN 3A (21) IN 3B (9) IN 4 (22) IN 12 (8) IN 4A (22) IN 4B (8) IN 5 (23) IN 6 (24) IN 13 (7) IN 14 (6) IN 5A (23) IN 6A (24) IN 5B (7) IN 6B (6) IN 7 (25) IN 15 (5) IN 7A (25) IN 7B (5) IN 8 (26) IN 16 (4) IN 8A (26) IN 8B (4) V- (27) FN3150 Rev 7.00 Jun 15, 2016 OUT (28) +V (1) NC (2) V- (27) IN 1B (11) IN 2B (10) OUT A (28) +V (1) OUT B(2) Page 15 of 25 HI-546, HI-547, HI-548, HI-549 Die Characteristics DIE DIMENSIONS: PASSIVATION: 83 mils x 108 mils Type: Nitride Over Silox Nitride Thickness: 3.5kÅ 1kÅ Silox Thickness: 12kÅ 2kÅ METALLIZATION: Type: CuAl Thickness: 16kÅ 2kÅ WORST CASE CURRENT DENSITY: 1.4 x 105 A/cm SUBSTRATE POTENTIAL (NOTE): TRANSISTOR COUNT: -VSUPPLY 253 PROCESS: CMOS-DI NOTE: The substrate appears resistive to the -VSUPPLY terminal, therefore it may be left floating (Insulating Die Mount) or it may be mounted on a conductor at -VSUPPLY potential. Metallization Mask Layouts HI-548 IN 6 (11) IN 7 IN 8 (10) (9) HI-549 OUT (8) IN 4 IN 3 (7) (6) IN 3B IN 4B OUT B (11) (10) (9) OUT A (8) IN 4A IN 3A (7) (6) IN 5 (12) IN 2 (5) IN 2B (12) IN 2A (5) +V (13) GND (14) IN 1 (4) IN 1B (13) +V (14) IN 1A (4) -V (3) A2 (15) FN3150 Rev 7.00 Jun 15, 2016 A1 (16) A0 (1) EN (2) -V (3) GND (15) A1 (16) A0 (1) EN (2) Page 16 of 25 HI-546, HI-547, HI-548, HI-549 Revision History The revision history provided is for informational purposes only and is believed to be accurate, but not warranted. Please go to the web to make sure that you have the latest revision. DATE REVISION CHANGE June 15, 2016 FN3150.7 Updated ordering information table on page 2. October 1, 2015 FN3150.6 - Updated Ordering Information Table on page 2. - Added Revision History. - Added About Intersil Verbiage. - Updated POD M28.3 to latest revision changes are as follow: Added land pattern -Added Package Outline Drawing M16.15 to the latest revision. About Intersil Intersil Corporation is a leading provider of innovative power management and precision analog solutions. The company's products address some of the largest markets within the industrial and infrastructure, mobile computing and high-end consumer markets. For the most updated datasheet, application notes, related documentation and related parts, please see the respective product information page found at www.intersil.com. You may report errors or suggestions for improving this datasheet by visiting www.intersil.com/ask. Reliability reports are also available from our website at www.intersil.com/support. © Copyright Intersil Americas LLC 1999-2016. All Rights Reserved. All trademarks and registered trademarks are the property of their respective owners. For additional products, see www.intersil.com/en/products.html Intersil products are manufactured, assembled and tested utilizing ISO9001 quality systems as noted in the quality certifications found at www.intersil.com/en/support/qualandreliability.html Intersil products are sold by description only. Intersil may modify the circuit design and/or specifications of products at any time without notice, provided that such modification does not, in Intersil's sole judgment, affect the form, fit or function of the product. Accordingly, the reader is cautioned to verify that datasheets are current before placing orders. Information furnished by Intersil is believed to be accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries. For information regarding Intersil Corporation and its products, see www.intersil.com FN3150 Rev 7.00 Jun 15, 2016 Page 17 of 25 HI-546, HI-547, HI-548, HI-549 Ceramic Dual-In-Line Frit Seal Packages (CERDIP) F28.6 MIL-STD-1835 GDIP1-T28 (D-10, CONFIGURATION A) 28 LEAD CERAMIC DUAL-IN-LINE FRIT SEAL PACKAGE LEAD FINISH c1 -D- -A- BASE METAL (c) E M -Bbbb S C A-B S Q -C- SEATING PLANE S1 b2 b ccc M C A-B S D S eA/2 NOTES - 0.232 - 5.92 - 0.014 0.026 0.36 0.66 2 b1 0.014 0.023 0.36 0.58 3 b2 0.045 0.065 1.14 1.65 - b3 0.023 0.045 0.58 1.14 4 c 0.008 0.018 0.20 0.46 2 c1 0.008 0.015 0.20 0.38 3 D - 1.490 - 37.85 5 E 0.500 0.610 15.49 5 eA e MAX b  A A MIN A A L MILLIMETERS MAX M (b) D BASE PLANE MIN b1 SECTION A-A D S INCHES SYMBOL c aaa M C A - B S D S NOTES: 1. Index area: A notch or a pin one identification mark shall be located adjacent to pin one and shall be located within the shaded area shown. The manufacturer’s identification shall not be used as a pin one identification mark. e 12.70 0.100 BSC 2.54 BSC - eA 0.600 BSC 15.24 BSC - eA/2 0.300 BSC 7.62 BSC - L 0.125 0.200 3.18 5.08 - Q 0.015 0.060 0.38 1.52 6 S1 0.005 - 0.13 - 7 105o 90o 105o - 2. The maximum limits of lead dimensions b and c or M shall be measured at the centroid of the finished lead surfaces, when solder dip or tin plate lead finish is applied.  90o aaa - 0.015 - 0.38 - 3. Dimensions b1 and c1 apply to lead base metal only. Dimension M applies to lead plating and finish thickness. bbb - 0.030 - 0.76 - ccc - 0.010 - 0.25 - M - 0.0015 - 0.038 2, 3 4. Corner leads (1, N, N/2, and N/2+1) may be configured with a partial lead paddle. For this configuration dimension b3 replaces dimension b2. 5. This dimension allows for off-center lid, meniscus, and glass overrun. N 28 28 8 Rev. 0 4/94 6. Dimension Q shall be measured from the seating plane to the base plane. 7. Measure dimension S1 at all four corners. 8. N is the maximum number of terminal positions. 9. Dimensioning and tolerancing per ANSI Y14.5M - 1982. 10. Controlling dimension: INCH. FN3150 Rev 7.00 Jun 15, 2016 Page 18 of 25 HI-546, HI-547, HI-548, HI-549 Dual-In-Line Plastic Packages (PDIP) E28.6 (JEDEC MS-011-AB ISSUE B) N 28 LEAD DUAL-IN-LINE PLASTIC PACKAGE E1 INDEX AREA 1 2 3 INCHES N/2 SYMBOL -B- -C- SEATING PLANE A2 e B1 D1 B 0.010 (0.25) M A1 eC C A B S MAX NOTES - 0.250 - 6.35 4 0.015 - 0.39 - 4 A2 0.125 0.195 3.18 4.95 - B 0.014 0.022 0.356 0.558 - C L B1 0.030 0.070 0.77 1.77 8 eA C 0.008 0.015 0.204 0.381 - D 1.380 1.565 D1 0.005 - A L D1 MIN A E BASE PLANE MAX A1 -AD MILLIMETERS MIN C eB NOTES: 1. Controlling Dimensions: INCH. In case of conflict between English and Metric dimensions, the inch dimensions control. 2. Dimensioning and tolerancing per ANSI Y14.5M-1982. 35.1 39.7 5 - 5 0.13 E 0.600 0.625 15.24 15.87 6 E1 0.485 0.580 12.32 14.73 5 e 0.100 BSC 2.54 BSC - eA 0.600 BSC 15.24 BSC 6 3. Symbols are defined in the “MO Series Symbol List” in Section 2.2 of Publication No. 95. eB - 0.700 - 17.78 7 L 0.115 0.200 2.93 5.08 4 4. Dimensions A, A1 and L are measured with the package seated in JEDEC seating plane gauge GS-3. N 5. D, D1, and E1 dimensions do not include mold flash or protrusions. Mold flash or protrusions shall not exceed 0.010 inch (0.25mm). 6. E and eA are measured with the leads constrained to be perpendicular to datum -C- . 28 28 9 Rev. 1 12/00 7. eB and eC are measured at the lead tips with the leads unconstrained. eC must be zero or greater. 8. B1 maximum dimensions do not include dambar protrusions. Dambar protrusions shall not exceed 0.010 inch (0.25mm). 9. N is the maximum number of terminal positions. 10. Corner leads (1, N, N/2 and N/2 + 1) for E8.3, E16.3, E18.3, E28.3, E42.6 will have a B1 dimension of 0.030 - 0.045 inch (0.76 - 1.14mm). FN3150 Rev 7.00 Jun 15, 2016 Page 19 of 25 HI-546, HI-547, HI-548, HI-549 Plastic Leaded Chip Carrier Packages (PLCC) 0.042 (1.07) 0.048 (1.22) PIN (1) IDENTIFIER N28.45 (JEDEC MS-018AB ISSUE A) 0.042 (1.07) 0.056 (1.42) 0.004 (0.10) C 0.025 (0.64) R 0.045 (1.14) 0.050 (1.27) TP C L D2/E2 E1 E C L D2/E2 VIEW “A” 0.020 (0.51) MIN A1 A D1 D 28 LEAD PLASTIC LEADED CHIP CARRIER PACKAGE INCHES MILLIMETERS SYMBOL MIN MAX MIN MAX NOTES A 0.165 0.180 4.20 4.57 - A1 0.090 0.120 2.29 3.04 - D 0.485 0.495 12.32 12.57 - D1 0.450 0.456 11.43 11.58 3 D2 0.191 0.219 4.86 5.56 4, 5 E 0.485 0.495 12.32 12.57 - E1 0.450 0.456 11.43 11.58 3 E2 0.191 0.219 4.86 5.56 4, 5 N 28 28 6 Rev. 2 11/97 SEATING -C- PLANE 0.020 (0.51) MAX 3 PLCS 0.026 (0.66) 0.032 (0.81) 0.025 (0.64) MIN 0.045 (1.14) MIN 0.013 (0.33) 0.021 (0.53) VIEW “A” TYP. NOTES: 1. Controlling dimension: INCH. Converted millimeter dimensions are not necessarily exact. 2. Dimensions and tolerancing per ANSI Y14.5M-1982. 3. Dimensions D1 and E1 do not include mold protrusions. Allowable mold protrusion is 0.010 inch (0.25mm) per side. Dimensions D1 and E1 include mold mismatch and are measured at the extreme material condition at the body parting line. 4. To be measured at seating plane -C- contact point. 5. Centerline to be determined where center leads exit plastic body. 6. “N” is the number of terminal positions. FN3150 Rev 7.00 Jun 15, 2016 Page 20 of 25 HI-546, HI-547, HI-548, HI-549 Small Outline Plastic Packages (SOIC) M28.3 (JEDEC MS-013-AE ISSUE C) N 28 LEAD WIDE BODY SMALL OUTLINE PLASTIC PACKAGE INDEX AREA H 0.25(0.010) M B M INCHES E SYMBOL -B- 1 2 3 L SEATING PLANE -A- A D h x 45o a e A1 B C 0.10(0.004) 0.25(0.010) M C A M B S MAX MILLIMETERS MIN MAX NOTES A 0.0926 0.1043 2.35 2.65 - A1 0.0040 0.0118 0.10 0.30 - B 0.013 0.0200 0.33 0.51 9 C 0.0091 0.0125 0.23 0.32 - D 0.6969 0.7125 17.70 18.10 3 E 0.2914 0.2992 7.40 7.60 4 e -C- MIN 0.05 BSC h 0.01 0.029 0.25 0.75 5 L 0.016 0.050 0.40 1.27 6  10.00 - 0.394 N 0.419 1.27 BSC H 28 0o 10.65 - 28 8o 0o 7 8o Rev. 1, 1/13 NOTES: 1. Symbols are defined in the “MO Series Symbol List” in Section 2.2 of Publication Number 95. 2. Dimensioning and tolerancing per ANSI Y14.5M-1982. 3. Dimension “D” does not include mold flash, protrusions or gate burrs. Mold flash, protrusion and gate burrs shall not exceed 0.15mm (0.006 inch) per side. TYPICAL RECOMMENDED LAND PATTERN (1.50mm) 4. Dimension “E” does not include interlead flash or protrusions. Interlead flash and protrusions shall not exceed 0.25mm (0.010 inch) per side. 5. The chamfer on the body is optional. If it is not present, a visual index feature must be located within the crosshatched area. (9.38mm) 6. “L” is the length of terminal for soldering to a substrate. 7. “N” is the number of terminal positions. 8. Terminal numbers are shown for reference only. 9. The lead width “B”, as measured 0.36mm (0.014 inch) or greater above the seating plane, shall not exceed a maximum value of 0.61mm (0.024 inch) (1.27mm TYP) FN3150 Rev 7.00 Jun 15, 2016 (0.51mm TYP) 10. Controlling dimension: MILLIMETER. Converted inch dimensions are not necessarily exact. Page 21 of 25 HI-546, HI-547, HI-548, HI-549 Ceramic Dual-In-Line Frit Seal Packages (CERDIP) F16.3 MIL-STD-1835 GDIP1-T16 (D-2, CONFIGURATION A) 16 LEAD CERAMIC DUAL-IN-LINE FRIT SEAL PACKAGE LEAD FINISH c1 -D- -A- BASE METAL (c) E M -Bbbb S C A-B S Q -C- SEATING PLANE S1 b2 b ccc M C A-B S D S eA/2 NOTES - 0.200 - 5.08 - 0.014 0.026 0.36 0.66 2 b1 0.014 0.023 0.36 0.58 3 b2 0.045 0.065 1.14 1.65 - b3 0.023 0.045 0.58 1.14 4 c 0.008 0.018 0.20 0.46 2 c1 0.008 0.015 0.20 0.38 3 D - 0.840 - 21.34 5 E 0.220 0.310 5.59 7.87 5 eA e MAX b  A A MIN A A L MILLIMETERS MAX M (b) D BASE PLANE MIN b1 SECTION A-A D S INCHES SYMBOL c aaa M C A - B S D S NOTES: 1. Index area: A notch or a pin one identification mark shall be located adjacent to pin one and shall be located within the shaded area shown. The manufacturer’s identification shall not be used as a pin one identification mark. e 0.100 BSC 2.54 BSC - eA 0.300 BSC 7.62 BSC - eA/2 0.150 BSC 3.81 BSC - L 0.125 0.200 3.18 5.08 - Q 0.015 0.060 0.38 1.52 6 S1 0.005 - 0.13 - 7 105o 90o 105o - 2. The maximum limits of lead dimensions b and c or M shall be measured at the centroid of the finished lead surfaces, when solder dip or tin plate lead finish is applied.  90o aaa - 0.015 - 0.38 - 3. Dimensions b1 and c1 apply to lead base metal only. Dimension M applies to lead plating and finish thickness. bbb - 0.030 - 0.76 - ccc - 0.010 - 0.25 - M - 0.0015 - 0.038 2, 3 4. Corner leads (1, N, N/2, and N/2+1) may be configured with a partial lead paddle. For this configuration dimension b3 replaces dimension b2. 5. This dimension allows for off-center lid, meniscus, and glass overrun. N 16 16 8 Rev. 0 4/94 6. Dimension Q shall be measured from the seating plane to the base plane. 7. Measure dimension S1 at all four corners. 8. N is the maximum number of terminal positions. 9. Dimensioning and tolerancing per ANSI Y14.5M - 1982. 10. Controlling dimension: INCH. FN3150 Rev 7.00 Jun 15, 2016 Page 22 of 25 HI-546, HI-547, HI-548, HI-549 Dual-In-Line Plastic Packages (PDIP) E16.3 (JEDEC MS-001-BB ISSUE D) N 16 LEAD DUAL-IN-LINE PLASTIC PACKAGE E1 INDEX AREA 1 2 3 INCHES N/2 -B- -AE D BASE PLANE -C- SEATING PLANE A2 A L D1 e B1 D1 B 0.010 (0.25) M A1 eC C A B S MILLIMETERS SYMBOL MIN MAX MIN MAX NOTES A - 0.210 - 5.33 4 A1 0.015 - 0.39 - 4 A2 0.115 0.195 2.93 4.95 - B 0.014 0.022 0.356 0.558 - C L B1 0.045 0.070 1.15 1.77 8, 10 eA C 0.008 0.014 C D 0.735 0.775 eB NOTES: 1. Controlling Dimensions: INCH. In case of conflict between English and Metric dimensions, the inch dimensions control. 0.355 19.68 5 D1 0.005 - 0.13 - 5 E 0.300 0.325 7.62 8.25 6 E1 0.240 0.280 6.10 7.11 5 e 0.100 BSC 2. Dimensioning and tolerancing per ANSI Y14.5M-1982. eA 0.300 BSC 3. Symbols are defined in the “MO Series Symbol List” in Section 2.2 of Publication No. 95. eB - 4. Dimensions A, A1 and L are measured with the package seated in JEDEC seating plane gauge GS-3. L 0.115 N 5. D, D1, and E1 dimensions do not include mold flash or protrusions. Mold flash or protrusions shall not exceed 0.010 inch (0.25mm). 6. E and eA are measured with the leads constrained to be perpendicular to datum -C- . 0.204 18.66 16 2.54 BSC 7.62 BSC 0.430 - 0.150 2.93 16 6 10.92 7 3.81 4 9 Rev. 0 12/93 7. eB and eC are measured at the lead tips with the leads unconstrained. eC must be zero or greater. 8. B1 maximum dimensions do not include dambar protrusions. Dambar protrusions shall not exceed 0.010 inch (0.25mm). 9. N is the maximum number of terminal positions. 10. Corner leads (1, N, N/2 and N/2 + 1) for E8.3, E16.3, E18.3, E28.3, E42.6 will have a B1 dimension of 0.030 - 0.045 inch (0.76 - 1.14mm). FN3150 Rev 7.00 Jun 15, 2016 Page 23 of 25 HI-546, HI-547, HI-548, HI-549 Plastic Leaded Chip Carrier Packages (PLCC) 0.042 (1.07) 0.048 (1.22) PIN (1) IDENTIFIER 0.042 (1.07) 0.056 (1.42) 0.004 (0.10) C 0.025 (0.64) R 0.045 (1.14) 0.050 (1.27) TP C L D2/E2 E1 E C L D2/E2 VIEW “A” 0.020 (0.51) MIN A1 A D1 D N20.35 (JEDEC MS-018AA ISSUE A) 20 LEAD PLASTIC LEADED CHIP CARRIER PACKAGE INCHES SYMBOL MIN MAX MILLIMETERS MIN MAX NOTES A 0.165 0.180 4.20 4.57 - A1 0.090 0.120 2.29 3.04 - D 0.385 0.395 9.78 10.03 - D1 0.350 0.356 8.89 9.04 3 D2 0.141 0.169 3.59 4.29 4, 5 E 0.385 0.395 9.78 10.03 - E1 0.350 0.356 8.89 9.04 3 E2 0.141 0.169 3.59 4.29 4, 5 N 20 20 6 Rev. 2 11/97 SEATING -C- PLANE 0.020 (0.51) MAX 3 PLCS 0.026 (0.66) 0.032 (0.81) 0.025 (0.64) MIN 0.045 (1.14) MIN 0.013 (0.33) 0.021 (0.53) VIEW “A” TYP. NOTES: 1. Controlling dimension: INCH. Converted millimeter dimensions are not necessarily exact. 2. Dimensions and tolerancing per ANSI Y14.5M-1982. 3. Dimensions D1 and E1 do not include mold protrusions. Allowable mold protrusion is 0.010 inch (0.25mm) per side. Dimensions D1 and E1 include mold mismatch and are measured at the extreme material condition at the body parting line. 4. To be measured at seating plane -C- contact point. 5. Centerline to be determined where center leads exit plastic body. 6. “N” is the number of terminal positions. FN3150 Rev 7.00 Jun 15, 2016 Page 24 of 25 HI-546, HI-547, HI-548, HI-549 Small Outline Plastic Packages (SOIC) M16.15 (JEDEC MS-012-AC ISSUE C) N 16 LEAD NARROW BODY SMALL OUTLINE PLASTIC PACKAGE INDEX AREA H 0.25(0.010) M B M INCHES E -B- 1 2 3 L SEATING PLANE -A- A D h x 45° e 0.25(0.010) M  A1 B C 0.10(0.004) C A M SYMBOL MIN MAX MIN MAX NOTES A 0.0532 0.0688 1.35 1.75 - A1 0.0040 0.0098 0.10 0.25 - B 0.013 0.020 0.33 0.51 9 C 0.0075 0.0098 0.19 0.25 - D 0.3859 0.3937 9.80 10.00 3 E 0.1497 0.1574 3.80 4.00 4 e -C- B S NOTES: 1. Symbols are defined in the “MO Series Symbol List” in Section 2.2 of Publication Number 95. MILLIMETERS 0.050 BSC 1.27 BSC - H 0.2284 0.2440 5.80 6.20 - h 0.0099 0.0196 0.25 0.50 5 L 0.016 0.050 0.40 1.27 6 N  16 0° 16 8° 0° 7 8° Rev. 1 6/05 2. Dimensioning and tolerancing per ANSI Y14.5M-1982. 3. Dimension “D” does not include mold flash, protrusions or gate burrs. Mold flash, protrusion and gate burrs shall not exceed 0.15mm (0.006 inch) per side. 4. Dimension “E” does not include interlead flash or protrusions. Interlead flash and protrusions shall not exceed 0.25mm (0.010 inch) per side. 5. The chamfer on the body is optional. If it is not present, a visual index feature must be located within the crosshatched area. 6. “L” is the length of terminal for soldering to a substrate. 7. “N” is the number of terminal positions. 8. Terminal numbers are shown for reference only. 9. The lead width “B”, as measured 0.36mm (0.014 inch) or greater above the seating plane, shall not exceed a maximum value of 0.61mm (0.024 inch). 10. Controlling dimension: MILLIMETER. Converted inch dimensions are not necessarily exact. FN3150 Rev 7.00 Jun 15, 2016 Page 25 of 25