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The semiconductor operations of Mitsubishi Electric and Hitachi were transferred to Renesas Technology Corporation on April 1st 2003. These operations include microcomputer, logic, analog and discrete devices, and memory chips other than DRAMs (flash memory, SRAMs etc.) Accordingly, although Hitachi, Hitachi, Ltd., Hitachi Semiconductors, and other Hitachi brand names are mentioned in the document, these names have in fact all been changed to Renesas Technology Corp. Thank you for your understanding. Except for our corporate trademark, logo and corporate statement, no changes whatsoever have been made to the contents of the document, and these changes do not constitute any alteration to the contents of the document itself. Renesas Technology Home Page: http://www.renesas.com
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Cautions
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HM628511HCI Series
Wide Temperature Range Version 4M High Speed SRAM (512-kword × 8-bit)
ADE-203-1304A (Z) Rev. 1.0 Nov. 30, 2001 Description
The HM628511HCI Series is a 4-Mbit high speed static RAM organized 512-k word × 8-bit. It has realized high speed access time by employing CMOS process (6-transistor memory cell)and high speed circuit designing technology. It is most appropriate for the application which requires high speed, high density memory and wide bit width configuration, such as cache and buffer memory in system. It is packaged in 400-mil 36-pin plastic SOJ.
Features
• Single 5.0 V supply: 5.0 V ± 10 % • Access time: 12 ns (max) • Completely static memory No clock or timing strobe required • Equal access and cycle times • Directly TTL compatible All inputs and outputs • Operating current: 130 mA (max) • TTL standby current: 40 mA (max) • CMOS standby current : 5 mA (max) • Center VCC and VSS type pin out • Temperature range : –40 to +85°C
Ordering Information
Type No. HM628511HCJPI-12 Access time 12 ns Device marking HM628511CJPI12 Package 400-mil 36-pin plastic SOJ (CP-36D)
HM628511HCI Series
Pin Arrangement
36-pin SOJ A0 A1 A2 A3 A4 I/O1 I/O2 VCC VSS I/O3 I/O4 A5 A6 A7 A8 A9 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 (Top View) 36 35 34 33 32 31 30 29 28 27 26 25 24 23 22 21 20 19 I/O8 I/O7 VSS VCC I/O6 I/O5 A14 A13 A12 A11 A10 NC NC A18 A17 A16 A15
Pin Description
Pin name A0 to A18 I/O1 to I/O8 CS OE WE VCC VSS NC Function Address input Data input/output Chip select Output enable Write enable Power supply Ground No connection
Rev. 1, Nov. 2001, page 2 of 2
HM628511HCI Series
Block Diagram
(LSB) A14 A13 A12 A5 A6 A7 A11 A10 A3 A1 (MSB) I/O1 . . . I/O8 A8 A9 A18 A16 A17 A0 A2 A4 A15
Internal voltage generator Row decoder 1024-row × 32-column × 16-block × 8-bit (4,194,304 bits)
VCC VSS
CS Column I/O Input data control Column decoder CS
WE CS OE
CS
(LSB)
(MSB)
Rev. 1, Nov. 2001, page 3 of 3
HM628511HCI Series
Operation Table
CS CS H L L L L Note: OE × H L H L WE × H H L L Mode Standby Output disable Read Write Write VCC current ISB, ISB1 ICC ICC ICC ICC I/O High-Z High-Z Dout Din Din Ref. cycle — — Read cycle (1) to (3) Write cycle (1) Write cycle (2)
H: VIH, L: VIL, ×: VIH or VIL
Absolute Maximum Ratings
Parameter Supply voltage relative to VSS Voltage on any pin relative to VSS Power dissipation Operating temperature Storage temperature Storage temperature under bias Symbol VCC VT PT Topr Tstg Tbias Value –0.5 to +7.0 –0.5* to VCC+0.5* 1.0 –40 to +85 –55 to +125 –40 to +85
1 2
Unit V V W °C °C °C
Notes: 1. VT (min) = –2.0 V for pulse width (under shoot) ≤ 6 ns. 2. VT (max) = VCC+2.0 V for pulse width (over shoot) ≤ 6 ns.
Recommended DC Operating Conditions
(Ta = –40 to +85°C)
Parameter Supply voltage Symbol VCC* VSS* Input voltage Notes: 1. 2. 3. 4. VIH VIL
3 4
Min 4.5 0 2.2 –0.5*
1
Typ 5.0 0 — —
Max 5.5 0 VCC + 0.5* 0.8
2
Unit V V V V
VIL (min) = –2.0 V for pulse width (under shoot) ≤ 6 ns. VIH (max) = VCC+2.0 V for pulse width (over shoot) ≤ 6 ns. The supply voltage with all VCC pins must be on the same level. The supply voltage with all VSS pins must be on the same level.
Rev. 1, Nov. 2001, page 4 of 4
HM628511HCI Series
DC Characteristics
(Ta = –40 to +85°C, VCC = 5.0 V ± 10 %, VSS = 0V)
Parameter Input leakage current Output leakage current Symbol Min IILII IILOI — — — Typ* — — —
1
Max 2 2 130
Unit µA µA mA
Test conditions Vin = VSS to VCC Vin = VSS to VCC Min cycle CS = VIL, lout = 0 mA Other inputs = VIH/VIL Min cycle, CS = VIH, Other inputs = VIH/VIL f = 0 MHz VCC ≥ CS ≥ VCC - 0.2 V, (1) 0 V ≤ Vin ≤ 0.2 V or (2) VCC ≥ Vin ≥ VCC - 0.2 V
Operation power supply current ICC
Standby power supply current
ISB ISB1
— —
— 2.5
40 5
mA mA
Output voltage
VOL VOH
— 2.4
— —
0.4 —
V V
IOL = 8 mA IOH = –4 mA
Notes: 1. Typical values are at VCC = 5.0 V, Ta = +25°C and not guaranteed.
Capacitance
(Ta = +25°C, f = 1.0 MHz)
Parameter Input capacitance* Note:
1 1
Symbol Cin CI/O
Min — —
Typ — —
Max 6 8
Unit pF pF
Test conditions Vin = 0 V VI/O = 0 V
Input/output capacitance*
1. This parameter is sampled and not 100% tested.
Rev. 1, Nov. 2001, page 5 of 5
HM628511HCI Series
AC Characteristics
(Ta = –40 to +85°C, VCC = 5.0 V ± 10 %, unless otherwise noted.) Test Conditions • Input pulse levels: 3.0 V/0.0 V • Input rise and fall time: 3 ns • Input and output timing reference levels: 1.5 V • Output load: See figures (Including scope and jig)
1.5 V 5V
Dout Zo=50 Ω
RL=50 Ω
480Ω Dout 255 Ω 5 pF
30 pF
Output load (A)
Output load (B) (for tCLZ, tOLZ, tCHZ, tOHZ, tWHZ, and tOW)
Read Cycle
HM628511HCI -12 Parameter Read cycle time Address access time Chip select access time Output enable to output valid Output hold from address change Chip select to output in low-Z Output enable to output in low-Z Chip deselect to output in high-Z Output disable to output in high-Z Symbol tRC tAA tACS tOE tOH tCLZ tOLZ tCHZ tOHZ Min 12 — — — 3 3 0 — — Max — 12 12 6 — — — 6 6 Unit ns ns ns ns ns ns ns ns ns 1 1 1 1 Notes
Rev. 1, Nov. 2001, page 6 of 6
HM628511HCI Series
Write Cycle
HM628511HCI -12 Parameter Write cycle time Address valid to end of write Chip select to end of write Write pulse width Address setup time Write recovery time Data to write time overlap Data hold from write time Write disable to output in low-Z Output disable to output in high-Z Write enable to output in high-Z Symbol tWC tAW tCW tWP tAS tWR tDW tDH tOW tOHZ tWHZ Min 12 8 8 8 0 0 6 0 3 — — Max — — — — — — — — — 6 6 Unit ns ns ns ns ns ns ns ns ns ns ns 1 1 1 9 8 6 7 Notes
Notes: 1. Transition is measured ±200 mV from steady voltage with output load (B). This parameter is sampled and not 100% tested. 2. Address should be valid prior to or coincident with CS transition low. 3. WE and/or CS must be high during address transition time. 4. If CS and OE are low during this period, I/O pins are in the output state. Then, the data input signals of opposite phase to the outputs must not be applied to them. 5. If the CS low transition occurs simultaneously with the WE low transition or after the WE transition, output remains a high impedance state. 6. tAS is measured from the latest address transition to the later of CS or WE going low. 7. tWR is measured from the earlier of CS or WE going high to the first address transition. 8. A write occurs during the overlap of a low CS and a low WE. A write begins at the latest transition among CS going low and WE going low. A write ends at the earliest transition among CS going high and WE going high. tWP is measured from the beginning of write to the end of write. 9. tCW is measured from the later of CS going low to the end of write.
Rev. 1, Nov. 2001, page 7 of 7
HM628511HCI Series
Timing Waveforms
Read Timing Waveform (1) (WE = VIH)
tRC
Address
Valid address tAA tOH tCHZ
CS OE
tACS
tOE
tOHZ
tOLZ tCLZ Dout High impedance Valid data
Read Timing Waveform (2) (WE = VIH, CS = VIL, OE = VIL)
tRC
Address tOH Dout
Valid address tAA tOH
Valid data
Rev. 1, Nov. 2001, page 8 of 8
HM628511HCI Series
Read Timing Waveform (3) (WE = VIH, CS = VIL, OE = VIL)*
tRC
2
+5
tACS tCLZ Dout High impedance Valid data High impedance tCHZ
Write Timing Waveform (1) (WE Controlled)
tWC Address Valid address tAW tWR
tCW *3 tAS *3 tOHZ Dout High impedance*5 tDW Din *4 tDH *4 tWP
Valid data
Rev. 1, Nov. 2001, page 9 of 9
HM628511HCI Series
Write Timing Waveform (2) (CS Controlled)
tWC Address Valid address tCW *3 tAW tWP *3 tAS tWHZ Dout tOW High impedance*5 tDW Din *4 tDH *4 tWR
Valid data
Rev. 1, Nov. 2001, page 10 of 10
HM628511HCI Series
Package Dimensions
HM628511HCJPI Series (CP-36D)
As of January, 2001
23.25 23.62 Max 36 19
10.16 ± 0.13
Unit: mm
1
3.50 ± 0.26
0.74
18
2.85 ± 0.12
11.18 ± 0.13
1.30 Max
0.80 +0.25 –0.17
*0.43 ± 0.10 0.41 ± 0.08
1.27
9.40 ± 0.25
Hitachi Code JEDEC EIAJ Mass (reference value) CP-36D Conforms Conforms 1.4 g
0.10
*Dimension including the plating thickness Base material dimension
Rev. 1, Nov. 2001, page 11 of 11
HM628511HCI Series
Disclaimer
1. Hitachi neither warrants nor grants licenses of any rights of Hitachi’s or any third party’s patent, copyright, trademark, or other intellectual property rights for information contained in this document. Hitachi bears no responsibility for problems that may arise with third party’s rights, including intellectual property rights, in connection with use of the information contained in this document. 2. Products and product specifications may be subject to change without notice. Confirm that you have received the latest product standards or specifications before final design, purchase or use. 3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However, contact Hitachi’s sales office before using the product in an application that demands especially high quality and reliability or where its failure or malfunction may directly threaten human life or cause risk of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment or medical equipment for life support. 4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly for maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic measures such as failsafes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other consequential damage due to operation of the Hitachi product. 5. This product is not designed to be radiation resistant. 6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without written approval from Hitachi. 7. Contact Hitachi’s sales office for any questions regarding this document or Hitachi semiconductor products.
Sales Offices
Hitachi, Ltd.
Semiconductor & Integrated Circuits Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan Tel: (03) 3270-2111 Fax: (03) 3270-5109
URL
http://www.hitachisemiconductor.com/
For further information write to:
Hitachi Semiconductor (America) Inc. 179 East Tasman Drive San Jose,CA 95134 Tel: (408) 433-1990 Fax: (408) 433-0223 Hitachi Europe Ltd. Electronic Components Group Whitebrook Park Lower Cookham Road Maidenhead Berkshire SL6 8YA, United Kingdom Tel: (1628) 585000 Fax: (1628) 585200 Hitachi Europe GmbH Electronic Components Group Dornacher Straße 3 D-85622 Feldkirchen Postfach 201, D-85619 Feldkirchen Germany Tel: (89) 9 9180-0 Fax: (89) 9 29 30 00 Hitachi Asia Ltd. Hitachi Tower 16 Collyer Quay #20-00 Singapore 049318 Tel : -538-6533/538-8577 Fax : -538-6933/538-3877 URL : http://semiconductor.hitachi.com.sg Hitachi Asia Ltd. (Taipei Branch Office) 4/F, No. 167, Tun Hwa North Road Hung-Kuo Building Taipei (105), Taiwan Tel : -(2)-2718-3666 Fax : -(2)-2718-8180 Telex : 23222 HAS-TP URL : http://www.hitachi.com.tw Hitachi Asia (Hong Kong) Ltd. Group III (Electronic Components) 7/F., North Tower World Finance Centre, Harbour City, Canton Road Tsim Sha Tsui, Kowloon Hong Kong Tel : -(2)-735-9218 Fax : -(2)-730-0281 URL : http://semiconductor.hitachi.com.hk
Copyright © Hitachi, Ltd., 2001. All rights reserved. Printed in Japan.
Colophon 5.0
Rev. 1, Nov. 2001, page 12 of 12