R1W V3216R Series
32Mb Advanced LPSRAM (2M wordx16bit)
REJ03C0215-0300Z Rev.3.00 2008.03.03
Description
The R1WV3216R Series is a family of low voltage 32-Mbit static RAMs organized as 2097152-words by 16-bit, fabricated by Renesas's high-performance 0.15um CMOS and TFT technologies. The R1WV3216R Series is suitable for memory applications where a simple interfacing , battery operating and battery backup are the important design objectives. The R1WV3216R Series is made by stacked-micro-package technology and two chips of 16Mbit Advanced LPSRAMs are assembled in one package. The R1WV3216R Series is packaged in a 52pin micro thin small outline mount device[µTSOP / 10.79mm x 10.49mm with the pin-pitch of 0.4mm] or a 48balls fine pitch ball grid array [f-BGA / 7.5mmx8.5mm with the ball-pitch of 0.75mm and 6x8 array] . It gives the best solution for a compaction of mounting area as well as flexibility of wiring pattern of printed circuit boards.
Features
• Single 2.7-3.6V power supply • Small stand-by current:4µA (3.0V, typ.) • Data retention supply voltage =2.0V • No clocks, No refresh • All inputs and outputs are TTL compatible. • Easy memory expansion by CS1#, CS2, LB# and UB# • Common Data I/O • Three-state outputs: OR-tie capability • OE# prevents data contention on the I/O bus • Process technology: 0.15um CMOS
REJ03C0215-0300Z Rev.3.00 2008.03.03 page 1 of 15
R1W V3216R Series
Ordering Information
Type No. R1WV3216RSD-7S% R1WV3216RSD-8S% R1WV3216RBG-7S% R1WV3216RBG-8S% Access time 70 ns 85 ns 70 ns 7.5mmx8.5mm f-BGA 0.75mm pitch 48ball 85 ns % - Temperature version; see table below % R I Temperature Range 0 ~ +70 ºC -40 ~ +85 ºC Package 350-mil 52-pin plastic µ - TSOP(II) (normal-bend type) (52PTG)
REJ03C0215-0300Z Rev.3.00 2008.03.03 page 2 of 15
R1W V3216R Series
Pin Arrangement
52-pin µTSOP
A15 A14 A13 A12 A11 A10 A9 A8 A19 CS1# WE# NC NC Vcc CS2 NC A20 A18 A17 A7 A6 A5 A4 A3 A2 A1 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 52 51 50 49 48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 A16 BYTE# UB# Vss LB# DQ15/A-1 DQ7 DQ14 DQ6 DQ13 DQ5 DQ12 DQ4 NC DQ11 DQ3 DQ10 DQ2 DQ9 DQ1 DQ8 DQ0 OE# Vss NC A0
48-pin fBGA
1 A B C D E F G H
LB#
2
OE#
3
A0 A3 A5 A17
Vss or NC
4
A1 A4 A6 A7 A16 A15 A13 A10
5
A2
CS1#
6
CS2
DQ0
DQ15
UB#
DQ13
DQ14
DQ1
DQ2
Vss Vcc
DQ10
DQ12
DQ3
Vcc Vss
DQ5
DQ11
DQ4
DQ9 A19 A8
A14 A12 A9
DQ6
DQ8
WE# A11
DQ7
A18
A20
(Top view)
Pin Description Pin name
A0 to A20 A-1 to A20 DQ 0 to DQ15 CS1# &CS2 WE# OE# LB# UB# Vcc Vss BYTE# NC
Note: Byte Mode is supported by only 52-pin µTSOP type.
Function
Address input (Word mode) Address input (Byte mode) Data input/output Chip select Write enable Output enable Lower byte select Upper byte select Power supply Ground Byte (x8 mode) enable input Non connection
REJ03C0215-0300Z Rev.3.00 2008.03.03 page 3 of 15
R1W V3216R Series
Block Diagram
SENSE Amp.
ADDRESS BUFFER
A0
Memory Array
DECODER
SENSE Amp.
A20 CS2 CS1# LB# UB# BYTE# WE# OE#
OUTPUT BUFFER
1048576 Words x 16BITS OR 2097152 Words x 8BITS CLOCK GENERATOR
DATA SELECTOR
OUTPUT BUFFER
DQ0
DQ7 DQ8 DQ15 / A-1
DATA SELECTOR
DATA INPUT BUFFER
Vcc Vss
16Mb Advanced LPSRAM #1 16Mb Advanced LPSRAM #2
Note: BYTE# pin is supported by only 52-pin µTSOP type.
REJ03C0215-0300Z Rev.3.00 2008.03.03 page 4 of 15
DATA INPUT BUFFER
x8/x16 SWITCHING CIRCUIT
R1W V3216R Series
Operating Table
CS1# H X X L L L L L L L L L CS2 X L X H H H H H H H H H BYTE# X X H H H X H H H H L L LB# X X H L L X H H L L L L UB# X X H H H X L L L L L L WE# X X X L H H L H L H L H OE# X X X X L H X L X L X L DQ0-7 High-Z High-Z High-Z Din Dout High-Z High-Z High-Z Din Dout Din Dout DQ8-14 High-Z High-Z High-Z High-Z High-Z High-Z Din Dout Din Dout High-Z High-Z DQ15 High-Z High-Z High-Z High-Z High-Z High-Z Din Dout Din Dout A-1 A-1 Operation Stand by Stand by Stand by Write in lower byte Read from lower byte Output disable Write in upper byte Read from upper byte Write Read Write Read
Note 1. H:VIH L:VIL X: VIH or VIL 2. BYTE# pin is supported by only 52-pin µTSOP type. When apply BYTE# =“L” , please assign LB#=UB#=“L”.
Absolute Maximum Ratings Parameter
Power supply voltage relative to Vss Terminal voltage on any pin relation toVss Power dissipation Operation temperature Storage temperature Storage temperature range under bias
Symbol
Vcc VT PT R ver. *3 Topr I ver. *3 Tstg R ver. *3 Tbias I ver. *3
Value
-0.5 to +4.6 -0.5*1 to Vcc+0.3*2 0.7 0 to +70 -40 to +85 -65 to +150 0 to +70 -40 to +85
Unit
V V W ºC ºC ºC ºC ºC
Note 1: -2.0V in case of AC (Pulse width ≤ 30ns) 2: Maximum voltage is +4.6V 3: Temperature range depends on R/I-version. Please see table on page 2.
REJ03C0215-0300Z Rev.3.00 2008.03.03 page 5 of 15
R1W V3216R Series
Recommended Operating Conditions Parameter
Supply voltage Input high voltage Input low voltage Ambient temperature range R ver. I ver.
Symbol
Vcc Vss VIH VIL Ta
Min.
2.7 0 2.4 -0.2 0 -40
Typ.
3.0 0 -
Max.
3.6 0 Vcc+0.2 0.4 +70 +85
Unit
V V V V ºC ºC
Note
1 2 2
Note 1. –2.0V in case of AC (Pulse width ≤ 30ns) 2. Ambient temperature range depends on R/I-version. Please see table on page 2.
DC Characteristics Parameter
Input leakage current
Symbol |ILI| |ILo|
Min.
-
Typ.
-
Max.
1
Unit
µA
Test conditions*3
Vin=Vss to Vcc BYTE# ≥Vcc-0.2V or BYTE# ≤ 0.2V, CS1# =VIH or CS2=VIL or OE# = VIH or WE# =VIL or LB# =UB# =VIH,VI/O=Vss to Vcc BYTE# ≥Vcc-0.2V or BYTE# ≤ 0.2V, Min. cycle, duty =100% I I/O = 0 mA, CS1# =VIL, CS2=VIH Others = VIH / VIL BYTE# ≥Vcc-0.2V or BYTE# ≤ 0.2V,
Output leakage current
-
-
1
µA
Icc1
Average operating current
-
30 *1
55
mA
Icc2
-
3 *1
8
mA
Cycle time = 1 µs, I I/O = 0 mA, CS1#≤ 0.2V, CS2 ≥ VCC-0.2V VIH ≥ VCC-0.2V , VIL ≤ 0.2V, duty=100% BYTE# ≥Vcc-0.2V or BYTE#≤0.2V, CS2=VIL
Standby current
ISB
-
0.1 *1 4 *1 7 *2 -
0.3 12 24 50 80 0.4
mA µA µA µA µA V V
~+25ºC V in ≥ 0V, ~+40ºC ~+70ºC ~+85ºC
Standby current
ISB1
-
BYTE# ≥Vcc-0.2V or BYTE#≤0.2V, (1) 0V≤CS2≤0.2V or (2) CS2≥Vcc-0.2V, CS1# ≥Vcc-0.2V or (3)LB# =UB# ≥Vcc-0.2V, CS2≥Vcc-0.2V, CS1# ≤0.2V Average value
Output high voltage Output Low voltage
VOH VOL
2.4 -
BYTE# ≥Vcc-0.2V or BYTE#≤0.2V, IOH = -1mA BYTE# ≥Vcc-0.2V or BYTE#≤0.2V, IOL = 2mA
Note 1. Typical parameter indicates the value for the center of distribution at Vcc=3.0V (Ta= 25ºC), and not 100% tested. 2. Typical parameter indicates the value for the center of distribution at Vcc=3.0V (Ta= 40ºC), and not 100% tested. 3. BYTE# pin is supported by only 52-pin µTSOP type. REJ03C0215-0300Z Rev.3.00 2008.03.03 page 6 of 15
R1W V3216R Series
Capacitance
(Ta = +25ºC, f =1MHz)
Parameter
Input capacitance Input / output capacitance
Symbol
C in C I/O
Min.
-
Typ.
-
Max.
20 20
Unit
pF pF
Test conditions
V in = 0V V I/O = 0V
Note
1 1
Note 1. This parameter is sampled and not 100% tested.
AC Characteristics
Test Conditions (Vcc=2.7~3.6V, Ta = 0~+70ºC / -40~+85ºC *)
• Input pulse levels: VIL= 0.4V,VIH=2.4V • Input rise and fall time : 5ns • Input and output timing reference levels : 1.4V • Output load : See figures (Including scope and jig)
1.4V RL=500Ω DQ CL=30pF
Note: Temperature range depends on R/I-version. Please see table on page 2.
REJ03C0215-0300Z Rev.3.00 2008.03.03 page 7 of 15
R1W V3216R Series
Read Cycle
Parameter Read cycle time Address access time Chip select access time Output enable to output valid Output hold from address change LB#,UB# access time Chip select to output in low-Z LB#,UB# enable to low-Z Output enable to output in low-Z Chip deselect to output in high-Z LB#,UB# disable to high-Z Output disable to output in high-Z Symbol R1WV3216R**-7S Min. Max. 70 10 10 5 5 0 0 0 0 70 70 70 35 70 25 25 25 25 R1WV3216R**-8S Min. Max. 85 10 10 5 5 0 0 0 0 85 85 85 45 85 30 30 30 30 Unit ns ns ns ns ns ns ns ns ns ns ns ns ns ns 2,3 2,3 2,3 1,2,3 1,2,3 1,2,3 1,2,3 Notes
tRC tAA tACS1 tACS2 tOE tOH tBA tCLZ tBLZ tOLZ tCHZ1 tCHZ2 tBHZ tOHZ
REJ03C0215-0300Z Rev.3.00 2008.03.03 page 8 of 15
R1W V3216R Series
Write Cycle
Parameter Write cycle time Address valid to end of write Chip selection to end of write Write pulse width LB#,UB# valid to end of write Address setup time Write recovery time Data to write time overlap Data hold from write time Output active from end of write Output disable to output in high-Z Write to output in high-Z Symbol R1WV3216R**-7S Min. Max. 70 65 65 55 65 0 0 35 0 5 0 0 25 25 R1WV3216R**-8S Min. Max. 85 70 70 60 70 0 0 40 0 5 0 0 30 30 Unit ns ns ns ns ns ns ns ns ns ns ns ns 2 1,2 1,2 6 7 5 4 Notes
tWC tAW tCW tWP tBW tAS tWR tDW tDH tOW tOHZ tWHZ
Byte Enable (supported by only 52-pin µTSOP )
Parameter Byte setup time Byte recovery time Symbol R1WV3216R**-7S Min. Max. 5 5 R1WV3216R**-8S Min. Max. 5 5 Unit ms ms Notes
tBS tBR
Note 1. tCHZ, tOHZ, tWHZ and tBHZ are defined as the time at which the outputs achieve the open circuit conditions
and are not referred to output voltage levels. 2. This parameter is sampled and not 100% tested. 3. AT any given temperature and voltage condition, tHZ max is less than tLZ min both for a given device and form device to device. 4. A write occurs during the overlap of a low CS1#, a high CS2, a low WE# and a low LB# or a low UB#. A write begins at the latest transition among CS1# going low, CS2 going high, WE# going low and LB# going low or UB# going low . A write ends at the earliest transition among CS1# going high, CS2 going low, WE# going high and LB# going high or UB# going high. tWP is measured from the beginning of write to the end of write. 5. tCW is measured from the later of CS1# going low or CS2 going high to end of write. 6. tAS is measured the address valid to the beginning of write. 7. tWR is measured from the earliest of CS1# or WE# going high or CS2 going low to the end of write cycle.
REJ03C0215-0300Z Rev.3.00 2008.03.03 page 9 of 15
R1W V3216R Series
Timing Waveform
Read Timing Waveform A0~20
(Word Mode)
tRC
Valid address
A-1~20
(Byte Mode)
tAA tBA
tOH
LB#,UB#
tBHZ
CS1#
tACS1 tCHZ1
CS2
tACS2 tCHZ2 tOE
OE#
WE# = "H" level
tOLZ tCLZ tBLZ
tOHZ
Valid data
DQ0~15
(Word Mode)
DQ0~7 (Byte Mode)
Note: Byte Mode is supported by only 52-pin µTSOP type. BYTE# ≥ Vcc-0.2V or BYTE# ≤ 0.2V
REJ03C0215-0300Z Rev.3.00 2008.03.03 page 10 of 15
R1W V3216R Series
Write Timing Waveform (1) (WE# CLOCK)
tWC
A 0~20
(Word Mode)
A -1~20
(Byte Mode)
Valid address
tBW tCW tCW tAW tAS tWP tWHZ tOW tWR
LB#,UB# CS1#
CS2
WE#
DQ0~15
(Word Mode)
tDW
tDH
DQ0~7
(Byte Mode)
Valid data
Note: Byte Mode is supported by only 52-pin µTSOP type. BYTE# ≥ Vcc-0.2V or BYTE# ≤ 0.2V
REJ03C0215-0300Z Rev.3.00 2008.03.03 page 11 of 15
R1W V3216R Series
Write Timing Waveform (2) (CS1#, CS2 CLOCK, OE#=VIH)
tWC
A0~20
(Word Mode)
A-1~20
(Byte Mode)
Valid address
tBW
LB#,UB#
CS1#
tAS
CS2
tCW tCW tWP tDW
tWR
WE# DQ0~15
(Word Mode)
tDH
DQ0~7 (Byte Mode)
Valid data
Note: Byte Mode is supported by only 52-pin µTSOP type. BYTE# ≥ Vcc-0.2V or BYTE# ≤ 0.2V
REJ03C0215-0300Z Rev.3.00 2008.03.03 page 12 of 15
R1W V3216R Series
Write Timing Waveform (3) (LB#,UB# CLOCK, OE#=VIH)
tWC
A0~20
(Word Mode)
A-1~20
(Byte Mode)
Valid address
tAS
tBW
tWR
LB#,UB# CS1#
tCW tCW
CS2
WE#
tWP tDW tDH
DQ0~15 (Word Mode) DQ0~7 (Byte Mode)
Valid data
Note: Byte Mode is supported by only 52-pin µTSOP type. BYTE# ≥ Vcc-0.2V or BYTE# ≤ 0.2V
BYTE# Timing Waveform CS2 CS1#
tBS
BYTE#
tBR
REJ03C0215-0300Z Rev.3.00 2008.03.03 page 13 of 15
R1W V3216R Series
Data Retention Characteristics
Parameter Symbol Min. Typ. Max. Unit Test conditions*3,4
V in ≥ 0V, BYTE#≥Vcc-0.2V or BYTE#≤0.2V (1) 0V ≤ CS2 ≤ 0.2V or (2) CS2 ≥ Vcc-0.2V, CS1# ≥ Vcc-0.2V or (3) LB# =UB# ≥ Vcc-0.2V, CS2 ≥ Vcc-0.2V, CS1# ≤ 0.2V
Vcc for data retention
VDR
2.0
-
3.6
V
Data retention current
4 *1 7 *2 -
12 24 50 80 -
µA µA µA µA ns
~+25ºC ~+40ºC ~+70ºC ~+85ºC
IccDR
-
Vcc=3.0V,Vin≥0V, BYTE# ≥ Vcc-0.2V or BYTE# ≤ 0.2V (1) 0V ≤ CS2 ≤ 0.2V or (2) CS2 ≥ Vcc-0.2V, CS1# ≥ Vcc-0.2V or (3) LB# =UB# ≥Vcc-0.2V, CS2 ≥ Vcc-0.2V, CS1# ≤ 0.2V Average value
Chip deselect to data retention time Operation recovery time
tCDR tR
0 5
See retention waveform ms
Note 1. Typical parameter indicates the value for the center of distribution at Vcc=3.0V (Ta= 25ºC) and not 100% tested. 2. Typical parameter indicates the value for the center of distribution at Vcc=3.0V (Ta= 40ºC) and not 100% tested. 3. BYTE# pin is supported by only 52-pin µTSOP type. 4. Also CS2 controls address buffer, WE# buffer ,CS1# buffer ,OE# buffer ,LB# ,UB# buffer and Din buffer .If CS2 controls data retention mode,Vin levels (address, WE# ,OE#,CS1#,LB#,UB#,I/O) can be in the high impedance state. If CS1# controls data retention mode, CS2 must be CS2 ≥ Vcc-0.2V or 0V ≤ CS2 ≤ 0.2V. The other input levels (address, WE# ,OE#,CS1#,LB#,UB#,I/O) can be in the high impedance state.
REJ03C0215-0300Z Rev.3.00 2008.03.03 page 14 of 15
R1W V3216R Series
Low Vcc Data Retention Timing Waveform (1) (CS1# Controlled)
tCDR
Vcc
2.7V
Data retention mode
tR
2.4V
V DR
CS1# 0V
Note: BYTE# pin is supported by only 52-pin µTSOP type. BYTE# ≥ Vcc-0.2V or BYTE# ≤ 0.2V
CS1# ≥ Vcc-0.2V
Low Vcc Data Retention Timing Waveform (2) (CS2 Controlled)
tCDR
Vcc
2.7V
Data retention mode
tR
CS2 V DR
0.2V 0V
Note: BYTE# pin is supported by only 52-pin µTSOP type. BYTE# ≥ Vcc-0.2V or BYTE# ≤ 0.2V
0V ≤ CS2 ≤ 0.2V
Low Vcc Data Retention Timing Waveform (3) (LB#, UB# Controlled)
tCDR
Vcc
2.7V
Data retention mode
tR
2.4V
V DR
LB#, UB# 0V
Note: BYTE# pin is supported by only 52-pin µTSOP type. BYTE# ≥ Vcc-0.2V or BYTE# ≤ 0.2V
LB#, UB# ≥ Vcc-0.2V
REJ03C0215-0300Z Rev.3.00 2008.03.03 page 15 of 15
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