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UPA2737GR-E1-AX

UPA2737GR-E1-AX

  • 厂商:

    RENESAS(瑞萨)

  • 封装:

    SOP8_150MIL

  • 描述:

    MOSFET P-CH 30V 11A 8SOP

  • 数据手册
  • 价格&库存
UPA2737GR-E1-AX 数据手册
Data Sheet μPA2737GR P-channel MOSFET R07DS1317EJ0100 Rev.1.00 Jan 12, 2016 –30 V, –11 A, 13 mΩ Description The μ PA2737GR is P-channel MOS Field Effect Transistor designed for DC/DC converter and power management applications of portable equipment. Features • VDSS = −30 V (TA = 25°C) • Low on-state resistance ⎯ RDS(on) = 13 mΩ MAX. (VGS = −10 V, ID = −11 A) • 4.5 V Gate-drive available • Small and surface mount package (SOP-8) • Pb-free and Halogen free SOP-8 Ordering Information Part No. LEAD PLATING μ PA2737GR-E1-AX μ PA2737GR-E2-AX Ni / Pd / Au PACKING Package SOP-8 0.085 g TYP. Tape 2500 p/reel Absolute Maximum Ratings (TA = 25°C) Item Drain to Source Voltage (VGS = 0 V) Gate to Source Voltage (VDS = 0 V) Drain Current (DC) Drain Current (pulse) ∗1 Total Power Dissipation ∗2 Total Power Dissipation (PW = 10 sec) ∗2 Channel Temperature Symbol VDSS VGSS ID(DC) ID(pulse) PT1 PT2 Tch Storage Temperature Single Avalanche Current ∗3 Single Avalanche Energy ∗3 Tstg IAS EAS Ratings −30 m20 m11 m110 1.1 2.5 150 Unit V V A A W W °C −55 to +150 11 12.1 °C A mJ Thermal Resistance Channel to Ambient Thermal Resistance ∗2 Rth(ch-A) 114 °C/W Notes: ∗1. PW ≤ 10 μs, Duty Cycle ≤ 1% ∗ 2. Mounted on a glass epoxy board of 25.4 mm x 25.4 mm x 0.8 mmt ∗ 3. Starting Tch = 25°C, VDD = −15 V, RG = 25 Ω, VGS = −20 → 0 V, L = 100 μH R07DS1317EJ0100 Rev.1.00 Jan 12, 2016 Page 1 of 6 μPA2737GR Electrical Characteristics (TA = 25°C) Item Zero Gate Voltage Drain Current Symbol IDSS Gate Leakage Current Gate Cut-off Voltage Forward Transfer Admittance ∗1 IGSS VGS(off) | yfs | Drain to Source On-state Resistance ∗1 Input Capacitance Output Capacitance Reverse Transfer Capacitance Turn-on Delay Time Rise Time Turn-off Delay Time Fall Time Total Gate Charge Gate to Source Charge Gate to Drain Charge Body Diode Forward Voltage ∗1 Reverse Recovery Time RDS(on)1 RDS(on)2 Ciss Coss Crss td(on) tr td(off) tf QG QGS QGD VF(S-D) trr Reverse Recovery Charge Qrr MIN. TYP. −1.0 4.5 MAX. −1 Unit μA Test Conditions VDS = −30 V, VGS = 0 V m100 −2.5 nA V S mΩ mΩ pF pF pF ns ns ns ns nC nC nC V ns VGS = m20 V, VDS = 0 V VDS = −10 V, ID = −1 mA VDS = −10 V, ID = −5.5 A VGS = −10 V, ID = −11 A VGS = −4.5 V, ID = −11 A VDS = −10 V, VGS = 0 V, f = 1 MHz VDD = −15 V, ID = −5.5 A, VGS = −10 V, nC di/dt = 100 A/μs 9.7 17 1750 850 770 20 32 70 55 45 2.5 23 0.85 49 13 25 48 RG = 10 Ω VDD = −24 V, VGS = −10 V, ID = −11 A IF = 11 A, VGS = 0 V IF = 11 A, VGS = 0 V, Note: ∗1. Pulsed TEST CIRCUIT 1 AVALANCHE CAPABILITY TEST CIRCUIT 2 SWITCHING TIME D.U.T. RG = 25 Ω D.U.T. L RL 50 Ω PG. VGS = −20 → 0 V VDD RG PG. VGS(−) VGS Wave Form 0 90% VGS 10% VDD VDS(−) − IAS BVDSS VDS ID VGS(−) 0 VDS Wave Form τ VDD Starting Tch τ = 1 μs Duty Cycle ≤ 1% VDS 90% 90% 10% 10% 0 td(on) tr td(off) ton tf toff TEST CIRCUIT 3 GATE CHARGE D.U.T. PG. IG = −2 mA RL 50 Ω VDD R07DS1317EJ0100 Rev.1.00 Jan 12, 2016 Page 2 of 6 μPA2737GR TYPICAL CHARACTERISTICS (TA = 25°C) FORWARD BIAS SAFE OPERATING AREA DERATING FACTOR OF FORWARD BIAS SAFE OPERATING AREA -1000 30 ms 100 ms ID(pulse) = –110 A 120 ID - Drain Current - A -100 100 80 60 40 PW ID(DC) = –11 A -10 o S( -1 50 75 100 125 150 -0.01 -0.01 175 d ite L im V 10 ) Po we r D = 10 0 s DC is si pa tio n Li Single Pulse m ite d TA = 25°C Mounted on glass epoxy board of 25.4 mm x 25.4 mm x 0.8 mmt -0.1 0 25 n) R D S= G (V 20 0 10 ms 1m s μ dT - Percentage of Rated Power - % 140 -0.1 -1 -10 -100 VDS - Drain to Source Voltage – V TA - Ambient Temperature - °C rth(t) - Transient Thermal Resistance - °C/W TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH 1000 Rth(ch-A) = 114°C/W 100 10 1 0.1 Rth(ch-A):Mounted on glass epoxy board of 25.4 mm x 25.4 mm x 0.8 mmt Single pulse 0.01 100 μ 1m 10 m 100 m 1 10 100 1000 PW - Pulse Width - s DRAIN CURRENT vs. FORWARD TRANSFER CHARACTERISTICS DRAIN TO SOURCE VOLTAGE -120 -100 TA = 150°C 75°C 25°C –55°C -10 V GS = –10 V -80 -60 ID - Drain Current - A ID - Drain Current - A -100 –4.5 V -40 -20 Pulsed -0.5 -1 VDS - Drain to Source Voltage - V R07DS1317EJ0100 Rev.1.00 Jan 12, 2016 -0.1 -0.01 Pulsed VDS = –10 V -0.001 -0 -0 -1 -1.5 -0 -1 -2 -3 -4 VGS - Gate to Source Voltage - V Page 3 of 6 GATE TO SOURCE CUT-OFF VOLTAGE vs. FORWARD TRANSFER ADMITTANCE vs. DRAIN CHANNEL TEMPERATURE CURRENT -2 -1 Pulsed VDS = –10 V ID = –1mA -0 -50 RDS(on) - Drain to Source On-state Resistance - mΩ | yfs | - Forward Transfer Admittance - S -3 0 50 100 150 100 TA = 150°C 75°C 25°C –55°C 10 1 Pulsed VDS = –10 V 0.1 -0.01 -0.1 -1 -10 Tch - Channel Temperature - °C ID - Drain Current - A DRAIN TO SOURCE ON-STATE RESISTANCE vs. DRAIN TO SOURCE ON-STATE RESISTANCE vs. DRAIN CURRENT GATE TO SOURCE VOLTAGE 40 Pulsed 30 VGS = –4.5 V 20 10 –10 V 0 -1 -10 -100 -1000 ID - Drain Current - A RDS(on) - Drain to Source On-state Resistance - mΩ VGS(off) – Gate to Source Cut-off Voltage - V μPA2737GR 30 Pulsed ID = –11 A 25 20 15 10 5 0 -0 -5 -10 -15 -20 VGS - Gate to Source Voltage - V CAPACITANCE vs. DRAIN TO SOURCE VOLTAGE DRAIN TO SOURCE ON-STATE RESISTANCE vs. 25 10000 Pulsed ID = –11 A 20 Ciss, Coss, Crss - Capacitance - pF RDS(on) - Drain to Source On-state Resistance - mΩ CHANNEL TEMPERATURE VGS = –4.5 V 15 10 VGS = –10 V 5 0 Ciss 1000 Coss Crss VGS = 0 V f = 1 MHz 100 -50 0 50 100 Tch - Channel Temperature - °C R07DS1317EJ0100 Rev.1.00 Jan 12, 2016 150 -0.1 -1 -10 -100 VDS - Drain to Source Voltage - V Page 4 of 6 μPA2737GR DYNAMIC INPUT/OUTPUT CHARACTERISTICS -10 -8 VGS VDS -15 -6 -10 -4 -5 -2 ID = –11 A -0 -0 0 10 20 30 40 QG - Gate Charge - nC R07DS1317EJ0100 Rev.1.00 Jan 12, 2016 50 IF - Diode Forward Current - A VDD = –24V –12V –6V -20 1000 VGS - Gate to Source Voltage - V VDS - Drain to Source Voltage - V -25 SOURCE TO DRAIN DIODE FORWARD VOLTAGE 100 VGS = –10 V 10 –4.5 V 0V Pulsed 1 0 0.2 0.4 0.6 0.8 1 1.2 1.4 VF(S-D) - Source to Drain Voltage - V Page 5 of 6 μPA2737GR Package Drawings (Unit: mm) SOP-8 Equivalent Circuit Drain Body Diode Gate Source Remark 1, 2, 3 Source 4 Gate 5, 6, 7, 8 Darin Strong electric field, when exposed to this device, can cause destruction of the gate oxide and ultimately degrade the device operation. Steps must be taken to stop generation of static electricity as much as possible, and quickly dissipate it once, when it has occurred. R07DS1317EJ0100 Rev.1.00 Jan 12, 2016 Page 6 of 6 Notice 1. Descriptions of circuits, software and other related information in this document are provided only to illustrate the operation of semiconductor products and application examples. You are fully responsible for the incorporation of these circuits, software, and information in the design of your equipment. Renesas Electronics assumes no responsibility for any losses incurred by you or third parties arising from the use of these circuits, software, or information. 2. Renesas Electronics has used reasonable care in preparing the information included in this document, but Renesas Electronics does not warrant that such information is error free. Renesas Electronics 3. Renesas Electronics does not assume any liability for infringement of patents, copyrights, or other intellectual property rights of third parties by or arising from the use of Renesas Electronics products or assumes no liability whatsoever for any damages incurred by you resulting from errors in or omissions from the information included herein. technical information described in this document. No license, express, implied or otherwise, is granted hereby under any patents, copyrights or other intellectual property rights of Renesas Electronics or others. 4. You should not alter, modify, copy, or otherwise misappropriate any Renesas Electronics product, whether in whole or in part. Renesas Electronics assumes no responsibility for any losses incurred by you or 5. Renesas Electronics products are classified according to the following two quality grades: "Standard" and "High Quality". The recommended applications for each Renesas Electronics product depends on third parties arising from such alteration, modification, copy or otherwise misappropriation of Renesas Electronics product. the product's quality grade, as indicated below. "Standard": Computers; office equipment; communications equipment; test and measurement equipment; audio and visual equipment; home electronic appliances; machine tools; personal electronic equipment; and industrial robots etc. "High Quality": Transportation equipment (automobiles, trains, ships, etc.); traffic control systems; anti-disaster systems; anti-crime systems; and safety equipment etc. Renesas Electronics products are neither intended nor authorized for use in products or systems that may pose a direct threat to human life or bodily injury (artificial life support devices or systems, surgical implantations etc.), or may cause serious property damages (nuclear reactor control systems, military equipment etc.). 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