R3154N203A-TR-R

R3154N203A-TR-R

  • 厂商:

    RICOH

  • 封装:

    SOT23-6

  • 描述:

    IC SUPERVISOR 1 CHANNEL SOT23-6

  • 数据手册
  • 价格&库存
R3154N203A-TR-R 数据手册
R3154N Series AEC-Q100 Compliant 42 V Input Window Voltage Detector with Diagnostic Function for Automotive Applications No. EC-528-210917 OVERVIEW The R3154N is a Window Voltage Detector suitable for functional safety requirement. This device monitors over-and-under output voltages from the power supply IC for a microprocessor and a sensor, and detects abnormal voltage of systems. Its undervoltage detection down to 0.55 V is suitable for low power devices. Also, operation check of voltage detection is available with the TEST pin. KEY BENEFITS ● ● ● ● Power supply from battery enables the voltage detector to operate independently from the power source. High-accuracy over-and-undervoltage detection from -1.25% to 0.75% and the hysteresis of Max. 0.75%. Overvoltage detection: 0.75 V at minimum, Undervoltage detection: 0.55 V at minimum. Compact package of SOT-23-6. Safe and secure adjacent pin configuration to prevent a short circuit. KEY SPECIFICATIONS ● Operating Voltage Range (Max. Rating): 3.0 V to 42.0 V (50.0 V) ● Operating Temperature Range: −40 °C to 125 °C ● Supply Current: Typ. 2.0 µA ● Overvoltage Detection: 0.75 V to 3.70 V (in 0.01 V step) Accuracy (VOVSET > 0.9 V): ±0.5 % (Ta = 25 °C) −1.25 % to 0.75 % (−40 °C to 125 °C) ● Undervoltage Detection: 0.55 V to 3.30 V (in 0.01 V step) Accuracy (VUVSET > 0.66 V): ±0.5 % (Ta = 25 °C) −1.25 % to 0.75 % (−40 °C to 125 °C) ● Detection Release Hysteresis: Typ. 0.5 % ● Detection Release Time: Typ. 20 µs ● Release Delay Time: Typ. 4 ms (CD = 0.01 µF) ● Output Type: Nch. Open Drain PACKAGE SELECTION GUIDE Product Name Package Quantity per Reel R3154NxxxA-TR-## SOT-23-6 3,000 pcs xxx: The combination of an overvoltage detection setting voltage (VOVSET) and an undervoltage detection setting voltage (VUVSET) Refer to Product-specific Electrical Characteristics for details. #: Quality Class Refer to SELECTION GUIDE for details. TYPICAL APPLICATIONS Battery DCDC VIN MPU RES_B CD SOT-23-6 2.9 x 2.8 x 1.1 (mm) VDD CD SENSE TEST DOUT VIN R3154N GPI GPO0 Sub MPU GPO1 CD: a capacitor corresponding to the set release delay time APPLICATIONS ● Power supply voltage monitoring for systems which require fault detection, such as ECU and ADAS. ● Power supply voltage monitoring for control units such as EV inverters and Charge Controllers. 1 R3154N No. EC-528-210917 SELECTION GUIDE The detection setting voltages and quality class are user-selectable. Selection Guide Product Name R3154NxxxA-TR-## Package Quantity per Reel Pb Free Halogen Free SOT-23-6 3,000 pcs Yes Yes xxx: The combination of an overvoltage detection setting voltage (VOVSET) and an undervoltage detection setting voltage (VUVSET). Refer to Product-specific Electrical Characteristics for details. #: Quality Class Quality Class A R ## AE R Operating Temperature Range −40°C to 125°C −40°C to 125°C Test Temperature 25°C, High Low, 25°C, High BLOCK DIAGRAM VDD SENSE INT Regulator VCC UVLO UVCMP OVCMP UVCMP + - OVCMP + Delay Circuit DOUT - VREF TEST GND TEST CD R3154N Block Diagram 2 R3154N No. EC-528-210917 PIN DESCRIPTIONS 6 5 4 (mark side) 1 2 3 SOT-23-6 Pin Configuration Pin Descriptions Pin No. Symbol Description 1 VDD Supply Voltage Pin 2 CD 3 DOUT Voltage Fault Detection Output Pin (“Low” at detection) 4 TEST TEST Pin (“Low” at operation check of voltage detection) 5 GND GND Pin 6 SENSE Release Delay Time Set Pin (“Open” when not connected) SENSE Voltage Input Pin Internal Equivalent Circuit for Each Pin DOUT VCC Driver TEST DOUT Pin VCC TEST Pin SENSE CD CD Pin SENSE Pin 3 R3154N No. EC-528-210917 ABSOLUTE MAXIMUM RATINGS Absolute Maximum Ratings Symbol Rating Unit Supply Voltage −0.3 to 50.0 V Peak Voltage(1) 60 V CD Pin Output Voltage −0.3 to 20.0 V VDOUT DOUT Pin Output Voltage −0.3 to 20.0 V VTEST TEST Pin Voltage −0.3 to 20.0 V VSENSE SENSE Pin Voltage −0.3 to 20.0 V 30 mA VDD VCD IDOUT Parameter DOUT Pin Output Current Refer to Appendix PD Power Dissipation Tj Junction Temperature Range −40 to 150 °C Tstg Storage Temperature Range −55 to 150 °C “POWER DISSIPATION” ABSOLUTE MAXIMUM RATINGS Electronic and mechanical stress momentarily exceeded absolute maximum ratings may cause permanent damage and may degrade the life time and safety for both device and system using the device in the field. The functional operation at or over these absolute maximum ratings are not assured. RECOMMENDED OPERATING CONDITIONS Recommended Operating Conditions Symbol Parameter Rating Unit Operating Voltage 3.0 to 42 V VSENSE SENSE Input Voltage 0 to 6.0 V VTEST TEST Pin Voltage 0 to 6.0 V VUP DOUT Pin Pull-up Voltage 0 to 6.0 V Ta Operating Temperature Range −40 to 125 °C VDD RECOMMENDED OPERATING CONDITIONS All of electronic equipment should be designed that the mounted semiconductor devices operate within the recommended operating conditions. The semiconductor devices cannot operate normally over the recommended operating conditions, even if they are used over such ratings by momentary electronic noise or surge. And the semiconductor devices may receive serious damage when they continue to operate over the recommended operating conditions. (1) Duration Time: Within 200 ms 4 R3154N No. EC-528-210917 ELECTRICAL CHARACTERISTICS VDD = 14 V, CD = 0.01 µF, pulled-up to 5 V with 100 kΩ, unless otherwise specified. are guaranteed by design engineering at -40°C ≤ Ta ≤ 125°C. The specifications surrounded by R3154N (-AE) Electrical Characteristics Symbol Parameter (Ta = 25°C) Test Conditions Ta = 25°C VOVDET Overvoltage (OV) Detector Threshold –40°C ≤ Ta ≤ 125°C Ta = 25°C VUVDET Undervoltage (UV) Detector Threshold –40°C ≤ Ta ≤ 125°C Min. Typ. Max. Unit 0.9 V < VOVSET x0.995 x1.005 V VOVSET ≤ 0.9 V −4.5 +4.5 mV x1.0075 V -11.25 +6.75 mV 0.66V < VUVSET x0.995 x1.005 V +3.3 mV x1.0075 V +4.95 mV 0.9 V < VOVSET x0.9875 VOVSET ≤ 0.9 V VUVSET ≤ 0.66V -3.3 0.66 V< VUVSET x0.9875 VUVSET ≤ 0.66V -8.25 VOVHYS Overvoltage (OV) Threshold Hysteresis VOVDET ×0.0025 VOVDET ×0.005 VOVDET ×0.0075 V VUVHYS Undervoltage (UV) Threshold Hysteresis VUVDET ×0.0025 VUVDET ×0.005 VUVDET ×0.0075 V 2.0 5.0 µA 32 MΩ ISS Supply Current VUVDET < VSENSE < VOVDET RSENSE SENSE Pin Resistance(1) Resistance between SENSE and GND VUVLO UVLO Detector Threshold 1.8 2.7 V UVLO Threshold Hysteresis 0.1 0.3 V 1.7 V VUVLOHYS VDDL DOUT Pin Output Low-operating Voltage(2) IOUT NMOS Driver Output Current VDD = 3.0, VDS = 0.1 V ILEAK NMOS Driver Leakage Current VDOUT = 5.5 V VTESTH TEST Pin Input Voltage, "High" VTESTL TEST Pin Input Voltage, "Low" tDELAY Release Delay Time 3 0.37 0.75 0 mA 1 V 1.6 2.5 µA 4 0.5 V 8 ms All test items listed in Electrical Characteristics are done under the pulse load condition (Tj ≈ Ta = 25°C) (1) (2) Typ. value varies depending on the set value of detector threshold. Minimum value of power supply voltage when an output voltage becomes 0.1V or less at detection. (Pulled-up resistance: 100 kΩ, Pulled-up voltage: 5 V) 5 R3154N No. EC-528-210917 VDD = 14 V, CD = 0.01 µF, pulled-up to 5 V with 100 kΩ, unless otherwise specified. R3154N (-R) Electrical Characteristics Symbol Parameter (-40°C ≤ Ta ≤ 125°C) Test Conditions Ta = 25°C VOVDET Overvoltage (OV) Detector Threshold –40°C ≤ Ta ≤ 125°C Ta = 25°C VUVDET Undervoltage (UV) Detector Threshold –40°C ≤ Ta ≤ 125°C Max. Unit 0.9 V < VOVSET x0.995 x1.005 V VOVSET ≤ 0.9 V −4.5 +4.5 mV x1.0075 V -11.25 +6.75 mV 0.66V < VUVSET x0.995 x1.005 V +3.3 mV x1.0075 V +4.95 mV 0.9 V < VOVSET x0.9875 VOVSET ≤ 0.9 V VUVSET ≤ 0.66V -3.3 0.66 V< VUVSET x0.9875 VUVSET ≤ 0.66V -8.25 Overvoltage (OV) Threshold Hysteresis VOVDET ×0.0025 VOVDET ×0.005 VOVDET ×0.0075 V VUVHYS Undervoltage (UV) Threshold Hysteresis VUVDET ×0.0025 VUVDET ×0.005 VUVDET ×0.0075 V 2.0 5.0 µA 32 MΩ Supply Current VUVDET < VSENSE < VOVDET RSENSE SENSE Pin Resistance(1) Resistance between SENSE and GND VUVLO UVLO Detector Threshold 1.8 2.7 V UVLO Threshold Hysteresis 0.1 0.3 V 1.7 V VUVLOHYS (2) Typ. VOVHYS ISS (1) Min. VDDL DOUT Pin Output Low-operating Voltage(2) IOUT NMOS Driver Output Current VDD = 3.0, VDS = 0.1 V ILEAK NMOS Driver Leakage Current VDOUT = 5.5 V VTESTH TEST Pin Input Voltage, "High" VTESTL TEST Pin Input Voltage, "Low" tDELAY Release Delay Time 3 0.37 0.75 0 mA 1 1.6 2.5 µA V 4 0.5 V 8 ms Typ. value varies depending on the set value of detector threshold. Minimum value of power supply voltage when an output voltage becomes 0.1V or less at detection. (Pulled-up resistance: 100 kΩ, Pulled-up voltage: 5 V) 6 R3154N No. EC-528-210917 VDD = 14 V, CD = 0.01 µF, pulled-up to 5 V with 100 kΩ, unless otherwise specfied. The specifications surrounded by are guaranteed by design engineering at -40°C ≤ Ta ≤ 125°C. R3154N-AE Product-specific Electrical Characteristics (Ta = 25°C) Product name VOVDET (V) VUVDET (V) Min. Typ. Max. Min. Typ. Max. R3154N201A 0.85550 0.86 0.86450 0.76615 0.77 0.77385 R3154N202A 0.74550 0.75 0.75450 0.54670 0.55 0.55330 R3154N203A 3.52230 3.54 3.55770 3.03475 3.05 3.06525 R3154N204A 1.32335 1.33 1.33665 1.16415 1.17 1.17585 R3154N205A 1.07460 1.08 1.08540 0.91540 0.92 0.92460 R3154N206A 0.86550 0.87 0.87450 0.72635 0.73 0.73365 R3154N207A 0.81550 0.82 0.82450 0.66665 0.67 0.67335 VOVDET (V) VUVDET (V) (-40°C ≤ Ta ≤ 125°C) VOVHYS (V) VUVHYS (V) Product name Min. Typ. Max. Min. Typ. Max. Min. Typ. Max. Min. Typ. Max. R3154N201A 0.84875 0.86 0.86675 0.76038 0.77 0.77577 0.00215 0.00430 0.00645 0.00193 0.00385 0.00577 R3154N202A 0.73875 0.75 0.75675 0.54175 0.55 0.55495 0.00188 0.00375 0.00562 0.00138 0.00275 0.00412 R3154N203A 3.49575 3.54 3.56655 3.01188 3.05 3.07287 0.00885 0.01770 0.02655 0.00763 0.01525 0.02287 R3154N204A 1.31338 1.33 1.33997 1.15538 1.17 1.17877 0.00333 0.00665 0.00997 0.00293 0.00585 0.00877 R3154N205A 1.06650 1.08 1.08810 0.90850 0.92 0.92690 0.00270 0.00540 0.00810 0.00230 0.00460 0.00690 R3154N206A 0.85875 0.87 0.87675 0.72088 0.73 0.73547 0.00218 0.00435 0.00652 0.00183 0.00365 0.00547 R3154N207A 0.80875 0.82 0.82675 0.66163 0.67 0.67502 0.00205 0.00410 0.00615 0.00168 0.00335 0.00502 7 R3154N No. EC-528-210917 VDD = 14 V, CD = 0.01 µF, pulled-up to 5 V with 100 kΩ, unless otherwise specfied. R3154N-R Product-specific Electrical Characteristics (Ta = 25°C) Product name VOVDET (V) VUVDET (V) Min. Typ. Max. Min. Typ. Max. R3154N201A 0.85550 0.86 0.86450 0.76615 0.77 0.77385 R3154N202A 0.74550 0.75 0.75450 0.54670 0.55 0.55330 R3154N203A 3.52230 3.54 3.55770 3.03475 3.05 3.06525 R3154N204A 1.32335 1.33 1.33665 1.16415 1.17 1.17585 R3154N205A 1.07460 1.08 1.08540 0.91540 0.92 0.92460 R3154N206A 0.86550 0.87 0.87450 0.72635 0.73 0.73365 R3154N207A 0.81550 0.82 0.82450 0.66665 0.67 0.67335 VOVDET (V) VUVDET (V) (-40°C ≤ Ta ≤ 125°C) VOVHYS (V) VUVHYS (V) Product name Min. Typ. Max. Min. Typ. Max. Min. Typ. Max. Min. Typ. Max. R3154N201A 0.84875 0.86 0.86675 0.76038 0.77 0.77577 0.00215 0.00430 0.00645 0.00193 0.00385 0.00577 R3154N202A 0.73875 0.75 0.75675 0.54175 0.55 0.55495 0.00188 0.00375 0.00562 0.00138 0.00275 0.00412 R3154N203A 3.49575 3.54 3.56655 3.01188 3.05 3.07287 0.00885 0.01770 0.02655 0.00763 0.01525 0.02287 R3154N204A 1.31338 1.33 1.33997 1.15538 1.17 1.17877 0.00333 0.00665 0.00997 0.00293 0.00585 0.00877 R3154N205A 1.06650 1.08 1.08810 0.90850 0.92 0.92690 0.00270 0.00540 0.00810 0.00230 0.00460 0.00690 R3154N206A 0.85875 0.87 0.87675 0.72088 0.73 0.73547 0.00218 0.00435 0.00652 0.00183 0.00365 0.00547 R3154N207A 0.80875 0.82 0.82675 0.66163 0.67 0.67502 0.00205 0.00410 0.00615 0.00168 0.00335 0.00502 8 R3154N No. EC-528-210917 TYPICAL APPLICATION CIRCUIT VDD VUP 100 kΩ VDD CD CD SENSE DOUT R3154N TEST VDD R1 RESET ←Signal MPU GND GND R3154N Typical Application Circuit Recommended External Components Symbol CD R1 Description A capacitor should be selected corresponding to the set Release Delay Time. Refer to “Delay in Operation and Release Delay Time (tDELAY)” in THEORY OF OPERATION for details. When minimizing the release delay time, layout the circuit without any capacitor. The “Low” voltage of the DOUT output is determined by the division ratio of the on resistance of the NMOS driver and the pull-up resistance value (R1). The on-resistance of the NMOS driver is calculated from the “NMOS driver output current”. Select the pull-up resistance value (R1) to bring the “Low” voltage of the DOUT output to the desired voltage. The “High” level of the DOUT output is determined by the division ratio of the leakage current of the NMOS driver and the pull-up resistance value (R1). The leakage current of the NMOS driver is calculated from the “NMOS driver leakage current”. Confirm if the “High” voltage of the DOUT output is the desired voltage. “Electrical Characteristic” is evaluated in conditions that pull-up voltage = 5 V and R1 = 100 kΩ. 9 R3154N No. EC-528-210917 THEORY OF OPERATION VDD VSENSE VUVLO+VUVLOHYS VUVREL VUVLO VOVDET VOVREL VUVDET UVLO Release Voltage: VUVLO+VUVLOHYS UVLO Detector Threshold: VUVLO Overvoltage Detector Threshold: VOVDET Overvoltage Release Voltage: VOVREL Undervoltage Release Voltage: VUVREL Undervoltage Detector Threshold: VUVDET VUVREL CD tDELAY tDELAY tDELAY depends on the capacity connected to the CD pin. tDELAY DOUT (1) (2) (3) (4) (1) (5) R3154N Timing Chart (1) When the SENSE pin voltage (VSENSE) exceeds the undervoltage release voltage (VUVREL), the DOUT pin outputs “High” after the release delay time (tDELAY). (2) When VSENSE exceeds the overvoltage detector threshold (VOVDET) by increasing of the voltage, the DOUT pin outputs “Low” after the detection delay time (Typ. 20 µs) and this triggers the overvoltage detecting state. (3) When VSENSE decreases less than the overvoltage release voltage (VOVREL), the DOUT pin outputs “High” after the release delay time (tDELAY). (4) When VSENSE decreases less than the undervoltage detector threshold (VUVDET), the DOUT pin outputs “Low” after the detection delay time (Typ. 20 µs) and this triggers the undervoltage detecting state. (5) When the VDD pin voltage (VDD) decreases less than the UVLO detector threshold (VUVLO), the DOUT pin outputs “Low”. Note that DOUT cannot maintain “Low” when the VDD pin voltage drops further and becomes lower than VDDL. 10 R3154N No. EC-528-210917 Delay Operation and Release Delay Time (tDELAY) At Undervoltage Detection A higher voltage than the undervoltage release voltage (VUVREL) supplied to the SENSE pin triggers charging of the external capacitor (CD capacitance), then the CD pin voltage (VCD) increases. The DOUT pin voltage (VDOUT) maintains “Low” until VCD reaches the CD pin threshold voltage (VTCD). When VCD exceeds VTCD, VDOUT transitions from “Low” to “High”. The release delay time (tDELAY) is the period from the time the SENSE pin voltage (VSENSE) exceeds VUVREL to a rising edge of VDOUT. VDOUT transitions from “Low” to “High” and it leads to discharging of the CD capacitor. Without the CD capacitor, it becomes the short tDELAY (Typ. 20 μs) depending on the circuit delay and CD pin stray capacity. When the higher voltage than VUVDET is supplied to the SENSE pin, the detection delay time (tPHL), which is the period that VDOUT transitions from “High” to “Low”, remains constant regardless of the capacitance value of the external capacitor. VUVREL VUVDET SENSE Pin VTCD CD Pin Voltage GND DOUT Pin GND Release Delay Time (tDELAY) Detection Delay Time (tPHL) Undervoltage Release Delay Timing Chart Calculation of Release Delay Time (tDELAY) at Undervoltage Detection The typical value of the release delay time (tDELAY) with the capacitance of the external capacitor (CD) is calculated in the following equation: tDELAY (s) = 0.73 × CD (F) / (1.8×10-6) tDELAYn is the period until the DOUT pin voltage reaches 2.5 V after the pulse voltage of (VUVDET + VOVDET) /2 V increased from (VUVDET x 0.97) V is supplied to the SENSE pin when DOUT pin is pulled up to 5 V with 100 kΩ. (VUVDET+ VOVDET) /2 V VUVREL VUVDET (VUVDET x 0.97) V 5.0 V SENSE Pin DOUT Pin 2.5 V GND tPHL tDELAY 11 R3154N No. EC-528-210917 At Overvoltage Detection A lower voltage than the overvoltage release voltage (VOVREL) supplied to the SENSE pin triggers charging of the external capacitor (CD capacitance), then the CD pin voltage (VCD) increases. The DOUT pin voltage (VDOUT) maintains “Low” until VCD reaches the CD pin threshold voltage (VTCD). When VCD exceeds VTCD, VDOUT is inverted from “Low” to “High”. The release delay time (tDELAY) is the period from the time the SENSE pin voltage (VSENSE) falls below VOVREL to a rising edge of VDOUT. VDOUT transitions to “High”. VDOUT transitions from “Low” to “High” and it leads to discharging of the CD capacitor. Without the CD capacitor, it becomes the short tDELAY (Typ. 20 μs) depending on the circuit delay and CD pin stray capacity. When the higher voltage than VOVDET is supplied to the SENSE pin, the detection delay time (tPHL), which is the period that VDOUT transitions from “High” to “Low”, remains constant regardless of the capacitance value of the external capacitor. VOVDET VOVREL SENSE pin VTCD CD Pin Voltage GND DOUT Pin GND Detection Delay Time (tPHL) Release Delay Time (tDELAY) Overvoltage Release Delay Timing Chart Calculation of Release Delay Time (tDELAY) at Overvoltage Detection The typical value of the release delay time (tDELAY) with the capacitance of the external capacitor (CD) is calculated in the following equation: tDELAY (s) = 0.73 × CD (F) / (1.8×10-6) tDELAY is the period until the DOUT pin voltage reaches 2.5 V after the pulse voltage of (VUVDET + VOVDET) /2 V decreased from (VOVDET x 1.03) V is supplied to the SENSE pin when DOUT pin is pulled up to 5 V with 100 kΩ. (VOVDET x 1.03) V VOVDET VOVREL (VUVDET+ VOVDET) /2 V SENSE Pin 5.0 V DOUT Pin 2.5 V GND tPHL tDELAY 12 R3154N No. EC-528-210917 Operation Check of Voltage Detection Function with TEST Pin Voltage Detection Function is to set DOUT to “Low” by inputting “Low” to the TEST pin, even when the SENSE pin voltage (VSENSE) is within a range of the release voltage. If the DOUT does not become “Low” even VSENSE is within the release voltage range and “Low” signal is input to the TEST pin, it can be judged that the IC has a fault. To cancel this function, set the TEST pin to “High” voltage or “Open”. When the TEST pin is open, the DOUT becomes “High” with pulled-up voltage in the IC. VSENSE VTEST VOVREL VUVREL VTESTL tDELAY VCD VTCD VDOUT (1) (2) TEST Pin Timing Chart (1) When inputting “Low” to the TEST pin, the DOUT is fixed to “Low” after the detection delay time (Typ. 20 µs) even if the SENSE pin voltage (VSENSE) is within a range of the release voltage. The “Low” signal of TEST pin voltage should be 50 µs or more. (2) When the TEST pin transitions from “Low” to “High”, the DOUT pin outputs “High” after the release delay time (tDELAY). At this time, the TEST pin should maintain “High” for the release delay time or longer. Even when the external capacitor (CD capacitance) is not connected, it should maintain “High” for 50 µs or more. 13 R3154N No. EC-528-210917 APPLICATION INFORMATION The concept of “H” level of TEST pin The R3154 has a voltage regulator (INT regulator) inside the IC. Major functions of the IC are operated by VCC (Typ. 3.3V) generated by INT regulator from input voltage, VDD. TEST pin is pulled up to VCC voltage via 100kΩ as it can be set to open when TEST pin is unused. When the voltage detect function is in use, when input “Low” voltage to TEST pin, then DOUT pin becomes “Low”. But when the voltage detect function is in no use, if “High” voltage is input to TEST pin, the current which is determined by the following equation flows continuously. This makes the supply current increase. (VCC – TEST “High” voltage) /100kΩ (VCC>TEST “High” voltage) Unless there’s a specific reason to avoid an OPEN pin condition, it’s recommended to be left OPEN when TEST pin is not used. As the circuit configuration prevents a reverse current from TEST pin to VCC, even when being used in condition of TEST “High” voltage>VCC, supply current doesn’t increase and VCC voltage doesn’t vary. 14 R3154N No. EC-528-210917 TYPICAL CHARACTERISTICS Note: Typical Characteristics are intended to be used as reference data; they are not guaranteed. 1) UV/OV Detection Release Voltage vs. Temperature VDD = 14 V, VUVSET = 3.3V VOVSET = 3.7 V VOVDET/VOVREL [V] 3.774 UV Release Voltage 3.333 3.300 UV Detection Voltage 3.267 3.234 -40 -25 0 25 50 Ta [ºC] 75 OV Release Voltage -40 -25 0 25 50 Ta [ºC] 75 105 125 VUVDET/VUVREL [V] 0.7650 0.5555 UV Release Voltage 0.7575 0.5500 OV Detection Voltage 0.7500 UV Detection Voltage 0.5445 -40 -25 0 25 50 Ta [ºC] 75 105 125 VUVSET = 3.15V 0.7425 0.7350 OV Release Voltage -40 -25 0 25 50 Ta [ºC] 75 105 125 VOVSET = 3.45 V 3.2130 VOVDET/VOVREL [V] VUVDET/VUVREL [V] 3.5190 UV Release Voltage 3.1815 3.4845 3.1500 OV Detection Voltage 3.4500 UV Detection Voltage 3.1185 3.0870 3.663 VOVSET = 0.75 V 0.5610 0.5390 OV Detection Voltage 3.700 3.626 105 125 VUVSET = 0.55V 3.737 VOVDET/VOVREL [V] VUVDET/VUVREL [V] 3.366 3.4155 -40 -25 0 25 50 Ta [ºC] 75 105 125 3.3810 OV Release Voltage -40 -25 0 25 50 Ta [ºC] 75 105 125 15 R3154N No. EC-528-210917 2) UV/OV Detection Voltage vs. Input Voltage VDD = 14 V, VUVSET = 3.3V 3.366 3.333 3.737 3.300 0 6 105ºC 125ºC 12 18 25ºC 105ºC 125ºC 24 30 Input Voltage VIN [V] 36 42 3.626 Broken Line: Release Voltage 0 6 12 18 24 30 Input Voltage VIN [V] 36 42 VOVSET = 0.75 V 0.5610 0.7650 VOVDET/VOVREL [V] VUVDET/VUVREL [V] Broken Line: Release Voltage 0.5555 0.7575 0.5500 -40ºC 25ºC 105ºC 125ºC 0.7500 0.5445 0 6 12 18 0.7425 -40ºC 25ºC 105ºC 125ºC 24 30 Input Voltage VIN [V] 36 42 VUVSET = 3.15V 0.7350 Broken Line: Release Voltage 0 6 12 18 24 30 Input Voltage VIN [V] 36 42 VOVSET = 3.45 V 3.2130 3.5190 VOVDET/VOVREL [V] VUVDET/VUVREL [V] Broken Line: Release Voltage 3.1815 3.4845 3.1500 -40ºC 25ºC 105ºC 125ºC 3.4500 3.1185 3.0870 25ºC 3.663 -40ºC VUVSET = 0.55V 0.5390 -40ºC 3.700 3.267 3.234 3.774 VOVDET/VOVREL [V] VUVDET/VOVREL [V] Broken Line: Release Voltage VOVSET = 3.7 V 0 6 12 18 3.4155 -40ºC 25ºC 105ºC 125ºC 24 36 30 Input Voltage VIN [V] 42 3.3810 Broken Line: Release Voltage 0 6 12 18 24 30 Input Voltage VIN [V] 36 42 16 R3154N No. EC-528-210917 3) Supply Current vs. Input Voltage VUVSET = 3.3 V / VOVSET = 3.7 V, VSENSE = 3.5V -40ºC 6 Supply Current ISS [μA] Supply Current ISS [μA] 7 4) Supply Current vs. VSENSE VUVSET = 3.3 V / VOVSET = 3.7 V, VDD = 14 V 7 25ºC 5 105ºC 4 125ºC 3 2 1 0 0 6 12 18 24 30 36 Input Voltage VDD [V] 42 6 -40ºC 25ºC 5 105ºC 4 125ºC 3 2 1 0 0 1 2 3 4 5 Input Voltage VSENSE [V] 6 DOUT Voltage VDOUT [V] 5) DOUT Pin Voltage vs. Input Voltage VUVSET = 3.3 V/VOVSET = 3.7 V, VSENSE = 3.5V, Ta = 25ºC 6 5 4 3 2 1 0 0 6 12 18 24 30 36 Input Voltage VDD [V] 42 VUVSET = 0.55 V / VOVSET = 0.75 V 6 DOUT Voltage VDOUT [V] DOUT Voltage VDOUT [V] 6) DOUT Pin Voltage vs. VSENSE VDD = 14 V, Ta = 25ºC, VUVSET = 3.3 V / VOVSET = 3.7 V 5 4 3 2 1 0 0 1 2 3 4 5 Input Voltage VSENSE [V] 6 6 5 4 3 2 1 0 0 1 2 3 4 5 Input Voltage VSENSE [V] 6 17 R3154N 7) Driver Output Current vs. Input Voltage VSENSE = 0 V, DOUT = 0.1 V 8) Driver Output Current vs. DOUT Pin Voltage VSENSE = 0 V, Ta = 25ºC Driver Output Current [mA] Driver Output Current [mA] No. EC-528-210917 6 100 5 4 3 2 1 0 0 6 12 18 -40ºC 25ºC 105ºC 125ºC 24 30 Input Voltage VDD [V] 36 42 80 VDD = 14 V 60 40 VDD = 2.9 V 20 0 0 1 2 3 4 5 6 DOUT Voltage VDOUT [V] 10) Release Delay Time vs. External Capacitor for CD Pin VUVSET = 3.3 V/VOVSET = 3.7 V, VDD = 14 V, CD = 10 nF VUVSET = 3.3 V/VOVSET = 3.7 V, VDD = 14 V, Ta = 25ºC 5.5 100 UV Release 5.0 OV Release 4.5 4.0 -40 -25 0 25 50 Ta [ºC] 75 105 125 Output delay time for Release [ms] 11) Release Delay Time vs. Input Voltage CD = 10 nF VSENSE = 0 V → (VUVSET + VOVSET) / 2 1 0.1 6 5 4 3 2 -40ºC 25ºC 1 105ºC 125ºC 0 6 12 18 24 30 Input Voltage VDD [V] 36 OV Release 0.001 0.001 0.01 0.1 1 CD [nF] 10 100 1000 VSENSE = 5.5 V → (VUVSET + VOVSET) / 2 7 0 UV Release 10 0.01 3.5 3.0 Output delay time for Release [ms] 1000 6.0 42 Output delay time for Release [ms] Output delay time for Release [ms] 9) Release Delay Time vs. Temperature 7 6 5 4 3 2 -40ºC 25ºC 1 105ºC 125ºC 0 0 6 12 18 24 30 Input Voltage VDD [V] 36 42 18 R3154N No. EC-528-210917 VSENSE = 3.5 V → 3.2 V (UV), 3.5 V → 3.81 V (OV) 40 30 OV Detection 20 UV Detection 10 0 -40 -25 0 25 50 Ta [ºC] 75 105 125 Output Delay time for Reset [μs] Output Delay time for Reset [μs] 12) Detection Delay Time vs. Temperature VDD = 14 V, VUVSET = 3.3 V / VOVSET = 3.7 V VSENSE = 3.5 V → 0 V (UV), 3.5 V → 5.5 V (OV) 70 60 OV Detection 50 40 30 20 UV Detection -40 -25 0 25 50 Ta [ºC] 75 105 125 Pulse Width [μs] 13) SENSE Pulse Width vs. Over Drive Voltage VDD = 14 V, VUVSET = 3.3 V / VOVSET = 3.7 V, Ta = 25ºC 180 160 140 120 100 80 60 40 20 0 OV Occurrence of reset signal in the area crossing OV and UV thresholds Over Drive Voltage VOVSET VSENSE Pulse Width VSENSE UV VUVSET 10 100 Over Drive Voltage 1000 Over Drive Voltage [mV] 40 5.5 20 5.0 4.5 10 DOUT Voltage 0 100 200 time [ms] 300 400 0 Input Voltage 15 10 5.5 5 5.0 0 4.5 DOUT Voltage 0 100 200 time [ms] 300 400 Input Voltage VDD [V] 30 20 DOUT Voltage VOUT [V] Input Voltage Input Voltage VDD [V] DOUT Voltage VOUT [V] 14) Load Dump 15) Cranking VUVSET = 3.3V / VOVSET= 3.7V, VSENSE= 3.5V, Ta = 25ºC VUVSET= 3.3V / VOVSET= 3.7V, VSENSE= 3.5V, Ta = 25ºC -5 19 POWER DISSIPATION SOT-23-6 PD-SOT-23-6-(125150)-JE-A The power dissipation of the package is dependent on PCB material, layout, and environmental conditions. The following measurement conditions are based on JEDEC STD. 51-7. Measurement Conditions Item Measurement Conditions Environment Mounting on Board (Wind Velocity = 0 m/s) Board Material Glass Cloth Epoxy Plastic (Four-Layer Board) Board Dimensions 76.2 mm × 114.3 mm × 0.8 mm Copper Ratio Outer Layer (First Layer): Less than 95% of 50 mm Square Inner Layers (Second and Third Layers): Approx. 100% of 50 mm Square Outer Layer (Fourth Layer): Approx. 100% of 50 mm Square Through-holes  0.3 mm × 7 pcs Measurement Result (Ta = 25°C, Tjmax = 150°C) Item Measurement Result Power Dissipation 830 mW Thermal Resistance (ja) ja = 150°C/W Thermal Characterization Parameter (ψjt) ψjt = 51°C/W ja: Junction-to-Ambient Thermal Resistance ψjt: Junction-to-Top Thermal Characterization Parameter 1000 900 830 Power Dissipation PD (mW) 800 700 600 500 400 300 200 100 0 0 25 50 75 100 Ambient Temperature (°C) 125 150 Power Dissipation vs. Ambient Temperature Measurement Board Pattern i PACKAGE DIMENSIONS SOT-23-6 DM-SOT-23-6-JE-B 2.9±0.2 +0.2 1.1-0.1 1.9±0.2 4 1 2 0 to 0.1 0.2MIN. 5 +0.2 1.6-0.1 6 0.8±0.1 (0.95) 2.8±0.3 (0.95) 3 +0.1 0.4-0.2 +0.1 0.15-0.05 Unit : mm SOT-23-6 Package Dimensions (Unit: mm) i 1. The products and the product specifications described in this document are subject to change or discontinuation of production without notice for reasons such as improvement. Therefore, before deciding to use the products, please refer to Ricoh sales representatives for the latest information thereon. 2. The materials in this document may not be copied or otherwise reproduced in whole or in part without prior written consent of Ricoh. 3. Please be sure to take any necessary formalities under relevant laws or regulations before exporting or otherwise taking out of your country the products or the technical information described herein. 4. The technical information described in this document shows typical characteristics of and example application circuits for the products. The release of such information is not to be construed as a warranty of or a grant of license under Ricoh's or any third party's intellectual property rights or any other rights. 5. The products in this document are designed for automotive applications. However, when using the products for automotive applications, please make sure to contact Ricoh sales representative in advance due to confirming the quality level. 6. We are making our continuous effort to improve the quality and reliability of our products, but semiconductor products are likely to fail with certain probability. In order to prevent any injury to persons or damages to property resulting from such failure, customers should be careful enough to incorporate safety measures in their design, such as redundancy feature, fire containment feature and fail-safe feature. We do not assume any liability or responsibility for any loss or damage arising from misuse or inappropriate use of the products. 7. Anti-radiation design is not implemented in the products described in this document. 8. The X-ray exposure can influence functions and characteristics of the products. Confirm the product functions and characteristics in the evaluation stage. 9. WLCSP products should be used in light shielded environments. The light exposure can influence functions and characteristics of the products under operation or storage. 10. There can be variation in the marking when different AOI (Automated Optical Inspection) equipment is used. In the case of recognizing the marking characteristic with AOI, please contact Ricoh sales or our distributor before attempting to use AOI. 11. Please contact Ricoh sales representatives should you have any questions or comments concerning the products or the technical information. Halogen Free Ricoh is committed to reducing the environmental loading materials in electrical devices with a view to contributing to the protection of human health and the environment. Ricoh has been providing RoHS compliant products since April 1, 2006 and Halogen-free products since April 1, 2012. 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