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MCH155A181JK

MCH155A181JK

  • 厂商:

    ROHM(罗姆)

  • 封装:

    0402

  • 描述:

    180 pF ±5% 50V 陶瓷电容器 C0G,NP0 0402(1005 公制)

  • 数据手册
  • 价格&库存
MCH155A181JK 数据手册
MCH15 Ceramic capacitors Multi-layer ceramic chip capacitors MCH15 (1005 (0402) size, chip capacitor) !External dimensions (Units : mm) !Features 1) Small size (1.0 x 0.5 x 0.5 mm) makes it perfect for lightweight portable devices. 2) Comes packed either in tape to enable automatic mounting or in bulk cases. 3) Precise uniformity of shape and dimensions facilitates highly efficient automatic mounting. 4) Barrier layer and end terminations to improve solderability. 0.1Min. 0.3Min. 0.5±0.05 0.5±0.05 0.5±0.05 1.0±0.05 0.5±0.05 !Structure External electrode ΙΙΙ (coating layer) Internal electrode Ceramic element External electrode ΙΙ (barrier layer) External electrode Ι (thick membrane layer) !Product designation Basic ordening unit (pcs.) Code Product thickness Packaging specifications Reel K 0.5mm Paper tape (width 8 mm, pitch 2 mm) φ180mm (7in.) 10,000 L 0.5mm Paper tape (width 8 mm, pitch 2 mm) φ330mm (13in.) 50,000 C 0.5mm Bulk case − 50,000 Reel (φ180, φ330mm) : compatible with EIAJ ET-7200A Bulk case: compatible with EIAJ ET-7201A Part No. M C H Rated voltage Code Voltage 2 25V 3 16V 5 50V Packaging style 1 5 5 F N 1 0 3 Z K Nominal Capacitance tolerance Capacitance-temperature characteristics Code Code Operating temperature (°C) Temp. coefficient or percent change capacitance Code tolerance A CG(C0G) 0±30ppm/°C −55~+125 C ± 0.25pF (0.5 ~ 5pF) CN R −55~+125 ±15% D ± 0.5pF (5.1 ~ 10pF) 3-digit designation J ± 5% (11pF or more) B −25~+85 ±10% according to IEC (X7R) (−55~+125) (±15%) K ± 10% FN F −25~+85 +30%,−80% (Y5V) (+22%,−82%) (−30~+85) Z + 80%, −20% ∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification. MCH15 Ceramic capacitors !Capacitance range For thermal compensation Part number Capacitance (pF) Temperature characteristics Rated voltage (V) Tolerance MCH15 Part number A (CG) (C0G) Capacitance (pF) 50V 47 51 56 1.1 1.2 1.3 62 68 75 1.5 1.6 1.8 82 91 100 C ( ± 0.25pF) 110 120 130 2.7 3 3.3 150 160 180 3.6 3.9 4 200 220 240 4.3 4.7 5 270 300 330 5.1 5.6 6 360 390 430 6.2 6.8 7 470 510 560 7.5 8 8.2 D ( ± 0.5pF) Rated voltage (V) Tolerance 0.5 0.75 1 2 2.2 2.4 Temperature characteristics MCH15 A (CG) (C0G) 50V J ( ± 5%) Product thickness (mm) 0.5 ± 0.05 9 9.1 10 11 12 13 15 16 18 20 22 24 J ( ± 5%) 27 30 33 36 39 43 ∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification. MCH15 Ceramic capacitors High dielectric constant Part number Capacitance (pF) MCH15 Temperature characteristics Rated voltage (V) Tolerance CN (R) (B) (X7R) 50V 16V K ( ±10%) FN (F) (Y5V) 50V 25V 16V Z ( +80, −20%) 220 270 330 390 470 560 680 820 1,000 1,200 1,500 1,800 2,200 2,700 3,300 3,900 4,700 5,600 6,800 8,200 10,000 (0.01µF) 12,000 15,000 18,000 22,000 27,000 33,000 39,000 47,000 56,000 68,000 82,000 100,000 (0.1µF) 120,000 150,000 180,000 220,000 270,000 330,000 390,000 470,000 560,000 Product thickness (mm) 0.5 ± 0.05 ∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification. MCH15 Ceramic capacitors !Characteristics Class 1 (For thermal compensation) Temperature characteristics A (CG) (C0G) Item Operating temperature Test methods/conditions (based on JIS C 5102) −55°C ~ 125°C Nominal capacitance (C) Must be within the specified tolerance range. Based on paragraph 7.8 and paragraph 9 Measured at room temperature and standard humidity, Dissipation factor (tanδ) 100/(400+20C)% or less: Less than 30 pF 0.1% or less : 30 pF or larger 1000pF or less Measurement frequency : 1 ± 0.1MHz Measurement voltage : 1 ± 0.1Vrms. Over 1000pF Measurement frequency : 1 ± 0.1kHz Measurement voltage : 1 ± 0.1Vrms. Insulation resistance (IR) Withstanding voltage Temperature characteristics Terminal adherence Appearance Resistance to vibration Rate of capacitance change Dissipation factor (tanδ) Appearance Rate of capacitance change There must be no mechanical damage. Must be within initial tolerance. Must satisfy initial specified value. 10,000MΩ or 500MΩ ⋅ µF, whichever is smaller The temperature coefficients in table 12, paragraph 7.12 are calculated at 20°C and high temperature. Based on paragraph 8.11. 2. Apply 5N for 10 ± 1s in the direction indicated by the arrow. Chip is mounted to a board in the manner shown on the right, subjected to vibration (type A in paragraph 8.2), and measured 24 ± 2 hrs. later. Pressure (5N) Test board Capacitor Board Based on paragraph 8.13 Soldering temperature : 235 ± 5°C Soldering time : 2 ± 0.5s Based on paragraph 8.14. Soldering temperature : 260 ± 5°C Soldering time : 5 ± 0.5s Preheating : 150 ± 10°C for 1 to 2 min. The insulation must not be damaged. ± 2.5% or ± 0.25 pF, whichever is larger. Must satisfy initial specified value. Insulation resistance 10,000MΩ or 500MΩ ⋅ µF, whichever is smaller Rate of capacitance change Based on paragraph 7.1 Apply 300% of the rated voltage for 1 to 5s then measure. There must be no mechanical damage. Dissipation factor (tanδ) Appearance Based on paragraph 7.6 Measurement is made after rated voltage is applied for 60 ± 5s. There must be no mechanical damage. ± 2.5% or ± 0.25 pF, whichever is larger. Insulation resistance Rate of capacitance change Hightemperature load test No detachment or signs of detachment. Must satisfy initial specified value. Appearance Humidity load test Within 0 ± 30ppm/°C Dissipation factor (tanδ) Withstanding voltage Temperature cycling The insulation must not be damaged. At least 3/4 of the surface of the two terminals must be covered with new solder. Solderability Resistance to soldering heat 10,000MΩ or 500MΩ ⋅ µF, whichever is smaller There must be no mechanical damage. ± 7.5% or ± 0.75 pF, whichever is larger. Dissipation factor (tanδ) 0.5% or less Insulation resistance 500MΩ or 25MΩ ⋅ µF, whichever is smaller Appearance There must be no mechanical damage. Rate of capacitance change ± 3.0% or ± 0.3 pF, whichever is larger. Dissipation factor (tanδ) 0.3% or less Insulation resistance 1,000MΩ or 50MΩ ⋅ µF, whichever is smaller Based on paragraph 9.3 Number of cycles : 5 Capacitance measured after 24 ± 2 hrs. Based on paragraph 9.9 Test temperature : 40 ± 2°C Relative humidity : 90% to 95% Applied voltage : rated voltage Test time : 500 to 524 hrs. Capacitance measured after 24 ± 2 hrs. Based on paragraph 9.10 Test temperature : Max. operating temp. Applied voltage : rated voltage × 200% Test time : 1,000 to 1,048 hrs. Capacitance measured after 24 ± 2 hrs. ∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification. MCH15 Ceramic capacitors Class 2 (High dielectric constant) Temperature characteristics CN (R) (B) (X7R) FN (F) (Y5V) −55°C ~ +125°C −30°C ~ +85°C Item Operating temperature Nominal capacitance (C) Dissipation factor (tanδ) Insulation resistance (IR) Withstanding voltage Temperature characteristics Terminal adherence Appearance Resistance to vibration Rate of capacitance change Dissipation factor (tanδ) Solderability Appearance Resistance to soldering heat Within ± 15% + 22, + 82% No detachment or signs of detachment There must be no mechanical damage. Must be within initial tolerance. Must satisfy initial specified value. Within ± 20.0% 10,000MΩ or 500MΩ ⋅ µF, whichever is smaller Rate of capacitance change Within ± 7.5% Within ± 20.0% Insulation resistance 10,000MΩ or 500MΩ ⋅ µF, whichever is smaller Insulation resistance Appearance Rate of capacitance change Dissipation factor (tanδ) Insulation resistance The temperature coefficients in paragraph 7.12, table 8, condition B, are based on measurements carried out at 20°C, with no voltage applied. Based on paragraph 8. 11. 2. Apply 5N for 10 ± 1s in the direction indicated by the arrow. Pressure (5N) Test board Capacitor Chip is mounted to a board in the manner shown on the right, subjected to vibration (type A in paragraph 8.2), and measured 48 ± 4 hrs. later. Board Based on paragraph 8. 13 Soldering temperature : 235 ± 5°C : 2 ± 0.5s Soldering time Based on paragraph 8. 14. Soldering temperature : 260 ± 5°C Soldering time : 5 ± 0.5s Preheating : 150 ± 10°C for 1 to 2 min. The insulation must not be damaged. Must satisfy initial specified value. Dissipation factor (tanδ) Based on paragraph 7.1 Apply 250% of the rated voltage for 1 to 5s then measure. There must be no mechanical damage. Dissipation factor (tanδ) Rate of capacitance change Based on paragraph 7.6 Measurement is made after rated voltage is applied for 60 ± 5s. There must be no mechanical damage. Within ± 5.0% Insulation resistance Appearance Hightemperature load test The insulation must not be damaged. Must satisfy initial specified value. Appearance Humidity load test 10,000MΩ or 500MΩ ⋅ µF, whichever is smaller Dissipation factor (tanδ) Withstanding voltage Temperature cycling Based on paragraph 7.8 Measured at room temperature and standard humidity, Measurement frequency: 1 ± 0.1 kHz 2.5% or less 5.0% or less (when rated voltage is 16V: 3.5% or less) (when rated voltage is 16V: 7.5% or less) Measurement voltage : 1.0 ± 0.2 Vrms. Must be within the specified tolerance range. At least 3/4 of the surface of the two terminals must be covered with new solder. Rate of capacitance change Test methods/conditions (based on JIS C 5102) There must be no mechanical damage. ± 12.5% or less Within ± 30.0% 5.0% or less 7.5% or less (when rated voltage is 16V: 10.0%) 500MΩ or 25MΩ ⋅ µF, whichever is smaller Based on paragraph 9.3 Number of cycles : 5 Capacitance measured after 48 ± 4 hrs. Based on paragraph 9.9 Test temperature : 40 ± 2°C Relative humidity : 90% to 95% Applied voltage : rated voltage Test time : 500 to 524 hrs. Capacitance measured after 48 ± 4 hrs. There must be no mechanical damage. Within ± 10.0% Within ± 30.0% 5.0% or less 7.5% or less (when rated voltage is 16V: 10.0%) Based on paragraph 9.10 Test temperature : Max. operating temp. Applied voltage : rated voltage × 200% Test time : 1,000 to 1,048 hrs. Capacitance measured after 48 ± 4 hrs. 1,000MΩ or 50MΩ ⋅ µF, whichever is smaller ∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification. MCH15 Ceramic capacitors !Packaging specifications (Units : mm) Reel 9.0 ± 0.3 φ180 mm plastic reel t φJ A D φ13 ± 0.2 E C B 11.4 ± 1.0 φ 60 + 1 0 0 φ180 −1.5 Taping F t1 Label position H Pulling direction (Paper taping) 9.5 ± 0.5 φ330 mm plastic reel F H J t t1 Symbol Size A φ80 ± 1 E 8.0 3.5 1.75 2.0 4.0 φ1.5 0.7 0.8 Dimensions ±0.3 ±0.05 ±0.1 ±0.05 ±0.1 +0.1 ±0.05 MAX. 0 φ330 ± 2 D φ13 ± 0.2 C Symbol 13.5 ± 1.0 B 0.65 ±0.1 1.15 ±0.1 1005 Label position EIAJ ET-7200A compliant Bulk case slider 12 shutter 36 110 EIAJ ET-7201 A compliant MCH15 50,000pcs/case ∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification. MCH15 Ceramic capacitors !Electrical characteristics gA (C0G) Characteristics 1000000 4 100000 3 10000 2 1 1000 0 IMPEDANCE (Ω) RATE OF CAPACITANCE CHANGE : (%) 5 −1 −2 −3 −4 −5 −50 0 50 1pF 100 10pF 10 1 100pF 0.1 100 1 10 100 1000 TEMPERATURE (°C) FREQUENCY (MHz) Fig.1 Capacitance-temperature characteristics Fig.2 Impedance-frequency characteristics 10000 gCN (X7R) Characteristics 10000 20 1000 10 0 −20 −30 10 5 −80 −40 0 40 80 120 IMPEDANCE (Ω) 100 −10 Dissipation factor (%) CAPACITANCE CHANGE : (%) 30 10 1 1,000pF 0.1 10,000pF 0.01 0.001 160 1 10 100 1000 10000 FREQUENCY (MHz) TEMPERATURE : (°C) Fig.4 Impedance-frequency characteristics Fig.3 Capacitance-temperature characteristics 10000 20 10 0 −10 −20 −30 −40 −50 −60 −70 −80 1000 60 50 40 30 20 10 −80 −40 0 40 80 120 TEMPERATURE : (°C) Fig.5 Capacitance-temperature characteristics 160 IMPEDANCE (Ω) 100 Dissipation factor (%) CAPACITANCE CHANGE : (%) gFN (Y5V) Characteristics 10 1 1,000pF 0.1 10,000pF 0.01 100,000pF 0.001 1 10 100 1000 10000 FREQUENCY (MHz) Fig.6 Impedance-frequency characteristics ∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification. MCH15 Ceramic capacitors gTemperature cycling test A (C0G) Characteristics (100pF) 0.6 JIS C 5102 9. 3 SAMPLE SIZE : n = 50pcs −55 / +125°C 100cyc 1.0 0 0.5 1 × 1012 0.3 0.2 −2.0 0.1 −3.0 1 × 1011 1 × 1010 0 TESTED INITIAL VALUE Fig.7 Rate of capacitance change TESTED Fig.9 Insulation resistance CN (X7R) Characteristics (1,000pF) 6.0 JIS C 5102 9. 3 SAMPLE SIZE : n = 50pcs −55 / +125°C 100cyc 10.0 JIS C 5102 9. 3 SAMPLE SIZE : n = 50pcs −55 / +125°C 100cyc 5.0 JIS C 5102 9. 3 SAMPLE SIZE : n = 50pcs −55 / +125°C 100cyc 1 × 1012 0 4.0 IIR : (Ω) 5.0 3.0 −5.0 2.0 −10.0 1.0 −15.0 1 × 1011 1 × 1010 0 INITIAL VALUE TESTED INITIAL VALUE Fig.10 Rate of capacitance change 6.0 JIS C 5102 9. 3 SAMPLE SIZE : n = 50pcs −30 / +85°C 100cyc 20.0 TESTED INITIAL VALUE Fig.11 tanδ FN (Y5V) Characteristics (10,000pF) 30.0 TESTED Fig.12 Insulation resistance JIS C 5102 9. 3 SAMPLE SIZE : n = 50pcs −30 / +85°C 100cyc 5.0 JIS C 5102 9. 3 SAMPLE SIZE : n = 50pcs −30 / +85°C 100cyc 1 × 1012 0.0 4.0 IR : (Ω) 10.0 tanδ : (%) RATE OF CAPACITANCE CHANGE : (%) INITIAL VALUE TESTED Fig.8 tanδ tanδ : (%) RATE OF CAPACITANCE CHANGE : (%) 15.0 JIS C 5102 9. 3 SAMPLE SIZE : n = 50pcs −55 / +125°C 100cyc 0.4 −1.0 INITIAL VALUE JIS C 5102 9. 3 SAMPLE SIZE : n = 50pcs −55 / +125°C 100cyc IR : (Ω) 2.0 tanδ : (%) RATE OF CAPACITANCE CHANGE : (%) 3.0 3.0 −10.0 2.0 −20.0 1.0 1 × 1011 0 −30.0 INITIAL VALUE TESTED Fig.13 Rate of capacitance change INITIAL VALUE Fig.14 tanδ TESTED 1 × 1010 INITIAL VALUE TESTED Fig.15 Insulation resistance ∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification. MCH15 Ceramic capacitors gHigh-temperature load test 0.3 −1.0 0.2 −2.0 0.1 1 × 1011 JIS C 5102 9. 10 SAMPLE SIZE : n = 50pcs +125°C 1,000h OVERLOAD : 200% RATED VOLTAGE 0 0 240 420 720 0 1000 240 480 720 1000 1 × 1010 0 240 480 720 1000 TIME (h) TIME (h) TIME (h) Fig.16 Rate of capacitance change Fig.17 tanδ Fig.18 Insulation resistance CN (X7R) Characteristics (1,000pF) 6.0 JIS C 5102 9. 10 SAMPLE SIZE : n = 50pcs +125°C 1,000h OVERLOAD : 200% RATED VOLTAGE 5.0 5.0 0 3.0 2.0 −10.0 1.0 0 240 480 720 1 × 1012 1 × 1011 1 × 1010 0 1000 JIS C 5102 9. 10 SAMPLE SIZE : n = 50pcs +125°C 1,000h OVERLOAD : 200% RATED VOLTAGE 4.0 −5.0 −15.0 JIS C 5102 9. 10 SAMPLE SIZE : n = 50pcs +125°C 1,000h OVERLOAD : 200% RATED VOLTAGE IR : (Ω) 10.0 0 240 480 720 0 1000 240 480 720 1000 TIME (h) TIME (h) TIME (h) Fig.19 Rate of capacitance change Fig.20 tanδ Fig.21 Insulation resistance FN (Y5V) Characteristics (10,000pF) 6.0 JIS C 5102 9. 10 SAMPLE SIZE : n = 50pcs +85°C 1,000h OVERLOAD : 200% RATED VOLTAGE 20.0 1 × 1012 tanδ : (%) 10.0 0.0 −10.0 4.0 3.0 1 × 1011 2.0 −20.0 JIS C 5102 9. 10 SAMPLE SIZE : n = 50pcs +85°C 1,000h OVERLOAD : 200% RATED VOLTAGE 1.0 −30.0 0 240 480 720 1000 JIS C 5102 9. 10 SAMPLE SIZE : n = 50pcs +85°C 1,000h OVERLOAD : 200% RATED VOLTAGE 5.0 IR : (Ω) 30.0 1 × 1012 0.4 IR : (Ω) 0.0 JIS C 5102 9. 10 SAMPLE SIZE : n = 50pcs +125°C 1,000h OVERLOAD : 200% RATED VOLTAGE 0.5 tanδ : (%) 1.0 15.0 RATE OF CAPACITANCE CHANGE : (%) 0.6 JIS C 5102 9. 10 SAMPLE SIZE : n = 50pcs +125°C 1,000h OVERLOAD : 200% RATED VOLTAGE 2.0 −3.0 RATE OF CAPACITANCE CHANGE : (%) A (C0G) Characteristics (100pF) tanδ : (%) RATE OF CAPACITANCE CHANGE : (%) 3.0 0 0 240 480 720 1000 1 × 1010 0 240 480 720 1000 TIME (h) TIME (h) TIME (h) Fig.22 Rate of capacitance change Fig.23 tanδ Fig.24 Insulation resistance ∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification. MCH15 Ceramic capacitors gHumidity load test A (C0G) Characteristics (100pF) 1.0 0.0 −2.0 0.1 480 720 1 × 1010 0 1000 240 480 720 0 1000 240 480 720 1000 TIME (h) TIME (h) TIME (h) Fig.25 Rate of capacitance change Fig.26 tanδ Fig.27 Insulation resistance CN (X7R) Characteristics (1,000pF) 6.0 JIS C 5102 9. 9 SAMPLE SIZE : n = 50pcs +40°C 90 ~ 95%RH 1,000h OVERLOAD : THE RATED VOLTAGE 5.0 0 JIS C 5102 9. 9 SAMPLE SIZE : n = 50pcs +40°C 90 ~ 95%RH 1,000h OVERLOAD : THE RATED VOLTAGE 5.0 3.0 2.0 −10.0 1.0 1 × 1011 0 0 240 480 720 1 × 1012 4.0 −5.0 −15.0 JIS C 5102 9. 9 SAMPLE SIZE : n = 50pcs +40°C 90 ~ 95%RH 1,000h OVERLOAD : THE RATED VOLTAGE IR : (Ω) 10.0 0 1000 240 480 720 1000 1 × 1010 0 240 480 720 1000 TIME (h) TIME (h) TIME (h) Fig.28 Rate of capacitance change Fig.29 tanδ Fig.30 Insulation resistance FN (Y5V) Characteristics (10,000pF) 6.0 JIS C 5102 9. 9 SAMPLE SIZE : n = 50pcs +40°C 90 ~ 95%RH 1,000h OVERLOAD : THE RATED VOLTAGE 20.0 1 × 1012 tanδ : (%) 10.0 0.0 4.0 3.0 −10.0 2.0 −20.0 1.0 −30.0 1 × 1011 JIS C 5102 9. 9 SAMPLE SIZE : n = 50pcs +40°C 90 ~ 95%RH 1,000h OVERLOAD : THE RATED VOLTAGE 0 0 240 480 720 1000 JIS C 5102 9. 9 SAMPLE SIZE : n = 50pcs +40°C 90 ~ 95%RH 1,000h OVERLOAD : THE RATED VOLTAGE 5.0 IR : (Ω) 30.0 1 × 1012 1 × 1011 0 240 tanδ : (%) RATE OF CAPACITANCE CHANGE : (%) 0.3 0.2 0 JIS C 5102 9. 9 SAMPLE SIZE : n = 50pcs +40°C 90 ~ 95%RH 1,000h OVERLOAD : THE RATED VOLTAGE 0.4 −1.0 15.0 JIS C 5102 9. 9 SAMPLE SIZE : n = 50pcs +40°C 90 ~ 95%RH 1,000h OVERLOAD : THE RATED VOLTAGE 0.5 IR : (Ω) 2.0 −3.0 RATE OF CAPACITANCE CHANGE : (%) 0.6 JIS C 5102 9. 9 SAMPLE SIZE : n = 50pcs +40°C 90 ~ 95%RH 1,000h OVERLOAD : THE RATED VOLTAGE tanδ : (%) RATE OF CAPACITANCE CHANGE : (%) 3.0 0 240 480 720 1000 1 × 1010 0 240 480 720 1000 TIME (h) TIME (h) TIME (h) Fig.31 Rate of capacitance change Fig.32 tanδ Fig.33 Insulation resistance ∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification.
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