MCH185A010CK

MCH18 Ceramic capacitors Multi-layer ceramic chip capacitors MCH18 (1608 (0603) size, chip capacitor) !External dimensions (Units : mm) !Features 1) Small size (1.6 x 0.8 x 0.8 mm) makes it perfect for lightweight portable devices. 2) Comes packed either in tape to enable automatic mounting or in bulk cases. 3) Precise uniformity of shape and dimentions highly efficient automatic mounting. 4) Barrier layer and end terminations to improve solderability. 0.15Min. 0.4Min. 0.8±0.1 0.8±0.1 0.8±0.1 1.6±0.1 0.8±0.1 !Structure External electrode ΙΙΙ (coating layer) Internal electrode Ceramic element External electrode ΙΙ (barrier layer) External electrode Ι (thick membrane layer) !Product designation Code Product thickness Packaging specifications Reel Basic ordering (pcs.) K 0.8mm Paper tape (width 8 mm, pitch 4 mm) φ180mm (7in.) 4,000 0.8mm Paper tape (width 8 mm, pitch 4 mm) φ330mm (13in.) L 16,000 C 15,000 0.8mm Bulk case − Ree l(φ180,φ330mm) : compatible with EIAJ ET-7200A Bulk case :compatible with EIAJ ET-7201A Part No. M C H Rated voltage Code Voltage 2 25V 3 16V 5 50V Packaging style 1 8 2 F N 1 0 4 Z K Capacitance-temperature characteristics Nominal Capacitance tolerance Code Code Operating temperature (ºC) Temp. coefficient or percent change capacitance Code tolerance ±30ppm/°C −55~+125 A CG(C0G) C ±0.25pF (0.5 ~ 5pF) D ±0.5pF (5.1 ~ 10pF) R −55~+125 ±15% CN B −25~+85 ±10% 3-digit designation J ±5% (11pF or more) (X7R) (−55~+125) (±15%) according to IEC K ±10% F −25~+85 +30%,−80% FN (Y5V) (+22%,−82%) (−30~+85) Z +80%, −20% ∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification. MCH18 Ceramic capacitors !Capacitance range For thermal compensation Part number. Tolerance Part number. MCH18 Temperature A (CG) (C0G) characteristics Capacitance(pF) Rated voltage (V) 50 Tolerance 0.5 0.75 1 110 120 130 1.1 1.2 1.3 150 160 180 1.5 1.6 1.8 200 220 240 2 2.2 2.4 C ( ± 0.25pF) 270 300 330 2.7 3 3.3 360 390 430 3.6 3.9 4 470 510 560 4.3 4.7 5 620 680 750 5.1 5.6 6 820 910 1,000 6.2 6.8 7 7.5 8 8.2 MCH18 Temperature A (CG) (C0G) characteristics Capacitance (pF) Rated voltage (V) 50 J ( ± 5%) Product thickness (mm) 0.8 ± 0.1 D ( ± 0.5pF) 9 9.1 10 11 12 13 15 16 18 20 22 24 27 30 33 36 39 43 J ( ± 5%) 47 51 56 62 68 75 82 91 100 ∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification. MCH18 Ceramic capacitors High dielectric constant Part number Capacitance(pF) Temperature characteristics Rated voltage (V) Tolerance MCH18 CN (R) (B) (X7R) 50 25 K (±10%) FN (F) (Y5V) 50 25 16 Z (+80%, −20%) 220 270 330 390 470 560 680 820 1,000 1,200 1,500 1,800 2,200 2,700 3,300 3,900 4,700 5,600 6,800 8,200 10,000 (0.01µF) 12,000 15,000 18,000 22,000 27,000 33,000 39,000 47,000 56,000 68,000 82,000 100,000 (0.1µF) 120,000 150,000 180,000 220,000 270,000 330,000 390,000 470,000 560,000 680,000 1,000,000 (1µF) 1,200,000 1,500,000 1,800,000 2,200,000 Product thickness (mm) 0.8 ± 0.1 ∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification. MCH18 Ceramic capacitors !Characteristics Class 1 (For thermal compensation) Temperature characteristics A (CG) (C0G) Item Operating temperature Test methods / conditions (based on JIS C 5102) −55°C ~ +125°C Nominal capacitance (C) Must be within the specified tolerance range. Based on paragraph 7.8 and paragraph 9 Measured at room temperature and standard humidity. Dissipation factor (tan δ ) 100 / (400 + 20C)% or less (Less than 30 pF) 0.1% or less (30 pF or larger) 1000pF or less Measurement frequency : 1± 0.1MHz Measurement voltage : 1± 0.1Vrms. Over 1000pF Measurement frequency : 1± 0.1kHz Measurement voltage : 1± 0.1Vrms. Insulation resistance (IR) 10,000MΩ or 500ΜΩ⋅µF , whichever is smaller Withstanding voltage Temperature characteristics Terminal adherence Appearance Resistance to vibration Rate of capacitance change Dissipation factor (tanδ) Appearance Rate of capacitance change Temperature cycling Hightemperature load test No detachment or signs of detachment. There must be no mechanical damage. Must be within initial tolerance. Must satisfy initial specified value. ± 2.5% or ± 0.25 pF , whichever is larger. Must satisfy initial specified value. Insulation resistance 10,000MΩ or 500ΜΩ⋅µF , whichever is smaller Withstanding voltage The insulation must not be damaged. Appearance There must be no mechanical damage. Rate of capacitance change ± 2.5% ± 0.25 pF , whichever is larger. Dissipation factor (tanδ) Must satisfy initial specified value. Insulation resistance 10,000MΩ or 500ΜΩ⋅µF , whichever is smaller Rate of capacitance change The temperature coefficients in table 12, paragraph 7.12 are calculated at 20°C and high temperature. Based on paragraph 8.11.2 Apply 5N for 10 ± 1s in the direction indicated by the arrow. Pressure (5N) Test board Capacitor Chip is mounted to a board in the manner shown on the right, subjected to vibration (type A in paragraph 8.2), and measured 24 ± 2 hrs. later. Board Based on paragraph 8.13 Soldering temperature : 235 ± 5°C Soldering time : 2 ± 0.5s There must be no mechanical damage. Dissipation factor (tanδ) Appearance Humidity load test Within 0 ± 30ppm / °C At least 3 / 4 of the surface of the two terminals must be covered with new solder. Solderability Resistance to soldering heat The insulation must not be damaged. Based on paragraph 7.6 Measurement is made after rated voltage is applied for 60 ± 5s. Based on paragraph 7.1 Apply 300% of the rated voltage for 1 to 5s then measure. There must be no mechanical damage. ± 7.5% or ± 0.75 pF , whichever is larger. Dissipation factor (tanδ) 0.5% or less Insulation resistance 500MΩ or 25ΜΩ⋅µF , whichever is smaller Appearance There must be no mechanical damage. Rate of capacitance change ± 3.0% or ± 0.3 pF , whichever is larger. Dissipation factor (tanδ) 0.3% or less Insulation resistance 1,000MΩ or 50ΜΩ⋅µF , whichever is smaller Based on paragraph 8.14 Soldering temperature : 260 ± 5°C Soldering time : 5 ± 0.5s Preheating : 150 ± 10°C for 1 to 2 min. Based on paragraph 9.3 Number of cycles : 5 Capacitance measured after 24 ± 2 hrs. Based on paragraph 9.9 Test temperature : 40 ± 2°C Relative humidity : 90% to 95% Applied voltage : rated voltage Test time : 500 to 524 hrs. Capacitance measured after 24 ± 2 hrs. Based on paragraph 9.10 Test temperature : Max. operating temp. Applied voltage : rated voltage × 200% Test time : 1,000 to 1,048 hrs. Capacitance measured after 24 ± 2 hrs. ∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification. MCH18 Ceramic capacitors Class 2 (High dielectric constant) Temperature characteristics CN (R) (B) (X7R) FN (F) (Y5V) −55°C ~ +125°C −30°C ~ +85°C Item Operating temperature Nominal capacitance (C) Dissipation factor (tanδ) Insulation resistance (IR) Withstanding voltage Temperature characteristics Terminal adherence Appearance Resistance to vibration Rate of capacitance change Dissipation factor (tanδ) Solderability Appearance Resistance to soldering heat Within ± 15% + 22, + 82% No detachment or signs of detachment There must be no mechanical damage. Must be within initial tolerance. Must satisfy initial specified value. Within ± 20.0% 10,000MΩ or 500MΩ ⋅ µF, whichever is smaller Withstanding voltage The insulation must not be damaged. Rate of capacitance change Within ± 20.0% Must satisfy initial specified value. Insulation resistance 10,000MΩ or 500MΩ ⋅ µF, whichever is smaller Insulation resistance Appearance Rate of capacitance change Dissipation factor (tanδ) Insulation resistance Based on paragraph 7.1 Apply 250% of the rated voltage for 1 to 5s then measure. The temperature coefficients in paragraph 7.12, table 8, condition B, are based on measurements carried out at 20°C, with no voltage applied. Based on paragraph 8. 11. 2. Apply 5N for 10 ± 1s in the direction indicated by the arrow. Pressure (5N) Test board Capacitor Chip is mounted to a board in the manner shown on the right, subjected to vibration (type A in paragraph 8.2), and measured 48 ± 4 hrs. later. Board Based on paragraph 8. 13 Soldering temperature: 235 ± 5°C : 2 ± 0.5s Soldering time Based on paragraph 8. 14. Soldering temperature : 260 ± 5°C Soldering time : 5 ± 0.5s Preheating : 150 ± 10°C for 1 to 2 min. There must be no mechanical damage. Within ± 7.5% Dissipation factor (tanδ) Dissipation factor (tanδ) Based on paragraph 7.6 Measurement is made after rated voltage is applied for 60 ± 5s. There must be no mechanical damage. Within ± 5.0% Insulation resistance Appearance Hightemperature load test The insulation must not be damaged. Must satisfy initial specified value. Rate of capacitance change Humidity load test 10,000 MΩ or 500 MΩ ⋅ µF, whichever is smaller Dissipation factor (tanδ) Appearance Temperature cycling Based on paragraph 7.8 Measured at room temperature and standard humidity, Measurement frequency: 1 ± 0.1 kHz 2.5% or less 5.0% or less (when rated voltage is 16V: 3.5% or less) (when rated voltage is 16V: 7.5% or less) Measurement voltage : 1.0 ± 0.2 Vrms. Must be within the specified tolerance range. At least 3/4 of the surface of the two terminals must be covered with new solder. Rate of capacitance change Test methods/conditions (based on JIS C 5102) There must be no mechanical damage. ± 12.5% or less Within ± 30.0% 5.0% or less 7.5% or less (when rated voltage is 16V: 10.0%) 500MΩ or 25MΩ ⋅ µF, whichever is smaller Based on paragraph 9.3 Number of cycles : 5 Capacitance measured after 48 ± 4 hrs. Based on paragraph 9.9 Test temperature : 40 ± 2°C Relative humidity : 90% to 95% Applied voltage : rated voltage Test time : 500 to 524 hrs. Capacitance measured after 48 ± 4 hrs. There must be no mechanical damage. Within ± 10.0% Within ± 30.0% 5.0% or less 7.5% or less (when rated voltage is 16V: 10.0%) Based on paragraph 9.10 Test temperature : Max. operating temp. Applied voltage : rated voltage × 200% Test time : 1,000 to 1,048 hrs. Capacitance measured after 48 ± 4 hrs. 1,000MΩ or 50MΩ ⋅ µF, whichever is smaller ∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification. MCH18 Ceramic capacitors !Packaging specifications (Units : mm) Taping Reel A D φ13 ±0.2 E C B F G H (Paper taping) F G H J t φ330 mm plastic reel t1 8.0 3.5 1.75 4.0 2.0 4.0 φ1.5 1.05 1.2 MAX. MAX. ±0.3 ±0.05 ±0.1 ±0.1 ±0.05 ±0.1 +0.1 0 Symbol A Size B 1.0 ±0.1 1.8 ±0.1 1608 13.5 ±1.0 φ80 ±1 E φ13 ±0.2 Dimensions D φ330 ±2 C Symbol Label position Pulling direction 9.5 ±0.5 t1 11.4 ±1.0 φ60 +1 0 φJ 0 φ180 −1.5 9.0 ±0.3 φ180 mm plastic reel t Label position EIAJ ET-7200A compliant Bulk case slider 12 shutter 36 110 EIAJ ET-7201A compliant MCH18 15,000pcs / case ∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification. MCH18 Ceramic capacitors !Electrical characteristics " A (C0G) Characteristics 1000000 4 100000 3 2 10000 1 1000 0 IMPEDANCE (Ω) RATE OF CAPACITANCE CHANGE : (%) 5 −1 −2 −3 −4 −5 100 1pF 10 10pF 1 100pF −50 0 50 0.1 100 1 TEMPERATURE : (°C) 10 100 1000 10000 FREQUENCY (MHz) Fig.1 Capacitance - temperature characteristics Fig.2 Impedance - frequency characteristics "CN (X7R) Characteristics 10000 20 1000 10 0 −20 −30 10 5 −80 −40 0 40 80 120 IMPEDANCE (Ω) 100 −10 Dissipation factor (%) CAPACITANCE CHANGE : (%) 30 10 1 1,000pF 10,000pF 0.1 0.01 100,000pF 0.001 160 1 10 100 1000 TEMPERATURE : (°C) FREQUENCY (MHz) Fig.3 Capacitance - temperature characteristics Fig.4 Impedance - frequency characteristics 10000 20 10 0 −10 −20 −30 −40 −50 −60 −70 −80 −80 10000 1000 60 50 40 30 20 10 −40 0 40 80 120 160 IMPEDANCE (Ω) 100 Dissipation factor (%) CAPACITANCE CHANGE : (%) "FN (Y5V) Characteristics 10 1 1,000pF 0.1 10,000pF 100,000pF 0.01 0.001 1 10 100 1000 TEMPERATURE : (°C) FREQUENCY (MHz) Fig.5 Capacitance - temperature characteristics Fig.6 Impedance - frequency characteristics 10000 ∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification. MCH18 Ceramic capacitors " Temperature cycling test A (C0G) Characteristics (100pF) 0.6 JIS C 5102 9. 3 SAMPLE SIZE : n = 50pcs −55 / +125°C 100cyc 2.0 JIS C 5102 9. 3 SAMPLE SIZE : n = 50pcs −55 / +125°C 100cyc 0.5 0.4 IR : (Ω) 0 0.3 −1.0 0.2 −2.0 0.1 −3.0 1×1011 1×1010 0 INITIAL VALUE TESTED INITIAL VALUE Fig.7 Rate of capacitance change 15.0 INITIAL VALUE TESTED Fig.8 tanδ TESTED Fig.9 Insulation resistance CN (X7R) Characteristics (1,000pF) 6.0 JIS C 5102 9. 3 SAMPLE SIZE : n = 50pcs −55 / +125°C 100cyc 10.0 JIS C 5102 9. 3 SAMPLE SIZE : n = 50pcs −55 / +125°C 100cyc 5.0 JIS C 5102 9. 3 SAMPLE SIZE : n = 50pcs −55 / +125°C 100cyc 1×1012 0 4.0 3.0 −5.0 2.0 −10.0 1.0 −15.0 IR : (Ω) 5.0 tanδ : (%) RATE OF CAPACITANCE CHANGE : (%) JIS C 5102 9. 3 SAMPLE SIZE : n = 50pcs −55 / +125°C 100cyc 1×1012 1.0 tanδ : (%) RATE OF CAPACITANCE CHANGE : (%) 3.0 1×1011 1×1010 0 INITIAL VALUE INITIAL VALUE TESTED TESTED INITIAL VALUE Fig.11 tanδ Fig.10 Rate of capacitance change TESTED Fig.12 Insulation resistance FN (Y5V) Characteristics (10,000pF) 6.0 JIS C 5102 9. 3 SAMPLE SIZE : n = 50pcs −30 / +85°C 100cyc 10.0 0.0 1×1012 3.0 2.0 −20.0 1.0 1×1011 1×1010 0 INITIAL VALUE TESTED Fig.13 Rate of capacitance change JIS C 5102 9. 3 SAMPLE SIZE : n = 50pcs −30 / +85°C 100cyc 4.0 −10.0 −30.0 JIS C 5102 9. 3 SAMPLE SIZE : n = 50pcs −30 / +85°C 100cyc 5.0 IR : (Ω) 20.0 tanδ : (%) RATE OF CAPACITANCE CHANGE : (%) 30.0 INITIAL VALUE Fig.14 tanδ TESTED INITIAL VALUE TESTED Fig.15 Insulation resistance ∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification. MCH18 Ceramic capacitors " High-temperature load test 0.4 0.3 −1.0 0.2 −2.0 0.1 240 480 720 1×1010 1000 480 720 240 0 1000 480 720 1000 TIME (h) Fig.16 Rate of capacitance change Fig.17 tanδ Fig.18 Insulation resistance CN (X7R)Characteristics(1,000pF) 6.0 JIS C 5102 9. 10 SAMPLE SIZE : n = 50pcs +125°C 1,000h OVERLOAD : 200% RATED VOLTAGE JIS C 5102 9. 10 SAMPLE SIZE : n = 50pcs +125°C 1,000h OVERLOAD : 200% RATED VOLTAGE 5.0 3.0 2.0 −10.0 1.0 1×1011 1×1010 0 240 480 720 1×1012 4.0 −5.0 0 JIS C 5102 9. 10 SAMPLE SIZE : n = 50pcs +125°C 1,000h OVERLOAD : 200% RATED VOLTAGE IR : (Ω) tanδ : (%) 0 1000 240 0 480 720 1000 240 0 480 720 1000 TIME (h) TIME (h) TIME (h) Fig.19 Rate of capacitance change Fig.20 tan δ Fig.21 Insulation resistance FN (Y5V) Characteristics (10,000pF) 6.0 JIS C 5102 9. 10 SAMPLE SIZE : n = 50pcs +85°C 1,000h OVERLOAD : 200% RATED VOLTAGE 10.0 0.0 JIS C 5102 9. 10 SAMPLE SIZE : n = 50pcs +85°C 1,000h OVERLOAD : 200% RATED VOLTAGE 5.0 1×1012 4.0 IR : (Ω) 20.0 3.0 1×1011 −10.0 2.0 −20.0 1.0 −30.0 240 0 TIME (h) 5.0 30.0 JIS C 5102 9. 10 SAMPLE SIZE : n = 50pcs +125°C 1,000h OVERLOAD : 200% RATED VOLTAGE TIME (h) 10.0 −15.0 1×1011 0 0 1×1012 IR : (Ω) 0.0 JIS C 5102 9. 10 SAMPLE SIZE : n = 50pcs +125°C 1,000h OVERLOAD : 200% RATED VOLTAGE 0.5 tanδ : (%) 1.0 15.0 RATE OF CAPACITANCE CHANGE : (%) 0.6 JIS C 5102 9. 10 SAMPLE SIZE : n = 50pcs +125°C 1,000h OVERLOAD : 200% RATED VOLTAGE 2.0 −3.0 RATE OF CAPACITANCE CHANGE : (%) A (C0G) Characteristics (100pF) tanδ : (%) RATE OF CAPACITANCE CHANGE : (%) 3.0 JIS C 5102 9. 10 SAMPLE SIZE : n = 50pcs +85°C 1,000h OVERLOAD : 200% RATED VOLTAGE 1×1010 0 0 240 480 720 1000 0 240 480 720 1000 0 240 480 720 1000 TIME (h) TIME (h) TIME (h) Fig.22 Rate of capacitance change Fig.23 tanδ Fig.24 Insulation resistance ∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification. MCH18 Ceramic capacitors " Humidity load test 0.3 −1.0 0.2 −2.0 0.1 240 480 720 0 1000 480 720 1000 1×1010 0 240 480 720 1000 TIME (h) Fig.25 Rate of capacitance change Fig.26 tan δ Fig.27 Insulation resistance CN (X7R) Characteristics (1,000pF) 6.0 JIS C 5102 9. 9 SAMPLE SIZE : n = 50pcs +40°C 90 ~ 95%RH 1,000h OVERLOAD : THE RATED VOLTAGE −10.0 1.0 480 720 1×1012 IR : (Ω) 3.0 2.0 240 1×1011 1×1010 0 1000 JIS C 5102 9. 9 SAMPLE SIZE : n = 50pcs +40°C 90~95%RH 1,000h OVERLOAD : THE RATED VOLTAGE 4.0 −5.0 0 JIS C 5102 9. 9 SAMPLE SIZE : n = 50pcs +40°C 90~95%RH 1,000h OVERLOAD : THE RATED VOLTAGE 5.0 tanδ : (%) 0 0 240 720 480 1000 0 240 480 720 1000 TIME (h) TIME (h) TIME (h) Fig.28 Rate of capacitance change Fig.29 tanδ Fig.30 Insulation resistance FN (Y5V) Characteristics (10,000pF) 6.0 JIS C 5102 9. 9 SAMPLE SIZE : n = 50pcs +40°C 90 ~ 95%RH 1,000h OVERLOAD : THE RATED VOLTAGE 10.0 0.0 JIS C 5102 9. 9 SAMPLE SIZE : n = 50pcs +40°C 90 ~ 95%RH 1,000h OVERLOAD : THE RATED VOLTAGE 5.0 1×1012 4.0 IR : (Ω) 20.0 3.0 1×1011 −10.0 2.0 −20.0 1.0 −30.0 240 TIME (h) 5.0 30.0 JIS C 5102 9. 9 SAMPLE SIZE : n = 50pcs +40°C 90~95%RH 1,000h OVERLOAD : THE RATED VOLTAGE TIME (h) 10.0 −15.0 1×1011 0 0 1×1012 0.4 IR : (Ω) 0.0 JIS C 5102 9. 9 SAMPLE SIZE : n = 50pcs +40°C 90 ~ 95%RH 1,000h OVERLOAD : THE RATED VOLTAGE 0.5 tanδ : (%) 1.0 15.0 RATE OF CAPACITANCE CHANGE : (%) 0.6 JIS C 5102 9. 9 SAMPLE SIZE : n = 50pcs +40°C 90 ~ 95%RH 1,000h OVERLOAD : THE RATED VOLTAGE 2.0 −3.0 RATE OF CAPACITANCE CHANGE : (%) A (C0G) Characteristics (100pF) tanδ : (%) RATE OF CAPACITANCE CHANGE : (%) 3.0 JIS C 5102 9. 9 SAMPLE SIZE : n = 50pcs +40°C 90 ~ 95%RH 1,000h OVERLOAD : THE RATED VOLTAGE 1×1010 0 0 240 480 720 1000 0 240 480 720 1000 0 240 480 720 1000 TIME (h) TIME (h) TIME (h) Fig.31 Rate of capacitance change Fig.32 tanδ Fig.33 Insulation resistance ∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification.