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CL10B474KP8NNNC

CL10B474KP8NNNC

  • 厂商:

    SAMSUNG(三星)

  • 封装:

    0603

  • 描述:

    贴片电容(MLCC) 0603 470nF ±10% 10V X7R

  • 详情介绍
  • 数据手册
  • 价格&库存
CL10B474KP8NNNC 数据手册
Specification of Automotive MLCC (Reference sheet) ● Supplier : Samsung Electro-Mechanics ● Samsung P/N : CL10B103KA8WPNC ● Product : Multi-layer Ceramic Capacitor ● Description : CAP, 10㎋, 25V, ± 10%, X7R, 0603 ● AEC-Q200 Qualified A. Dimension ● Dimension Size 0603 inch L 1.60±0.10 mm W 0.80±0.10 mm T 0.80±0.10 mm BW 0.30±0.20 mm B. Samsung Part Number CL 10 B 103 K A 8 W P N C ① ② ③ ④ ⑤ ⑥ ⑦ ⑧ ⑨ ⑩ ⑪ ① Series Samsung Multi-layer Ceramic Capacitor ② Size 0603 ③ Dielectric (inch code) X7R ④ Capacitance 10 ⑤ Capacitance ± 10% ⑦ Thickness 25 W :0.80±0.10 mm ⑧ Inner electrode Ni, Open Mode Design ㎋ Termination Plating tolerance ⑥ Rated Voltage L : 1.60±0.10 mm V 0.80±0.10 mm Metal-Epoxy Sn 100% (Pb Free) ⑨ Product Automotive ⑩ Special code Normal ⑪ Packaging Cardboard Type, 7" Reel C. Reliability Test and Judgement condition Performance Test items Test condition High Temperature Appearance : No abnormal exterior appearance Unpowered, 1,000hrs @ Max. temperature Exposure Capacitance Change Within ±10 % Measurement at 24±2hrs after test conclusion Tan δ : 0.03 max. IR :More than 10,000 ㏁ or 500 ㏁×㎌ Whichever is smaller Temperature Cycling Appearance : No abnormal exterior appearance Initial Measurement 2* Final Measurement 3* 1,000Cycles Capacitance Change Within ±10 % Initial Measurement 2* Tan δ : 0.03 max. Final Measurement 3* IR : More than 10,000 ㏁ or 500 ㏁×㎌ Measurement at 24±2hrs after test conclusion Whichever is smaller 1 cycle condition : -55+0/-3℃(30±3min) → Room Temp. (1min) → 125+3/-0℃(30±3min) → Room Temp. (1min) Destructive Physical No Defects or abnormalities Per EIA 469 Analysis Humidity Bias Appearance : No abnormal exterior appearance 1,000hrs 85℃/85%RH, Rated Voltage and 1.3~1.5V, Capacitance Change Within ±12.5 % Add 100kohm resistor Tan δ : 0.035 max. Initial Measurement 2* IR :More than 500 ㏁ or 25 ㏁×㎌ Final Measurement 4* Whichever is smaller Measurement at 24±2hrs after test conclusion The charge/discharge current is less than 50mA. High Temperature Appearance : No abnormal exterior appearance 1,000hrs @ 125℃, 200% Rated Voltage, Operating Life Capacitance Change Within ±12.5 % Initial Measurement 2* Tan δ : 0.035 max. Final Measurement 4* IR :More than 1,000 ㏁ or 50 ㏁×㎌ Measurement at 24±2hrs after test conclusion Whichever is smaller The charge/discharge current is less than 50mA. Performance External Visual Test condition No abnormal exterior appearance Microscope (´10) Physical DimensionsWithin the specified dimensions Mechanical Shock Using The calipers Appearance : No abnormal exterior appearance Three shocks in each direction should be applied along Capacitance Change Within ±10 % 3 mutually perpendicular axes of the test specimen (18 shocks) Tan δ, IR : Initial spec. Peak value Duration Wave Velocity 1,500G 0.5ms Half sine 4.7m/sec Initial Measurement 2* Final Measurement 5* Vibration Appearance : No abnormal exterior appearance 5g's for 20min., 12cycles each of 3 orientations, Capacitance Change Within ±10 % Use 8"×5" PCB 0.031" Thick 7 secure points on one long side Tan δ, IR : Initial spec. and 2 secure points at corners of opposite sides. Parts mounted within 2" from any secure point. Test from 10~2,000㎐. Initial Measurement 2* Final Measurement 5* Resistance to Appearance : No abnormal exterior appearance Solder Heat Capacitance Change Within ±10 % preheating : 150℃ for 60~120 sec. Solder pot : 260±5℃, 10±1sec. Tan δ, IR : Initial spec. Initial Measurement 2* Final Measurement 3* Appearance : No abnormal exterior appearance ESD Solderability Capacitance Change Within ±10 % AEC-Q200-002 or ISO/DIS10605 Initial Measurement 2* Tan δ, IR : Initial spec. Final Measurement 4* 95% of the terminations is to be soldered a) Preheat at 155℃ for 4 hours, Immerse in solder for 5s at 245±5℃ evenly and continuously b) Steam aging for 8 hours, Immerse in solder for 5s at 245±5℃ c) Steam aging for 8 hours, Immerse in solder for 120s at 260±5℃ solder : a solution ethanol and rosin Electrical Characterization Capacitance : Within specified tolerance *A capacitor prior to measuring the capacitance is heat treated at Tan δ : 0.025 max. 150 +0/-10℃ for 1hour and maintained in ambient air for 24±2 hours IR(25℃) : More than 10,000 ㏁ or 500 ㏁×㎌ The Capacitance / D.F. should be measured at 25℃, Whichever is smaller 1 ㎑ ± 10%, IR(125℃) More than 1,000 ㏁ or 10 ㏁×㎌ Whichever is smaller Board Flex 1 ± 0.2 Vrms I.R. should be measured with a DC voltage not exceeding Rated Voltage @25℃, @125℃ for 60~120 sec. Dielectric Strength Dielectric Strength : 250% of the rated voltage for 1~5 seconds Appearance : No abnormal exterior appearance Bending to the limit, 3 ㎜ for 60 seconds 1* Capacitance Change Within ±10 % Initial Measurement 2* Final Measurement 5* Terminal Appearance : No abnormal exterior appearance 10 N, for 60 sec. Strength(SMD) Capacitance Change Within ±10 % Initial Measurement 2* Beam Load Destruction value should be exceed Temperature X7R Characteristics From -55 ℃ to 125 ℃, Capacitance change should be within ±15% Final Measurement 5* 20 N Beam speed : 0.5±0.05 ㎜/sec D. Recommended Soldering method : Reflow ( Reflow Peak Temperature : 260 +0/-5℃, 30sec. ), Meet IPC/JEDEC J-STD-020 D Standard *1 : The figure indicates typical specification. Please refer to individual specifications. *2 : Initial measurement : Perform a heat treatment at 150 +0/-10℃ for one hour after soldering process. and then let sit for 24±2 hours at room temperature. Perform the initial measurement. *3 : Final measurement : Let sit for 24±2 hours at room temperature after test conclusion, then measure. *4 : Final measurement : Perform a heat treatment at 150 +0/-10℃ for one hour after soldering process. and then let sit for 24±2 hours at room temperature. Perform the initial measurement. *5 : Final measurement : Let measure within 24 hours at room temperature after test conclusion. Product specifications included in the specifications are effective as of March 1, 2013. Please be advised that they are standard product specifications for reference only. We may change, modify or discontinue the product specifications without notice at any time. So, you need to approve the product specifications before placing an order. Should you have any question regarding the product specifications, please contact our sales personnel or application engineers. ● Disclaimer & Limitation of Use and Application The products listed in this Specification sheet are NOT designed and manufactured for any use and applications set forth below. Please note that any misuse of the products deviating from products specifications or information provided in this Spec sheet may cause serious property damages or personal injury. We will NOT be liable for any damages resulting from any misuse of the products, specifically including using the products for high reliability applications as listed below. If you have any questions regarding this 'Limitation of Use and Application', you should first contact our sales personnel or application engineers. ① ② ③ ④ ⑤ ⑥ ⑦ ⑧ ⑨ ⑩ ⑪ ⑫ Aerospace/Aviation equipment Medical equipment Military equipment Disaster prevention/crime prevention equipment Power plant control equipment Atomic energy-related equipment Undersea equipment Traffic signal equipment Data-processing equipment Electric heating apparatus, burning equipment Safety equipment Any other applications with the same as or similar complexity or reliability to the applications
CL10B474KP8NNNC
物料型号:三星电子的汽车级多层陶瓷电容器,型号为CL10B103KA8WPNC。

器件简介:该电容器符合AEC-Q200标准,具有10nF的电容值,额定电压为25V,公差为±10%,采用X7R介质,0603英寸尺寸。

引脚分配:文档中未明确提供引脚分配信息,但根据0603尺寸,通常为两个端子。

参数特性:电容值为10nF,公差±10%,介质为X7R,内电极材料为镍,采用开放式设计,端子金属-环氧树脂覆盖,无铅锡100%镀层。

功能详解:文档中未提供具体功能详解,但通常这类电容器用于稳定电源电压,滤除噪声等。

应用信息:适用于汽车电子领域。

封装信息:封装尺寸为0603英寸,厚度为0.80±0.10mm,采用纸板盘装,7英寸卷装。
CL10B474KP8NNNC 价格&库存

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CL10B474KP8NNNC
  •  国内价格
  • 20+0.20866
  • 200+0.19427
  • 600+0.17988
  • 3000+0.16549

库存:0