SPECIFICATION
· Supplier : Samsung electro-mechanics
· Product : Multi-layer Ceramic Capacitor
(Reference sheet)
CL10C8R2CB8NNND
· Samsung P/N :
· Description :
CAP, 8.2㎊, 50V, ± 0.25㎊, C0G, 0603
A. Samsung Part Number
CL
10
C
8R2
C
B
8
N
N
N
D
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Samsung Multi-layer Ceramic Capacitor
0603 (inch code)
L: 1.60 ± 0.10 mm
① Series
② Size
③ Dielectric
④ Capacitance
⑤ Capacitance
tolerance
⑥ Rated Voltage
⑦ Thickness
C0G
8.2 ㎊
± 0.25㎊
W: 0.80 ± 0.10 mm
⑧ Inner electrode
Termination
Plating
⑨ Product
⑩ Special
⑪ Packaging
50 V
0.80 ± 0.10 mm
Ni
Cu
Sn 100%
(Pb Free)
Normal
Reserved for future use
Cardboard Type, 13" reel
B. Structure and dimension
Samsung P/N
(Lead Free)
CL10C8R2CB8NNND
Dimension(㎜)
L
W
T
BW
1.60 ± 0.10
0.80 ± 0.10
0.80 ± 0.10
0.30 ± 0.20
C. Samsung Reliability Test and Judgement condition
Performance
Capacitance
Q
Insulation
Resistance
Appearance
Withstanding
Voltage
Temperature
Characteristics
Adhesive Strength
of Termination
Bending Strength
Solderability
Within specified tolerance
564 min
10,000Mohm or 500Mohm×㎌
Whichever is smaller
No abnormal exterior appearance
No dielectric breakdown or
mechanical breakdown
C0G
Test condition
1㎒±10% / 0.5~5Vrms
Rated Voltage
60~120 sec.
Microscop (X10)
300% of the rated voltage
(From -55℃ to 125℃, Capacitance change should be within ±30PPM/℃)
No peeling shall be occur on the
500g×F, for 10±1 sec.
terminal electrode
Capacitance change :
Bending to the limit (1mm)
with 1.0mm/sec.
within ±5% or ±0.5㎊ whichever is larger
More than 75% of terminal surface
SnAg3.0Cu0.5 solder
is to be soldered newly
245±5℃, 3±0.3sec.
(preheating : 80~120℃ for 10~30sec.)
Resistance to
Soldering heat
Vibration Test
Moisture
Resistance
High Temperature
Resistance
Temperature
Cycling
Capacitance change :
Solder pot : 270±5℃, 10±1sec.
within ±2.5% or ±0.25㎊ whichever is larger
Tan δ, IR : initial spec.
Capacitance change :
Amplitude : 1.5mm
within ±2.5% or ±0.25㎊ whichever is larger
Tan δ, IR : initial spec.
Capacitance change :
From 10㎐ to 55㎐ (return : 1min.)
2hours ´ 3 direction (x, y, z)
With rated voltage
within ±7.5% or ±0.75㎊ whichever is larger
Q:
127.33 min
IR :
500Mohm or 25Mohm × ㎌
Whichever is smaller
Capacitance change :
40±2℃, 90~95%RH, 500+12/-0hrs
within ±3% or ±0.3㎊ whichever is larger
Q:
282 min
IR :
1,000Mohm or 50Mohm × ㎌
Whichever is smaller
Capacitance change :
within ±2.5% or ±0.25㎊ whichever is larger
Tan δ, IR : initial spec.
With 200% of the rated voltage
Max. operating temperature
1000+48/-0hrs
1 cycle condition
Min. operating temperature
Max. operating temperature
→
5 cycle test
※ The reliability test condition can be replaced by the corresponding accelerated test condition.
D. Recommended Soldering method :
Reflow ( Reflow Peak Temperature : 260+0/-5℃, 10sec. Max )
Product specifications included in the specifications are effective as of March 1, 2013.
Please be advised that they are standard product specifications for reference only.
We may change, modify or discontinue the product specifications without notice at any time.
So, you need to approve the product specifications before placing an order.
Should you have any question regarding the product specifications,
please contact our sales personnel or application engineers.
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- Disclaimer & Limitation of Use and Application The products listed in this Specification sheet are NOT designed and manufactured for any use
and applications set forth below.
Please note that any misuse of the products deviating from products specifications or information
provided in this Spec sheet may cause serious property damages or personal injury.
We will NOT be liable for any damages resulting from any misuse of the products, specifically
including using the products for high reliability applications as listed below.
If you have any questions regarding this 'Limitation of Use and Application', you should first contact
our sales personnel or application engineers.
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Aerospace/Aviation equipment
Automotive or Transportation equipment (vehicles, trains, ships, etc)
Medical equipment
Military equipment
Disaster prevention/crime prevention equipment
Any other applications with the same as or similar complexity or reliability to the applications
set forth above.
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