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CL21C122JBF1PNE

CL21C122JBF1PNE

  • 厂商:

    SAMSUNG(三星)

  • 封装:

    0805

  • 描述:

    贴片电容(MLCC) 0805 1.2nF ±5% 50V C0G(NP0)

  • 数据手册
  • 价格&库存
CL21C122JBF1PNE 数据手册
Specification of Automotive MLCC (Reference sheet) ● Supplier : Samsung electro-mechanics ● Samsung P/N : CL21C122JBF1PNE ● Product : Multi-layer Ceramic Capacitor ● Description : CAP, 1.2㎋, 50V, ± 5%, C0G, 0805 ● AEC-Q200 Qualified A. Dimension ● Dimension Size 0805 inch L 2.00±0.10 mm W 1.25±0.10 mm T 1.25±0.10 mm BW 0.50+0.20/-0.30 mm B. Samsung Part Number ① Series CL 21 C 122 J B F 1 P N E ① ② ③ ④ ⑤ ⑥ ⑦ ⑧ ⑨ ⑩ ⑪ Samsung Multi-layer Ceramic Capacitor ② Size 0805 ③ Dielectric C0G ④ Capacitance 1.2 ㎋ ⑤ Capacitance ± 5% (inch code) L: 2.00±0.10 mm W: 1.25±0.10 mm ⑧ Inner electrode Ni Termination Cu Plating Sn 100% (Pb Free) tolerance 50 V ⑥ Rated Voltage 1.25±0.10 mm ⑦ Thickness ⑨ Product Automotive ⑩ Special code Normal ⑪ Packaging Embossed Type, 7" Reel C. Reliability Test and Judgement condition High Temperature Performance Appearance : No abnormal exterior appearance Test condition Unpowered, 1,000hrs @ Max. temperature Exposure Capacitance Change : Measurement at 24±2hrs after test conclusion Within ±2.5% or ±0.25㎊ whichever is larger Q: 1,000 min. IR : More than 10,000 ㏁ or 500 ㏁×㎌ Whichever is smaller Temperature Cycling Appearance : No abnormal exterior appearance Capacitance Change : Within ±2.5% or ±0.25㎊ 1,000Cycles Measurement at 24±2hrs after test conclusion whichever is larger Q: 1,000 min. 1 cycle condition : -55+0/-3℃(30±3min) → Room Temp. (1min) IR : More than 10,000 ㏁ or 500 ㏁×㎌ → 125+3/-0℃(30±3min) → Room Temp. (1min) Whichever is smaller Destructive Physical No Defects or abnormalities Per EIA 469 Analysis Humidity Bias Appearance : No abnormal exterior appearance 1,000hrs 85℃/85%RH, Rated Voltage and 1.3~1.5V, Capacitance Change : Add 100kohm resistor Within ±2.5% or ±0.25㎊ whichever is larger Q: 200 min. The charge/discharge current is less than 50mA. IR : More than 500 ㏁ or 25 ㏁×㎌ Whichever is smaller High Temperature Appearance : No abnormal exterior appearance Operating Life Capacitance Change : Q: Measurement at 24±2hrs after test conclusion whichever is larger The charge/discharge current is less than 50mA. 350 min. IR : More than 1,000 ㏁ or 50 ㏁×㎌ Whichever is smaller 1,000hrs @ 125 ℃, 200% Rated Voltage, Within ±3% or ±0.3㎊ External Visual Performance No abnormal exterior appearance Physical Dimensions Within the specified dimensions Mechanical Shock Using The calipers Appearance : No abnormal exterior appearance Three shocks in each direction should be applied along Capacitance Change : 3 mutually perpendicular axes of the test specimen (18 shocks) Within ±2.5% or ±0.25㎊ whichever is larger Q, IR : Vibration Test condition Microscope (´10) Peak value Duration Wave Velocity 1,500G 0.5ms Half sine 4.7m/sec Initial spec. Appearance : No abnormal exterior appearance 5g's for 20min., 12cycles each of 3 orientations, Capacitance Change : Use 8"×5" PCB 0.031" Thick 7 secure points on one long side Within ±2.5% or ±0.25㎊ whichever is larger and 2 secure points at corners of opposite sides. Parts mounted within 2" from any secure point. Test from 10~2,000㎐. Q, IR : Initial spec. Resistance to Appearance : No abnormal exterior appearance Solder Heat Capacitance Change : Within ±2.5% or ±0.25㎊ Preheating : 150℃ for 60~120 sec. Solder pot : 260±5℃, 10±1sec. whichever is larger Q, IR : Initial spec. Appearance : No abnormal exterior appearance ESD Capacitance Change : AEC-Q200-002 or ISO/DIS10605 Within ±2.5% or ±0.25㎊ whichever is larger Q, IR : Solderability Initial spec. 95% of the terminations is to be soldered a) Preheat at 155℃ for 4 hours, Immerse in solder for 5s at 245±5℃ evenly and continuously b) Steam aging for 8 hours, Immerse in solder for 5s at 245±5℃ c) Steam aging for 8 hours, Immerse in solder for 120s at 260±5℃ solder : a solution ethanol and rosin Electrical Capacitance : Within specified tolerance Characterization Q: 1,000 min. IR(25℃) : The Capacitance / D.F. should be measured at 25℃, 1 ㎑ ± 10%, 0.5~5 Vrms More than 100,000 ㏁ or 1,000 ㏁×㎌ I.R. should be measured with a DC voltage not exceeding Whichever is smaller. Rated Voltage @25℃, @125℃ for 60~120 sec. IR(125℃) : More than 10,000 ㏁ or 100 ㏁×㎌ Whichever is smaller. Board Flex Dielectric Strength Dielectric Strength : 300% of the rated voltage for 1~5 seconds Appearance : No abnormal exterior appearance Bending to the limit, Capacitance Change : 3 ㎜ for 60 seconds Within ±5% or ±0.5㎊ whichever is larger Terminal Appearance : No abnormal exterior appearance Strength(SMD) Capacitance Change : 18 N, for 60 sec. Beam Load Destruction value should be exceed 20 N Temperature C0G Characteristics From -55 ℃ to 125 ℃, Capacitance change should be within 0±30ppm/℃ Within ±2.5% or ±0.25㎊ whichever is larger Beam speed : 0.5±0.05 ㎜/sec D. Recommended Soldering method : Reflow ( Reflow Peak Temperature : 260 +0/-5℃, 30sec. ), Meet IPC/JEDEC J-STD-020 D Standard Product specifications included in the specifications are effective as of March 1, 2013. Please be advised that they are standard product specifications for reference only. We may change, modify or discontinue the product specifications without notice at any time. So, you need to approve the product specifications before placing an order. Should you have any question regarding the product specifications, please contact our sales personnel or application engineers.
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