SGM2306A
Elektronische Bauelemente 5A, 30V,RDS(ON) 35mΩ
N-Channel Enhancement Mode Power Mos.FET
RoHS Compliant Product
Description
The SGM2306A utilized advanced processing techniques to achieve the lowest possible on-resistance, extremely efficient and cost-effectiveness device. The SGM2306A is universally used for all commercialindustrial surface mount applications.
SOT-89
Featur es
* Lower On-Resistance * Capable Of 2.5V Gate drive
D
REF. A B C D E F
G
Millimeter Min. Max. 4.4 4.6 4.05 4.25 1.50 1.70 1.30 1.50 2.40 2.60 0.89 1.20
REF. G H I J K L M
S
Millimeter Min. Max. 3.00 REF. 1.50 REF. 0.40 0.52 1.40 1.60 0.35 0.41 5° TYP. 0.70 REF.
Absolute Maximum Ratings
Parameter
Drain-Source Voltage Gate-Source Voltage Continuous Drain Current, VGS @4.5V Continuous Drain Current, VGS @4.5V Pulsed Drain Current
1,2 3 3
Symbol
VD S VG S ID@TA=25 C
o ID@TA=70 C o
Ratings
30
±12 5.0 4.0 20
Unit
V V A A A W
W / oC
o
IDM PD@TA=25 C
o
Total Power Dissipation Linear Derating Factor Operating Junction and Storage Temperature Range
1.5 0.012
Tj, Tstg
-55~+150
C
Thermal Data
Parameter
Thermal Resistance Junction-ambient
3
Symbol
Max. Rthj-a
Ratings
83.3
Unit
o
C /W
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Any changing of specification will not be informed individual
01-Jun-2002 Rev. A
Page 1 of 4
SGM2306A
Elektronische Bauelemente 5A, 30V,RDS(ON) 35mΩ N-Channel Enhancement Mode Power Mos.FET
Electrical Characteristics( Tj=25 C Unless otherwise specified)
Parameter
Drain-Source Breakdown Voltage Breakdown Voltage Temp. Coefficient Gate Threshold Voltage Gate-Source Leakage Current Drain-Source Leakage Current (Tj=25 C ) Drain-Source Leakage Current(Tj=150C)
o o
o
Symbol
BVDSS BVDS/ Tj VGS(th) IGSS IDSS
Min.
30
_
Typ.
_
Max.
_
Unit
V V/ C V nA uA uA
o
Test Condition
VGS=0V, ID=250uA Reference to 25 C, ID=1mA VDS=VGS, ID=250uA VGS=±20V VDS=30V,VGS=0 VDS=24V,VGS=0 VGS=10V, ID=5A
o
0.1
_ _ _ _ _ _ _ _
_
0.5
_ _ _ _
1.2
±100
1 25 30 35 50 90
15
_ _
Static Drain-Source On-Resistance
_
RD S ( O N )
_ _
mΩ
VGS=4.5V, ID=5 A VGS=2.5V, ID=2.6A VGS=1.8V, ID=1 A ID=5A VDS=16V VGS= 4.5V
Total Gate Charge2 Gate-Source Charge Gate-Drain ("Miller") Charge Turn-on Delay Time2 Rise Time Turn-off Delay Time Fall Time Input Capacitance Output Capacitance Reverse Transfer Capacitance Forward Transconductance
Qg Qgs Qgd Td(ON) Tr Td(Off) Tf Ciss Coss Crss Gfs
_ _ _ _ _ _ _ _ _ _
8.5 1.5 3.2 6 20 20 3 660 90 70 13
nC
_
_ _ _
VDD=15V ID=5A nS VGS=10V RG=3.3Ω RD=3 Ω
1050
_ _
pF
VGS=0V VDS=25V f=1.0MHz
_
_
S
VDS=5 V, ID=5A
Source-Drain Diode
Parameter
Forward On Voltage 2 Reverse Recovery Time2
Reverse Recovery Change
Symbol
VSD Trr
Min.
_ _
Typ.
_
Max.
1.2
_ _
Unit
V nS nC
Test Condition
IS=1.2A, VGS=0V. IS=5 A, VGS=0V. dl/dt=100A/us
14
7
Q rr
_
Notes: 1. Pulse width limited by Max. junction temperature. 2. Pulse width≦300us, dutycycle≦2%. 3.Surface mounted on FR4 board, t ≦ 0sec. 1
http://www.SeCoSGmbH.com/ Any changing of specification will not be informed individual
01-Jun-2002 Rev. A
Page 2 of 4
SGM2306A
Elektronische Bauelemente
5A, 30V,RDS(ON) 35mΩ N-Channel Enhancement Mode Power Mos.FET
Characteristics Curve
Fig 1. Typical Output Characteristics
Fig 2. Typical Output Characteristics
Fig 3. On-Resistance v.s. Gate Voltage
Fig 4. Normalized On-Resistance v.s. Junction Temperature
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Fig 5. Forward Characteristics of Reverse Diode
Fig 6. Gate Threshold Voltage v.s. Junction Temperature
Any changing of specification will not be informed individual
01-Jun-2002 Rev. A
Page 3 of 4
SGM2306A
Elektronische Bauelemente
5A, 30V,RDS(ON) 35mΩ N-Channel Enhancement Mode Power Mos.FET
Fig 7. Gate Charge Characteristics
Fig 8. Typical Capacitance Characteristics
Fig 9. Maximum Safe Operating Area
Fig 10. Effective Transient Thermal Impedance
Fig 11. Switching Time Waveform
Fig 12. Gate Charge Waveform
http://www.SeCoSGmbH.com/
Any changing of specification will not be informed individual
01-Jun-2002 Rev. A
Page 4 of 4
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