SSD15N10
Elektronische Bauelemente 15A, 100V, RDS(ON) 100m N-Ch Enhancement Mode Power MOSFET
RoHS Compliant Product A suffix of “-C” specifies halogen free
DESCRIPTION
The SSD15N10 provide the designer with the best combination of fast switching. The TO-252 package is universally preferred for all commercial-industrial surface mount applications. The device is suited for charger, industrial and consumer environment.
TO-252(D-Pack)
FEATURES
RDS(on) ≦ 100m @ VGS = 10V Super high density cell design for extremely low RDS(on) Exceptional on-resistance and maximum DC current capability
A B
C D
GE
K
HF
PACKAGE INFORMATION
Package TO-252 MPQ 2.5K Leader Size 13’ inch
N O P
M
J
REF.
A B C D E F G H
Millimeter Min. Max. 6 .4 6.8 5.20 5.50 2.20 2.40 0.45 0.58 6.8 7.3 2.40 3.0 5.40 6.2 0 .8 1.20
REF.
J K M N O P
Millimeter Min. Max. 2.30 REF. 0.70 0.90 0.50 1.1 0.9 1 .6 0 0.15 0.43 0.58
2
Drain
1
Gate
3
Source
ABSOLUTE MAXIMUM RATINGS (TA = 25°C unless otherwise specified)
Parameter
Drain-Source Voltage Gate-Source Voltage Continuous Drain Current Pulsed Drain Current Power Dissipation
1
Symbol
VDS VGS TC=25° C TC=70° C ID IDM TC=25° C TA=25° C PD TJ, TSTG
Ratings
100 ±20 15 13.8 60 44.6 2 -55 ~ 150
Unit
V V A A A W W ° C
Operating Junction and Storage Temperature Range
Thermal Resistance Ratings Maximum Thermal Resistance Junction-Ambient (PCB 3 mount)
http://www.SeCoSGmbH.com/
RθJA RθJC
62.5
° /W C
Maximum Thermal Resistance Junction-Case
2.8 changes of specification will°not /be informed individually. CW Any
25-Apr-2011 Rev. A
Page 1 of 4
SSD15N10
Elektronische Bauelemente 15A, 100V, RDS(ON) 100m N-Ch Enhancement Mode Power MOSFET
ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise specified)
Parameter
Drain-Source Breakdown Voltage Gate Threshold Voltage Gate-Source Leakage Current Drain-Source Leakage Current Static Drain-Source On-Resistance Total Gate Charge
2 2
Symbol
BVDSS VGS(th) IGSS IDSS RDS(ON) Qg Qgs Qgd Td(on) Tr Td(off) Tf Ciss Coss Crss Rg
Min.
100 1.0 -
Typ.
80 13 4.6 7.6 14 33 39 5 840 115 80 0.9
Max.
2.5 ±100 1 100 -
Unit
V V nA µA m
Test conditions
VGS=0, ID=250µA VDS=VGS, ID=250µA VGS= ±20V VDS=80V, VGS=0 VGS=10V, ID=8A
Gate-Source Charge Gate-Drain (“Miller”) Change Turn-on Delay Time Rise Time Turn-off Delay Time Fall Time Input Capacitance Output Capacitance Reverse Transfer Capacitance Gate Resistance
2
nC
ID=10A VDS=80V VGS=4.5V
nS pF
VDS=50V ID= 10A VGS=10V RL= 5Ω RG= 1Ω
VGS=0 VDS=25V f=1.0MHz f=1.0MHz
Source-Drain Diode
Forward On Voltage
2
VSD
-
-
1.2
V
IS=8.0A, VGS=0V
Notes: 1. Pulse width limited by maximum junction temperature. 2. Pulse test. 3. Surface Mounted on 1 in2 copper pad of FR4 Board.
http://www.SeCoSGmbH.com/
Any changes of specification will not be informed individually.
25-Apr-2011 Rev. A
Page 2 of 4
SSD15N10
Elektronische Bauelemente 15A, 100V, RDS(ON) 100m N-Ch Enhancement Mode Power MOSFET
CHARACTERISTICS CURVE
http://www.SeCoSGmbH.com/
Any changes of specification will not be informed individually.
25-Apr-2011 Rev. A
Page 3 of 4
SSD15N10
Elektronische Bauelemente 15A, 100V, RDS(ON) 100m N-Ch Enhancement Mode Power MOSFET
CHARACTERISTICS CURVE
http://www.SeCoSGmbH.com/
Any changes of specification will not be informed individually.
25-Apr-2011 Rev. A
Page 4 of 4
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