SSD50P03-09D
Elektronische Bauelemente 61A, -30V, RDS(ON) 9mΩ P-Ch Enhancement Mode Power MOSFET
RoHS Compliant Product A suffix of “-C” specifies halogen free
DESCRIPTION
These miniature surface mount MOSFETs utilize high cell density process. Low RDS(on) assures minimal power loss and conserves energy, making this device ideal for use in power management circuitry. Typical applications are PWMDC-DC converters, power management in portable and battery-powered products such as computers, printers, battery charger, telecommunication power system, and telephones power system.
TO-252(D-Pack)
A B
C D
FEATURES
Low RDS(on) provides higher efficiency and extends battery life. Miniature TO-252 surface mount package saves board space. High power and current handling capability. Extended VGS range (±25) for battery pack applications.
GE
K M J
HF
N O P
REF.
PACKAGE INFORMATION
Package TO-252 MPQ 2.5K LeaderSize 13’ inch
A B C D E F G H
Millimeter Min. Max. 6.4 6.8 5.20 5.50 2.20 2.40 0.45 0.58 6.8 7.3 2.40 3.0 5.40 6.2 0.8 1.20
REF.
J K M N O P
Millimeter Min. Max. 2.30 REF. 0.70 0.90 0.50 1.1 0.9 1.6 0 0.15 0.43 0.58
Drain
Gate
Source
ABSOLUTE MAXIMUM RATINGS (TA = 25°C unless otherwise specified) PARAMETER
Drain-Source Voltage Gate-Source Voltage Continuous Drain Current Pulsed Drain Current
2 1 1
SYMBOL
VDS VGS ID @TA=25℃ IDM IS PD @TA=25℃ TJ, TSTG RθJA RθJC
RATINGS
-30 ±25 61 ±40 -30 50 -55 ~ 175 50 3.0
UNIT
V V A A A W °C °C / W °C / W
Continuous Source Current (Diode Conduction) Total Power Dissipation
1
Operating Junction and Storage Temperature Range Maximum Thermal Resistance Junction-Ambient 1 Maximum Thermal Resistance Junction-Case
Notes: 1 Surface Mounted on 1” x 1” FR4 Board. 2 Pulse width limited by maximum junction temperature.
http://www.SeCoSGmbH.com/
THERMAL RESISTANCE RATINGS
Any changes of specification will not be informed individually.
02-Dec-2010 Rev.A
Page 1 of 2
SSD50P03-09D
Elektronische Bauelemente 61A, -30V, RDS(ON) 9mΩ P-Ch Enhancement Mode Power MOSFET
ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise specified) PARAMETER
Gate-Threshold Voltage Gate-Body Leakage Zero Gate Voltage Drain Current On-State Drain Current 1 Drain-Source On-Resistance 1 Forward Transconductance Diode Forward Voltage
1
SYMBO MIN. TYP. MAX. UNIT Static
VGS(th) IGSS IDSS ID(on) RDS(ON) gfs VSD -1 -41 31 -0.7 ±100 -1 -5 9 13 nA μA A mΩ S V
TEST CONDITIONS
VDS= VGS, ID = -250 μA VDS = 0V, VGS= ±25V VDS= -24V, VGS= 0V VDS= -24V, VGS=0V, TJ=55°C VDS = -5V, VGS= -10V VGS= -10V, ID= -61A VGS= -4.5V, ID= -51A VDS= -15V, ID= -61A IS= -41 A, VGS= 0 V
Dynamic 2
Total Gate Charge Gate-Source Charge Gate-Drain Charge Qg Qgs Qgd 37 10 14.5 nC VDS = -15 V VGS = -4.5 V ID = -61 A
Switching
Turn-on Delay Time Rise Time Turn-off Delay Time Fall Time Td(on) Tr Td(off) Tf 15 12 62 46 nS VDD= -15 V ID= -41 A VGEN = -10 V RL= 15 RG= 6
Notes 1 Pulse test:Pulse width ≦ 300 μs, duty cycle ≦ 2%. 2 Guaranteed by design, not subject to production testing.
http://www.SeCoSGmbH.com/
Any changes of specification will not be informed individually.
02-Dec-2010 Rev.A
Page 2 of 2
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