1N4148D2B

SILICON EPITAXIAL PLANAR DIODE 1N4148D2A / 1N4148D2B • • • • • • Low Leakage Fast Switching Low Forward Voltage Hermetic Ceramic Surface Mount Package Suitable for general purpose, switching applications. Space Level and High-Reliability Screening Options Available ABSOLUTE MAXIMUM RATINGS (TA = 25°C unless otherwise stated) VBR VRWM IO IFSM TJ Tstg Breakdown Voltage Working Peak Reverse Voltage (1) Average Rectified Output Current, TA = 75°C Surge Current, half sine wave, tp = 8.3ms(2) Junction Temperature Range Storage Temperature Range 100V 75V 200mA 2A -65 to +200°C -65 to +200°C (1) IO is rated at 200mA @ TA = 75°C for PC boards where thermal resistance from mounting point to ambient is sufficiently controlled where TJ(Max) does not exceed 175°C (2) TA = 25°C @ IO=0 and VRWM for ten 8.3mS surges at 1 minute intervals. Semelab Limited reserves the right to change test conditions, parameter limits and package dimensions without notice. Information furnished by Semelab is believed to be both accurate and reliable at the time of going to press. However Semelab assumes no responsibility for any errors or omissions discovered in its use. Semelab encourages customers to verify that datasheets are current before placing orders. S emelab Coventry Road, Lutterworth, Leicestershire, LE17 4JB Semelab Limited Telephone +44 (0) 1455 556565 Fax +44 (0) 1455 552612 Email: sales@semelab-tt.com Document Number 8271 Issue 2 Page 1 of 4 Website: http://www.semelab-tt.com SILICON EPITAXIAL PLANAR DIODE 1N4148D2A / 1N4148D2B THERMAL PROPERTIES Symbol RθJA Parameter Thermal Resistance Junction to Ambient Min Typ Max 325 Units °C/W ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise stated) Symbols Parameters Test Conditions IF = 10mA VF Forward Voltage IF = 100mA IF = 10mA (3) Min. Typ. Max. 0.8 1.2 Units TA = 150°C (3) V 0.8 1.3 25 500 nA IF = 100mA VR = 20V IR Reverse Current VR = 75V VR = 20V VR = 75V TA = -55°C TA = 150°C 35 75 µA DYNAMIC CHARACTERISTICS C Capacitance VR = 0V VR = 1.5V IF = IR = 10mA IREC = 1.0mA f = 1.0MHz RL = 100 4.7 4.7 5 ns pF trr Reverse Recovery Time Notes Notes (3) Pulse Width ≤ 300us, δ ≤ 2% S emelab Coventry Road, Lutterworth, Leicestershire, LE17 4JB Semelab Limited Telephone +44 (0) 1455 556565 Fax +44 (0) 1455 552612 Email: sales@semelab-tt.com Website: http://www.semelab-tt.com Document Number 8271 Issue 2 Page 2 of 4 SILICON EPITAXIAL PLANAR DIODE 1N4148D2A / 1N4148D2B MECHANICAL DATA DLCC2 Variant A (D2A) PAD 1 PAD 2 DIMENSION A B C D ANODE CATHODE mm 5.00 ±0.10 2.61 ±0.10 1.08 ±0.10 1.76 ±0.10 Inches 0.197 ±0.004 0.103 ±0.004 0.043 ±0.004 0.069 ±0.004 DLCC2 Variant B (D2B) PAD 1 PAD 2 PAD 3 DIMENSION A B C D ANODE CATHODE LID CONTACT TO ANODE* mm 5.00 ±0.10 2.61 ±0.10 1.08 ±0.10 1.76 ±0.10 Inches 0.197 ±0.004 0.103 ±0.004 0.043 ±0.004 0.069 ±0.004 SOLDER PAD LAYOUT D-5A DLCC2/ D-5A MELF OVERLAY DIMENSION A B C mm 6.25 1.70 2.67 Inches 0.246 0.067 0.105 A B * The additional contact provides a connection to the lid in the application. Connecting the metal lid to a known electrical potential stops deep dielectric discharge in space applications; see the Space Weather link www.semelab.co.uk/dlcc2.html on the Semelab web site. Package variant to be specified at order. Other Package Outlines may be available – Contact Semelab Sales to Enquire S emelab Coventry Road, Lutterworth, Leicestershire, LE17 4JB Semelab Limited Telephone +44 (0) 1455 556565 Fax +44 (0) 1455 552612 Email: sales@semelab-tt.com Website: http://www.semelab-tt.com Document Number 8271 Issue 2 Page 3 of 4 C SILICON EPITAXIAL PLANAR DIODE 1N4148D2A / 1N4148D2B SCREENING OPTIONS Space Level (JQRS/ESA) and High Reliability options are available in accordance with the High Reliability and Screening Options Handbook available for download from the from the TT electronics Semelab web site. ESA Quality Level Products are based on the testing procedures specified in the generic ESCC 5000 and in the corresponding part detail specifications. Semelabs QR216 and QR217 processing specifications (JQRS), in conjunction with the companies ISO 9001:2000 approval present a viable alternative to the American MILPRF-19500 space level processing. QR217 (Space Level Quality Conformance) is based on the quality conformance inspection requirements of MIL-PRF19500 groups A (table V), B (table VIa), C (table VII) and also ESA / ESCC 5000 (chart F4) lot validation tests. QR216 (Space Level Screening) is based on the screening requirements of MIL-PRF-19500 (table IV) and also ESA /ESCC 5000 (chart F3). JQRS parts are processed to the device data sheet and screened to QR216 with conformance testing to Q217 groups A and B in accordance with MIL-STD-750 methods and procedures. Additional conformance options are available, for example Pre-Cap Visual Inspection, Buy-Off Visit or Data Packs. These are chargeable and must be specified at the order stage (See Ordering Information). Minimum order quantities may apply. Alternative or additional customer specific conformance or screening requirements would be considered. Contact Semelab sales with enquires. ORDERING INFORMATION Part numbers are built up from Type, Package Variant, and screening level. The part numbers are extended to include the additional options as shown below. Type – Main Part Number Package Variant – See Mechanical Data Screening Level – See Screening Options (ESA / JQRS) Additional Options: Customer Pre-Cap Visual Inspection Customer Buy-Off visit Data Pack Solderability Samples Scanning Electron Microscopy Radiography (X-ray) Total Dose Radiation Test MIL-PRF-19500 (QR217) Group B charge Group B destructive mechanical samples Group C charge Group C destructive electrical samples Group C destructive mechanical samples ESA/ESCC Lot Validation Testing (subgroup 1) charge LVT1 destructive samples (environmental) LVT1 destructive samples (mechanical) Lot Validation Testing (subgroup 2) charge LVT2 endurance samples (electrical) Lot Validation Testing (subgroup 3) charge LVT3 destructive samples (mechanical) .CVP .CVB .DA .SS .SEM .XRAY .RAD .GRPB .GBDM (12 pieces) .GRPC .GCDE (12 pieces) .GCDM (6 pieces) .LVT1 .L1DE (15 pieces) .L1DM (15 pieces) .LVT2 .L2D (15 pieces) .LVT3 .L3D (5 pieces) Additional Option Notes: 1) All ‘Additional Options’ are chargeable and must be specified at order stage. 2) When Group B,C or LVT is required, additional electrical and mechanical destructive samples must be ordered 3) All destructive samples are marked the same as other production parts unless otherwise requested. MARKING DETAILS Parts can be laser marked with approximately 7 characters on two lines and always includes cathode identification. Typical marking would include part or specification number, week of seal or serial number subject to available space and legibility. Customer specific marking requirements can be arranged at the time of order. Example Marking: Example ordering information: The following example is for the 1N4148 part with package variant A, JQRS screening, additional Group C conformance testing and a Data pack. Part Numbers: 1N4148D2A-JQRS (Include quantity for flight parts) 1N4148D2A-JQRS.GRPC (chargeable conformance option) 1N4148D2A-JQRS.GCDE (charge for destructive parts) 1N4148D2A-JQRS.GCDM (charge for destructive parts) 1N4148D2A-JQRS.DA (charge for Data pack) Customers with any specific requirements (e.g. marking or screening) may be supplied with a similar alternative part number (there is maximum 20 character limit to part numbers). Contact Semelab sales with enquiries High Reliability and Screening Options Handbook link: http://www.semelab.co.uk/pdf/misc/documents/hirel_and_screening_options.pdf S emelab Coventry Road, Lutterworth, Leicestershire, LE17 4JB Semelab Limited Telephone +44 (0) 1455 556565 Fax +44 (0) 1455 552612 Email: sales@semelab-tt.com Website: http://www.semelab-tt.com Document Number 8271 Issue 2 Page 4 of 4