1N6309BD2A

500mW ZENER DIODES 1N6309BD2A TO 1N6340BD2A • • • DLCC2 Hermetic Ceramic Package Designed as a Drop-In Replacement for “D-5A”/ “A-MELF” Package Standard Zener Voltage Tolerance of ±5% Space Level and High-Reliability Screening Options Available ABSOLUTE MAXIMUM RATINGS (TA = 25°C unless otherwise stated) VZM IZM PT TJ TSTG TSP Reference Voltage Continuous DC Current Total Power Dissipation at Junction Temperature Range Storage Temperature Range Maximum Soldering Pad Temperature for 20s TA = 75°C See Reference Table See Reference Table 500mW -65 to +175°C -65 to +175°C 260°C THERMAL PROPERTIES Symbol RθJA (1) Parameter Thermal Resistance Junction to Ambient Max 300 Units °C/W (1) PCB = FR4 – 0.0625 Inch (1.59mm), 1 Layer, 1.0-Oz Cu, 0.007 Inch2 (1.7mm x 2.76mm2) Pad Size, horizontal, in still air Semelab Limited reserves the right to change test conditions, parameter limits and package dimensions without notice. Information furnished by Semelab is believed to be both accurate and reliable at the time of going to press. However Semelab assumes no responsibility for any errors or omissions discovered in its use. Semelab encourages customers to verify that datasheets are current before placing an order. S emelab Semelab Limited Telephone +44 (0) 1455 556565 Email: sales@semelab-tt.com Coventry Road, Lutterworth, Leicestershire, LE17 4JB Fax +44 (0) 1455 552612 Website: http://www.semelab-tt.com Document Number 9021 Issue 2 Page 1 of 4 500mW ZENER DIODES 1N6309BD2A TO 1N6340BD2A ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise stated) Max Zener Impedance Nominal Zener Voltage @ IZ2 Type (V ) Z2 Volts 1N6309 1N6310 1N6311 1N6312 1N6313 1N6314 1N6315 1N6316 1N6317 1N6318 1N6319 1N6320 1N6321 1N6322 1N6323 1N6324 1N6325 1N6326 1N6327 1N6328 1N6329 1N6330 1N6331 1N6332 1N6333 1N6334 1N6335 1N6336 1N6337 1N6338 1N6339 1N6340 2.4 2.7 3.0 3.3 3.6 3.9 4.3 4.7 5.1 5.6 6.2 6.8 7.5 8.2 9.1 10 11 12 13 15 16 18 20 22 24 27 30 33 36 39 43 47 Minimum Zener Voltage @ IZ1 250 µA (V ) Z1 Volts 1.1 1.2 1.3 1.5 1.8 2 2.4 2.8 3.3 4.3 5.2 6.0 6.6 7.5 8.4 9.1 10 11 11.9 13.8 14.7 16.6 18.5 20.4 22.3 25.2 28 30.9 33.7 36.6 40.4 44.2 Maximum Reverse Current @ VR Voltage (2) Reg. VZ(reg) V 1.5 1.5 1.5 1.6 1.6 1.6 0.9 0.5 0.4 0.4 0.3 0.35 0.4 0.4 0.5 0.5 0.5 0.55 0.55 0.7 0.75 0.85 0.95 1.05 1.15 1.3 1.45 1.6 1.75 1.9 2.1 2.25 Surge Current (IZSM) A 2.5 2.2 2 1.8 1.65 1.5 1.4 1.27 1.17 1.1 0.97 1.23 1.16 1.07 0.97 0.89 0.83 0.77 0.71 0.62 0.58 0.52 0.47 0.43 0.39 0.35 0.31 0.28 0.26 0.24 0.22 0.2 Maximum Noise Density N D µV/√Hz 200 150 100 20 12 12 12 12 12 10 10 50 30 10 10 10 10 10 10 10 10 10 10 10 10 10 10 10 10 10 10 10 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 2 5 5 5 20 40 80 100 100 100 100 100 100 100 100 100 100 100 100 100 100 80 80 Test Current (IZ2) mA 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 9.5 8.5 7.8 7 6.2 5.6 5.2 4.6 4.2 3.8 3.4 3.2 3 2.7 @ IZ 2 (Z ) Z Ω 30 30 29 27 25 23 20 17 14 8 3 3 4 5 6 6 7 7 8 10 12 14 18 20 24 27 32 40 50 55 65 75 @ 250µA (Z ) ZK (IZM) mA (V R) V 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.5 2 2.5 3.5 4 5 6 7 8 8.5 9 9.9 11 12 14 15 17 18 21 23 25 27 30 33 36 @25° C I R1 µA 100 60 30 5 3 2 2 5 5 5 5 2 2 1.0 1.0 1.0 1.0 1.0 0.05 0.05 0.05 0.05 0.05 0.05 0.05 0.05 0.05 0.05 0.05 0.05 0.05 0.05 @150° C I R2 Typical(3) Temp Coefficient αVZ %/° C -0.085 -0.080 -0.075 -0.070 -0.065 -.060 -0.045 +0.020 -.028 +0.032 -0.020 +0.035 +0.050 +0.060 +0.062 +0.068 +0.075 +0.076 +0.079 +0.082 +0.083 +0.083 +0.084 +0.084 +0.085 +0.086 +0.087 +0.088 +0.090 +0.091 +0.092 +0.093 +0.094 +0.095 +0.095 1200 1300 1400 1400 1400 1700 1700 1500 1300 1200 800 400 400 400 500 500 550 550 550 600 600 600 500 500 500 500 500 600 600 700 800 900 177 157 141 128 117 108 99 90 83 76 68 63 57 52 47 43 39 35 33 28 27 24 21 19 18 16 14 13 12 11 9.9 9 SERIES ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise) Symbol VF Note No Note (2) (3) Voltage regulation VZ(reg) is the measured voltage change at thermal equilibrium between the current of 10% and 50% of Maximum Zener current IZM when the pad temperature is maintained at 25°C =+8°C, -2°C. Not a production test. Temp Coefficient is applicable to space product - IZ stabilised at = IZ2 rated, T1 = +25°C ±5°C;T2 = +125°C Coventry Road, Lutterworth, Leicestershire, LE17 4JB Fax +44 (0) 1455 552612 Website: http://www.semelab-tt.com Document Number 9021 Issue 2 Page 2 of 4 Parameters Forward Voltage Test Conditions IF = 200mA Max 1.5 Units V S emelab Semelab Limited Telephone +44 (0) 1455 556565 Email: sales@semelab-tt.com 500mW ZENER DIODES 1N6309BD2A TO 1N6340BD2A MECHANICAL DATA DLCC2 Variant A (D2A) PAD 1 PAD 2 DIMENSION A B C D ANODE CATHODE mm 5.00 ±0.10 2.61 ±0.10 1.08 ±0.10 1.76 ±0.10 Inches 0.197 ±0.004 0.103 ±0.004 0.043 ±0.004 0.069 ±0.004 DLCC2 Variant B (D2B) PAD 1 PAD 2 PAD 3 DIMENSION A B C D ANODE CATHODE LID CONTACT TO ANODE* mm 5.00 ±0.10 2.61 ±0.10 1.08 ±0.10 1.76 ±0.10 Inches 0.197 ±0.004 0.103 ±0.004 0.043 ±0.004 0.069 ±0.004 SOLDER PAD LAYOUT D-5A DLCC2/ D-5A MELF OVERLAY DIMENSION A B C mm 6.25 1.70 2.67 Inches 0.246 0.067 0.105 A B * The additional contact provides a connection to the lid in the application. Connecting the metal lid to a known electrical potential stops deep dielectric discharge in space applications; see the Space Weather link www.semelab.co.uk/dlcc2.html on the Semelab web site. Package variant to be specified at order. Other Package Outlines may be available – Contact Semelab Sales to Enquire S emelab Semelab Limited Telephone +44 (0) 1455 556565 Email: sales@semelab-tt.com Coventry Road, Lutterworth, Leicestershire, LE17 4JB Fax +44 (0) 1455 552612 Website: http://www.semelab-tt.com Document Number 9021 Issue 2 Page 3 of 4 C 500mW ZENER DIODES 1N6309BD2A TO 1N6340BD2A SCREENING OPTIONS Space Level (JQRS/ESA) and High Reliability options are available in accordance with the High Reliability and Screening Options Handbook available for download from the from the TT electronics Semelab web site. ESA Quality Level Products are based on the testing procedures specified in the generic ESCC 5000 and in the corresponding part detail specifications. Semelabs QR216 and QR217 processing specifications (JQRS), in conjunction with the companies ISO 9001:2000 approval present a viable alternative to the American MILPRF-19500 space level processing. QR217 (Space Level Quality Conformance) is based on the quality conformance inspection requirements of MIL-PRF19500 groups A (table V), B (table VIa), C (table VII) and also ESA / ESCC 5000 (chart F4) lot validation tests. QR216 (Space Level Screening) is based on the screening requirements of MIL-PRF-19500 (table IV) and also ESA /ESCC 5000 (chart F3). JQRS parts are processed to the device data sheet and screened to QR216 with conformance testing to Q217 groups A and B in accordance with MIL-STD-750 methods and procedures. Additional conformance options are available, for example Pre-Cap Visual Inspection, Buy-Off Visit or Data Packs. These are chargeable and must be specified at the order stage (See Ordering Information). Minimum order quantities may apply. Alternative or additional customer specific conformance or screening requirements would be considered. Contact Semelab sales with enquires. ORDERING INFORMATION Part numbers are built up from Type, Package Variant, and screening level. The part numbers are extended to include the additional options as shown below. Type – See Electrical Characteristics Table Package Variant – See Mechanical Data Screening Level – See Screening Options (ESA / JQRS) Additional Options: Customer Pre-Cap Visual Inspection Customer Buy-Off visit Data Pack Solderability Samples Scanning Electron Microscopy Radiography (X-ray) Total Dose Radiation Test MIL-PRF-19500 (QR217) Group B charge Group B destructive mechanical samples Group C charge Group C destructive electrical samples Group C destructive mechanical samples ESA/ESCC Lot Validation Testing (subgroup 1) charge LVT1 destructive samples (environmental) LVT1 destructive samples (mechanical) Lot Validation Testing (subgroup 2) charge LVT2 endurance samples (electrical) Lot Validation Testing (subgroup 3) charge LVT3 destructive samples (mechanical) .CVP .CVB .DA .SS .SEM .XRAY .RAD .GRPB .GBDM (12 pieces) .GRPC .GCDE (12 pieces) .GCDM (6 pieces) .LVT1 .L1DE (15 pieces) .L1DM (15 pieces) .LVT2 .L2D (15 pieces) .LVT3 .L3D (5 pieces) Additional Option Notes: 1) All ‘Additional Options’ are chargeable and must be specified at order stage. 2) When Group B,C or LVT is required, additional electrical and mechanical destructive samples must be ordered 3) All destructive samples are marked the same as other production parts unless otherwise requested. MARKING DETAILS Parts can be laser marked with approximately 7 characters on two lines and always includes cathode identification. Typical marking would include part or specification number, week of seal or serial number subject to available space and legibility. Customer specific marking requirements can be arranged at the time of order. Example Marking: Example ordering information: The following example is for the 1N6309B part with package variant A, JQRS screening, additional Group C conformance testing and a Data pack. Part Numbers: 1N6309BD2A-JQRS (Include quantity for flight parts) 1N6309BD2A-JQRS.GRPC (chargeable conformance option) 1N6309BD2A-JQRS.GCDE (charge for destructive parts) 1N6309BD2A-JQRS.GCDM (charge for destructive parts) 1N6309BD2A-JQRS.DA (charge for Data pack) Customers with any specific requirements (e.g. marking or screening) may be supplied with a similar alternative part number (there is maximum 20 character limit to part numbers). Contact Semelab sales with enquiries. High Reliability and Screening Options Handbook link: http://www.semelab.co.uk/pdf/misc/documents/hirel_and_screening_options.pdf S emelab Semelab Limited Telephone +44 (0) 1455 556565 Email: sales@semelab-tt.com Coventry Road, Lutterworth, Leicestershire, LE17 4JB Fax +44 (0) 1455 552612 Website: http://www.semelab-tt.com Document Number 9021 Issue 2 Page 4 of 4