2N4393C1

SILICON SMALL SIGNAL N-CHANNEL JFET 2N4393C1 • • Hermetic Surface Mounted Package. Designed For High Reliability and Space Applications. Screening Options Available. • ABSOLUTE MAXIMUM RATINGS (TA = 25°C unless otherwise stated) VDS VGS VGD IG PD TJ Tstg Drain – Source Voltage Gate – Source Voltage Gate – Drain Voltage Gate Current Total Power Dissipation at Junction Temperature Range Storage Temperature Range 40V -40V -40V 50mA 300mW 2mW/°C -55 to +175°C -65 to +200°C TA = 25°C Derate Above 25°C THERMAL PROPERTIES Symbols RθJA Parameters Thermal Resistance, Junction To Ambient Min. Typ. Max. 500 Units °C/W Semelab Limited reserves the right to change test conditions, parameter limits and package dimensions without notice. Information furnished by Semelab is believed to be both accurate and reliable at the time of going to press. However Semelab assumes no responsibility for any errors or omissions discovered in its use. Semelab encourages customers to verify that datasheets are current before placing orders. S emelab Coventry Road, Lutterworth, Leicestershire, LE17 4JB Semelab Limited Telephone +44 (0) 1455 556565 Fax +44 (0) 1455 552612 Email: sales@semelab-tt.com Document Number 8518 Issue 2 Page 1 of 4 Website: http://www.semelab-tt.com SILICON SMALL SIGNAL N-CHANNEL JFET 2N4393C1 ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise stated) Symbols V(BR)GSS VGS(off) IDSS (1) Parameters Gate – Source Breakdown Voltage Gate – Source Cut-off Voltage Saturation Drain Current Gate Reverse Current Test Conditions VDS = 0V VDS = 20V VDS = 20V VDS = 0V IG = 1.0µA ID = 1.0nA VGS = 0V VGS = -20V TA = 150°C VDS = 20V VGS = -5V TA = 150°C VGS = 0V VGS = 0 ID = 3mA ID = 1.0mA Min. -40 Typ Max. Units V -0.5 5 -3 30 -100 -200 100 200 0.4 100 mA pA nA pA nA V IGSS ID(off) VDS(on) RDS(on) Drain Cut-off Current Drain – Source On Voltage Drain – Source On Resistance DYNAMIC CHARACTERISTICS Ciss Crss RDS(on) ēn tr td(on) tf td(off) (2) Common – Source Input Capacitance Common – Source Reverse Transfer Capacitance Drain – Source On Resistance Equivalent Input Noise Voltage Rise Time Turn-on Delay Time Fall Time Turn-off Delay Time VDS = 20V f = 1.0MHz VDS = 0V f = 1.0MHz VGS = 0 f = 1.0KHz VDG = 10V f = 1.0KHz VGS = 0V VGS = -5V 26 pF 5 100 3 5 nV √Hz ID = 0A ID = 1.0mA VDD = 10V VGS = 0V VGSX = -5V ID(on) = 3mA 15 30 50 ns Notes Notes (1) Pulse Width ≤ 300us, δ ≤ 2% (2) By design only, not a production test. S emelab Coventry Road, Lutterworth, Leicestershire, LE17 4JB Semelab Limited Telephone +44 (0) 1455 556565 Fax +44 (0) 1455 552612 Email: sales@semelab-tt.com Website: http://www.semelab-tt.com Document Number 8518 Issue 2 Page 2 of 4 SILICON SMALL SIGNAL N-CHANNEL JFET 2N4393C1 MECHANICAL DATA Dimensions in mm (inches) 0.51 ± 0.10 (0.02 ± 0.004) 4 R0.31 (0.012) See Package Variant Table 0.76 ± 0.15 (0.03 ± 0.006) 1.02 ± 0.10 (0.04 ± 0.004) 2.54 ± 0.13 (0.10 ± 0.005) 2 1.91 ± 0.10 (0.075 ± 0.004) 3.05 ± 0.13 (0.12 ± 0.005) R (0 0. .0 56 22 ) 1 3 0.31 (0.012) rad. 1.40 (0.055) max. C1 Underside View PACKAGE VARIANT TABLE Variant A B C D Pad 1 Drain Drain Source Source Pad 2 Source Source Drain Drain Pad 3 Gate Gate Gate Gate Pad 4 No Pad (3-Pins Only) Lid Contact * No Pad (3-Pins Only) Lid Contact * * The additional contact provides a connection to the lid in the application. Connecting the metal lid to a known electrical potential stops deep dielectric discharge in space applications; see the Space Weather link www.semelab.co.uk/mil/lcc1_4 on the Semelab web site. Package variant to be specified at order. S emelab Coventry Road, Lutterworth, Leicestershire, LE17 4JB Semelab Limited Telephone +44 (0) 1455 556565 Fax +44 (0) 1455 552612 Email: sales@semelab-tt.com Website: http://www.semelab-tt.com Document Number 8518 Issue 2 Page 3 of 4 SILICON SMALL SIGNAL N-CHANNEL JFET 2N4393C1 SCREENING OPTIONS Space Level (JQRS/ESA) and High Reliability options are available in accordance with the High Reliability and Screening Options Handbook available for download from the from the TT electronics Semelab web site. ESA Quality Level Products are based on the testing procedures specified in the generic ESCC 5000 and in the corresponding part detail specifications. Semelabs QR216 and QR217 processing specifications (JQRS), in conjunction with the companies ISO 9001:2000 approval present a viable alternative to the American MILPRF-19500 space level processing. QR217 (Space Level Quality Conformance) is based on the quality conformance inspection requirements of MIL-PRF19500 groups A (table V), B (table VIa), C (table VII) and also ESA / ESCC 5000 (chart F4) lot validation tests. QR216 (Space Level Screening) is based on the screening requirements of MIL-PRF-19500 (table IV) and also ESA /ESCC 5000 (chart F3). JQRS parts are processed to the device data sheet and screened to QR216 with conformance testing to Q217 groups A and B in accordance with MIL-STD-750 methods and procedures. Additional conformance options are available, for example Pre-Cap Visual Inspection, Buy-Off Visit or Data Packs. These are chargeable and must be specified at the order stage (See Ordering Information). Minimum order quantities may apply. Alternative or additional customer specific conformance or screening requirements would be considered. Contact Semelab sales with enquires. ORDERING INFORMATION Part number is built from part, package variant and screening level. The part number can be extended to include the additional options as shown below. Type – See Electrical Stability Characteristics Table Package Variant – See Mechanical Data Screening Level – See Screening Options (ESA / JQRS) Additional Options: Customer Pre-Cap Visual Inspection Customer Buy-Off visit Data Pack Solderability Samples Scanning Electron Microscopy Radiography (X-ray) Total Dose Radiation Test MIL-PRF-19500 (QR217) Group B charge Group B destructive mechanical samples Group C charge Group C destructive electrical samples Group C destructive mechanical samples ESA/ESCC Lot Validation Testing (subgroup 1) charge LVT1 destructive samples (environmental) LVT1 destructive samples (mechanical) Lot Validation Testing (subgroup 2) charge LVT2 endurance samples (electrical) Lot Validation Testing (subgroup 3) charge LVT3 destructive samples (mechanical) .CVP .CVB .DA .SS .SEM .XRAY .RAD .GRPB .GBDM (12 pieces) .GRPC .GCDE (12 pieces) .GCDM (6 pieces) .LVT1 .L1DE (15 pieces) .L1DM (15 pieces) .LVT2 .L2D (15 pieces) .LVT3 .L3D (5 pieces) Additional Option Notes: 1) All ‘Additional Options’ are chargeable and must be specified at order stage. 2) When Group B,C or LVT is required, additional electrical and mechanical destructive samples must be ordered 3) All destructive samples are marked the same as other production parts unless otherwise requested. MARKING DETAILS Screened parts are typically marked with specification number, serial number (or week of seal) as shown in the example below. All non screened parts are printed with three characters only eg. 22A. Customer specific marking requirements can be arranged at time of order but is approximately limited to two lines of 7 Characters. This is to ensure text remains readable.. Example Marking: Example ordering information: The following example is for the 2N4393C1 part, package variant D, JQRS screening, additional Group C conformance testing and a Data pack. Part Numbers: 2N4393C1D-JQRS (Include quantity for flight parts) 2N4393C1D-JQRS.GRPC (chargeable conformance option) 2N4393C1D-JQRS.GCDE (charge for destructive parts) 2N4393C1D-JQRS.GCDM (charge for destructive parts) 2N4393C1D-JQRS.DA (charge for Data pack) Customers with any specific requirements (e.g. marking, package or screening) may be supplied with a similar alternative part number (there is maximum 20 character limit to part numbers). Contact Semelab sales with all enquiries High Reliability and Screening Options Handbook link: http://www.semelab.co.uk/pdf/misc/documents/hirel_and_screening_options.pdf S emelab Coventry Road, Lutterworth, Leicestershire, LE17 4JB Semelab Limited Telephone +44 (0) 1455 556565 Fax +44 (0) 1455 552612 Email: sales@semelab-tt.com Document Number 8518 Issue 2 Page 4 of 4 Website: http://www.semelab-tt.com