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HFS12N65S

HFS12N65S

  • 厂商:

    SEMIHOW

  • 封装:

    TO-220F-3

  • 描述:

    类型:N沟道;漏源电压(Vdss):650V;连续漏极电流(Id):12A;功率(Pd):51W;导通电阻(RDS(on)@Vgs,Id):780mΩ@10V,6A;阈值电压(Vgs(th)@Id):...

  • 数据手册
  • 价格&库存
HFS12N65S 数据手册
HFS12N65S Aug 2009 BVDSS = 650 V HFS12N65S 650V N-Channel MOSFET FEATURES  Originative New Design  Superior Avalanche Rugged Technology  Robust Gate Oxide Technology  Very Low Intrinsic Capacitances  Excellent Switching Characteristics  Unrivalled Gate Charge : 38 nC (Typ.)  Extended Safe Operating Area  Lower RDS(ON) : 0.67 Ω (Typ.) @VGS=10V  100% Avalanche Tested RDS(on) typ = 0.67 Ω ID = 12 A TO-220F 1 2 3 1.Gate 2. Drain 3. Source Absolute Maximum Ratings Symbol VDSS ID IDM VGS EAS IAR EAR dv/dt PD TJ, TSTG TL Drain-Source Voltage Drain Current Drain Current Drain Current Gate-Source Voltage TC=25℃ unless otherwise specified Parameter – Continuous (TC = 25℃) – Continuous (TC = 100℃) – Pulsed (Note 1) Value 650 12* 7.4* 48* ±30 (Note 2) (Note 1) (Note 1) (Note 3) Units V A A A V mJ A mJ V/ns W W/℃ ℃ ℃ Single Pulsed Avalanche Energy Avalanche Current Repetitive Avalanche Energy Peak Diode Recovery dv/dt Power Dissipation (TC = 25℃) - Derate above 25℃ Operating and Storage Temperature Range 860 12 22.5 4.5 51 0.41 -55 to +150 300 Maximum lead temperature for soldering purposes, 1/8” from case for 5 seconds *Drain current limited by maximum junction temperature Thermal Resistance Characteristics Symbol RθJC RθJA Junction-to-Case Junction-to-Ambient Parameter Typ. --Max. 2.43 62.5 ℃/W Units ◎ SEMIHOW REV.A0,Aug 2009 HFS12N65S Electrical Characteristics TC=25 °C Symbol Parameter unless otherwise specified Test Conditions Min Typ Max Units On Characteristics VGS RDS(ON) Gate Threshold Voltage Static Drain-Source On-Resistance VDS = VGS, ID = 250 ㎂ VGS = 10 V, ID = 6.0 A 2.0 --0.67 4.0 0.78 V Ω Off Characteristics BVDSS Drain-Source Breakdown Voltage VGS = 0 V, ID = 250 ㎂ ID = 250 ㎂, Referenced to 25℃ VDS = 650 V, VGS = 0 V VDS = 520 V, TC = 125℃ VGS = 30 V, VDS = 0 V VGS = -30 V, VDS = 0 V 650 ------0.5 ------1 10 100 -100 V V/℃ ㎂ ㎂ ㎁ ㎁ ΔBVDSS Breakdown Voltage Temperature /ΔTJ Coefficient IDSS IGSSF IGSSR Zero Gate Voltage Drain Current Gate-Body Leakage Current, Forward Gate-Body Leakage Current, Reverse Dynamic Characteristics Ciss Coss Crss Input Capacitance Output Capacitance Reverse Transfer Capacitance VDS = 25 V, VGS = 0 V, f = 1.0 MHz ---1835 185 16 2385 240 21 ㎊ ㎊ ㎊ Switching Characteristics td(on) tr td(off) tf Qg Qgs Qgd Turn-On Time Turn-On Rise Time Turn-Off Delay Time Turn-Off Fall Time Total Gate Charge Gate-Source Charge Gate-Drain Charge (Note 4,5) VDS = 325 V, ID = 12 A, RG = 25 Ω -------- 30 85 140 90 38 8 13 70 180 280 190 49 --- ㎱ ㎱ ㎱ ㎱ nC nC nC VDS = 520V, ID = 12 A, VGS = 10 V (Note 4,5) Source-Drain Diode Maximum Ratings and Characteristics IS ISM VSD trr Qrr Continuous Source-Drain Diode Forward Current Pulsed Source-Drain Diode Forward Current Source-Drain Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge IS = 12.0 A, VGS = 0 V IS = 12.0 A, VGS = 0 V diF/dt = 100 A/μs (Note 4) --------420 4.9 12 48 1.4 --A V ㎱ μC Notes ; 1. Repetitive Rating : Pulse width limited by maximum junction temperature 2. L=11mH, IAS=12A, VDD=50V, RG=25Ω, Starting TJ =25°C 3. ISD≤12A, di/dt≤200A/μs, VDD≤BVDSS , Starting TJ =25 °C 4. Pulse Test : Pulse Width ≤ 300μs, Duty Cycle ≤ 2% 5. Essentially Independent of Operating Temperature ◎ SEMIHOW REV.A0,Aug 2009 HFS12N65S Typical Characteristics ID, Drain Current [A] VDS, Drain-Source Voltage [V] ID, Drain Current [A] VGS, Gate-Source Voltage [V] Figure 1. On Region Characteristics Figure 2. Transfer Characteristics 2.0 1.5 VGS = 10V 1.0 VGS = 20V 0.5 * Note : TJ = 25oC 0.0 0 5 10 15 20 25 30 35 IDR, Reverse Drain Current [A] RDS(ON)[Ω], Drain-Source On-Resistance ID, Drain Current[A] VSD, Source-Drain Voltage [V] Figure 3. On Resistance Variation vs Drain Current and Gate Voltage 3500 3000 2500 Ciss = Cgs + Cgd (Cds = shorted) Coss = Cds + Cgd Crss = Cgd Figure 4. Body Diode Forward Voltage Variation with Source Current and Temperature 12 VDS = 130V VGS, Gate-Source Voltage [V] Ciss 10 VDS = 325V VDS = 520V Capacitances [pF] 8 2000 Coss 1500 1000 500 0 10-1 ∗ Note ; 1. VGS = 0 V 2. f = 1 MHz 6 4 Crss 2 * Note : ID = 12.0A 10 0 10 1 0 0 4 8 12 16 20 24 28 32 36 40 VDS, Drain-Source Voltage [V] QG, Total Gate Charge [nC] Figure 5. Capacitance Characteristics Figure 6. Gate Charge Characteristics ◎ SEMIHOW REV.A0,Aug 2009 HFS12N65S Typical Characteristics (continued) 2.5 BVDSS, (Normalized) Drain-Source Breakdown Voltage RDS(ON), (Normalized) Drain-Source On-Resistance 2.0 1.5 1.0 0.5 * Note: 1. VGS=10V 2. ID=6.0A 0.0 -100 -50 0 50 100 150 200 TJ, Junction Temperature [oC] TJ, Junction Temperature[oC] Figure 7. Breakdown Voltage Variation vs Temperature 14 102 Operation in This Area is Limited by R DS(on) Figure 8. On-Resistance Variation vs Temperature ID, Drain Current [A] 101 ID, Drain Current [A] 103 10 µs 100 µs 1 ms 10 ms 100 ms DC 12 10 8 6 4 2 0 25 100 10-1 * Notes : 1. TC = 25 oC 2. TJ = 150 oC 3. Single Pulse 10-2 100 101 102 50 75 100 125 150 VDS, Drain-Source Voltage [V] TC, Case Temperature [oC] Figure 9. Maximum Safe Operating Area Figure 10. Maximum Drain Current vs Case Temperature ZθJC(t), Thermal Response 100 D=0.5 0.2 0.1 10-1 0.05 0.02 0.01 single pulse * Notes : 1. ZθJC(t) = 2.43 oC/W Max. 2. Duty Factor, D=t1/t2 3. TJM - TC = PDM * ZθJC(t) PDM t1 10 -3 10-2 10 -5 t2 100 101 10 -4 10 -2 10 -1 t1, Square Wave Pulse Duration [sec] Figure 11. Transient Thermal Response Curve ◎ SEMIHOW REV.A0,Aug 2009 HFS12N65S Fig 12. Gate Charge Test Circuit & Waveform 50KΩ 12V 200nF 300nF Same Type as DUT VDS VGS Qg 10V VGS Qgs Qgd DUT 3mA Charge Fig 13. Resistive Switching Test Circuit & Waveforms VDS RG RL VDD ( 0.5 rated VDS ) VDS 90% 10V DUT Vin 10% td(on) t on tr td(off) t off tf Fig 14. Unclamped Inductive Switching Test Circuit & Waveforms L VDS VDD ID RG DUT VDD BVDSS IAS BVDSS 1 EAS = ---- LL IAS2 -------------------2 BVDSS -- VDD ID (t) VDS (t) tp 10V Time ◎ SEMIHOW REV.A0,Aug 2009 HFS12N65S Fig 15. Peak Diode Recovery dv/dt Test Circuit & Waveforms DUT + VDS _ IS L Driver RG Same Type as DUT VDD VGS • dv/dt controlled by RG • IS controlled by pulse period VGS ( Driver ) Gate Pulse Width D = -------------------------Gate Pulse Period 10V IFM , Body Diode Forward Current IS ( DUT ) IRM di/dt Body Diode Reverse Current VDS ( DUT ) Body Diode Recovery dv/dt Vf VDD Body Diode Forward Voltage Drop ◎ SEMIHOW REV.A0,Aug 2009 HFS12N65S Package Dimension TO-220F ±0.20 ±0.20 φ3 8± .1 6.68±0.20 0. 20 2.54±0.20 0.70±0.20 15.87±0.20 3.30±0.20 12.42±0.20 2.76±0.20 9.75±0.20 1.47max 0.80±0.20 2.54typ 2.54typ 0.50±0.20 ◎ SEMIHOW REV.A0,Aug 2009
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