SEMiX223GD12E4c
Absolute Maximum Ratings Symbol
IGBT VCES IC ICnom ICRM ICRM = 3xICnom VCC = 800 V VGE ≤ 20 V VCES ≤ 1200 V VGES tpsc Tj Inverse diode IF Tc = 25 °C Tc = 80 °C Tj = 150 °C Tj = 175 °C Tc = 25 °C Tc = 80 °C 1200 333 256 225 675 -20 ... 20 10 -40 ... 175 270 202 225 IFRM = 3xIFnom tp = 10 ms, sin 180°, Tj = 25 °C 675 1161 -40 ... 175 600 -40 ... 125 AC sinus 50Hz, t = 1 min 4000 V A A A A V µs °C A A A A A °C A °C V
Conditions
Values
Unit
SEMiX® 33c
Trench IGBT Modules
SEMiX223GD12E4c
Tj = 175 °C
IFnom
Features
• Homogeneous Si • Trench = Trenchgate technology • VCE(sat) with positive temperature coefficient • High short circuit capability • UL recognized, file no. E63532
IFRM IFSM Tj Module It(RMS) Tstg Visol
Typical Applications*
• AC inverter drives • UPS • Electronic Welding
Characteristics Symbol
IGBT VCE(sat) VCE0 rCE VGE(th) ICES Cies Coes Cres QG RGint td(on) tr Eon td(off) tf Eoff Rth(j-c) IC = 225 A VGE = 15 V chiplevel Tj = 25 °C Tj = 150 °C Tj = 25 °C Tj = 150 °C VGE = 15 V VGE=VCE, IC = 9 mA VGE = 0 V VCE = 1200 V VCE = 25 V VGE = 0 V VGE = - 8 V...+ 15 V Tj = 25 °C VCC = 600 V IC = 225 A Tj = 150 °C Tj = 150 °C Tj = 150 °C Tj = 25 °C Tj = 150 °C f = 1 MHz f = 1 MHz f = 1 MHz 13.2 0.87 0.71 1275 3.33 213 60 22 535 113 31.4 0.135 Tj = 25 °C Tj = 150 °C 5 1.85 2.25 0.8 0.7 4.7 6.9 5.8 0.1 2.1 2.45 0.9 0.8 5.3 7.3 6.5 0.3 V V V V mΩ mΩ V mA mA nF nF nF nC Ω ns ns mJ ns ns mJ K/W
Conditions
min.
typ.
max.
Unit
Remarks
• Case temperature limited to TC=125°C max. • Product reliability results are valid for Tj=150°C
RG on = 1.5 Ω Tj = 150 °C RG off = 1.5 Ω di/dton = 3630 A/µs Tj = 150 °C di/dtoff = 2235 A/µs Tj = 150 °C per IGBT
GD © by SEMIKRON Rev. 1 – 28.06.2010 1
SEMiX223GD12E4c
Characteristics Symbol Conditions
Tj = 25 °C Tj = 150 °C Tj = 25 °C Tj = 150 °C rF Tj = 25 °C Tj = 150 °C IF = 225 A Tj = 150 °C di/dtoff = 3900 A/µs T = 150 °C j VGE = -15 V Tj = 150 °C VCC = 600 V per diode 1.1 0.7 3.6 4.7
min.
typ.
2.2 2.1 1.3 0.9 3.9 5.4 210 37 17.2
max.
2.49 2.4 1.5 1.1 4.4 5.9
Unit
V V V V mΩ mΩ A µC mJ
Inverse diode VF = VEC IF = 225 A VGE = 0 V chip VF0
SEMiX® 33c
Trench IGBT Modules
SEMiX223GD12E4c
IRRM Qrr Err Rth(j-c) Module LCE RCC'+EE'
0.22 20
K/W nH mΩ mΩ K/W
res., terminal-chip per module to heat sink (M5)
TC = 25 °C TC = 125 °C 3 to terminals (M6) 2.5
0.7 1 0.014 5 5 900
Features
• Homogeneous Si • Trench = Trenchgate technology • VCE(sat) with positive temperature coefficient • High short circuit capability • UL recognized, file no. E63532
Rth(c-s) Ms Mt w
Nm Nm Nm g Ω K
Typical Applications*
• AC inverter drives • UPS • Electronic Welding
Temperatur Sensor R100 B100/125 Tc=100°C (R25=5 kΩ) R(T)=R100exp[B100/125(1/T-1/T100)]; T[K]; 493 ± 5% 3550 ±2%
Remarks
• Case temperature limited to TC=125°C max. • Product reliability results are valid for Tj=150°C
GD 2 Rev. 1 – 28.06.2010 © by SEMIKRON
SEMiX223GD12E4c
Fig. 1: Typ. output characteristic, inclusive RCC'+ EE'
Fig. 2: Rated current vs. temperature IC = f (TC)
Fig. 3: Typ. turn-on /-off energy = f (IC)
Fig. 4: Typ. turn-on /-off energy = f (RG)
Fig. 5: Typ. transfer characteristic
Fig. 6: Typ. gate charge characteristic
© by SEMIKRON
Rev. 1 – 28.06.2010
3
SEMiX223GD12E4c
Fig. 7: Typ. switching times vs. IC
Fig. 8: Typ. switching times vs. gate resistor RG
Fig. 9: Typ. transient thermal impedance
Fig. 10: Typ. CAL diode forward charact., incl. RCC'+EE'
Fig. 11: Typ. CAL diode peak reverse recovery current
Fig. 12: Typ. CAL diode recovery charge
4
Rev. 1 – 28.06.2010
© by SEMIKRON
SEMiX223GD12E4c
SEMiX 33c
pinout
This is an electrostatic discharge sensitive device (ESDS), international standard IEC 60747-1, Chapter IX * The specifications of our components may not be considered as an assurance of component characteristics. Components have to be tested for the respective application. Adjustments may be necessary. The use of SEMIKRON products in life support appliances and systems is subject to prior specification and written approval by SEMIKRON. We therefore strongly recommend prior consultation of our personal.
© by SEMIKRON
Rev. 1 – 28.06.2010
5
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