SIPMOS® Small-Signal Transistor
BSS 135
q q q q q q q
VDS 600 V ID 0.080 A RDS(on) 60 Ω
N channel Depletion mode High dynamic resistance Available grouped in VGS(th)
1
2
3
Type
Ordering Code
Tape and Reel Information
Pin Configuration Marking 1 G 2 D 3 S SS135
Package TO-92
BSS 135 Q67000-S237 E6325: 2000 pcs/carton; Ammopack Maximum Ratings Parameter Drain-source voltage Drain-gate voltage, RGS = 20 kΩ Gate-source voltage Gate-source peak voltage, aperiodic Continuous drain current, TA = 42 ˚C Pulsed drain current, Max. power dissipation,
Symbol
Values 600 600 ± 14 ± 20 0.080 0.24 1.0 – 55 … + 150 ≤ 125 E 55/150/56
Unit V
VDS VDGR VGS Vgs ID ID puls Ptot Tj, Tstg RthJA
– –
A W ˚C K/W –
TA = 25 ˚C TA = 25 ˚C
Operating and storage temperature range Thermal resistance, chip-ambient (without heat sink) DIN humidity category, DIN 40 040 IEC climatic category, DIN IEC 68-1
Semiconductor Group
1
04.97
BSS 135
Electrical Characteristics at Tj = 25 ˚C, unless otherwise specified. Parameter Symbol min. Static Characteristics Drain-source breakdown voltage VGS = − 3 V, ID = 0.25 mA Gate threshold voltage VDS = 3 V, ID = 1 mA Drain-source cutoff current VDS = 600 V, VGS = − 3 V Tj = 25 ˚C Tj = 125 ˚C Gate-source leakage current VGS = 20 V, VDS = 0 Drain-source on-resistance VGS = 0 V, ID = 0.01 A Dynamic Characteristics Forward transconductance VDS ≥ 2 × ID × RDS(on)max, ID = 0.01 A Input capacitance VGS = − 3 V, VDS = 25 V, f = 1 MHz Output capacitance VGS = − 3 V, VDS = 25 V, f = 1 MHz Reverse transfer capacitance VGS = − 3 V, VDS = 25 V, f = 1 MHz Turn-on time ton, (ton = td(on) + tr) Values typ. max. Unit
V(BR)DSS
600 – − 1.5 – − 0.7
V
VGS(th) IDSS
− 1.8
– –
– – 10 40
100 200 100
nA µA nA
IGSS
–
RDS(on)
– 60
Ω
gfs
0.01 0.04 110 8 3 4 10 15 20 –
S pF – 150 12 5 6 15 20 30 ns
Ciss Coss
–
Crss
–
td(on) tr td(off) tf
– – – –
VDD = 30 V, VGS = − 3 V ... + 5 V, RGS = 50 Ω, ID = 0.2 A
Turn-off time toff, (toff = td(off) + tf)
VDD = 30 V, VGS = − 3 V ... + 5 V, RGS = 50 Ω, ID = 0.2 A
Semiconductor Group
2
BSS 135
Electrical Characteristics (cont’d) at Tj = 25 ˚C, unless otherwise specified. Parameter Symbol min. Reverse Diode Continuous reverse drain current TA = 25 ˚C Pulsed reverse drain current TA = 25 ˚C Diode forward on-voltage IF = 0.16 A, VGS = 0 Values typ. max. Unit
IS
– – – 0.80 0.080 0.240
A
ISM
–
VSD
– 1.30
V
VGS(th) Grouping
Range of VGS(th) Threshold voltage selected in groups P R S T U V W
1):
Symbol ∆VGS(th)
Limit Values min. – – 0.95 – 1.08 – 1.21 – 1.34 – 1.47 – 1.60 – 1.73 max. 0.15 – 0.80 – 0.93 – 1.06 – 1.19 – 1.32 – 1.45 – 1.58
Unit V V V V V V V V
Test Condition –
VGS(th)
VDS1 = 0.2 V; VDS2 = 3 V; ID = 1 mA
1) A specific group cannot be ordered separately. Each reel only contains transistors from one group.
Semiconductor Group
3
BSS 135
Characteristics at Tj = 25 ˚C, unless otherwise specified. Total power dissipation Ptot = f (TA) Safe operating area ID = f (VDS) parameter: D = 0.01, TC = 25 ˚C
Typ. output characteristics ID = f (VDS) parameter: tp = 80 µs
Typ. drain-source on-resistance RDS(on) = f (ID) parameter: VGS
Semiconductor Group
4
BSS 135
Typ. transfer characteristics ID = f (VGS) parameter: tp = 80 µs, VDS ≥ 2 × ID × RDS(on)max.
Typ. forward transconductance gfs = f (ID) parameter: VDS ≥ 2 × ID × RDS(on)max., tp = 80 µs
Drain-source on-resistance RDS(on) = f (Tj) parameter: ID = 0.01 A, VGS = 0 V, (spread)
Typ. capacitances C = f (VDS) parameter: VGS = 0, f = 1 MHz
Semiconductor Group
5
BSS 135
Gate threshold voltage VGS(th) = f (Tj) parameter: VDS = 3 V, ID = 1 mA, (spread)
Forward characteristics of reverse diode IF = f (VSD) parameter: tp = 80 µs, Tj, (spread)
Drain current ID = f (TA) parameter: VGS ≥ 3 V
Drain-source breakdown voltage V(BR) DSS = b × V(BR)DSS (25 ˚C)
Semiconductor Group
6
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