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Q67006-A9225

Q67006-A9225

  • 厂商:

    SIEMENS

  • 封装:

  • 描述:

    Q67006-A9225 - 5-V Low-Drop Fixed Voltage Regulator - Siemens Semiconductor Group

  • 数据手册
  • 价格&库存
Q67006-A9225 数据手册
5-V Low-Drop Fixed Voltage Regulator TLE 4279 Features • • • • • • • • • Output voltage tolerance ≤ ± 2 % Very low current consumption Early warning Reset output low down to VQ = 1 V Overtemperature protection Reverse polarity proof Settable reset threshold Very low-drop voltage Wide temperature range Ordering Code Package on request Q67006-A9225 P-DIP-8-4 P-DSO-8-1 (SMD) P-DSO-14-4 (SMD) P-DSO-20-6 (SMD) P-DSO-8-1 P-DIP-8-4 Type TLE 4279 A TLE 4279 G w TLE 4279 GM Q67006-A9307 TLE 4279 GL Q67006-A9306 w New type Functional Description This device is a voltage regulator with a fixed 5-V output, e.g. in a P-DSO-8-1 package. The maximum operating P-DSO-20-6 voltage is 45 V. The output is able to drive a 150 mA load. It is short circuit protected and the thermal shutdown switches the output off if the junction temperature is in excess of 150 °C. A reset signal is generated for an output voltage of VQ < 4.6 V. The reset threshold voltage can be decreased by external connection of a voltage divider. The reset delay time can be set by an external capacitor. If the application requires pull up resistors at the logic outputs (Reset, P-DSO-14-4 Sense Out) the TLE 4269 with integrated resistors can be used. It is also possible to supervise the input voltage by using an integrated comparator to give a low voltage warning. Semiconductor Group 1 1998-11-01 TLE 4279 Pin Configuration (top view) P-DIP-8-4 Ι SΙ RE D P-DSO-8-1 1 2 3 4 8 7 6 5 AEP01668 Ι SΙ RE D 1 2 3 4 8 7 6 5 AEP01813 Q SO R GND Q SO R GND Pin Definitions and Functions (TLE 4279 A and TLE 4279 G) Pin No. 1 2 3 4 5 6 7 8 Symbol I SI RE D GND R SO Q Function Input; block directly to GND on the IC with a ceramic capacitor. Sense input; if not needed connect to Q. Reset threshold; if not needed connect to ground. Reset delay; to select the delay time, connect to GND via external capacitor. Ground Reset output; open-collector output Sense output; open-collector output 5-V output; connect to GND with a 10 µF capacitor, ESR < 10 Ω. Semiconductor Group 2 1998-11-01 TLE 4279 Pin Configuration (top view) P-DSO-20-6 RE D N.C. GND GND GND GND N.C. N.C. R 1 2 3 4 5 6 7 8 9 10 20 19 18 17 16 15 14 13 12 11 AEP01802 SΙ Ι N.C. GND GND GND GND N.C. Q SO Pin Definitions and Functions (TLE 4279 GL) Pin No. 1 2 4-7, 14-17 10 11 12 19 20 Symbol RE D GND R SO Q I SI Function Reset threshold; if not needed connect to ground. Reset delay; to select delay time connect to GND via external capacitor. Ground Reset output; open-collector output Sense output; open-collector output Output; connect to GND with 10 µF capacitor, ESR < 10 Ω Input; block directly to GND at the IC by a ceramic capacitor Sense input; if not needed connect to Q Semiconductor Group 3 1998-11-01 TLE 4279 Pin Configuration (top view) P-DSO-14-4 RE D GND GND GND GND R 1 2 3 4 5 6 7 14 13 12 11 10 9 8 SI Ι GND GND GND Q SO AEP02254 Pin Definitions and Functions (TLE 4279 GM) Pin No. 1 2 3, 4, 5, 6 7 8 9 10, 11, 12 13 14 Symbol RE D GND R SO Q GND I SI Function Reset threshold; if not needed connect to GND Reset delay; connect to GND via external delay capacitor for setting delay time Ground Reset output; open-collector output Sense output; open-collector output 5-V output; connect to GND with 10 µF capacitor, ESR < 10 Ω Ground Input; block to ground directly at the IC by a ceramic capacitor Sense input; if not needed connect to Q Semiconductor Group 4 1998-11-01 TLE 4279 Circuit Description The control amplifier compares a reference voltage, made highly accurate by resistance balancing, with a voltage proportional to the output voltage and drives the base of the series PNP transistor via a buffer. Saturation control as a function of the load current prevents any over-saturation of the power element. In the reset generator block a comparator compares a reference voltage independent of the input voltage with the scaled-down output voltage. If the output voltage reaches 4.6 V the reset delay capacitor is discharged and the reset output is set to low. This low is guaranteed down to an output voltage of 1 V. As the output voltage increases again, from 4.6 V onward the reset delay capacitor is charged with constant current. When the capacitor voltage reaches the upper switching threshold Vdt, the reset returns to high. By choosing the value of this capacitor, the reset delay time can be selected over a wide range. With the reset threshold input RE it is possible to lower the reset threshold Vrt. If pin RE is connected to pin Q via a voltage divider, for example, the reset condition is reached when this voltage is decreased below the switching threshold Vre of 1.35 V. Another comparator compares the signal of the pin SI, normally fed by a voltage divider from the input voltage, with the reference and gives an early warning on the pin SO. It is also possible to superwise an other voltage e.g. of a second regulator, or to build a watchdog circuit with few external components. Application Description The input capacitor CI is necessary for compensating line influences. Using a resistor of approx. 1 Ω in series with CI, the oscillating circuit consisting of input inductivity and input capacitance can be damped. The output capacitor CQ is necessary for the stability of the regulating circuit. Stability is guaranteed at values ≥ 10 µF and an ESR ≤ 10 Ω within the operating temperature range. Both reset output and sense output are open collector outputs and have to be connected to 5 V output via external pull-up resistors ≥ 10 kΩ. For small tolerances of the reset delay the spread of the capacitance of the delay capacitor and its temperature coefficient should be noted. Semiconductor Group 5 1998-11-01 TLE 4279 Ι Error Amplifier Reference Current and Saturation Control Q Trimming D R RE Reference SO SI AEB01955 Block Diagram Semiconductor Group 6 1998-11-01 TLE 4279 Absolute Maximum Ratings Tj = – 40 to 150 °C Parameter Symbol Limit Values min. Input Input voltage Input current Sense Input Input voltage Input current Reset Threshold Voltage Current Reset Delay Voltage Current Ground Current Reset Output Voltage Current Sense Output Voltage Current max. Unit Notes VI II – 40 45 – V – – internal limited – VSI ISI – 0.3 45 1 V mA – – 1 VRE IRE – 0.3 – 10 7 10 V mA – – VD ID – 0.3 7 – V – – internal limited – IGND 50 – mA – VR IR – 0.3 7 – V – – internal limited – VSO ISO – 0.3 7 – V – – internal limited – Semiconductor Group 7 1998-11-01 TLE 4279 Absolute Maximum Ratings (cont’d) Tj = – 40 to 150 °C Parameter Symbol Limit Values min. 5-V Output Output voltage Output current Temperature Junction temperature Storage temperature Operating Range Input voltage Junction temperature Thermal Data Junction-ambient max. Unit Notes VQ IQ – 0.3 7 – V mA – – –5 Tj TStg – – 50 150 150 °C °C – – VI Tj – – 40 45 150 V °C – – Rthja – 100 200 70 70 60 60 30 30 K/W K/W K/W K/W K/W K/W K/W K/W P-DIP-8-4 P-DSO-8-1 P-DSO-14-4 P-DSO-20-6 P-DIP-8-4 P-DSO-8-1 P-DSO-14-4 P-DSO-20-6 Rthjc – Semiconductor Group 8 1998-11-01 TLE 4279 Characteristics VI = 13.5 V; Tj = – 40 °C < Tj < 125 °C Parameter Symbol Limit Values min. Output voltage Current limit Current consumption; Iq = II – IQ Current consumption; Iq = II – IQ Current consumption; Iq = II – IQ Drop voltage Load regulation Line regulation Reset Generator Switching threshold Reset low voltage Delay switching threshold Switching threshold typ. 5.00 200 150 250 2 0.25 10 10 max. 5.10 500 300 700 8 0.5 30 40 V mA µA µA mA V mV mV Unit Measuring Condition 1 mA ≤ IQ ≤ 100 mA 6 V ≤ VI ≤ 16 V – VQ IQ Iq Iq Iq Vdr ∆VQ ∆VQ 4.90 150 – – – – – – IQ ≤ 1 mA, Tj < 85 °C IQ = 10 mA IQ = 50 mA IQ = 100 mA1) IQ = 5 mA to 100 mA VI = 6 V to 26 V IQ = 1 mA Vrt VR Vdt Vst 4.50 – 1.4 0.3 – 3.0 4.60 0.1 1.8 0.45 – 6.5 4.80 0.4 2.2 0.60 0.1 9.5 V V V V V µA – Rextern = 20 kΩ – – Reset delay low voltage VD Charge current 1) VQ < VRT VD = 1 V Id Drop voltage = VI – VQ (measured when the output voltage has dropped 100 mV from the nominal value obtained at 13.5 V input.) Semiconductor Group 9 1998-11-01 TLE 4279 Characteristics (cont’d) VI = 13.5 V; Tj = – 40 °C < Tj < 125 °C Parameter Symbol Limit Values min. Delay time L → H Delay time H → L Switching voltage Input Voltage Sense Sense threshold high Sence threshold low Sense output low voltage Sense input current typ. 28 1 1.35 max. – – 1.44 ms µs V Unit Measuring Condition td tt Vre 17 – 1.26 CD = 100 nF CD = 100 nF VQ > 3.5 V Vsi, high Vsi, high VSO,low 1.24 1.16 – 1.31 1.20 0.1 1.38 1.28 0.4 V V V – – VSI < 1.20 V; VI > 3 V Rextern = 20 kΩ – ISI –1 0.1 1 µA Semiconductor Group 10 1998-11-01 TLE 4279 Measuring Circuit (P-DIP-8-4, P-DSO-8-1) VΙ < t RR V RT VQ dV Ι d = dt C D VDT VST VD td t RR V RO Power-on-Reset Thermal Shutdown Voltage Dip at Input Undervoltage Secondary Spike Overload at Output AED01542 Reset Timing Diagram Semiconductor Group 11 1998-11-01 TLE 4279 VΙ < t RR V RT VQ dV Ι d = dt C D VDT VST VD td t RR V RO Power-on-Reset Thermal Shutdown Voltage Dip at Input Undervoltage Secondary Spike Overload at Output AED01542 Sence Input Timing Diagram Semiconductor Group 12 1998-11-01 TLE 4279 Charge Current Id versus Temperature Tj Ιd 16 µA 14 12 10 8 6 4 2 0 -40 AED01803 Switching Voltage Vdt and Vst versus Temperature Tj 3.2 VD V 2.8 AED01804 V Ι = 13.5 V V C = 1.0 V V Ι = 13.5 V 2.4 2.0 1.6 1.2 0.8 Vdt Vst 0.4 0 -40 0 40 80 120 C 160 0 40 80 120 C 160 Tj Tj Drop Voltage Vdr versus Output Current IQ 500 AED01805 Reset Switching Threshold Vre versus Temperature Tj Vre 1.7 V 1.6 1.5 1.4 AED01806 V dr mV 400 300 Tj = 125 C 200 1.3 1.2 Tj = 25 C 1.1 100 1.0 0 0 30 60 90 120 mA 180 0.9 -40 0 40 80 120 C 160 ΙQ Tj Semiconductor Group 13 1998-11-01 TLE 4279 Current Consumption Iq versus Input Voltage VI 30 AED01807 Output Voltage VQ versus Input Voltage VI 12 AED01808 Ι q mA 25 VQ V 10 20 8 15 RL = 33 Ω 6 RL = 50 Ω 10 RL = 50 Ω RL = 100 Ω RL = 200 Ω 0 10 20 30 40 V 50 4 5 2 0 0 0 2 4 6 8 V 10 VΙ VΙ Sense Threshold Vsi versus Temperature Tj 1.6 AED01809 Output Voltage VQ versus Temperature Tj 5.2 AED01671 V si V 1.5 VQ V Ι = 13.5 V V 5.1 V Ι = 13.5 V 1.4 Sense Output High 5.0 1.3 4.9 Sense Output Low 1.2 4.8 1.1 4.7 1.0 -40 0 40 80 120 C 160 4.6 -40 0 40 80 120 C 160 Tj Tj Semiconductor Group 14 1998-11-01 TLE 4279 Output Current IQ versus Input Voltage VI 350 AED01810 Current Consumption Iq versus Output Current IQ 12 AED01811 Ι Q mA 300 250 Ι q mA 10 V Ι = 13.5 V Tj = 25 C Tj = 25 C 200 150 100 50 0 8 Tj = 125 C 6 4 2 0 10 20 30 40 V 50 0 0 20 40 60 80 mA 120 VΙ ΙQ Current Consumption Iq versus Output Current IQ Ιq 1.6 mA 1.4 1.2 1.0 0.8 0.6 0.4 0.2 0 AED01812 V Ι = 13.5 V Tj = 25 C 0 10 20 30 40 mA 50 ΙQ Semiconductor Group 15 1998-11-01 TLE 4279 Package Outlines P-DIP-8-4 (Plastic Dual In-line Package) Sorts of Packing Package outlines for tubes, trays etc. are contained in our Data Book “Package Information” Dimensions in mm Semiconductor Group 16 1998-11-01 GPD05583 TLE 4279 P-DSO-8-1 (SMD) (Plastic Dual Small Outline Package) Sorts of Packing Package outlines for tubes, trays etc. are contained in our Data Book “Package Information” SMD = Surface Mounted Device Semiconductor Group 17 Dimensions in mm 1998-11-01 GPS05121 TLE 4279 P-DSO-20-6 (SMD) (Plastic Dual Small Outline Package) 2.65 max 0.35 x 45˚ 2.45 -0.2 0.2 -0.1 1.27 0.35 +0.15 2) 20 0.2 24x 11 0.1 0.4 +0.8 10.3 ±0.3 GPS05094 1 12.8 1) 10 -0.2 Index Marking 1) Does not include plastic or metal protrusions of 0.15 max per side 2) Does not include dambar protrusion of 0.05 max per side Sorts of Packing Package outlines for tubes, trays etc. are contained in our Data Book “Package Information” SMD = Surface Mounted Device Semiconductor Group 18 0.23 +0.0 9 8˚ ma x 7.6 -0.2 1) Dimensions in mm 1998-11-01 TLE 4279 P-DSO-14-4 (SMD) (Plastic Dual Small Outline Package) 0.35 x 45˚ 1.75 max 1.45 -0.2 0.19 +0.06 0.2 -0.1 4 -0.2 1) 1.27 0.35 +0.15 2) 14 0.1 0.2 14x 6 ±0.2 8 0.4 +0.8 1 7 8.75 -0.21) Index Marking 1) Does not include plastic or metal protrusion of 0.15 max. per side 2) Does not include dambar protrusion of 0.05 max. per side GPS05093 Sorts of Packing Package outlines for tubes, trays etc. are contained in our Data Book “Package Information” SMD = Surface Mounted Device Semiconductor Group 19 8˚ max. Dimensions in mm 1998-11-01
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