SPD14N05 SPU14N05
SIPMOS ® Power Transistor
• N channel • Enhancement mode • Avalanche-rated • dv /dt rated • 175°C operating temperature
Pin 1 Pin 2 Pin 3
G
D
S
Type
VDS 55 V 55 V
ID 13.5 A 13.5 A
RDS(on) 0.1 Ω 0.1 Ω
Package
Ordering Code
SPD14N05 SPU14N05
P-TO252 P-TO251
Q67040 - S4123 - A2 Q67040 - S4115 - A2
Maximum Ratings Parameter Symbol Values Unit
Continuous drain current
TC = 25 °C TC = 100 °C
ID
A 13.5 9.6
Pulsed drain current
TC = 25 °C
IDpuls
54
EAS
Avalanche energy, single pulse
ID = 13.5 A, VDD = 25 V, RGS = 25 Ω L = 571 µH, Tj = 25 °C
mJ
52
IAR EAR
Avalanche current,limited by Tjmax Avalanche energy,periodic limited by Tjmax Reverse diode dv/dt
IS = 13.5 A, V DS = 40 V, diF/dt = 200 A/µs Tjmax = 175 °C
13.5 3.5
A mJ kV/µs
dv /dt
6
VGS Ptot
Gate source voltage Power dissipation
TC = 25 °C
± 20
35
V W
Semiconductor Group
1
29/Jan/1998
SPD14N05 SPU14N05
Maximum Ratings Parameter Symbol Values Unit
Operating temperature Storage temperature Thermal resistance, junction - case Thermal resistance, junction - ambient (PCB mount)** Thermal resistance, junction - ambient IEC climatic category, DIN IEC 68-1
Tj Tstg RthJC RthJA RthJA
-55 ... + 175 -55 ... + 175
°C
≤ 4.3 ≤ 50 ≤ 100
55 / 175 / 56
K/W
** when mounted on 1 " square PCB ( FR4 );for recommended footprint
Electrical Characteristics, at Tj = 25°C, unless otherwise specified Parameter Symbol min. Static Characteristics Values typ. max. Unit
Drain- source breakdown voltage
V GS = 0 V, ID = 0.25 mA, Tj = 25 °C
V (BR)DSS
V 55 -
Gate threshold voltage
V GS=V DS, ID = 20 µA
V GS(th)
2.1
IDSS
3
4 µA
Zero gate voltage drain current
V DS = 50 V, V GS = 0 V, Tj = -40 °C V DS = 50 V, V GS = 0 V, Tj = 25 °C V DS = 50 V, V GS = 0 V, Tj = 150 °C
IGSS
0.1 -
0.1 1 100 nA
Gate-source leakage current
V GS = 20 V, VDS = 0 V
RDS(on)
10
100
Drain-Source on-resistance
V GS = 10 V, ID = 9.6 A
Ω
0.076 0.1
Semiconductor Group
2
29/Jan/1998
SPD14N05 SPU14N05
Electrical Characteristics, at Tj = 25°C, unless otherwise specified Parameter Symbol min. Dynamic Characteristics Values typ. max. Unit
Transconductance
V DS≥ 2 * ID * RDS(on)max, ID = 9.6 A
gfs
S 4 pF 270 340
Input capacitance
V GS = 0 V, V DS = 25 V, f = 1 MHz
Ciss
Output capacitance
V GS = 0 V, V DS = 25 V, f = 1 MHz
Coss
Crss
95
120
Reverse transfer capacitance
V GS = 0 V, V DS = 25 V, f = 1 MHz
td(on)
50
65 ns
Turn-on delay time
V DD = 30 V, VGS = 10 V, ID = 13.5 A RG = 33 Ω
tr
9
15
Rise time
V DD = 30 V, VGS = 10 V, ID = 13.5 A RG = 33 Ω
td(off)
22
35
Turn-off delay time
V DD = 30 V, VGS = 10 V, ID = 13.5 A RG = 33 Ω
tf
18
30
Fall time
V DD = 30 V, VGS = 10 V, ID = 13.5 A RG = 33 Ω
Qg(th)
17
25 nC
Gate charge at threshold
V DD = 40 V, ID ≥ 0.1 A, V GS =0 to 1 V
Qg(7)
0.33
0.5
Gate charge at 7.0 V
V DD = 40 V, ID = 13.5 A, V GS =0 to 7 V
Qg(total)
7.1
11
Gate charge total
V DD = 40 V, ID = 13.5 A, V GS =0 to 10 V
V (plateau)
9.5
14 V
Gate plateau voltage
V DD = 40 V, ID = 13.5 A
-
5.9
-
Semiconductor Group
3
29/Jan/1998
SPD14N05 SPU14N05
Electrical Characteristics, at Tj = 25°C, unless otherwise specified Parameter Symbol min. Reverse Diode Values typ. max. Unit
Inverse diode continuous forward current
TC = 25 °C
IS
A 13.5
Inverse diode direct current,pulsed
TC = 25 °C
ISM
V SD
-
54 V
Inverse diode forward voltage
V GS = 0 V, IF = 27 A
trr
1.17
1.8 ns
Reverse recovery time
V R = 30 V, IF=lS, diF/dt = 100 A/µs
Qrr
50
75 µC
Reverse recovery charge
V R = 30 V, IF=lS, diF/dt = 100 A/µs
-
0.1
0.15
Semiconductor Group
4
29/Jan/1998
SPD14N05 SPU14N05
Power dissipation Ptot = ƒ(TC)
Drain current ID = ƒ(TC) parameter: VGS ≥ 10 V
14 A
36 W Ptot 28 24 20 16 12 8 4 0 0 ID
12 11 10 9 8 7 6 5 4 3 2 1 0 20 40 60 80 100 120 140 °C 180 0 20 40 60 80 100 120 140 °C 180
TC
TC
Safe operating area ID = ƒ(VDS) parameter: D = 0.01, TC = 25°C
10 2
t = 3.3µs p
Transient thermal impedance Zth JC = ƒ(tp) parameter: D = tp / T
10 1
K/W
10 µs
DS (o n)
ID 10 1
=
V
DS
A
/I
D
ZthJC
10 0
R
100 µs
10 -1 D = 0.50 0.20 10 0 DC
1 ms 10 ms
0.10 10 -2 single pulse 0.05 0.02 0.01
10 -1 0 10
10
1
V 10
2
VDS
10 -3 -7 10
10
-6
10
-5
10
-4
10
-3
10
-2
10
-1
s 10
0
tp
Semiconductor Group
5
29/Jan/1998
SPD14N05 SPU14N05
Typ. output characteristics ID = ƒ(VDS) parameter: tp = 80 µs , Tj = 25 °C
30 A 26 ID 24 22 20 18 16 14 12 10 8 6 4
c b e g i
Typ. drain-source on-resistance RDS (on) = ƒ(ID) parameter: tp = 80 µs, Tj = 25 °C
0.32
Ptot = 35W
l
k
j
Ω
VGS [V] a b c 4.0 4.5 5.0 5.5 6.0 6.5 7.0 7.5 8.0 9.0
a
b
c
d
e
f
g
h
RDS (on) 0.24
hd
e f g
0.20
0.16
fh
i j
0.12
i j
k 10.0
d l 20.0
0.08
k
0.04 VGS [V] =
a 4.0 4.5 b 5.0 c 5.5 d 6.0 e f 6.5 7.0 g 7.5 h i j k 8.0 9.0 10.0 20.0
2 a 0 0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0
V
5.0
0.00 0
4
8
12
16
20
A
26
VDS
ID
Typ. transfer characteristics ID = f (V GS)
parameter: tp = 80 µs
VDS≥2 x ID x RDS(on)max
35
A
I
D
25
20
15
10
5
0 0
1
2
3
4
5
6
7
8
V
VGS
10
Semiconductor Group
6
29/Jan/1998
SPD14N05 SPU14N05
Drain-source on-resistance RDS (on) = ƒ(Tj ) parameter: ID = 9.6 A, VGS = 10 V
0.32
Gate threshold voltage
V GS(th)= f (Tj)
parameter:VGS=VDS, ID =20µA
5.0
Ω
RDS (on) 0.24
VGS(th)
V 4.4 4.0 3.6
0.20
3.2 2.8 98% 2.4 2.0 1.6
max
0.16
0.12
typ
0.08 1.2 0.04 0.00 -60 0.8 0.4 -20 20 60 100 °C 180 0.0 -60 -20 20 60 100 140 V
Tj
typ
min
Tj
200
Typ. capacitances
C = f (VDS)
parameter:VGS = 0V, f = 1MHz
10 3
Forward characteristics of reverse diode IF = ƒ(VSD) parameter: Tj , tp = 80 µs
10 2
A
C
pF
Ciss
IF 10 1
10 2
Coss
Crss
10 0 Tj = 25 °C typ Tj = 175 °C typ Tj = 25 °C (98%) Tj = 175 °C (98%)
10 1 0
5
10
15
20
25
30
V
VDS
40
10 -1 0.0
0.4
0.8
1.2
1.6
2.0
2.4
V
3.0
VSD
Semiconductor Group
7
29/Jan/1998
SPD14N05 SPU14N05
Avalanche energy EAS = f (Tj) parameter:ID=13.5 A,VDD =25 V RGS =25 Ω , L = 571 µH
60
Typ. gate charge VGS = ƒ(QGate) parameter: ID puls = 14 A
16
V mJ
EAS
VGS
12
40
10 0,2 VDS max 0,8 VDS max
30
8
6 20 4 10
2 0 40 60 80 100 120 140 °C
Tj
0 20 180
0
1
2
3
4
5
6
7
nC
9
Q Gate
Drain-source breakdown voltage V(BR)DSS = ƒ(Tj)
65
V V(BR)DSS
61
59
57
55
53
51 49 -60
-20
20
60
100
°C
180
Tj
Semiconductor Group
8
29/Jan/1998