S-80124CNPF-JKJTFG

Rev.3.3_00 ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) S-801 Series The S-801 Series is a series of high-precision voltage detectors with a built-in delay time generator of fixed time developed using CMOS process. The detection voltage is fixed internally, with an accuracy of ±2.0 %. Internal oscillator and counter timer can delay the release signal without external parts. Three delay times 50 ms, 100 ms, and 200 ms are available. Two output forms, Nch open-drain and CMOS output, are available. Features • • • • • • • • • 1.3 μA typ. (at VDD=3.5 V) ±2.0 % 60 mV typ. 2.2 V to 6.0 V (0.1 V step) A type 50 ms typ. B type 100 ms typ. C type 200 ms typ. ON/OFF switching function of delay time (DS pin) Operating voltage range 0.95 V to 10.0 V Output forms Nch open-drain output (Active Low) CMOS output (Active Low) Lead-free products Ultra-low current consumption High-precision detection voltage Hysteresis characteristics Detection voltage Three delay times Applications • Power monitor for portable equipment such as notebook computers, digital still cameras, PDA, and cellular phones. • Constant voltage power monitor for cameras, video equipment and communication devices. • Power monitor for microcomputers and reset for CPUs. Packages Package name SOT-23-5 SNT-4A Package MP005-A PF004-A Drawing code Tape Reel MP005-A MP005-A PF004-A PF004-A Land — PF004-A Seiko Instruments Inc. 1 ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.3.3_00 S-801 Series Block Diagrams 1. Nch Open-drain Output Products VDD Delay circuit + *1 − Oscillator counter timer *1 OUT *1 VREF VSS DS *1. Parasitic diode Figure 1 2. CMOS Output Products VDD + *1 Delay circuit Oscillator counter timer *1 *1 − OUT *1 VREF VSS DS *1. Parasitic diode Figure 2 2 Seiko Instruments Inc. ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.3.3_00 S-801 Series Product Name Structure The detection voltage, delay time, output form and packages for S-801 Series can be selected at the user's request. Refer to the "1. Product name" for the construction of the product name and "2. Product Name List" for the full product names. 1. Product Name S-801xx x x xx - xxx xx G IC direction in tape specifications*1 T2: SOT-23-5 TF: SNT-4A Product code*2 Package code MC: SOT-23-5 PF: SNT-4A Output form N: Nch open-drain output (Active low) L: CMOS output (Active low) Delay time A: 50 ms typ. B: 100 ms typ. C: 200 ms typ. Detection voltage value 22 to 60 (e.g. When the detection voltage is 2.2 V, it is expressed as 22.) *1. Refer to the taping specifications at the end this book. *2. Refer to the Table 2 in the “2. Product name list”. Seiko Instruments Inc. 3 ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.3.3_00 S-801 Series 2. Product Name List 2-1. SOT-23-5 Table 1 (1/3) Detection voltage range 2.2 V ±2.0% Delay time 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. Nch open-drain output products S-80122ANMC-JCHT2G S-80122BNMC-JGHT2G S-80122CNMC-JKHT2G S-80123ANMC-JCIT2G S-80123BNMC-JGIT2G S-80123CNMC-JKIT2G S-80124ANMC-JCJT2G S-80124BNMC-JGJT2G S-80124CNMC-JKJT2G S-80125ANMC-JCKT2G S-80125BNMC-JGKT2G S-80125CNMC-JKKT2G S-80126ANMC-JCLT2G S-80126BNMC-JGLT2G S-80126CNMC-JKLT2G S-80127ANMC-JCMT2G S-80127BNMC-JGMT2G S-80127CNMC-JKMT2G S-80128ANMC-JCNT2G S-80128BNMC-JGNT2G S-80128CNMC-JKNT2G S-80129ANMC-JCOT2G S-80129BNMC-JGOT2G S-80129CNMC-JKOT2G S-80130ANMC-JCPT2G S-80130BNMC-JGPT2G S-80130CNMC-JKPT2G S-80131ANMC-JCQT2G S-80131BNMC-JGQT2G S-80131CNMC-JKQT2G S-80132ANMC-JCRT2G S-80132BNMC-JGRT2G S-80132CNMC-JKRT2G S-80133ANMC-JCST2G S-80133BNMC-JGST2G S-80133CNMC-JKST2G S-80134ANMC-JCTT2G S-80134BNMC-JGTT2G S-80134CNMC-JKTT2G CMOS output products S-80122ALMC-JAHT2G S-80122BLMC-JEHT2G S-80122CLMC-JIHT2G S-80123ALMC-JAIT2G S-80123BLMC-JEIT2G S-80123CLMC-JIIT2G S-80124ALMC-JAJT2G S-80124BLMC-JEJT2G S-80124CLMC-JIJT2G S-80125ALMC-JAKT2G S-80125BLMC-JEKT2G S-80125CLMC-JIKT2G S-80126ALMC-JALT2G S-80126BLMC-JELT2G S-80126CLMC-JILT2G S-80127ALMC-JAMT2G S-80127BLMC-JEMT2G S-80127CLMC-JIMT2G S-80128ALMC-JANT2G S-80128BLMC-JENT2G S-80128CLMC-JINT2G S-80129ALMC-JAOT2G S-80129BLMC-JEOT2G S-80129CLMC-JIOT2G S-80130ALMC-JAPT2G S-80130BLMC-JEPT2G S-80130CLMC-JIPT2G S-80131ALMC-JAQT2G S-80131BLMC-JEQT2G S-80131CLMC-JIQT2G S-80132ALMC-JART2G S-80132BLMC-JERT2G S-80132CLMC-JIRT2G S-80133ALMC-JAST2G S-80133BLMC-JEST2G S-80133CLMC-JIST2G S-80134ALMC-JATT2G S-80134BLMC-JETT2G S-80134CLMC-JITT2G 2.3 V ±2.0% 2.4 V ±2.0% 2.5 V ±2.0% 2.6 V ±2.0% 2.7 V ±2.0% 2.8 V ±2.0% 2.9 V ±2.0% 3.0 V ±2.0% 3.1 V ±2.0% 3.2 V ±2.0% 3.3 V ±2.0% 3.4 V ±2.0% 4 Seiko Instruments Inc. ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.3.3_00 S-801 Series Table 1 (2/3) Detection voltage range 3.5 V ±2.0% Delay time 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. Nch open-drain output products S-80135ANMC-JCUT2G S-80135BNMC-JGUT2G S-80135CNMC-JKUT2G S-80136ANMC-JCVT2G S-80136BNMC-JGVT2G S-80136CNMC-JKVT2G S-80137ANMC-JCWT2G S-80137BNMC-JGWT2G S-80137CNMC-JKWT2G S-80138ANMC-JCXT2G S-80138BNMC-JGXT2G S-80138CNMC-JKXT2G S-80139ANMC-JCYT2G S-80139BNMC-JGYT2G S-80139CNMC-JKYT2G S-80140ANMC-JCZT2G S-80140BNMC-JGZT2G S-80140CNMC-JKZT2G S-80141ANMC-JC2T2G S-80141BNMC-JG2T2G S-80141CNMC-JK2T2G S-80142ANMC-JC3T2G S-80142BNMC-JG3T2G S-80142CNMC-JK3T2G S-80143ANMC-JC4T2G S-80143BNMC-JG4T2G S-80143CNMC-JK4T2G S-80144ANMC-JC5T2G S-80144BNMC-JG5T2G S-80144CNMC-JK5T2G S-80145ANMC-JC6T2G S-80145BNMC-JG6T2G S-80145CNMC-JK6T2G S-80146ANMC-JC7T2G S-80146BNMC-JG7T2G S-80146CNMC-JK7T2G S-80147ANMC-JC8T2G S-80147BNMC-JG8T2G S-80147CNMC-JK8T2G S-80148ANMC-JC9T2G S-80148BNMC-JG9T2G S-80148CNMC-JK9T2G S-80149ANMC-JDAT2G S-80149BNMC-JHAT2G S-80149CNMC-JLAT2G CMOS output products S-80135ALMC-JAUT2G S-80135BLMC-JEUT2G S-80135CLMC-JIUT2G S-80136ALMC-JAVT2G S-80136BLMC-JEVT2G S-80136CLMC-JIVT2G S-80137ALMC-JAWT2G S-80137BLMC-JEWT2G S-80137CLMC-JIWT2G S-80138ALMC-JAXT2G S-80138BLMC-JEXT2G S-80138CLMC-JIXT2G S-80139ALMC-JAYT2G S-80139BLMC-JEYT2G S-80139CLMC-JIYT2G S-80140ALMC-JAZT2G S-80140BLMC-JEZT2G S-80140CLMC-JIZT2G S-80141ALMC-JA2T2G S-80141BLMC-JE2T2G S-80141CLMC-JI2T2G S-80142ALMC-JA3T2G S-80142BLMC-JE3T2G S-80142CLMC-JI3T2G S-80143ALMC-JA4T2G S-80143BLMC-JE4T2G S-80143CLMC-JI4T2G S-80144ALMC-JA5T2G S-80144BLMC-JE5T2G S-80144CLMC-JI5T2G S-80145ALMC-JA6T2G S-80145BLMC-JE6T2G S-80145CLMC-JI6T2G S-80146ALMC-JA7T2G S-80146BLMC-JE7T2G S-80146CLMC-JI7T2G S-80147ALMC-JA8T2G S-80147BLMC-JE8T2G S-80147CLMC-JI8T2G S-80148ALMC-JA9T2G S-80148BLMC-JE9T2G S-80148CLMC-JI9T2G S-80149ALMC-JBAT2G S-80149BLMC-JFAT2G S-80149CLMC-JJAT2G 3.6 V ±2.0% 3.7 V ±2.0% 3.8 V ±2.0% 3.9 V ±2.0% 4.0 V ±2.0% 4.1 V ±2.0% 4.2 V ±2.0% 4.3 V ±2.0% 4.4 V ±2.0% 4.5 V ±2.0% 4.6 V ±2.0% 4.7 V ±2.0% 4.8 V ±2.0% 4.9 V ±2.0% Seiko Instruments Inc. 5 ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.3.3_00 S-801 Series Table 1 (3/3) Detection voltage range 5.0 V ±2.0% Delay time 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. Nch open-drain output products S-80150ANMC-JDBT2G S-80150BNMC-JHBT2G S-80150CNMC-JLBT2G S-80151ANMC-JDCT2G S-80151BNMC-JHCT2G S-80151CNMC-JLCT2G S-80152ANMC-JDDT2G S-80152BNMC-JHDT2G S-80152CNMC-JLDT2G S-80153ANMC-JDET2G S-80153BNMC-JHET2G S-80153CNMC-JLET2G S-80154ANMC-JDFT2G S-80154BNMC-JHFT2G S-80154CNMC-JLFT2G S-80155ANMC-JDGT2G S-80155BNMC-JHGT2G S-80155CNMC-JLGT2G S-80156ANMC-JDHT2G S-80156BNMC-JHHT2G S-80156CNMC-JLHT2G S-80157ANMC-JDIT2G S-80157BNMC-JHIT2G S-80157CNMC-JLIT2G S-80158ANMC-JDJT2G S-80158BNMC-JHJT2G S-80158CNMC-JLJT2G S-80159ANMC-JDKT2G S-80159BNMC-JHKT2G S-80159CNMC-JLKT2G S-80160ANMC-JDLT2G S-80160BNMC-JHLT2G S-80160CNMC-JLLT2G CMOS output products S-80150ALMC-JBBT2G S-80150BLMC-JFBT2G S-80150CLMC-JJBT2G S-80151ALMC-JBCT2G S-80151BLMC-JFCT2G S-80151CLMC-JJCT2G S-80152ALMC-JBDT2G S-80152BLMC-JFDT2G S-80152CLMC-JJDT2G S-80153ALMC-JBET2G S-80153BLMC-JFET2G S-80153CLMC-JJET2G S-80154ALMC-JBFT2G S-80154BLMC-JFFT2G S-80154CLMC-JJFT2G S-80155ALMC-JBGT2G S-80155BLMC-JFGT2G S-80155CLMC-JJGT2G S-80156ALMC-JBHT2G S-80156BLMC-JFHT2G S-80156CLMC-JJHT2G S-80157ALMC-JBIT2G S-80157BLMC-JFIT2G S-80157CLMC-JJIT2G S-80158ALMC-JBJT2G S-80158BLMC-JFJT2G S-80158CLMC-JJJT2G S-80159ALMC-JBKT2G S-80159BLMC-JFKT2G S-80159CLMC-JJKT2G S-80160ALMC-JBLT2G S-80160BLMC-JFLT2G S-80160CLMC-JJLT2G 5.1 V ±2.0% 5.2 V ±2.0% 5.3 V ±2.0% 5.4 V ±2.0% 5.5 V ±2.0% 5.6 V ±2.0% 5.7 V ±2.0% 5.8 V ±2.0% 5.9 V ±2.0% 6.0 V ±2.0% 6 Seiko Instruments Inc. ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.3.3_00 S-801 Series 2-2. SNT-4A Table 2 (1/3) Detection voltage range 2.2 V ±2.0% Delay time 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. Nch open-drain output products S-80122ANPF-JCHTFG S-80122BNPF-JGHTFG S-80122CNPF-JKHTFG S-80123ANPF-JCITFG S-80123BNPF-JGITFG S-80123CNPF-JKITFG S-80124ANPF-JCJTFG S-80124BNPF-JGJTFG S-80124CNPF-JKJTFG S-80125ANPF-JCKTFG S-80125BNPF-JGKTFG S-80125CNPF-JKKTFG S-80126ANPF-JCLTFG S-80126BNPF-JGLTFG S-80126CNPF-JKLTFG S-80127ANPF-JCMTFG S-80127BNPF-JGMTFG S-80127CNPF-JKMTFG S-80128ANPF-JCNTFG S-80128BNPF-JGNTFG S-80128CNPF-JKNTFG S-80129ANPF-JCOTFG S-80129BNPF-JGOTFG S-80129CNPF-JKOTFG S-80130ANPF-JCPTFG S-80130BNPF-JGPTFG S-80130CNPF-JKPTFG S-80131ANPF-JCQTFG S-80131BNPF-JGQTFG S-80131CNPF-JKQTFG S-80132ANPF-JCRTFG S-80132BNPF-JGRTFG S-80132CNPF-JKRTFG S-80133ANPF-JCSTFG S-80133BNPF-JGSTFG S-80133CNPF-JKSTFG S-80134ANPF-JCTTFG S-80134BNPF-JGTTFG S-80134CNPF-JKTTFG S-80135ANPF-JCUTFG S-80135BNPF-JGUTFG S-80135CNPF-JKUTFG S-80136ANPF-JCVTFG S-80136BNPF-JGVTFG S-80136CNPF-JKVTFG S-80137ANPF-JCWTFG S-80137BNPF-JGWTFG S-80137CNPF-JKWTFG CMOS output products S-80122ALPF-JAHTFG S-80122BLPF-JEHTFG S-80122CLPF-JIHTFG S-80123ALPF-JAITFG S-80123BLPF-JEITFG S-80123CLPF-JIITFG S-80124ALPF-JAJTFG S-80124BLPF-JEJTFG S-80124CLPF-JIJTFG S-80125ALPF-JAKTFG S-80125BLPF-JEKTFG S-80125CLPF-JIKTFG S-80126ALPF-JALTFG S-80126BLPF-JELTFG S-80126CLPF-JILTFG S-80127ALPF-JAMTFG S-80127BLPF-JEMTFG S-80127CLPF-JIMTFG S-80128ALPF-JANTFG S-80128BLPF-JENTFG S-80128CLPF-JINTFG S-80129ALPF-JAOTFG S-80129BLPF-JEOTFG S-80129CLPF-JIOTFG S-80130ALPF-JAPTFG S-80130BLPF-JEPTFG S-80130CLPF-JIPTFG S-80131ALPF-JAQTFG S-80131BLPF-JEQTFG S-80131CLPF-JIQTFG S-80132ALPF-JARTFG S-80132BLPF-JERTFG S-80132CLPF-JIRTFG S-80133ALPF-JASTFG S-80133BLPF-JESTFG S-80133CLPF-JISTFG S-80134ALPF-JATTFG S-80134BLPF-JETTFG S-80134CLPF-JITTFG S-80135ALPF-JAUTFG S-80135BLPF-JEUTFG S-80135CLPF-JIUTFG S-80136ALPF-JAVTFG S-80136BLPF-JEVTFG S-80136CLPF-JIVTFG S-80137ALPF-JAWTFG S-80137BLPF-JEWTFG S-80137CLPF-JIWTFG 7 2.3 V ±2.0% 2.4 V ±2.0% 2.5 V ±2.0% 2.6 V ±2.0% 2.7 V ±2.0% 2.8 V ±2.0% 2.9 V ±2.0% 3.0 V ±2.0% 3.1 V ±2.0% 3.2 V ±2.0% 3.3 V ±2.0% 3.4 V ±2.0% 3.5 V ±2.0% 3.6 V ±2.0% 3.7 V ±2.0% Seiko Instruments Inc. ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.3.3_00 S-801 Series Table 2 (2/3) Detection voltage range 3.8 V ±2.0% Delay time 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. Nch open-drain output products S-80138ANPF-JCXTFG S-80138BNPF-JGXTFG S-80138CNPF-JKXTFG S-80139ANPF-JCYTFG S-80139BNPF-JGYTFG S-80139CNPF-JKYTFG S-80140ANPF-JCZTFG S-80140BNPF-JGZTFG S-80140CNPF-JKZTFG S-80141ANPF-JC2TFG S-80141BNPF-JG2TFG S-80141CNPF-JK2TFG S-80142ANPF-JC3TFG S-80142BNPF-JG3TFG S-80142CNPF-JK3TFG S-80143ANPF-JC4TFG S-80143BNPF-JG4TFG S-80143CNPF-JK4TFG S-80144ANPF-JC5TFG S-80144BNPF-JG5TFG S-80144CNPF-JK5TFG S-80145ANPF-JC6TFG S-80145BNPF-JG6TFG S-80145CNPF-JK6TFG S-80146ANPF-JC7TFG S-80146BNPF-JG7TFG S-80146CNPF-JK7TFG S-80147ANPF-JC8TFG S-80147BNPF-JG8TFG S-80147CNPF-JK8TFG S-80148ANPF-JC9TFG S-80148BNPF-JG9TFG S-80148CNPF-JK9TFG S-80149ANPF-JDATFG S-80149BNPF-JHATFG S-80149CNPF-JLATFG S-80150ANPF-JDBTFG S-80150BNPF-JHBTFG S-80150CNPF-JLBTFG S-80151ANPF-JDCTFG S-80151BNPF-JHCTFG S-80151CNPF-JLCTFG S-80152ANPF-JDDTFG S-80152BNPF-JHDTFG S-80152CNPF-JLDTFG S-80153ANPF-JDETFG S-80153BNPF-JHETFG S-80153CNPF-JLETFG CMOS output products S-80138ALPF-JAXTFG S-80138BLPF-JEXTFG S-80138CLPF-JIXTFG S-80139ALPF-JAYTFG S-80139BLPF-JEYTFG S-80139CLPF-JIYTFG S-80140ALPF-JAZTFG S-80140BLPF-JEZTFG S-80140CLPF-JIZTFG S-80141ALPF-JA2TFG S-80141BLPF-JE2TFG S-80141CLPF-JI2TFG S-80142ALPF-JA3TFG S-80142BLPF-JE3TFG S-80142CLPF-JI3TFG S-80143ALPF-JA4TFG S-80143BLPF-JE4TFG S-80143CLPF-JI4TFG S-80144ALPF-JA5TFG S-80144BLPF-JE5TFG S-80144CLPF-JI5TFG S-80145ALPF-JA6TFG S-80145BLPF-JE6TFG S-80145CLPF-JI6TFG S-80146ALPF-JA7TFG S-80146BLPF-JE7TFG S-80146CLPF-JI7TFG S-80147ALPF-JA8TFG S-80147BLPF-JE8TFG S-80147CLPF-JI8TFG S-80148ALPF-JA9TFG S-80148BLPF-JE9TFG S-80148CLPF-JI9TFG S-80149ALPF-JBATFG S-80149BLPF-JFATFG S-80149CLPF-JJATFG S-80150ALPF-JBBTFG S-80150BLPF-JFBTFG S-80150CLPF-JJBTFG S-80151ALPF-JBCTFG S-80151BLPF-JFCTFG S-80151CLPF-JJCTFG S-80152ALPF-JBDTFG S-80152BLPF-JFDTFG S-80152CLPF-JJDTFG S-80153ALPF-JBETFG S-80153BLPF-JFETFG S-80153CLPF-JJETFG 3.9 V ±2.0% 4.0 V ±2.0% 4.1 V ±2.0% 4.2 V ±2.0% 4.3 V ±2.0% 4.4 V ±2.0% 4.5 V ±2.0% 4.6 V ±2.0% 4.7 V ±2.0% 4.8 V ±2.0% 4.9 V ±2.0% 5.0 V ±2.0% 5.1 V ±2.0% 5.2 V ±2.0% 5.3 V ±2.0% 8 Seiko Instruments Inc. ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.3.3_00 S-801 Series Table 2 (3/3) Detection voltage range 5.4 V ±2.0% Delay time 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. 50 ms typ. 100 ms typ. 200 ms typ. Nch open-drain output products S-80154ANPF-JDFTFG S-80154BNPF-JHFTFG S-80154CNPF-JLFTFG S-80155ANPF-JDGTFG S-80155BNPF-JHGTFG S-80155CNPF-JLGTFG S-80156ANPF-JDHTFG S-80156BNPF-JHHTFG S-80156CNPF-JLHTFG S-80157ANPF-JDITFG S-80157BNPF-JHITFG S-80157CNPF-JLITFG S-80158ANPF-JDJTFG S-80158BNPF-JHJTFG S-80158CNPF-JLJTFG S-80159ANPF-JDKTFG S-80159BNPF-JHKTFG S-80159CNPF-JLKTFG S-80160ANPF-JDLTFG S-80160BNPF-JHLTFG S-80160CNPF-JLLTFG CMOS output products S-80154ALPF-JBFTFG S-80154BLPF-JFFTFG S-80154CLPF-JJFTFG S-80155ALPF-JBGTFG S-80155BLPF-JFGTFG S-80155CLPF-JJGTFG S-80156ALPF-JBHTFG S-80156BLPF-JFHTFG S-80156CLPF-JJHTFG S-80157ALPF-JBITFG S-80157BLPF-JFITFG S-80157CLPF-JJITFG S-80158ALPF-JBJTFG S-80158BLPF-JFJTFG S-80158CLPF-JJJTFG S-80159ALPF-JBKTFG S-80159BLPF-JFKTFG S-80159CLPF-JJKTFG S-80160ALPF-JBLTFG S-80160BLPF-JFLTFG S-80160CLPF-JJLTFG 5.5 V ±2.0% 5.6 V ±2.0% 5.7 V ±2.0% 5.8 V ±2.0% 5.9 V ±2.0% 6.0 V ±2.0% Seiko Instruments Inc. 9 ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.3.3_00 S-801 Series Pin Configurations SOT-23-5 Top view 5 4 Table 3 Pin No. Pin name Pin description 1 DS*1 ON/OFF switch for delay time 2 VSS GND pin 3 NC*2 No connection 4 OUT Voltage detection output pin 5 VDD Voltage input pin *1. Refer to “2. Delay Circuit” in “ Operation” for operation. *2. The NC pin is electrically open. The NC pin can be connected to VDD or VSS. 1 2 3 Figure 3 SNT-4A Top view 1 2 4 3 Table 4 Pin No. Pin name Pin description 1 VSS GND pin 2 DS*1 ON/OFF switch for delay time 3 VDD Voltage input pin 4 OUT Voltage detection output pin *1. Refer to “2. Delay Circuit” in “ Operation” for operation. Figure 4 10 Seiko Instruments Inc. ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.3.3_00 S-801 Series Absolute Maximum Ratings Table 5 Item Symbol Power supply voltage VDD−VSS Output voltage Nch open-drain output products VOUT CMOS output products Output current IOUT Power SOT-23-5 PD dissipation SNT-4A Operating ambient temperature Topr Storage temperature Tstg *1. When mounted on board [Mounted board] (1) Board size: 114.3 mm × 76.2 mm × t1.6 mm (2) Board name: JEDEC STANDARD51-7 (Ta=25°C unless otherwise specified) Absolute maximum ratings Unit 12 V VSS−0.3 to VSS+12 VSS−0.3 to VDD+0.3 50 mA 250 (When not mounted on board) mW 600*1 140 (When not mounted on board) 300*1 −40 to +85 °C −40 to +125 Caution The absolute maximum ratings are rated values exceeding which the product could suffer physical damage. These values must therefore not be exceeded under any conditions. Power Dissi pation (PD) [ mW] 700 600 500 400 300 200 100 0 0 SNT-4A 100 150 50 Ambient Temperature (Ta) [°C] SOT-23-5 Figure 5 Power Dissipation of Package (When Mounted on Board) Seiko Instruments Inc. 11 ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.3.3_00 S-801 Series Electrical Characteristics Table 6 Item Detection voltage*1 Hysteresis width Current consumption Operating voltage Output current Symbol −VDET VHYS ISS (Ta=25 °C Unless otherwise specified) Test Condition Min. Typ. Max. Unit circuit −VDET(S) −VDET(S) −VDET(S) V 1 — ×0.98 ×1.02 — 30 60 100 mV S-80122 to 26 — 1.3 3.3 μA VDD=3.5 V S-80127 to 39 — 1.5 3.5 VDD=4.5 V S-80140 to 60 — 1.8 4.0 VDD=6.5 V — 0.95 — 10.0 V Output transistor, VDD=1.2 V 0.75 1.5 — mA 2 Nch, VOUT=0.5 V S-80122 to 60 VDD=2.4 V 3.0 6.0 — S-80127 to 60 Only for CMOS output VDD=4.8 V 1.0 2.0 — products, S-80122 to 39 Output transistor, VDD=6.0 V 1.25 2.5 — Pch, VDD–VOUT=0.5 V S-80140 to 54 VDD=8.4 V 1.5 3.0 — S-80155 to 60 Only for Nch open-drain output products, Output transistor, — — 0.1 μA Nch, VDD=10.0 V, VOUT=10.0 V Ta=−40 °C to +85 °C VDD=−VDET+1 V, DS pin Low S-801xxAx S-801xxBx S-801xxCx — ±120 ±360 ppm/ °C 1 VDD IOUT Leakage current Detection voltage temperature coefficient *2 Delay time 1 ILEAK Δ − VDET ΔTa • − VDET 32.5 50 72.5 ms 65 100 145 130 200 290 110 220 330 3 Delay time 2 tD2 μs VDD=−VDET+1 V, DS pin High 1.0 — — V 4 Input voltage VSH DS pin, VDD=6.0 V — — 0.3 VSL DS pin, VDD=6.0 V *1. −VDET: Actual detection voltage value, −VDET(S): Specified detection voltage value (The center value of the detection voltage range in Table 1 to 2.) *2. Temperature change ratio for the detection voltage [mV/°C] is calculated using the following equation. Δ − VDET [mV/ °C]*1 = − VDET(S) (Typ.) [V ]*2 × Δ − VDET [ppm/ °C]*3 ÷ 1000 ΔTa ΔTa • − VDET *1. Temperature change ratio of the detection voltage *2. Specified detection voltage value *3. Detection voltage temperature coefficient tD1 12 Seiko Instruments Inc. ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.3.3_00 S-801 Series Test Circuits 1. A VDD DS OUT VSS V R 100 kΩ DS *1 2. VDD OUT A VSS *1. R is unnecessary for CMOS output products. Figure 6 3. R 100 kΩ DS V *1 Figure 7 4. A VDD OUT VSS V R 100 kΩ *1 VDD DS OUT VSS *1. R is unnecessary for CMOS output products. Figure 8 *1. R is unnecessary for CMOS output products. Figure 9 Seiko Instruments Inc. 13 ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.3.3_00 S-801 Series Operation 1. Basic Operation: CMOS Output (Active Low) 1-1. When the power supply voltage (VDD) is higher than the release voltage (+VDET), the Nch transistor is OFF and the Pch transistor is ON to provide VDD (high) at the output. Since the (RB + RC) • VDD Nch transistor N1 in Figure 10 is OFF, the comparator input voltage is . RA + RB + RC 1-2. When the VDD goes below +VDET, the output provides the VDD level, as long as VDD remains above the detection voltage (–VDET). When the VDD falls below –VDET (point A in Figure 11), the Nch transistor becomes ON, the Pch transistor becomes OFF, and the VSS level appears at the output. At this time the Nch transistor N1 in Figure 10 becomes ON, the comparator RB • VDD . input voltage is changed to RA + RB 1-3. When the VDD falls below the minimum operating voltage, the output becomes undefined, or goes to VDD when the output is pulled up to VDD. 1-4. The VSS level appears when VDD rises above the minimum operating voltage. The VSS level still appears even when VDD surpasses the –VDET, as long as it does not exceed the release voltage +VDET. 1-5. When VDD rises above +VDET (point B in Figure 11), the Nch transistor becomes OFF and the Pch transistor becomes ON to provide VDD at the output. The VDD at the OUT pin is delayed for tD due to the delay circuit. VDD RA + − RB VREF RC N1 DS VSS Nch Delay circuit Pch *1 OUT *1 *1. Paracitic diode Figure 10 Operation 1 14 Seiko Instruments Inc. ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.3.3_00 S-801 Series ( 1) ( 2) Hysterisis width (VHYS) ( 3) ( 4) ( 5) VDD B Release voltage (+VDET) Detection voltage (−VDET) Minimum operating voltage VSS A VDD Output from OUT pin VSS tD Figure 11 Operation 2 2. Delay Circuit 2-1. Delay Time The delay circuit delays the output signal from the time at which the power voltage (VDD) exceeds the release voltage (+VDET) when VDD is turned on. The output signal is not delayed when the VDD goes below the detection voltage (–VDET). (Refer to Figure 11.) The delay time (tD) is a fixed value that is determined by a built-in oscillation circuit and counter. 2-2. DS Pin (ON/OFF Switch Pin for Delay Time) The DS pin should be connected to Low or High. When the DS pin is High, the output delay time becomes short since the output signal is taken from the middle of counter circuit (Refer to Figure 16). 3. Other Characteristics 3-1. Temperature Characteristics of Detection Voltage The shaded area in Figure 12 shows the temperature characteristics of the detection voltage. –VDET [V] +0.792 mV/°C 2.200 –0.792 mV/°C –40 25 85 Ta [°C] Figure 12 Temperature Characteristics of Detection Voltage (Example for S-80122xxxx) Seiko Instruments Inc. 15 ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.3.3_00 S-801 Series 3-2. Temperature Characteristics of Release Voltage The temperature coefficient coefficient Δ + VDET ΔTa Δ + VDET of the release voltage is calculated by the temperature ΔTa Δ − VDET for the detection voltage as follows: ΔTa + VDET Δ − VDET = × − VDET ΔTa The temperature coefficients for the release voltage and the detection voltage have the same sign consequently. 3-3. Temperature Characteristics of Hysteresis Voltage The temperature characteristics for the hysteresis voltage is expressed as is calculated as follows: Δ + VDET Δ − VDET VHYS Δ − VDET − = × ΔTa ΔTa − VDET ΔTa Δ + VDET Δ − VDET and − ΔTa ΔTa Standard Circuit R 100 kΩ *1 VDD DS OUT VSS *1. R is unnecessary for CMOS output products. Figure 13 Caution The above connection diagram and constant will not guarantees successful operation. Perform through using the actual application to set the constant. 16 Seiko Instruments Inc. ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.3.3_00 S-801 Series Technical Terms 1. Detection Voltage (–VDET), Release Voltage (+VDET) The detection voltage (–VDET) is a voltage at which the output turns to low. The detection voltage varies slightly among products of the same specification. The variation of detection voltage between the specified minimum (–VDET) Min. and the maximum (–VDET) Max. is called the detection voltage range (Refer to Figure 14). e.g. For the S-80122AN, the detection voltage lies in the range of 2.156 ≤ (–VDET) ≤ 2.244. This means that some S-80122ANs have 2.156 V for –VDET and some have 2.244 V. The release voltage (+VDET) is a voltage at which the output turns to high. The release voltage varies slightly among products of the same specification. The variation of release voltages between the specified minimum (+VDET) Min. and the maximum (+VDET) Max. is called the release voltage range (Refer to Figure 15). e.g. For the S-80122AN, the release voltage lies in the range of 2.186 ≤ (+VDET) ≤ 2.344. This means that some S-80122ANs have 2.186 V for +VDET and some have 2.344 V. VDD Detection voltage (−VDET) Max. (−VDET) Min. Detection voltage range VDD Release voltage (+VDET) Max. (+VDET) Min. Release voltage range OUT OUT Delay time Figure 14 Detection Voltage Figure 15 Release Voltage Remark Although the detection voltage and release voltage overlap in the range of 2.186 V to 2.244 V, +VDET is always larger than –VDET. Seiko Instruments Inc. 17 ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.3.3_00 S-801 Series 2. Hysteresis Width (VHYS) Hysteresis width is the voltage difference between the detection voltage and the release voltage (The voltage at point B−The voltage at point A=VHYS in Figure 11). The existence of the hysteresis width prevents malfunction caused by noise on input signal. 3. Delay Time (tD) Delay time is a time internally measured from the instant at which input voltage to the VDD pin exceeds the release voltage (+VDET) to the point at which the output of the OUT pin inverts. The delay time is fixed in each series distinguished by A, B and C. S-801xxAx series: typ. 50 ms S-801xxBx series: typ. 100 ms S-801xxCx series: typ. 200 ms The output of the OUT pin can be inverted in a short delay time (tD2) by setting the DS pin High (Refer to Figure 16). V +VDET at DS=”H” OUT VDD tD1 tD2 Figure 16 4. Through-type Current The through-type current refers to the current that flows instantaneously at the time of detection and release of a voltage detector. The through-type current flows at a frequency of 20 kHz during release delay time since the internal logic circuit operates. 18 Seiko Instruments Inc. ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.3.3_00 S-801 Series 5. Oscillation In applications where a resistor is connected to the voltage detector input (Figure 17), taking a CMOS active low products for example, the through-type current which is generated when the output goes from low to high (release) causes a voltage drop equal to [through-type current] × [input resistance] across the resistor. When the input voltage drops below the detection voltage (–VDET) as a result, the output voltage goes to low level. In this state, the through-type current stops and its resultant voltage drop disappears, and the output goes from low to high. The through-type current is again generated, a voltage drop appears, and repeating the process finally induces oscillation. VDD RA VIN S-801 RB VSS OUT Figure 17 Example for Bad Implementation of Input Voltage Divider Precautions • In the S-801 series products, the through-type current flows at a frequency of 20 kHz approximately during the delay time since the internal oscillator circuit and counter timer operate at voltage release. High impedance in the input may cause oscillation by the through-type current. When the input impedance is high, insert a capacitor between VDD pin and VSS pin to prevent oscillation. • Do not apply an electrostatic discharge to this IC that exceeds the performance ratings of the built-in electrostatic protection circuit. • In CMOS output products of the S-801 Series, the through-type current flows at detection and release. If the impedance is high, oscillation may occur due to the voltage drop by the through-type current during releasing. • When designing for mass production using an application circuit described herein, the product deviation and temperature characteristics should be taken into consideration. SII shall not bear any responsibility for the patents on the circuits described herein. • SII claims no responsibility for any and all disputes arising out of or in connection with any infringement of the products including this IC upon patents owned a third party. Seiko Instruments Inc. 19 ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.3.3_00 S-801 Series Typical Characteristics (Typical Data) 1. Detection Voltage (VDET) - Temperature (Ta) S-80122AL 2.4 VDET (+) S-80160AL 6.4 VDET [V] VDET [V] 2.3 6.2 VDET (+) 2.2 VDET (−) 2.1 −40 −20 0 20 40 60 80 100 6.0 VDET (−) 5.8 −40 −20 0 20 40 60 80 100 Ta [°C] Ta [°C)] 2. Hysteresis Voltage Width (VHYS) - Temperature (Ta) S-80122AL S-80160AL 100 90 80 70 60 50 40 30 −40 −20 0 20 40 60 80 100 100 90 80 70 60 50 40 30 −40 −20 0 20 40 60 80 100 VHYS [mV] VHYS [mV] Ta [°C] Ta [°C] 3. Current Consumption (ISS) - Input Voltage (VDD) (a) S-80122AL Ta=25°C 3.5 3.0 2.5 2.9 μA (b) S-80129AL Ta=25°C 3.5 3.0 3.3 μA 2.5 2.0 1.5 1.0 0.5 0.0 ISS [μA] 2.0 1.5 1.0 0.5 0.0 0 2 4 6 8 10 ISS [μA] 0 2 4 6 8 10 VDD [V] VDD [V] (c) S-80130AL 3.5 3.0 2.5 2.0 1.5 1.0 0.5 0.0 0 2 4 6 8 10 5.0 μA (d) S-80160AL Ta=25°C 3.5 3.0 2.5 2.0 1.5 1.0 0.5 0.0 0 2 4 6 8 10 20 μA Ta=25°C ISS [μA] VDD [V] ISS [μA] VDD [V] 20 Seiko Instruments Inc. ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.3.3_00 S-801 Series 4. Current Consumption (ISS) - Temperature (Ta) (a) S-80122AL VDD=3.5 V 5.0 4.0 (b) S-80129AL 5.0 4.0 VDD=4.5 V ISS [μA] 3.0 2.0 1.0 0.0 −40 −20 0 20 40 60 80 100 ISS [μA] 3.0 2.0 1.0 0.0 −40 −20 0 20 40 60 80 100 Ta [°C] Ta [°C] (c) S-80130AL 5.0 4.0 (d) S-80160AL VDD=4.5 V 5.0 4.0 VDD=6.5 V ISS [μA] ISS [μA] 3.0 2.0 1.0 0.0 −40 −20 0 20 40 60 80 100 3.0 2.0 1.0 0.0 −40 −20 0 20 40 60 80 100 Ta [°C] 5. Nch Transistor Output Current (IOUT) -VOUT S-80160AL Ta=25°C 70 60 VDD=1 V, 1.2 V 5.5 V 4V 2.4 V 2V 50 40 30 20 10 0 0 2 4 6 8 10 Ta [°C] 6. Pch Transistor Output Current (IOUT) - (VDD-VOUT) S-80122AL Ta=25°C 40 6V IOUT [mA] IOUT [mA] 30 20 10 0 0 VDD=4 V 4.8 V 10 V 8V 6.5 V 2 4 6 8 10 VOUT [V] 7. Nch Transistor Output Current (IOUT) - Input Voltage (VDD) S-80160AL VDS=0.5 V 25 20 Ta= −40°C 25°C VDD-VOUT [V] 8. Pch transistor Output Current (IOUT) - Input Voltage (VDD) S-80122AL VDS=0.5 V 5 4 Ta= −40°C IOUT [mA] IOUT [mA] 15 10 85°C 5 0 0 2 4 6 8 10 3 2 1 0 0 2 4 6 8 10 85°C 25°C VDD [V] VDD [V] Seiko Instruments Inc. 21 ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.3.3_00 S-801 Series 9. Minimum Operating Voltage - Input Voltage (VDD) S-80122AN 0.6 0.5 Pull-up, VDD:100 kΩ Ta= −40°C 25°C VOUT [V] 0.4 0.3 0.2 0.1 0 0 0.5 85°C 1 1.5 VDD [V] 10. Threshold Voltage of DS Pin - Temperature (Ta) S-80122AL VDD=6.0 V 1 Threshold [V] 0.8 0.6 0.4 0.2 11. Threshold Voltage of DS Pin - Input Voltage (VDD) S-80122AL 1 Threshold [V] 0.8 0.6 0.4 0.2 0 Ta= −40°C 25°C 85°C 0 −40 −20 0 20 40 60 80 100 0 2 4 6 8 10 Ta [°C] 12. Delay Time 1 - Temperature (Ta) S-80122CL 300 VDD [V] S-80160CL VDD=3.2 V Delay time [ms] 300 250 200 150 100 50 0 −40 −20 0 20 40 60 80 100 VDD=7.0 V Delay time [ms] 250 200 150 100 50 0 −40 −20 0 20 40 60 80 100 Ta [°C] Ta [°C] 13. Delay Time 1 - Input Voltage (VDD) S-80122CL 300 Ta=25°C Delay time [ms] 250 200 150 100 50 0 2 4 6 8 10 VDD [V] 22 Seiko Instruments Inc. ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.3.3_00 S-801 Series 14. Delay Time 2 - Temperature (Ta) S-80122AL 400 350 300 250 200 150 100 50 0 −40 −20 0 20 40 60 S-80160AL VDD=3.2 V Delay time [μs] 400 350 300 250 200 150 100 50 0 −40 −20 0 20 40 60 VDD=7.0 V Delay time [μs] 80 100 80 100 Ta [°C] Ta [°C] 15. Delay Time 2 - Input Voltage (VDD) S-80122AN 400 350 300 250 200 150 100 50 0 2 4 6 Ta=25°C Delay time [μs] 8 10 VDD [V] VIH INPUT VOLTAGE VDD VDD DS V *1 S-801 Series VSS OUT R 100 kΩ *2 VIL tD VDD×90 % V OUTPUT VOLTAGE VSS VIH=10 V, VIL=0.95 V *1. Set to VDD or VSS. *2. R is not necessary for CMOS output products. Figure 18 Measurment Condition for Delay Time Figure 19 Measurment Circuit for Delay Time Caution The above connection diagram will not guarantees successful operation. Perform through using the actual application to set the constant. Seiko Instruments Inc. 23 ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.3.3_00 S-801 Series 16. Response Time - Load Capacitor (COUT) S-80122AL 1 S-80122AN 100 Ta=25°C Ta=25°C Response time [ms] Response time [ms] 10 1 0.1 0.01 0.001 tPHL tPLH (Delay time2) 0.0001 0.001 0.01 0.1 0.1 tPHL 0.01 tPLH (Delay time2) 0.001 0.00001 0.0001 0.001 0.01 0.1 0.00001 COUT [μF] COUT [μF] S-80160AL 1 S-80160AN Ta=25°C Response time [ms] 100 10 1 0.1 0.01 0.001 tPHL tPLH (Delay time2) 0.0001 0.001 0.01 0.1 Ta=25°C Response time [ms] 0.1 tPHL 0.01 tPLH (Delay time2) 0.001 0.00001 0.0001 0.001 0.01 0.1 0.00001 COUT [μF] 1 μs VIH INPUT VOLTAGE VIL VDD OUTPUT VOLTAGE COUT [μF] 1 μs VDD VDD V DS S-801 Series VSS OUT V R 100 kΩ *1 tPHL tPLH VDD × 90 % VDD × 10 % VIH=10 V, VIL=0.95 V *1. R is not necessary for CMOS output products. Figure 20 Measurment Condition for Response Time Figure 21 Measurment Circuit for Response Time Caution The above connection diagram will not guarantees successful operation. Perform through using the actual application to set the constant. 24 Seiko Instruments Inc. ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.3.3_00 S-801 Series Application Circuit Examples Microcomputer Reset Circuits If the power supply voltage to a microcomputer falls below the specified level, an unspecified operation may be performed or the contents of the memory register may be lost. When power supply voltage returns to normal, the microcomputer needs to be initialized before normal operations can be done. Reset circuits protect microcomputers in the event of current being momentarily switched off or lowered. Reset circuits shown in Figures 22 to 23 can be easily constructed with the help of the S-801 series that has low operating voltage, a high-precision detection voltage, hysteresis, and a built-in delay circuit. VDD1 VDD VDD2 S801xxAL S801xxAN Microcomputer VSS Microcomputer VSS (Nch open-drain output products only.) Figure 22 Ret Circuit (S-801xxAL) Figure 23 Reset Circuit (S-801xxAN) Caution The above connection diagram will not guarantees successful operation. Perform through using the actual application to set the constant. Seiko Instruments Inc. 25 2.9±0.2 1.9±0.2 5 4 1 2 3 0.16 -0.06 +0.1 0.95±0.1 0.4±0.1 No. MP005-A-P-SD-1.2 TITLE No. SCALE UNIT SOT235-A-PKG Dimensions MP005-A-P-SD-1.2 mm Seiko Instruments Inc. 4.0±0.1(10 pitches:40.0±0.2) +0.1 ø1.5 -0 2.0±0.05 0.25±0.1 ø1.0 -0 +0.2 4.0±0.1 1.4±0.2 3.2±0.2 321 4 5 Feed direction No. MP005-A-C-SD-2.1 TITLE No. SCALE UNIT SOT235-A-Carrier Tape MP005-A-C-SD-2.1 mm Seiko Instruments Inc. 12.5max. Enlarged drawing in the central part ø13±0.2 9.0±0.3 (60°) (60°) No. MP005-A-R-SD-1.1 TITLE No. SCALE UNIT mm SOT235-A-Reel MP005-A-R-SD-1.1 QTY. 3,000 Seiko Instruments Inc. 1.2±0.04 4 3 1 2 +0.05 0.08 -0.02 0.65 0.48±0.02 0.2±0.05 No. PF004-A-P-SD-4.0 TITLE No. SCALE UNIT SNT-4A-A-PKG Dimensions PF004-A-P-SD-4.0 mm Seiko Instruments Inc. ø1.5 -0 +0.1 2.0±0.05 4.0±0.1 0.25±0.05 5° 1.45±0.1 ø0.5 -0 +0.1 4.0±0.1 0.65±0.05 2 1 3 4 Feed direction No. PF004-A-C-SD-1.0 TITLE No. SCALE UNIT SNT-4A-A-Carrier Tape PF004-A-C-SD-1.0 mm Seiko Instruments Inc. 12.5max. Enlarged drawing in the central part ø13±0.2 9.0±0.3 (60°) (60°) No. PF004-A-R-SD-1.0 TITLE No. SCALE UNIT mm SNT-4A-A-Reel PF004-A-R-SD-1.0 QTY. 5,000 Seiko Instruments Inc. 0.52 1.16 0.52 0.3 0.35 0.3 Caution Making the wire pattern under the package is possible. However, note that the package may be upraised due to the thickness made by the silk screen printing and of a solder resist on the pattern because this package does not have the standoff. No. PF004-A-L-SD-3.0 TITLE No. SCALE UNIT SNT-4A-A-Land Recommendation PF004-A-L-SD-3.0 mm Seiko Instruments Inc. • • • • • • The information described herein is subject to change without notice. Seiko Instruments Inc. is not responsible for any problems caused by circuits or diagrams described herein whose related industrial properties, patents, or other rights belong to third parties. The application circuit examples explain typical applications of the products, and do not guarantee the success of any specific mass-production design. When the products described herein are regulated products subject to the Wassenaar Arrangement or other agreements, they may not be exported without authorization from the appropriate governmental authority. Use of the information described herein for other purposes and/or reproduction or copying without the express permission of Seiko Instruments Inc. is strictly prohibited. The products described herein cannot be used as part of any device or equipment affecting the human body, such as exercise equipment, medical equipment, security systems, gas equipment, or any apparatus installed in airplanes and other vehicles, without prior written permission of Seiko Instruments Inc. Although Seiko Instruments Inc. exerts the greatest possible effort to ensure high quality and reliability, the failure or malfunction of semiconductor products may occur. The user of these products should therefore give thorough consideration to safety design, including redundancy, fire-prevention measures, and malfunction prevention, to prevent any accidents, fires, or community damage that may ensue.