SG50N06D2S, SG50N06D3S
Discrete IGBTs
Dimensions SOT-227(ISOTOP)
Dim. A B C D E F G H J K L M N O P Q R S T U Millimeter Min. Max. 31.50 7.80 4.09 4.09 4.09 14.91 30.12 37.80 11.68 8.92 0.76 12.60 25.15 1.98 4.95 26.54 3.94 4.72 24.59 -0.05 3.30 0.780 31.88 8.20 4.29 4.29 4.29 15.11 30.30 38.20 12.22 9.60 0.84 12.85 25.42 2.13 5.97 26.90 4.42 4.85 25.07 0.1 4.57 0.830 Inches Min. Max. 1.240 0.307 0.161 0.161 0.161 0.587 1.186 1.489 0.460 0.351 0.030 0.496 0.990 0.078 0.195 1.045 0.155 0.186 0.968 -0.002 0.130 19.81 1.255 0.323 0.169 0.169 0.169 0.595 1.193 1.505 0.481 0.378 0.033 0.506 1.001 0.084 0.235 1.059 0.174 0.191 0.987 0.004 0.180 21.08
SG50N06D2S
SG50N06D3S
V W
Symbol
o o
Test Conditions
Maximum Ratings 600 600 ±20 ±30 75 50 200 ICM=100 @ 0.8VCES 250 600 60 600 150 300 -40…+150 150 -40…+150 1.5/13 1.5/13 30
o
Unit V V A A W V A A W o C
VCES TJ=25 C to 150 C VCGR TJ=25oC to 150oC; RGE=1M VGES Continuous VGEM Transient IC25 TC=25oC IC90 TC=90oC ICM TC=25oC; 1 ms SSOA VGE=15V; TVJ=125oC; RG=10 (RBSOA) Clamped inductive load; L=30uH PC TC=25oC VRRM IFAVM TC=70oC; rectangular; d=50% IFRM tp 10ms; pulse width limited by TJ PD TC=25oC Maximum lead temperature for soldering 1.6 mm (0.062 in.) from case for 10 s TJ TJM Tstg Md Mounting torque Terminal connection torque(M4) Weight
CASE
DIODE
IGBT
A Nm/Ib.in. g
(TJ=25 C, unless otherwise specified) Symbol BVCES VGE(th) ICES IGES VCE(sat) Test Conditions IC=250uA; VGE=0V IC=250uA; VCE=VGE VCE=0.8VCES; VGE=0V; TJ=25 C TJ=125 C
o o
Characteristic Values min. typ. max. 600 2.5 5.0 200 1 ±100 2.5
Unit V V uA mA nA V
VCE=0V; VGE=±20V IC=IC90; VGE=15V
SG50N06D2S, SG50N06D3S
Discrete IGBTs
(TJ=25oC, unless otherwise specified) Symbol Test Conditions Characteristic Values min. gts IC=IC90; VCE=10V Pulse test, t Cies Coes Cres Qg Qge Qgc td(on) tri td(off) tfi Eoff td(on) tri Eon td(off) tfi Eoff RthJC RthCK Reverse Diode (FRED) Symbol
o
Unit
typ. 50
max. S
35 2%
300us, duty cycle
4100 VCE=25V; VGE=0V; f=1MHz 290 50 110 IC=IC90; VGE=15V; VCE=0.5VCES
o
pF
30 35
nC
Inductive load, TJ=25 C IC=IC90; VGE=15V; L=100uH VCE=0.8VCES; RG=Roff=2.7 Remarks:Switching times may increase for VCE(Clamp) 0.8VCES' higher TJ or increased RG Inductive load, TJ=125 C IC=IC90; VGE=15V; L=100uH VCE=0.8VCES; RG=Roff=2.7 Remarks:Switching times may increase for VCE(Clamp) increased RG 0.8VCES' higher TJ or
o
50 50 110 150 3.0 50 60 3.0 200 250 4.2 0.50 0.05 250 220 4.0
ns ns ns ns mJ ns ns mJ ns ns mJ K/W K/W
(TJ=25oC, unless otherwise specified) Test Conditions Characteristic Values min. typ. max. 1.75 2.40 650 2.5 8.0 35 0.85
o
Unit
VF IR IRM trr RthJC
IF=60A; TVJ=150 C Pulse test, t 300us, duty cycle d TVJ=25oC; VR=VRRM TVJ=150oC
2%; TVJ=25 C
o
V uA mA A ns K/W
IF=IC90; VGE=0V; -diF/dt=100A/us; VR=540V IF=1A; -di/dt=50A/us; VR=30V; TJ=25 C
很抱歉,暂时无法提供与“SG50N06D3S”相匹配的价格&库存,您可以联系我们找货
免费人工找货