M95512-W M95512-R M95512-DF
Datasheet
512-Kbit serial SPI bus EEPROM
Features
SO8N
•
•
(150 mil width)
•
TSSOP8
(169 mil width)
•
•
•
UFDFPN8 (DFN8)
(2 x 3 mm)
WLSCP8
(1.289 x 1.955 mm)
Product status link
M95512-DF
M95512-R
M95512-W
•
•
•
•
•
Compatible with the serial peripheral interface (SPI) bus
Memory array
–
512-Kbit (64-Kbyte) of EEPROM
–
Page size: 128 bytes
–
Additional write lockable page (Identification page)
Write time
–
Byte Write within 5 ms
–
Page Write within 5 ms
Write protect
–
quarter array
–
half array
–
whole memory array
High-speed clock: 16 MHz
Single supply voltage:
–
2.5 V to 5.5 V for M95512-W
–
1.8 V to 5.5 V for M95512-R
–
1.7 V to 5.5 V for M95512-DF
Operating temperature range: from -40 °C up to +85 °C
Enhanced ESD protection
More than 4 million Write cycles
More than 200-year data retention
Packages
–
SO8N (ECOPACK2)
–
TSSOP8 (ECOPACK2)
–
UFDFPN8 (ECOPACK2)
–
WLCSP8 (ECOPACK2)
DS4192 - Rev 24 - September 2021
For further information contact your local STMicroelectronics sales office.
www.st.com
M95512-W M95512-R M95512-DF
Description
1
Description
The M95512 devices are electrically erasable programmable memories (EEPROMs) organized as 65536 x 8 bits,
accessed through the SPI bus.
The M95512-W can operate with a supply voltage from 2.5 V to 5.5 V, the M95512-R can operate with a supply
voltage from 1.8 V to 5.5 V and the M95512-DF can operate with a supply voltage from 1.7 V to 5.5 V, over an
ambient temperature range of -40 °C / +85 °C.
The M95512-DF offers an additional page, named the Identification page (128 bytes). The Identification page can
be used to store sensitive application parameters that can be (later) permanently locked in read-only mode.
Figure 1. Logic diagram
VCC
D
C
S
M95xxx
Q
W
HOLD
VSS
The SPI bus signals are C, D and Q, as shown in Figure 1 and Table 1. The device is selected when Chip select
(S) is driven low. Communications with the device can be interrupted when the HOLD is driven low.
Table 1. Signal names
Signal name
DS4192 - Rev 24
Function
Direction
C
Serial clock
Input
D
Serial data input
Input
Q
Serial data output
Output
S
Chip select
Input
W
Write protect
Input
HOLD
Hold
Input
VCC
Supply voltage
-
VSS
Ground
-
page 2/45
M95512-W M95512-R M95512-DF
Description
Figure 2. 8-pin package connections (top view)
M95xxx
1.
S
1
8
VCC
Q
2
7
HOLD
W
3
6
C
VSS
4
5
D
See Section 10 Package information for package dimensions, and how to identify pin 1.
Figure 3. WLCSP connections
1
A
D
B
C
3
3
VCC
VCC
C
W
D
E
2
1
D
HOLD
HOLD
W
S
Marking side (top view)
C
D
Q
S
A
B
C
Q
VSS
2
VSS
E
Bump side (bottom view)
MS51613V1
Table 2. Signals versus bump position
DS4192 - Rev 24
Position
A
B
C
D
E
1
D
-
W
-
VSS
2
-
C
-
Q
-
3
VCC
-
HOLD
-
S
page 3/45
M95512-W M95512-R M95512-DF
Block diagram
2
Block diagram
The memory is organized as shown in the following figure.
Figure 4. Block diagram
DATA REGISTER
+
ECC
/S
SENSE AMPLIFIERS
X DECODER
PAGE LATCHES
Q
I/O
D
C
HOLD
1. = Identification page
DS4192 - Rev 24
STATUS
REGISTER
CONTROL
LOGIC
Y DECODER
ARRAY
W
CUSTOM AREA(1)
HV GENERATOR
+
SEQUENCER
ADDRESS
REGISTER
MS67262
page 4/45
M95512-W M95512-R M95512-DF
Signal description
3
Signal description
During all operations, VCC must be held stable and within the specified valid range: VCC(min) to VCC(max).
All of the input and output signals must be held high or low (according to voltages of VIH, VOH, VIL or VOL, as
specified in Section 9 DC and AC parameters). These signals are described next.
3.1
Serial data output (Q)
This output signal is used to transfer data serially out of the device. Data is shifted out on the falling edge of Serial
clock (C).
3.2
Serial data input (D)
This input signal is used to transfer data serially into the device. It receives instructions, addresses, and the data
to be written. Values are latched on the rising edge of Serial clock (C).
3.3
Serial clock (C)
This input signal provides the timing of the serial interface. Instructions, addresses, or data present at Serial data
input (D) are latched on the rising edge of Serial clock (C). Data on Serial data output (Q) change from the falling
edge of Serial clock (C).
3.4
Chip select (S)
When this input signal is high, the device is deselected and Serial data output (Q) is at high impedance. The
device is in the Standby power mode, unless an internal Write cycle is in progress. Driving Chip select (S) low
selects the device, placing it in the Active power mode.
After power-up, a falling edge on Chip select (S) is required prior to the start of any instruction.
3.5
Hold (HOLD)
The Hold (HOLD) signal is used to pause any serial communications with the device without deselecting the
device.
During the Hold condition, the Serial data output (Q) is high impedance, and Serial data input (D) and Serial clock
(C) are Don’t care.
To start the Hold condition, the device must be selected, with Chip select (S) driven low.
3.6
Write protect (W)
The main purpose of this input signal is to freeze the size of the area of memory that is protected against Write
instructions (as specified by the values in the BP1 and BP0 bits of the Status register).
This pin must be driven either high or low, and must be stable during all Write instructions.
3.7
VCC supply voltage
VCC is the supply voltage.
3.8
VSS ground
VSS is the reference for all signals, including the VCC supply voltage.
DS4192 - Rev 24
page 5/45
M95512-W M95512-R M95512-DF
Connecting to the SPI bus
4
Connecting to the SPI bus
All instructions, addresses and input data bytes are shifted in to the device, most significant bit first. The Serial
data input (D) is sampled on the first rising edge of the Serial clock (C) after Chip select (S) goes low.
All output data bytes are shifted out of the device, most significant bit first. The Serial data output (Q) is latched on
the first falling edge of the Serial clock (C) after the instruction (such as the Read from Memory array and Read
Status register instructions) have been clocked into the device.
Figure 5. Bus master and memory devices on the SPI bus
VCC
SPI interface with
(CPOL, CPHA) =
(0, 0) or 1, 1)
SDO
SDI
SCK
C Q D
SPI bus master
R
CS3 CS2 CS1
VCC
SPI memory
device
S W HOLD
(1)
(1)
C Q D
R
VCC
SPI memory
device
C Q D
R
SPI memory
device
S W HOLD
(1)
VCC
(1)
S W HOLD
(1)
(1)
VSS
1. The Write protect (W) and Hold (HOLD) signals should be driven, high or low as appropriate.
MS19755V3
Figure 5 shows an example of three memory devices connected to an SPI bus master. Only one memory device
is selected at a given time, so only one memory device drives the Serial data output (Q) line at that time. The
other memory devices are in high impedance state. The pull-up resistor R ensures that a device is not selected if
the Bus master leaves the S line in the high impedance state.
In applications where the bus master can enter a state where the whole input/output SPI bus is high-impedance
at a given time (for example, if the bus master is reset during the transmission of an instruction), it is advised to
connect the clock line (C) to an external pull-down resistor so that, if all inputs/outputs become high-impedance,
the C line is pulled low (while the S line is pulled high). This ensures that S and C do not become high at the
same time, and so, that the tSHCH requirement is met. The typical value of R is 100 kΩ.
DS4192 - Rev 24
page 6/45
M95512-W M95512-R M95512-DF
SPI modes
4.1
SPI modes
These devices can be driven by a microcontroller with its SPI peripheral running in either of the following two
modes:
•
CPOL = 0, CPHA = 0
•
CPOL = 1, CPHA = 1
For these two modes, input data is latched in on the rising edge of Serial clock (C), and output data is available
from the falling edge of Serial clock (C).
The difference between the two modes, as shown in Figure 6, is the clock polarity when the bus master is in
Stand-by mode and not transferring data:
•
C remains at 0 for (CPOL = 0, CPHA = 0)
•
C remains at 1 for (CPOL = 1, CPHA = 1)
Figure 6. SPI modes supported
CPOL
CPHA
0
0
C
1
1
C
D
Q
DS4192 - Rev 24
MSB
MSB
page 7/45
M95512-W M95512-R M95512-DF
Operating features
5
Operating features
5.1
Supply voltage (VCC)
5.1.1
Operating supply voltage (VCC)
Prior to selecting the memory and issuing instructions to it, a valid and stable VCC voltage within the specified
[VCC(min), VCC(max)] range must be applied (see Operating conditions in Section 9 DC and AC parameters).
This voltage must remain stable and valid until the end of the transmission of the instruction and, for a Write
instruction, until the completion of the internal write cycle (tW). In order to secure a stable DC supply voltage, it is
recommended to decouple the VCC line with a suitable capacitor (usually in the range between 10 and 100 nF)
close to the VCC / VSS device pins.
5.1.2
Device reset
In order to prevent erroneous instruction decoding and inadvertent Write operations during power‑up, a
power‑on‑reset (POR) circuit is included. At power-up, the device does not respond to any instruction until
VCC reaches the POR threshold voltage. This threshold is lower than the minimum VCC operating voltage (see
Operating conditions in Section 9 DC and AC parameters).
At power-up, when VCC passes over the POR threshold, the device is reset and is in the following state:
•
•
•
Standby power mode
Deselected
Status register values:
–
Write enable latch (WEL) bit is reset to 0
–
Write in progress (WIP) bit is reset to 0
–
SRWD, BP1 and BP0 bits remain unchanged (non-volatile bits)
It is important to note that the device must not be accessed until VCC reaches a valid and stable level within
the specified [VCC(min), VCC(max)] range, as defined under Operating conditions in Section 9 DC and AC
parameters.
5.1.3
Power-up conditions
When the power supply is turned on, VCC rises continuously from VSS to VCC. During this time, the Chip select (S)
line is not allowed to float but should follow the VCC voltage. It is therefore recommended to connect the S line to
VCC via a suitable pull-up resistor (see Figure 5. Bus master and memory devices on the SPI bus).
In addition, the Chip select (S) input offers a built-in safety feature, as the S input is
edge-sensitive as well as level-sensitive: after power-up, the device does not become selected until a falling edge
has first been detected on Chip select (S). This ensures that Chip select (S) must have been high, prior to going
low to start the first operation.
The VCC voltage has to rise continuously from 0 V up to the minimum VCC operating voltage defined in
Section 9 DC and AC parameters.
5.1.4
Power-down
During power-down (continuous decrease of the VCC supply voltage below the minimum VCC operating voltage
defined in Section 9 DC and AC parameters), the device must be:
•
deselected (Chip select S must be allowed to follow the voltage applied on VCC)
•
DS4192 - Rev 24
in Standby power mode (there must not be any internal write cycle in progress)
page 8/45
M95512-W M95512-R M95512-DF
Active power and Standby power modes
5.2
Active power and Standby power modes
When Chip select (S) is low, the device is selected, and in the Active power mode. The device consumes ICC.
When Chip select (S) is high, the device is deselected. If a Write cycle is not currently in progress, the device then
goes into the Standby power mode, and the device consumption drops to ICC1, as specified in DC characteristics
(see Section 9 DC and AC parameters).
5.3
Hold condition
The Hold (HOLD) signal is used to pause any serial communications with the device without resetting the clocking
sequence.
To enter the Hold condition, the device must be selected, with Chip select (S) low.
During the Hold condition, the Serial data output (Q) is high impedance, and the Serial data input (D) and the
Serial clock (C) are Don’t care.
Normally, the device is kept selected for the whole duration of the Hold condition. Deselecting the device while it is
in the Hold condition has the effect of resetting the state of the device: this mechanism can be used, if required, to
reset the ongoing processes.
This resets the internal logic, except the WEL and WIP bits of the Status register.
In the specific case where the device has moved in a Write command (Inst + Address + data bytes, each data
byte being exactly 8 bits), deselecting the device also triggers the Write cycle of this decoded command.
Figure 7. Hold condition activation
C
HOLD
Hold
condition
Hold
condition
The Hold condition starts when the Hold (HOLD) signal is driven low when Serial clock (C) is already low (as
shown in Figure 7).
Figure 7 also shows what happens if the rising and falling edges are not timed to coincide with Serial clock (C)
being low.
5.4
Status register
The Status register contains a number of status and control bits that can be read or set (as appropriate) by
specific instructions. See Section 6.3 Read Status register (RDSR) for a detailed description of the Status
register bits.
DS4192 - Rev 24
page 9/45
M95512-W M95512-R M95512-DF
Data protection and protocol control
5.5
Data protection and protocol control
The device features the following data protection mechanisms:
•
Before accepting the execution of the Write and Write Status register instructions, the device checks
whether the number of clock pulses comprised in the instructions is a multiple of eight.
•
All instructions that modify data must be preceded by a Write enable (WREN) instruction to set the Write
enable latch (WEL) bit.
•
The Block protect (BP1, BP0) bits in the Status register are used to configure part of the memory as
read‑only.
•
The Write protect (W) signal is used (in conjunction with the SRWD bit) to protect the Block protect (BP1,
BP0) bits in the Status register.
For any instruction to be accepted, and executed, Chip select (S) must be driven high after the rising edge of
Serial clock (C) for the last bit of the instruction, and before the next rising edge of Serial clock (C).
Two points to note in the previous sentence:
•
The “last bit of the instruction” can be the eighth bit of the instruction code, or the eighth bit of a data byte,
depending on the instruction (except for Read Status register (RDSR) and Read (READ) instructions).
•
The “next rising edge of Serial clock (C)” might (or might not) be the next bus transaction for some other
device on the SPI bus.
Table 3. Write-protected block size
Status register bits
DS4192 - Rev 24
Protected block
Protected array addresses
0
None
None
0
1
Upper quarter
C000h - FFFFh
1
0
Upper half
8000h - FFFFh
1
1
Whole memory
0000h - FFFFh
BP1
BP0
0
page 10/45
M95512-W M95512-R M95512-DF
Instructions
6
Instructions
Each command is composed of bytes (MSBit transmitted first), initiated with the instruction byte, as summarized
in Table 4.
If an invalid instruction is sent (one not contained in Table 4), the device automatically enters in a Wait state until
deselected.
Table 4. Instruction set
Instruction
Description
Instruction format
WREN
Write enable
0000 0110
WRDI
Write disable
0000 0100
RDSR
Read Status register
0000 0101
WRSR
Write Status register
0000 0001
READ
Read from Memory array
0000 0011
WRITE
Write to Memory array
0000 0010
(1)
Read Identification page
1000 0011
WRID(1)
Write Identification page
1000 0010
RDLS(1)
Reads the Identification page lock status
1000 0011
Locks the Identification page in read-only mode
1000 0010
RDID
LID(1)
1. Instruction available only for the M95512-D device.
For read and write commands to memory array and Identification page the address is defined by two bytes as
explained in the following table.
Table 5. Significant bits within two address bytes
Instruction
READ
or WRITE
RDID
or WRID
RDLS
or LID
DS4192 - Rev 24
MSB address byte
LSB address byte
b15
b14
b13
b12
b11
b10
b9
b8
b7
b6
b5
b4
b3
b2
b1
b0
A15
A14
A13
A12
A11
A10
A9
A8
A7
A6
A5
A4
A3
A2
A1
A0
0
0
0
0
0
0
0
0
0
A6
A5
A4
A3
A2
A1
A0
0
0
0
0
0
1
0
0
0
0
0
0
0
0
0
0
page 11/45
M95512-W M95512-R M95512-DF
Write enable (WREN)
6.1
Write enable (WREN)
The Write enable latch (WEL) bit must be set prior to each WRITE and WRSR instruction. The only way to do this
is to send a Write enable instruction to the device.
As shown in Figure 8, to send this instruction to the device, Chip select (S) is driven low, and the bits of the
instruction byte are shifted in, on Serial data input (D). The device then enters a wait state. It waits for the device
to be deselected by Chip select (S) being driven high.
Figure 8. Write enable (WREN) sequence
S
0
1
2
3
4
5
6
7
C
Instruction
D
Q
DS4192 - Rev 24
High impedance
MS41478V1
page 12/45
M95512-W M95512-R M95512-DF
Write disable (WRDI)
6.2
Write disable (WRDI)
One way of resetting the Write enable latch (WEL) bit is to send a Write disable instruction to the device.
As shown in Figure 9, to send this instruction to the device, Chip select (S) is driven low, and the bits of the
instruction byte are shifted in, on Serial data input (D).
The device then enters a wait state. It waits for a the device to be deselected, by Chip select (S) being driven
high.
The Write enable latch (WEL) bit, in fact, becomes reset by any of the following events:
•
Power-up
•
WRDI instruction execution
•
WRSR instruction completion
•
WRITE instruction completion.
Figure 9. Write disable (WRDI) sequence
S
0
1
2
3
4
5
6
7
C
Instruction
D
Q
DS4192 - Rev 24
High Impedance
page 13/45
M95512-W M95512-R M95512-DF
Read Status register (RDSR)
6.3
Read Status register (RDSR)
The Read Status register (RDSR) instruction is used to read the Status register. The Status register may be
read at any time, even while a Write or Write Status register cycle is in progress. When one of these cycles is
in progress, it is recommended to check the Write in progress (WIP) bit before sending a new instruction to the
device. It is also possible to read the Status register continuously, as shown in Figure 10.
Figure 10. Read Status register (RDSR) sequence
S
0
1
2
3
4
5
6
7
8
9 10 11 12 13 14 15
C
Instruction
D
Q
High impedance
Status Register Out
7
MSB
6
5
4
3
2
1
Status Register Out
0
7
6
5
4
MSB
3
2
1
0 7
MS47548V1
The status and control bits of the Status register are detailed in the following subsections.
6.3.1
WIP bit
The Write in progress (WIP) bit indicates whether the memory is busy with a Write or Write Status Register cycle.
When set to 1, such a cycle is in progress, when reset to 0, no such cycle is in progress.
6.3.2
WEL bit
The Write enable latch (WEL) bit indicates the status of the internal Write enable latch. When set to 1, the internal
Write enable latch is set. When set to 0, the internal Write enable latch is reset, and no Write or Write Status
Register instruction is accepted.
The WEL bit is returned to its reset state by the following events:
•
Power-up
•
Write Disable (WRDI) instruction completion
•
Write Status Register (WRSR) instruction completion
•
Write (WRITE) instruction completion
6.3.3
BP1, BP0 bits
The Block protect (BP1, BP0) bits are non volatile. They define the size of the area to be software-protected
against Write instructions. These bits are written with the Write Status register (WRSR) instruction. When one
or both of the Block protect (BP1, BP0) bits is set to 1, the relevant memory area (as defined in Table 3. Writeprotected block size) becomes protected against Write (WRITE) instructions. The Block protect (BP1, BP0) bits
can be written provided that the Hardware Protected mode has not been set.
DS4192 - Rev 24
page 14/45
M95512-W M95512-R M95512-DF
Write Status register (WRSR)
6.3.4
SRWD bit
The Status register Write Disable (SRWD) bit is operated in conjunction with the Write protect (W) signal. The
Status register Write Disable (SRWD) bit and Write protect (W) signal enable the device to be put in the Hardware
Protected mode (when the Status register Write Disable (SRWD) bit is set to 1, and Write protect (W) is driven
low). In this mode, the non-volatile bits of the Status register (SRWD, BP1, BP0) become read-only bits and the
Write Status register (WRSR) instruction is no longer accepted for execution.
Table 6. Status register format
b7
b0
SRWD
0
0
0
BP1
BP0
WEL
WIP
Status register Write protect
Block protect bits
Write enable latch bit
Write in progress bit
6.4
Write Status register (WRSR)
The Write Status register (WRSR) instruction is used to write new values to the Status register. Before it can be
accepted, a Write enable (WREN) instruction must have been previously executed.
The Write Status register (WRSR) instruction is entered by driving Chip select (S) low, followed by the instruction
code, the data byte on Serial Data input (D) and Chip select (S) driven high. Chip select (S) must be driven high
after the rising edge of Serial clock (C) that latches in the eighth bit of the data byte, and before the next rising
edge of Serial clock (C). Otherwise, the Write Status register (WRSR) instruction is not executed.
The following figure shows the instruction sequence.
Figure 11. Write Status register (WRSR) sequence
S
0
1
2
3
4
5
6
7
8
9
10
11 12 13 14 15
C
Instruction
D
Status Register In
7
6
5
4
3
2
1
0
MSB
Q
High impedance
MS47556V1
Driving the Chip select (S) signal high at a byte boundary of the input data triggers the
self-timed Write cycle that takes tW to complete (as specified in AC tables in Section 9 DC and AC parameters).
While the Write Status register cycle is in progress, the Status register may still be read to check the value of the
Write in progress (WIP) bit: the WIP bit is 1 during the self-timed Write cycle tW, and 0 when the Write cycle is
complete. The WEL bit (Write enable latch) is also reset at the end of the Write cycle tW.
DS4192 - Rev 24
page 15/45
M95512-W M95512-R M95512-DF
Write Status register (WRSR)
The Write Status register (WRSR) instruction enables the user to change the values of the BP1, BP0 and SRWD
bits:
•
The Block protect (BP1, BP0) bits define the size of the area that is to be treated as read-only, as defined in
Table 3.
•
The SRWD (Status register Write Disable) bit, in accordance with the signal read on the Write protect pin
(W), enables the user to set or reset the Write protection mode of the Status register itself, as defined in
Table 7. When in Write-protected mode, the Write Status register (WRSR) instruction is not executed.
The contents of the SRWD and BP1, BP0 bits are updated after the completion of the WRSR instruction, including
the tW Write cycle.
The Write Status register (WRSR) instruction has no effect on the b6, b5, b4, b1, b0 bits in the Status register.
Bits b6, b5, b4 are always read as 0.
Table 7. Protection modes
W signal
SRWD
bit
1
0
0
0
1
1
0
1
Memory content
Mode
Softwareprotected
(SPM)
Hardwareprotected
(HPM)
Write protection of the Status register
Status register is writable (if the WREN
instruction has set the WEL bit).
The values in the BP1 and BP0 bits can be
changed.
Status register is Hardware write-protected.
The values in the BP1 and BP0 bits cannot be
changed.
Protected
area (1)
Unprotected area(1)
Writeprotected
Ready to accept
Write instructions
Writeprotected
Ready to accept
Write instructions
1. As defined by the values in the Block protect (BP1, BP0) bits of the Status register. See Table 3.
The protection features of the device are summarized in Table 7.
When the Status register Write Disable (SRWD) bit in the Status register is 0 (its initial delivery state), it is
possible to write to the Status register (provided that the WEL bit has previously been set by a WREN instruction),
regardless of the logic level applied on the Write protect (W) input pin.
When the Status register Write Disable (SRWD) bit in the Status register is set to 1, two cases should be
considered, depending on the state of the Write protect (W) input pin:
•
If Write protect (W) is driven high, it is possible to write to the Status register (provided that the WEL bit has
previously been set by a WREN instruction).
•
If Write protect (W) is driven low, it is not possible to write to the Status register even if the WEL bit has
previously been set by a WREN instruction. (Attempts to write to the Status register are rejected, and are
not accepted for execution). As a consequence, all the data bytes in the memory area, which are Softwareprotected (SPM) by the Block protect (BP1, BP0) bits in the Status register, are also hardware-protected
against data modification.
Regardless of the order of the two events, the Hardware-protected mode (HPM) can be entered by:
•
either setting the SRWD bit after driving the Write protect (W) input pin low,
•
or driving the Write protect (W) input pin low after setting the SRWD bit.
Once the Hardware-protected mode (HPM) has been entered, the only way of exiting it is to pull high the Write
protect (W) input pin.
If the Write protect (W) input pin is permanently tied high, the Hardware-protected mode (HPM) can never be
activated, and only the Software-protected mode (SPM), using the Block protect (BP1, BP0) bits in the Status
register, can be used.
DS4192 - Rev 24
page 16/45
M95512-W M95512-R M95512-DF
Read from Memory array (READ)
6.5
Read from Memory array (READ)
As shown in Figure 12, to send this instruction to the device, Chip select (S) is first driven low. The bits of the
instruction byte and address bytes are then shifted in, on Serial data input (D). The address is loaded into an
internal address register, and the byte of data at that address is shifted out, on Serial data output (Q).
Figure 12. Read from Memory array (READ) sequence
S
0 1 2 3 4 5 6 7 8 9 10
20 21 22 23 24 25 26 27 28 29 30 31
C
Instruction
16-Bit Address
15 14 13
D
3 2 1 0
MSB
High Impedance
Q
Data Out 1
7 6 5 4 3
Data Out 2
2 1 0 7
MSB
If Chip select (S) continues to be driven low, the internal address register is incremented automatically, and the
byte of data at the new address is shifted out.
When the highest address is reached, the address counter rolls over to zero, allowing the Read cycle to be
continued indefinitely. The whole memory can, therefore, be read with a single READ instruction.
The Read cycle is terminated by driving Chip select (S) high. The rising edge of the Chip select (S) signal can
occur at any time during the cycle.
The instruction is not accepted, and is not executed, if a Write cycle is currently in progress.
DS4192 - Rev 24
page 17/45
M95512-W M95512-R M95512-DF
Write to Memory array (WRITE)
6.6
Write to Memory array (WRITE)
As shown in Figure 13, to send this instruction to the device, Chip select (S) is first driven low. The bits of the
instruction byte, address byte, and at least one data byte are then shifted in, on Serial data input (D).
The instruction is terminated by driving Chip select (S) high at a byte boundary of the input data. The self‑timed
Write cycle, triggered by the Chip select (S) rising edge, continues for a period tW (as specified in AC
characteristics in Section 9 DC and AC parameters), at the end of which the Write in Progress (WIP) bit is
reset to 0.
Figure 13. Byte Write (WRITE) sequence
S
0 1 2 3 4 5 6 7 8 9 10
20 21 22 23 24 25 26 27 28 29 30 31
C
Instruction
D
Q
16-bit address
15 14 13
Data byte
3 2 1 0 7 6 5 4 3 2 1 0
High impedance
In the case of Figure 13, Chip select (S) is driven high after the eighth bit of the data byte has been latched
in, indicating that the instruction is being used to write a single byte. However, if Chip select (S) continues to
be driven low (as shown in Figure 14), the next byte of input data is shifted in, so that more than a single byte,
starting from the given address towards the end of the same page, can be written in a single internal Write cycle.
Each time a new data byte is shifted in, the least significant bits of the internal address counter are incremented.
If more bytes are sent than will fit up to the end of the page, a condition known as “roll-over” occurs. In case of
roll-over, the bytes exceeding the page size are overwritten from location 0 of the same page.
The instruction is not accepted, and is not executed, under the following conditions:
•
if the Write enable latch (WEL) bit has not been set to 1 (by executing a Write enable instruction just before),
•
if a Write cycle is already in progress,
•
if the device has not been deselected, by driving high Chip select (S), at a byte boundary (after the eighth
bit, b0, of the last data byte that has been latched in),
•
if the addressed page is in the region protected by the Block protect (BP1 and BP0) bits.
Note:
DS4192 - Rev 24
The self-timed write cycle tW is internally executed as a sequence of two consecutive events: [Erase addressed
byte(s)], followed by [Program addressed byte(s)]. An erased bit is read as “0” and a programmed bit is read as
“1”.
page 18/45
M95512-W M95512-R M95512-DF
Write to Memory array (WRITE)
Figure 14. Page Write (WRITE) sequence
S
0 1 2 3 4 5 6 7 8 9 10
20 21 22 23 24 25 26 27 28 29 30 31
C
Instruction
16-Bit Address
15 14 13
D
Data Byte 1
3 2 1 0 7 6 5 4 3 2 1 0
S
32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47
C
Data Byte 2
D
DS4192 - Rev 24
Data Byte 3
7 6 5 4 3 2 1 0 7 6 5 4 3 2 1 0
Data Byte N
6 5 4 3 2 1 0
page 19/45
M95512-W M95512-R M95512-DF
Read Identification page (available only in M95512-D devices)
6.6.1
Cycling with Error Correction Code (ECC x 4)
The M95512 devices offer an Error Correction Code (ECC) logic. The ECC is an internal logic function
transparent for the SPI communication protocol.
The ECC logic is implemented on each group of four EEPROM bytes (A group of four bytes is located at
addresses [4*N, 4*N+1, 4*N+2, 4*N+3], where N is an integer. Inside a group, if a single bit out of the four bytes
happens to be erroneous during a Read operation, the ECC detects this bit and replaces it with the correct value.
The read reliability is therefore much improved.
Even if the ECC function is performed on groups of four bytes, a single byte can be written/cycled independently.
In this case, the ECC function also writes/cycles the three other bytes located in the same group. As a
consequence, the maximum cycling budget is defined at group level and the cycling can be distributed over
the four bytes of the group: the sum of the cycles seen by byte0, byte1, byte2 and byte3 of the same group must
remain below the maximum value defined in Table 13. Cycling performance by groups of four bytes.
6.7
Read Identification page (available only in M95512-D devices)
The Identification page (128 bytes) is an additional page that can be written and (later) permanently locked in
Read-only mode. This page is read with the Read Identification page instruction (see Table 4. Instruction set). The
Chip select signal (S) is first driven low, the bits of the instruction byte and address bytes are then shifted in, on
Serial data input (D). Address bit A10 must be 0, upper address bits are Don't care, and the data byte pointed to
by the lower address bits [A6:A0] is shifted out on Serial data output (Q). If Chip select (S) continues to be low,
the internal address register is automatically incremented, and the byte of data at the new address is shifted out.
The number of bytes to read in the ID page must not exceed the page boundary, otherwise unexpected data are
read (for instance when reading the ID page from location 90d, the number of bytes must be lower than or equal
to 38d, as the ID page boundary is 128 bytes).
The read cycle is terminated by driving Chip select (S) high. The rising edge of the Chip select (S) signal can
occur at any time during the cycle. The first byte addressed can be any byte within any page.
The instruction is not accepted, and is not executed, if a write cycle is currently in progress.
Figure 15. Read Identification page sequence
S
0 1 2 3 4 5 6 7 8 9 10
20 21 22 23 24 25 26 27 28 29 30 31
C
Instruction
D
16-bit address
15 14 13
3
2
1
0
MSB
Q
High impedance
Data Out 1
7
6
5
4
3
2
Data Out 2
1
0
7
MSB
DS4192 - Rev 24
page 20/45
M95512-W M95512-R M95512-DF
Write Identification page (available only in M95512-D devices)
6.8
Write Identification page (available only in M95512-D devices)
The Identification page (128 bytes) is an additional page that can be written and (later) permanently locked in
Read-only mode.
Writing this page is achieved with the Write Identification page instruction (see Table 4. Instruction set). The Chip
select signal (S) is first driven low. The bits of the instruction byte, address bytes, and at least one data byte are
then shifted in on Serial data input (D). Address bit A10 must be 0, upper address bits are Don't care, the lower
address bits [A5:A0] define the byte address within the Identification page. The instruction sequence is shown in
the figure below.
Figure 16. Write Identification page sequence
S
0
1
2
3
4
5
6
7
8
9 10
20 21 22 23 24 25 26 27 28 29 30 31
C
Instruction
16-bit address
D
15 14 13
3
2
Data byte
1
0
7
6
5
4
3
2
1
0
High impedance
Q
6.9
Read Lock status (available only in M95512-D devices)
The Read Lock status instruction (see Table 4. Instruction set) is used to check whether the Identification page is
locked or not in Read-only mode. The Read Lock status sequence is defined with the Chip select (S) first driven
low. The bits of the instruction byte and address bytes are then shifted in on Serial data input (D). Address bit A10
must be 1, all other address bits are Don't care. The Lock bit is the LSB (least significant bit) of the byte read on
Serial data output (Q). It is at “1” when the lock is active and at “0” when the lock is not active. If Chip select (S)
continues to be driven low, the same data byte is shifted out. The read cycle is terminated by driving Chip select
(S) high.
The following figure shows the instruction sequence.
Figure 17. Read Lock status sequence
S
0
1
2
3
4
5
6
7
8
9 10
20 21 22 23 24 25 26 27 28 29 30 31
C
Instruction
16-bit address
15 14 13
D
3
2
1
0
MSB
Data Out 1
High impedance
Q
7
6
5
4
3
2
Data Out 2
1
0
7
MSB
DS4192 - Rev 24
page 21/45
M95512-W M95512-R M95512-DF
Lock ID (available only in M95512-D devices)
6.10
Lock ID (available only in M95512-D devices)
The Lock ID instruction permanently locks the Identification page in read-only mode. Before this instruction can be
accepted, a Write enable (WREN) instruction must have been executed.
The Lock ID instruction is issued by driving Chip select (S) low, sending the instruction code, the address and a
data byte on Serial data input (D), and driving Chip select (S) high. In the address sent, A10 must be equal to 1,
all other address bits are Don't Care. The data byte sent must be equal to the binary value xxxx xx1x, where x =
Don't care.
Chip select (S) must be driven high after the rising edge of Serial clock (C) that latches in the eighth bit of the data
byte, and before the next rising edge of Serial clock (C). Otherwise, the Lock ID instruction is not executed.
Driving Chip select (S) high at a byte boundary of the input data triggers the self-timed write cycle whose duration
is tW (as specified in AC characteristics in Section 9 DC and AC parameters). The instruction sequence is shown
in Figure 18. Lock ID sequence.
The instruction is discarded, and is not executed, under the following conditions:
•
If a Write cycle is already in progress
•
If Block protect bits (BP1,BP0) = (1,1)
•
If a rising edge on Chip select (S) happens outside of a byte boundary
•
If the Write enable latch (WEL) bit has not been set to 1 (by executing a Write enable instruction just before)
Figure 18. Lock ID sequence
S
0
1
2
3
4
5
6
7
8
9 10
20 21 22 23 24 25 26 27 28 29 30 31
C
Instruction
D
16-bit address
15 14 13
3
2
Data byte
1
0
7
6
5
4
3
2
1
0
High impedance
Q
DS4192 - Rev 24
page 22/45
M95512-W M95512-R M95512-DF
Power-up and delivery state
7
Power-up and delivery state
7.1
Power-up state
After power-up, the device is in the following state:
•
Standby power mode
•
Deselected (after power-up, a falling edge is required on Chip select (S) before any instructions can be
started)
•
Not in the Hold condition
•
The Write enable latch (WEL) is reset to 0
•
Write in progress (WIP) is reset to 0
The SRWD, BP1 and BP0 bits of the Status register are unchanged from the previous power-down (they are
non-volatile bits).
7.2
Initial delivery state
The device is delivered with the memory array and Identification page bits set to all 1s (each byte = FFh). The
Status register Write Disable (SRWD) and Block protect (BP1 and BP0) bits are initialized to 0.
DS4192 - Rev 24
page 23/45
M95512-W M95512-R M95512-DF
Maximum ratings
8
Maximum ratings
Stressing the device outside the ratings listed in Table 8 may cause permanent damage to the device. These
are stress ratings only, and operation of the device at these, or any other conditions outside those indicated in
the operating sections of this specification, is not implied. Exposure to absolute maximum rating conditions for
extended periods may affect device reliability.
Table 8. Absolute maximum ratings
Symbol
Parameter
Min.
Max.
TAMB
Ambient operating temperature
–40
130
TSTG
Storage temperature
–65
150
TLEAD
Lead temperature during soldering
See note
°C
(1)
VO
Output voltage
–0.50
VCC + 0.6
VI
Input voltage
–0.50
6.5
VCC
Supply voltage
–0.50
6.5
IOL
DC output current (Q = 0)
-
5
IOH
DC output current (Q = 1)
-
5
Electrostatic discharge voltage (human body model) (2)
-
4000
VESD
Unit
V
mA
V
1. Compliant with JEDEC standard J-STD-020 (for small-body, Sn-Pb or Pb free assembly), the ST ECOPACK 7191395
specification, and the European directive on Restrictions on Hazardous Substances (RoHS directive 2011/65/EU of July
2011).
2. Positive and negative pulses applied on different combinations of pin connections, according to AEC-Q100-002 (compliant
with ANSI/ESDA/JEDEC JS-001-2012, C1 = 100 pF, R1 = 1500 Ω, R2 = 500 Ω).
DS4192 - Rev 24
page 24/45
M95512-W M95512-R M95512-DF
DC and AC parameters
9
DC and AC parameters
This section summarizes the operating conditions and the DC/AC characteristics.
Table 9. Operating conditions (M95512-W, device grade 6)
Symbol
Min.
Max.
Unit
Supply voltage
2.5
5.5
V
Ambient operating temperature
–40
85
°C
Min.
Max.
Unit
Supply voltage
1.8
5.5
V
Ambient operating temperature
-40
85
°C
Min.
Max.
Unit
Supply voltage
1.7
5.5
V
Ambient operating temperature
–40
85
°C
Min.
Max.
Unit
Load capacitance
-
100
pF
-
Input rise and fall times
-
25
ns
-
Input pulse voltages
0.2 VCC to 0.8 VCC
V
-
Input and output timing reference voltages
0.3 VCC to 0.7 VCC
V
VCC
TA
Parameter
Table 10. Operating conditions (M95512-R, device grade 6)
Symbol
VCC
TA
Parameter
Table 11. Operating conditions (M95512-DF, device grade 6)
Symbol
VCC
TA
Parameter
Table 12. AC measurement conditions
Symbol
CL
Parameter
Figure 19. AC measurement I/O waveform
Input Levels
Input and Output
Timing Reference Levels
0.8 ₓ VCC
0.7 ₓ VCC
0.3 ₓ VCC
0.2 ₓ VCC
DS4192 - Rev 24
page 25/45
M95512-W M95512-R M95512-DF
DC and AC parameters
Table 13. Cycling performance by groups of four bytes
Symbol
Parameter
Ncycle
Test condition
Write cycle endurance(1)
Min.
Max.
TA ≤ 25 °C, VCC(min) < VCC < VCC(max)
-
4,000,000
TA = 85 °C, VCC(min) < VCC < VCC(max)
-
1,200,000
Unit
Write cycle(2)
1. The Write cycle endurance is defined for groups of four data bytes located at addresses [4*N, 4*N+1, 4*N+2, 4*N+3], where
N is an integer. The Write cycle endurance is evaluated by characterization and qualification.
2. A Write cycle is executed when either a Page write, a Byte write, a WRSR, a WRID or an LID instruction is decoded. When
using the Byte write, the Page write or the WRID instruction, refer also to Section 6.6.1 Cycling with Error Correction Code
(ECC x 4).
Table 14. Memory cell data retention
Parameter
Test condition
Min.
Max.
Unit
-
200
Year
TA = 55 °C
Data retention(1)
1. The data retention behaviour is checked in production, while the 200-year limit is evaluated by characterization and
qualification results.
Table 15. Capacitance
Test condition(1)
Min.
Max.
Unit
VOUT = 0 V
-
8
pF
Input capacitance (D)
VIN = 0 V
-
8
pF
Input capacitance (other pins)
VIN = 0 V
-
6
pF
Symbol
COUT
CIN
Parameter
Output capacitance (Q)
1. Evaluated By Characterization at TA = 25 °C and frequency of 5 MHz – Not tested in production.
Table 16. DC characteristics (M95512-W, device grade 6)
Symbol
Parameter
Test conditions in addition to those defined in Table 9
Min.
Max.
Unit
ILI
Input leakage current
VIN = VSS or VCC
-
±2
µA
ILO
Output leakage current
S = VCC, Q = VSS or VCC
-
±2
µA
ICC
Supply current (Read)
C = 0.1 VCC / 0.9 VCC at 10 MHz, VCC = 2.5 V, Q = open
-
4
mA
C = 0.1 VCC / 0.9 VCC at 16 MHz, VCC = 5 V, Q = open
-
8
mA
ICC0 (1)
Supply current (Write)
During tW, S = VCC, 2.5 V ≤ VCC ≤ 5.5 V
-
2
mA
Supply current
S = VCC, VCC= 2.5 V, VIN = VSS or VCC
-
2
(Standby Power mode)
S = VCC, VCC= 5.5 V, VIN = VSS or VCC
-
3
VIL
Input low voltage
-
–0.45
0.3 VCC
V
VIH
Input high voltage
-
0.7 VCC
VCC+1
V
VOL
Output low voltage
VCC = 2.5 V and IOL = 1.5 mA or VCC = 5 V and IOL = 2 mA
-
0.4
V
VOH
Output high voltage
0.8 VCC
-
V
ICC1
VCC = 2.5 V and IOH = –0.4 mA or
VCC = 5 V and IOH = –2 mA
µA
1. Evaluated By Characterization - Not tested in production.
DS4192 - Rev 24
page 26/45
M95512-W M95512-R M95512-DF
DC and AC parameters
Table 17. DC characteristics (M95512-R, device grade 6)
Symbol
Test conditions in addition to those defined in Table 10(1)
Parameter
Min
Max
Unit
ILI
Input leakage current
VIN = VSS or VCC
-
±2
µA
ILO
Output leakage current
S = VCC, Q = VSS or VCC
-
±2
µA
ICC
Supply current (Read)
C = 0.1 VCC / 0.9 VCC at 5 MHz, VCC= 1.8 V, Q = open
-
2.5
mA
ICC0 (2)
Supply current (Write)
During tW, S = VCC, 1.8 V ≤ VCC < 2.5 V
-
1.5
mA
ICC1
Supply current (Standby
Power mode)
S = VCC, VCC = 1.8 V, VIN = VSS or VCC
-
1
µA
VIL
Input low voltage
-
– 0.45
0.3 VCC
V
VIH
Input high voltage
-
0.7 VCC VCC + 1
V
VOL
Output low voltage
IOL = 0.15 mA, VCC = 1.8 V
-
0.3
V
VOH
Output high voltage
IOH = –0.1 mA, VCC = 1.8 V
0.8 VCC
-
V
1. If the application uses the M95512-R devices with 2.5 V ≤ VCC ≤ 5.5 V and - 40 °C < TA < + 85 °C, refer to Table 16 instead
of the above table.
2. Evaluated By Characterization - Not tested in production.
Table 18. DC characteristics (M95512-DF, device grade 6)
Symbol
Test conditions in addition to those defined in Table 11(1)
Parameter
Min.
Max.
Unit
ILI
Input leakage current
VIN = VSS or VCC
-
±2
µA
ILO
Output leakage current
S = VCC, Q = VSS or VCC
-
±2
µA
ICC
Supply current (Read)
-
2.5
mA
ICC0(2)
Supply current (Write)
During tW, S = VCC, 1.7 ≤ VCC < 2.5 V
-
1.5
mA
ICC1
Supply current (Standby)
S = VCC, VCC = 1.7 V, VIN = VSS or VCC
-
1
µA
VIL
Input low voltage
-
– 0.45
0.3 VCC
V
VIH
Input high voltage
-
0.7 VCC VCC + 1
V
VOL
Output low voltage
IOL = 0.15 mA, VCC = 1.7 V
-
0.3
V
VOH
Output high voltage
IOH = –0.1 mA, VCC = 1.7 V
0.8 VCC
-
V
C = 0.1 VCC / 0.9 VCC at 5 MHz, VCC = 1.7 V,
Q = open
1. If the application uses the M95512-DF devices with 2.5 V ≤ VCC ≤ 5.5 V and –40 °C ≤ TA ≤ +85 °C, refer to Table 16, rather
than to the above table.
2. Evaluated By Characterization - Not tested in production.
DS4192 - Rev 24
page 27/45
M95512-W M95512-R M95512-DF
DC and AC parameters
Table 19. AC characteristics
Test conditions specified either in Table 9, Table 10 or in Table 11 and in Table 12
Symbol
Alt.
fC
fSCK
Parameter
Clock frequency
1.7 V ≤ VCC < 2.5 V 2.5 V ≤ VCC < 4.5 V VCC ≥ 4.5V
Min. Max.
Unit
Min.
Max.
Min.
Max.
DC
5
DC
10
DC
16
MHz
tSLCH
tCSS1 S active setup time
60
-
30
-
20
-
ns
tSHCH
tCSS2 S not active setup time
60
-
30
-
20
-
ns
tSHSL
tCS
S deselect time
90
-
40
-
25
-
ns
tCHSH
tCSH
S active hold time
60
-
30
-
20
-
ns
tCHSL
-
S not active hold time
60
-
30
-
20
-
ns
tCH (1)
tCLH
Clock high time
80
-
40
-
25
-
ns
tCL(1)
tCLL
Clock low time
80
-
40
-
25
-
ns
tCLCH (2)
tRC
Clock rise time
-
2
-
2
-
2
µs
tCHCL(2)
tFC
Clock fall time
-
2
-
2
-
2
µs
tDVCH
tDSU
Data in setup time
20
-
10
-
10
-
ns
tCHDX
tDH
Data in hold time
20
-
10
-
10
-
ns
tHHCH
-
Clock low hold time after HOLD not active
60
-
30
-
25
-
ns
tHLCH
-
Clock low hold time after HOLD active
60
-
30
-
20
-
ns
tCLHL
-
Clock low setup time before HOLD active
0
-
0
-
0
-
ns
tCLHH
-
Clock low setup time before HOLD not active
0
-
0
-
0
-
ns
tSHQZ(2)
tDIS
Output disable time
-
80
-
40
-
25
ns
tCLQV
tV
Clock low to output valid
-
80
-
40
-
25
ns
tCLQX
tHO
Output hold time
0
-
0
-
0
-
ns
tQLQH(2)
tRO
Output rise time
-
80
-
40
-
10
ns
tQHQL(2)
tFO
Output fall time
-
80
-
40
-
10
ns
tHHQV
tLZ
HOLD high to output valid
-
80
-
40
-
25
ns
tHLQZ(2)
tHZ
HOLD low to output High-Z
-
80
-
40
-
25
ns
tW
tWC
Write time
-
5
-
5
-
5
ms
1. tCH + tCL must never be less than the shortest possible clock period, 1 / fC(max).
2. Evaluated By Characterization - Not tested in production.
DS4192 - Rev 24
page 28/45
M95512-W M95512-R M95512-DF
DC and AC parameters
Figure 20. Serial input timing
tSHSL
S
tCHSL
tCH
tSLCH
tCHSH
tSHCH
C
tDVCH
tCL
tCHCL
tCLCH
tCHDX
D
LSB IN
MSB IN
High impedance
Q
Figure 21. Hold timing
S
tHLCH
tCLHL
tHHCH
C
tCLHH
tHLQZ
tHHQV
Q
HOLD
Figure 22. Serial output timing
S
tSHSL
tCH
C
tCLQV
tCLCH
tCHCL
tCL
tSHQZ
tCLQX
Q
tQLQH
tQHQL
D
DS4192 - Rev 24
ADDR
LSB IN
page 29/45
M95512-W M95512-R M95512-DF
Package information
10
Package information
In order to meet environmental requirements, ST offers these devices in different grades of ECOPACK packages,
depending on their level of environmental compliance. ECOPACK specifications, grade definitions and product
status are available at: www.st.com. ECOPACK is an ST trademark.
10.1
SO8N package information
SO8N is an 8-lead, 4.9 x 6 mm, plastic small outline, 150 mils body width, package.
Figure 23. SO8N – Outline
h x 45˚
A
A2
c
ccc
b
e
0.25 mm
D
GAUGE PLANE
k
8
E1
1
E
A1
L
L1
1.
DS4192 - Rev 24
Drawing is not to scale.
page 30/45
M95512-W M95512-R M95512-DF
SO8N package information
Table 20. SO8N – Mechanical data
Symbol
inches (1)
millimeters
Min.
Typ.
Max.
Min.
Typ.
Max.
A
-
-
1.750
-
-
0.0689
A1
0.100
-
0.250
0.0039
-
0.0098
A2
1.250
-
-
0.0492
-
-
b
0.280
-
0.480
0.0110
-
0.0189
c
0.170
-
0.230
0.0067
-
0.0091
D
4.800
4.900
5.000
0.1890
0.1929
0.1969
E
5.800
6.000
6.200
0.2283
0.2362
0.2441
E1
3.800
3.900
4.000
0.1496
0.1535
0.1575
e
-
1.270
-
-
0.0500
-
h
0.250
-
0.500
0.0098
-
0.0197
k
0°
-
8°
0°
-
8°
L
0.400
-
1.270
0.0157
-
0.0500
L1
-
1.040
-
-
0.0409
-
ccc
-
-
0.100
-
-
0.0039
1. Values in inches are converted from mm and rounded to four decimal digits.
Figure 24. SO8N - Recommended footprint
3.9
6.7
0.6 (x8)
1.27
1.
DS4192 - Rev 24
Dimensions are expressed in millimeters.
page 31/45
M95512-W M95512-R M95512-DF
TSSOP8 package information
10.2
TSSOP8 package information
TSSOP8 is an 8-lead thin shrink small outline, 3 x 6.4 mm, 0.65 mm pitch, package.
Figure 25. TSSOP8 – Outline
D
8
5
c
E1
1
E
4
α
A1
CP
A2
A
b
1.
L
L1
e
Drawing is not to scale.
Table 21. TSSOP8 – Mechanical data
Symbol
inches (1)
millimeters
Min.
Typ.
Max.
Min.
Typ.
Max.
A
-
-
1.200
-
-
0.0472
A1
0.050
-
0.150
0.0020
-
0.0059
A2
0.800
1.000
1.050
0.0315
0.0394
0.0413
b
0.190
-
0.300
0.0075
-
0.0118
c
0.090
-
0.200
0.0035
-
0.0079
CP
-
-
0.100
-
-
0.0039
D
2.900
3.000
3.100
0.1142
0.1181
0.1220
e
-
0.650
-
-
0.0256
-
E
6.200
6.400
6.600
0.2441
0.2520
0.2598
E1
4.300
4.400
4.500
0.1693
0.1732
0.1772
L
0.450
0.600
0.750
0.0177
0.0236
0.0295
L1
-
1.000
-
-
0.0394
-
α
0°
-
8°
0°
-
8°
1. Values in inches are converted from mm and rounded to four decimal digits.
DS4192 - Rev 24
page 32/45
M95512-W M95512-R M95512-DF
TSSOP8 package information
Figure 26. TSSOP8 – Recommended footprint
2.3
1.0
7.0
0.65
0.35
1.
DS4192 - Rev 24
Dimensions are expressed in millimeters.
page 33/45
M95512-W M95512-R M95512-DF
UFDFPN8 (DFN8) package information
10.3
UFDFPN8 (DFN8) package information
UFDFPN8 is an 8-lead, 2 × 3 mm, 0.55 mm thickness ultra thin profile fine pitch dual flat package.
Figure 27. UFDFPN8 - Outline
D
N
A B
A
ccc C
Pin #1
ID marking
E
A1
C
eee C
Seating plane
A3
Side view
2x
aaa C
1
aaa C
2x
2
Top view
D2
e
1
2
L3
Datum A
b
L1
L L3
Pin #1
ID marking
E2
K
L
e/2
L1
e
Terminal tip
Detail “A”
Even terminal
ND-1 x e
Bottom view
1.
2.
3.
4.
DS4192 - Rev 24
See Detail “A”
Maximum package warpage is 0.05 mm.
Exposed copper is not systematic and can appear partially or totally according to the cross section.
Drawing is not to scale.
The central pad (the area E2 by D2 in the above illustration) must be either connected to VSS or left floating
(not connected) in the end application.
page 34/45
M95512-W M95512-R M95512-DF
UFDFPN8 (DFN8) package information
Table 22. UFDFPN8 - Mechanical data
Symbol
inches(1)
millimeters
Min
Typ
Max
Min
Typ
Max
A
0.450
0.550
0.600
0.0177
0.0217
0.0236
A1
0.000
0.020
0.050
0.0000
0.0008
0.0020
b(2)
0.200
0.250
0.300
0.0079
0.0098
0.0118
D
1.900
2.000
2.100
0.0748
0.0787
0.0827
D2
1.200
-
1.600
0.0472
-
0.0630
E
2.900
3.000
3.100
0.1142
0.1181
0.1220
E2
1.200
-
1.600
0.0472
-
0.0630
e
-
0.500
-
-
0.0197
-
K
0.300
-
-
0.0118
-
-
L
0.300
-
0.500
0.0118
-
0.0197
L1
-
-
0.150
-
-
0.0059
L3
0.300
-
-
0.0118
-
-
aaa
-
-
0.150
-
-
0.0059
bbb
-
-
0.100
-
-
0.0039
ccc
-
-
0.100
-
-
0.0039
ddd
-
-
0.050
-
-
0.0020
eee(3)
-
-
0.080
-
-
0.0031
1. Values in inches are converted from mm and rounded to four decimal digits.
2. Dimension b applies to plated terminal and is measured between 0.15 and 0.30 mm from the terminal tip.
3. Applied for exposed die paddle and terminals. Exclude embedding part of exposed die paddle from measuring.
Figure 28. UFDFPN8 - Recommended footprint
1.400
0.500
0.300
0.600
1.200
1.300
1.
DS4192 - Rev 24
Dimensions are expressed in millimetres.
page 35/45
M95512-W M95512-R M95512-DF
WLCSP8 (CS) package information
10.4
WLCSP8 (CS) package information
This WLCSP is a 8-bump, 1.289 x 1.955 mm, 0.5 mm pitch wafer level chip scale package.
Figure 29. WLCSP8 - Outline
e1
bbb Z
D
X
Orientation
reference
Y
Orientation
reference
e3
e2
Detail A
e
E
G
aaa
Wafer back side
A
A2
(4X)
Side view
F
Bump side
Bump
Detail A
rotated by 90°
A1
eee Z
Z
b (8X)
Ø ccc M Z X Y
Øddd M Z
1.
2.
3.
4.
DS4192 - Rev 24
Seating plane
Drawing is not to scale.
Dimension is measured at the maximum bump diameter parallel to primary datum Z.
Primary datum Z and seating plane are defined by the spherical crowns of the bump.
Bump position designation per JESD 95-1, SPP-010.
page 36/45
M95512-W M95512-R M95512-DF
WLCSP8 (CS) package information
Table 23. WLCSP8 - Mechanical data
Symbol
inches(1)
millimeters
Min
Typ
Max
Min
Typ
Max
A
0.500
0.540
0.580
0.0197
0.0213
0.0228
A1
-
0.190
-
-
0.0075
-
A2
-
0.350
-
-
0.0138
-
b
-
0.270
-
-
0.0106
-
D
-
1.289
1.309
-
0.0507
0.0515
E
-
1.955
1.975
-
0.0770
0.0778
e
-
1.000
-
-
0.0394
-
e1
-
0.866
-
-
0.0341
-
e2
-
0.500
-
-
0.0197
-
e3
-
0.433
-
-
0.0170
-
F
-
0.202
-
-
0.0080
-
G
-
0.469
-
-
0.0185
-
aaa
-
0.110
-
-
0.0043
-
bbb
-
0.110
-
-
0.0043
-
ccc
-
0.110
-
-
0.0043
-
ddd
-
0.060
-
-
0.0024
-
eee
-
0.060
-
-
0.0024
-
1. Values in inches are converted from mm and rounded to four decimal digits.
Figure 30. WLCSP8 - Recommended footprint
0.433 mm
0.866 mm
0.500 mm
1.000 mm
Orientation
reference
1.
DS4192 - Rev 24
8 bumps x Ø 0.270 mm
Dimensions are expressed in millimeters.
page 37/45
M95512-W M95512-R M95512-DF
Ordering information
11
Ordering information
Table 24. Ordering information scheme
Example:
M95
512
-D
W
MN
6
T
P
\K
Device type
M95 = SPI serial access EEPROM
Device function
512 = 512-Kbit (65536 x 8)
Device family
Blank = Without Identification page
D = With additional Identification page
Operating voltage
W = VCC = 2.5 to 5.5 V
R = VCC = 1.8 to 5.5 V
F = VCC = 1.7 to 5.5 V
Package(1)
MN = SO8N (150 mil width)
DW = TSSOP8 (169 mil width)
MC = UFDFPN8 (DFN8)
CS = WLCSP8
Device grade
6 = Industrial temperature range, –40 to 85 °C
Device tested with standard test flow
Option
blank = Tube packing
T = Tape and reel packing
Plating technology
G or P = RoHS compliant and halogen-free (ECOPACK2)
Process(2)
/K = Manufacturing technology code
1. All packages are ECOPACK2 (RoHS-compliant and free of brominated, chlorinated and antimony-oxide flame retardants).
2. These process letters appear on the device package (marking) and on the shipment box. Please contact your nearest ST
Sales Office for further information.
Note:
DS4192 - Rev 24
Parts marked as “ES”, “E” or accompanied by an Engineering Sample notification letter, are not yet qualified and
therefore not approved for use in production. ST is not responsible for any consequences resulting from such
use. In no event will ST be liable for the customer using any of these engineering samples in production. ST
Quality has to be contacted prior to any decision to use these Engineering samples to run qualification activity.
page 38/45
M95512-W M95512-R M95512-DF
Revision history
Table 25. Document revision history
Date
Revision
Changes
Added:
•
Table 14: Capacitance.
•
Note (1) under Table 23: DC characteristics (current and new M95080-R and M95080-DR products)
•
Notes (1) and (2) in Section 4.3: Hold condition
•
Note (1) under Table 36: AC characteristics (M95080-R, M95080-DR device grade 6)
Updated:
01‑Apr‑2011
14
•
Section 3: Connecting to the SPI bus
•
Section 7: ECC (error correction code) and write cycling
•
Moved from Section 4.5: Data protection and protocol control to Section 4.4: Status register
•
Table 2: Write-protected block size
Deleted:
•
Table 25: Available M95512 products (package, voltage range, temperature grade)
•
Table 26: Available M95512-DR products (package, voltage range, temperature grade)
Renamed Figure 2.
19‑Jul‑2011
15
Added UFDFPN8 MC package.
Updated disclaimer.
Datasheet split into:
28‑Mar‑2012
16
•
M95512-W, M95512-R, M95512-DF (this datasheet) for standard products (range 6),
•
M95512-125 datasheet for automotive products (range 3).
Added reference M95512-DR.
Deleted:
•
UFDFPN8 (MLP8): MB version package
Updated:
28‑Jun‑2012
17
•
Cycling and data retention limits (KB devices): 4 million cycles and 200-year data retention
•
Section 10: Package information
•
Figure 6: reference dot moved close to VCC ball
•
Figure 41: M95512-DFCS6TP/K – WLCSP 8-bump wafer-level chip scale package outline
•
Table 57: M95512-DFCS6TP/K, WLCSP 8-bump wafer-level chip scale package mechanical data
Fixed some errors in Figure 6: WLCSP connections for M95512-DFCS6TP/K.
Restored missing table: Table 16: Operating conditions (M95080-DF,device grade 36).
18‑Sep‑2012
18
Replaced various suffixes in UFDFPN8 package name (cover page) by (MLP8) so that this package be consistently
named UFDFPN8 (MLP8) as a block, all over the document.
Changed “Test conditions” description (first line in table) in the following tables: Table 24, Table 26, Table 28, Table
30, Table 42, Table 43, Table 48, and footnote 1. of Table 28.
(Restored Revision History)
24‑Sep‑2012
19
Added Note 1 in Table 26: DC characteristics (M95512-W products,device grade 6).
Added Note 1 in Table 43: AC characteristics (M95512-W products,device grade 6).
Updated:
06‑Dec‑2012
03‑Jun‑2013
DS4192 - Rev 24
20
21
•
Section 7.2: Initial delivery state
•
ICC1 values in Table 26, Table 28 and Table 30
•
Note 1 in Table 24: DC characteristics (previous M95080-W products, device grade 6)
Replaced “ball” by “bump” in the entire document.
page 39/45
M95512-W M95512-R M95512-DF
Date
Revision
Changes
Updated:
•
Package figure on cover page
•
Features: high-speed clock frequency changed from 10 to 16 MHz.
•
Note (1) under Table 12: Absolute maximum ratings
•
ICC row in Table 26: DC characteristics (M95512-W products, device grade 6)
•
Table 43: AC characteristics (M95512-W products, device grade 6)
Removed M95512-DR.
Removed “preliminary data” from WLCSP (CS) package.
24‑Apr‑2014
22
Updated Figure 6: WLCSP connections for M95512-DFCS6TP/K.
Updated tables in Section 6: Instructions.
Update Footnote 2. in Figure 38.
Updated Table 54: UFDFPN8 (MLP8) – 8-lead ultra thin fine pitch dual flat package no lead 2 x 3 mm, data.
Updated Features and image on cover page.
Updated Section 5.1.3: Power-up conditions, title of Section 6.6.1: Cycling with error correction code (ECC x4),
Section 10: Package information and its subsections.
Updated Table 8: Absolute maximum ratings and its footnote 2, Table 12: AC measurement conditions and Table 27:
Ordering information scheme.
23‑Nov‑2018
23
Updated Figure 2: 8-pin package connections (top view), Figure 3: WLCSP connections for M95512-DFCS6TP/K,
Figure 4: Block diagram, Figure 6: SPI modes supported, Figure 7: Hold condition activation, Figure 8: Write enable
(WREN) sequence, Figure 9: Write disable (WRDI) sequence, Figure 10: Read Status Register (RDSR) sequence,
Figure 11: Write Status Register (WRSR) sequence, Figure 13: Byte Write (WRITE) sequence, Figure 15: Read
Identification page sequence and Figure 16: Write Identification Page sequence.
Added Table 2: Signals vs. bump position and Note: in Section 11.
Minor text edits across the whole document.
Added:
•
Figure 26. TSSOP8 – Recommended footprint
•
Figure 28. UFDFPN8 - Recommended footprint
Updated:
29‑Sep‑2021
24
•
Cover image
•
Section 2 Block diagram
•
Figure 3. WLCSP connections
•
Section 5.1.2 Device reset
•
Section 5.1.3 Power-up conditions
•
Section 5.3 Hold condition
•
Section 5.5 Data protection and protocol control
•
Section 6 Instructions
•
Section 6.6.1 Cycling with Error Correction Code (ECC x 4)
•
Table 5. Significant bits within two address bytes
•
Table 13. Cycling performance by groups of four bytes
•
Table 14. Memory cell data retention
•
Table 16. DC characteristics (M95512-W, device grade 6)
•
Table 17. DC characteristics (M95512-R, device grade 6)
•
Table 18. DC characteristics (M95512-DF, device grade 6)
•
Table 19. AC characteristics
•
Section 10.4 WLCSP8 (CS) package information
•
Table 24. Ordering information scheme
Deleted:
DS4192 - Rev 24
•
Table 16: DC characteristics (previous M95512-W products, device grade 6)
•
Table 19: AC characteristics (M95512-W, device grade 6)
•
Table 20: AC characteristics (previous M95512-W products, device grade 6)
page 40/45
M95512-W M95512-R M95512-DF
Contents
Contents
1
Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2
2
Memory organization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
3
Signal description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5
4
3.1
Serial data output (Q) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
3.2
Serial data input (D) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
3.3
Serial clock (C) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
3.4
Chip select . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
3.5
Hold . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
3.6
Write protect . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
3.7
VCC supply voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
3.8
VSS ground . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
Connecting to the SPI bus . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
4.1
5
Operating features. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8
5.1
6
SPI modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
Supply voltage (VCC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
5.1.1
Operating supply voltage (VCC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
5.1.2
Device reset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
5.1.3
Power-up conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
5.1.4
Power-down . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
5.2
Active power and Standby power modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
5.3
Hold condition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
5.4
Status register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
5.5
Data protection and protocol control . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
Instructions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .11
6.1
Write enable (WREN) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
6.2
Write disable (WRDI) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
6.3
Read Status register (RDSR) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
DS4192 - Rev 24
6.3.1
WIP bit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
6.3.2
WEL bit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
6.3.3
BP1, BP0 bits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
page 41/45
M95512-W M95512-R M95512-DF
Contents
6.3.4
6.4
Write Status register (WRSR) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
6.5
Read from Memory array (READ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
6.6
Write to Memory array (WRITE) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
6.6.1
7
SRWD bit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
Cycling with Error Correction Code (ECC x 4). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
6.7
Read Identification page (available only in M95128-D devices) . . . . . . . . . . . . . . . . . . . . . . . 20
6.8
Write Identification page (available only in M95128-D devices) . . . . . . . . . . . . . . . . . . . . . . . 21
6.9
Read Lock status (available only in M95512-D devices) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
6.10
Lock ID (available only in M95512-D devices). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
Power-up and delivery state . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .23
7.1
Power-up state . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
7.2
Initial delivery state . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
8
Maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .24
9
DC and AC parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .25
10
Package information. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .30
11
10.1
SO8N package information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
10.2
TSSOP8 package information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32
10.3
UFDFPN8 (DFN8) package information. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
10.4
WLCSP package information. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
Ordering information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .38
Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .39
DS4192 - Rev 24
page 42/45
M95512-W M95512-R M95512-DF
List of tables
List of tables
Table 1.
Table 2.
Table 3.
Table 4.
Table 5.
Table 6.
Table 7.
Table 8.
Table 9.
Table 10.
Table 11.
Table 12.
Table 13.
Table 14.
Table 15.
Table 16.
Table 17.
Table 18.
Table 19.
Table 20.
Table 21.
Table 22.
Table 23.
Table 24.
Table 25.
Signal names . . . . . . . . . . . . . . . . . . . . . . . . . .
Signals versus bump position . . . . . . . . . . . . . . .
Write-protected block size . . . . . . . . . . . . . . . . . .
Instruction set . . . . . . . . . . . . . . . . . . . . . . . . . .
Significant bits within two address bytes . . . . . . . .
Status register format . . . . . . . . . . . . . . . . . . . . .
Protection modes. . . . . . . . . . . . . . . . . . . . . . . .
Absolute maximum ratings . . . . . . . . . . . . . . . . .
Operating conditions (M95512-W, device grade 6) .
Operating conditions (M95512-R, device grade 6) .
Operating conditions (M95512-DF, device grade 6)
AC measurement conditions . . . . . . . . . . . . . . . .
Cycling performance by groups of four bytes . . . . .
Memory cell data retention . . . . . . . . . . . . . . . . .
Capacitance . . . . . . . . . . . . . . . . . . . . . . . . . . .
DC characteristics (M95512-W, device grade 6). . .
DC characteristics (M95512-R, device grade 6) . . .
DC characteristics (M95512-DF, device grade 6) . .
AC characteristics . . . . . . . . . . . . . . . . . . . . . . .
SO8N – Mechanical data . . . . . . . . . . . . . . . . . .
TSSOP8 – Mechanical data . . . . . . . . . . . . . . . .
UFDFPN8 - Mechanical data . . . . . . . . . . . . . . . .
WLCSP8 - Mechanical data. . . . . . . . . . . . . . . . .
Ordering information scheme. . . . . . . . . . . . . . . .
Document revision history . . . . . . . . . . . . . . . . . .
DS4192 - Rev 24
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. 2
. 3
10
11
11
15
16
24
25
25
25
25
26
26
26
26
27
27
28
31
32
35
37
38
39
page 43/45
M95512-W M95512-R M95512-DF
List of figures
List of figures
Figure 1.
Figure 2.
Figure 3.
Figure 4.
Figure 5.
Figure 6.
Figure 7.
Figure 8.
Figure 9.
Figure 10.
Figure 11.
Figure 12.
Figure 13.
Figure 14.
Figure 15.
Figure 16.
Figure 17.
Figure 18.
Figure 19.
Figure 20.
Figure 21.
Figure 22.
Figure 23.
Figure 24.
Figure 25.
Figure 26.
Figure 27.
Figure 28.
Figure 29.
Figure 30.
DS4192 - Rev 24
Logic diagram. . . . . . . . . . . . . . . . . . . . . . . . .
8-pin package connections (top view) . . . . . . . .
WLCSP connections . . . . . . . . . . . . . . . . . . . .
Block diagram . . . . . . . . . . . . . . . . . . . . . . . .
Bus master and memory devices on the SPI bus.
SPI modes supported . . . . . . . . . . . . . . . . . . .
Hold condition activation . . . . . . . . . . . . . . . . .
Write enable (WREN) sequence . . . . . . . . . . . .
Write disable (WRDI) sequence . . . . . . . . . . . .
Read Status register (RDSR) sequence . . . . . . .
Write Status register (WRSR) sequence . . . . . .
Read from Memory array (READ) sequence . . .
Byte Write (WRITE) sequence . . . . . . . . . . . . .
Page Write (WRITE) sequence . . . . . . . . . . . .
Read Identification page sequence . . . . . . . . . .
Write Identification page sequence . . . . . . . . . .
Read Lock status sequence . . . . . . . . . . . . . . .
Lock ID sequence . . . . . . . . . . . . . . . . . . . . . .
AC measurement I/O waveform . . . . . . . . . . . .
Serial input timing . . . . . . . . . . . . . . . . . . . . . .
Hold timing. . . . . . . . . . . . . . . . . . . . . . . . . . .
Serial output timing . . . . . . . . . . . . . . . . . . . . .
SO8N – Outline . . . . . . . . . . . . . . . . . . . . . . .
SO8N - Recommended footprint . . . . . . . . . . . .
TSSOP8 – Outline . . . . . . . . . . . . . . . . . . . . .
TSSOP8 – Recommended footprint. . . . . . . . . .
UFDFPN8 - Outline . . . . . . . . . . . . . . . . . . . . .
UFDFPN8 - Recommended footprint . . . . . . . . .
WLCSP8 - Outline. . . . . . . . . . . . . . . . . . . . . .
WLCSP8 - Recommended footprint. . . . . . . . . .
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page 44/45
M95512-W M95512-R M95512-DF
IMPORTANT NOTICE – PLEASE READ CAREFULLY
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© 2021 STMicroelectronics – All rights reserved
DS4192 - Rev 24
page 45/45