M95P32-I M95P32-E
Datasheet
Ultra low power 32-Mbit serial SPI page EEPROM with dual and quad outputs
Features
Interface
•
Supports serial peripheral interface (SPI) and dual/quad outputs
High speed frequency
UFDFPN8
(4 x 4 mm)
SO8N
(4.9 x 6 mm)
•
•
Clock frequency up to 80MHz
Fast read single/dual/quad output with one dummy byte
–
Dual output data transfer up to 160Mbits/s
–
Quad output data transfer up to 320Mbits/s
Memory
•
•
•
•
32 Mbits of page EEPROM
64-Kbyte blocks, 4-Kbyte sectors
Page size: 512-byte
Two additional 512-byte identification pages
Supply voltage
WLCSP8
(2.608 x 1.531 mm)
•
Wide voltage range: VCC from 1.6 to 3.6 V
Temperature
•
Unsawn wafer
Operating temperature range:
–
-40 °C to +85 °C (industrial)
–
-40 °C to +105 °C (extended)
Performance
•
•
Product status link
Write endurance: 500 kcycles on full temperature range
Data retention:
–
100 years
–
10 years after 500 kcycles
M95P32-I
Ultra-low power consumption
M95P32-E
•
•
•
•
•
Product label
0.6 μA (typ) in deep power-down mode
16 μA (typ) in Standby mode
800 μA (typ) for read single at 10 MHz
1.5 mA (typ) for page write
Current peak control < 3 mA
DS12964 - Rev 4 - July 2023
For further information contact your local STMicroelectronics sales office.
www.st.com
M95P32-I M95P32-E
High write erase performance
•
•
Fast Write/Prog/Erase times:
–
2 ms (typ) for byte and page write (includes auto erase and program) for 512 bytes
–
1.2 ms (typ) for page program (512 bytes)
–
1.1 ms (typ) for page erase
–
1.3 ms (typ) for sector erase
–
4 ms (typ) for block erase
–
15 ms (typ) for chip erase
Page program with buffer load
Advanced features
•
•
•
•
•
•
•
•
•
•
ECC for high memory reliability (DEC,TED)
Schmitt trigger inputs for noise filtering
Output buffer programmable strength
Operating status flags for ISO26262
Software reset
Write protection by block, with top/bottom option
Unique ID upon request
Electronic identification
Supports SFDP (serial flash discoverable parameters) mode
JEDEC standard manufacturer identification
Package
•
ECOPACK2 (RoHS compliant) and halogen-free packages:
–
DFN8 4 x 4 mm
–
SO8N
–
WLCSP8
–
Unsawn wafer
ESD protection
•
DS12964 - Rev 4
HBM (human body model): 2000 V
page 2/71
M95P32-I M95P32-E
Description
1
Description
The M95P32-I and M95P32-E are manufactured with ST's advanced proprietary NVM technology. They offer byte
flexibility, page alterability, high page cycling performance, and ultra-low power consumption, equivalent to that of
EEPROM technology.
The M95P32-I and M95P32-E are a 32-Mbit SPI page EEPROM device organized as 8192 programmable pages
of 512 bytes each, accessed through an SPI bus with high-performance dual- and quad-SPI outputs.
The devices offer two additional (identification) 512-byte pages:
•
•
The first contains identification data and, upon request, the UID.
The second can be used to store sensitive application parameters, which can (later) be permanently locked
in read-only mode.
Additional status, configuration and volatile registers set the desired device configuration, while the safety register
provides information on the device status.
The M95P32-I operates with a supply voltage from 1.6 to 3.6 V over an ambient temperature range of -40 °C to
+85 °C. The M95P32-E offers an extended range of temperature of -40°C to +105 °C. The device supports a
clock frequency of up to 80 MHz.
The M95P32-I and M95P32-E offer byte and page write instructions of up to 512 bytes. Write instructions consist
in self-timed auto erase and program operations, resulting in flexible data byte management.
The devices also accept page/block/sector/chip erase commands to set the memory to an erased state.
The memory can then be fast-programmed by 512-byte pages, and further optimized using the Page program
with buffer load instruction to hide the SPI communication latency.
Table 1. Signal names
Pad number
Signal name
1
S
2
Q-DQ1
Serial data output / Serial data output 1 for dual / quad
3
W-DQ2
Write protect / Serial data output 2 for quad
4
VSS
5
D-DQ0
6
C
7
HOLD-DQ3
8
VCC
Function
Chip select
Direction
Input
Ground
Output
Input / Output
-
Serial data input / Serial data output 0 for dual / quad
Serial clock
Input / Output
Input
Hold / Serial data output 3 for quad
Input / Output
Supply voltage
-
Figure 1. 8-pin package connections (top view)
S
1
Q-DQ1
2
W-DQ2
VSS
DS12964 - Rev 4
8
VCC
M95P32-I 7
3 M95P32-E 6
HOLD-DQ3
4
D-DQ0
5
C
page 3/71
M95P32-I M95P32-E
Description
Figure 2. 8-bump ultra thin WLCSP8 connection
_
S
VCC
VCC
_
S
Q
____
HOLD
____
HOLD
Q
__
W
C
C
__
W
VSS
D
D
VSS
Marking side
(top view)
DS12964 - Rev 4
Bump side
(bottom view)
page 4/71
M95P32-I M95P32-E
Memory
2
Memory
2.1
Block diagram
The device contains: the memory array, the registers, the identification pages, the high voltage, and the decoding
blocks. (see Figure 3. Block diagram)
The memory array is divided into 8192 erasable pages of 512 bytes.
The PEC (program erase controller) executes all the algorithms managing the correct execution of erase and
program operations. It mainly improves the cycling and data retention performance and keeps erase and program
times at the typical value during the whole product operating life.
A Deep power down mode is available to minimize the power consumption (switching OFF the circuitry of several
internal blocks). In this configuration, the current consumption is reduced to Icc2 (see Table 23. DC characteristics
(M95P32-I; industrial temperature range) and Table 24. DC characteristics (M95P32-E; extended temperature
range)).
Figure 3. Block diagram
SPI
Power
mgmt
HV mgmt
Sense amps + Decoder Y
Decoder X
Pads
Analog pumps reference
Program, erase and read controller + PEC
Memory array
Registers
Identification pages
OFF in Deep power down
DS12964 - Rev 4
page 5/71
M95P32-I M95P32-E
Memory map
2.2
Memory map
The memory array is divided into 8192 erasable pages of 512 bytes, and is organized either as 1024 erasable
sectors of 4 Kbytes, 64 erasable blocks of 64 Kbytes, or as an entirely erasable array.
The device offers two additional (identification) 512-byte pages. The first contains identification data and, upon
request, the UID. The second page can be used to store sensitive application parameters that can (later) be
permanently locked in read-only mode.
The device features a memory protection scheme with block granularity coded in four non-volatile bits of the
status register.
The memory array configuration is organized as:
•
•
4 194 304 bytes
64 blocks of 64 Kbytes, or 1024 sectors of 4 Kbytes, or 8192 pages of 512 bytes, hence:
–
–
–
each block contains 16 sectors
each sector contains 8 pages
each page contains 512 bytes
See the address range in Table 2.
DS12964 - Rev 4
page 6/71
M95P32-I M95P32-E
Memory map
Table 2. Address range by sector
64-Kbyte block number
63
….
0
DS12964 - Rev 4
4-Kbyte sector number
Address range (hexadecimal)
Start
End
1023
3FF000
3FFFFF
1022
3FE000
3FEFFF
1021
3FD000
3FDFFF
1020
3FC000
3FCFFF
1019
3FB000
3FBFFF
1018
3FA000
3FAFFF
1017
3F9000
3F9FFF
1016
3F8000
3F8FFF
1015
3F7000
3F7FFF
1014
3F6000
3F6FFF
1013
3F5000
3F5FFF
1012
3F4000
3F4FFF
1011
3F3000
3F3FFF
1010
3F2000
3F2FFF
1009
3F1000
3F1FFF
1008
3F0000
3F0FFF
….
….
….
15
F000
FFFF
14
E000
EFFF
13
D000
DFFF
12
C000
CFFF
11
B000
BFFF
10
A000
AFFF
9
9000
9FFF
8
8000
8FFF
7
7000
7FFF
6
6000
6FFF
5
5000
5FFF
4
4000
4FFF
3
3000
3FFF
2
2000
2FFF
1
1000
1FFF
0
0
FFF
page 7/71
M95P32-I M95P32-E
Memory map
Table 3. Example of pages inside sector 0
Sector 0
Page number
Start address (hexadecimal)
End address (hexadecimal)
Last page:
7
E00
FFF
6
C00
DFF
…..
…..
…..
2
400
5FF
1
200
3FF
0
000
1FF
….
First page:
DS12964 - Rev 4
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M95P32-I M95P32-E
Signal description
3
Signal description
During all operations, VCC must be held stable and within the specified valid range VCC(min) to VCC(max).
All the input and output signals described in the following sections must be held high or low, or transit between
levels, according to the VIH, VOH, VIL or VOL voltages specified in Table 25. DC characteristics - other parameters.
3.1
Serial data output (Q-DQ1)
This output is a push-pull buffer. The signal is used to transfer data out of the device, serially. Data are shifted out
on the falling edge of the serial clock (C).
With the dual-output and quad-output read commands, this pin remains an output (DQ1) in conjunction with other
pins, to allow four bits of data on DQ0-3 pins to be clocked out on every falling edge of SCK.
To maintain consistency with the SPI nomenclature, the data output Q (DQ1) pin is referenced as the MISO pin,
unless specifically addressing the dual output and quad output modes (in this case it is referenced to as DQ1).
The serial output pin is in a high impedance state (high-Z) whenever the device is deselected (S is de-asserted).
3.2
Serial data input (D-DQ0)
This is a CMOS input with no internal pull-up/down and an output push-pull buffer. The signal transfers data
serially into the device. It receives instructions, addresses, and the data to be written. Values are latched on the
rising edge of the serial clock (C).
With the dual-output and quad-output read commands, this pin becomes a push/pull output buffer (DQ0) in
conjunction with other pins to allow four bits of data on DQ0-3 pins to be clocked out on every falling edge of
SCK.
To maintain consistency with the SPI nomenclature, the data input D (DQ0) pin is referenced as MOSI.
The D pin is in high-Z whenever the device is deselected (S is de-asserted).
3.3
Serial clock (C)
This is a CMOS input with no internal pull up/down. This signal synchronizes the timing of the serial interface. The
instructions, the addresses, or the data present on the serial data input (D) are latched on the rising edge of the
serial clock (C), while the output data on the DQn pins is changed after the falling edge of the serial clock (C).
3.4
Chip select (S)
This is a CMOS input with no internal pull up/down. When this signal is high, the device is deselected and serial
data outputs (DQ0-3) are in high impedance. The device is in Standby power mode (not deep power-down mode)
unless an internal write cycle is in progress.
Driving chip select (S) low selects the device, putting it in active power mode.
After power-up, a falling edge on chip select (S) is required prior to the start of any instruction. A low to high
transition is required to end an operation.
An external pull-up on S is required so that at power-up the voltage on S follows the power supply voltage on
VCC.
3.5
Hold (HOLD-DQ3)
This pin is a CMOS input with no internal pull-up/down, and a push-pull output buffer. This signal is used to pause
all serial communications with the device, without deselecting it.
During the hold condition, the serial data output (Q) is high-Z, and the serial data input (D) and serial clock (C) are
don’t care.
To start the hold condition, the device must be selected by driving chip select (S) low.
When the device is selected with HOLD low and C high, it switches into the hold condition when C transits low.
The HOLD pin supports dual and quad output reads (see Section 4.3 and Section 4.4).
With the fast read quad output command, the HOLD function is no longer available after the last bit of the third
address bytes of the command, and the HOLD pin becomes an output pin (DQ3). In conjunction with other pins,
this allows four-bit data to be clocked into DQ3 on every falling edge of SCK.
DS12964 - Rev 4
page 9/71
M95P32-I M95P32-E
Write protect (W-DQ2)
For consistency with the SPI nomenclature, this pin is referenced as the HOLD pin, unless specifically addressing
the quad output mode, in which case it is referenced as DQ3.
3.6
Write protect (W-DQ2)
This pin is a CMOS input with no internal pull-up/down, and an output push-pull buffer. The main purpose of this
signal is to freeze the size of the area of memory protected against write instructions (as specified by the values in
the BPn and TB bits of the status register).
This pin must be driven either high or low, and must be stable during all write instructions. It supports dual and
quad output read (see Section 4.3 and Section 4.4).
With the fast read quad output command, the write protect pin (W-DQ2) becomes an output pin, after the last bit
of the third address bytes of the command. In conjunction with other pins, this allows four bits of data on DQ2 to
be clocked-in on every falling edge of SCK.
For consistency with the SPI nomenclature, this pin is referred to as the W, unless specifically addressing the
quad output mode, in which case it is referred as DQ2.
3.7
VCC (VCC, supply voltage)
VCC is the device core power supply.
3.8
VSS (VSS, ground)
VSS is the reference for all signals, including the VCC supply voltage.
DS12964 - Rev 4
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M95P32-I M95P32-E
Device operation
4
Device operation
4.1
Connecting to the SPI bus
All instructions, addresses, and input data bytes are shifted in to the device, the most significant bit first. The
serial data input (D) is sampled on the first rising edge of the serial clock (C) after chip select (S) goes low.
All output data bytes are shifted out of the device, the most significant bit first. The serial data output (on DQn
pins) is output on the first falling edge of the serial clock (C) after eight instruction bits (such as the read from
memory array and read status register instructions) have been clocked into the device.
The write protect (W) and hold (HOLD) signals must be driven high or low as appropriate.
Figure 4. Bus master and memory devices on the SPI bus
Vss
Vcc
R
R
R
HOLD
W
SPI Interface with
CPOL,CPHA) =
(0,0 or (1,1)
MOSI
MISO
C
Vcc
SPI Bus Master
Vcc
C Q,DQ1 D,DQ0
C Q,DQ1 D,DQ0
Vss
SPI Memory
Device
W,DQ2
CS3
CS2
CS1
S
Vcc
C Q,DQ1 D,DQ0
Vss
SPI Memory
Device
HOLD,DQ3
W,DQ2
S
Vss
SPI Memory
Device
HOLD,DQ3
W,DQ2
HOLD,DQ3
S
Figure 4 shows an example of three memory devices connected to an SPI bus master. Only one memory device
is selected at a time, so only one memory drives the serial data output (Q) line at a time. The other memory
devices are high impedance.
The pull-up resistor R (whose typical value is 100 kΩ) ensures that a device is not selected if the bus master
leaves the S line in the high impedance state.
DS12964 - Rev 4
page 11/71
M95P32-I M95P32-E
SPI modes
4.2
SPI modes
This device can be driven by a microcontroller through its SPI peripheral running in one of the following modes:
•
•
CPOL = 0, CPHA = 0
CPOL = 1, CPHA = 1
In these modes, input data is latched on the rising edge of the serial clock (C), and data is output on the falling
edge of the serial clock (C).
The difference between these two modes, as shown in Figure 5, is the polarity of the clock state when the bus
master is in standby mode and not transferring data:
•
•
C remains at 0 for (CPOL = 0, CPHA = 0)
C remains at 1 for (CPOL = 1, CPHA = 1)
Figure 5. SPI modes supported
CPOL
CPHA
0
0
C
1
1
C
D
Q
MSB
MSB
Because at a given instant only one device is selected, only one device drives the serial data output (n-DQn) at a
time. The other devices are in a high impedance state (high-Z). An example of three devices connected to an
MCU through an SPI bus is shown in Figure 4. Bus master and memory devices on the SPI bus.
4.3
Dual output read
The M95P32-I and M95P32-E feature a dual output read mode that allows two bits of data to be clocked out of
the device on every clock cycle to improve throughput. With the fast read dual output command, the D pin
becomes an output (D‑DQ0) along with the Q‑DQ1 pin.
4.4
Quad output read
The M95P32-I and M95P32-E feature a quad output read mode that allows four bits of data to be clocked out of
the device on every clock cycle to improve throughput. With the fast read quad output command, the D, W, and
HOLD pins become outputs (D-DQ0, W-DQ2, HOLD-DQ3), along with the Q-DQ1 pin.
4.5
Supply voltage
Prior to selecting the memory and issuing instructions to it, a valid and stable supply voltage within the specified
VCC(min) to VCC(max) range must be applied (see Table 18. Operating conditions). This voltage must remain stable
and valid until the end of the transmission of the instruction and, for a modify instruction, until the completion of
the internal write cycle (See Table 26. Programming times).
To ensure a stable DC supply voltage, it is recommended to decouple the VCC line with a suitable capacitor
(usually in the range of between 10 and 100 nF), close to the VCC / VSS device pins.
4.6
Power-up conditions
When the power supply is turned on, VCC rises continuously from VSS to VCC. During this time, the chip select (S)
line is not allowed to float but follows the VCC voltage. It is therefore recommended to connect the S line to VCC
via a suitable pull-up resistor (see Figure 4. Bus master and memory devices on the SPI bus).
DS12964 - Rev 4
page 12/71
M95P32-I M95P32-E
Power-down conditions
In addition, the chip select (S) input offers a built-in safety feature (it is edge-sensitive, as well as level‑sensitive).
Thus, after power-up, the device is not selected until a falling edge is first detected on S. This ensures that Chip
select (S) is high, before going low to start the first operation.
The VCC voltage must rise continuously from 0 V up to the minimum VCC operating voltage defined in
Table 18. Operating conditions.
4.7
Power-down conditions
During power-down (continuous decrease of the supply voltage below the minimum VCC operating voltage
defined in Table 18. Operating conditions), the device must be:
4.8
•
deselected (S must follow the voltage applied on VCC)
•
in standby power mode (there must not be any internal write cycle in progress).
Active power, standby power, and deep power-down modes
When chip select (S) is low, the device is selected, and in active power mode.
When chip select (S) is high, the device is deselected, but remains in active power mode until all internal cycles
have completed (program, erase, write status register). The device then goes into standby power mode. The
device consumption drops to ICC1 as specified in Table 23. DC characteristics (M95P32-I; industrial temperature
range) and Table 24. DC characteristics (M95P32-E; extended temperature range).
Deep power-down mode is entered when the deep power-down command is executed. The device consumption
drops further to ICC2. The device remains in this mode until the release from power-down command is executed.
While in deep power-down mode the device ignores all write, program and erase commands. This provides an
extra software protection mechanism when the device is not in active use, by protecting it from inadvertent
operations. For further information, see Section 6.21 Deep power-down enter (B9h).
4.9
Device reset
To prevent erroneous instruction decoding and inadvertent programming, write or erase operations during
power‑up, a power‑on‑reset (POR) circuit is included. At power-up, the device does not respond to any
instructions until VCC reaches the POR threshold voltage. This threshold is lower than the minimum VCC operating
voltage (see Table 18. Operating conditions).
At power-up, when VCC passes over the POR threshold, the device is reset, and is in the following state:
•
•
•
in standby power mode
deselected
status register:
•
–
write enable latch (WEL) bit reset to 0
–
write in progress (WIP) bit reset to 0
–
all nonvolatile bits unchanged
configurable and safety registers:
•
–
all volatile bits reset to 0
–
all nonvolatile bits (DRV1, DRV0) unchanged
volatile register:
–
all bits reset to 0 except BUFLD set to 1
Important:
The device must not be accessed until VCC reaches a valid and stable level within the specified VCC(min) to
VCC(max) range, as defined in Table 18. Operating conditions.
4.10
Hold condition
The hold (HOLD) signal is used to pause serial communications with the device, without resetting the clocking
sequence. However, setting this signal low does not terminate the write status register, program, write, or erase
cycles that are in progress.
To enter the hold condition, the device must be selected with chip select (S) low.
During the hold condition, the serial data output (Q) is high-Z, and the serial data input (D) and serial clock (C) are
don’t care.
DS12964 - Rev 4
page 13/71
M95P32-I M95P32-E
ECC
Normally, the device is kept selected for the duration of the hold condition. This ensures that the internal logic
state remains unchanged from the moment of entry into the hold condition. Deselecting the device during the hold
condition resets the state of the device. This mechanism can be used to reset the ongoing processes.
Note:
This resets the internal logic, except the WEL and WIP bits of the status register.
The hold condition starts when the HOLD signal is driven low when the serial clock (C) is already low (as shown
in Figure 6). If the falling edge does not coincide with C being low, the hold condition starts when C next goes low.
The hold condition ends on the rising edge of the HOLD signal, if this coincides with C being low. If the rising edge
does not coincide with C being low, the hold condition ends when C next goes low.
Figure 6. Hold condition activation
C
HOLD
Hold
condition
Hold
condition
Figure 6 also shows what happens if the rising and falling edges are not timed to coincide with the serial clock (C)
being low.
To restart communication with the device, it is necessary to drive HOLD high, and then to drive chip select (S) low.
This prevents the device from returning to the hold condition.
4.11
ECC
The error correction code (ECC) is an internal logic function that significantly improves the data integrity of the
M95P32-I and M95P32-E. It is always active, and is transparent for SPI communication.
The ECC offers double-bit correction over 16 bytes (128 bits), and triple-bit error detection. When a 3-error
detection occurs, no correction is applied to the data. The single, double, and triple error detection bits are
readable in the safety register.
The ECC flag information is cumulative, meaning that on the same read instruction the flags are raised as soon
as a correction or a detection occurs, and all flags may be raised. The status bit is detailed in Section 5.2.2 Safety
register.
DS12964 - Rev 4
page 14/71
M95P32-I M95P32-E
Data protection and protocol control
4.12
Data protection and protocol control
The device features the following data protection mechanisms:
•
Power on reset and an internal timer (tPUW) can provide protection against inadvertent changes while the
power supply is outside the operating specification.
Before accepting the execution of the program, write and erase, and write status register instructions, the
device checks whether the number of clock pulses comprising the instructions is a multiple of eight.
For any instruction to be accepted, and executed, chip select (S) must be driven high after the rising edge
of the serial clock (C) for the last bit of the instruction, and before the next rising edge of the serial clock
(C).
All instructions that modify data must be preceded by a write enable (WREN) instruction to set the write
enable latch (WEL) bit.
The block protection (BP2, BP1, and BP0) and TB bits in the status register are used to configure part of
the memory as read-only.
The write protect (W) signal is used to protect the block protection (BP2, BP1, BP0) and TB bits in the
status register in conjunction with the SRWD bit.
•
•
•
•
•
In addition to the low power consumption feature, the Deep power-down mode offers extra software protection: all
program and erase commands are ignored when the device is in this mode.
4.12.1
Memory protection scheme
The memory can be configured as read-only using the block protection (BP2, BP1, BP0) and TB bits, as shown in
Table 4. Refer to Section 5.1 Status register for more information on the BPn bits.
Table 4. Protected area sizes
TB
BP2
BP1
BP0
Protected block(s)
Protected addresses
Protected size(1)
Protected portion
X
0
0
0
None
None
None
None
0
0
0
1
63
3F0000h – 3FFFFFh
64 KB
Upper 1/64
0
0
1
0
62 and 63
3E0000h – 3FFFFFh
128 KB
Upper 1/32
0
0
1
1
60 → 63
3C0000h – 3FFFFFh
256 KB
Upper 1/16
0
1
0
0
56 → 63
380000h – 3FFFFFh
512 KB
Upper 1/8
0
1
0
1
48 → 63
300000h – 3FFFFFh
1 MB
Upper 1/4
0
1
1
0
32 → 63
200000h – 3FFFFFh
2 MB
Upper 1/2
1
0
0
1
0
000000h – 00FFFFh
64 KB
Lower 1/64
1
0
1
0
0 and 1
000000h – 01FFFFh
128 KB
Lower 1/32
1
0
1
1
0→3
000000h – 03FFFFh
256 KB
Lower 1/16
1
1
0
0
0→7
000000h – 07FFFFh
512 KB
Lower 1/8
1
1
0
1
0 → 15
000000h – 0FFFFFh
1 MB
Lower 1/4
1
1
1
0
0 → 31
000000h – 1FFFFFh
2 MB
Lower 1/2
X
1
1
1
0 → 63
000000h – 3FFFFFh
4 MB
All
1. The device is ready to accept any ERASE commands only if all block protection bits (BP2, BP1, BP0) are set to 0.
DS12964 - Rev 4
page 15/71
M95P32-I M95P32-E
Polling during a program, write, or erase cycle
4.12.2
Hardware data protection
Hardware data protection is implemented using the write protect signal applied on the W pin. This freezes the
nonvolatile bits of the status register in a read-only mode. In this mode, the block protection bits (BPn), the top/
bottom bit (TB), and the status register write disable bit (SRWD) are protected (for further details, refer to
Section 5.1 Status register).
Table 5. Protection modes
Write protection
W
SRWD
bit
1
0
0
Software
protected
•
0
1
1
(SPM)
•
0
1
Hardware
protected
•
•
Mode
(HPM)
of the status register
Status register is writable (if the WREN
instruction has set the WEL bit)
BP2, BP1, BP0, and TB bits can be changed
Status register is hardware write-protected
BP2, BP1, BP0, and TB bits cannot be
changed
Memory content(1)
Protected
area
Unprotected area
Write
protected
Ready to accept write
instructions
1. As defined by the values in the block protection (BP2, BP1, BP0) and TB bits of the status register.
4.13
Polling during a program, write, or erase cycle
A reduction in the time taken to complete the following commands is possible by not waiting for the worst-case
delay (tPW, tWSCR, tPP, tSE, tBE, or tCE) to elapse. See Table 26. Programming times:
•
•
•
•
Write
Write status register
Program
Erase (page, sector, block, and chip erase)
The write in progress (WIP) bit in the status register is provided so that the application program can monitor
whether the write, program, or erase cycle is complete (refer to Section 5.1 Status register).
DS12964 - Rev 4
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M95P32-I M95P32-E
Status, configurable, safety, volatile, and SFDP registers
5
Status, configurable, safety, volatile, and SFDP registers
These registers provide:
•
•
•
the status of the availability and the setting of the memory array
the status of the output buffer strength
the status of the device after power up and ECC bit detection
The write status/configuration register instructions can be used to configure the device write protection features.
5.1
Status register
The status register can be read with the RDSR instruction in loop mode. The nonvolatile bits SRWD, TB, BP2,
BP1, and BP0 can be changed with the WRSR instruction when sending a data byte. The MSB (b7) is sent first.
Table 6. Status register format
b7
b6
b5
b4
b3
b2
b1
b0
SRWD
TB
x(1)
BP2
BP1
BP0
WEL
WIP
1. x: Don't care bit.
Status register write protect (SRWD) bit
The nonvolatile status register write disable (SRWD) bit is used in conjunction with the write protect (W) signal.
The status register write disable (SRWD) bit and write protect (W) signals enable the device to be put into
hardware protected mode (when the status register write disable (SRWD) bit is set to 1, and write protect (W) is
driven low). In this mode, the nonvolatile bits of the status register (SRWD, BP2, BP1, BP0 and TB) become
read‑only bits, and the write status register (WRSR) instruction is no longer accepted for execution. The
protection modes are described in Table 5. Protection modes.
Top / bottom protection (TB) bit
The nonvolatile Top/Bottom bit (TB) controls whether the block protection bits (BP2, BP1, BP0) protect from the
top (TB = 0) or from the bottom (TB = 1) of the array, as shown in Table 4. Protected area sizes. The factory
default setting is TB = 0. The TB bit can be set with the write status register instruction, depending on the state of
the SRWD and WEL bits.
Block protection (BP2, BP1, BP0) bits
These are nonvolatile read/write bits in the status register, which provide write protection control and status. All,
none, or a portion of the memory array can be protected from program and erase instructions (see
Table 4. Protected area sizes). The factory default setting for the block protection bits is 0 (array unprotected).
The block protection bits can be set using the write status register instruction.
Write enable latch (WEL) bit
This is a read-only bit in the status register, which is set to 1 after executing a write enable instruction. The WEL
status bit is cleared to 0 when the device is write disabled. A write disable state occurs upon power-up, or after
correct completion of any of the following instructions: Write disable, write, page program, sector erase, block
erase, chip erase, write status register.
Write in progress (WIP) bit
This is a read-only bit in the status register, set to 1 when:
1.
the device is executing a modify operation. During this time, the device ignores further instructions except for
the read status register. When the program, write, erase, or write status/configuration register instruction has
completed, the WIP bit is cleared to 0, indicating that the device is ready for further instructions.
2.
the device is in power-up (see Table 14. Power-up/down conditions).
DS12964 - Rev 4
page 17/71
M95P32-I M95P32-E
Configuration and safety register format
5.2
Configuration and safety register format
5.2.1
Configuration register
This register can be read with the RDCR instruction in loop mode. The two nonvolatile bits DRV[1:0] can be
changed with the WRSR instruction when sending a second data byte. The MSB (b7) is sent first.
Table 7. Configuration register format
b7
b6
b5
b4
b3
b2
b1
b0
x(1)
DRV1
DRV0
x(1)
x(1)
x(1)
x(1)
LID
1. x: Don't care bit.
The nonvolatile DRV1 and DRV0 bits determine the output driver strength (RON of the buffer) for the read
operations. The values of DRV1 and DRV0 are given in Table 8.
The nonvolatile LID bit determines if the identification page is locked or not. When LID = 0, the identification page
can be modified by the user. When LID = 1, this page is locked in read-only mode and cannot be changed. The
LID bit can be modified with a WRSR instruction when two data bytes are sent, see Section 6.8 Write status and
configuration registers (01h).
Table 8. Output driver strength
DRV1, DRV0
Buffer strength
RON typical at 3.3 V / 25 °C
RON typical at 1.8 V / 25 °C
0, 0
Do not use
-
-
0, 1
Medium
110 Ω
200 Ω
1, 0
Low
175 Ω
300 Ω
1, 1
Do not use
-
-
Note:
The delivered state is with buffer strength "Medium".
5.2.2
Safety register
This 8-bit register can be read with the RDCR instruction in loop mode.
All bits are volatile and are read-only. They can be reset with the CLRSF instruction.
Table 9. Safety register format
b7
b6
b5
b4
b3
b2
b1
b0
PAMAF
PUF
ERF
PRF
ECC1C
ECC2C
ECC3D
ECC3DS
Protected array modify attempt flag (PAMAF) bit
This bit indicates whether a modify operation to a protected memory area has been attempted:
•
•
0: clear
1: modify attempt detected
This is a sticky volatile bit that can be reset to 0 only by issuing a clear safety flag instruction. This flag is cleared
to 0 after a successful power-up or by a software reset instruction.
DS12964 - Rev 4
page 18/71
M95P32-I M95P32-E
Configuration and safety register format
Power-up flag (PUF) bit
This bit indicates if the power-up operation was completed successfully:
•
•
0: successful
1: error
This volatile bit is refreshed at each power-up, and after a software reset instruction. The flag is cleared to 0 by
the clear safety flag instruction.
Note:
If the PUF bit remains at 1 after the power-up, the status register is read as FF.
Erase flag (ERF) bit
This bit indicates if a previously executed erase operation was completed successfully.
•
•
0: successful
1: error
This volatile bit is refreshed at each erase/write operation. This flag is cleared to 0 at power-up, or by a clear
safety flag or software reset instruction.
Program flag (PRF) bit
This bit indicates if a previously executed program operation was completed successfully.
•
•
0: successful
1: error
This volatile bit is refreshed at each program/write operation. In buffer mode, the flag becomes a sticky flag. This
flag is cleared to 0 at power-up, or by a clear safety flag or software reset instruction.
ECC1 correction flag (ECC1C) bit
This bit indicates if the ECC corrected a single-bit error during a previously executed read/program/write
operation.
•
•
0: no correction
1: correction done
This volatile bit is refreshed at each read/program/write operation. This flag is cleared to 0 at power-up, or after a
clear safety flag or software reset instruction.
ECC2 correction flag (ECC2C) bit
This bit indicates if the ECC corrected a double-bit error in a previously executed read/program/write operation.
•
•
0: no correction
1: correction done
This volatile bit is refreshed at each read/program/write operation. This flag is cleared to 0 at power-up, or after a
clear safety flag or software reset instruction.
ECC 3 detection flag (ECC3D) bit
This bit indicates if the ECC detected a triple-bit error in at least one word of 16 bytes in a previously executed
read/program/write operation.
•
•
0: no detection
1: error detection
This volatile bit is refreshed at each read/program/write operation. This flag is cleared to 0 at power-up, or after a
clear safety flag or software reset instruction.
DS12964 - Rev 4
page 19/71
M95P32-I M95P32-E
Volatile register format
ECC 3 detection flag (ECC3DS) bit
This bit indicates if the ECC detected a triple bit error in at least one word of 16 bytes in a previously executed
read/program/write operation.
•
•
0: no detection
1: error detection
This is a sticky volatile bit that can only be reset by issuing a clear safety flag instruction. This flag is cleared to 0
at power-up, or after a software reset instruction.
The ECC flag information is cumulative: on the same read instruction, the flags are raised as soon as a correction
or a detection occurs, and all flags may be raised.
5.3
Volatile register format
This byte can be read with the RDVR instruction in loop mode. The volatile bit BUFEN is enabled with WRVR
instruction.
Table 10. Volatile register format
b7
b6
b5
b4
b3
b2
b1
b0
x(1)
x(1)
x(1)
x(1)
x(1)
x(1)
BUFEN
BUFLD
1. x: Don't care bit.
Buffer loading activation (BUFEN) bit
This Buffer mode is activated by setting the volatile configuration bit (BUFEN) to 1 with a WREN + WRVR
instruction.
When this bit is set to 1, it allows Page program instruction decoding and buffering while a previous Program
instruction is executing.
When this bit is at 0, a Page program instruction is not decoded while the program is being executed. At
power‑up, or after Software reset instruction, this flag is cleared to 0.
Buffer loading status (BUFLD) bit
When this bit is at 0, the buffer is free and accepts the loading of a new Page program instruction.
When this bit is at 1, the buffer is full and a Page program instruction is discarded and lost.
This bit:
•
•
•
5.4
is set to 1 at power-up
switches to 0 when BUFEN is set to 1
is automatically set to 1 when BUFEN is 0
SFDP register format
The M95P32-I and M95P32-E feature a 512-byte serial flash discoverable parameter (SFDP) register that
contains information about device configuration, available instructions, and other features, in a standard set of
internal parameter tables.
These parameter tables can be interrogated by host-system software, enabling the adjustments needed to
accommodate divergent features from multiple vendors.
The Read SFDP register instruction is compatible with the SFDP standard and with the JEDEC standard
JESD216.
For further information, refer to www.st.com “Serial flash discovery parameters for M95P family” documentation.
DS12964 - Rev 4
page 20/71
M95P32-I M95P32-E
Instructions
6
Instructions
All instructions can run at the maximum frequency of 80 MHz, except read instructions (READ and RDID), which
can run at 50 MHz maximum.
Each command is composed of several bytes (the MSB is transmitted first), initiated with the instruction byte as
summarized in Table 11. If an invalid instruction (that is, one not contained in Table 11) is sent, the device
automatically enters a wait state until the device or the state is deselected.
Table 11. M95P32-I and M95P32-E instruction set
Instruction
Number of bytes
Name
Description
WREN
Write enable
0000 0110
06
0
0
0
WRDI
Write disable
0000 0100
04
0
0
0
RDSR
Read status register
0000 0101
05
0
0
1 (rollover)
WRSR
Write status register
0000 0001
01
0
0
1 or 2
READ
Read data single output
0000 0011
03
3
0
FREAD
Fast read single output with one dummy byte
0000 1011
0B
3
1
FDREAD
Fast read dual output with one dummy byte
0011 1011
3B
3
1
FQREAD
Fast read quad output with one dummy byte
0110 1011
6B
3
1
PGWR
Page write (erase and program)
0000 0010
02
3
0
1 to 512
PGPR
Page program
0000 1010
0A
3
0
1 to 512
PGER
Page erase (512 bytes)
1101 1011
DB
3
0
0
SCER
Sector erase (4 Kbytes)
0010 0000
20
3
0
0
BKER
Block erase (64 Kbytes)
1101 1000
D8
3
0
0
CHER
Chip erase
1100 0111
C7
0
0
0
RDID
Read identification (EE)
1000 0011
83
3
0
FRDID
Fast read identification (EE)
1000 1011
8B
3
1
WRID
Write identification page (EE)
1000 0010
82
3
0
1 to 512
DPD
Deep power- down enter
1011 1001
B9
0
0
0
RDPD
Deep power- down release
1010 1011
AB
0
0
0
JEDID
JEDEC identification (SF)
1001 1111
9F
0
0
3
RDCR
Read configuration and safety register
0001 0101
15
0
0
2 (rollover)
RDVR
Read volatile register
1000 0101
85
0
0
1
WRVR
Write volatile register
1000 0001
81
0
0
1
CLRSF
Clear safety sticky flags
0101 0000
50
0
0
0
RDSFDP
Read SFDP
0101 1010
5A
3
1
1 to 512 (rollover)
RSTEN
Enable reset
0110 0110
66
0
0
0
RESET
Software reset
1001 1001
99
0
0
0
DS12964 - Rev 4
Binary code Hex code Address Dummy
Frequency
Data
(MHz)
80
50
1 to 4 M (rollover)
1 to 1024 (rollover)
80
50
80
page 21/71
M95P32-I M95P32-E
Write enable (06h)
6.1
Write enable (06h)
The write enable (WREN) instruction sets the write enable latch (WEL) bit in the status register to 1. The WEL bit
must be set before every page program, page write, page erase, sector erase, block erase, chip erase, write
status register, write volatile register, and write identification page instruction.
The write enable instruction is entered by driving S low, shifting the instruction code 06h into the data input (D) pin
on the rising edge of C, and then driving S high. The S pin must be driven high after the eighth bit has been
latched. If this is not done the write enable instruction is not executed.
Figure 7. Write enable
0
1
2
3
4
5
6
7
S
C
D
Q
High impedance
WREN instruction
6.2
MS54391V1
Write disable (04h)
The write disable (WRDI) instruction resets the write enable latch (WEL) bit in the status register to 0. The write
disable instruction is entered by driving S low, shifting the instruction code 04h into the D pin, and then driving S
high.
The S pin must be driven high after the eighth bit has been latched. If this is not done the write disable instruction
is not executed.
Figure 8. Write disable
-3
-2
-1
0
1
2
3
4
5
6
7
8
9
10
11
S
C
D
Q
High impedance
Write disable instruction
MS54396V1
DS12964 - Rev 4
page 22/71
M95P32-I M95P32-E
Read status register (05h)
6.3
Read status register (05h)
The Read status register (RDSR) instruction is used to read this 8-bit register, whose content is described in
Section 5.1 Status register.
The instruction is entered by driving S low and shifting the instruction code 05h into the D pin on the rising edge of
C. The status register bits are then shifted out (MSB first) on the Q pin, on the falling edge of C as shown in
Figure 9.
Figure 9. Read status register
0
1
2
3
4
5
6
7
8
9
Q7
Q6
10
11
12
13
14
15
16
17
18
19
20
21
22
23
S
C
D
Q
High impedance
RDSR instruction
Q5
Q4
Q3
Q2
Status register content
Q1
Q0
Q7
Q6
Q5
Q4
Q3
Q2
Status register content
Q1
Q0
Q7
MS69273V1
This instruction can be used at any time, even while a program, erase or write status register cycle is in progress.
The WIP status bit can be checked to determine when the cycle is complete, and if the device is ready to accept
another instruction. The status register can be read continuously in loop mode. The instruction is completed by
driving S high.
DS12964 - Rev 4
page 23/71
M95P32-I M95P32-E
Read configuration and safety registers (15h)
6.4
Read configuration and safety registers (15h)
The read configuration and safety register (RDCR) instruction reads the two configuration and safety register
bytes (one for each register). It is sent without an address, and the device first outputs the configuration register
byte, followed by the safety register byte in loop mode.
The instruction is entered by driving S low, and shifting the instruction code 15h into the D pin on the rising edge
of C. The configuration and safety register bit values are then shifted out (MSB first) on the Q pin, on the falling
edge of C as shown in Figure 10. The configuration and safety registers can be read continuously.
The instruction is completed by driving S high.
Figure 10. Read configuration and safety registers
0
1
2
3
4
5
6
7
8
9
Q7
Q6
10
11
12
13
14
15
16
17
18
19
20
21
22
23
S
C
D
Q
High impedance
RDCR instruction
Q5
Q4
Q3
Q2
Configuration byte
Q1
Q0
Q7
Q6
Q5
Q4
Q3
Safety byte
Q2
Q1
Q0
Q7
MS69274V1
The content of configuration and safety registers is described in Section 5.2 Configuration and safety register
format.
DS12964 - Rev 4
page 24/71
M95P32-I M95P32-E
Clear safety register (50h)
6.5
Clear safety register (50h)
The clear safety register (CLRSF) instruction resets all the bits of the safety register.
This instruction is entered (without an address) by driving S low, and shifting the instruction code 50h into the data
input (D) pin on the rising edges of C. The instruction is completed by driving S high.
As soon as S goes high, the device resets immediately all the volatile bits of the safety register.
The S pin must be driven high after the eighth bit has been latched. If this is not done the instruction is not
executed.
Figure 11. Clear safety register
-3
-2
-1
0
1
2
3
4
5
6
7
8
9
10
11
S
C
D
Q
High impedance
CLRSF instruction
DS12964 - Rev 4
MS54397V1
page 25/71
M95P32-I M95P32-E
Read volatile register (85h)
6.6
Read volatile register (85h)
The read volatile register (RDVR) instruction is used to read the 8-bit volatile register.
The instruction is entered by driving S low and shifting the instruction code 35h into the D pin on the rising edge of
C. The volatile register bits are then shifted out (MSB first) on the Q pin, on the falling edge of C. The volatile
register can be read continuously, as shown in Figure 12. The instruction is completed by driving S high.
The read volatile register instruction can be used at any time, even while a program, erase or write status register
cycle is in progress.
Refer to Section 5 Status, configurable, safety, volatile, and SFDP registers for the register description.
Figure 12. Read volatile register
0
1
2
3
4
5
6
7
8
9
Q7
Q6
10
11
12
13
14
15
16
17
18
19
20
21
22
23
S
C
D
Q
High impedance
RDVR instruction
DS12964 - Rev 4
Q5
Q4
Q3
Volatile byte
Q2
Q1
Q0
Q7
Q6
Q5
Q4
Q3
Volatile byte
Q2
Q1
Q0
Q7
MS69275V1
page 26/71
M95P32-I M95P32-E
Write volatile register (81h)
6.7
Write volatile register (81h)
The write volatile register (WRVR) instruction is used to write the volatile register, whose writable bits include
BUFEN and BUFLD.
Only the BUFEN bit can be updated, the BUFLD bit is a status bit.
All other bit locations MSB [7:4], LSB[3;2:0] are read-only and are not affected by this instruction.
To write the Volatile register bits, a write enable (06h) instruction must have been previously executed, or the
device does not accept the volatile register instruction (Status register bit WEL must be set to 1). Once write is
enabled, the instruction is entered by driving S low, sending the instruction code 81h, and then the volatile register
data byte. The instruction is completed by driving S high.
The S pin must be driven high after the eighth bit has been latched. If this is not done, the WRVR instruction is not
executed.
Figure 13. Write volatile register
-3
-2
-1
0
1
2
3
4
5
6
7
8
9
D7
D6
10
11
12
13
14
15
16
17
18
S
C
D
D5
D4
D3
D2
D1
D0
High impedance
Q
WRVR instruction
Data byte in
MS55404V1
During the volatile register write operation (06h combined with 81h), after S is driven high, the self-timed Write
register cycle starts and the WRVR time is instantaneous (see Table 26. Programming times). The content of
volatile register is described in Section 5.3 Volatile register format.
DS12964 - Rev 4
page 27/71
M95P32-I M95P32-E
Write status and configuration registers (01h)
6.8
Write status and configuration registers (01h)
The write status register (WRSR) instruction is used to write the status and configuration register.
A WRSR instruction, used with one data byte, changes status register bits SRWD, TB, BPx, and WEL.
A WRSR instruction, used with two data bytes, can change status register bits, configuration bits (DVx), and lock
ID bit (LID), located in the configuration register.
To write the status and configuration registers, a write enable (06h) instruction must have been previously
executed from the device to accept the instruction (Status register bit WEL must be 1). Once write is enabled, the
write status register (WRSR) instruction is entered (MSB first) by driving the S low, sending the instruction code
01h, followed by one or two data byte(s) on serial data input (D), and driving the S high.
The S pin must be driven high after the eighth bit has been latched. If this is not done, the write status, and
configurable registers instruction is not executed.
The bytes of the status and configuration register are stored in different pages to avoid losing the second byte if,
after having changed the first one, a power-down occurs.
A WRSR instruction with more data bytes than defined above is discarded.
The instruction is not accepted, and is not executed, if a write cycle is in progress.
The content of the status and the configuration register is described in Section 5.1 Status register and
Section 5.2 Configuration and safety register format.
Figure 14. Write status register
0
1
2
3
4
5
6
7
8
9
10
D7
D6
11
12
13
14
15
S
C
D
Q
D5
D4
D3
D2
D1
D0
High impedance
WRSR instruction
Status register data byte in
MS69261V1
Figure 15. Write status and configuration registers
0
1
2
3
4
5
6
7
8
9
D7
D6
10
11
12
13
14
15
16
17
18
19
20
21
22
23
S
C
D
Q
WRSR instruction
DS12964 - Rev 4
D5
D4
D3
D2
D1
D0
D7
D6
D5
D4
D3
D2
D1
D0
High impedance
Status register data byte in
Configuration register data byte in
MS69276V1
page 28/71
M95P32-I M95P32-E
Read data single output (03h)
6.9
Read data single output (03h)
The read data single output (READ) instruction allows one or more data bytes to be sequentially read from the
memory. The instruction is initiated by driving the S pin low and then shifting the instruction code 03h, followed by
a 24-bit address (A23-A0) into the D pin. The code and address bits are latched on the rising edge of the C pin.
After the address is received, the data byte of the addressed memory location is shifted out (MSB first) on the Q
pin, on the falling edge of C. The address is automatically incremented to the next higher address after each data
byte is shifted out, allowing a continuous stream of data. This means that the whole memory can be accessed
with a single instruction, as long as the clock continues to cycle. The address counter rolls over to 0 after the
highest address is reached. The instruction is completed by driving S high.
The read data single output instruction sequence is shown in Figure 16.
Figure 16. Read data single output
0
1
2
3
4
5
6
7
8
9
10
A23
A22
A21
29
30
31
32
33
34
35
36
37
38
39
S
C
D
Q
A2
READ instruction
A1
A0
Q7
High impedance
24-bit address
Q6
Q5
Q4
Q3
Data Out 1
Q2
Q1
Q0
Q7
Data Out 2
MS69262V1
DS12964 - Rev 4
page 29/71
M95P32-I M95P32-E
Fast read single output with one dummy byte (0Bh)
6.10
Fast read single output with one dummy byte (0Bh)
The fast read single output with one dummy byte (FREAD) instruction allows one or more data bytes to be
sequentially read from the memory. However, through the addition of eight dummy clocks after the 24-bit address,
it can operate at the highest possible frequency (see Table 27. AC characteristics).
The instruction is initiated by driving the S pin low and then shifting the instruction code 0Bh followed, first by a
24-bit address (A23-A0) into the D pin, then by eight additional dummy clock cycles.
The code and address bits are latched on the rising edge of the C pin. After the eight dummy clock cycles are
received, the data byte of the addressed memory location is shifted out (MSB first) on the Q pin, on the falling
edge of C. The address is automatically incremented to the next higher address after each byte of data is shifted
out, allowing a continuous stream of data. This means that the entire memory can be accessed with a single
instruction as long as the clock continues to cycle. The address counter rolls over to 0 after the highest address is
reached. The instruction is completed by driving S high.
During the dummy clock cycles the data value on the D pin is Don't care, and the Q pin is high-Z.
Figure 17. Fast read single output with one dummy byte
0
1
2
3
4
5
6
7
8
9
10
A23
A22
A21
29
30
31
S
C
D
Q
A1
A0
High impedance
READ instruction
32
A2
33
34
35
36
37
38
39
40
41
42
43
24-bit address
44
45
46
47
48
49
50
51
52
53
54
55
S
C
D
High impedance
Dummy clock cycles
DS12964 - Rev 4
Q7
Q6
Q5
Q4
Q3
Data Out 1
Q2
Q1
Q0
Q7
Q6
Q5
Q4
Q3
Data Out 2
Q2
Q1
Q0
Q7
Q
MS69255V1
page 30/71
M95P32-I M95P32-E
Fast read dual output with one dummy byte (3Bh)
6.11
Fast read dual output with one dummy byte (3Bh)
The fast read dual output with one dummy byte (FDREAD) instruction is similar to the fast read single output with
one dummy byte (0Bh) instruction, except that data is output on pins DQ1 and DQ0. This allows the data to be
transferred at the highest possible frequency of fC (see Table 27. AC characteristics).
The instruction is initiated by driving the S pin low, then shifting the instruction code 3Bh followed by a 24‑bit
address (A23-A0) into the D pin, and finally adding eight dummy clock cycles, as shown in Figure 18. The code
and address bits are latched on the rising edge of the C pin. After the eight dummy clock cycles are received, the
data byte of the addressed memory location is shifted out (MSB first) on the DQ1 and DQ0 pins (every two bits
interleave on the two I/O pins), on the falling edge of C.
The address is automatically incremented to the next higher address after each data byte is shifted out, so the
whole memory can be read out with a fast read dual instruction. The address counter rolls over to 0 after the
highest address is reached. The instruction is completed by driving the S pin high. During the dummy clock
cycles, the data value on the D pin is don't care, and the Q pin is high-Z.
Figure 18. Fast read dual output with one dummy byte
0
1
2
3
4
5
6
7
8
9
10
A23
A22
A21
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
Q6
Q4
Q2
Q0
Q6
Q4
Q2
Q0
Q7
Q5
Q3
Q1
Q7
Q5
Q3
Q1
S
C
D-DQ0
Q-DQ1
A2
A1
A0
High impedance
FDREAD instruction
24-bit address
Dummy clock cycles
Data Out 1
Data Out 2
MS55470V1
DS12964 - Rev 4
page 31/71
M95P32-I M95P32-E
Fast read quad output with one dummy byte (6Bh)
6.12
Fast read quad output with one dummy byte (6Bh)
The fast read quad output with one dummy byte (FQREAD) instruction is similar to the fast read dual output with
one dummy byte instruction, except that data is output on four pins (DQ3, DQ2, DQ1, and DQ0). This allows data
to be transferred at the highest possible frequency fC (see Table 27. AC characteristics).
The instruction is initiated by driving the S pin low, then shifting the instruction code 6Bh, followed by a 24-bit
address (A23-A0) into the D pin, and then adding eight dummy clock cycles as shown in Figure 19. The code and
address bits are latched on the rising edge of the C pin. After the eight dummy clock cycles are received, the data
byte of the addressed memory location is shifted out (MSB first) on the DQ3, DQ2, DQ1, and DQ0 pins (every
four bits interleave on the four I/O pins) on the falling edge of C.
The address is automatically incremented to the next higher address after each data byte is shifted out, so the
whole memory can be read out with a fast read quad instruction. The address counter rolls over to 0 after the
highest address is reached.
The instruction is completed by driving the S pin high.
During the dummy clock cycles, the data value on the D pin is don't care, and the Q pin is high-Z.
Note:
The W-DQ2 and HOLD-DQ3 pins switch in high impedance after the last bit of the third address byte of the
instruction.
Figure 19. Fast read quad output with one dummy byte
0
1
2
3
4
5
6
7
8
9
10
29
A23
A22
A21
30
31
S
C
D-DQ0
Q-DQ1
High impedance
W-DQ2
High impedance
A2
A1
A0
HOLD-DQ3
FQREAD instruction
32
33
34
35
36
37
38
39
40
41
24-bit address
42
43
44
45
46
S
C
Q4
Q0
Q4
Q0
Q4
Q0
D-DQ0
High impedance
Q5
Q1
Q5
Q1
Q5
Q1
Q-DQ1
High impedance
Q6
Q2
Q6
Q2
Q6
Q2
W-DQ2
High impedance
Q7
Q3
Q7
Q3
Q7
Q3
HOLD-DQ3
Dummy clock cycles
DS12964 - Rev 4
Data Out 1
Data Out 2
Data Out 3
MS69272V1
page 32/71
M95P32-I M95P32-E
Erase operations
6.13
Erase operations
Chip erase, Block erase, Sector erase and Page erase operations set the selected area bits to 1.
6.13.1
Chip erase (C7h)
The chip erase (CHER) instruction sets all memory bits within the device to the erased state of 1 (FFh). A write
enable instruction must be executed before the device accepts the chip erase instruction (Status register bit WEL
must be 1). The instruction is initiated by driving the S pin low and shifting-in the instruction code C7h. The
instruction is completed by driving S high. The chip erase instruction sequence is shown in Figure 20.
The S pin must be driven high after the eighth bit has been latched. If this is not done the chip erase instruction is
not executed. After S is driven high, the self-timed chip erase instruction starts, with a time duration of tCE (see
Table 26). While the chip erase cycle is in progress, the read status register instruction can still be accessed to
check the status of the WIP bit. The WIP bit is automatically set to 1 during the chip erase cycle. It is reset to 0
when the device is ready to accept commands. After the chip erase cycle has finished, the write enable latch
(WEL) bit in the status register is cleared to 0. The chip erase instruction is not executed if any addressed pages
of the chip are protected by the block protection (BP2, BP1, and BP0) and TB bits. The status is reported with
PAMAF and ERF flags. See Table 9. Safety register format.
Figure 20. Chip erase
0
1
2
3
4
5
6
7
S
C
D
Q
High impedance
CHER instruction
6.13.2
MS69263V1
Block erase (D8h)
The block erase (BKER) instruction sets all memory bits within a specified block (64 Kbytes) to the erased state of
all 1s (FFh). A write enable instruction must be executed before the device accepts the block erase instruction
(the WEL status register bit must be 1). The instruction is initiated by driving the S pin low and shifting-in the
instruction code “D8h” followed by a 24-bit block address (A23-A0). The instruction is completed by driving S high.
The block erase instruction sequence is shown in Figure 21.
The S pin must be driven high after the eighth bit of the last byte has been latched. If this is not done the block
erase instruction is not executed. After S is driven high, the self-timed block erase instruction starts, with a time
duration of tBE1 (see Table 26. Programming times). While the block erase cycle is in progress, the read status
register instruction can still be accessed to check the status of the WIP bit. The WIP bit is at 1 during the block
erase cycle. It transits to 0 when the cycle has finished and the device is ready to accept further instructions. After
the block erase cycle is complete, the write enable latch (WEL) bit in the status register is cleared to 0. The block
erase instruction is not executed if any addressed pages of the block are protected by the block protection (BP2,
BP1, and BP0) and TB bits. The status is reported with PAMAF and ERF flags. See Table 9. Safety register
format.
DS12964 - Rev 4
page 33/71
M95P32-I M95P32-E
Erase operations
Figure 21. Block erase
-3
-2
-1
0
1
2
3
4
5
6
7
8
9
10
A23
A22
A21
11
12
29
30
31
S
C
D
Q
A1
A0
High impedance
BKER instruction
6.13.3
A2
24-bit address
MS55407V1
Sector erase (20h)
The sector erase (SCER) instruction sets all memory bits within a specified sector (4 Kbytes) to the erased state
of all 1s (FFh). A write enable instruction must be executed before the device accepts this instruction (Status
register bit WEL must equal 1). The instruction is initiated by driving the S pin low and shifting-in the instruction
code 20h, followed a 24-bit sector address (A23-A0). The instruction is completed by driving S high. The sector
erase instruction sequence is shown in Figure 22.
Figure 22. Sector erase
0
1
2
3
4
5
6
7
8
9
10
A23
A22
A21
11
12
29
30
31
S
C
D
Q
A2
A1
A0
High impedance
SCER instruction
24-bit address
MS55408V1
The S pin must be driven high after the eighth bit of the last byte has been latched. If this is not done the sector
erase instruction is not executed. After S is driven high, the self-timed sector erase instruction starts, for a time
duration of tSE (see Table 26. Programming times). While the sector erase cycle is in progress, the read status
register instruction can still be accessed to check the status of the WIP bit. The WIP bit is set 1 during the sector
erase cycle. It transits to 0 when the cycle is finished and the device is ready to accept further instructions. After
the sector erase cycle is complete, the write enable latch (WEL) bit in the status register is cleared to 0. The
sector erase instruction is not executed if any addressed pages of the sector are protected by the block protection
(BP2, BP1, and BP0) and TB bits. The status is reported with PAMAF and ERF flags. See Table 9. Safety register
format.
DS12964 - Rev 4
page 34/71
M95P32-I M95P32-E
Page program operations
6.13.4
Page erase (DBh)
The page erase (PGER) instruction sets a page of 512 bytes within the device to the erased state of all 1s (FFh).
A write enable instruction must first be executed before the device accepts the Page erase instruction (Status
register bit WEL must equal 1). The instruction is initiated by driving the S pin low and shifting-in the instruction
code DBh. The instruction is completed by driving S high. The Page erase instruction sequence is shown in
Figure 23.
The S pin must be driven high after the eighth bit has been latched, or the instruction is not executed. After S is
driven high, the self-timed page erase instruction starts, for a time duration of tPE (see Table 26. Programming
times). While the page erase cycle is in progress, the Read status register instruction can still be accessed to
check the status of the WIP bit. The WIP bit is 1 during the page erase cycle, and becomes 0 when the cycle
finishes and the device is ready to accept further instructions. After the page erase cycle is completed, the write
enable latch (WEL) bit in the status register is cleared to 0. The page erase instruction is not executed if the
addressed page is protected by the bock protection (BP2, BP1, and BP0) and TB bits. The status is reported with
PAMAF and ERF flags. See Table 9. Safety register format.
Figure 23. Page erase
0
1
2
3
4
5
6
7
8
9
10
29
A23
A22
A21
30
31
S
C
D
Q
6.14.1
A1
A0
High impedance
PGER instruction
6.14
A2
24-bit address
MS69278V1
Page program operations
Page program (0Ah)
The page program (PGPR) instruction allows from one to 512 bytes of data, initially in the erased state (FFh), to
be programmed to 0. A write enable instruction must be executed before the device accepts this instruction
(Status register bit WEL = 1).
The instruction is initiated by driving S low, then shifting the instruction code 0Ah, followed by a 24-bit address
(A23-A0) and at least one data byte into the D-DQ0 pin. The S pin must be held low for the whole length of the
instruction. The instruction is completed by driving S high. The sequence is shown in Figure 24.
Figure 24. Page program
0
1
2
3
4
5
6
7
8
9
10
29
30
31
32
33
34
35
36
37
38
39
4121 4122 4123 4124 4125 4126 4127 4128
S
C
D
A23 A22 A21
PGPR instruction
A2
24-bit address
A1
A0
D7
D6
D5
D4
D3
Data byte 1
D2
D1
D0
D7
Data bytes 2 to 511
D6
D5
D4
D3
Data byte 512
D2
D1
D0
MS69264V1
S must be driven high after the eighth bit of the last byte has been latched, otherwise the instruction is rejected
and is not executed. After S is driven high, the self-timed page program instruction starts for a time duration of tpp
(see Table 26. Programming times). While the page program cycle is in progress, the read status register
instruction can still be accessed to check the status of the WIP bit, which is at 1 during the page program cycle. It
becomes 0 when the cycle is finished and the device is ready to accept further instructions. When the page
program cycle finishes, the write enable latch (WEL) bit in the status register is cleared to 0. The page program
instruction is not executed if the addressed page is protected by the block protection bits, and the status is
reported with PAMAF, ERF, and PRF flags. See Table 9. Safety register format.
DS12964 - Rev 4
page 35/71
M95P32-I M95P32-E
Page program operations
Due to the ECC architecture, the page program operation can be executed only once within a data word of 16
bytes (modulo 16). The operation is limited to writing bytes within a single physical page (where address A23 to
A9 are the same), regardless of the number of bytes being programmed. After each data byte is received, the
address on the nine lowest-order address bits (A8 to A0) is internally incremented by one, and the remaining bits
(A23 to A9) remain constant. If more than 512 bytes are transmitted, the address counter rolls over to the
beginning of the same page and, the previously stored data is overwritten.
6.14.2
Page program with buffer load (0Ah)
Similarly to the page program instruction, the page program with buffer load (PGPR) instruction allows from one
to 512 bytes of data, initially in the erased state (FFh), to be programmed. It also allows the buffer of 512 data
bytes for the next page program operation to be loaded during page program execution.
The buffer mode must be activated by setting the buffer loading activation bit (BUFEN) to 1. See
Section 5.3 Volatile register format
A write enable instruction must be executed before the device accepts a page program instruction (Status register
bit WEL = 1).
The page program with buffer load instruction is initiated by driving pin S low, then shifting-in the instruction code
0Ah, followed by a 24-bit address (A23-A0) and at least one data byte into the D-DQ0 pin. The S pin must be held
low for the whole length of the instruction. The S pin must be driven high after the eighth bit of the last byte has
been latched. After S is driven high, the self-timed page program instruction starts for a time duration of tpp (see
Table 26. Programming times). The sequence is shown in Figure 24. Page program.
While the self-timed page program is in progress, and if buffer is available (BUFLD equal to 0), a new page
program instruction (no WREN needed) can be sent. This new page program command is executed with the
information stored in the buffer as soon as the ongoing page program execution is complete.
•
•
If the buffer is empty, the device waits for a new page program instruction.
If the buffer is not available (BUFLD equal to 1), the user must wait for the buffer free ((BUFLD equal to 0)
before sending a new page program instruction.
The read volatile register instruction (RDVR) allows buffer status to be checked.
•
To exit from buffer mode, the volatile configuration bit (BUFEN) in the volatile register must be reset to 0. See
Section 6.7 Write volatile register (81h).
Table 12. Buffer load
BUFEN
WIP
BUFLD
0
x
1
1
0
0
Description
Buffer mode inactive.
BUFLD is always at 1 when BUFEN is at 0 (buffer mode not active).
Buffer mode activated.
All the buffers are empty, page program allowed.
Buffer mode activated.
1
1
0
A buffer is empty and the page program is ongoing.
New page program authorized to load the available buffer.
Buffer mode activated.
1
1
1
All buffers are full and the page program is ongoing.
New page program not allowed.
Caution:
DS12964 - Rev 4
In buffer mode, only a reduced set of instructions is decoded to allow programming of a selected area. When
programming is complete, the BUFEN flag must be reset to enable the device to decode the full set of
instructions. In particular, to check programmed content, the user must exit from buffer mode to launch a READ
instruction over the programmed area.
page 36/71
M95P32-I M95P32-E
Page write (02h)
6.15
Page write (02h)
The page write (PGWR) instruction allows from one to 512 bytes of data to be written in a single instruction (auto
erase + program) leaving the other bytes of the page unchanged. A write enable instruction must be executed
before the device accepts this instruction (Status register bit WEL = 1).
The page write instruction is initiated by driving the S pin low then shifting the instruction code 02h, followed by a
24-bit address (A23-A0) and at least one data byte, into the D-DQ0 pin. S must be held low for the entire length of
the instruction, while data are sent to the device. The instruction is completed by driving S high. The whole
sequence is shown in Figure 25.
Figure 25. Page write
0
1
2
3
4
5
6
7
8
9
10
29
30
31
32
33
34
35
36
37
38
39
A2
A1
A0
D7
D6
D5
D4
D3
D2
D1
D0
S
C
D
A23 A22 A21
PGWR instruction
40
41
42
43
44
45
46
47
24-bit address
4121
4122
4123
4124
4125
4126
Data byte 1
4127
4128
S
C
D7
D6
D5
D4
D3
Data byte 2
D2
D1
D0
D7
D6
D5
D4
D3
Data byte 512
D2
D1
D0
D
MS55491V1
S must be driven high after the eighth bit of the last byte has been latched, or the page write instruction is not
executed. After S is driven high, the self-timed page write instruction starts for a time duration of tpw (see
Table 26. Programming times). While the page write cycle is in progress, the read status register instruction can
still be accessed to check the status of the WIP bit, which is at 1 during the page program cycle, and becomes 0
when the cycle is finished and the device is ready to accept further instructions. After the page write cycle has
finished, the write enable latch (WEL) bit in the status register is cleared to 0.
The page write operation is limited to writing bytes within a single physical page (where address A23 to A9 are the
same). After each data byte received, the address on the nine lowest order address bits (A8 to A0) is internally
incremented by one, and the remaining bits (A23 to A9) remain constant. If more than 512 bytes are transmitted,
the address counter rolls over to the beginning of the same page and the previously stored data are overwritten.
The write page instruction is not executed if a part of the targeted area is protected by the block protection bits. In
this case, the status is reported with the PAMAF, ERF, and PRF flags.
DS12964 - Rev 4
page 37/71
M95P32-I M95P32-E
Read identification (83h)
6.16
Read identification (83h)
The read identification (RDID) instruction allows one or more data bytes in the two identification pages (512 bytes
each) to be read sequentially:
•
•
The first page contains three device identification bytes.
In the case of an UID, one byte for length, and an unique ID value on N bytes, as specified in UID length
see Table 13).
The second page is located at the address 200h. It is delivered erased, available for customer data.
•
Table 13. Identification page content
Note:
Address (in the first identification page)
Content
Value
00h
ST manufacturer code
20h
01h
SPI family code
00h
02h
Memory density code
16h (32-Mbit)
03h
UID length
00h
04h
UID
FFh
The first three bytes (address 00h, 01h, and 02h) of the identification page can also be read with the read
JEDEC identification (JDID) instruction.
The read identification (RDID) instruction is initiated by driving the S pin low and shifting the instruction code 83h,
followed by a 24-bit address (A23-A0) into the D-DQ0 pin.
The data byte pointed to by the lower address bits [A9:A0] is shifted out (MSB first) on the serial data output (Q),
as shown in Figure 26. Read identification. The address is automatically incremented to the next higher address
of the identification pages after each data byte is shifted out, thus enabling a continuous stream of data. This
means that the entire area of identification pages (1024 bytes) can be accessed with a single instruction as long
as the clock continues to cycle. The instruction is completed by driving S high.
Figure 26. Read identification
0
1
2
3
4
5
6
7
8
9
10
29
30
31
32
33
34
35
36
37
38
39
Q7
Q6
Q5
Q4
Q3
Q2
Q1
Q0
40
41
42
Q7
Q6
Q5
43
44
45
46
47
Q4
Q3
Q2
Q1
Q0
S
C
A23 A22 A21
D
A2
A1
A0
High impedance
Q
RDID instruction
48
49
50
51
52
53
54
55
24-bit address
56
57
58
59
60
61
62
63
ST manufacturer code
64
65
66
67
68
69
70
71
Q7
SPI Family code
4121 4122 4123 4124 4125 4126 4127 4128
S
C
D
Q7
Q6
Q5
Q4
Q3
Q2
Memory density code
DS12964 - Rev 4
Q1
Q0
Q7
Q6
Q5
Q4
Q3
Q2
UID length or data out 4
Q1
Q0
Q7
Q6
Q5
Q4
Q3
Q2
UID or data out 5
Q1
Q0
Q7
Q6
Q5
Q4
Q3
data out 512
Q2
Q1
Q0
Q7
Q
MS69257V1
page 38/71
M95P32-I M95P32-E
Fast read identification (8Bh)
6.17
Fast read identification (8Bh)
The fast read identification (FRDID) instruction allows one or more data bytes in the two identification pages to be
sequentially read. With the addition of eight dummy clocks after the 24-bit address, it can operate at the highest
possible frequency fC (see Table 27. AC characteristics).
This instruction is initiated by driving the S pin low and shifting the instruction code 8Bh, followed first by a 24-bit
address (A23-A0) into the D-DQ0 pin, then by eight additional dummy clocks. The code and address bits are
latched on the rising edge of the C pin. After the eight dummy clocks are received, the data byte of the addressed
memory location is shifted out (MSB first) on the Q pin, on the falling edge of C. The address is automatically
incremented to the next higher address after each data byte is shifted out, thus enabling a continuous stream of
data. This means that the entire identification page (1024 bytes) can be accessed with a single instruction as long
as the clock continues to cycle.
The address counter rolls over to 0 after the highest address of the second identification page is reached. The
instruction is completed by driving the S pin high. During the dummy clock cycles the data value on the D pin is
don't care, and the Q pin is High-Z.
The FRDID instruction sequence is shown in Figure 27.
Figure 27. Fast read identification
0
1
2
3
4
5
6
7
8
9
10
29
30
31
S
C
D
A23 A22 A21
Q
A2
A1
A0
High impedance
FRDID instruction
32
33
34
35
36
37
38
39
24-bit address
40
41
42
43
44
45
46
47
4121 4122 4123 4124 4125 4126 4127 4128
S
C
D
High impedance
Dummy
Q7
Q6
Q5
Q4
Q3
Data out 1
Q2
Q1
Q0
Q7
Q6
Q5
Q4
Q3
Q2
Q1
Q0
Q7
Q
Data out 512
MS69266V1
DS12964 - Rev 4
page 39/71
M95P32-I M95P32-E
Write identification page (82h)
6.18
Write identification page (82h)
The write identification page (WRID) instruction is used to write the identification page.
To write the Identification page, a write enable (06h) instruction must have been executed previously for the
device to accept the instruction (Status register bit WEL = 1). Once write is enabled, the write identification page
instruction is initiated by driving the S pin low, then shifting the instruction code 82h followed by a 24-bit address
(A23-A0) and at least one data byte, into the D pin. The S pin must be held low for the whole length of the
instruction while data is being sent to the device. The instruction is completed by driving S high. (see Figure 28).
Figure 28. Write identification page
0
1
2
3
4
5
6
7
8
9
10
29
30
31
32
33
34
35
36
37
38
39
A2
A1
A0
D7
D6
D5
D4
D3
D2
D1
D0
S
C
A23 A22 A21
D
WRID instruction
24-bit address
40
41
42
43
44
45
46
47
D7
D6
D5
D4
D3
D2
D1
D0
4121
4122
4123
4124
4125
Data byte 1
4126
4127
4128
S
C
D
Data byte 2
D7
D6
D5
D4
D3
Data byte 512
D2
D1
D0
MS69258V1
Each time a new data byte is shifted in, the least significant bits of the internal address counter are incremented. If
the address counter exceeds the page boundary (the page size is 512 bytes), the internal address pointer rolls
over to the beginning of the page where next data bytes are written. If more than 512 bytes are received, only the
last 512 bytes are written.
DS12964 - Rev 4
page 40/71
M95P32-I M95P32-E
JEDEC identification (9Fh)
6.19
JEDEC identification (9Fh)
The JEDEC identification (JDID) instruction allows the three device identification bytes to be read in loop mode.
See Table 13. Identification page content.
This instruction is initiated by driving the S pin low and then shifting the instruction code 9Fh into the D pin. The
code bits are latched on the rising edge of the C pin. After the last bit of instruction code is received, the three
identification bytes are shifted out (MSB first) on the Q pin, on the next falling clock edge. The same three bytes
are continuously shifted out as long as the clock continues to cycle. The instruction is stopped by driving the S pin
high, as shown in Figure 29.
Figure 29. JEDEC identification
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
Q7
Q6
Q5
Q4
Q3
Q2
Q1
Q0
Q7
Q6
Q5
19
20
21
22
23
24
25
26
27
28
29
30
31
Q4
Q3
Q2
Q1
Q0
Q7
Q6
Q5
Q4
Q3
Q2
Q1
Q0
S
C
D
Q
High impedance
JDID instruction
ST manufacturer code
SPI family code
Memory density code
MS69279V1
DS12964 - Rev 4
page 41/71
M95P32-I M95P32-E
Read SFDP (5Ah)
6.20
Read SFDP (5Ah)
The read SFDP (RDSFDP) instruction is used to read the SFDP register format.
This instruction is initiated by driving the S pin low and shifting the instruction code 5Ah, followed first by a 24-bit
address (A23-A0) into the D pin, then by eight additional dummy clock cycles. The code and address bits are
latched on the rising edge of the C pin. After the eight dummy clocks are received, the data byte of the SFDP
register is shifted out (MSB first) on the Q pin, on the falling edge of C. The address is automatically incremented
to the next higher address after each data byte is shifted out, thus enabling a continuous stream of data. This
means that the whole SFDP register (512 bytes) can be accessed with a single instruction, as long as the clock
continues to cycle. The instruction is completed by driving S high. During the dummy clock cycles the data value
on the D pin is don't care and the Q pin is high-Z.
The read SFDP sequence is shown in Figure 30. Read SFDP.
Figure 30. Read SFDP
0
1
2
3
4
5
6
7
8
9
10
11
29
30
31
A2
A1
A0
47
48
49
S
C
D
A23 A22 A21
Q
High impedance
RDSFDP instruction
32
33
34
35
36
37
38
39
24-bit address
40
41
42
43
44
45
46
50
51
52
53
54
55
S
C
D
High impedance
Dummy
DS12964 - Rev 4
Q7
Q6
Q5
Q4
Q3
Data out 1
Q2
Q1
Q0
Q7
Q6
Q5
Q4
Q3
Data out 2
Q2
Q1
Q0
Q
MS69280V1
page 42/71
M95P32-I M95P32-E
Deep power-down enter (B9h)
6.21
Deep power-down enter (B9h)
The deep power-down enter (DPD) instruction puts the device in a very low consumption state, in which a limited
number of commands are available. This instruction is initiated by driving S low and shifting the instruction code
B9h into the D pin. The S pin must be held low for the whole length of the instruction. Pin S must be driven high
after the eighth bit has been latched, otherwise the instruction is not executed. After S is driven high, the device
enters in deep power-down state after a delay of tDPD.
The deep power-down enter instruction sequence is shown in Figure 31. See Table 15. Deep power-down
conditions for the values of tDP, tDPD, and tRDDPSL.
Figure 31. Deep power-down enter
0
1
2
3
4
5
6
tDPDSL
7
S
C
D
Current
DPD instruction
Standby current (ICC1)
tDPD
Deep power-down current (ICC2)
MS54399V2
While in deep power-down state, only the deep power-down release and reset instructions, which restore the
device to normal operation, are recognized. The device is always in normal operation on power-up, with a standby
current of ICC1.
Refer to Table 15. Deep power-down conditions for tDPD and tDPDSL.
DS12964 - Rev 4
page 43/71
M95P32-I M95P32-E
Deep power-down release (ABh)
6.22
Deep power-down release (ABh)
The deep power-down release (RDPD) instruction releases the device from deep power-down state, putting it into
Standby mode state.
This instruction is initiated by driving S low and shifting the instruction code ABh into the D pin. The S pin must be
held low for the full length of the instruction. Pin S must be driven high after the eighth bit has been latched,
otherwise the instruction is not executed. After S is driven high, if the device is in Deep power-down mode, the
transition to Standby power mode is delayed by tRDPD, and S must remain high for at least tRDPSL(max), as
specified in Table 15. Deep power-down conditions). Once in standby power mode, the device waits to be
selected so that it can receive, decode, and execute instructions.
The RDPD instruction sequence is shown in Figure 32.
Figure 32. Deep power-down release
0
1
2
3
4
5
6
7
tRDPDSL
S
C
D
Current
RDPD instruction
Deep power-down current (ICC2)
Standby current (ICC1)
MS55492V2
Refer to Table 15. Deep power-down conditions for tDPD and tRDPDSL.
DS12964 - Rev 4
page 44/71
M95P32-I M95P32-E
Enable reset (66h) and software reset (99h)
6.23
Enable reset (66h) and software reset (99h)
The enable reset (RSTEN) and software reset (RESET) instructions reset the device.
The RSTEN instruction enables the RESET instruction.
The RSTEN instruction is initiated by driving S low and shifting the instruction code 66h into the D pin. The S pin
must be held low for the entire length of the instruction . Pin S must be driven high after the eighth bit has been
latched. Once the S pin is driven high, the RESET instruction is initiated by driving S low and shifting the
instruction code 99h into the D pin. The S pin must be held low for the entire length of the instruction . Pin S must
be driven high after the eighth bit has been latched, otherwise the instruction is not executed.
To avoid accidental resets, these two instructions must be issued in sequence. Any command other than a
software reset (99h) after an enable reset (66h) command disables the reset enable state. A new sequence of
enable reset (66h) and software reset (99h) is needed to reset the device. Once the reset command is accepted
by the device, the reset is effective after a delay given in Table 16. Reset recovery time. During this period, no
command is accepted.
Figure 33. Software reset
0
1
2
3
4
5
6
7
0
1
2
3
4
5
6
7
S
C
D
High impedance
Q
RSTEN instruction
RESET instruction
MS55473V1
RSTEN and RESET instructions are understood in deep power-down mode.
When the device is in Deep Power mode or Standby mode, a software reset command can be decoded and
executed. In this case, the device is reset and after tRST1 or tRST2 it enters in Standby mode, ready to accept all
instructions.
When the device is executing a modify operation (including write status register command) a software reset
command can be decoded and executed. In this case either: the ongoing operation is properly completed: the
device is reset it goes in Standby mode, ready to accept all instructions or the ongoing operating does not finish
correctly, the data being processed can be damaged or lost, the device resets and it goes in Standby mode, ready
to accept all instructions.
DS12964 - Rev 4
page 45/71
M95P32-I M95P32-E
Power-up/down
7
Power-up/down
7.1
Power-up/down
Figure 34. Power-up timing
V
VCC (max)
Chip select low not allowed
Device fully accessible
VCC (min)
tVSL
Reset state
VPOR
Time
Figure 35. Power-down timing
V
VCC (max)
Chip select low not allowed
Device fully accessible
VCC (min)
tVSL
VPOR
tPWD
Time
Table 14. Power-up/down conditions
Parameter
Power-up
Power-down
Symbol
Min
Max
Unit
tVSL
30(1)
-
µs
Power-on reset voltage(2)
VPOR
1.1
1.45
V
Power-down time for reset(2)
tPWD
10
-
µs
VPOR
1.1
1.45
V
VCC(min) to S
Power-on reset
low(2)
voltage(2)
1. The WIP bit can be monitored after TVSL has elapsed (WIP = 1 at power-up and before tVSL = 30 μs).
2. Evaluated by characterization - not tested in production.
DS12964 - Rev 4
page 46/71
M95P32-I M95P32-E
Deep power-down
7.2
Deep power-down
Table 15. Deep power-down conditions
Symbol
(1)(2)
Parameter
Min Max
tDPDSL
Delay for S low (new instruction after S high from deep power-down enter instruction)
tDPD(3)
Time delay for deep power-down mode after S high
tRDPDSL(1)(2)
Release deep power-down delay to S low (new instruction)
Unit
10
-
μs
-
10
μs
30
-
μs
1. Evaluated by characterization - not tested in production.
2. Refer to Figure 31. Deep power-down enter and Figure 32. Deep power-down release.
3. Specified by design - not tested in production.
7.3
Reset
Table 16. Reset recovery time
Symbol
Parameter
Min
Max
Unit
tRST1(1)
Reset time when reset occurs with WIP = 0
-
30
µs
tRST2(1)
Reset time when reset occurs during modify
operations except chip erase
-
12
ms
tRST3(1)
Reset time when reset occurs in chip erase
execution
-
25
ms
1. Specified by design - not tested in production.
DS12964 - Rev 4
page 47/71
M95P32-I M95P32-E
Delivery state
8
Delivery state
The device is delivered with the following configuration:
•
•
•
•
•
•
•
DS12964 - Rev 4
Memory array erased: all bits set to 1 (each byte = FFh)
Status register: 00h (all bits are initialized to 0)
Safety register: 00h (all bits are initialized to 0)
Configuration register: 20h (0010 0000b)
Volatile register: 01h (0000 0001b)
Jedec ID delivered with three bytes set as specified in Table 13. Identification page content
Identification pages not protected and content as described in Section 6.16 Read identification (83h)
page 48/71
M95P32-I M95P32-E
Maximum ratings
9
Maximum ratings
Stressing the device outside the ratings listed in Table 17 may cause permanent damage to the device. These are
stress ratings only, and operation of the device at these, or any other conditions outside those indicated in the
operating sections of this specification, is not implied. Exposure to absolute maximum rating conditions for
extended periods may affect device reliability.
Table 17. Absolute maximum ratings
Symbol
Parameter
Min.
Max.
TAMB
Ambient operating temperature
-40
125
TSTG
Storage temperature
-65
150
TLEAD
Lead temperature during soldering
VO
Output voltage
-0.50
VCC + 0.6
VI
Input voltage
-0.50
4.2
VCC
Supply voltage
-0.50
4.2
IOL
DC output current (Q = 0)
-
5
IOH
DC output current (Q = 1)
-
5
VESD
Electrostatic discharge voltage (human body model) (2)
-
2000
See note
Unit
°C
(1)
V
mA
V
1. Compliant with JEDEC standard J-STD-020 (for small-body, Sn-Pb or Pb free assembly), the ST ECOPACK 7191395
specification, and the European directive on Restrictions on Hazardous Substances (RoHS directive 2011/65/EU of July
2011).
2. Positive and negative pulses applied on different combinations of pin connections, according to ANSI/ESDA/JEDEC JS-001,
C1 = 100 pF, R1 = 1500 Ω, R2 = 500 Ω.
DS12964 - Rev 4
page 49/71
M95P32-I M95P32-E
DC and AC parameters
10
DC and AC parameters
This section summarizes the operating conditions and the DC/AC characteristics.
Table 18. Operating conditions
Symbol
Parameter
Min.
Max.
Unit
VCC
Supply voltage
1.6
3.6
V
Ambient operating temperature (industrial range)
-40
85
°C
Ambient operating temperature (extended range)
-40
105
°C
TA
Table 19. AC measurement conditions
Symbol
Parameter
Min.
Max.
Unit
-
5
ns
-
Input rise/fall time
-
Input waveforms levels
0.1 VCC
0.9 VCC
-
Input timing reference levels
0.3 VCC
0.7 VCC
V
-
Output timing reference level
30 or 100
pF
Cbus
0.5 VCC
Capacitive load on output pins (CL)
-
Figure 36. AC measurement levels
0.9 VCC
Input waveform and timing
reference levels
Output timing reference level
0.7 VCC
0.5 VCC
0.3 VCC
0.1 VCC
MS69253V1
Table 20. Cycling performance by pages
Symbol
Parameter
Ncycle
Write cycle endurance
-
Chip erase endurance
Test conditions
–40 °C ≤ TA ≤ 85 °C,
Min.
Max.
Unit
-
500000
Write cycle (2)
-
100
Cycle
(1)
VCC(min) < VCC < VCC(max)
–40 °C ≤ TA ≤ 85 °C, (1)
VCC(min) < VCC < VCC(max)
1. –40 °C ≤ TA ≤ 105 °C for extended range.
2. A write cycle is executed when either a page write, a page program, a page erase, a WRSR, a WRID is decoded. When
using the page write or the WRID instruction refer also to Section 4.11 ECC.
DS12964 - Rev 4
page 50/71
M95P32-I M95P32-E
DC and AC parameters
Table 21. Memory cell data retention
Parameter
Data retention
Test conditions
(1)
Data retention after cycling (after 500K
100
TA = 40 °C
cycles)(1)
Min.
10
Unit
Year
1. The data retention behavior is checked in production, while the 100-year limit is defined from characterization and
qualification results.
Table 22. Capacitance
Symbol
Parameter
Test conditions (1)
Min.
Max.
COUT
Output pins capacitance
VOUT = 0 V
-
8
CIN
Input capacitance (D)
VIN = 0 V
-
6
Unit
pF
1. Specified by design - not tested in production.
DS12964 - Rev 4
page 51/71
M95P32-I M95P32-E
DC and AC parameters
Table 23. DC characteristics (M95P32-I; industrial temperature range)
Symbol
Parameter
Test conditions
S = VCC; TA = 25 °C
ICC1
VIN = VSS or VCC; 1.6 V ≤ VCC ≤ 3.6 V
Standby supply current
S = VCC; TA = 85 °C
VIN = VSS or VCC; 1.6V ≤ VCC ≤ 3.6 V
S = VCC; TA = 25 °C
VIN = VSS or VCC; VCC = 1.8 V
S = VCC; TA = 25 °C
ICC2
VIN = VSS or VCC; VCC = 3.6 V
Deep power-down current
S = VCC; TA = 85 °C
VIN = VSS or VCC; VCC = 1.8 V
S = VCC; TA = 85 °C
Min.
Typ.
Max.
-
16
35
Unit
µA
-
35(1)
40(1)
-
0.6
1.0
µA
-
1.5
2.0
-
0.6(1)
2.0(1)
µA
-
1.5(1)
3.0(1)
-
0.8(1)
1.5(1)
-
0.8(1)
2.0(1)
Read current quad
-
0.9(1)
2.0(1)
Read current single
-
1.0
2.0
-
1.2
2.0
-
1.5
3.0
-
1.5(1)
3.0(1)
-
1.8(1)
3.0(1)
Read current quad
-
2.0(1)
3.0(1)
Read current single
-
2.0
3.0
-
2.5
4.0
Read current quad
-
3.0
5.0
ICC4(1)
Page program current
-
2.0
3.0
mA
ICC5(1)
Write status current
-
1.5
3.0
mA
VIN = VSS or VCC; VCC = 3.6 V
Read current single
Read current dual
Read current dual
ICC3
ICC7(1)
ICC8
(1)
ICC9(2)
All outputs open
Read current single
Read current dual
ICC6
20 MHz
Read current quad
Read current dual
(1)
10 MHz
50 MHz
80 MHz
mA
mA
mA
mA
Page write current
S = VCC, no polling
-
1.5
3.0
mA
Page erase current
Averaged on execution time
-
1.0
3.0
mA
Sector/block erase current
-
2.0
3.0
mA
Chip erase current
-
10
25
mA
1. Evaluated by characterization - not tested in production.
2. Specified by design - not tested in production.
DS12964 - Rev 4
page 52/71
M95P32-I M95P32-E
DC and AC parameters
Table 24. DC characteristics (M95P32-E; extended temperature range)
Symbol
Parameter
Test conditions
S = VCC; TA = 25 °C
ICC1
VIN = VSS or VCC; 1.6 V ≤ VCC ≤ 3.6 V
Standby supply current
S = VCC; TA = 105 °C
VIN = VSS or VCC; 1.6 V ≤ VCC ≤ 3.6 V
S = VCC; TA = 25 °C
VIN = VSS or VCC; VCC = 1.8 V
S = VCC; TA = 25 °C
ICC2
VIN = VSS or VCC; VCC = 3.6 V
Deep power-down current
S = VCC; TA = 105 °C
VIN = VSS or VCC; VCC = 1.8 V
S = VCC; TA = 105 °C
Min.
Typ.
Max.
-
16
35
µA
-
45
150
-
0.6
1.0
µA
-
1.5
2.0
-
1.5
2.0
µA
-
2.5
4.0
-
0.8(1)
1.5(1)
-
0.8(1)
2.0(1)
Read current quad
-
0.9(1)
2.0(1)
Read current single
-
1.0
2.0
-
1.2
2.0
-
1.5
3.0
-
1.5(1)
3.0(1)
-
1.8(1)
3.0(1)
Read current quad
-
2.0(1)
3.0(1)
Read current single
-
2.0
3.0
-
2.5
4.0
Read current quad
-
3.0
5.0
ICC4(1)
Page program current
-
2.0
3.0
ICC5(1)
Write status current
-
1.5
3.0
VIN = VSS or VCC; VCC = 3.6 V
Read current single
Read current dual
Read current dual
ICC3
ICC7(1)
ICC8
(1)
ICC9(2)
All outputs open
Read current single
Read current dual
ICC6
20 MHz
Read current quad
Read current dual
(1)
10 MHz
50 MHz
80 MHz
Unit
Page write current
S = VCC, no polling.
-
1.5
3.0
Page erase current
Averaged on execution time.
-
1.0
3.0
Sector/block erase current
-
2.0
3.0
Chip erase current
-
10
25
mA
1. Evaluated by characterization - not tested in production.
2. Specified by design - not tested in production.
DS12964 - Rev 4
page 53/71
M95P32-I M95P32-E
DC and AC parameters
Table 25. DC characteristics - other parameters
Symbol
Parameter
ILI
Input leakage current
ILO
Output leakage current
VIL
Input low voltage
VIH
Input high voltage
VOL
Output low voltage
VOH
Output high voltage
Vpor(1)
Test conditions
Min.
Max.
-
±2
-
±2
-0.45
0.25 VCC
0.75 VCC
VCC + 0.6
VCC = 1.8 V, IOL = 0.15 mA
-
0.3
VCC = 2.5 V, IOL = 1.5 mA
-
0.4
VCC = 1.8 V, IOH = 0.15 mA
0.8 VCC
-
VCC = 2.5 V, IOH = 1.5 mA
0.8 VCC
-
-
1.1
1.45
VIN = VSS or VCC
Q open
Voltage reset
Unit
µA
V
1. Evaluated by characterization - not tested in production.
Table 26. Programming times
Symbol
Parameter
Min.
Typ.(1)(2)
Max.(2)
tPP
Page program cycle time (512 bytes)
-
1.2
1.5
tPE
Page erase cycle time (512 bytes)
-
1.1
4.5(3)
tPW
Page write cycle time (512 bytes)
-
2
4.5(3)
tSE
Sector erase cycle time
-
1.3
5(3)
tBE
Block erase cycle time
-
4
8(3)
tCE
Chip erase cycle time
-
15
25(3)
Write status and configuration registers cycle time
-
4
9(3)
tWSCR
Unit
ms
1. TA = 25 °C
2. No significant degradation with aging.
3. The probability to reach the maximum value is less than 1 out of 10 millions.
DS12964 - Rev 4
page 54/71
M95P32-I M95P32-E
DC and AC parameters
Table 27. AC characteristics
Test conditions specified in Table 18 and Table 19
Symbol
1.6 V ≤ VCC ≤ 2.6 V
Parameter
2.6 V < VCC ≤ 3.6 V
Min.
Max.
Min
Max.
Clock frequency
-
40
-
80
tSLCH
S active setup time
5
-
5
-
tSHCH
S not active setup time
3
-
3
-
tSHSL
S deselect time
50
-
50
-
tCHSH
S active hold time
5
-
5
-
tCHSL
S not active hold time
5
-
5
-
Clock high time
10
-
5.5
-
Clock low time
10
-
5.5
-
Clock rise time
0.1
-
0.1
-
Clock fall time
0.1
-
0.1
-
FC
tCH
(1)
tCL(1)
tCLCH
(2)
tCHCL(2)
Data in set-up time
2
-
2
-
tCHDX
Data in hold time
2
-
2
-
tCLHL
Clock low setup time before HOLD active
0
-
0
-
tCLHH
Clock low setup time before HOLD not active
0
-
0
-
tHLCH
HOLD active setup time before clock high
5
-
5
-
tHHCH
HOLD not active time before clock high
5
-
5
-
Output disable time
-
8
-
8
-
20(4)
-
11(5)
1
-
1
-
(2)(3)
tCLQV
tCLQX(2)
tHHQV
MHz
ns
V / ns
tDVCH
tSHQZ(2)
Unit
Clock low to output valid
Load 30 pF
Output hold time
HOLD high to output valid
Load 30 pF
-
25
-
15
tHHQX(2)
HOLD high to output low / high-Z
Load 30 pF
1
-
1
-
tHLQZ(2)
HOLD low to output high-Z
-
8
-
8
tWHSL(2)
Write protect setup time
10
-
10
-
tSHWL(2)
Write protect hold time
10
-
10
-
ns
ns
1. tCH + tCL must never be less than the shortest possible clock period that is 1 / fC(max).
2. Evaluated by characterization - not tested in production.
3. With buffer strength medium (DRV1; DRV0 = 0; 1).
4. TCLQV = 30 ns with buffer strength low (DRV1; DRV0 = 1; 0). Evaluated by characterization - not tested in production.
5. TCLQV = 15 ns with buffer strength low (DRV1; DRV0 = 1; 0). Evaluated by characterization - not tested in production.
DS12964 - Rev 4
page 55/71
M95P32-I M95P32-E
DC and AC parameters
Figure 37. Serial input timing
W
tSHWL
tWHSL
tSHSL
S
tCHSL
tCH
tSLCH
tCHSH
tSHCH
C
tDVCH
tCL
tCHCL
tCLCH
tCHDX
D
LSB IN
MSB IN
High impedance
Q
MS69213
Figure 38. Hold timing
S
tHLCH
tCLHL
tHHCH
C
tCLHH
tHLQZ
tHHQV
DT01448cV2
Q
HOLD
Figure 39. Serial output timing
S
tSHSL
tCH
C
tCLQV
tCLCH
tCHCL
tCL
tSHQZ
tCLQX
tQLQH
tQHQL
D
DS12964 - Rev 4
ADDR
LSB IN
DT01449gV2
Q
page 56/71
M95P32-I M95P32-E
Package information
11
Package information
In order to meet environmental requirements, ST offers these devices in different grades of ECOPACK packages,
depending on their level of environmental compliance. ECOPACK specifications, grade definitions and product
status are available at: www.st.com. ECOPACK is an ST trademark.
11.1
SO8N package information
This SO8N is an 8-lead, 4.9 x 6 mm, plastic small outline, 150 mils body width, package.
Figure 40. SO8N – Outline
h x 45˚
A
A2
c
b
ccc
e
0.25 mm
D
GAUGE PLANE
SEATING
PLANE
k
C
E1
1
E
A1
L
L1
O7_SO8_ME_V2
8
1. Drawing is not to scale.
DS12964 - Rev 4
page 57/71
M95P32-I M95P32-E
SO8N package information
Table 28. SO8N – Mechanical data
Symbol
inches (1)
millimeters
Min.
Typ.
Max.
Min.
Typ.
Max.
A
-
-
1.750
-
-
0.0689
A1
0.100
-
0.250
0.0039
-
0.0098
A2
1.250
-
-
0.0492
-
-
b
0.280
-
0.480
0.0110
-
0.0189
c
0.170
-
0.230
0.0067
-
0.0091
D(2)
4.800
4.900
5.000
0.1890
0.1929
0.1969
E
5.800
6.000
6.200
0.2283
0.2362
0.2441
E1(3)
3.800
3.900
4.000
0.1496
0.1535
0.1575
e
-
1.270
-
-
0.0500
-
h
0.250
-
0.500
0.0098
-
0.0197
k
0°
-
8°
0°
-
8°
L
0.400
-
1.270
0.0157
-
0.0500
L1
-
1.040
-
-
0.0409
-
ccc
-
-
0.100
-
-
0.0039
1. Values in inches are converted from mm and rounded to four decimal digits.
2. Dimension “D” does not include mold flash, protrusions or gate burrs. Mold flash, protrusions or gate burrs shall not exceed
0.15 mm per side
3. Dimension “E1” does not include interlead flash or protrusions. Interlead flash or protrusions shall not exceed 0.25 mm per
side.
Note:
The package top may be smaller than the package bottom. Dimensions D and E1 are determinated at the
outermost extremes of the plastic body exclusive of mold flash, tie bar burrs, gate burrs and interleads flash, but
including any mismatch between the top and bottom of plastic body. Measurement side for mold flash,
protusions or gate burrs is bottom side.
Figure 41. SO8N - Footprint example
1.27
O7_SO8N_FP_V2
3.9
6.7
0.6 (x8)
1. Dimensions are expressed in millimeters.
DS12964 - Rev 4
page 58/71
M95P32-I M95P32-E
WLCSP8 package information
11.2
WLCSP8 package information
This WLCSP is a 8-ball, 2.608 x 1.531 mm, 0.7 x 0.8 mm pitch, wafer level chip scale package.
Figure 42. WLCSP8 - Outline with BSC
E
Orientation
reference
aaa C
(2X)
A
Orientation
reference
bbb C
ddd C
B
e1
F
C
G
e
ccc
D
aaa C
(2X)
A3
A2
TOP VIEW
CA B
b
SIDE VIEW
A1
F
G
A
BOTTOM VIEW
1. Drawing is not to scale.
2. Dimension is measured at the maximum bump diameter parallel to primary datum Z.
3. Primary datum C and seating plane are defined by the spherical crowns of the bump.
E1f_WLCSP8_32M_ME_V1
DS12964 - Rev 4
page 59/71
M95P32-I M95P32-E
WLCSP8 package information
Table 29. WLCSP8 - Mechanical data
Symbol
Inches1
Millimeters
Min
Typ
Max
Min
Typ
Max
A
0.520
0.550
0.580
0.0205
0.0216
0.0228
A1
-
0.194
-
-
0.0076
-
-
0.355
-
-
0.0140
-
A3
-
0.025
-
-
0.0010
-
b
-
0.268
-
-
0.0105
-
D
-
2.608
2.639
-
0.1027
0.1039
E
-
1.531
1.562
-
0.0603
0.0615
e
-
0.700
-
-
0.0276
-
e1
-
0.800
-
-
0.0315
-
F
-
0.366
-
-
0.0144
-
G
-
0.254
-
-
0.0100
-
aaa
-
-
0.110
-
-
0.0043
bbb
-
-
0.110
-
-
0.0043
ccc
-
-
0.110
-
-
0.0043
ddd
-
-
0.060
-
-
0.0024
A2
(including A3)
1. Values in inches are converted from mm and rounded to 4 decimal digits.
DS12964 - Rev 4
page 60/71
M95P32-I M95P32-E
UFDFPN8 (DFN8) package information
11.3
UFDFPN8 (DFN8) package information
This UFDFPN is an 8-lead, 4 x 4 mm, 0.8 mm pitch ultra thin profile fine pitch dual flat package.
Figure 43. UFDFPN8 - Outline
B
PIN 1 INDEX
E
2x
aaa
2x
C
aaa
D
C
A
ccc C
A1
A
Nx
eee C
SEATING
PLANE
AB
bbb M
C
ddd M
C
D2
Nx b
k
fff M C A B
L (8x)
fff M C A B
b
E2
e
PIN 1 INDEX
1. Exposed copper is not systematic and can appear partially or totally according to the cross section.
2. Drawing is not to scale.
3. The central pad (the area E2 by D2 in the above illustration) must be either connected to VSS or left floating
(not connected) in the end application.
4. Exact shape of the leads at the edge of the package is optional.
5. Dimensions “b” and “L” are measured at terminal plating surface.
DS12964 - Rev 4
page 61/71
M95P32-I M95P32-E
UFDFPN8 (DFN8) package information
Table 30. UFDFPN8 - Mechanical data
Symbol
inches(1)
millimeters
Min
Typ
Max
Min
Typ
Max
A
0.45
0.55
0.65
0.0177
0.0217
0.0256
A1(2)(3)
0.00
-
0.05
0.000
-
0.0020
b(4)(5)
0.20
0.25
0.30
0.0079
0.0098
0.0118
D
D2
4.00 BSC
2.10
E
E2
0.1574 BSC
2.20
2.30
0.0827
4.00 BSC
3.10
e
0.0866
0.0905
0.1574 BSC
3.2
3.3
0.1220
0.80 BSC
0.1260
0.1299
0.0315 BSC
L
0.30
0.35
0.40
0.0118
0.0138
0.0157
k
0.40
-
-
0.0157
-
-
N
8
aaa(6)
0.15
0.0059
bbb(6)
0.10
0.0039
ccc(6)
0.10
0.0039
ddd(6)
0.05
0.0020
eee(6)
0.08
0,0031
fff(6)
0.10
0.0039
1. Values in inches are converted from mm and rounded to four decimal digits.
2. A1 is defined as the distance from the seating plane to the lowest point on the package body (standoff).
3. Terminal A1 identifier and terminal numbering convention shall conform to JEP95 SPP-002. Terminal A1 identifier must be
located within the zone indicated on the outline drawing. Topside terminal A1 indicator may be a molded, or metalized
feature. Optional indicator on bottom surface may be a molded, marked, or metallized feature.
4. Dimension ‘b’ applies to a metallized terminal and is measured between 0.15 mm and 0.30 mm from the terminal tip. If the
terminal has the optional radius on the other end of the terminal, the dimension ‘b’ should not be measured in that radius
area.
5. Inner edge of corner terminals may be chamfered or rounded in order to achieve minimum gap “k”. This feature should not
affect the terminal width “b”, which is measured L/2 from the edge of the package body.
6. Dimensioning and tolerancing schemes conform to ASME Y14.5M-1994.
Figure 44. UFDFPN8 - Footprint example
0.35
0.80
3.20
2.20
0.40 min.
1. Dimensions are expressed in millimeters.
DS12964 - Rev 4
page 62/71
M95P32-I M95P32-E
Ordering information
12
Ordering information
Table 31. Ordering information scheme
Example
M95
P32-
I
X
MN
T
/E
F
Device type
M95 = SPI serial access EEPROM
Device function
P32 = 32-Mbit (4 194 304 x 8-bit)
Device grade
I = industrial temperature range, -40 °C to 85 °C
E = extended temperature range, -40 °C to 105 °C
Operating voltage
X = VCC = 1.6 V to 3.6 V
Package(1)
MN = SO8N (150 mil width)
CS = WLCSP8 (13 mil width)
MG = DFN8 (4 x 4 mm)
Option
Blank = tube packing
T = tape and reel packing
Process
/E = manufacturing technology code
Option
F = with back side coating
Blank = without back side coating
1. All packages are ECOPACK2 (RoHS-compliant and free of brominated, chlorinated, and antimony-oxide flame retardants).
Note:
For a list of available options (speed, package, etc.) or for further information on any aspect of this device,
contact your nearest ST sales office.
Note:
Parts marked as “ES”, “E”, or accompanied by an Engineering sample notification letter, are not yet qualified and
therefore not approved for use in production. ST is not responsible for any consequences resulting from such
use. In no event will ST be liable for the customer using any of these engineering samples in production. ST
quality has to be contacted prior to any decision to use these Engineering samples to run qualification activity.
DS12964 - Rev 4
page 63/71
M95P32-I M95P32-E
Ordering information
Table 32. Ordering information scheme for unsawn wafer
Example:
M95
P32
-I
X
W
22
I
/E
Device type
M95 = SPI serial access EEPROM
Device function
P32 = 32-Mbit (4 194 304 x 8-bit)
Device grade
I = industrial temperature range, -40 °C to 85 °C
Operating voltage
X = VCC = 1.6 V to 3.6 V
Delivery form
W = unsawn wafer
Wafer thickness
22 = 180 µm back lapped wafer
Wafer testing
I = inkless test
Process
E = manufacturing technology code
DS12964 - Rev 4
page 64/71
M95P32-I M95P32-E
Revision history
Table 33. Document revision history
Date
Revision
15‑Jun‑2022
1
Changes
Initial release.
Updated:
05-Oct-2022
2
•
•
•
•
•
•
•
•
•
•
Cover image
Section 6.10 Fast read single output with one dummy byte (0Bh)
Section 6.16 Read identification (83h)
Figure 26. Read identification
Figure 27. Fast read identification
Table 17. Absolute maximum ratings
Table 25. DC characteristics - other parameters
Section 11.2 WLCSP8 package information
Section 11.3 UFDFPN8 (DFN8) package information
Table 26. Programming times
Updated:
08-Mar-2023
3
•
•
•
•
•
•
•
•
•
•
Features
Section 1 Description
Section 2 Memory
Section 3 Signal description
Section 5 Status, configurable, safety, volatile, and SFDP registers
Section 6 Instructions
Section 9 Maximum ratings
Section 10 DC and AC parameters
Section 11 Package information
Section 12 Ordering information
Updated:
11-Jul-2023
DS12964 - Rev 4
4
•
•
•
•
•
•
•
•
•
Features
Section 3 Signal description
Section 3.5 Hold (HOLD-DQ3)
Section 3.6 Write protect (W-DQ2)
Section 6.8 Write status and configuration registers (01h)
Table 23. DC characteristics (M95P32-I; industrial temperature range)
Table 24. DC characteristics (M95P32-E; extended temperature range)
Table 27. AC characteristics
Section 11.3 UFDFPN8 (DFN8) package information
page 65/71
M95P32-I M95P32-E
Contents
Contents
1
Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3
2
Memory . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5
3
4
2.1
Block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
2.2
Memory map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
Signal description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .9
3.1
Serial data output (Q-DQ1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
3.2
Serial data input (D-DQ0). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
3.3
Serial clock (C) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
3.4
Chip select (S) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
3.5
Hold (HOLD-DQ3). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
3.6
Write protect (W-DQ2) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
3.7
VCC (VCC, supply voltage). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
3.8
VSS (VSS, ground) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
Device operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .11
4.1
Connecting to the SPI bus . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
4.2
SPI modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
4.3
Dual output read . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
4.4
Quad output read . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
4.5
Supply voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
4.6
Power-up conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
4.7
Power-down conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
4.8
Active power, standby power, and deep power-down modes . . . . . . . . . . . . . . . . . . . . . . . . . 13
4.9
Device reset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
4.10
Hold condition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
4.11
ECC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
4.12
Data protection and protocol control . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
4.13
5
4.12.1
Memory protection scheme . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
4.12.2
Hardware data protection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
Polling during a program, write, or erase cycle . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
Status, configurable, safety, volatile, and SFDP registers . . . . . . . . . . . . . . . . . . . . . . . . . .17
5.1
Status register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
5.2
Configuration and safety register format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
DS12964 - Rev 4
5.2.1
Configuration register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
5.2.2
Safety register. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
page 66/71
M95P32-I M95P32-E
Contents
6
5.3
Volatile register format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
5.4
SFDP register format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
Instructions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .21
6.1
Write enable (06h). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
6.2
Write disable (04h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
6.3
Read status register (05h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
6.4
Read configuration and safety registers (15h). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
6.5
Clear safety register (50h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
6.6
Read volatile register (85h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
6.7
Write volatile register (81h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
6.8
Write status and configuration registers (01h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28
6.9
Read data single output (03h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
6.10
Fast read single output with one dummy byte (0Bh). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
6.11
Fast read dual output with one dummy byte (3Bh) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
6.12
Fast read quad output with one dummy byte (6Bh) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32
6.13
Erase operations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
6.14
7
6.13.1
Chip erase (C7h). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
6.13.2
Block erase (D8h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
6.13.3
Sector erase (20h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
6.13.4
Page erase (DBh) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
Page program operations. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
6.14.1
Page program (0Ah) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
6.14.2
Page program with buffer load (0Ah). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
6.15
Page write (02h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
6.16
Read identification (83h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38
6.17
Fast read identification (8Bh) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39
6.18
Write identification page (82h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40
6.19
JEDEC identification (9Fh). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41
6.20
Read SFDP (5Ah) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42
6.21
Deep power-down enter (B9h). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 43
6.22
Deep power-down release (ABh) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44
6.23
Enable reset (66h) and software reset (99h) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45
Power-up/down . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .46
7.1
Power-up/down . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46
7.2
Deep power-down . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47
7.3
Reset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47
DS12964 - Rev 4
page 67/71
M95P32-I M95P32-E
Contents
8
Delivery state . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .48
9
Maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .49
10
DC and AC parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .50
11
Package information. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .57
12
11.1
SO8N package information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 57
11.2
WLCSP8 package information. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 59
11.3
UFDFPN8 (DFN8) package information. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61
Ordering information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .63
Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .65
List of figures. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .69
List of tables . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .70
DS12964 - Rev 4
page 68/71
M95P32-I M95P32-E
List of figures
List of figures
Figure 1.
Figure 2.
Figure 3.
Figure 4.
Figure 5.
Figure 6.
Figure 7.
Figure 8.
Figure 9.
Figure 10.
Figure 11.
Figure 12.
Figure 13.
Figure 14.
Figure 15.
Figure 16.
Figure 17.
Figure 18.
Figure 19.
Figure 20.
Figure 21.
Figure 22.
Figure 23.
Figure 24.
Figure 25.
Figure 26.
Figure 27.
Figure 28.
Figure 29.
Figure 30.
Figure 31.
Figure 32.
Figure 33.
Figure 34.
Figure 35.
Figure 36.
Figure 37.
Figure 38.
Figure 39.
Figure 40.
Figure 41.
Figure 42.
Figure 43.
Figure 44.
DS12964 - Rev 4
8-pin package connections (top view) . . . . . . . .
8-bump ultra thin WLCSP8 connection . . . . . . .
Block diagram . . . . . . . . . . . . . . . . . . . . . . . .
Bus master and memory devices on the SPI bus.
SPI modes supported . . . . . . . . . . . . . . . . . . .
Hold condition activation . . . . . . . . . . . . . . . . .
Write enable. . . . . . . . . . . . . . . . . . . . . . . . . .
Write disable . . . . . . . . . . . . . . . . . . . . . . . . .
Read status register . . . . . . . . . . . . . . . . . . . .
Read configuration and safety registers . . . . . . .
Clear safety register . . . . . . . . . . . . . . . . . . . .
Read volatile register. . . . . . . . . . . . . . . . . . . .
Write volatile register . . . . . . . . . . . . . . . . . . . .
Write status register . . . . . . . . . . . . . . . . . . . .
Write status and configuration registers . . . . . . .
Read data single output . . . . . . . . . . . . . . . . . .
Fast read single output with one dummy byte . . .
Fast read dual output with one dummy byte . . . .
Fast read quad output with one dummy byte. . . .
Chip erase . . . . . . . . . . . . . . . . . . . . . . . . . . .
Block erase . . . . . . . . . . . . . . . . . . . . . . . . . .
Sector erase . . . . . . . . . . . . . . . . . . . . . . . . .
Page erase . . . . . . . . . . . . . . . . . . . . . . . . . .
Page program . . . . . . . . . . . . . . . . . . . . . . . .
Page write . . . . . . . . . . . . . . . . . . . . . . . . . . .
Read identification . . . . . . . . . . . . . . . . . . . . .
Fast read identification. . . . . . . . . . . . . . . . . . .
Write identification page. . . . . . . . . . . . . . . . . .
JEDEC identification . . . . . . . . . . . . . . . . . . . .
Read SFDP . . . . . . . . . . . . . . . . . . . . . . . . . .
Deep power-down enter. . . . . . . . . . . . . . . . . .
Deep power-down release . . . . . . . . . . . . . . . .
Software reset . . . . . . . . . . . . . . . . . . . . . . . .
Power-up timing . . . . . . . . . . . . . . . . . . . . . . .
Power-down timing . . . . . . . . . . . . . . . . . . . . .
AC measurement levels. . . . . . . . . . . . . . . . . .
Serial input timing . . . . . . . . . . . . . . . . . . . . . .
Hold timing. . . . . . . . . . . . . . . . . . . . . . . . . . .
Serial output timing . . . . . . . . . . . . . . . . . . . . .
SO8N – Outline . . . . . . . . . . . . . . . . . . . . . . .
SO8N - Footprint example . . . . . . . . . . . . . . . .
WLCSP8 - Outline with BSC. . . . . . . . . . . . . . .
UFDFPN8 - Outline . . . . . . . . . . . . . . . . . . . . .
UFDFPN8 - Footprint example . . . . . . . . . . . . .
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M95P32-I M95P32-E
List of tables
List of tables
Table 1.
Table 2.
Table 3.
Table 4.
Table 5.
Table 6.
Table 7.
Table 8.
Table 9.
Table 10.
Table 11.
Table 12.
Table 13.
Table 14.
Table 15.
Table 16.
Table 17.
Table 18.
Table 19.
Table 20.
Table 21.
Table 22.
Table 23.
Table 24.
Table 25.
Table 26.
Table 27.
Table 28.
Table 29.
Table 30.
Table 31.
Table 32.
Table 33.
Signal names . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Address range by sector . . . . . . . . . . . . . . . . . . . . . . . . . .
Example of pages inside sector 0. . . . . . . . . . . . . . . . . . . .
Protected area sizes. . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Protection modes. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Status register format . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Configuration register format . . . . . . . . . . . . . . . . . . . . . . .
Output driver strength. . . . . . . . . . . . . . . . . . . . . . . . . . . .
Safety register format . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Volatile register format . . . . . . . . . . . . . . . . . . . . . . . . . . .
M95P32-I and M95P32-E instruction set . . . . . . . . . . . . . . .
Buffer load . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Identification page content . . . . . . . . . . . . . . . . . . . . . . . .
Power-up/down conditions . . . . . . . . . . . . . . . . . . . . . . . .
Deep power-down conditions. . . . . . . . . . . . . . . . . . . . . . .
Reset recovery time . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Absolute maximum ratings . . . . . . . . . . . . . . . . . . . . . . . .
Operating conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . .
AC measurement conditions . . . . . . . . . . . . . . . . . . . . . . .
Cycling performance by pages. . . . . . . . . . . . . . . . . . . . . .
Memory cell data retention . . . . . . . . . . . . . . . . . . . . . . . .
Capacitance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
DC characteristics (M95P32-I; industrial temperature range) .
DC characteristics (M95P32-E; extended temperature range)
DC characteristics - other parameters. . . . . . . . . . . . . . . . .
Programming times . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
AC characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
SO8N – Mechanical data . . . . . . . . . . . . . . . . . . . . . . . . .
WLCSP8 - Mechanical data. . . . . . . . . . . . . . . . . . . . . . . .
UFDFPN8 - Mechanical data . . . . . . . . . . . . . . . . . . . . . . .
Ordering information scheme. . . . . . . . . . . . . . . . . . . . . . .
Ordering information scheme for unsawn wafer . . . . . . . . . .
Document revision history . . . . . . . . . . . . . . . . . . . . . . . . .
DS12964 - Rev 4
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page 70/71
M95P32-I M95P32-E
IMPORTANT NOTICE – READ CAREFULLY
STMicroelectronics NV and its subsidiaries (“ST”) reserve the right to make changes, corrections, enhancements, modifications, and improvements to ST
products and/or to this document at any time without notice. Purchasers should obtain the latest relevant information on ST products before placing orders. ST
products are sold pursuant to ST’s terms and conditions of sale in place at the time of order acknowledgment.
Purchasers are solely responsible for the choice, selection, and use of ST products and ST assumes no liability for application assistance or the design of
purchasers’ products.
No license, express or implied, to any intellectual property right is granted by ST herein.
Resale of ST products with provisions different from the information set forth herein shall void any warranty granted by ST for such product.
ST and the ST logo are trademarks of ST. For additional information about ST trademarks, refer to www.st.com/trademarks. All other product or service names
are the property of their respective owners.
Information in this document supersedes and replaces information previously supplied in any prior versions of this document.
© 2023 STMicroelectronics – All rights reserved
DS12964 - Rev 4
page 71/71