STB9NK80Z
Datasheet
Automotive-grade N-channel 800 V, 1.5 Ω typ., 5.2 A SuperMESH
Power MOSFET in a D²PAK package
Features
TAB
2
Order code
VDS
RDS(on) max.
ID
STB9NK80Z
800 V
1.8 Ω
5.2 A
3
1
•
•
•
•
•
D²PAK
D(2, TAB)
AEC-Q101 qualified
100% avalanche tested
Gate charge minimized
Very low intrinsic capacitance
Zener-protected
Applications
G(1)
•
Switching applications
Description
S(3)
AM01475V1
This high-voltage device is a Zener-protected N-channel Power MOSFET developed
using the SuperMESH technology by STMicroelectronics, an optimization of the wellestablished PowerMESH. In addition to a significant reduction in on-resistance, this
device is designed to ensure a high level of dv/dt capability for the most demanding
applications.
Product status link
STB9NK80Z
Product summary
Order code
STB9NK80Z
Marking
B9NK80Z
Package
D²PAK
Packing
Tape and reel
DS9606 - Rev 3 - October 2019
For further information contact your local STMicroelectronics sales office.
www.st.com
STB9NK80Z
Electrical ratings
1
Electrical ratings
Table 1. Absolute maximum ratings
Symbol
Parameter
Value
Unit
VDS
Drain-source voltage
800
V
VGS
Gate-source voltage
±30
V
ID
Drain current (continuous) at TC = 25 °C
5.2
A
ID
Drain current (continuous) at TC = 100 °C
3.3
A
IDM (1)
Drain current (pulsed)
20.8
A
PTOT
Total power dissipation at TC = 25 °C
125
W
ESD
Gate-source human body model (C = 100 pF, R = 1.5 kΩ)
4
kV
4.5
V/ns
-55 to 150
°C
Value
Unit
dv/dt
(2)
Tj
Peak diode recovery voltage slope
Operating junction temperature range
Tstg
Storage temperature range
1. Pulse width limited by safe operating area.
2. ISD ≤ 5.2 A, di/dt ≤ 200 A/µs, VDD ≤ V(BR)DSS.
Table 2. Thermal data
Symbol
Parameter
Rthj-case
Thermal resistance junction-case
Rthj-amb
Thermal resistance junction-ambient
1
62.5
°C/W
Table 3. Avalanche characteristics
Symbol
IAR
(1)
EAS (2)
Parameter
Value
Unit
Avalanche current, repetitive or not-repetitive
5.2
A
Single pulse avalanche energy
210
mJ
1. Pulse width limited by Tjmax.
2. Starting Tj = 25 °C, ID = IAR, VDD = 50 V.
DS9606 - Rev 3
page 2/17
STB9NK80Z
Electrical characteristics
2
Electrical characteristics
(TCASE = 25 °C unless otherwise specified)
Table 4. On/off states
Symbol
V(BR)DSS
Parameter
Drain-source breakdown
voltage
Test conditions
VGS = 0 V, ID = 1 mA
Min.
Typ.
Max.
800
Unit
V
VGS = 0 V, VDS = 800 V
1
µA
IDSS
Zero gate voltage drain current
VGS = 0 V, VDS = 800 V,
TC = 125 °C (1)
50
µA
IGSS
Gate-body leakage current
VDS = 0 V, VGS = ±20 V
±10
µA
VGS(th)
Gate threshold voltage
VDS = VGS, ID = 100 µA
3.75
4.5
V
RDS(on)
Static drain-source onresistance
VGS = 10 V, ID = 2.6 A
1.5
1.8
Ω
Typ.
Max.
Unit
3
1. Defined by design, not subject to production test.
Table 5. Dynamic
Symbol
gfs
(1)
Parameter
Forward transconductance
Test conditions
VDS = 15 V, ID = 2.6 A
Ciss
Input capacitance
Coss
Output capacitance
Crss
Reverse transfer capacitance
Coss eq. (2)
Equivalent output capacitance
VGS = 0 V, VDS = 0 V to 640 V
Qg
Total gate charge
VDD = 640 V, ID = 2.6 A,
Qgs
Gate-source charge
VGS = 0 to 10 V
Gate-drain charge
(see Figure 15. Test circuit for gate
charge behavior)
Qgd
Min.
VDS = 25 V, f = 1 MHz,
VGS = 0 V
5
S
1138
-
122
-
pF
-
pF
-
nC
25
-
50
40
-
7
21
1. Pulsed: pulse duration=300μs, duty cycle 1.5%.
2. Coss eq. is defined as a constant equivalent capacitance giving the same charging time as Coss when VDSincreases from 0 to
80% VDSS.
DS9606 - Rev 3
page 3/17
STB9NK80Z
Electrical characteristics
Table 6. Switching times
Symbol
td(on)
tr
td(off)
tr
tr(Voff)
tr
tc
Parameter
Test conditions
Turn-on delay time
Min.
Unit
-
ns
Max.
Unit
12
Fall time
(see Figure 14. Test circuit for resistive
load switching times and
Figure 19. Switching time waveform)
Off-voltage rise time
VDD = 640 V, ID = 5.2 A,
12
Fall time
RG = 4.7 Ω, VGS = 10 V
10
Cross-over time
(see Figure 16. Test circuit for inductive
load switching and diode recovery times)
20
Turn-off delay time
Max.
20
VDD = 400 V, ID = 2.6 A, RG = 4.7 Ω,
VGS = 10 V
Rise time
Typ.
45
-
22
Table 7. Source-drain diode
Symbol
ISD
Parameter
Test conditions
Min.
Typ.
Source-drain current
-
5.2
ISDM (1)
Source-drain current (pulsed)
-
20.8
VSD (2)
Forward on voltage
ISD = 5.2 A, VGS = 0 V
-
1.6
trr
Reverse recovery time
ISD = 5.2 A, di/dt = 100 A/µs
-
530
ns
Qrr
Reverse recovery charge
-
3.31
μC
IRRM
Reverse recovery current
VDD = 50 V, Tj = 150 °C (see
Figure 16. Test circuit for inductive load
switching and diode recovery times)
-
12.5
A
Min.
Typ.
Max.
Unit
30
-
-
V
A
V
1. Pulse width is limited by safe operating area.
2. Pulsed: pulse duration = 300 μs, duty cycle 1.5%.
Table 8. Gate-source Zener diode
Symbol
V(BR)GSO
Parameter
Test conditions
Gate-source breakdown voltage IGS = ±1 mA, ID = 0 A
The built-in back-to-back Zener diodes are specifically designed to enhance the ESD performance of the device.
The Zener voltage facilitates efficient and cost-effective device integrity protection, thus eliminating the need for
additional external componentry.
DS9606 - Rev 3
page 4/17
STB9NK80Z
Electrical characteristics (curves)
2.1
Electrical characteristics (curves)
Figure 1. Safe operating area
DS9606 - Rev 3
Figure 2. Thermal impedance
Figure 3. Output characterisics
Figure 4. Transfer characteristics
Figure 5. Transconductance
Figure 6. Static drain-source on- resistance
page 5/17
STB9NK80Z
Electrical characteristics (curves)
Figure 7. Gate charge vs gate-source voltage
Figure 8. Capacitance variations
Figure 9. Normalized gate threshold voltage vs
temperature
Figure 10. Normalized on-resistance vs temperature
Figure 11. Source-drain diode forward characteristics
Figure 12. Normalized breakdown voltage vs temperature
DS9606 - Rev 3
page 6/17
STB9NK80Z
Electrical characteristics (curves)
Figure 13. Maximum avalanche energy vs temperature
DS9606 - Rev 3
page 7/17
STB9NK80Z
Test circuits
3
Test circuits
Figure 14. Test circuit for resistive load switching times
Figure 15. Test circuit for gate charge behavior
VDD
12 V
2200
+ μF
3.3
μF
VDD
VD
VGS
1 kΩ
100 nF
RL
IG= CONST
VGS
RG
47 kΩ
+
pulse width
D.U.T.
2.7 kΩ
2200
μF
pulse width
D.U.T.
100 Ω
VG
47 kΩ
1 kΩ
AM01469v1
AM01468v1
Figure 16. Test circuit for inductive load switching and
diode recovery times
D
G
A
D.U.T.
S
25 Ω
A
L
A
B
B
3.3
µF
D
G
+
VD
100 µH
fast
diode
B
Figure 17. Unclamped inductive load test circuit
RG
1000
+ µF
2200
+ µF
VDD
3.3
µF
VDD
ID
D.U.T.
S
D.U.T.
Vi
_
pulse width
AM01471v1
AM01470v1
Figure 19. Switching time waveform
Figure 18. Unclamped inductive waveform
ton
V(BR)DSS
td(on)
VD
toff
td(off)
tr
tf
90%
90%
IDM
VDD
10%
0
ID
VDD
AM01472v1
VGS
0
VDS
10%
90%
10%
AM01473v1
DS9606 - Rev 3
page 8/17
STB9NK80Z
Package information
4
Package information
In order to meet environmental requirements, ST offers these devices in different grades of ECOPACK packages,
depending on their level of environmental compliance. ECOPACK specifications, grade definitions and product
status are available at: www.st.com. ECOPACK is an ST trademark.
DS9606 - Rev 3
page 9/17
STB9NK80Z
D²PAK (TO-263) type A package information
4.1
D²PAK (TO-263) type A package information
Figure 20. D²PAK (TO-263) type A package outline
0079457_26
DS9606 - Rev 3
page 10/17
STB9NK80Z
D²PAK (TO-263) type A package information
Table 9. D²PAK (TO-263) type A package mechanical data
Dim.
mm
Min.
Max.
A
4.40
4.60
A1
0.03
0.23
b
0.70
0.93
b2
1.14
1.70
c
0.45
0.60
c2
1.23
1.36
D
8.95
9.35
D1
7.50
7.75
8.00
D2
1.10
1.30
1.50
E
10.00
E1
8.30
8.50
8.70
E2
6.85
7.05
7.25
e
10.40
2.54
e1
4.88
5.28
H
15.00
15.85
J1
2.49
2.69
L
2.29
2.79
L1
1.27
1.40
L2
1.30
1.75
R
V2
DS9606 - Rev 3
Typ.
0.40
0°
8°
page 11/17
STB9NK80Z
D²PAK (TO-263) type A package information
Figure 21. D²PAK (TO-263) recommended footprint (dimensions are in mm)
Footprint_26
DS9606 - Rev 3
page 12/17
STB9NK80Z
D²PAK packing information
4.2
D²PAK packing information
Figure 22. D²PAK tape outline
DS9606 - Rev 3
page 13/17
STB9NK80Z
D²PAK packing information
Figure 23. D²PAK reel outline
T
40mm min.
access hole
at slot location
B
D
C
N
A
G measured
at hub
Tape slot
in core for
tape start
2.5mm min.width
Full radius
AM06038v1
Table 10. D²PAK tape and reel mechanical data
Tape
Dim.
DS9606 - Rev 3
Reel
mm
mm
Dim.
Min.
Max.
Min.
A0
10.5
10.7
A
B0
15.7
15.9
B
1.5
D
1.5
1.6
C
12.8
D1
1.59
1.61
D
20.2
E
1.65
1.85
G
24.4
F
11.4
11.6
N
100
K0
4.8
5.0
T
Max.
330
13.2
26.4
30.4
P0
3.9
4.1
P1
11.9
12.1
Base quantity
1000
P2
1.9
2.1
Bulk quantity
1000
R
50
T
0.25
0.35
W
23.7
24.3
page 14/17
STB9NK80Z
Revision history
Table 11. Document revision history
Date
Version
Changes
05-Jun-2013
1
First issue.
12-Jul-2013
2
Document status promoted from preliminary to production data.
21-Oct-2019
3
Modified Table 5. Dynamic and Section 4.1 D²PAK (TO-263) type A package
information.
Minor text changes.
DS9606 - Rev 3
page 15/17
STB9NK80Z
Contents
Contents
1
Electrical ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2
2
Electrical characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
2.1
Electrical characteristics (curves) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
3
Test circuits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8
4
Package information. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .9
4.1
D²PAK (TO-263) type A package information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
4.2
D²PAK packing information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .15
DS9606 - Rev 3
page 16/17
STB9NK80Z
IMPORTANT NOTICE – PLEASE READ CAREFULLY
STMicroelectronics NV and its subsidiaries (“ST”) reserve the right to make changes, corrections, enhancements, modifications, and improvements to ST
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Purchasers are solely responsible for the choice, selection, and use of ST products and ST assumes no liability for application assistance or the design of
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ST and the ST logo are trademarks of ST. For additional information about ST trademarks, please refer to www.st.com/trademarks. All other product or service
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Information in this document supersedes and replaces information previously supplied in any prior versions of this document.
© 2019 STMicroelectronics – All rights reserved
DS9606 - Rev 3
page 17/17