STD4LN80K5
N-channel 800 V, 2.1 Ω typ., 3 A MDmesh™ K5
Power MOSFET in a DPAK package
Datasheet - production data
Features
DPAK
Figure 1: Internal schematic diagram
Order code
VDS
RDS(on) max.
ID
STD4LN80K5
800 V
2.6 Ω
3A
Industry’s lowest RDS(on) x area
Industry’s best figure of merit (FoM)
Ultra low gate charge
100% avalanche tested
Zener-protected
Applications
Switching applications
Description
This very high voltage N-channel Power
MOSFET is designed using MDmesh™ K5
technology based on an innovative proprietary
vertical structure. The result is a dramatic
reduction in on resistance and ultra low gate
charge for application requiring superior power
density and high efficiency.
Table 1: Device summary
Order code
Marking
Package
Packing
STD4LN80K5
4LN80K5
DPAK
Tape and reel
May 2016
DocID027848 Rev 2
This is information on a product in full production.
1/15
www.st.com
Contents
STD4LN80K5
Contents
1
Electrical ratings ............................................................................. 3
2
Electrical characteristics ................................................................ 4
2.1
Electrical characteristics (curves) ...................................................... 6
3
Test circuits ..................................................................................... 8
4
Package information ....................................................................... 9
5
2/15
4.1
DPAK (TO-252) type A package information..................................... 9
4.2
DPAK (TO-252) packing information ............................................... 12
Revision history ............................................................................ 14
DocID027848 Rev 2
STD4LN80K5
1
Electrical ratings
Electrical ratings
Table 2: Absolute maximum ratings
Symbol
VGS
Parameter
Gate-source voltage
Value
Unit
± 30
V
ID
Drain current (continuous) at TC = 25 °C
3
A
ID
Drain current (continuous) at TC = 100 °C
1.9
A
ID(1)
Drain current (pulsed)
12
A
PTOT
Total dissipation at TC = 25 °C
60
W
dv/dt(2)
Peak diode recovery voltage slope
15
V/ns
dv/dt(3)
MOSFET dv/dt ruggedness
50
V/ns
Tstg
Storage temperature range
- 55 to 150
°C
Value
Unit
Thermal resistance junction-case
2.08
°C/W
Thermal resistance junction-pcb
50
°C/W
Value
Unit
Tj
Operating junction temperature range
Notes:
(1)Pulse
(2)I
SD
(3)V
width limited by safe operating area.
≤ 3 A, di/dt ≤ 100 A/µs; VDS peak < V(BR)DSS, VDD = 400 V.
DS
≤ 640 V
Table 3: Thermal data
Symbol
Rthj-case
Rthj-pcb
(1)
Parameter
Notes:
(1)When
mounted on FR-4 board of 1 inch², 2 oz Cu
Table 4: Avalanche characteristics
Symbol
Parameter
IAR
Avalanche current, repetetive or not repetetive
(pulse width limited by Tjmax)
0.8
A
EAS
(Single pulse avalanche energy
(starting Tj = 25 °C, ID = IAR; VDD = 50 V)
160
mJ
DocID027848 Rev 2
3/15
Electrical characteristics
2
STD4LN80K5
Electrical characteristics
TC = 25 °C unless otherwise specified
Table 5: On/off states
Symbol
Parameter
Test conditions
V(BR)DSS
Drain-source breakdown
voltage
IDSS
Zero gate voltage Drain
current
IGSS
VGS = 0 V, ID = 1 mA
Min.
Typ.
Max.
Unit
800
V
VGS = 0 V, VDS = 800 V
1
µA
VGS = 0 V, VDS = 800 V,
TC = 125 °C(1)
50
µA
Gate-body leakage current
VDS = 0 V, VGS = ± 25 V
± 10
µA
VGS(th)
Gate threshold voltage
VDS = VGS, ID = 100 µA
4
5
V
RDS(on)
Static drain-source
on-resistance
VGS = 10 V, ID = 1 A
2.1
2.6
Ω
Min.
Typ.
Max.
Unit
-
122
-
pF
-
11
-
pF
-
0.3
-
pF
-
23
-
pF
-
9
-
pF
18
-
Ω
-
3.7
-
nC
-
1
-
nC
-
2.2
-
nC
3
Notes:
(1)
Defined by design, not subject to production test.
Table 6: Dynamic
Symbol
Parameter
Ciss
Input capacitance
Coss
Output capacitance
Crss
Reverse transfer
capacitance
Test conditions
VDS= 100 V, f = 1 MHz,
VGS = 0 V
Co(tr)(1)
Equivalent capacitance
time related
Co(er)(2)
Equivalent capacitance
energy related
RG
Intrinsic gate resistance
f = 1 MHz, ID = 0 A
Qg
Total gate charge
Qgs
Gate-source charge
Qgd
Gate-drain charge
VDD = 640 V, ID = 2.5 A,
VGS = 10 V (see Figure 15:
"Test circuit for gate charge
behavior")
VDS = 0 to 640 V,
VGS = 0 V
-
Notes:
(1)
Time related is defined as a constant equivalent capacitance giving the same charging time as Coss when VDS
increases from 0 to 80% VDSS.
(2)
Energy related is defined as a constant equivalent capacitance giving the same stored energy as C oss when
VDS increases from 0 to 80% VDSS.
4/15
DocID027848 Rev 2
STD4LN80K5
Electrical characteristics
Table 7: Switching times
Symbol
td(on)
tr
td(off)
tf
Parameter
Turn-on delay time
Rise time
Turn-off-delay time
Fall time
Test conditions
Min.
Typ.
Max.
Unit
VDD = 400 V, ID = 1.25 A
RG = 4.7 Ω, VGS = 10 V (see
Figure 14: "Test circuit for
resistive load switching times"
and Figure 19: "Switching time
waveform")
-
7
-
ns
-
9
-
ns
-
31
-
ns
-
25
-
ns
Min.
Typ.
Max.
Unit
Table 8: Source drain diode
Symbol
Parameter
Test conditions
ISD
Source-drain current
-
3
A
ISDM(1)
Source-drain current
(pulsed)
-
12
A
VSD (2)
Forward on voltage
ISD= 2.5 A, VGS = 0 V,
-
1.6
V
trr
Reverse recovery time
-
230
ns
Qrr
Reverse recovery charge
-
1.04
µC
IRRM
Reverse recovery current
ISD = 2.5 A, di/dt = 100 A/µs,
VDD = 60 V (see Figure 16:
"Test circuit for inductive load
switching and diode recovery
times")
-
9
A
ISD = 2.5 A, di/dt = 100 A/µs,
VDD = 60 V, Tj = 150 °C (see
Figure 16: "Test circuit for
inductive load switching and
diode recovery times")
-
368
ns
-
1.53
µC
-
8
A
trr
Reverse recovery time
Qrr
Reverse recovery charge
IRRM
Reverse recovery current
Notes:
(1)
Pulse width is limited by safe operating area
(2)Pulsed:
pulse duration = 300 µs, duty cycle 1.5%
Table 9: Gate-source Zener diode
Symbol
V(BR)GSO
Parameter
Gate-source breakdown voltage
Test conditions
Min.
IGS = ± 1 mA, ID = 0 A
30
Typ.
Max.
-
Unit
V
The built-in back-to-back Zener diodes are specifically designed to enhance the ESD
performance of the device. The Zener voltage facilitates efficient and cost-effective device
integrity protection, thus eliminating the need for additional external componentry.
DocID027848 Rev 2
5/15
Electrical characteristics
2.1
STD4LN80K5
Electrical characteristics (curves)
Figure 3: Thermal impedance
Figure 2: Safe operating area
CG34360
K
0
10
c
-1
10
-2
10 -5
10
6/15
-4
10
-3
10
-2
10
-1
10
tp (s)
Figure 4: Output characteristics
Figure 5: Transfer characteristics
Figure 6: Gate charge vs gate-source voltage
Figure 7: Static drain-source on-resistance
DocID027848 Rev 2
STD4LN80K5
Electrical characteristics
Figure 8: Capacitance variations
Figure 9: Normalized gate threshold voltage
vs temperature
Figure 10: Normalized on-resistance vs
temperature
Figure 11: Normalized V(BR)DSS vs temperature
Figure 12: Maximum avalanche energy vs
starting TJ
Figure 13: Source-drain diode forward
characteristics
DocID027848 Rev 2
7/15
Test circuits
3
STD4LN80K5
Test circuits
Figure 14: Test circuit for resistive load
switching times
Figure 15: Test circuit for gate charge
behavior
VDD
RL
IG= CONST
VGS
+
pulse width
2200
μF
100 Ω
D.U.T.
2.7 kΩ
VG
47 kΩ
1 kΩ
AM01469v10
Figure 16: Test circuit for inductive load
switching and diode recovery times
Figure 17: Unclamped inductive load test
circuit
Figure 18: Unclamped inductive waveform
8/15
DocID027848 Rev 2
Figure 19: Switching time waveform
STD4LN80K5
4
Package information
Package information
In order to meet environmental requirements, ST offers these devices in different grades of
ECOPACK® packages, depending on their level of environmental compliance. ECOPACK ®
specifications, grade definitions and product status are available at: www.st.com.
ECOPACK® is an ST trademark.
4.1
DPAK (TO-252) type A package information
Figure 20: DPAK (TO-252) type A package outline
0068772_A_21
DocID027848 Rev 2
9/15
Package information
STD4LN80K5
Table 10: DPAK (TO-252) type A mechanical data
mm
Dim.
Min.
Max.
A
2.20
2.40
A1
0.90
1.10
A2
0.03
0.23
b
0.64
0.90
b4
5.20
5.40
c
0.45
0.60
c2
0.48
0.60
D
6.00
6.20
D1
4.95
E
6.40
E1
4.60
4.70
4.80
e
2.16
2.28
2.40
e1
4.40
4.60
H
9.35
10.10
L
1.00
1.50
(L1)
2.60
2.80
3.00
L2
0.65
0.80
0.95
L4
0.60
R
V2
10/15
Typ.
5.10
5.25
6.60
1.00
0.20
0°
DocID027848 Rev 2
8°
STD4LN80K5
Package information
Figure 21: DPAK (TO-252) recommended footprint (dimensions are in mm)
DocID027848 Rev 2
11/15
Package information
4.2
STD4LN80K5
DPAK (TO-252) packing information
Figure 22: DPAK (TO-252) tape outline
12/15
DocID027848 Rev 2
STD4LN80K5
Package information
Figure 23: DPAK (TO-252) reel outline
Table 11: DPAK (TO-252) tape and reel mechanical data
Tape
Reel
mm
mm
Dim.
Dim.
Min.
Max.
A0
6.8
7
A
B0
10.4
10.6
B
1.5
12.1
C
12.8
B1
D
1.5
D1
1.5
E
1.65
F
1.6
Min.
Max.
330
13.2
D
20.2
G
16.4
1.85
N
50
7.4
7.6
T
K0
2.55
2.75
P0
3.9
4.1
Base qty.
2500
P1
7.9
8.1
Bulk qty.
2500
P2
1.9
2.1
R
40
T
0.25
0.35
W
15.7
16.3
DocID027848 Rev 2
18.4
22.4
13/15
Revision history
5
STD4LN80K5
Revision history
Table 12: Document revision history
Date
Revision
22-May-2015
1
First release.
2
Document status promoted from preliminary data to production
data.
Updated Figure 1: "Internal schematic diagram".
Updated Section 1: "Electrical ratings", Section 2: "Electrical
characteristics".
Added Section 2.1: "Electrical characteristics (curves)".
Updated Section 3: "Test circuits".
Minor text changes.
18-May-2016
14/15
Changes
DocID027848 Rev 2
STD4LN80K5
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© 2016 STMicroelectronics – All rights reserved
DocID027848 Rev 2
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