STE145N65M5
N-channel 650 V, 0.012 Ω typ., 143 A MDmesh™ M5
Power MOSFET in an ISOTOP package
Datasheet - production data
Features
Order code
VDS @ TJmax
RDS(on) max.
ID
STE145N65M5
710 V
0.015 Ω
143 A
Extremely low RDS(on)
Low gate charge and input capacitance
Excellent switching performance
100% avalanche tested
Applications
Figure 1: Internal schematic diagram
Switching applications
Description
This device is an N-channel Power MOSFET
based on the MDmesh™ M5 innovative vertical
process technology combined with the wellknown PowerMESH™ horizontal layout. The
resulting product offers extremely low onresistance, making it particularly suitable for
applications requiring high power and superior
efficiency.
Table 1: Device summary
Order code
Marking
Package
Packaging
STE145N65M5
145N65M5
ISOTOP
Tube
November 2015
DocID025538 Rev 2
This is information on a product in full production.
1/13
www.st.com
Contents
STE145N65M5
Contents
1
Electrical ratings ............................................................................. 3
2
Electrical characteristics ................................................................ 4
2.1
Electrical characteristics (curves) ...................................................... 6
3
Test circuits ..................................................................................... 8
4
Package information ....................................................................... 9
4.1
5
2/13
ISOTOP package information ......................................................... 10
Revision history ............................................................................ 12
DocID025538 Rev 2
STE145N65M5
1
Electrical ratings
Electrical ratings
Table 2: Absolute maximum ratings
Symbol
VGS
Parameter
Value
Unit
Gate-source voltage
± 25
V
ID
Drain current (continuous) at TC = 25 °C
143
A
ID
Drain current (continuous) at TC = 100 °C
90
A
(1)
IDM
Drain current (pulsed)
572
A
PTOT
Total dissipation at TC = 25 °C
679
W
IAR
Avalanche current, repetitive or not repetitive (pulse width
limited by Tj max)
12
A
EAS
Single pulse avalanche energy (starting Tj = 25 °C, ID = IAR,
VDD = 50 V)
2420
mJ
Peak diode recovery voltage slope
15
V/ns
VISO
Isolation withstand voltage applied between each pin and
heatsink plate (AC voltage, t = 60 s)
2.5
kV
Tstg
Storage temperature
dv/dt
(2)
Tj
- 55 to 150
Max. operating junction temperature
150
°C
Notes:
(1)
(2)
Pulse width limited by safe operating area.
ISD ≤ 143 A, di/dt ≤ 400 A/µs; VDS(peak) < V(BR)DSS, VDD = 400 V.
Table 3: Thermal data
Symbol
Parameter
Rthj-case
Thermal resistance junction-case max
Rthj-amb
Thermal resistance junction-ambient max
DocID025538 Rev 2
Value
Unit
0.184
°C/W
30
°C/W
3/13
Electrical characteristics
2
STE145N65M5
Electrical characteristics
TC = 25 °C unless otherwise specified
Table 4: On/off states
Symbol
V(BR)DSS
Parameter
Test conditions
Drain-source breakdown voltage
VGS = 0 V, ID = 1 mA
Min.
Typ.
Max.
650
Unit
V
VGS = 0 V,
VDS = 650 V
10
µA
VGS = 0 V, VDS =
650 V, TC = 125 °C
100
µA
Gate-body leakage current
VDS = 0 V,
VGS = ±25 V
±100
nA
VGS(th)
Gate threshold voltage
VDS = VGS, ID = 250 µA
4
5
V
RDS(on)
Static drain-source on-resistance
VGS = 10 V, ID = 69 A
0.012
0.015
Ω
Min.
Typ.
Max.
Unit
-
18500
-
pF
-
413
-
pF
-
11
-
pF
-
415
-
pF
-
1950
-
pF
IDSS
IGSS
Zero gate voltage drain current
3
Table 5: Dynamic
Symbol
Ciss
Parameter
Test conditions
Input capacitance
VDS= 100 V, f = 1 MHz,
VGS = 0 V
Coss
Output capacitance
Crss
Reverse transfer capacitance
(1)
Co(er)
(2)
Co(tr)
Equivalent output capacitance
energy related
Equivalent output capacitance
time related
VGS = 0, VDS = 0 to 520 V
RG
Intrinsic gate resistance
f = 1 MHz, open drain
-
0.7
-
Ω
Qg
Total gate charge
-
414
-
nC
Qgs
Gate-source charge
-
114
-
nC
Qgd
Gate-drain charge
VDD = 520 V, ID = 69 A,
VGS = 10 V (see Figure
15: "Test circuit for gate
charge behavior")
-
164
-
nC
Notes:
(1)
Co(er) is defined as a constant equivalent capacitance giving the same stored energy as Coss when VDS
increases from 0 to 80% VDSS
(2)
Co(tr) is defined as a constant equivalent capacitance giving the same charging time as C oss when VDS increases
from 0 to 80% VDSS
4/13
DocID025538 Rev 2
STE145N65M5
Electrical characteristics
Table 6: Switching times
Symbol
Parameter
td(V)
Voltage delay time
tr(V)
Voltage rise time
tf(i)
Current fall time
tC(off)
Crossing time
Test conditions
Min.
Typ.
Max.
Unit
VDD = 400 V, ID = 85 A
RG = 4.7 Ω, VGS = 10 V
(see Figure 16: "Test circuit for
inductive load switching and
diode recovery times" and
Figure 19: "Switching time
waveform")
-
255
-
ns
-
11
-
ns
-
82
-
ns
-
88
-
ns
Min.
Typ.
Max.
Unit
Table 7: Source drain diode
Symbol
ISD
Parameter
Test conditions
Source-drain current
-
143
A
(1)
Source-drain current
(pulsed)
-
572
A
(2)
Forward on voltage
VGS = 0 V, ISD = 143 A
-
1.5
V
trr
Reverse recovery time
-
568
ns
Qrr
Reverse recovery charge
-
14.5
µC
IRRM
Reverse recovery current
ISD = 143 A, di/dt = 100 A/µs,
VDD = 100 V (see Figure 16:
"Test circuit for inductive load
switching and diode recovery
times")
-
51
A
ISD = 143 A, di/dt = 100 A/µs,
VDD = 100 V, Tj = 150 °C
(see Figure 16: "Test circuit for
inductive load switching and
diode recovery times")
-
728
ns
-
24.5
µC
-
67
A
ISDM,
VSD
trr
Reverse recovery time
Qrr
Reverse recovery charge
IRRM
Reverse recovery current
Notes:
(1)
(2)
Pulse width is limited by safe operating area
Pulsed: pulse duration = 300 µs, duty cycle 1.5%
DocID025538 Rev 2
5/13
Electrical characteristics
2.2
STE145N65M5
Electrical characteristics (curves)
Figure 3: Thermal impedance
Figure 2: Safe operating area
Figure 5: Transfer characteristics
Figure 4: Output characteristics
AM17901v1
ID (A)
VGS=10V
9V
300
8V
250
200
150
7V
100
50
6V
0
0
5
10
15
20
25
VDS(V)
Figure 6: Gate charge vs gate-source voltage
6/13
Figure 7: Static drain-source on-resistance
DocID025538 Rev 2
STE145N65M5
Electrical characteristics
Figure 9: Normalized gate threshold voltage
vs temperature
Figure 8: Capacitance variations
C
(pF)
100000
Ciss
10000
1000
Coss
f=1 MHz
100
10
Crss
1
0.1
1
10
100
VDS(V)
Figure 10: Normalized on-resistance vs
temperature
Figure 11: Normalized V(BR)DSS vs temperature
Figure 12: Output capacitance stored energy
Figure 13: Switching losses vs gate
resistance
The previous figure Eon includes reverse recovery of a SiC diode.
DocID025538 Rev 2
7/13
Test circuits
3
STE145N65M5
Test circuits
Figure 14: Test circuit for resistive load
switching times
Figure 15: Test circuit for gate charge
behavior
Figure 16: Test circuit for inductive load
switching and diode recovery times
Figure 17: Unclamped inductive load test
circuit
Figure 18: Unclamped inductive waveform
Figure 19: Switching time waveform
AM05540v2_for_M5
8/13
DocID025538 Rev 2
STE145N65M5
4
Package information
Package information
In order to meet environmental requirements, ST offers these devices in different grades of
®
®
ECOPACK packages, depending on their level of environmental compliance. ECOPACK
specifications, grade definitions and product status are available at: www.st.com.
®
ECOPACK is an ST trademark.
DocID025538 Rev 2
9/13
Package information
4.1
STE145N65M5
ISOTOP package information
Figure 20: ISOTOP outline
10/13
DocID025538 Rev 2
STE145N65M5
Package information
Table 8: ISOTOP mechanical data
mm
Dim.
Min.
Typ.
Max.
A
11.80
12.20
A1
8.90
9.10
B
7.80
8.20
C
0.75
0.85
C2
1.95
2.05
D
37.80
38.20
D1
31.50
31.70
E
25.15
25.50
E1
23.85
24.15
E2
24.80
G
14.90
15.10
G1
12.60
12.80
G2
3.50
4.30
F
4.10
4.30
F1
4.60
5
ØP
4
4.30
P1
4
4.40
S
30.10
30.30
DocID025538 Rev 2
11/13
Revision history
5
STE145N65M5
Revision history
Table 9: Document revision history
Date
Revision
18-Nov-2013
1
First release.
2
Updated title, features and description on cover page.
Document status promoted from preliminary to production data.
Modified: Table 2: "Absolute maximum ratings" and Figure 12: "Output
capacitance stored energy"
Minor text changes.
12-Nov-2015
12/13
Changes
DocID025538 Rev 2
STE145N65M5
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DocID025538 Rev 2
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