STF24N60DM2
N-channel 600 V, 0.175 Ω typ., 18 A MDmesh™ DM2
Power MOSFET in a TO-220FP package
Datasheet - production data
Features
Order code
VDS @ TJmax
RDS(on) max.
ID
STF24N60DM2
650 V
0.200 Ω
18 A
TO-220FP
Figure 1: Internal schematic diagram
Fast-recovery body diode
Extremely low gate charge and input
capacitance
Low on-resistance
100% avalanche tested
Extremely high dv/dt ruggedness
Zener-protected
Applications
Switching applications
Description
This high voltage N-channel Power MOSFET is
part of the MDmesh™ DM2 fast recovery diode
series. It offers very low recovery charge (Qrr)
and time (trr) combined with low RDS(on), rendering
it suitable for the most demanding high efficiency
converters and ideal for bridge topologies and
ZVS phase-shift converters.
Table 1: Device summary
Order code
Marking
Package
Packing
STF24N60DM2
24N60DM2
TO-220FP
Tube
September 2016
DocID025498 Rev 5
This is information on a product in full production.
1/13
www.st.com
Contents
STF24N60DM2
Contents
1
Electrical ratings ............................................................................. 3
2
Electrical characteristics ................................................................ 4
2.1
Electrical characteristics (curves) ...................................................... 6
3
Test circuits ..................................................................................... 8
4
Package information ....................................................................... 9
4.1
5
2/13
TO-220FP package information ...................................................... 10
Revision history ............................................................................ 12
DocID025498 Rev 5
STF24N60DM2
1
Electrical ratings
Electrical ratings
Table 2: Absolute maximum ratings
Symbol
VGS
ID(1)
IDM(2)(1)
PTOT
Parameter
Gate-source voltage
Value
Unit
± 25
V
Drain current (continuous) at TC = 25 °C
18
Drain current (continuous) at TC= 100 °C
11
Drain current (pulsed)
72
A
W
Total dissipation at TC = 25 °C
30
dv/dt(3)
Peak diode recovery voltage slope
40
dv/dt(4)
MOSFET dv/dt ruggedness
50
VISO
Insulation withstand voltage (RMS) from all three leads to external
heat sink (t = 1 s; TC = 25 °C)
Tstg
Storage temperature range
Tj
Max. operating junction temperature range
A
V/ns
2500
V
–55 to 150
°C
Notes:
(1)
Limited by package.
(2)
Pulse width is limited by safe operating area.
(3)
ISD ≤ 18 A, di/dt ≤ 400 A/µS, VDS(peak) < V(BR)DSS, VDD = 400 V.
(4)
VDS ≤ 480 V.
Table 3: Thermal data
Symbol
Parameter
Value
Rthj-case
Thermal resistance junction-case max.
4.2
Rthj-amb
Thermal resistance junction-ambient max.
62.5
Unit
°C/W
Table 4: Avalanche characteristics
Symbol
Parameter
Value
Unit
IAR
Avalanche current, repetitive or not repetitive
(pulse width limited by TJmax)
3.5
A
EAS
Single pulse avalanche energy
(starting TJ =25 °C, ID = IAR; VDD = 50 V)
180
mJ
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Electrical characteristics
2
STF24N60DM2
Electrical characteristics
(Tcase= 25 °C unless otherwise specified)
Table 5: On /off states
Symbol
V(BR)DSS
Parameter
Test conditions
Drain-source breakdown
voltage
VGS = 0 V, ID = 1 mA
Min.
Typ.
Max.
600
Unit
V
VGS = 0 V, VDS = 600 V
1.5
µA
VGS = 0 V, VDS = 600 V,
TC = 125 °C (1)
100
µA
Gate-body leakage
current
VDS = 0 V, VGS = ±25 V
±10
µA
VGS(th)
Gate threshold voltage
VDS = VGS, ID = 250 µA
4
5
V
RDS(on)
Static drain-source onresistance
VGS = 10 V, ID = 9 A
0.175
0.200
Ω
Min.
Typ.
Max.
Unit
-
1055
-
pF
-
56
-
pF
-
2.4
-
pF
IDSS
Zero gate voltage drain
current
IGSS
3
Notes:
(1)Defined
by design, not subject to production test.
Table 6: Dynamic
Symbol
Parameter
Test conditions
Ciss
Input capacitance
Coss
Output capacitance
Crss
Reverse transfer
capacitance
Coss eq.(1)
Equivalent output
capacitance
VDS = 0 to 480 V, VGS = 0 V
-
259
-
pF
RG
Intrinsic gate resistance
f = 1 MHz, ID = 0 A
-
7
-
Ω
Qg
Total gate charge
-
29
-
nC
Qgs
Gate-source charge
-
6
-
nC
Qgd
Gate-drain charge
VDD = 480 V, ID = 18 A,
VGS = 10 V
(see Figure 15: "Test circuit for
gate charge behavior")
-
12
-
nC
VDS = 100 V, f = 1 MHz,
VGS = 0 V
Notes:
(1)C
oss eq.
is defined as a constant equivalent capacitance giving the same charging time as C OSS when VDS
increases from 0 to 80% VDSS.
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STF24N60DM2
Electrical characteristics
Table 7: Switching times
Symbol
td(on)
tr
td(off)
tf
Parameter
Test conditions
Turn-on delay time
VDD = 300 V, ID = 9 A
RG = 4.7 Ω, VGS = 10 V
(see Figure 14: "Test circuit for
resistive load switching times"
and Figure 19: "Switching time
waveform")
Rise time
Turn-off-delay time
Fall time
Min.
Typ.
Max.
Unit
-
15
-
ns
-
8.7
-
ns
-
60
-
ns
-
15
-
ns
Min.
Typ.
Max.
Unit
Table 8: Source-drain diode
Symbol
Parameter
Test conditions
ISD
Source-drain current
-
18
A
ISDM(1)
Source-drain current
(pulsed)
-
72
A
VSD (2)
Forward on voltage
VGS = 0 V, ISD = 18 A
-
1.6
V
trr
Reverse recovery time
-
155
ns
Qrr
Reverse recovery
charge
-
956
nC
IRRM
Reverse recovery
current
ISD = 18 A, di/dt = 100 A/µs,
VDD = 60 V (see Figure 16: "Test
circuit for inductive load
switching and diode recovery
times")
-
12.5
A
ISD = 18 A, di/dt = 100 A/µs,
VDD = 60 V, Tj = 150 °C (see
Figure 16: "Test circuit for
inductive load switching and
diode recovery times")
-
200
ns
-
1450
nC
-
13
trr
Reverse recovery time
Qrr
Reverse recovery
charge
IRRM
Reverse recovery
current
A
Notes:
(1)
Pulse width is limited by safe operating area.
(2)
Pulse test: pulse duration = 300 µs, duty cycle 1.5%.
DocID025498 Rev 5
5/13
Electrical characteristics
2.1
STF24N60DM2
Electrical characteristics (curves)
Figure 2: Safe operating area
Figure 3: Thermal impedance
Figure 4: Output characteristics
Figure 5: Transfer characteristics
Figure 6: Gate charge vs gate-source voltage
Figure 7: Static drain-source on-resistance
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STF24N60DM2
Electrical characteristics
Figure 8: Capacitance variations
Figure 9: Output capacitance stored energy
Figure 10: Normalized gate threshold voltage vs
temperature
Figure 11: Normalized on-resistance vs temperature
Figure 12: Source-drain diode forward
characteristics
Figure 13: Normalized V(BR)DSS vs temperature
DocID025498 Rev 5
7/13
Test circuits
3
8/13
STF24N60DM2
Test circuits
Figure 14: Test circuit for resistive load
switching times
Figure 15: Test circuit for gate charge
behavior
Figure 16: Test circuit for inductive load
switching and diode recovery times
Figure 17: Unclamped inductive load test
circuit
Figure 18: Unclamped inductive waveform
Figure 19: Switching time waveform
DocID025498 Rev 5
STF24N60DM2
4
Package information
Package information
In order to meet environmental requirements, ST offers these devices in different grades of
ECOPACK® packages, depending on their level of environmental compliance. ECOPACK ®
specifications, grade definitions and product status are available at: www.st.com.
ECOPACK® is an ST trademark.
DocID025498 Rev 5
9/13
Package information
4.1
STF24N60DM2
TO-220FP package information
Figure 20: TO-220FP package outline
10/13
DocID025498 Rev 5
STF24N60DM2
Package information
Table 9: TO-220FP package mechanical data
mm
Dim.
Min.
Typ.
Max.
A
4.4
4.6
B
2.5
2.7
D
2.5
2.75
E
0.45
0.7
F
0.75
1
F1
1.15
1.70
F2
1.15
1.70
G
4.95
5.2
G1
2.4
2.7
H
10
10.4
L2
16
L3
28.6
30.6
L4
9.8
10.6
L5
2.9
3.6
L6
15.9
16.4
L7
9
9.3
Dia
3
3.2
DocID025498 Rev 5
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Revision history
5
STF24N60DM2
Revision history
Table 10: Document revision history
Date
Revision
12-Nov-2013
1
First release.
2
– Modified: dv/dt value in Table 2
– Modified: IAR value in Table 4
– Modified: IDSS and VGS(th) in Table 5
– Minor text changes
03-Mar-2014
3
– Modified: Figure 1
– Modified: PTOT value and note 1 in Table 2
– Modified: Rthj-case value in Table 3
– Modified: IAR value in Table 4
– Minor text changes
05-Mar-2015
4
– Document status promoted from preliminary to production data.
– Updated title, features and description in cover page.
20-Sep-2016
5
Updated Figure 2: "Safe operating area".
Minor text changes
21-Jan-2014
12/13
Changes
DocID025498 Rev 5
STF24N60DM2
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