STF27N60M2-EP
N-channel 600 V, 0.150 Ω typ., 20 A MDmesh™ M2 EP
Power MOSFET in TO-220FP package
Datasheet - production data
Features
Order code
V
STF27N60M2-EP
TO-220FP
DS
600 V
RDS(on) max
ID
0.163 Ω
20 A
Extremely low gate charge
Excellent output capacitance (COSS) profile
Very low turn-off switching losses
100% avalanche tested
Zener-protected
Applications
Figure 1: Internal schematic diagram
D(2)
Switching applications
Tailored for very high frequency converters
(f > 150 kHz)
Description
These devices are N-channel Power MOSFETs
developed using MDmesh™ M2 EP enhanced
performance technology. Thanks to their strip
layout and an improved vertical structure, these
devices exhibit low on-resistance, optimized
switching characteristics with very low turn-off
switching losses, rendering them suitable for the
most demanding very high frequency converters.
G(1)
S(3)
AM15572v1_no_tab
Table 1: Device summary
Order code
Marking
Package
Packing
STF27N60M2-EP
27N60M2EP
TO-220FP
Tube
January 2016
DocID028863 Rev 1
This is information on a product in full production.
1/13
www.st.com
Contents
STF27N60M2-EP
Contents
1
Electrical ratings ............................................................................... 3
2
Electrical characteristics ................................................................. 4
2.1
Electrical characteristics (curves) ...................................................... 6
3
Test circuits ...................................................................................... 8
4
Package information ........................................................................ 9
4.1
5
2/13
TO-220FP package information ...................................................... 10
Revision history .............................................................................. 12
DocID028863 Rev 1
STF27N60M2-EP
1
Electrical ratings
Electrical ratings
Table 2: Absolute maximum ratings
Symbol
Parameter
Value
Unit
VGS
Gate-source voltage
± 25
V
ID(1)
Drain current (continuous) at TC = 25 °C
20
A
ID(1)
Drain current (continuous) at TC = 100 °C
13
A
IDM(2)
Drain current (pulsed)
80
A
PTOT
Total dissipation at TC = 25 °C
30
W
dv/dt
(3)
Peak diode recovery voltage slope
15
V/ns
dv/dt
(4)
MOSFET dv/dt ruggedness
50
V/ns
VISO
Insulation withstand voltage (RMS) from all three leads to external
heat sink (t = 1 s; Tc = 25 °C)
2.5
kV
Tstg
Storage temperature
- 55 to 150
°C
Tj
Operating junction temperature
Notes:
(1)
Limited by maximum junction temperature
(2)
Pulse width limited by safe operating area.
(3)
ISD ≤ 20 A, di/dt ≤ 400 A/µs; VDS(peak) < V(BR)DSS, VDD = 400 V.
(4)
VDS ≤ 480 V
Table 3: Thermal data
Symbol
Parameter
Value
Unit
Rthj-case
Thermal resistance junction-case max
4.2
°C/W
Rthj-amb
Thermal resistance junction-ambient max
62.5
°C/W
Table 4: Avalanche characteristics
Symbol
Parameter
Value
Unit
IAR
Avalanche current, repetetive or not repetetive
(pulse width limited by Tjmax)
3.6
A
EAS
Single pulse avalanche energy (starting Tj = 25 °C, ID = IAR; VDD = 50 V)
260
mJ
DocID028863 Rev 1
3/13
Electrical characteristics
2
STF27N60M2-EP
Electrical characteristics
TC = 25 °C unless otherwise specified
Table 5: On/off states
Symbol
V(BR)DSS
Parameter
Test conditions
Drain-source breakdown
voltage
VGS = 0 V, ID = 1 mA
Min.
Typ.
Max.
600
Unit
V
VGS = 0 V, VDS = 600 V
1
µA
VGS = 0 V, VDS = 600 V,
TC = 125 °C
100
µA
Gate-body leakage current
VDS = 0 V, VGS = ±25 V
±10
µA
VGS(th)
Gate threshold voltage
VDS = VGS, ID = 250 µA
3
4
V
RDS(on)
Static drain-source onresistance
VGS = 10 V, ID = 10 A
0.150
0.163
Ω
Min.
Typ.
Max.
Unit
-
1320
-
pF
-
70
-
pF
-
1
-
pF
IDSS
Zero gate voltage drain
current
IGSS
2
Table 6: Dynamic
Symbol
Parameter
Test conditions
Ciss
Input capacitance
Coss
Output
capacitance
Crss
Reverse transfer
capacitance
Coss eq.(1)
Equivalent output
capacitance
VDS = 0 to 480 V, VGS = 0 V
-
146
-
pF
RG
Intrinsic gate
resistance
f = 1 MHz, ID = 0 A
-
4
-
Ω
Qg
Total gate charge
-
33
-
nC
-
5.2
-
nC
-
16
-
nC
VDS= 100 V, f = 1 MHz, VGS = 0 V
VDD = 480 V, ID = 20 A, VGS = 10 V
(see Figure 15: "Test circuit for gate
charge behavior")
Qgs
Gate-source
charge
Qgd
Gate-drain charge
Notes:
(1)
Coss eq. is defined as a constant equivalent capacitance giving the same charging time as Coss when VDS
increases from 0 to 80% VDSS
Table 7: Switching times
Symbol
td(on)
Turn-on
delay time
tr
Rise time
td(off)
Turn-offdelay time
tf
4/13
Parameter
Test conditions
VDD = 300 V, ID = 10 A, RG = 4.7 Ω,
VGS = 10 V (see Figure 14: "Test circuit for
resistive load switching times" and Figure 19:
"Switching time waveform" )
Fall time
DocID028863 Rev 1
Min.
Typ.
Max.
Unit
-
13.4
-
ns
-
8.1
-
ns
-
55.6
-
ns
-
6.3
-
ns
STF27N60M2-EP
Electrical characteristics
Table 8: Source-drain diode
Symbol
Parameter
Test conditions
Min.
Typ.
Max.
Unit
Source-drain
current
-
20
A
ISDM(1)
Source-drain
current (pulsed)
-
80
A
VSD (2)
Forward on
voltage
-
1.6
V
ISD
trr
Reverse
recovery time
Qrr
Reverse
recovery charge
IRRM
VGS = 0 V, ISD = 20 A
-
271
ns
-
3.44
µC
Reverse
recovery current
-
25.4
A
trr
Reverse
recovery time
-
352
ns
Qrr
Reverse
recovery charge
-
4.82
µC
IRRM
Reverse
recovery current
-
27.4
A
ISD = 20 A, di/dt = 100 A/µs, VDD = 60 V
(see Figure 19: "Switching time
waveform")
ISD = 20 A, di/dt = 100 A/µs, VDD = 60 V,
Tj = 150 °C (see Figure 19: "Switching
time waveform")
Notes:
(1)
Pulse width is limited by safe operating area
(2)
Pulsed: pulse duration = 300 µs, duty cycle 1.5%
DocID028863 Rev 1
5/13
Electrical characteristics
2.1
STF27N60M2-EP
Electrical characteristics (curves)
Figure 2: Safe operating area
Figure 3: Thermal impedance
GIPG140120161308 RV
ID
(A)
Operation in this area is
Limited by RDS(on)
10
tp = 10 µs
tp = 100 µs
1
tp = 1 ms
Single pulse,Tc =25°C
Tj≤150°C,VGS=10 V
0.1
0.1
6/13
1
10
tp = 10 ms
100
VDS[V]
Figure 4: Output characteristics
Figure 5: Transfer characteristics
Figure 6: Gate charge vs gate-source voltage
Figure 7: Static drain-source on-resistance
DocID028863 Rev 1
STF27N60M2-EP
Electrical characteristics
Figure 8: Capacitance variations
Figure 9: Output capacitance stored energy
Figure 10: Normalized V(BR)DSS vs
temperature
Figure 11: Normalized gate threshold voltage
vs temperature
Figure 12: Normalized on-resistance vs
temperature
Figure 13: Source-drain diode forward
characteristics
DocID028863 Rev 1
7/13
Test circuits
3
STF27N60M2-EP
Test circuits
Figure 14: Test circuit for resistive load
switching times
Figure 15: Test circuit for gate charge
behavior
Figure 16: Test circuit for inductive load
switching and diode recovery times
Figure 17: Unclamped inductive load test
circuit
Figure 19: Switching time waveform
Figure 18: Unclamped inductive waveform
8/13
DocID028863 Rev 1
STF27N60M2-EP
4
Package information
Package information
In order to meet environmental requirements, ST offers these devices in different grades of
ECOPACK® packages, depending on their level of environmental compliance. ECOPACK®
specifications, grade definitions and product status are available at: www.st.com.
ECOPACK® is an ST trademark.
DocID028863 Rev 1
9/13
Package information
4.1
STF27N60M2-EP
TO-220FP package information
Figure 20: TO-220FP package outline
10/13
DocID028863 Rev 1
STF27N60M2-EP
Package information
Table 9: TO-220FP package mechanical data
mm
Dim.
Min.
Typ.
Max.
A
4.4
4.6
B
2.5
2.7
D
2.5
2.75
E
0.45
0.7
F
0.75
1
F1
1.15
1.70
F2
1.15
1.70
G
4.95
5.2
G1
2.4
2.7
H
10
10.4
L2
16
L3
28.6
30.6
L4
9.8
10.6
L5
2.9
3.6
L6
15.9
16.4
L7
9
9.3
Dia
3
3.2
DocID028863 Rev 1
11/13
Revision history
5
STF27N60M2-EP
Revision history
Table 10: Document revision history
12/13
Date
Revision
14-Jan-2016
1
DocID028863 Rev 1
Changes
First release.
STF27N60M2-EP
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DocID028863 Rev 1
13/13
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