STF7N105K5
N-channel 1050 V, 1.4 Ω typ., 4 A MDmesh™ K5
Power MOSFET in TO-220FP package
Datasheet - production data
Features
Order code
STF7N105K5
TO-220FP
V
DS
RDS(on) max.
ID
PTOT
2.0 Ω
4A
25 W
1050 V
Industry’s lowest RDS(on) x area
Industry’s best FoM (figure of merit)
Ultra-low gate charge
100% avalanche tested
Zener-protected
Applications
Figure 1: Internal schematic diagram
D(2)
Switching applications
Description
This very high voltage N-channel Power
MOSFET is designed using MDmesh™ K5
technology based on an innovative proprietary
vertical structure. The result is a dramatic
reduction in on-resistance and ultra-low gate
charge for applications requiring superior power
density and high efficiency.
G(1)
S(3)
AM15572v1_no_tab
Table 1: Device summary
Order code
Marking
Package
Packaging
STF7N105K5
7N105K5
TO-220FP
Tube
June 2016
DocID026184 Rev 2
This is information on a product in full production.
1/14
www.st.com
Contents
STF7N105K5
Contents
1
Electrical ratings ............................................................................. 3
2
Electrical characteristics ................................................................ 4
2.1
Electrical characteristics (curves) ...................................................... 6
3
Test circuits ..................................................................................... 9
4
Package information ..................................................................... 10
4.1
5
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TO-220FP package information ...................................................... 11
Revision history ............................................................................ 13
DocID026184 Rev 2
STF7N105K5
1
Electrical ratings
Electrical ratings
Table 2: Absolute maximum ratings
Symbol
Parameter
VGS
ID
Value
Unit
Gate- source voltage
± 30
V
Drain current (continuous) at TC = 25 °C
4(1)
A
A
Drain current (continuous) at TC = 100 °C
3(1)
IDM(2)
Drain current (pulsed)
16
A
PTOT
Total dissipation at TC = 25 °C
25
W
IAR
Max. current during repetitive or single pulse avalanche
1.5
A
EAS
Single pulse avalanche energy
(starting TJ = 25 °C, ID=IAR, VDD= 50 V)
132
mJ
VISO
Insulation withstand voltage (RMS) from all three leads to external
heat sink (t = 1 s; TC = 25 °C)
2500
V
Peak diode recovery voltage slope
4.5
V/ns
MOSFET dv/dt ruggedness
50
V/ns
- 55 to 150
°C
ID
dv/dt (3)
dv/dt
(4)
Tj
Operating junction temperature range
Tstg
Storage temperature range
Notes:
(1)Limited
(2)Pulse
(3)I
SD
(4)V
by package.
width limited by safe operating area.
≤ 4 A, di/dt ≤ 100 A/µs, VDS(peak) ≤ V(BR)DSS ; VSD ≤ 840 V
DS
≤ 840 V
Table 3: Thermal data
Symbol
Parameter
Value
Unit
Rthj-case
Thermal resistance junction-case max
5
°C/W
Rthj-amb
Thermal resistance junction-amb max
62.5
°C/W
DocID026184 Rev 2
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Electrical characteristics
2
STF7N105K5
Electrical characteristics
(TCASE = 25 °C unless otherwise specified).
Table 4: On/off states
Symbol
V(BR)DSS
Parameter
Test conditions
Drain-source breakdown
voltage
VGS= 0 V, ID = 1 mA
Min.
Typ.
Max.
1050
Unit
V
VGS = 0 V, VDS = 1050 V
1
µA
VGS = 0 V, VDS = 1050 V,
TC=125 °C(1)
50
µA
Gate body leakage current
VDS = 0, VGS = ± 20 V
±10
µA
VGS(th)
Gate threshold voltage
VDS = VGS, ID = 100 µA
4
5
V
RDS(on)
Static drain-source onresistance
VGS = 10 V, ID= 2 A
1.4
2
Ω
Min.
Typ.
Max.
Unit
-
380
-
pF
-
40
-
pF
-
0.65
-
pF
-
47
-
pF
-
17
-
pF
IDSS
Zero gate voltage drain
current
IGSS
3
Notes:
(1)Defined
by design, not subject to production test.
Table 5: Dynamic
Symbol
Parameter
Ciss
Input capacitance
Coss
Output capacitance
Crss
Reverse transfer
capacitance
Co(tr)(1)
Test conditions
VDS =100 V, f=1 MHz, VGS=0 V
Equivalent capacitance
time related
VGS = 0 V, VDS = 0 to 840 V
Co(er)(2)
Equivalent capacitance
energy related
RG
Intrinsic gate resistance
f = 1MHz open drain
-
7
-
Ω
Qg
Total gate charge
-
11
-
nC
Qgs
Gate-source charge
-
2.8
-
nC
Qgd
Gate-drain charge
VDD = 840 V, ID = 4 A
VGS =10 V
Figure 16: "Test circuit for gate
charge behavior"
-
5.6
-
nC
Notes:
(1)Time
related is defined as a constant equivalent capacitance giving the same charging time as C oss when VDS
increases from 0 to 80% VDSS
(2)Energy
related is defined as a constant equivalent capacitance giving the same stored energy as Coss when VDS
increases from 0 to 80% VDSS
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DocID026184 Rev 2
STF7N105K5
Electrical characteristics
Table 6: Switching times
Symbol
td(on)
tr
td(off)
tf
Parameter
Turn-on delay time
Rise time
Turn-off delay time
Fall time
Test conditions
Min.
Typ.
Max.
Unit
VDD = 525 V, ID = 2 A, RG=4.7 Ω,
VGS=10 V
(see Figure 15: "Test circuit for
resistive load switching times" and
Figure 20: "Switching time
waveform")
-
17.5
-
ns
-
7
-
ns
-
43
-
ns
-
25
-
ns
Min.
Typ.
Max.
Unit
4
A
16
A
1.6
V
Table 7: Source drain diode
Symbol
Parameter
Test conditions
ISD
Source-drain current
ISDM
Source-drain current
(pulsed)
-
VSD(1)
Forward on voltage
ISD= 4 A, VGS=0
-
trr
Reverse recovery time
-
370
ns
Qrr
Reverse recovery charge
-
3
µC
IRRM
Reverse recovery current
ISD= 4 A, VDD= 60 V
di/dt = 100 A/µs,
Figure 17: "Test circuit for
inductive load switching and
diode recovery times"
-
16.5
A
ISD= 4 A,VDD= 60 V
di/dt=100 A/µs, Tj=150 °C
Figure 17: "Test circuit for
inductive load switching and
diode recovery times"
-
600
ns
-
4.4
µC
-
14.5
A
trr
Reverse recovery time
Qrr
Reverse recovery charge
IRRM
Reverse recovery current
Notes:
(1)Pulsed:
pulse duration = 300µs, duty cycle 1.5%
Table 8: Gate-source Zener diode
Symbol
V(BR)GSO
Parameter
Gate-source breakdown voltage
Test conditions
IGS = ± 1mA, ID=0
Min
Typ.
Max.
Unit
30
-
-
V
The built-in back-to-back Zener diodes have been specifically designed to enhance the
ESD capability of the device. The Zener voltage is appropriate for efficient and costeffective intervention to protect the device integrity. These integrated Zener diodes thus
eliminate the need for external components.
DocID026184 Rev 2
5/14
Electrical characteristics
2.1
STF7N105K5
Electrical characteristics (curves)
Figure 2: Safe operating area
Figure 3: Thermal impedance
Figure 4: Output characteristics
Figure 5: Transfer characteristics
Figure 6: Gate charge vs gate-source voltage
Figure 7: Static drain-source on-resistance
Ω
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STF7N105K5
Electrical characteristics
Figure 8: Capacitance variations
Figure 9: Source-drain diode forward
characteristics
Figure 10: Normalized gate threshold voltage
vs temperature
Figure 11: Normalized on-resistance vs
temperature
µ
Figure 12: Normalized V(BR)DSS vs
temperature
Figure 13: Maximum avalanche energy vs
starting Tj
GIPG210320141421S A
EAS
(mJ)
120
ID=1.5 A
VDD=50 V
100
80
60
40
20
0
0
DocID026184 Rev 2
20
40
60
80
100 120 140 TJ(°C)
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Electrical characteristics
STF7N105K5
Figure 14: Output capacitance stored energy
µ
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DocID026184 Rev 2
STF7N105K5
3
Test circuits
Test circuits
Figure 16: Test circuit for gate charge
behavior
Figure 15: Test circuit for resistive load
switching times
Figure 17: Test circuit for inductive load
switching and diode recovery times
Figure 18: Unclamped inductive load test
circuit
Figure 19: Unclamped inductive waveform
DocID026184 Rev 2
Figure 20: Switching time waveform
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Package information
4
STF7N105K5
Package information
In order to meet environmental requirements, ST offers these devices in different grades of
ECOPACK® packages, depending on their level of environmental compliance. ECOPACK ®
specifications, grade definitions and product status are available at: www.st.com.
ECOPACK® is an ST trademark.
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STF7N105K5
4.1
Package information
TO-220FP package information
Figure 21: TO-220FP package outline
DocID026184 Rev 2
11/14
Package information
STF7N105K5
Table 9: TO-220FP package mechanical data
mm
Dim.
Min.
Max.
A
4.4
4.6
B
2.5
2.7
D
2.5
2.75
E
0.45
0.7
F
0.75
1
F1
1.15
1.70
F2
1.15
1.70
G
4.95
5.2
G1
2.4
2.7
H
10
10.4
L2
12/14
Typ.
16
L3
28.6
30.6
L4
9.8
10.6
L5
2.9
3.6
L6
15.9
16.4
L7
9
9.3
Dia
3
3.2
DocID026184 Rev 2
STF7N105K5
5
Revision history
Revision history
Table 10: Document revision history
Date
Revision
Changes
07-Apr-2014
1
First release.
07-Jun-2016
2
Updated Figure 6: "Gate charge vs gate-source voltage" and Table 5:
"Dynamic".
Minor text changes.
DocID026184 Rev 2
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STF7N105K5
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