STF7N65M6
Datasheet
N-channel 650 V, 0.91 Ω typ., 5 A, MDmesh™ M6 Power MOSFET
in a TO‑220FP package
Features
1
2
3
TO-220FP
D(2)
Order code
VDS
RDS(on) max.
ID
STF7N65M6
650 V
0.99 Ω
5A
•
•
Reduced switching losses
Lower RDS(on) per area vs previous generation
•
•
•
Low gate input resistance
100% avalanche tested
Zener-protected
Applications
•
Switching applications
G(1)
Description
S(3)
AM15572v1_no_tab
The new MDmesh™ M6 technology incorporates the most recent advancements to
the well-known and consolidated MDmesh family of SJ MOSFETs.
STMicroelectronics builds on the previous generation of MDmesh devices through its
new M6 technology, which combines excellent RDS(on) per area improvement with
one of the most effective switching behaviors available, as well as a user-friendly
experience for maximum end-application efficiency.
Product status link
STF7N65M6
Product summary
Order code
STF7N65M6
Marking
7N65M6
Package
TO-220FP
Packing
Tube
DS11822 - Rev 2 - October 2018
For further information contact your local STMicroelectronics sales office.
www.st.com
STF7N65M6
Electrical ratings
1
Electrical ratings
Table 1. Absolute maximum ratings
Symbol
VGS
Parameter
Gate-source voltage
Value
Unit
±25
V
ID
Drain current (continuous) at TC = 25 °C
5
A
ID
Drain current (continuous) at TC = 100 °C
3.2
A
IDM (1)
Drain current (pulsed)
20
A
PTOT
Total power dissipation at TC = 25 °C
20
W
dv/dt(2)
Peak diode recovery voltage slope
5
dv/dt(3)
MOSFET dv/dt ruggedness
50
Insulation withstand voltage (RMS) from all three leads to external heat sink
(t = 1 s, TC = 25 °C)
2.5
kV
-55 to 150
°C
Value
Unit
VISO
TJ
Tstg
Operating junction temperature range
Storage temperature range
V/ns
1. Pulse width limited by safe operating area.
2. ISD ≤ 5 A, di/dt = 400 A/μs, VDS peak < V(BR)DSS, VDD = 400 V
3. VDS ≤ 520 V
Table 2. Thermal data
Symbol
Parameter
Rthj-case
Thermal resistance junction-case
6.25
Rthj-amb
Thermal resistance junction-ambient
62.5
°C/W
Table 3. Avalanche characteristics
Symbol
DS11822 - Rev 2
Parameter
Value
Unit
IAR
Avalanche current, repetitive or not repetitive (pulse width limited by Tjmax.)
1.5
A
Eas
Single pulse avalanche energy (starting Tj = 25 °C, ID = IAR, VDD = 50 V)
95
mJ
page 2/13
STF7N65M6
Electrical characteristics
2
Electrical characteristics
TC = 25 °C unless otherwise specified
Table 4. On/off state
Symbol
V(BR)DSS
Parameter
Test conditions
Drain-source breakdown voltage
VGS= 0, ID = 1 mA
Min.
Typ.
650
Zero gate voltage drain current
1
µA
100
µA
±5
µA
3
3.75
V
0.91
0.99
Ω
Min.
Typ.
Max.
Unit
-
220
-
pF
-
25
-
pF
-
1.1
-
pF
VGS = 0 V, VDS = 650 V,
TC = 125 °C(1)
IGSS
Gate body leakage current
VDS = 0 V, VGS = ±25 V
VGS(th)
Gate threshold voltage
VDS = VGS, ID = 250 µA
RDS(on)
Static drain-source on-resistance
VGS = 10 V, ID = 2.5 A
Unit
V
VGS = 0 V, VDS = 650 V
IDSS
Max.
2.25
1. Defined by design, not subject to production test.
Table 5. Dynamic
Symbol
Parameter
Test conditions
Ciss
Input capacitance
Coss
Output capacitance
Crss
Reverse transfer capacitance
Coss eq.(1)
Equivalent output capacitance
VDS = 0 to 520 V, VGS = 0 V
-
45
-
pF
RG
Intrinsic gate resistance
f = 1 MHz, ID = 0 A
-
6.3
-
Ω
Qg
Total gate charge
VDD = 520 V, ID = 5 A,
-
6.9
-
nC
Qgs
Gate-source charge
VGS = 0 to 10 V
-
1.3
-
nC
Qgd
Gate-drain charge
(see Figure 14. Test circuit for gate
charge behavior)
-
3.1
-
nC
VDS = 100 V, f = 1 MHz, VGS = 0 V
1. Coss eq. is defined as a constant equivalent capacitance giving the same charging time as Coss when VDS increases from 0
to 80% VDSS.
Table 6. Switching times
Symbol
td(on)
tr
td(off)
tf
DS11822 - Rev 2
Parameter
Test conditions
Min.
Typ.
Max.
Unit
Turn-on delay time
VDD = 325 V, ID = 2.5 A,
-
6.5
-
ns
Rise time
RG = 4.7 Ω, VGS = 10 V
-
4.5
-
ns
Turn-off delay time
(see Figure 13. Test circuit for
resistive load switching times and
Figure 18. Switching time
waveform)
-
21.4
-
ns
-
12.4
-
ns
Fall time
page 3/13
STF7N65M6
Electrical characteristics
Table 7. Source-drain diode
Symbol
ISD
ISDM(1)
(2)
Parameter
Test conditions
Min.
Typ.
Max.
Unit
Source-drain current
-
5
A
Source-drain current (pulsed)
-
20
A
1.6
V
Forward on voltage
ISD = 5 A, VGS = 0 V
-
trr
Reverse recovery time
ISD = 5 A, di/dt = 100 A/µs,
-
171
ns
Qrr
Reverse recovery charge
VDD = 60 V
-
1
µC
Reverse recovery current
(see Figure 15. Test circuit for
inductive load switching and diode
recovery times)
-
11.8
A
trr
Reverse recovery time
ISD = 5 A, di/dt = 100 A/µs,
-
234
ns
Qrr
Reverse recovery charge
VDD = 60 V, Tj = 150 °C
-
1.2
µC
IRRM
Reverse recovery current
(see Figure 15. Test circuit for
inductive load switching and diode
recovery times)
-
10.8
A
VSD
IRRM
1. Pulse width limited by safe operating area.
2. Pulsed: pulse duration = 300 µs, duty cycle 1.5%.
DS11822 - Rev 2
page 4/13
STF7N65M6
Electrical characteristics (curves)
2.1
Electrical characteristics (curves)
Figure 1. Safe operating area
ID
(A)
Figure 2. Thermal impedance
K
GIPG130920161403SOA
10 1
Operation in this area
is limited by RDS(on)
GC20940
10 -1
tp =10 µs
10 0
tp =100 µs
tp =1 ms
10
tp =10 ms
-1
single pulse
TJ ≤ 150 °C
TC = 25 °C
VGS=10 V
10 0
10 1
10 -2
10 -1
V DS (V)
10 2
Figure 3. Output characteristics
ID
(A)
10 -3
10 -4
10 -3
10 -2
10 -1
10 0
t p (s)
Figure 4. Transfer characteristics
ID
(A)
GIPG290720160921OCH
VGS = 6 V
8
10 -2
GIPG290720161033TCH
VDS =14 V
8
6
6
VGS=5 V
4
4
2
2
VGS = 4 V
0
0
2
4
6
8
10
12
V DS (V)
Figure 5. Gate charge vs gate-source voltage
VGS
(V)
2
4
6
GIPG020820160837QVG VDS
(V)
500
0.95
400
0.93
6
300
0.91
4
200
0.89
2
100
0.87
0
Qg (nC)
0.85
0
10
VDD = 520 V
ID = 5 A
8
0
0
1
2
3
4
5
6
7
8
V GS (V)
GIPG290720161116RID
600
VDS
8
Figure 6. Static drain-source on-resistance
Ω
0.97
12
DS11822 - Rev 2
0
0
VGS=10 V
1
2
3
4
5
IC (A)
page 5/13
STF7N65M6
Electrical characteristics (curves)
Figure 8. Normalized gate threshold voltage vs
temperature
Figure 7. Capacitance variations
C
(pF)
GIPG290720161128CVR
10 3
V GS(th)
(norm.)
GIPG290720161143VTH
ID=250 µA
1.1
C ISS
1
10 2
0.9
C OSS
10 1
f = 1 MHz
0.8
C RSS
10 0
0.7
10
-1
10 -1
10 0
10 1
V DS (V)
10 2
Figure 9. Normalized on-resistance vs temperature
R DS(on)
(norm.)
GIPG290720161206RON
V GS =10 V
2.2
0.6
-75
1
1
0.96
0.6
0.92
75
125
0.88
-75
°
Figure 11. Output capacitance stored energy
GIPG290720161227EOS
E
(μJ)
2
1
1.6
0.9
1.2
0.8
0.8
0.7
0.4
0.6
DS11822 - Rev 2
200
300
400
500
600
V DS (V)
ID= 1 mA
-25
25
75
V SD
(V)
1.1
100
TJ (°C)
°
125
Figure 12. Source-drain diode forward characteristics
2.4
0
0
125
GIPG290720161215BDV
1.08
1.4
25
75
V (BR)DSS
(norm.)
1.04
-25
25
Figure 10. Normalized V(BR)DSS vs temperature
1.8
0.2
-75
-25
0.5
0
GIPG290720161328SDF
Tj = 50 °C
Tj = 25 °C
Tj = 150 °C
1
2
3
4
5
I SD (A)
page 6/13
STF7N65M6
Test circuits
3
Test circuits
Figure 13. Test circuit for resistive load switching times
Figure 14. Test circuit for gate charge behavior
VDD
RL
RL
2200
+ μF
3.3
μF
VDD
VD
RG
VGS
IG= CONST
VGS
+
pulse width
D.U.T.
2.7 kΩ
2200
μF
pulse width
D.U.T.
100 Ω
VG
47 kΩ
1 kΩ
AM01469v10
AM01468v1
Figure 15. Test circuit for inductive load switching and
diode recovery times
D
G
A
D.U.T.
S
25 Ω
A
L
A
VD
100 µH
fast
diode
B
B
B
3.3
µF
D
G
+
Figure 16. Unclamped inductive load test circuit
RG
1000
+ µF
2200
+ µF
VDD
3.3
µF
VDD
ID
D.U.T.
S
D.U.T.
Vi
_
pulse width
AM01471v1
AM01470v1
Figure 18. Switching time waveform
Figure 17. Unclamped inductive waveform
ton
V(BR)DSS
td(on)
toff
td(off)
tr
tf
VD
90%
90%
IDM
VDD
10%
0
ID
VDD
AM01472v1
VGS
0
VDS
10%
90%
10%
AM01473v1
DS11822 - Rev 2
page 7/13
STF7N65M6
Package information
4
Package information
In order to meet environmental requirements, ST offers these devices in different grades of ECOPACK®
packages, depending on their level of environmental compliance. ECOPACK® specifications, grade definitions
and product status are available at: www.st.com. ECOPACK® is an ST trademark.
DS11822 - Rev 2
page 8/13
STF7N65M6
TO-220FP package information
4.1
TO-220FP package information
Figure 19. TO-220FP package outline
7012510_Rev_12_B
DS11822 - Rev 2
page 9/13
STF7N65M6
TO-220FP package information
Table 8. TO-220FP package mechanical data
Dim.
mm
Min.
Max.
A
4.4
4.6
B
2.5
2.7
D
2.5
2.75
E
0.45
0.7
F
0.75
1
F1
1.15
1.70
F2
1.15
1.70
G
4.95
5.2
G1
2.4
2.7
H
10
10.4
L2
DS11822 - Rev 2
Typ.
16
L3
28.6
30.6
L4
9.8
10.6
L5
2.9
3.6
L6
15.9
16.4
L7
9
9.3
Dia
3
3.2
page 10/13
STF7N65M6
Revision history
Table 9. Document revision history
DS11822 - Rev 2
Date
Revision
15-Sep-2016
1
16-Oct-2018
2
Changes
Initial release.
Updated Figure 14. Test circuit for gate charge behavior.
Minor text changes
page 11/13
STF7N65M6
Contents
Contents
1
Electrical ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2
2
Electrical characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
2.1
Electrical characteristics (curves) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
3
Test circuits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7
4
Package information. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .8
4.1
TO-220FP package information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .11
DS11822 - Rev 2
page 12/13
STF7N65M6
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© 2018 STMicroelectronics – All rights reserved
DS11822 - Rev 2
page 13/13