STF8N90K5
N-channel 900 V, 0.60 Ω typ., 8 A MDmesh™ K5
Power MOSFET in a TO-220FP package
Datasheet - production data
Features
TO-220FP
Order code
VDS
RDS(on) max.
ID
STF8N90K5
900 V
0.68 Ω
8A
Industry’s lowest RDS(on) x area
Industry’s best FoM (figure of merit)
Ultra-low gate charge
100% avalanche tested
Zener-protected
Applications
Figure 1: Internal schematic diagram
D(2)
Switching applications
Description
This very high voltage N-channel Power
MOSFET is designed using MDmesh™ K5
technology based on an innovative proprietary
vertical structure. The result is a dramatic
reduction in on-resistance and ultra-low gate
charge for applications requiring superior power
density and high efficiency.
G(1)
S(3)
AM15572v1_no_tab
Table 1: Device summary
Order code
Marking
Package
Packing
STF8N90K5
8N90K5
TO-220FP
Tube
November 2016
DocID030081 Rev 1
This is information on a product in full production.
1/13
www.st.com
Contents
STF8N90K5
Contents
1
Electrical ratings ............................................................................. 3
2
Electrical characteristics ................................................................ 4
2.1
Electrical characteristics (curves) ...................................................... 6
3
Test circuits ..................................................................................... 8
4
Package information ....................................................................... 9
4.1
5
2/13
TO-220FP package information ...................................................... 10
Revision history ............................................................................ 12
DocID030081 Rev 1
STF8N90K5
1
Electrical ratings
Electrical ratings
Table 2: Absolute maximum ratings
Symbol
Parameter
Value
Unit
VGS
Gate-source voltage
±30
V
ID(1)
Drain current (continuous) at TC = 25 °C
8
A
ID(1)
Drain current (continuous) at TC = 100 °C
5
A
ID(2)
Drain current pulsed
32
A
PTOT
Total dissipation at TC = 25 °C
30
W
VISO
Insulation withstand voltage (RMS) from all three leads to external
heat sink (t = 1 s; TC = 25 °C)
2500
V
dv/dt (3)
dv/dt
(4)
Tj
Peak diode recovery voltage slope
4.5
MOSFET dv/dt ruggedness
50
Operating junction temperature range
Tstg
Storage temperature range
V/ns
-55 to 150
°C
Value
Unit
Notes:
(1)Limited
(2)Pulse
(3)I
SD
(4)V
by maximum junction temperature.
width limited by safe operating area
≤ 8 A, di/dt ≤ 100 A/μs; VDS peak ≤ V(BR)DSS
DS
≤ 720 V
Table 3: Thermal data
Symbol
Parameter
Rthj-case
Thermal resistance junction-case
4.2
°C/W
Rthj-amb
Thermal resistance junction-ambient
62.5
°C/W
Value
Unit
Table 4: Avalanche characteristics
Symbol
Parameter
IAR
Avalanche current, repetitive or not repetitive
(pulse width limited by TJ max)
2.7
A
EAS
Single pulse avalanche energy
(starting TJ = 25 °C, ID = IAR, VDD = 50 V)
250
mJ
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3/13
Electrical characteristics
2
STF8N90K5
Electrical characteristics
TC = 25 °C unless otherwise specified
Table 5: On/off-state
Symbol
Parameter
V(BR)DSS
Drain-source breakdown voltage
Test conditions
Min.
VGS = 0 V, ID = 1 mA
900
Typ.
Max.
Unit
V
VGS = 0 V, VDS = 900 V
1
µA
IDSS
Zero gate voltage drain current
VGS = 0 V, VDS = 900 V,
TC = 125 °C(1)
50
µA
IGSS
Gate body leakage current
VDS = 0 V, VGS = ±20 V
±10
µA
VGS(th)
Gate threshold voltage
VDS = VGS, ID = 100 µA
4
5
V
RDS(on)
Static drain-source on-resistance
VGS = 10 V, ID = 4 A
0.60
0.68
Ω
Min.
Typ.
Max.
Unit
-
426
-
pF
-
41
-
pF
-
1.2
-
pF
-
75
-
pF
-
28
-
pF
3
Notes:
(1)Defined
by design, not subject to production test.
Table 6: Dynamic
Symbol
Ciss
Parameter
Test conditions
Input capacitance
VDS = 100 V, f = 1 MHz,
VGS = 0 V
Coss
Output capacitance
Crss
Reverse transfer capacitance
Co(tr)(1)
Equivalent capacitance time
related
Co(er)(2)
Equivalent capacitance energy
related
VDS = 0 to 720 V,
VGS = 0 V
Rg
Intrinsic gate resistance
f = 1 MHz , ID= 0 A
-
7
-
Ω
Qg
Total gate charge
-
11
-
nC
Qgs
Gate-source charge
-
3.5
-
nC
Qgd
Gate-drain charge
VDD = 720 V, ID = 8 A,
VGS= 10 V
(see Figure 15: "Test
circuit for gate charge
behavior")
-
4.8
-
nC
Notes:
(1)Time
related is defined as a constant equivalent capacitance giving the same charging time as Coss when V DS
increases from 0 to 80% VDSS
(2)Energy
related is defined as a constant equivalent capacitance giving the same stored energy as Coss when
VDS increases from 0 to 80% VDSS
4/13
DocID030081 Rev 1
STF8N90K5
Electrical characteristics
Table 7: Switching times
Symbol
Parameter
td(on)
Turn-on delay time
tr
Rise time
td(off)
Turn-off delay time
tf
Fall time
Test conditions
Min.
Typ.
Max.
Unit
VDD= 450 V, ID = 4 A,
RG = 4.7 Ω, VGS = 10 V
(see Figure 14: "Test circuit for
resistive load switching times"
and Figure 19: "Switching time
waveform")
-
14.7
-
ns
-
13.2
-
ns
-
36.4
-
ns
-
13.5
-
ns
Min.
Typ.
Max.
Unit
Table 8: Source-drain diode
Symbol
Parameter
Test conditions
ISD
Source-drain current
-
8
A
ISDM(1)
Source-drain current
(pulsed)
-
32
A
VSD(2)
Forward on voltage
ISD = 8 A, VGS = 0 V
-
1.5
V
ISD = 8 A, di/dt = 100 A/µs,
VDD = 60 V
(see Figure 16: "Test circuit for
inductive load switching and
diode recovery times")
-
371
ns
-
4.27
µC
-
23
A
ISD = 8 A, di/dt = 100 A/µs,
VDD = 60 V, Tj = 150 °C
(see Figure 16: "Test circuit for
inductive load switching and
diode recovery times")
-
582
ns
-
5.73
µC
-
19.7
A
trr
Reverse recovery time
Qrr
Reverse recovery charge
IRRM
Reverse recovery current
trr
Reverse recovery time
Qrr
Reverse recovery charge
IRRM
Reverse recovery current
Notes:
(1)Pulse
width limited by safe operating area
(2)Pulsed:
pulse duration = 300 µs, duty cycle 1.5%
Table 9: Gate-source Zener diode
Symbol
Parameter
V (BR)GSO
Gate-source breakdown voltage
Test conditions
IGS= ± 1mA, ID= 0A
Min
Typ.
Max
Unit
30
-
-
V
The built-in back-to-back Zener diodes are specifically designed to enhance the ESD
performance of the device. The Zener voltage facilitates efficient and cost-effective device
integrity protection,thus eliminating the need for additional external componentry.
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5/13
Electrical characteristics
2.1
STF8N90K5
Electrical characteristics (curves)
Figure 2: Safe operating area
Figure 3: Thermal impedance
Figure 4: Output characteristics
Figure 5: Transfer characteristics
Figure 6: Gate charge vs gate-source voltage
Figure 7: Static drain-source on-resistance
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STF8N90K5
Electrical characteristics
Figure 8: Capacitance variations
Figure 9: Normalized gate threshold voltage vs
temperature
Figure 10: Normalized on-resistance vs temperature
Figure 11: Normalized V(BR)DSS vs temperature
Figure 12: Source-drain diode forward
characteristics
Figure 13: Maximum avalanche energy vs starting TJ
DocID030081 Rev 1
7/13
Test circuits
3
STF8N90K5
Test circuits
Figure 14: Test circuit for resistive load
switching times
Figure 15: Test circuit for gate charge
behavior
VDD
RL
IG= CONST
VGS
+
pulse width
2200
μF
100 Ω
D.U.T.
2.7 kΩ
VG
47 kΩ
1 kΩ
AM01469v10
8/13
Figure 16: Test circuit for inductive load
switching and diode recovery times
Figure 17: Unclamped inductive load test
circuit
Figure 18: Unclamped inductive waveform
Figure 19: Switching time waveform
DocID030081 Rev 1
STF8N90K5
4
Package information
Package information
In order to meet environmental requirements, ST offers these devices in different grades of
ECOPACK® packages, depending on their level of environmental compliance. ECOPACK ®
specifications, grade definitions and product status are available at: www.st.com.
ECOPACK® is an ST trademark.
DocID030081 Rev 1
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Package information
4.1
STF8N90K5
TO-220FP package information
Figure 20: TO-220FP package outline
10/13
DocID030081 Rev 1
STF8N90K5
Package information
Table 10: TO-220FP package mechanical data
mm
Dim.
Min.
Typ.
Max.
A
4.4
4.6
B
2.5
2.7
D
2.5
2.75
E
0.45
0.7
F
0.75
1
F1
1.15
1.70
F2
1.15
1.70
G
4.95
5.2
G1
2.4
2.7
H
10
10.4
L2
16
L3
28.6
30.6
L4
9.8
10.6
L5
2.9
3.6
L6
15.9
16.4
L7
9
9.3
Dia
3
3.2
DocID030081 Rev 1
11/13
Revision history
5
STF8N90K5
Revision history
Table 11: Document revision history
12/13
Date
Revision
28-Nov-2016
1
Changes
First release
DocID030081 Rev 1
STF8N90K5
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