STFH24N60M2
N-channel 600 V, 0.168 Ω typ., 18 A MDmesh™ M2
Power MOSFET in a TO-220FP wide creepage package
Datasheet - production data
Features
Order code
VDS @ TJmax
RDS(on) max
ID
STFH24N60M2
650 V
0.19 Ω
18 A
Extremely low gate charge
Excellent output capacitance (COSS) profile
100% avalanche tested
Zener-protected
Wide creepage distance of 4.25 mm
between the pins
Applications
Figure 1: Internal schematic diagram
D(2)
G(1)
Switching applications
LLC converters, resonant converters
Description
This device is an N-channel Power MOSFET
developed using MDmesh™ M2 technology.
Thanks to its strip layout and an improved vertical
structure, the device exhibits low on-resistance
and optimized switching characteristics,
rendering it suitable for the most demanding high
efficiency converters.
The TO-220FP wide creepage package provides
increased surface insulation for Power MOSFETs
to prevent failure due to arcing, which can occur
in polluted environments.
S(3)
AM15572v1_no_tab
Table 1: Device summary
Order code
Marking
Package
Packing
STFH24N60M2
24N60M2
TO-220FP wide creepage
Tube
June 2016
DocID029415 Rev 2
This is information on a product in full production.
1/12
www.st.com
Contents
STFH24N60M2
Contents
1
Electrical ratings ............................................................................. 3
2
Electrical characteristics ................................................................ 4
2.1
Electrical characteristics (curves) ...................................................... 6
3
Test circuits ..................................................................................... 8
4
Package information ....................................................................... 9
4.1
5
2/12
TO-220FP wide creepage package information ................................ 9
Revision history ............................................................................ 11
DocID029415 Rev 2
STFH24N60M2
1
Electrical ratings
Electrical ratings
Table 2: Absolute maximum ratings
Symbol
VGS
ID
ID
IDM
(2)
Parameter
Value
Unit
Gate-source voltage
± 25
V
Drain current (continuous) at TC = 25 °C
18 (1)
A
Drain current (continuous) at TC = 100 °C
12 (1)
A
(1)
A
72
Drain current (pulsed)
PTOT
Total dissipation at TC = 25 °C
30
W
dv/dt
(3)
Peak diode recovery voltage slope
15
V/ns
dv/dt
(4)
MOSFET dv/dt ruggedness
50
V/ns
2500
V
- 55 to 150
°C
VISO
Insulation withstand voltage (RMS) from all three leads to external
heat sink (t = 1 s; TC = 25 °C)
Tstg
Storage temperature range
Tj
Operating junction temperature range
Notes:
(1)Limited
(2)Pulse
(3)I
SD
(4)V
by maximum junction temperature.
width limited by safe operating area.
≤ 18 A, di/dt ≤ 400 A/µs; VDSpeak < V(BR)DSS, VDD = 400 V.
DS
≤ 480 V.
Table 3: Thermal data
Symbol
Parameter
Value
Unit
Rthj-case
Thermal resistance junction-case max
4.2
°C/W
Rthj-amb
Thermal resistance junction-ambient max
62.5
°C/W
Table 4: Avalanche characteristics
Symbol
Parameter
Value
Unit
IAR
Avalanche current, repetitive or not repetitive (pulse width limited by T jmax)
3.5
A
EAS
Single pulse avalanche energy (starting Tj=25 °C, ID= IAR; VDD=50 V)
180
mJ
DocID029415 Rev 2
3/12
Electrical characteristics
2
STFH24N60M2
Electrical characteristics
(TC = 25 °C unless otherwise specified)
Table 5: On /off states
Symbol
Parameter
Test conditions
V(BR)DSS
Drain-source breakdown voltage
VGS = 0, ID = 1 mA
Min.
Typ.
Max.
600
Unit
V
VGS = 0, VDS = 600 V
1
µA
VGS = 0,
VDS = 600 V,
TC=125 °C(1)
100
µA
±10
µA
3
4
V
0.168
0.190
Ω
Min.
Typ.
Max.
Unit
-
1060
-
pF
-
55
-
pF
-
2.2
-
pF
IDSS
Zero gate voltage
drain current
IGSS
Gate-body leakage
current
VDS = 0, VGS = ± 25 V
VGS(th)
Gate threshold voltage
VDS = VGS, ID = 250 µA
RDS(on)
Static drain-source on- resistance
VGS = 10 V, ID = 9 A
2
Notes:
(1)Defined
by design, not subject to production test.
Table 6: Dynamic
Symbol
Parameter
Test conditions
Ciss
Input capacitance
Coss
Output capacitance
Crss
Reverse transfer
capacitance
Coss eq.(1)
Equivalent output
capacitance
VDS= 0 to 480 V, VGS= 0 V
-
258
-
pF
RG
Intrinsic gate
resistance
f = 1 MHz, ID=0 A
-
7
-
Ω
Qg
Total gate charge
-
29
-
nC
Qgs
Gate-source charge
-
6
-
nC
Qgd
Gate-drain charge
VDD = 480 V, ID = 18 A,
VGS = 10 V
(see Figure 15: "Test circuit for
gate charge behavior")
-
12
-
nC
VDS = 100 V, f = 1 MHz,
VGS = 0 V
Notes:
(1)
4/12
Coss eq. is defined as a constant equivalent capacitance giving the same charging time as Coss when VDS increases
DocID029415 Rev 2
from 0 to 80% VDSS.
STFH24N60M2
Electrical characteristics
Table 7: Switching times
Symbol
Parameter
td(on)
Turn-on delay time
tr
Rise time
td(off)
Turn-off delay time
tf
Fall time
Test conditions
VDD = 300 V, ID = 9 A,
RG = 4.7 Ω, VGS = 10 V
(see Figure 14: "Test circuit for
resistive load switching times" and
Figure 19: "Switching time waveform")
Min.
Typ.
Max.
Unit
-
14
-
ns
-
9
-
ns
-
60
-
ns
-
15
-
ns
Min.
Typ.
Max.
Unit
Table 8: Source drain diode
Symbol
ISD(1)
ISDM(1)(2)
VSD(3)
Parameter
Source-drain
current
-
18
A
Source-drain
current (pulsed)
-
72
A
-
1.6
V
Forward on voltage
Reverse recovery
time
trr
Test conditions
Qrr
Reverse recovery
charge
IRRM
Reverse recovery
current
trr
Reverse recovery
time
Qrr
Reverse recovery
charge
IRRM
Reverse recovery
current
ISD = 18 A, VGS = 0 V
ISD = 18 A, di/dt = 100 A/µs
VDD = 60 V (see Figure 16: "Test
circuit for inductive load switching
and diode recovery times")
ISD = 18 A, di/dt = 100 A/µs
VDD = 60 V, Tj = 150 °C
(see Figure 16: "Test circuit for
inductive load switching and diode
recovery times")
-
332
ns
-
4
µC
-
24
A
-
450
ns
-
5.5
µC
-
25
A
Notes:
(1)The
value is rated according to Rthj-case and limited by package.
(2)Pulse
width limited by safe operating area
(3)Pulsed:
pulse duration = 300 µs, duty cycle 1.5%
DocID029415 Rev 2
5/12
Electrical characteristics
2.1
STFH24N60M2
Electrical characteristics (curves)
Figure 2: Safe operating area
Figure 3: Thermal impedance
Figure 4: Output characteristics
Figure 5: Transfer characteristics
Figure 6: Gate charge vs gate-source voltage
Figure 7: Static drain-source on-resistance
6/12
DocID029415 Rev 2
STFH24N60M2
Electrical characteristics
Figure 8: Capacitance variations
Figure 9: Output capacitance stored energy
Figure 10: Normalized gate threshold voltage vs
temperature
Figure 11: Normalized on-resistance vs temperature
Figure 12: Source-drain diode forward
characteristics
Figure 13: Normalized V(BR)DSS vs temperature
DocID029415 Rev 2
7/12
Test circuits
3
STFH24N60M2
Test circuits
Figure 15: Test circuit for gate charge
behavior
Figure 14: Test circuit for resistive load
switching times
Figure 16: Test circuit for inductive load
switching and diode recovery times
Figure 17: Unclamped inductive load test
circuit
Figure 18: Unclamped inductive waveform
8/12
DocID029415 Rev 2
Figure 19: Switching time waveform
STFH24N60M2
4
Package information
Package information
In order to meet environmental requirements, ST offers these devices in different grades of
ECOPACK® packages, depending on their level of environmental compliance. ECOPACK ®
specifications, grade definitions and product status are available at: www.st.com.
ECOPACK® is an ST trademark.
4.1
TO-220FP wide creepage package information
Figure 20: TO-220FP wide creepage package outline
DM00260252_1
DocID029415 Rev 2
9/12
Package information
STFH24N60M2
Table 9: TO-220FP wide creepage package mechanical data
mm
Dim.
10/12
Min.
Typ.
Max.
A
4.60
4.70
4.80
B
2.50
2.60
2.70
D
2.49
2.59
2.69
E
0.46
0.59
F
0.76
0.89
F1
0.96
1.25
F2
1.11
1.40
G
8.40
8.50
8.60
G1
4.15
4.25
4.35
H
10.90
11.00
11.10
L2
15.25
15.40
15.55
L3
28.70
29.00
29.30
L4
10.00
10.20
10.40
L5
2.55
2.70
2.85
L6
16.00
16.10
16.20
L7
9.05
9.15
9.25
Dia
3.00
3.10
3.20
DocID029415 Rev 2
STFH24N60M2
5
Revision history
Revision history
Table 10: Document revision history
Date
Revision
Changes
07-Jun-2016
1
First release.
16-Jun-2016
2
Document status promoted from preliminary data to production data.
Minor text changes.
DocID029415 Rev 2
11/12
STFH24N60M2
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DocID029415 Rev 2
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