STFI10LN80K5
N-channel 800 V, 0.55 Ω typ., 8 A MDmesh™ K5
Power MOSFET in a I²PAKFP package
Datasheet - production data
Features
12
3
2
I PAKFP
(TO-281)
Order code
VDS
RDS(on) max.
ID
STFI10LN80K5
800 V
0.63 Ω
8A
Fully insulated and low profile package with
increased creepage path from pin to
heatsink plate
Industry’s RDS(on) x area
Industry’s best FoM (figure of merit)
Ultra-low gate charge
100% avalanche tested
Zener-protected
Figure 1: Internal schematic diagram
Applications
D(2)
Switching applications
Description
This very high voltage N-channel Power
MOSFET is designed using MDmesh™ K5
technology based on an innovative proprietary
vertical structure. The result is a dramatic
reduction in on-resistance and ultra-low gate
charge for applications requiring superior power
density and high efficiency.
G(1)
S(3)
AM15572v1_no_tab
Table 1: Device summary
Order code
Marking
Package
Packing
STFI10LN80K5
10LN80K5
I²PAKFP
Tube
February 2016
DocID028981 Rev 1
This is information on a product in full production.
1/13
www.st.com
Contents
STFI10LN80K5
Contents
1
Electrical ratings ............................................................................. 3
2
Electrical characteristics ................................................................ 4
2.1
Electrical characteristics (curves) ...................................................... 6
3
Test circuits ..................................................................................... 9
4
Package information ..................................................................... 10
4.1
5
2/13
I2PAKFP (TO-281) package information ......................................... 10
Revision history ............................................................................ 12
DocID028981 Rev 1
STFI10LN80K5
1
Electrical ratings
Electrical ratings
Table 2: Absolute maximum ratings
Symbol
VGS
Parameter
Value
Unit
± 30
V
ID
Gate-source voltage
Drain current (continuous) at TC = 25 °C
8
A
(1)
ID
Drain current (continuous) at TC = 100 °C
5
A
(2)
ID
Drain current pulsed
32
A
PTOT
Total dissipation at TC = 25 °C
20
W
VISO
Insulation withstand voltage (RMS) from all three leads to external heat
sink (t=1s; TC=25°C)
2500
V
(1)
dv/dt
(3)
Peak diode recovery voltage slope
4.5
dv/dt
(4)
MOSFET dv/dt ruggedness
50
Tj
Tstg
Operating junction temperature range
V/ns
- 55 to
150
Storage temperature range
°C
Notes:
(1)
(2)
Limited by maximum junction temperature.
Pulse width limited by safe operating area
(3)
ISD≤ 8 A, di/dt≤100 A/μs; VDS peak ≤ V(BR)DSS
(4)
VDS ≤ 640 V
Table 3: Thermal data
Symbol
Parameter
Value
Unit
Rthj-case
Thermal resistance junction-case
6.25
°C/W
Rthj-amb
Thermal resistance junction-ambient
62.5
°C/W
Value
Unit
Table 4: Avalanche characteristics
Symbol
Parameter
IAR
Avalanche current, repetitive or not repetitive (pulse width
limited by Tjmax)
2.7
A
EAS
Single pulse avalanche energy (starting Tj = 25 °C, ID = IAR,
VDD = 50 V)
240
mJ
DocID028981 Rev 1
3/13
Electrical characteristics
2
STFI10LN80K5
Electrical characteristics
TC = 25 °C unless otherwise specified
Table 5: On/off-state
Symbol
V(BR)DSS
Parameter
Drain-source breakdown voltage
Test conditions
Min.
VGS = 0 V, ID = 1 mA
800
Typ.
Max.
Unit
V
VGS = 0 V, VDS = 800 V
1
µA
IDSS
Zero gate voltage drain current
VGS = 0 V, VDS = 800 V
(1)
TC = 125 °C
50
µA
IGSS
Gate body leakage current
VDS = 0 V, VGS = ±20 V
±10
µA
VGS(th)
Gate threshold voltage
VDS = VGS, ID = 100 µA
4
5
V
RDS(on)
Static drain-source on-resistance
VGS = 10 V, ID = 4 A
0.55
0.63
Ω
Min.
Typ.
Max.
Unit
-
427
-
pF
-
43
-
pF
-
0.25
-
pF
-
72
-
pF
27
-
pF
3
Notes:
(1)
Defined by design, not subject to production test.
Table 6: Dynamic
Symbol
Ciss
Parameter
Input capacitance
VDS = 100 V, f = 1 MHz,
VGS = 0 V
Coss
Output capacitance
Crss
Reverse transfer capacitance
(1)
Co(tr)
(2)
Co(er)
Test conditions
Equivalent capacitance time
related
Equivalent capacitance energy
related
VDS = 0 to 640 V,
VGS = 0 V
Rg
Intrinsic gate resistance
f = 1 MHz , ID= 0 A
-
7
-
Ω
Qg
Total gate charge
-
15
-
nC
Qgs
Gate-source charge
-
4.2
-
nC
Qgd
Gate-drain charge
VDD = 640 V, ID = 8 A
VGS= 10 V
(see Figure 16: "Test
circuit for gate charge
behavior")
-
9
-
nC
Notes:
(1)
Time related is defined as a constant equivalent capacitance giving the same charging time as Coss when VDS
increases from 0 to 80% VDSS
(2)
Energy related is defined as a constant equivalent capacitance giving the same stored energy as C oss when VDS
increases from 0 to 80% VDSS
4/13
DocID028981 Rev 1
STFI10LN80K5
Electrical characteristics
Table 7: Switching times
Symbol
td(on)
tr
Parameter
Turn-on delay time
Rise time
td(off)
tf
Turn-off delay time
Fall time
Test conditions
Min.
Typ.
Max.
Unit
VDD= 400 V, ID = 4 A, RG = 4.7 Ω
VGS = 10 V (see Figure 15: "Test
circuit for resistive load switching
times" and Figure 20: "Switching
time waveform")
-
11.8
-
ns
-
10
-
ns
-
28
-
ns
-
13
-
ns
Min.
Typ.
Max.
Unit
Table 8: Source-drain diode
Symbol
ISD
Parameter
Test conditions
Source-drain current
-
8
A
(1)
Source-drain current
(pulsed)
-
32
A
(2)
ISDM
VSD
Forward on voltage
ISD = 8 A, VGS = 0 V
-
trr
Reverse recovery time
-
350
ns
Qrr
Reverse recovery charge
-
3.9
µC
IRRM
Reverse recovery current
ISD = 8 A, di/dt = 100 A/µs,
VDD = 60 V
(see Figure 17: "Test
circuit for inductive load
switching and diode
recovery times")
-
22.5
A
ISD = 8 A, di/dt = 100 A/µs,
VDD = 60 V, Tj = 150 °C
(see Figure 17: "Test
circuit for inductive load
switching and diode
recovery times")
-
505
ns
-
5
µC
-
20
A
trr
Reverse recovery time
Qrr
Reverse recovery charge
IRRM
Reverse recovery current
1.5
V
Notes:
(1)
(2)
Pulse width limited by safe operating area
Pulsed: pulse duration = 300 µs, duty cycle 1.5%
Table 9: Gate-source Zener diode
Symbol
V (BR)GSO
Parameter
Gate-source breakdown voltage
Test conditions
IGS= ± 1 mA, ID= 0 A
Min
Typ.
Max
Unit
30
-
-
V
The built-in back-to-back Zener diodes are specifically designed to enhance the ESD
performance of the device. The Zener voltage facilitates efficient and cost-effective device
integrity protection,thus eliminating the need for additional external componentry.
DocID028981 Rev 1
5/13
Electrical characteristics
2.2
STFI10LN80K5
Electrical characteristics (curves)
Figure 2: Safe operating area
Figure 3: Thermal impedance
K
GC20940_ZTH
δ=0.5
0.1
δ=0.2
0.05
0.02
10 -1
0.01
Single pulse
10 -2
10
6/13
-3
10-4
10-3
10
-2
10
-1
10
0
tp(s)
Figure 4: Output characteristics
Figure 5: Transfer characteristics
Figure 6: Gate charge vs gate-source voltage
Figure 7: Static drain-source on-resistance
DocID028981 Rev 1
STFI10LN80K5
Electrical characteristics
Figure 8: Capacitance variations
Figure 9: Normalized gate threshold voltage
vs temperature
Figure 10: Normalized on-resistance vs
temperature
Figure 11: Normalized V(BR)DSS vs temperature
Figure 12: Output capacitance stored energy
Figure 13: Source-drain diode forward
characteristics
DocID028981 Rev 1
7/13
Electrical characteristics
STFI10LN80K5
Figure 14: Maximum avalanche energy vs starting TJ
8/13
DocID028981 Rev 1
STFI10LN80K5
3
Test circuits
Test circuits
Figure 15: Test circuit for resistive load
switching times
Figure 16: Test circuit for gate charge
behavior
Figure 17: Test circuit for inductive load
switching and diode recovery times
Figure 18: Unclamped inductive load test
circuit
Figure 19: Unclamped inductive waveform
Figure 20: Switching time waveform
DocID028981 Rev 1
9/13
Package information
4
STFI10LN80K5
Package information
In order to meet environmental requirements, ST offers these devices in different grades of
®
®
ECOPACK packages, depending on their level of environmental compliance. ECOPACK
specifications, grade definitions and product status are available at: www.st.com.
®
ECOPACK is an ST trademark.
4.1
I2PAKFP (TO-281) package information
Figure 21: I²PAKFP (TO-281) package outline
8291506 Re v. C
10/13
DocID028981 Rev 1
STFI10LN80K5
Package information
Table 10: I²PAKFP (TO-281) mechanical data
mm
Dim.
Min.
Typ.
Max.
A
4.40
4.60
B
2.50
2.70
D
2.50
2.75
D1
0.65
0.85
E
0.45
0.70
F
0.75
1.00
F1
1.20
G
4.95
5.20
H
10.00
10.40
L1
21.00
23.00
L2
13.20
14.10
L3
10.55
10.85
L4
2.70
3.20
L5
0.85
L6
7.50
DocID028981 Rev 1
1.25
7.60
7.70
11/13
Revision history
5
STFI10LN80K5
Revision history
Table 11: Document revision history
12/13
Date
Revision
10-Feb-2016
1
DocID028981 Rev 1
Changes
First release.
STFI10LN80K5
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