STFI26NM60N
N-channel 600 V, 0.135 Ω typ., 20 A MDmesh™ II
Power MOSFET in an I²PAKFP package
Datasheet - production data
Features
12
3
2
I PAKFP
(TO-281)
Figure 1: Internal schematic diagram
Order code
VDS
RDS(on) max
ID
STFI26NM60N
600 V
0.165 Ω
20 A
Fully insulated and low profile package with
increased creepage path from pin to
heatsink plate
100% avalanche tested
Low input capacitance and gate charge
Low gate input resistance
Applications
Switching applications
Description
D(2)
This device is an N-channel Power MOSFET
developed using the second generation of
MDmesh™ technology. This revolutionary Power
MOSFET associates a vertical structure to the
company’s strip layout to yield one of the world’s
lowest on-resistance and gate charge. It is
therefore suitable for the most demanding high
efficiency converters.
G(1)
S(3)
AM01475v1_no Tab_noZen
Table 1: Device summary
Order code
Marking
Package
Packaging
STFI26NM60N
26NM60N
I²PAKFP (TO-281)
Tube
December 2016
DocID022495 Rev 4
This is information on a product in full production.
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www.st.com
Contents
STFI26NM60N
Contents
1
Electrical ratings ............................................................................. 3
2
Electrical characteristics ................................................................ 4
2.1
Electrical characteristics (curves) ...................................................... 6
3
Test circuits ..................................................................................... 8
4
Package information ....................................................................... 9
4.1
5
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I²PAKFP package information ........................................................... 9
Revision history ............................................................................ 11
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STFI26NM60N
1
Electrical ratings
Electrical ratings
Table 2: Absolute maximum ratings
Symbol
Parameter
Value
Unit
VDS
Drain-source voltage
600
V
VGS
Gate-source voltage
±30
V
ID(1)
Drain current (continuous) at TC = 25 °C
20
A
ID(1)
Drain current (continuous) at TC = 100 °C
12.6
A
Drain current (pulsed)
80
A
Total dissipation at TC = 25 °C
35
W
Peak diode recovery voltage slope
15
V/ns
2500
V
-55 to 150
°C
Value
Unit
IDM
(1)(2)
PTOT
dv/dt
(3)
VISO
Insulation withstand voltage (RMS) from all three leads to external
heat sink
(t = 1 s; TC = 25 °C)
Tstg
Storage temperature range
Tj
Operating junction temperature range
Notes:
(1)Limited
(2)Pulse
(3)I
SD
by package.
width limited by safe operating area.
≤ 20 A, di/dt ≤ 400 A/µs, VDS(peak) ≤ V(BR)DSS, VDD ≤ 80% V(BR)DSS
Table 3: Thermal data
Symbol
Parameter
Rthj-case
Thermal resistance junction-case
3.6
°C/W
Rthj-amb
Thermal resistance junction-ambient
62.5
°C/W
Value
Unit
6
A
610
mJ
Table 4: Avalanche characteristics
Symbol
Parameter
IAS
Single pulse avalanche current (pulse width limited by Tjmax)
EAS
Single pulse avalanche energy
(starting TJ=25 °C, ID=IAS, VDD=50 V)
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Electrical characteristics
2
STFI26NM60N
Electrical characteristics
(TCASE = 25 °C unless otherwise specified)
Table 5: On/off states
Symbol
Parameter
V(BR)DSS
Drain-source
breakdown voltage
Test conditions
ID = 1 mA, VGS = 0 V
IDSS
Zero gate voltage drain
current
IGSS
Min.
Typ.
Max.
600
V
VGS = 0 V, VDS = 600 V
1
VGS = 0 V, VDS = 600 V,
TC= 125 °C (1)
100
Gate-body leakage current
VDS = 0 V, VGS = ±25 V
VGS(th)
Gate threshold voltage
VDS = VGS, ID = 250 µA
RDS(on)
Static drain-source onresistance
VGS = 10 V, ID = 10 A
Unit
µA
±0.1
µA
3
4
V
0.135
0.165
Ω
Min.
Typ.
Max.
Unit
-
1800
-
pF
-
115
-
pF
-
6
-
pF
VGS = 0 V, VDS = 0 to 480 V
-
310
-
pF
-
60
-
nC
-
8.5
-
nC
-
30
-
nC
-
2.8
-
Ω
2
Notes:
(1)Defined
by design, not subject to production test.
Table 6: Dynamic
Symbol
Ciss
Parameter
Test conditions
Input capacitance
VDS = 50 V, f = 1 MHz,
VGS = 0 V
Coss
Output capacitance
Crss
Reverse transfer
capacitance
Coss eq. (1)
Equivalent output
capacitance
Qg
Total gate charge
Qgs
Gate-source charge
Qgd
Gate-drain charge
VDD = 480 V, ID = 20 A,
VGS = 10 V
(see Figure 14: "Test circuit for
gate charge behavior")
RG
Gate input resistance
f=1 MHz, ID=0 A
Notes:
(1)C
oss eq.
is defined as a constant equivalent capacitance giving the same charging time as C oss when VDS
increases from 0 to 80% VDS
Table 7: Switching times
Symbol
td(on)
tr
td(off)
tf
4/12
Parameter
Turn-on delay time
Rise time
Turn-off delay time
Fall time
Test conditions
Min.
Typ.
Max.
Unit
VDD = 300 V, ID = 10 A,
RG = 4.7 Ω, VGS = 10 V
(see Figure 13: "Test circuit for
resistive load switching times"
and Figure 18: "Switching time
waveform")
-
13
-
ns
-
25
-
ns
-
85
-
ns
-
50
-
ns
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STFI26NM60N
Electrical characteristics
Table 8: Source-drain diode
Symbol
Parameter
Test conditions
ISD(1)
Source-drain current
ISDM(2)
Source-drain current
(pulsed)
VSD(3)
Forward on voltage
trr
Reverse recovery time
Qrr
Reverse recovery charge
IRRM
Reverse recovery current
trr
Reverse recovery time
Qrr
Reverse recovery charge
IRRM
Reverse recovery current
Min.
Typ.
Max.
Unit
-
20
A
-
80
A
ISD = 20 A, VGS = 0 V
-
1.5
V
ISD = 20 A, di/dt = 100 A/µs
VDD = 60 V
(see Figure 15: "Test circuit for
inductive load switching and
diode recovery times")
-
370
ns
-
5.8
µC
-
31.6
A
ISD = 20 A, di/dt = 100 A/µs
VDD = 60 V, Tj = 150 °C
(see Figure 15: "Test circuit for
inductive load switching and
diode recovery times")
-
450
ns
-
7.5
µC
-
32.5
A
Notes:
(1)Limited
(2)
by package.
Pulse width limited by safe operating area.
(3)Pulsed:
pulse duration = 300 µs, duty cycle 1.5%
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Electrical characteristics
2.1
STFI26NM60N
Electrical characteristics (curves)
Figure 2: Safe operating area
Figure 3: Thermal impedance
Figure 4: Output characteristics
Figure 5: Transfer characteristics
Figure 6: Gate charge vs gate-source voltage
Figure 7: Static drain-source on-resistance
W
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STFI26NM60N
Electrical characteristics
Figure 8: Capacitance variations
Figure 9: Source-drain diode forward characteristics
Figure 10: Normalized gate threshold voltage vs
temperature
Figure 11: Normalized on-resistance vs temperature
Figure 12: Normalized V(BR)DSS vs temperature
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Test circuits
3
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STFI26NM60N
Test circuits
Figure 13: Test circuit for resistive load
switching times
Figure 14: Test circuit for gate charge
behavior
Figure 15: Test circuit for inductive load
switching and diode recovery times
Figure 16: Unclamped inductive load test
circuit
Figure 17: Unclamped inductive waveform
Figure 18: Switching time waveform
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STFI26NM60N
4
Package information
Package information
In order to meet environmental requirements, ST offers these devices in different grades of
ECOPACK® packages, depending on their level of environmental compliance. ECOPACK ®
specifications, grade definitions and product status are available at: www.st.com.
ECOPACK® is an ST trademark.
4.1
I²PAKFP package information
Figure 19: I²PAKFP (TO-281) package outline
8291506 Re v. C
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Package information
STFI26NM60N
Table 9: I²PAKFP (TO-281) mechanical data
mm
Dim.
Min.
Typ.
A
4.40
4.60
B
2.50
2.70
D
2.50
2.75
D1
0.65
0.85
E
0.45
0.70
F
0.75
1.00
F1
10/12
Max.
1.20
G
4.95
5.20
H
10.00
10.40
L1
21.00
23.00
L2
13.20
14.10
L3
10.55
10.85
L4
2.70
3.20
L5
0.85
L6
7.50
DocID022495 Rev 4
1.25
7.60
7.70
STFI26NM60N
5
Revision history
Revision history
Table 10: Document revision history
Date
Revision
15-Nov-2011
1
First release.
04-Jun-2012
2
Document status promoted from preliminary data to production data.
Updated PTOT and Derating factor values in Table 2: Absolute
maximum ratings, Rth-case value in Table 3: Thermal data Package
name has been updated.
10-Jun-2015
3
Updated Section 4: Package information.Minor text changes.
4
Modified Table 2: "Absolute maximum ratings", Table 5: "On/off states",
Table 6: "Dynamic" and Table 8: "Source-drain diode"
Modified Section 2.1: "Electrical characteristics (curves)"
Minor text changes
13-Dec-2016
Changes
DocID022495 Rev 4
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STFI26NM60N
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