STGP12NB60HD
N-CHANNEL 18A - 600V TO-220
PowerMESH™ IGBT
TYPE
VCES
STGP12NB60HD
■
■
■
■
■
■
■
VCE(sat)
IC
(Max) @25°C
@ 100°C
< 2.8 V
18 A
600 V
HIGH INPUT IMPEDANCE
LOW ON-VOLTAGE DROP (Vcesat)
OFF LOSSES INCLUDE TAIL CURRENT
LOW GATE CHARGE
HIGH CURRENT CAPABILITY
VERY HIGH FREQUENCY OPERATION
CO-PACKAGED WITH TURBOSWITCHT
ANTIPARALLEL DIODE
3
1
2
TO-220
DESCRIPTION
Using the latest high voltage technology based on a
patented strip layout, STMicroelectronics has designed an advanced family of IGBTs, the PowerMESH™ IGBTs, with outstanding perfomances.
The suffix "H" identifies a family optimized for high
frequency applications (up to 50kHz)in order to
achieve very high switching performances (reduced
tfall) mantaining a low voltage drop.
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INTERNAL SCHEMATIC DIAGRAM
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APPLICATIONS
HIGH FREQUENCY MOTOR CONTROLS
■ SMPS and PFC IN BOTH HARD SWITCH AND
RESONANT TOPOLOGIES
■ UPS
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ORDERING INFORMATION
SALES TYPE
MARKING
PACKAGE
PACKAGING
STGP12NB60HD
GP12NB60HD
TO-220
TUBE
October 2003
1/9
STGP12NB60HD
ABSOLUTE MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
VCES
Collector-Emitter Voltage (VGS = 0)
600
V
VECR
Emitter-Collector Voltage
20
V
VGE
Gate-Emitter Voltage
± 20
V
IC
Collector Current (continuous) at TC = 25°C (#)
30
A
IC
Collector Current (continuous) at TC = 100°C (#)
18
A
Collector Current (pulsed)
60
A
Total Dissipation at TC = 25°C
125
W
Derating Factor
1.0
W/°C
–65 to 150
°C
150
°C
ICM ()
PTOT
Tstg
Tj
Storage Temperature
Max. Operating Junction Temperature
() Pulse width limited by safe operating area
THERMAL DATA
Rthj-case
Thermal Resistance Junction-case Max
1.0
Rthj-amb
Thermal Resistance Junction-ambient Max
62.5
)
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t(
°C/W
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°C/W
ELECTRICAL CHARACTERISTICS (TCASE = 25 °C UNLESS OTHERWISE SPECIFIED)
OFF
Parameter
Collector-Emitter Breakdown
Voltage
IC = 250 µA, VGE = 0
Collector cut-off
(VGE = 0)
VCE = Max Rating, TC = 25 °C
50
µA
VCE = Max Rating, TC = 125 °C
100
µA
VGE = ± 20V , VCE = 0
±100
nA
Max.
Unit
5
V
2.8
V
ICES
Gate-Emitter Leakage
Current (VCE = 0)
Test Conditions
P
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Symbol
VBR(CES)
IGES
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ON (1)
Symbol
Parameter
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VGE(th)
Gate Threshold Voltage
VCE(sat)
Collector-Emitter Saturation
Voltage
DYNAMIC
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Symbol
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2/9
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Parameter
Forward Transconductance
Input Capacitance
Min.
Typ.
Test Conditions
Min.
Typ.
3
VGE = 15V, IC = 12 A
2.0
VGE = 15V, IC = 12 A, Tj =125°C
1.7
Test Conditions
Min.
VCE = 15 V , IC = 12 A
VCE = 25V, f = 1 MHz, VGE = 0
Unit
V
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VCE = VGE, IC = 250 µA
Max.
600
Typ.
V
Max.
Unit
10
S
920
pF
Coes
Output Capacitance
120
pF
Cres
Reverse Transfer
Capacitance
27
pF
Qg
Qge
Qgc
Total Gate Charge
Gate-Emitter Charge
Gate-Collector Charge
VCE = 480V, IC = 12 A,
VGE = 15V
68
10
30
nC
nC
nC
ICL
Latching Current
Vclamp = 480 V , Tj = 150°C
RG = 10 Ω
48
A
STGP12NB60HD
ELECTRICAL CHARACTERISTICS (CONTINUED)
SWITCHING ON
Symbol
td(on)
tr
(di/dt)on
Eon
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
Turn-on Delay Time
Rise Time
VCC = 480 V, IC = 12 A
RG = 10Ω , VGE = 15 V
5
46
ns
ns
Turn-on Current Slope
Turn-on Switching Losses
VCC= 480 V, IC = 12 A
RG=10Ω, VGE = 15 V,
Tj =125°C
700
290
A/µs
µJ
SWITCHING OFF
Symbol
tc
Parameter
Test Conditions
tc
ns
ns
Delay Time
91
ns
Fall Time
100
ns
Turn-off Switching Loss
0.21
Total Switching Loss
0.49
Vcc = 480 V, IC = 12 A,
RGE = 10 Ω , VGE = 15 V
Tj = 125 °C
Cross-over Time
tr(Voff)
Off Voltage Rise Time
td(off)
Delay Time
tf
Ets
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Turn-off Switching Loss
Total Switching Loss
COLLECTOR-EMITTER DIODE
Symbol
Parameter
Ifm
Vf
Forward On-Voltage
trr
Qrr
Irrm
(s)
t
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od
Reverse Recovery Time
Reverse Recovery Charge
Reverse Recovery Current
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Test Conditions
Forward Current
Forward Current pulsed
If
uc
Min.
mJ
ns
od
ns
76
Pr
)
s
t(
mJ
230
Fall Time
Eoff(**)
Unit
27
td(off)
Ets
Max.
150
Off Voltage Rise Time
Eoff(**)
Typ.
Vcc = 480 V, IC = 12A,
RGE = 10 Ω , VGE = 15 V
Cross-over Time
tr(Voff)
tf
Min.
95
ns
200
ns
0.45
mJ
0.74
mJ
Typ.
If = 6 A
If = 6 A, Tj = 125 °C
1.3
1.1
If = 6 A ,VR = 50 V,
Tj = 125°C, di/dt = 100 A/µs
80
240
5.5
Max.
Unit
12
48
A
A
1.9
V
V
ns
nC
A
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Note: 1. Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %.
2. Pulse width limited by max. junction temperature.
(**)Losses include Also the Tail (Jedec Standardization)
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(#) Calculated according to the iterative formula:
T J MAX – T C
IC ( T C ) = -------------------------------------------------------------------------------------R THJ – C × V CESAT ( MAX )(T C, IC)
3/9
STGP12NB60HD
Output Characteristics
Transfer Characteristics
Transconductance
Collector-Emitter On Voltage vs Temperature
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Collector-Emitter On Voltage vs Collettor Current
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Gate Threshold vs Temperature
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STGP12NB60HD
Normalized Breakdown Voltage vs Temperature
Capacitance Variations
Gate Charge vs Gate-Emitter Voltage
Total Switching Losses vs Gate Resistance
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Total Switching Losses vs Temperature
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Total Switching Losses vs Collector Current
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STGP12NB60HD
Switching Off Safe Operating Area
Diode Forward Voltage
Thermal Impedance
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STGP12NB60HD
Fig. 1: Gate Charge test Circuit
Fig. 2: Test Circuit For Inductive Load Switching
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7/9
STGP12NB60HD
TO-220 MECHANICAL DATA
mm.
DIM.
MIN.
TYP
TYP.
MAX.
4.40
4.60
0.173
0.181
b
0.61
0.88
0.024
0.034
b1
1.15
1.70
0.045
0.066
c
0.49
0.70
0.019
0.027
D
15.25
15.75
0.60
0.620
E
10
10.40
0.393
0.409
e
2.40
2.70
0.094
0.106
e1
4.95
5.15
0.194
0.202
F
1.23
1.32
0.048
0.052
H1
6.20
6.60
0.244
0.256
J1
2.40
2.72
0.094
0.107
L
13
14
0.511
0.551
L1
3.50
3.93
0.137
0.154
L20
16.40
0.645
L30
28.90
1.137
øP
3.75
3.85
0.147
Q
2.65
2.95
0.104
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MIN.
A
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MAX.
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0.151
0.116
STGP12NB60HD
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Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the
consequences of use of such information nor for any infringement of patents or other rights of third parties which may result from
its use. No license is granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications
mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information
previously supplied. STMicroelectronics products are not authorized for use as critical components in life support devices or
systems without express written approval of STMicroelectronics.
© The ST logo is a registered trademark of STMicroelectronics
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© 2003 STMicroelectronics - Printed in Italy - All Rights Reserved
STMicroelectronics GROUP OF COMPANIES
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9/9
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